JP2010251527A - Electronic component, and method of manufacturing electronic component - Google Patents

Electronic component, and method of manufacturing electronic component Download PDF

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JP2010251527A
JP2010251527A JP2009099457A JP2009099457A JP2010251527A JP 2010251527 A JP2010251527 A JP 2010251527A JP 2009099457 A JP2009099457 A JP 2009099457A JP 2009099457 A JP2009099457 A JP 2009099457A JP 2010251527 A JP2010251527 A JP 2010251527A
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semiconductor element
circuit board
thermosetting resin
electronic component
frame
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JP5414336B2 (en
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Kojiro Nakamura
浩二郎 中村
Yoshihiro Tomura
善広 戸村
Masahiro Ono
正浩 小野
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Panasonic Corp
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Panasonic Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • H01L2224/113Manufacturing methods by local deposition of the material of the bump connector
    • H01L2224/1133Manufacturing methods by local deposition of the material of the bump connector in solid form
    • H01L2224/1134Stud bumping, i.e. using a wire-bonding apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/27Manufacturing methods
    • H01L2224/273Manufacturing methods by local deposition of the material of the layer connector
    • H01L2224/2733Manufacturing methods by local deposition of the material of the layer connector in solid form
    • H01L2224/27334Manufacturing methods by local deposition of the material of the layer connector in solid form using preformed layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector

Abstract

<P>PROBLEM TO BE SOLVED: To provide an electronic component of high quality which does not have a semiconductor element damaged when made thin, and to provide a method of manufacturing the same. <P>SOLUTION: While the semiconductor element 104 is pressed and heated through a metal frame 306 to join bumps 105 on the semiconductor element 104 to substrate electrodes 102 on a circuit board 101 by a thermosetting resin film 301, the metal frame 306 is bonded with the same thermosetting resin film 301 and solidification is carried out. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は、半導体素子を回路基板にフリップチップ実装した電子部品とその製造方法に関する。   The present invention relates to an electronic component in which a semiconductor element is flip-chip mounted on a circuit board and a manufacturing method thereof.

近年の携帯情報端末の小型化、軽量化による電子部品の高密度化、小型化、軽量化に伴い、フリップチップ接続によるCSP(Chip Sized Package)やMCM(Multi Chip Module)が必要とされている。   With recent downsizing and weight reduction of portable information terminals, electronic components are becoming denser, smaller, and lighter, so that CSP (Chip Sized Package) and MCM (Multi Chip Module) by flip chip connection are required. .

図10は特許文献1に記載されたフリップチップ実装方法を断面図で示したものである。回路基板101の表面には基板電極102や配線103が形成されている。この回路基板101に搭載される半導体素子104には、回路基板101と対向する面にバンプ105が形成されている。   FIG. 10 is a sectional view showing the flip chip mounting method described in Patent Document 1. In FIG. Substrate electrodes 102 and wirings 103 are formed on the surface of the circuit board 101. The semiconductor element 104 mounted on the circuit board 101 has bumps 105 formed on the surface facing the circuit board 101.

この回路基板101の基板電極102と半導体素子104のバンプ105とを位置合わせし、ボンディングツール106にて半導体素子104を回路基板101に加圧、加熱することにより実装する。この際、基板電極102とバンプ105を電気的に接続する方法として異方性導電フィルム107を介在させる方法がある。   The substrate electrode 102 of the circuit board 101 and the bumps 105 of the semiconductor element 104 are aligned, and the semiconductor element 104 is pressed and heated on the circuit board 101 by the bonding tool 106 and mounted. At this time, there is a method of interposing an anisotropic conductive film 107 as a method of electrically connecting the substrate electrode 102 and the bump 105.

異方性導電フィルム107は、微細な導電粒子108を分散させた熱硬化性または熱可塑性の樹脂フィルムで、半導体素子104と回路基板101との間で加圧、加熱されることにより、軟化、流動化して、半導体素子104の下全体に押し広げられて回路基板101と接着、固化される。また、半導体素子104のバンプ105と回路基板101の基板電極102の間には、導電粒子108が挟まれ電気的接続が得られる。   The anisotropic conductive film 107 is a thermosetting or thermoplastic resin film in which fine conductive particles 108 are dispersed, and is softened by being pressed and heated between the semiconductor element 104 and the circuit board 101. It is fluidized and spreads over the entire surface of the semiconductor element 104 to be bonded and solidified with the circuit board 101. In addition, conductive particles 108 are sandwiched between the bumps 105 of the semiconductor element 104 and the substrate electrodes 102 of the circuit board 101 to obtain electrical connection.

なお、ボンディングツール106に異方性導電フィルム107が付着しないように、ボンディングツール106と半導体素子104の間に、例えばフッ素系樹脂を用いた樹脂シート状部材109を挟んでおいて加圧、加熱を行う。   In order to prevent the anisotropic conductive film 107 from adhering to the bonding tool 106, for example, a resin sheet-like member 109 using a fluorine-based resin is sandwiched between the bonding tool 106 and the semiconductor element 104, and pressure and heating are performed. I do.

特開2001−127105号公報JP 2001-127105 A

このように樹脂シート状部材109をボンディングツール106と半導体素子104の間に挟んで加圧、加熱を行う場合、半導体素子104上のバンプ105が配置されている部分とバンプ105が配置されていない部分とで、図11に示すように樹脂シート状部材109の変形に差異が生じる。樹脂シート状部材109の弾性率は1GPa以下である。   In this way, when the resin sheet-like member 109 is sandwiched between the bonding tool 106 and the semiconductor element 104 and pressed and heated, the portion on the semiconductor element 104 where the bump 105 is disposed and the bump 105 are not disposed. As shown in FIG. 11, there is a difference in the deformation of the resin sheet-like member 109. The elastic modulus of the resin sheet-like member 109 is 1 GPa or less.

すなわち、バンプ105が配置されている部分の樹脂シート状部材109の変形は、バンプ105が配置されていない部分の樹脂シート状部材109の変形よりも大きく、そのため、半導体素子104がバンプ105を支点として大きく曲げられる現象が発生する。   That is, the deformation of the resin sheet-like member 109 in the portion where the bump 105 is arranged is larger than the deformation of the resin sheet-like member 109 in the portion where the bump 105 is not arranged. As a result, the phenomenon of being bent greatly occurs.

この場合、特に半導体素子104が薄型化した場合、バンプ105の近傍に加圧時の応力が集中し、半導体素子104が損傷するという課題を有している。さらに、異方性導電フィルム107の樹脂中のシリカ110によって半導体素子104が破壊されることがある。   In this case, particularly when the semiconductor element 104 is thinned, there is a problem that stress at the time of pressing is concentrated near the bump 105 and the semiconductor element 104 is damaged. Furthermore, the semiconductor element 104 may be destroyed by the silica 110 in the resin of the anisotropic conductive film 107.

本発明は、前記従来の課題を解決するもので、特に半導体素子の薄型化に対して半導体素子を損傷しない高品質な電子部品とその製造方法を提供することを目的とする。   An object of the present invention is to solve the above-described conventional problems, and in particular, to provide a high-quality electronic component that does not damage a semiconductor element with respect to the thinning of the semiconductor element and a method for manufacturing the same.

本発明の請求項1記載の電子部品は、主面にバンプを有する半導体素子と、前記半導体素子の前記バンプに当接して導通した基板電極を有する回路基板と、前記半導体素子と前記回路基板との間に位置する熱硬化性樹脂と、材質が硬質で、前記半導体素子の前記主面とは反対側の面に直接または接着層を介して当接し外周部のうちの少なくとも前記半導体素子の前記バンプが形成されている辺に対応する部分が前記回路基板の側に近接して前記熱硬化性樹脂によって前記回路基板に接着されている枠とを有していることを特徴とする。   According to a first aspect of the present invention, there is provided an electronic component comprising: a semiconductor element having a bump on a main surface; a circuit board having a substrate electrode in contact with the bump of the semiconductor element; and the semiconductor element and the circuit board. A thermosetting resin located between and a material that is hard, and abuts directly or via an adhesive layer on a surface opposite to the main surface of the semiconductor element, and at least the semiconductor element of the outer peripheral portion A portion corresponding to a side on which the bump is formed has a frame that is adjacent to the circuit board side and is bonded to the circuit board by the thermosetting resin.

本発明の請求項2記載の電子部品は、請求項1において、前記枠は、前記半導体素子を内部に含む凹型の形状であることを特徴とする。
本発明の請求項3記載の電子部品は、請求項1において、前記枠は、金属板を切り欠きで折り曲げられたものであることを特徴とする。
According to a second aspect of the present invention, in the electronic component according to the first aspect, the frame has a concave shape including the semiconductor element therein.
According to a third aspect of the present invention, in the electronic component according to the first aspect, the frame is formed by bending a metal plate with a notch.

本発明の請求項4記載の電子部品は、請求項2または請求項3において、前記枠は、前記回路基板に近接して前記回路基板の実装面に沿って延びる鍔部が形成されていることを特徴とする。   According to a fourth aspect of the present invention, in the electronic component according to the second or third aspect, the frame is formed with a flange extending along the mounting surface of the circuit board in the vicinity of the circuit board. It is characterized by.

本発明の請求項5記載の電子部品の製造方法は、回路基板に熱硬化性樹脂を供給する工程と、半導体素子を前記半導体素子上のバンプが前記回路基板上の基板電極に合致する位置決め状態で前記熱硬化性樹脂を介し前記回路基板に搭載する工程と、前記半導体素子を被覆する形状の枠を前記半導体素子上に搭載する工程と、前記枠を前記回路基板に押し付ける方向に加圧しながら加熱する工程とを有し、前記回路基板に前記バンプを電気的接続状態に圧着するとともに前記熱硬化性樹脂にて前記枠を前記回路基板に接着固定することを特徴とする。   According to a fifth aspect of the present invention, there is provided a method of manufacturing an electronic component comprising: supplying a thermosetting resin to a circuit board; and positioning the semiconductor element so that bumps on the semiconductor element match a substrate electrode on the circuit board. The step of mounting on the circuit board through the thermosetting resin, the step of mounting a frame having a shape covering the semiconductor element on the semiconductor element, and pressurizing the frame against the circuit board And heating and bonding the bumps to the circuit board in an electrically connected state, and bonding and fixing the frame to the circuit board with the thermosetting resin.

本発明の請求項6記載の電子部品の製造方法は、回路基板に第1熱硬化性樹脂を供給する工程と、半導体素子を前記半導体素子上のバンプが前記回路基板上の基板電極に合致する位置決め状態で前記熱硬化性接着を介し前記回路基板に搭載する工程と、前記半導体素子上に第2熱硬化性樹脂を供給する工程と、前記半導体素子を被覆する寸法の硬質板を前記半導体素子上に前記第2熱硬化性樹脂を介して搭載する工程と、凹部を有する加圧用ジグを前記半導体素子に被せて前記硬質板を前記回路基板に押し付ける方向に加圧しながら加熱する工程とを有し、前記回路基板に前記バンプを電気的接続状態に圧着すると同時に、前記半導体素子上の前記熱硬化性樹脂を熱硬化させ、さらに同時に前記硬質板を前記半導体素子が被覆される形状に変形させながら、前記熱硬化性樹脂にて前記硬質板を前記回路基板に接着固定する。   According to a sixth aspect of the present invention, there is provided a method for manufacturing an electronic component, comprising: supplying a first thermosetting resin to a circuit board; and bumps on the semiconductor element are aligned with substrate electrodes on the circuit board. A step of mounting on the circuit board through the thermosetting adhesion in a positioning state; a step of supplying a second thermosetting resin on the semiconductor element; and a hard plate having a size covering the semiconductor element. A step of mounting via the second thermosetting resin, and a step of heating while pressing the hard plate against the circuit board by covering the semiconductor element with a pressing jig having a recess. At the same time, the bumps are crimped to the circuit board in an electrically connected state, and at the same time, the thermosetting resin on the semiconductor element is thermoset, and at the same time, the hard plate is changed to a shape that covers the semiconductor element. Is allowed while, adhered and fixed the rigid plate to the circuit board by the thermosetting resin.

この構成によれば、半導体素子の薄型化に対して、半導体素子を損傷しない高品質な電子部品を高生産で提供することができる。   According to this configuration, it is possible to provide a high-quality electronic component that does not damage the semiconductor element with high production as the semiconductor element becomes thinner.

本発明の実施の形態1の電子部品の製造工程の説明図Explanatory drawing of the manufacturing process of the electronic component of Embodiment 1 of this invention スタッドバンプの形成工程の説明図Illustration of the stud bump formation process 同実施の形態の完成した電子部品の拡大斜視図Enlarged perspective view of the completed electronic component of the same embodiment 同実施の形態の完成した電子部品の断面図Sectional view of the completed electronic component of the same embodiment 同実施の形態の別の例の電子部品の断面図Sectional drawing of the electronic component of another example of the same embodiment 本発明の実施の形態2の電子部品の製造工程の説明図Explanatory drawing of the manufacturing process of the electronic component of Embodiment 2 of this invention 同実施の形態の完成した電子部品の断面図Sectional view of the completed electronic component of the same embodiment 同実施の形態に使用する金属板の平面図Plan view of metal plate used in the same embodiment 本発明の実施の形態1,2の平面図と別の例の平面図The top view of Embodiment 1, 2 of this invention and the top view of another example 従来の製造工程の断面図Cross-sectional view of conventional manufacturing process 同従来例の説明図Illustration of the conventional example

以下、本発明の各実施の形態を図1〜図9に基づいて説明する。
(実施の形態1)
本発明の実施の形態1における電子部品の製造方法およびその方法により製造される電子部品の構造を図1〜図4に基づいて説明する。
Hereinafter, each embodiment of the present invention will be described with reference to FIGS.
(Embodiment 1)
A method for manufacturing an electronic component according to Embodiment 1 of the present invention and the structure of the electronic component manufactured by the method will be described with reference to FIGS.

図2はワイヤボンディング技術を利用したバンプ形成方法を工程順に示した断面図であり、図1は電子部品の製造方法を工程順に示した断面図であり、図4は図1により製造された電子部品の断面図を示す。   2 is a cross-sectional view showing a bump forming method using wire bonding technology in the order of steps, FIG. 1 is a cross-sectional view showing a method of manufacturing an electronic component in the order of steps, and FIG. 4 is an electronic device manufactured according to FIG. Sectional drawing of components is shown.

図2に示すバンプ形成方法は、ワイヤボンディング技術を利用し、Au線201の先端にスパーク放電を用いてAuボール202を形成し(図2(a))、Auボール202を保持するキャピラリ203を下降し、Auボール202が加熱ステージにより加熱された半導体素子104のパッド電極204に接触し、その後加圧力と超音波が印加されて接合が完了する(図2(b))。その後、一定量Au線201を引き出した後、Au線201をクランプしてキャピラリ203が上昇すると、Au線201が引きちぎられ、バンプ105の形成が完了する(図2(c))。パッド電極204の材質は一般的にAlを主材料とし、SiやCuを含むAl化合物である。   The bump forming method shown in FIG. 2 uses wire bonding technology to form an Au ball 202 at the tip of the Au wire 201 using spark discharge (FIG. 2A), and a capillary 203 that holds the Au ball 202 is formed. Then, the Au ball 202 comes into contact with the pad electrode 204 of the semiconductor element 104 heated by the heating stage, and thereafter, pressure and ultrasonic waves are applied to complete the bonding (FIG. 2B). Thereafter, after a certain amount of Au wire 201 is drawn out, when the Au wire 201 is clamped and the capillary 203 is raised, the Au wire 201 is torn off and the formation of the bump 105 is completed (FIG. 2C). The material of the pad electrode 204 is generally an Al compound mainly containing Al and containing Si or Cu.

半導体素子104のパッド電極204の間のピッチが120μmのとき、バンプ105の直径は85μm、バンプ105の台座部の高さは25μmとする。これらの形状はバンプ105の材質、バンプ105の形成条件、ボンディング条件により、±3〜10μm程度は調整できる。   When the pitch between the pad electrodes 204 of the semiconductor element 104 is 120 μm, the diameter of the bump 105 is 85 μm, and the height of the pedestal of the bump 105 is 25 μm. These shapes can be adjusted to about ± 3 to 10 μm depending on the material of the bump 105, the formation condition of the bump 105, and the bonding condition.

図1(a)に示す回路基板101の基板電極102の上に、図1(b)では、半導体素子104の大きさより1mm程度大きな寸法にてカットされた熱硬化性樹脂フィルム301を配置し、貼り付けツール303により熱硬化性樹脂フィルム301を貼り付ける。貼り付けツール303は内蔵したヒータ302にて70〜120℃に加熱されており、5〜10kgf/cm程度の圧力で熱硬化性樹脂フィルム301を回路基板101の基板電極102の上に貼り付ける。 On the substrate electrode 102 of the circuit board 101 shown in FIG. 1 (a), in FIG. 1 (b), a thermosetting resin film 301 cut to a size about 1 mm larger than the size of the semiconductor element 104 is disposed. The thermosetting resin film 301 is pasted by the pasting tool 303. The affixing tool 303 is heated to 70 to 120 ° C. by a built-in heater 302 and a thermosetting resin film 301 is affixed on the substrate electrode 102 of the circuit board 101 at a pressure of about 5 to 10 kgf / cm 2. .

貼り付けツール303により熱硬化性樹脂フィルム301を貼り付ける時に、貼り付けツール303に熱硬化性樹脂フィルム301が貼り付くことを防止するために、熱硬化性樹脂フィルム301にはセパレータ304が貼り付けられた状態になっており、熱硬化性樹脂フィルム301を回路基板101に貼り付けた後にセパレータ304が熱硬化性樹脂フィルム301から剥がされる。   In order to prevent the thermosetting resin film 301 from sticking to the attaching tool 303 when the thermosetting resin film 301 is attached by the attaching tool 303, a separator 304 is attached to the thermosetting resin film 301. In this state, the separator 304 is peeled off from the thermosetting resin film 301 after the thermosetting resin film 301 is attached to the circuit board 101.

熱硬化性樹脂フィルム301は、シリカなどの無機系フィラーを含有した絶縁性を有するもの(例えば、エポキシ樹脂、フェノール樹脂、ポリイミドなど)、無機系フィラーを全く含有しない絶縁性を有するもの(例えば、エポキシ樹脂、フェノール樹脂、ポリイミドなど)が好ましいとともに、後工程におけるリフロー工程での高温に耐えうる耐熱性(例えば、260℃下で10秒間耐えうる程度の耐熱性)を有することが好ましい。   The thermosetting resin film 301 has an insulating property containing an inorganic filler such as silica (for example, an epoxy resin, a phenol resin, a polyimide, etc.), or has an insulating property not containing any inorganic filler (for example, An epoxy resin, a phenol resin, a polyimide, etc.) are preferable, and it is preferable to have heat resistance that can withstand high temperatures in a reflow process in a later step (for example, heat resistance that can withstand 10 seconds at 260 ° C.).

図1(c)では、図2の工程によって半導体素子104のパッド電極204上にバンプ105が形成された半導体素子104を、バンプ105の位置が前記の熱硬化性樹脂フィルム301が貼り付けられた回路基板101の基板電極102の位置に対応するように位置合わせして、吸着ツール305により回路基板101に押圧して搭載する。このとき吸着ツール305の温度は環境下とほぼ同程度の温度であり、熱硬化性樹脂フィルム301が熱硬化反応を開始する反応開始温度以下である。   In FIG. 1C, the semiconductor element 104 in which the bump 105 is formed on the pad electrode 204 of the semiconductor element 104 by the process of FIG. 2 is attached to the thermosetting resin film 301 at the position of the bump 105. The circuit board 101 is positioned so as to correspond to the position of the substrate electrode 102, and is pressed and mounted on the circuit board 101 by the suction tool 305. At this time, the temperature of the adsorption tool 305 is substantially the same as that in the environment, and is equal to or lower than the reaction start temperature at which the thermosetting resin film 301 starts the thermosetting reaction.

図1(d)では、枠としての金属枠306が吸着ツール307によりホールドされて、半導体素子104を被覆するように位置合わせして半導体素子104の上に搭載する。従来例で使用されていた樹脂シート状部材109の弾性率が1GPa以下であったのに対して、金属枠306はそれよりも弾性率が大きく、具体的には3GPa以上が好ましい。金属枠306は半導体素子の大きさと略同一サイズであり、半導体素子104を被覆できるようにあらかじめ凹部が形成された形状をしたものが好ましい。半導体素子104の外形寸法を6mm×6mmとすると、前記凹部の内径寸法は半導体素子104の寸法公差を考慮し、6.1mm×6.1mm〜6.2mm×6.2mm程度が好ましい。厚みは立体形状を維持するために0.1mm〜0.35mm程度が好ましい。また、材質は次工程での押圧、加熱に対して変形しない金属、例えば、SUS、洋白、リン青銅などが好ましい。吸着ツール307の温度は環境下とほぼ同程度の温度であり、熱硬化性樹脂フィルム301が熱硬化反応を開始する反応開始温度以下である。   In FIG. 1D, the metal frame 306 as a frame is held by the suction tool 307, aligned so as to cover the semiconductor element 104, and mounted on the semiconductor element 104. The elastic modulus of the resin sheet-like member 109 used in the conventional example is 1 GPa or less, whereas the metal frame 306 has a higher elastic modulus, specifically, 3 GPa or more is preferable. The metal frame 306 is substantially the same size as the semiconductor element, and preferably has a shape in which a recess is formed in advance so that the semiconductor element 104 can be covered. When the outer dimension of the semiconductor element 104 is 6 mm × 6 mm, the inner diameter dimension of the recess is preferably about 6.1 mm × 6.1 mm to 6.2 mm × 6.2 mm in consideration of the dimensional tolerance of the semiconductor element 104. The thickness is preferably about 0.1 mm to 0.35 mm in order to maintain a three-dimensional shape. The material is preferably a metal that is not deformed by pressing or heating in the next step, such as SUS, white, phosphor bronze, or the like. The temperature of the adsorption tool 307 is approximately the same temperature as the environment, and is equal to or lower than the reaction start temperature at which the thermosetting resin film 301 starts the thermosetting reaction.

図1(e)と図1(f)では、ヒータ308により加熱された圧着ツール309により金属枠306を押圧、加熱することにより、位置合わせされた半導体素子104も押圧、加熱され、接合が完了する。   1E and 1F, the metal frame 306 is pressed and heated by the crimping tool 309 heated by the heater 308, whereby the aligned semiconductor element 104 is also pressed and heated to complete the bonding. To do.

このときバンプ105は、押圧されることにより回路基板101の基板電極102上で変形されながら押し付けられていく。このとき、押圧は最低でも20gf必要であり、半導体素子104、バンプ105、回路基板101を損傷しない程度の荷重を印加する。また、このとき、加熱された圧着ツール309により半導体素子104と回路基板101の間の熱硬化性樹脂フィルム301には170℃〜250℃程度の熱が数秒〜30秒程度印加され、この熱硬化性樹脂フィルム301が熱硬化され、半導体素子104は硬化した熱硬化性樹脂310により回路基板101上に固定される。また、同時に金属枠306も熱硬化性樹脂310により回路基板101上に固定される。以上の工程により得られる電子部品の構造を図3と図4に示す。   At this time, the bump 105 is pressed while being deformed on the substrate electrode 102 of the circuit board 101 by being pressed. At this time, the pressure is required to be at least 20 gf, and a load that does not damage the semiconductor element 104, the bump 105, and the circuit board 101 is applied. At this time, heat of about 170 ° C. to 250 ° C. is applied to the thermosetting resin film 301 between the semiconductor element 104 and the circuit board 101 by the heated crimping tool 309 for about several seconds to 30 seconds. The thermosetting resin film 301 is thermally cured, and the semiconductor element 104 is fixed on the circuit board 101 by the cured thermosetting resin 310. At the same time, the metal frame 306 is also fixed on the circuit board 101 by the thermosetting resin 310. The structure of the electronic component obtained by the above steps is shown in FIGS.

ここでは熱硬化性樹脂310としてフィルム状のものを用いた場合について説明を行ったが、熱硬化性樹脂310の形態は液状のものでもよい。
また、金属枠306の形状は図5のような形状でもよい。つまり、金属枠306には鍔部306aが形成されている。このとき、金属枠306と回路基板101との接着面積がさらに広くなるため、金属枠306をさらに強固に回路基板101と接着することが可能である。
Here, the case where a film-like resin is used as the thermosetting resin 310 has been described, but the thermosetting resin 310 may be in a liquid form.
Further, the shape of the metal frame 306 may be as shown in FIG. That is, the collar portion 306 a is formed on the metal frame 306. At this time, since the bonding area between the metal frame 306 and the circuit board 101 is further increased, the metal frame 306 can be bonded to the circuit board 101 more firmly.

かかる構成によれば、従来使用されていた樹脂シート状部材109に比べて硬質の金属枠306を介して、半導体素子104を回路基板101に押圧するので、半導体素子104のバンプ105の近傍には応力が集中しないため、薄型の半導体素子104に対しても高品質に実装することが可能である。   According to such a configuration, the semiconductor element 104 is pressed against the circuit board 101 via the hard metal frame 306 as compared with the resin sheet-like member 109 that has been conventionally used. Since stress is not concentrated, it is possible to mount the thin semiconductor element 104 with high quality.

また、金属枠306で半導体素子101を覆っているのでシールド効果を有する。また、部分的に加圧しないので、樹脂中のシリカなどのフィラーで半導体素子101が破壊されることもない。   Further, since the semiconductor element 101 is covered with the metal frame 306, it has a shielding effect. Moreover, since it does not pressurize partially, the semiconductor element 101 is not destroyed by a filler such as silica in the resin.

(実施の形態2)
本発明の実施の形態2における電子部品の製造方法およびその方法により製造される電子部品の構造を図6および図7に基づいて説明する。
(Embodiment 2)
A method for manufacturing an electronic component and a structure of the electronic component manufactured by the method according to Embodiment 2 of the present invention will be described with reference to FIGS.

図6は電子部品の製造方法を工程順に示した断面図であり、図7は図6により製造された電子部品の断面図を示す。
ワイヤボンディング技術を利用して半導体素子104上にバンプ105を形成する方法は実施の形態1における図2と同じであるため、ここでは説明を省略する。
FIG. 6 is a cross-sectional view showing a method of manufacturing an electronic component in the order of steps, and FIG. 7 is a cross-sectional view of the electronic component manufactured according to FIG.
Since the method of forming the bump 105 on the semiconductor element 104 using the wire bonding technique is the same as that in FIG. 2 in Embodiment Mode 1, description thereof is omitted here.

図6(a)と図6(b)では、回路基板101の基板電極102上に半導体素子104の大きさより1mm程度大きな寸法にてカットされた熱硬化性樹脂フィルム301を配置し、内蔵したヒータ302にて70〜120℃に加熱された貼り付けツール303により5〜10kgf/cm程度の圧力で熱硬化性樹脂フィルム301を回路基板101の基板電極102上に貼り付ける。この後、熱硬化性樹脂フィルム301の貼り付けツール303側に取り外し可能に配置されたセパレータ304を剥がすことにより回路基板101の準備工程が完了する。 In FIG. 6A and FIG. 6B, a thermosetting resin film 301 cut to a size approximately 1 mm larger than the size of the semiconductor element 104 is disposed on the substrate electrode 102 of the circuit substrate 101, and a built-in heater. The thermosetting resin film 301 is pasted on the substrate electrode 102 of the circuit board 101 at a pressure of about 5 to 10 kgf / cm 2 by the pasting tool 303 heated to 70 to 120 ° C. in 302. Then, the preparation process of the circuit board 101 is completed by removing the separator 304 detachably disposed on the affixing tool 303 side of the thermosetting resin film 301.

このセパレータ304は、貼り付けツール303に熱硬化性樹脂フィルム301が貼り付くことを防止するためのものである。ここで、熱硬化性樹脂フィルム301は、シリカなどの無機系フィラーを含有した絶縁性を有するもの(例えば、エポキシ樹脂、フェノール樹脂、ポリイミドなど)、無機系フィラーを全く含有しない絶縁性を有するもの(例えば、エポキシ樹脂、フェノール樹脂、ポリイミドなど)が好ましいとともに、後工程におけるリフロー工程での高温に耐えうる耐熱性(例えば、260℃の環境下で10秒間耐えうる程度の耐熱性)を有することが好ましい。   The separator 304 is for preventing the thermosetting resin film 301 from sticking to the sticking tool 303. Here, the thermosetting resin film 301 has an insulating property containing an inorganic filler such as silica (for example, an epoxy resin, a phenol resin, a polyimide, etc.), or has an insulating property not containing any inorganic filler. (For example, epoxy resin, phenol resin, polyimide, etc.) are preferable and have heat resistance that can withstand high temperatures in a reflow process in a later process (for example, heat resistance that can withstand 10 seconds in an environment of 260 ° C.). Is preferred.

図6(c)では、図2の工程によって半導体素子104のパッド電極204上にバンプ105が形成された半導体素子104を、バンプ105の位置が前記の熱硬化性樹脂フィルム301が貼り付けられた回路基板101の基板電極102の位置に対応するように位置合わせして、吸着ツール305により回路基板101に押圧して搭載する。このとき吸着ツール305の温度は環境下とほぼ同程度の温度であり、熱硬化性樹脂フィルム301が熱硬化反応を開始する反応開始温度以下である。   6C, the semiconductor element 104 in which the bump 105 is formed on the pad electrode 204 of the semiconductor element 104 by the process of FIG. 2 is attached to the thermosetting resin film 301 at the position of the bump 105. The circuit board 101 is positioned so as to correspond to the position of the substrate electrode 102, and is pressed and mounted on the circuit board 101 by the suction tool 305. At this time, the temperature of the adsorption tool 305 is substantially the same as that in the environment, and is equal to or lower than the reaction start temperature at which the thermosetting resin film 301 starts the thermosetting reaction.

図6(d)では、半導体素子104上に硬質板としての金属板401を固定するための接着層としての熱硬化性樹脂402を供給する。ここで金属板401は、従来使用されていた樹脂シート状部材109に比べて硬質である。   In FIG. 6D, a thermosetting resin 402 as an adhesive layer for fixing the metal plate 401 as a hard plate on the semiconductor element 104 is supplied. Here, the metal plate 401 is harder than the conventionally used resin sheet member 109.

図6(e)では、従来使用されていた樹脂シート状部材109に比べて硬質の硬質板としての金属板401を半導体素子104を被覆するように位置合わせして吸着ツール307により半導体素子104上に搭載する。金属板401は半導体素子104の大きさに半導体素子104の厚みの2倍と接続時の半導体素子104の主面と回路基板101との間隙の寸法を加算した寸法が好ましい。またその形状は図8に示すように十字の形状が好ましい。金属板401にはあらかじめ半導体素子104の大きさと略同一寸法の位置に切り欠き401aを設けておく。半導体素子104の外形寸法を6mm×6mm、半導体素子104の厚みを0.1mmとすると、金属板401の外形寸法は半導体素子104の寸法公差を考慮し、6.2mm×6.2mm〜6.3mm×6.3mm程度が好ましい。厚みは平板形状が後工程での押圧、加熱工程にて折り曲げられやすいよう0.02mm〜0.3mm程度が好ましい。厚みが0.1mm以上の金属板401に対しては、後工程での押圧、加熱工程にて折り曲げられやすいように6.1mm×6.1mmの寸法に切り欠きを設けることが好ましい。また、材質は次工程での押圧、加熱に対して変形しない金属、例えば、SUS、洋白、リン青銅、アルミなどが好ましい。具体的には、アルミの場合の厚みは0.02mm、洋白の場合の厚みは0.3mmであった。   In FIG. 6 (e), the metal plate 401, which is harder than the conventionally used resin sheet-like member 109, is aligned so as to cover the semiconductor element 104, and the semiconductor element 104 is placed on the semiconductor element 104 by the suction tool 307. To be installed. The metal plate 401 preferably has a size obtained by adding the size of the semiconductor element 104 to twice the thickness of the semiconductor element 104 and the size of the gap between the main surface of the semiconductor element 104 and the circuit board 101 when connected. The shape is preferably a cross as shown in FIG. The metal plate 401 is previously provided with a notch 401a at a position substantially the same size as the semiconductor element 104. When the outer dimensions of the semiconductor element 104 are 6 mm × 6 mm and the thickness of the semiconductor element 104 is 0.1 mm, the outer dimensions of the metal plate 401 are 6.2 mm × 6.2 mm to 6. mm in consideration of the dimensional tolerance of the semiconductor element 104. About 3 mm x 6.3 mm is preferable. The thickness is preferably about 0.02 mm to 0.3 mm so that the flat plate shape can be easily bent in the pressing and heating process in the subsequent process. For the metal plate 401 having a thickness of 0.1 mm or more, it is preferable to provide a notch with a size of 6.1 mm × 6.1 mm so that the metal plate 401 can be easily bent in the subsequent pressing and heating processes. The material is preferably a metal that does not deform with respect to pressing and heating in the next step, such as SUS, white, phosphor bronze, and aluminum. Specifically, the thickness in the case of aluminum was 0.02 mm, and the thickness in the case of Western white was 0.3 mm.

図6(f)では、ヒータ403により加熱された圧着ツール404により金属板401を押圧、加熱する。
このとき、圧着ツール404は凹型の形状とし、凹部の内部寸法は外形が半導体素子104の大きさに金属板401の厚みの2倍を加算した寸法と略同一する。また深さは接続後の回路基板101の上面から金属板401の上面までの高さと略同一とする。半導体素子104の外形寸法を6mm×6mm、半導体素子104の厚みを0.1mmとすると、金属板401の外形寸法は半導体素子104の寸法公差を考慮し、6.2mm×6.2mm〜6.3mm×6.3mm程度が好ましい。圧着ツール404の凹部の内部寸法は半導体素子104の寸法公差を考慮し、6.2mm×6.2mm〜6.3mm×6.3mm程度が好ましい。凹部の深さは0.2mm〜0.25mm程度が好ましい。
In FIG. 6 (f), the metal plate 401 is pressed and heated by the crimping tool 404 heated by the heater 403.
At this time, the crimping tool 404 has a concave shape, and the internal dimension of the concave part is substantially the same as the dimension obtained by adding twice the thickness of the metal plate 401 to the size of the semiconductor element 104. The depth is substantially the same as the height from the upper surface of the circuit board 101 after connection to the upper surface of the metal plate 401. When the outer dimensions of the semiconductor element 104 are 6 mm × 6 mm and the thickness of the semiconductor element 104 is 0.1 mm, the outer dimensions of the metal plate 401 are 6.2 mm × 6.2 mm to 6. mm in consideration of the dimensional tolerance of the semiconductor element 104. About 3 mm x 6.3 mm is preferable. The internal dimension of the recess of the crimping tool 404 is preferably about 6.2 mm × 6.2 mm to 6.3 mm × 6.3 mm in consideration of the dimensional tolerance of the semiconductor element 104. The depth of the recess is preferably about 0.2 mm to 0.25 mm.

圧着ツール404により位置合わせされた金属板401を押圧、加熱することにより、最初に金属板401の四隅が切り欠き401aで回路基板101の側の折れ曲げられて、半導体素子104も押圧、加熱され、図6(g)に示すように接合が完了する。   By pressing and heating the metal plate 401 aligned by the crimping tool 404, the four corners of the metal plate 401 are first bent at the side of the circuit board 101 by the notches 401a, and the semiconductor element 104 is also pressed and heated. The joining is completed as shown in FIG.

このとき、バンプ105は、押圧されることにより、回路基板101の基板電極102上で変形されながら押し付けられていく。このとき、押圧は最低でも20gf必要であり、半導体素子104、バンプ105、回路基板101を損傷しない程度の荷重を印加する。また、このとき、加熱された圧着ツール309により半導体素子104と回路基板101の間の熱硬化性樹脂フィルム301には170℃〜250℃程度の熱が数秒〜30秒程度印加され、この熱硬化性樹脂フィルム301が熱硬化され、半導体素子104は硬化した熱硬化性樹脂310により回路基板101上に固定される。また、同時に金属板401はあらかじめ設けられた切り欠きで折り曲げられながら、半導体素子104の外周にはみ出ている熱硬化性樹脂310により回路基板101の上に固定される。   At this time, the bump 105 is pressed while being deformed on the substrate electrode 102 of the circuit board 101 by being pressed. At this time, the pressure is required to be at least 20 gf, and a load that does not damage the semiconductor element 104, the bump 105, and the circuit board 101 is applied. At this time, heat of about 170 ° C. to 250 ° C. is applied to the thermosetting resin film 301 between the semiconductor element 104 and the circuit board 101 by the heated crimping tool 309 for about several seconds to 30 seconds. The thermosetting resin film 301 is thermally cured, and the semiconductor element 104 is fixed on the circuit board 101 by the cured thermosetting resin 310. At the same time, the metal plate 401 is fixed on the circuit board 101 by the thermosetting resin 310 protruding from the outer periphery of the semiconductor element 104 while being bent at a notch provided in advance.

かかる構成によれば、半導体素子104のバンプ105の近傍には応力が集中しないため、薄型の半導体素子104に対しても高品質に実装することが可能である。また、あらかじめ高価な立体形状の金属枠を必要とせず、金型での打ち抜き方法などによる安価な平板形状の金属板を用いることができるので、電子部品を安価に製造することができる。   According to such a configuration, stress is not concentrated in the vicinity of the bump 105 of the semiconductor element 104, so that it can be mounted on the thin semiconductor element 104 with high quality. In addition, an expensive three-dimensional metal frame is not required in advance, and an inexpensive flat metal plate by a punching method using a mold or the like can be used. Therefore, an electronic component can be manufactured at a low cost.

上記の各実施の形態では、金属枠306や金属板401を折り曲げて構成した枠は、図9(a)に示すように凹部を形成するように四隅に壁61,62,63,64が形成されていたが、図9(b)に示すように、バンプ105が半導体素子104の対向する2辺に沿って形成されている場合には、バンプ105が形成されている辺に対応して、金属枠306や金属板401を折り曲げて構成した枠に壁61,63を形成することによっても、ほぼ同様の効果を期待できる。   In each of the embodiments described above, the frames 61, 62, 63, 64 are formed at the four corners of the frame formed by bending the metal frame 306 or the metal plate 401 so as to form a recess as shown in FIG. However, as shown in FIG. 9B, when the bump 105 is formed along two opposing sides of the semiconductor element 104, corresponding to the side where the bump 105 is formed, By forming the walls 61 and 63 in a frame formed by bending the metal frame 306 or the metal plate 401, substantially the same effect can be expected.

なお、この実施の形態2では半導体素子104の上に金属板401を固定するために接着層として熱硬化性樹脂402を供給したが、この熱硬化性樹脂402を設けない場合も実施することができる。   In the second embodiment, the thermosetting resin 402 is supplied as an adhesive layer in order to fix the metal plate 401 on the semiconductor element 104. However, the thermosetting resin 402 may be provided even when the thermosetting resin 402 is not provided. it can.

本発明は、薄型の半導体素子を実装した各種の電子部品の信頼性の向上に寄与できる。   The present invention can contribute to improving the reliability of various electronic components mounted with a thin semiconductor element.

101 回路基板
102 基板電極
104 半導体素子
105 バンプ
301 熱硬化性樹脂フィルム
302 ヒータ
303 貼り付けツール
304 セパレータ
305 吸着ツール
306 金属枠(枠)
306a 鍔部
307 吸着ツール
308 ヒータ
309 圧着ツール
310 熱硬化された熱硬化性樹脂フィルム
401 金属板(硬質板)
402 熱硬化性樹脂
403 ヒータ
404 凹部を有する圧着ツール
DESCRIPTION OF SYMBOLS 101 Circuit board 102 Board electrode 104 Semiconductor element 105 Bump 301 Thermosetting resin film 302 Heater 303 Pasting tool 304 Separator 305 Adsorption tool 306 Metal frame (frame)
306a Hook 307 Adsorption tool 308 Heater 309 Crimping tool 310 Thermosetting resin film thermoset 401 Metal plate (hard plate)
402 Thermosetting resin 403 Heater 404 Crimping tool having recess

Claims (6)

主面にバンプを有する半導体素子と、
前記半導体素子の前記バンプに当接して導通した基板電極を有する回路基板と、
前記半導体素子と前記回路基板との間に位置する熱硬化性樹脂と、
材質が硬質で、前記半導体素子の前記主面とは反対側の面に直接または接着層を介して当接し外周部のうちの少なくとも前記半導体素子の前記バンプが形成されている辺に対応する部分が前記回路基板の側に近接して前記熱硬化性樹脂によって前記回路基板に接着されている枠と
を有している電子部品。
A semiconductor element having bumps on the main surface;
A circuit board having a substrate electrode brought into contact with and in contact with the bump of the semiconductor element;
A thermosetting resin located between the semiconductor element and the circuit board;
A portion made of a hard material and in contact with a surface opposite to the main surface of the semiconductor element directly or via an adhesive layer, corresponding to at least a side of the outer peripheral portion where the bump of the semiconductor element is formed An electronic component having a frame adhered to the circuit board by the thermosetting resin adjacent to the circuit board side.
前記枠は、前記半導体素子を内部に含む凹型の形状である
請求項1記載の電子部品。
The electronic component according to claim 1, wherein the frame has a concave shape including the semiconductor element therein.
前記枠は、金属板を切り欠きで折り曲げられたものである
請求項1記載の電子部品。
The electronic component according to claim 1, wherein the frame is a metal plate bent by a notch.
前記枠は、前記回路基板に近接して前記回路基板の実装面に沿って延びる鍔部が形成されている
請求項2または請求項3に記載の電子部品。
4. The electronic component according to claim 2, wherein the frame is formed with a flange extending along the mounting surface of the circuit board in the vicinity of the circuit board.
回路基板に熱硬化性樹脂を供給する工程と、
半導体素子を前記半導体素子上のバンプが前記回路基板上の基板電極に合致する位置決め状態で前記熱硬化性樹脂を介し前記回路基板に搭載する工程と、
前記半導体素子を被覆する形状の枠を前記半導体素子上に搭載する工程と、
前記枠を前記回路基板に押し付ける方向に加圧しながら加熱する工程と
を有し、前記回路基板に前記バンプを電気的接続状態に圧着するとともに前記熱硬化性樹脂にて前記枠を前記回路基板に接着固定する
電子部品の製造方法。
Supplying a thermosetting resin to the circuit board;
Mounting a semiconductor element on the circuit board through the thermosetting resin in a positioning state in which bumps on the semiconductor element match a substrate electrode on the circuit board;
Mounting a frame having a shape covering the semiconductor element on the semiconductor element;
Heating the frame while pressing it in a direction of pressing the frame against the circuit board, and crimping the bumps to the circuit board in an electrically connected state and using the thermosetting resin to attach the frame to the circuit board. Manufacturing method of electronic parts to be bonded and fixed.
回路基板に第1熱硬化性樹脂を供給する工程と、
半導体素子を前記半導体素子上のバンプが前記回路基板上の基板電極に合致する位置決め状態で前記熱硬化性接着を介し前記回路基板に搭載する工程と、
前記半導体素子上に第2熱硬化性樹脂を供給する工程と、
前記半導体素子を被覆する寸法の硬質板を前記半導体素子上に前記第2熱硬化性樹脂を介して搭載する工程と、
凹部を有する加圧用ジグを前記半導体素子に被せて前記硬質板を前記回路基板に押し付ける方向に加圧しながら加熱する工程と
を有し、
前記回路基板に前記バンプを電気的接続状態に圧着すると同時に、前記半導体素子上の前記熱硬化性樹脂を熱硬化させ、さらに同時に前記硬質板を前記半導体素子が被覆される形状に変形させながら、前記熱硬化性樹脂にて前記硬質板を前記回路基板に接着固定する
電子部品の製造方法。
Supplying a first thermosetting resin to the circuit board;
Mounting a semiconductor element on the circuit board through the thermosetting adhesion in a positioning state in which bumps on the semiconductor element match a substrate electrode on the circuit board;
Supplying a second thermosetting resin on the semiconductor element;
Mounting a hard plate of a size covering the semiconductor element on the semiconductor element via the second thermosetting resin;
A step of covering the semiconductor element with a pressurizing jig having a recess and heating while pressing in the direction of pressing the hard plate against the circuit board,
At the same time that the bumps are crimped to the circuit board in an electrically connected state, the thermosetting resin on the semiconductor element is thermally cured, and at the same time, the hard plate is deformed into a shape covered with the semiconductor element, A method of manufacturing an electronic component, wherein the hard plate is bonded and fixed to the circuit board with the thermosetting resin.
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JP2013038270A (en) * 2011-08-09 2013-02-21 Fujitsu Ltd Electronic device and method for manufacturing the same
CN108369933A (en) * 2015-12-16 2018-08-03 三菱电机株式会社 Semiconductor device and its manufacturing method

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JP2000260819A (en) * 1999-03-10 2000-09-22 Toshiba Corp Manufacture of semiconductor device
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JPH10150128A (en) * 1996-11-15 1998-06-02 Nitto Denko Corp Semiconductor device and its manufacture
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JP2013038270A (en) * 2011-08-09 2013-02-21 Fujitsu Ltd Electronic device and method for manufacturing the same
CN108369933A (en) * 2015-12-16 2018-08-03 三菱电机株式会社 Semiconductor device and its manufacturing method
CN108369933B (en) * 2015-12-16 2021-06-29 三菱电机株式会社 Semiconductor device and method for manufacturing the same

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