JP2010283076A - Method for heat treatment of silicon wafer - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a heat treatment method of a silicon wafer, capable of largely reducing a void defect in regions of a surface and a surface layer of a device active layer even if rapid-heating/rapid-cooling heat treatment which takes place as second-time-scale heat treatment is used. <P>SOLUTION: The heat treatment method is provided for heat treatment on a silicon wafer W sliced from a silicon monocrystal ingot grown by the Czochralski method. The heat treatment method includes the steps of: supplying an inert gas into a first space 20a with which a surface W1 of the silicon wafer W with a semiconductor device formed comes into contact; and supplying an oxidizing gas into a second space 20b with which a rear face W2 of the silicon wafer W comes into contact, so as to make rapid-heating/rapid-cooling heat treatment with the ultimate temperature of ≥1,300°C and ≤1,400°C. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to a silicon wafer heat treatment method in which heat treatment is performed on a silicon wafer sliced from a silicon single crystal ingot grown by the Czochralski method.

  A silicon wafer (hereinafter also simply referred to as a wafer) used as a substrate for forming a semiconductor device has a void defect such as COP (Crystal Originated Particle) near the surface of the wafer (hereinafter referred to as a device active layer) serving as a device active region. It is required not to exist.

  Generally, a silicon wafer in which a silicon single crystal ingot grown by the Czochralski method is sliced and mirror-polished has void defects such as COP. It is possible to eliminate void defects such as COP in the device active layer by performing a heat treatment for 30 minutes or more at a temperature of 1100 ° C. or higher in an Ar gas atmosphere using a heat treatment furnace or the like (for example, patent Reference 1).

  In recent years, a technique for forming a defect-free layer near the surface of a wafer by performing rapid thermal processing (Rapid Thermal Process: hereinafter also referred to as RTP) on a silicon wafer is known. ing.

  As an example, for example, when performing RTP, a method of forming a predetermined thermal oxide film corresponding to a predetermined defect-free region depth using an oxygen atmosphere (for example, Patent Document 2), or on the surface side of a silicon wafer A method of performing RTP by supplying a gas mainly containing argon and a gas mainly containing nitrogen on the back side is known (for example, Patent Document 3).

JP 2006-4983 A JP 2000-91259 A JP 2001-308101 A

  However, the heat treatment method described in Patent Document 1 is poor in productivity because the heat treatment time is long, and because it is a long time heat treatment, oxygen diffuses outward from the wafer surface, and the device active layer Since the concentration of dissolved oxygen is greatly reduced, it is difficult to suppress the dislocation extension that occurs due to the application of damage or strain generated in the device process.

  Further, in the heat treatment method described in Patent Document 2, oxygen in the atmosphere diffuses inward to the wafer surface, so that the concentration of dissolved oxygen on the surface of the wafer active surface of the device active layer (hereinafter referred to as the surface portion) increases. For this reason, in this surface portion, the void defect inner wall oxide film is difficult to dissolve, and the void defect may remain without disappearing. In this case, after RTP, in order to remove the surface portion, it is necessary to perform mirror polishing again, so that there is a problem that productivity is lowered.

  On the other hand, since the heat treatment method described in Patent Document 3 uses a gas mainly composed of argon, the concentration of dissolved oxygen in the surface portion of the device active layer does not increase. Therefore, in this case, since the inner wall oxide film of the void defect is easily dissolved, the void defect on the surface portion can be eliminated. However, the argon gas generates less interstitial silicon (hereinafter referred to as i-Si) necessary to eliminate void defects in which the inner wall oxide film is dissolved, compared with the oxygen atmosphere, and therefore, the argon gas has a short time of seconds. The region where the void defect can be eliminated by RTP, which is the heat treatment of, may be only the surface portion of the device active layer, and in the device active layer below the surface portion (hereinafter referred to as the surface layer portion), In some cases, the annihilation power of the void defect is reduced and the void defect remains without disappearing. In this case, there is a problem that the yield in the device process decreases.

  The present invention has been made in view of the above-described circumstances, and even in the case where a rapid heating / cooling heat treatment that is a heat treatment in seconds is used, voids are generated in the surface portion and the surface layer portion of the device active layer. An object of the present invention is to provide a silicon wafer heat treatment method capable of greatly reducing defects.

  In order to achieve the above object, a silicon wafer heat treatment method according to the present invention is a silicon wafer heat treatment method for performing heat treatment on a silicon wafer sliced from a silicon single crystal ingot grown by the Czochralski method. The inert gas is supplied into the first space where the surface side where the semiconductor device of the silicon wafer is formed is in contact, and the oxidizing gas is supplied into the second space where the back side of the silicon wafer is in contact. It is characterized by performing rapid heating / cooling heat treatment at the following maximum temperatures.

  The oxygen partial pressure in the oxidizing gas is preferably 20% or more and 100% or less.

  The thickness of the oxide film formed on the back side of the silicon wafer after the rapid heating / cooling heat treatment is preferably 15 nm or more.

  The present invention is a heat treatment of a silicon wafer that can greatly reduce void defects in the surface and surface layer regions of the device active layer even when a rapid heating / cooling heat treatment, which is a heat treatment in seconds, is used. A method is provided.

  Therefore, the silicon wafer subjected to the heat treatment according to the present invention greatly contributes to the improvement of the yield in the device process.

It is sectional drawing which shows the outline | summary of the rapid heating and rapid cooling heat processing apparatus used for the heat processing method of the silicon wafer concerning this embodiment. It is a conceptual diagram for demonstrating an example of the heat processing sequence in the rapid heating and rapid cooling heat processing applied to this embodiment. It is a wafer sectional view for explaining the mechanism in which a void defect reduces by the heat treatment method of the silicon wafer concerning this embodiment. It is a wafer sectional view for explaining a mechanism in which a void defect remains in a surface portion of a device active layer when an oxidizing gas is supplied to the surface W1 side of the wafer. It is a wafer sectional view for explaining a mechanism in which a void defect remains in a surface layer portion of a device active layer when oxidizing gas is not supplied to the back surface W2 side of the wafer. It is a result figure of the LPD measurement in this test (Example 1 and Comparative Examples 1-5).

  Hereinafter, embodiments of the present invention will be described in more detail with reference to the drawings.

  FIG. 1 is a cross-sectional view showing an outline of a rapid heating / rapid cooling heat treatment apparatus used in the silicon wafer heat treatment method according to the present embodiment.

  The RTP apparatus 10 shown in FIG. 1 contains a reaction tube 20 for accommodating a wafer W and performing heat treatment, a wafer holding unit 30 provided in the reaction tube 20 for holding the wafer W, and heating for heating the wafer W. Unit 40. In the state where the wafer W is held by the wafer holder 30, the first space 20a, which is a space surrounded by the inner wall of the reaction tube 20 and the surface W1 side where the semiconductor device of the wafer W is formed, and the reaction tube A second space 20b that is a space surrounded by the inner wall 20 and the back surface W2 side of the wafer W is formed.

The reaction tube 20 has a first supply port 22 for supplying the first atmospheric gas F _A into the first space 20a and a second supply port for supplying the second atmospheric gas F _B into the second space 20b. 24, a first outlet 26 for discharging the first atmosphere gas F _a which is supplied from the first space 20a, a second discharging the second ambient gas F _B which is supplied from the second space 20b And a discharge port 28. The reaction tube 20 is made of, for example, quartz.

  The wafer holding unit 30 includes a susceptor 32 that directly holds the outer peripheral portion of the back surface W2 of the wafer W in a ring shape, and a rotating body 34 that holds the susceptor 32 and rotates the susceptor 32 in the radial direction. The susceptor 32 and the rotating body 34 are made of, for example, SiC.

  The heating unit 40 is disposed outside the reaction tube 20 above the wafer holding unit 30 and heats the wafer W from the surface W1 side. The heating unit 40 is composed of, for example, a plurality of halogen lamps 50.

  Further, the first space 20 a and the second space 20 b formed in the reaction tube 20 are spatially connected by a connecting portion 60.

When performing rapid heating / cooling heat treatment using the RTP apparatus 10 shown in FIG. 1, a wafer W is introduced into the reaction tube 20 from a wafer introduction port (not shown) provided in the reaction tube 20 to hold the wafer. The wafer W is held in a ring shape on the susceptor 32 of the unit 30, and a first atmospheric gas F _A to be described later from the first supply port 22 and a second atmospheric gas F _B to be described later from the second supply port 24. And heating the wafer W by the heating unit 40.

  Next, the silicon wafer heat treatment method according to the embodiment of the present invention will be described more specifically.

  The silicon wafer heat treatment method according to this embodiment performs rapid heating / cooling heat treatment on a silicon wafer manufactured by slicing a silicon single crystal ingot grown by the Czochralski method.

  The silicon single crystal ingot is grown by the Czochralski method by a known method.

  Specifically, a silicon single crystal ingot heats polycrystalline silicon filled in a quartz crucible to form a silicon melt, contacts the seed crystal with the surface of the silicon melt, and rotates the seed crystal and the quartz crucible. Then, the seed crystal is pulled up, expanded to a desired diameter to form a straight body portion, and then grown by separating from the silicon melt.

  Next, the silicon single crystal ingot thus obtained is processed into a silicon wafer by slicing or the like by a known method.

  Specifically, after a silicon single crystal ingot is sliced into a wafer shape with an inner peripheral blade or a wire saw, the outer peripheral portion is chamfered, lapped, etched, mirror polished, and the like.

  Next, rapid heating / cooling heat treatment is performed on the mirror-polished silicon wafer thus obtained by using an RTP apparatus 10 as shown in FIG.

  FIG. 2 is a conceptual diagram for explaining an example of a heat treatment sequence in the rapid heating / cooling heat treatment applied to the present embodiment.

The rapid heating / cooling heat treatment applied to the present embodiment uses a RTP apparatus 10 as shown in FIG. 1 for a mirror-polished silicon wafer, and the surface W1 side on which the semiconductor device of the silicon wafer is formed is contact with the first space 20a to supply an inert gas as a first atmospheric gas F _a, the oxidizing gas is supplied as a second atmosphere gas F _B into the second space 20b of the rear surface W2 side of the silicon wafer is in contact, For example, the heat treatment sequence as shown in FIG.

  More specifically, a mirror-polished wafer W is placed in a reaction tube 20 held at a temperature T0 (for example, 600 ° C.), and the first space 20a where the surface W1 side of the wafer W on which the semiconductor device is formed contacts. An inert gas is supplied to the inside, and an oxidizing gas is supplied to the second space 20b where the back surface W2 side of the wafer W is in contact, and the temperature T1 (° C) is the highest temperature T1 (° C) of 1300 ° C to 1400 ° C. Is rapidly heated at a predetermined temperature increase rate ΔTu (° C./second) and then held at the maximum temperature T1 (° C.) for a predetermined time t (second), and the wafer W is transferred from the maximum temperature T1 (° C.) to the reaction tube. Rapid cooling is performed at a predetermined temperature decrease rate ΔTd (° C./second) to a temperature taken out 20 (for example, temperature T 0 (° C.)).

  The temperatures T0 and T1 described above can be measured by a radiation thermometer (not shown) installed below the wafer holder 30 when the RTP apparatus 10 as shown in FIG. 1 is used. When a plurality of the radiation thermometers are arranged in the radial direction of the wafer W, the average temperature can be set.

  As described above, according to the silicon wafer heat treatment method according to the present invention, the device active layer is provided even when the rapid heating / cooling heat treatment, which is the heat treatment in seconds, is used because the above-described embodiment is provided. Void defects can be greatly reduced in the surface and surface layer regions. Therefore, the silicon wafer subjected to the heat treatment according to the present invention can greatly contribute to the improvement of the yield in the device process.

  Next, a mechanism capable of obtaining this effect will be described.

  FIG. 3 is a wafer cross-sectional view for explaining the mechanism of reducing void defects by the silicon wafer heat treatment method according to this embodiment.

  In the rapid heating / cooling thermal processing according to the present embodiment, when an inert gas (argon in FIG. 3) is supplied to the front surface W1 side of the wafer and an oxidizing gas (not shown) is supplied to the back surface W2 side (FIG. 3). (A)) The inner wall oxide film of the void defect existing in the device active layer D is dissolved, and oxygen diffuses outward from the wafer surface at the surface portion Da of the device active layer D. Note that by supplying an oxidizing gas to the back surface W2 side of the wafer, a plurality of i-Si is generated on the back surface W2 side of the wafer. Since i-Si has a high diffusion speed in silicon, a plurality of i-Si diffuses from the back surface W2 side to the front surface W1 side of the wafer. Also, i-Si is generated in the surface portion Da by supplying an inert gas also on the surface W1 side of the wafer (FIG. 3B).

 For this reason, void defects present in the surface portion Da due to i-Si generated in the surface portion Da are present in the surface layer portion Db of the device active layer D due to i-Si diffused from the back surface W2 side of the wafer W. Each defect can be greatly reduced (FIG. 3C).

  When an oxidizing gas is supplied to the surface W1 side of the wafer, the solid solution oxygen concentration on the surface portion of the device active layer increases, so that the inner wall oxide film of the void defect becomes difficult to be dissolved and the void defect disappears. It may remain without.

  FIG. 4 is a wafer cross-sectional view for explaining a mechanism in which void defects remain on the surface portion of the device active layer when an oxidizing gas is supplied to the surface W1 side of the wafer.

In the rapid heating / cooling heat treatment, when an oxidizing gas (oxygen in FIG. 4) is supplied to the wafer surface W1 side (FIG. 4 (a)), oxygen in the atmosphere diffuses inward into the wafer. As a result, an oxide film (SiO ₂ ) is formed on the surface, and the concentration of dissolved oxygen in the surface portion Da of the device active layer D increases. The void defects existing in the surface portion Da may be slightly dissolved in the inner wall oxide film, but cannot be completely dissolved and remain in the void defects. On the other hand, in the surface layer portion Db of the device active layer D, the increase in the solid solution oxygen concentration due to the inward diffusion of oxygen does not occur, so that the inner wall oxide film of the void defect existing in the surface layer portion Db is dissolved (FIG. 4B). )).

  Accordingly, since the inner wall oxide film remains in the void defect at the surface portion Da, i-Si generated by the inward diffusion of oxygen cannot enter the void defect, and as a result, the surface portion Da. In FIG. 4, it is considered that void defects remain (FIG. 4C).

  If no oxidizing gas is supplied to the back surface W2 side of the wafer, the amount of i-Si generated on the front surface W1 side of the wafer is small in the rare gas atmosphere supplied to the front surface W1 side of the wafer. The region where the void defect can be eliminated by RTP, which is a short-time heat treatment of a unit, may be only the surface portion of the device active layer, and the void defect disappears in the surface layer portion below the surface portion. The force is reduced, and void defects may remain without disappearing.

  FIG. 5 is a wafer cross-sectional view for explaining a mechanism in which void defects remain in the surface layer portion of the device active layer when no oxidizing gas is supplied to the back surface W2 side of the wafer.

  In the rapid heating / cooling heat treatment, when the inert gas (argon in FIG. 5) is supplied to the front surface W1 side of the wafer and the oxidizing gas is not supplied to the back surface W2 side (FIG. 5 (a)), the device activity The inner wall oxide film of the void defect existing in the layer D is dissolved, and oxygen diffuses outward from the wafer surface at the front surface portion Da of the wafer, but the oxidizing gas is not supplied to the back surface W2 side of the wafer. The amount of i-Si generated is small and is generated only on the surface W1 side of the wafer (FIG. 5B).

  Therefore, although the void defect can be eliminated at the surface portion Da, since the amount of i-Si is small at the surface portion Db, the void defect cannot be eliminated and the void defect (the inner wall oxide film is dissolved). It is considered that a void defect is also left (FIG. 5C).

  Note that when the atmospheric gas supplied into the first space 20a is hydrogen, mixing of an oxidizing gas (for example, oxygen) and hydrogen gas supplied into the second space 20b has a risk of explosion. It is not preferable.

  Further, when the atmospheric gas supplied into the first space 20a or the second space 20b is nitrogen, a nitride film is formed on the surface of the wafer W in the rapid heating / cooling heat treatment, and the nitride film For removal, an etching process or the like must be newly performed, which is not preferable because the manufacturing process increases.

  Argon is preferably used as the inert gas supplied into the first space 20a. Further, oxygen is preferably used as the oxidizing gas supplied into the second space 20b.

  The maximum temperature T1 is 1300 ° C. or higher and 1400 ° C. or lower.

  By setting it as such temperature conditions, the extinction power of the void defect in a device active layer can be improved.

  When the maximum temperature T1 is less than 1300 ° C., the annihilation power of void defects in the device active layer is lowered, which is not preferable. When the maximum temperature T1 exceeds 1400 ° C., it becomes close to the melting point of silicon, which is not preferable because thermal deformation occurs in the silicon wafer and slip occurs.

  More preferably, the upper limit of the maximum temperature reached is 1380 ° C. or less from the viewpoint of the device life as the RTP device.

  The oxygen partial pressure in the oxidizing gas is preferably 20% or more and 100% or less.

  By setting such an oxygen partial pressure condition, a large amount of i-Si can be generated in the wafer, so that the annihilation power of void defects in the surface layer portion of the device active layer can be increased.

  When the oxygen partial pressure is less than 20%, the amount of i-Si formed in the wafer is small, and it is difficult to increase the extinction power of void defects in the surface layer portion.

  More preferably, the inert gas is 100% argon gas not containing oxygen, and the oxidizing gas is 100% oxygen gas.

  By setting it as such a structure, a void defect can be largely reduced more in the area | region of the surface part and surface layer part of a device active layer.

  The thickness of the oxide film formed on the back side of the silicon wafer after the rapid heating / cooling heat treatment is preferably 15 nm or more.

  By setting the film thickness of such an oxide film, a large amount of i-Si can be generated in the wafer, so that the extinction power of void defects in the surface layer portion of the device active layer can be increased.

  The holding time (t) at the maximum temperature T1 (° C.) is preferably 1 second to 15 seconds.

  By providing such a configuration, void defects can be greatly reduced in the surface and surface layer regions of the device active layer, and productivity can be greatly improved. In addition, when the holding time (t) is less than 1 second, the holding time (t) is short, so that void defects may not be reduced in the device active layer, which is not preferable.

  The temperature increase rate ΔTu is preferably 10 ° C./second or more and 150 ° C./second or less from the viewpoint of productivity, occurrence of slip at the time of RTP, and the like. Further, the temperature drop rate ΔTd is preferably 10 ° C./second or more and 150 ° C./second or less from the same viewpoint.

  EXAMPLES Hereinafter, although this invention is demonstrated further more concretely based on an Example, this invention is not restrict | limited by the following Example.

(Example 1, Comparative Examples 1-5)
A silicon single crystal ingot having a region in which vacancy-type point defects exist dominantly by controlling v / G (v: pulling speed, G: temperature gradient in the pulling axis direction in the single crystal) by the CZ method. An RTP as shown in FIG. 1 is applied to a wafer (300 mm in diameter, 775 mm in thickness) that is grown and then sliced from a region where vacancy-type point defects are dominantly present and whose surfaces are mirror-polished. A rapid heating / cooling heat treatment was performed using the apparatus 10.

In this case, waving first atmospheric gas F _A, the type of gas in the second ambient gas F _B, the maximum temperature T1 and the holding time t (seconds) respectively, subjected to RTP at heat treatment sequence shown in FIG. 2 It was.

  Other conditions (constant conditions) in this test are as follows.

-Temperature T0: 600 ° C
Temperature rising rate ΔTu: 10 ° C./second Temperature falling rate ΔTd: 10 ° C./second With respect to the annealed wafer obtained under the above conditions, LPD (Light Point Defect) on the wafer surface, which is the device formation surface, is expressed as KLA- Measurement was performed with Surfscan-SP2 (≧ 40 nm) manufactured by Tencor. In addition, by repeatedly polishing the wafer surface as a device forming surface, the LPD distribution in the depth direction from the wafer surface was measured in the same manner.

  Moreover, the LSTD (5 micrometers) measurement of the wafer surface which is a device formation surface was performed with respect to the annealed wafer obtained on each condition, and the reduction rate of defect density was computed. This measurement was performed with an LSTD (Laser Scattering Tomography Defect) scanner (MO-601 manufactured by Raytex).

  In addition, the center point of the front and back surfaces of the wafer was evaluated by the ellipsometry method using a three-wavelength automatic ellipsometer Auto Ru IV NIR III manufactured by Rudolf Research Analytical Co., Ltd.

Table 1 shows the test conditions in this test and the evaluation results in LSTD, and FIG. 6 shows the results of LPD measurements in this test (Example 1 and Comparative Examples 1 to 5). The vertical axis in FIG. 6 is the number of LPDs (number of void defects) when the number of LPDs by SP2 on the device formation surface of the polished wafer before RTP is 100%, and the horizontal axis is the capacitance method ( It is the distance from the wafer surface calculated from the wafer center thickness measured by KLA-Tencor AFS).

As can be seen from Table 1 and FIG. 6, it can be seen that in the annealed wafer obtained in Example 1, the void defects are greatly reduced in the surface portion and the surface layer portion of the device active layer. In Comparative Example 1 in which the maximum temperature T1 is lowered under similar atmospheric gas conditions, it is recognized that void defects remain. Furthermore, in Comparative Examples 2 and 3 using oxygen as the first atmospheric gas F _A , a tendency that many void defects remain in the surface portion of the device active layer is recognized in any case. Further, in Comparative Examples 4 and 5 without using oxygen as the second atmosphere gas F _B, void defects in the surface portion of the device active layer is greatly reduced, but tended to have void defects often remains in the deeper surface portion It is done.

DESCRIPTION OF SYMBOLS 10 RTP apparatus 20 Reaction tube 30 Wafer holding part 32 Susceptor 34 Rotating body 40 Heating part 50 Halogen lamp 60 Connection part

Claims (3)

A silicon wafer heat treatment method for performing heat treatment on a silicon wafer sliced from a silicon single crystal ingot grown by the Czochralski method,
An inert gas is supplied into the first space where the surface side of the silicon wafer on which the semiconductor device is formed is in contact, and an oxidizing gas is supplied into the second space where the back surface side of the silicon wafer is in contact. A method for heat treatment of a silicon wafer, characterized by performing rapid heating / cooling heat treatment at the highest temperature reached.   2. The method for heat-treating a silicon wafer according to claim 1, wherein an oxygen partial pressure in the oxidizing gas is 20% or more and 100% or less.   The silicon wafer heat treatment method according to claim 1 or 2, wherein a thickness of the oxide film formed on the back surface side of the silicon wafer after the rapid heating / cooling heat treatment is 15 nm or more.

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