JP2010256140A - 電気化学測定装置 - Google Patents
電気化学測定装置 Download PDFInfo
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- JP2010256140A JP2010256140A JP2009105690A JP2009105690A JP2010256140A JP 2010256140 A JP2010256140 A JP 2010256140A JP 2009105690 A JP2009105690 A JP 2009105690A JP 2009105690 A JP2009105690 A JP 2009105690A JP 2010256140 A JP2010256140 A JP 2010256140A
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Abstract
【解決手段】FETのゲート電極を作用極とし、対向極と参照極を備えた3極構造の電気化学測定装置であって、対向極とFETのソース電極との間に低周波電圧を印加して、FETのゲート電極と対向極との間に電圧を印加させる電圧印加手段と、FETのゲート電極と対向極の間に流れる変位電流を計測する変位電流計測手段とを備え、変位電流計測手段による測定結果にもとづいて電気化学測定を行うことを特徴とする電気化学測定装置。
【選択図】図8
Description
WE 作用極
RE 参照極
Vg ゲート電圧
R 高抵抗
Claims (4)
- FETのゲート電極を作用極とし、対向極と参照極を備えた3極構造の電気化学測定装置であって、対向極とFETのソース電極との間に低周波電圧を印加して、FETのゲート電極と対向極との間に電圧を印加させる電圧印加手段と、FETのゲート電極と対向極の間に流れる変位電流を計測する変位電流計測手段とを備え、変位電流計測手段による測定結果にもとづいて電気化学測定を行うことを特徴とする電気化学測定装置。
- ゲート絶縁抵抗を介して溶液に電圧分割分配して電圧印加するためにFETのゲート電極の面積を制御することにより、ゲート絶縁抵抗に比較して溶液のインピーダンスを大きくすることを特徴とする請求項1に記載の電気化学測定装置。
- 対向極と作用極の間のインピーダンスに近いインピーダンスを有する素子を作用極と接地極の間に設けたことを特徴とする請求項1又は2に記載の電気化学測定装置。
- 前記素子のインピーダンスが制御信号により可変であることを特徴とする請求項3に記載の電気化学測定装置。
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JP2009105690A JP5540252B2 (ja) | 2009-04-23 | 2009-04-23 | 電気化学測定装置 |
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JP2009105690A JP5540252B2 (ja) | 2009-04-23 | 2009-04-23 | 電気化学測定装置 |
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JP2010256140A true JP2010256140A (ja) | 2010-11-11 |
JP5540252B2 JP5540252B2 (ja) | 2014-07-02 |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6138557A (ja) * | 1984-07-31 | 1986-02-24 | Toshiba Corp | 溶存物質の分析方法 |
JPS61181951A (ja) * | 1985-02-08 | 1986-08-14 | Seitai Kinou Riyou Kagakuhin Shinseizou Gijutsu Kenkyu Kumiai | イオン濃度測定装置 |
JP2004309462A (ja) * | 2003-02-26 | 2004-11-04 | Toshiba Corp | 核酸濃度定量分析チップ、核酸濃度定量分析装置および核酸濃度定量分析方法 |
JP2007263914A (ja) * | 2006-03-30 | 2007-10-11 | Hitachi Ltd | 測定装置及び分析用素子 |
WO2008007716A1 (en) * | 2006-07-13 | 2008-01-17 | National University Corporation Nagoya University | Material detection device |
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2009
- 2009-04-23 JP JP2009105690A patent/JP5540252B2/ja not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6138557A (ja) * | 1984-07-31 | 1986-02-24 | Toshiba Corp | 溶存物質の分析方法 |
JPS61181951A (ja) * | 1985-02-08 | 1986-08-14 | Seitai Kinou Riyou Kagakuhin Shinseizou Gijutsu Kenkyu Kumiai | イオン濃度測定装置 |
JP2004309462A (ja) * | 2003-02-26 | 2004-11-04 | Toshiba Corp | 核酸濃度定量分析チップ、核酸濃度定量分析装置および核酸濃度定量分析方法 |
JP2007263914A (ja) * | 2006-03-30 | 2007-10-11 | Hitachi Ltd | 測定装置及び分析用素子 |
WO2008007716A1 (en) * | 2006-07-13 | 2008-01-17 | National University Corporation Nagoya University | Material detection device |
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