JP2010239004A - Semiconductor light emitting device - Google Patents

Semiconductor light emitting device Download PDF

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JP2010239004A
JP2010239004A JP2009086697A JP2009086697A JP2010239004A JP 2010239004 A JP2010239004 A JP 2010239004A JP 2009086697 A JP2009086697 A JP 2009086697A JP 2009086697 A JP2009086697 A JP 2009086697A JP 2010239004 A JP2010239004 A JP 2010239004A
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semiconductor light
light emitting
emitting device
emitting element
heat
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Masafumi Yamada
雅史 山田
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Olympus Corp
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Olympus Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched

Abstract

<P>PROBLEM TO BE SOLVED: To provide a semiconductor light emitting device which has a structure capable of preventing the deterioration of a sealing resin containing a fluorescence substance caused by heat and light generated from the semiconductor light emitting device, and is elongated in operating life. <P>SOLUTION: The semiconductor light emitting device 100 includes: a sealing resin 102 containing a fluorescence substance covering the semiconductor light emitting element 101 so as not to make the element contact with each other; a substrate 103 on which the sealing resin 102 and the semiconductor light emitting element 101 are arranged; a spatial layer 105 in which the semiconductor light emitting element 101 is arranged in the sealing resin 102; and a heat discharge opening 106 communicating with the spatial layer 105. Heat radiated from the semiconductor emitting element 101 to the spatial layer 105 is discharged from the heat discharge opening 106 to the outside. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は、半導体発光素子から発生した熱により、蛍光体層を含む封止樹脂が劣化するのを防止する構造に関する。   The present invention relates to a structure for preventing a sealing resin including a phosphor layer from being deteriorated by heat generated from a semiconductor light emitting element.

近年、半導体発光装置が広く用いられている。この半導体発光装置は、例えば、特許文献1に記載されるような構造として、封止樹脂の劣化を防止する技術が提案されている。   In recent years, semiconductor light emitting devices have been widely used. In this semiconductor light emitting device, for example, as a structure described in Patent Document 1, a technique for preventing deterioration of the sealing resin has been proposed.

この従来の半導体発光装置は、図1に示すように、半導体発光素子10の周囲に断熱層11を印刷法により高精度で作製し、該断熱層の外側に蛍光体層12を設けることで、半導体発光素子10の発熱が直接蛍光体110に触れないようにし、発熱による蛍光体110の経時的劣化を改善する技術が開示されている。また、図1は、従来技術を示す模式図である。尚、図1において、引用文献1に記載の図、及び符号を用いているため、ここで説明しない構成要素の符号もある。   In this conventional semiconductor light emitting device, as shown in FIG. 1, a heat insulating layer 11 is produced around the semiconductor light emitting element 10 with high accuracy by a printing method, and a phosphor layer 12 is provided outside the heat insulating layer. A technique for preventing the heat generation of the semiconductor light emitting element 10 from directly touching the phosphor 110 and improving the temporal deterioration of the phosphor 110 due to the heat generation is disclosed. FIG. 1 is a schematic diagram showing the prior art. In addition, in FIG. 1, since the figure and code | symbol described in the cited reference 1 are used, the code | symbol of the component which is not demonstrated here also exists.

しかしながら、従来の半導体発光装置において、断熱層11は、シリコーン樹脂、エポキシ樹脂、フッ素樹脂から選択される1種または2種以上の組み合せからなり、有機物で構成されていることから、半導体発光素子から発生する紫外線などの光エネルギー、熱により変色、劣化などのダメージを受け易い。   However, in the conventional semiconductor light emitting device, the heat insulating layer 11 is composed of one or a combination of two or more selected from a silicone resin, an epoxy resin, and a fluororesin, and is composed of an organic substance. It is susceptible to damage such as discoloration and deterioration due to light energy such as ultraviolet rays and heat.

このように有機物から構成された断熱層11が劣化するメカニズムは、熱、光などにより樹脂内にあるベンゼン環に隣接した官能基が、電子移動をしてしまい、発色団であるキノン成分に変化してしまい変色するということが有力な説とされている。   The mechanism by which the heat insulating layer 11 composed of organic substances deteriorates as described above is that the functional group adjacent to the benzene ring in the resin is moved by electrons due to heat, light, etc., and changes to a quinone component which is a chromophore. It is said that it is a powerful theory that it will change color.

特に、エポキシ樹脂は、光エネルギー、および熱に弱く、半導体発光素子10の点灯時に発せられる光および熱により劣化が進み、半導体発光素子10から放出される光を妨げ、明るさを軽減させるという問題がある。また、電流値を上げることにより、半導体発光素子10から放出する光の明るさは増加するが、半導体発光素子10の発熱量が増加し、樹脂の劣化を促進させるという問題がある。   In particular, the epoxy resin is weak to light energy and heat, and deteriorates due to light and heat emitted when the semiconductor light emitting element 10 is turned on, thereby preventing light emitted from the semiconductor light emitting element 10 and reducing brightness. There is. Further, increasing the current value increases the brightness of light emitted from the semiconductor light emitting element 10, but there is a problem that the amount of heat generated by the semiconductor light emitting element 10 increases and the deterioration of the resin is promoted.

このような理由により、有機物、特にエポキシ樹脂が含まれる断熱層11は、黄変などの経時的劣化を起こし、半導体発光素子10から放出した光を外部へ取り出す効果を妨げるという問題があった。   For these reasons, the heat insulating layer 11 containing an organic substance, particularly an epoxy resin, has deteriorated over time, such as yellowing, and has a problem of hindering the effect of extracting light emitted from the semiconductor light emitting element 10 to the outside.

そこで、本発明は、上述の問題に鑑みてなされたものであり、その目的とするところは半導体発光素子から発生する熱および光により、蛍光体を含む封止樹脂が劣化するのを防止する構造を備え、長寿命となる半導体発光装置を提供するものである。   Accordingly, the present invention has been made in view of the above-described problems, and the object of the present invention is a structure that prevents the sealing resin containing the phosphor from deteriorating due to heat and light generated from the semiconductor light emitting element. A semiconductor light emitting device having a long life is provided.

上記問題を解決するために、本発明の半導体発光装置は、半導体発光素子と、前記半導体発光素子を接触しないように覆う蛍光体を含む封止樹脂と、前記封止樹脂、及び前記半導体発光素子が配設される基板と、前記封止樹脂によって形成され、前記半導体発光素子が配置される空間層と、前記空間層と連通する排熱口と、を具備することを特徴とする。   In order to solve the above problem, a semiconductor light emitting device of the present invention includes a semiconductor light emitting element, a sealing resin including a phosphor that covers the semiconductor light emitting element so as not to contact, the sealing resin, and the semiconductor light emitting element. , A space layer formed of the sealing resin, on which the semiconductor light emitting element is disposed, and a heat exhaust port communicating with the space layer.

本発明によれば、半導体発光素子から発生した熱は、空間層および排熱口を通して外部に放出される。これにより、蛍光体層が半導体発光素子の熱を直接受けることなく、経時的に劣化するのを防止することができる。その結果、長寿命な半導体発光装置を実現できる。   According to the present invention, heat generated from the semiconductor light emitting device is released to the outside through the space layer and the heat exhaust port. Thereby, it can prevent that a fluorescent substance layer deteriorates with time, without receiving the heat | fever of a semiconductor light-emitting device directly. As a result, a long-lived semiconductor light emitting device can be realized.

従来の半導体発光装置を示す断面図Sectional view showing a conventional semiconductor light emitting device 第1の実施形態に係る半導体発光装置を示す斜視図1 is a perspective view showing a semiconductor light emitting device according to a first embodiment. 同、図2のIII−III線に沿った半導体発光装置の断面図Sectional drawing of the semiconductor light-emitting device along the III-III line of FIG. 同、変形例の半導体発光装置を示す断面図Sectional drawing which shows the semiconductor light-emitting device of a modification 第2の実施形態に係る他の半導体発光装置を示す斜視図The perspective view which shows the other semiconductor light-emitting device based on 2nd Embodiment. 同、変形例の半導体発光装置を示す斜視図The perspective view which shows the semiconductor light-emitting device of a modification same as the above 第3の実施形態に係る半導体発光装置を示す分解斜視図The disassembled perspective view which shows the semiconductor light-emitting device concerning 3rd Embodiment. 同、図7のVIII−VIII線に沿った半導体発光装置を示す断面図Sectional drawing which shows the semiconductor light-emitting device along the VIII-VIII line of FIG. 第4の実施形態に係る他の半導体発光装置を示す分解斜視図The disassembled perspective view which shows the other semiconductor light-emitting device based on 4th Embodiment. 同、図9のX−X線に沿った半導体発光装置を示す断面図Sectional drawing which shows the semiconductor light-emitting device along the XX line of FIG.

第1の実施の形態について説明する。図2に第1の実施の形態に係る半導体発光装置の斜視図を、図3に図2の半導体発光装置のIII−III線断面図を示す。また、図4に半導体発光装置の変形例を示す。   A first embodiment will be described. FIG. 2 is a perspective view of the semiconductor light emitting device according to the first embodiment, and FIG. 3 is a cross-sectional view taken along the line III-III of the semiconductor light emitting device of FIG. FIG. 4 shows a modification of the semiconductor light emitting device.

図2、および図3に示す、半導体発光装置100は、半導体発光素子101と、封止樹脂である蛍光体層102と、外部へ導通する基板であるリード電極103a,103bを構成する電極一体基板103と、この電極一体基板103のリード電極103a,103b同士の電気的短絡を防止するための絶縁体である絶縁性物質104と、を備えて主に構成されている。   The semiconductor light emitting device 100 shown in FIGS. 2 and 3 includes a semiconductor light emitting element 101, a phosphor layer 102 that is a sealing resin, and lead electrodes 103a and 103b that are substrates that are electrically connected to the outside. 103 and an insulating material 104 that is an insulator for preventing an electrical short circuit between the lead electrodes 103a and 103b of the electrode-integrated substrate 103.

半導体発光素子101は、電極一体基板103の各リード電極103a,103bと電気的に接続されている。この半導体発光素子101は、リード電極103a(103b)にアノード電圧、およびカソード電圧を印加すると発光する。尚、半導体発光素子101の実装形態は、ここではフリップチップボンディングとして図示しているが、他にもワイヤーボンディング、はんだ、電導性接着剤、ACF、NCPなどの工法を用いても良い。   The semiconductor light emitting element 101 is electrically connected to the lead electrodes 103 a and 103 b of the electrode integrated substrate 103. The semiconductor light emitting device 101 emits light when an anode voltage and a cathode voltage are applied to the lead electrode 103a (103b). The mounting form of the semiconductor light emitting device 101 is illustrated here as flip chip bonding, but other methods such as wire bonding, solder, conductive adhesive, ACF, NCP, etc. may be used.

電極一体基板103は、Cu系合金、Fe系合金などの機械的強度、電気伝導度、熱伝導度、耐食性などの優れた母材を用い、この母材表面には、Au、Ag、Sn、Niめっきなどを施している。尚、電極一体基板103は、図4に示すような構造でも良く、外部に接続を取り出せる構造であれば制限はない。この場合、セラミックなどの絶縁物質から形成された絶縁体の基板103´上にリード電極103a,103bを任意に作製することが可能であり、設計の自由度を増大させることができる。   The electrode-integrated substrate 103 uses a base material having excellent mechanical strength, electrical conductivity, thermal conductivity, corrosion resistance, etc., such as Cu-based alloy and Fe-based alloy, and Au, Ag, Sn, Ni plating is applied. The electrode-integrated substrate 103 may have a structure as shown in FIG. 4 and is not limited as long as the connection can be taken out to the outside. In this case, the lead electrodes 103a and 103b can be arbitrarily formed on an insulating substrate 103 ′ formed of an insulating material such as ceramic, and the degree of design freedom can be increased.

蛍光体層102は、蛍光体を含む透明樹脂で構成されており、半導体発光素子101を覆うように配設されている。この蛍光体層102を形成する透明樹脂としては、エポキシ系、アクリル系、シリコーン系などを用い、切削、注型、成形などの加工方法で作製される。透明樹脂内は、蛍光体を分散し、濃度が略均一になるように作製されている。   The phosphor layer 102 is made of a transparent resin containing a phosphor, and is disposed so as to cover the semiconductor light emitting element 101. As the transparent resin for forming the phosphor layer 102, an epoxy-based, acrylic-based, silicone-based, or the like is used, and is manufactured by a processing method such as cutting, casting, or molding. The transparent resin is prepared so that the phosphor is dispersed and the concentration becomes substantially uniform.

尚、半導体発光素子101は、青色発光、または紫外発光の発光素子を用いた場合、黄色蛍光体を用いれば白色光が容易に実現することができる。また、青色ダイオードに赤色蛍光体および緑色蛍光体を用いれば同様にして、白色光を容易に実現することができる。   In the case where the semiconductor light emitting element 101 uses a blue light emitting element or an ultraviolet light emitting element, white light can be easily realized by using a yellow phosphor. Similarly, white light can be easily realized by using a red phosphor and a green phosphor for the blue diode.

このように白色光が必要となる場合には、半導体発光素子101の発色を考慮して、蛍光体を選択すれば、容易に白色光を実現することができる。また、白色光に限らず、半導体発光素子と蛍光体を適宜選択すれば、所望の発色を実現することができる。   When white light is required in this way, white light can be easily realized by selecting a phosphor in consideration of the color of the semiconductor light emitting element 101. Further, not only white light but also a suitable color development can be realized by appropriately selecting a semiconductor light emitting element and a phosphor.

蛍光体層102は、図2に示すように4つの脚部107が形成された構造である。これら脚部107は、蛍光体層102における、ここでは四隅下方に延設されたものであり、電極一体基板103上に固着される。具体的には、これら4つの脚部107は、電極一体基板103の面接触する部分が接着剤等(不図示)によって、電極一体基板103上に固着されている。   The phosphor layer 102 has a structure in which four legs 107 are formed as shown in FIG. These leg portions 107 extend in the phosphor layer 102 below the four corners here, and are fixed on the electrode integrated substrate 103. Specifically, these four leg portions 107 are fixed on the electrode-integrated substrate 103 with an adhesive or the like (not shown) at the surface contact portion of the electrode-integrated substrate 103.

接着剤等による固着後は、半導体発光素子101が実装されている面からその反対面に向かった上下方向に蛍光体層102と電極一体基板103との間、及び左右方向に脚部107間に形成された間隙が、本実施の形態の排熱口106を構成する。尚、蛍光体層102は、図2に示したような、外形が直方体構造だけでなく、ドーム状、円錐状、そして蛍光体層102主面の角部にR面取り構造を設けるなどしても良い。   After fixing with an adhesive or the like, between the phosphor layer 102 and the electrode integrated substrate 103 in the vertical direction from the surface on which the semiconductor light emitting element 101 is mounted to the opposite surface, and between the legs 107 in the left and right direction. The formed gap constitutes the heat exhaust port 106 of the present embodiment. The phosphor layer 102 has not only a rectangular parallelepiped structure as shown in FIG. 2, but also a dome shape, a conical shape, and an R chamfer structure provided at the corner of the phosphor layer 102 main surface. good.

空間層105は、半導体発光素子101と蛍光体層102との間に形成された空間である。蛍光体層102は、空間層105が設けられることにより、半導体発光素子101に対して所定の離間距離を保つように配置されており、半導体発光素子101と非接触となっている。換言すると、半導体発光素子101と蛍光体層102とは、一定の距離が保たれるように非接触に配置されている。   The space layer 105 is a space formed between the semiconductor light emitting element 101 and the phosphor layer 102. The phosphor layer 102 is disposed so as to maintain a predetermined separation distance from the semiconductor light emitting element 101 by providing the space layer 105, and is not in contact with the semiconductor light emitting element 101. In other words, the semiconductor light emitting element 101 and the phosphor layer 102 are arranged in a non-contact manner so as to maintain a certain distance.

以上のように構成された半導体発光装置100は、半導体発光素子101から発生した熱108が空間層105に放熱され、排熱口106を経て、外部へ放出される構造となっている。そのため、空間層105の中に半導体発光素子101から発生する熱が停滞することがないため、蛍光体層102内部の温度上昇を抑制することができ、熱による蛍光体層102への劣化によるダメージを軽減できる。   The semiconductor light emitting device 100 configured as described above has a structure in which the heat 108 generated from the semiconductor light emitting element 101 is radiated to the space layer 105 and discharged to the outside through the heat exhaust port 106. Therefore, the heat generated from the semiconductor light emitting element 101 does not stagnate in the space layer 105, so that the temperature rise in the phosphor layer 102 can be suppressed, and damage due to deterioration of the phosphor layer 102 due to heat. Can be reduced.

上記のような構成により、本実施の形態の半導体発光装置100は、半導体発光素子101から発生した熱が空間層105、および排熱口106を通して外部に放出される。このことから、蛍光体層102が半導体発光素子101からの発熱による黄変などの経時的劣化を抑制し、蛍光体層102を含む樹脂の劣化を防止することができる。   With the configuration as described above, in the semiconductor light emitting device 100 of the present embodiment, heat generated from the semiconductor light emitting element 101 is released to the outside through the space layer 105 and the exhaust heat port 106. Accordingly, the phosphor layer 102 can suppress deterioration over time such as yellowing due to heat generation from the semiconductor light emitting element 101, and can prevent deterioration of the resin including the phosphor layer 102.

以上の説明から、本実施の形態の半導体発光装置100は、蛍光体層102が半導体発光素子101からの熱を直接受けることなく、経時的に劣化するのを防止することができる。その結果、長寿命な半導体発光装置100を実現することができる。   From the above description, the semiconductor light emitting device 100 of the present embodiment can prevent the phosphor layer 102 from being deteriorated with time without directly receiving heat from the semiconductor light emitting element 101. As a result, the semiconductor light emitting device 100 having a long life can be realized.

また、半導体発光装置100は、半導体発光素子101と蛍光体層102とが一定の距離が保たれるように非接触に配置されているため、蛍光体層102が半導体発光素子101と直接に接触した状態よりも、半導体発光素子101からの光エネルギーの影響を受け難くなり、有機物、特にエポキシ樹脂から形成した蛍光体層102への劣化によるダメージも軽減される。   In the semiconductor light emitting device 100, the semiconductor light emitting element 101 and the phosphor layer 102 are disposed in a non-contact manner so that a certain distance is maintained, so that the phosphor layer 102 is in direct contact with the semiconductor light emitting element 101. This makes it less susceptible to the light energy from the semiconductor light emitting element 101 than the above state, and reduces damage due to deterioration of the phosphor layer 102 formed from an organic material, particularly an epoxy resin.

(第2の実施形態)
第2の実施の形態について説明する。第2の実施の形態は、前記排熱口106の構成における変形例について示したものである。図5、および図6に第2の実施の形態に係る半導体発光装置の斜視図を示す。尚、第1の実施の形態にて説明した半導体発光装置100と同一の構成要素については、それらの説明を省略すると共に、同一の符号を用いる場合がある。
(Second Embodiment)
A second embodiment will be described. The second embodiment shows a modification of the configuration of the heat exhaust port 106. 5 and 6 are perspective views of the semiconductor light emitting device according to the second embodiment. In addition, about the same component as the semiconductor light-emitting device 100 demonstrated in 1st Embodiment, while omitting those description, the same code | symbol may be used.

図5に示すように、半導体発光装置200は、蛍光体層202に少なくとも1つ以上、つまり、複数の排熱口206を形成した構成となっている。尚、蛍光体層202は、下方縁辺部207が電極一体基板103上に接着されている。   As shown in FIG. 5, the semiconductor light emitting device 200 has a configuration in which at least one, that is, a plurality of heat exhaust ports 206 are formed in the phosphor layer 202. The phosphor layer 202 has a lower edge 207 bonded to the electrode integrated substrate 103.

これら複数の排熱口206は、蛍光体層202を貫通しており、空間層(105、図5においては不図示)と外部空間を連通する、ここでは複数の孔部である。半導体発光素子(101、図5においては不図示)から発生した熱は、蛍光体層202に形成された複数の排熱口206を通過し、外部空間へと放出される。   The plurality of heat exhaust ports 206 pass through the phosphor layer 202, and are a plurality of holes here, which communicate the space layer (105, not shown in FIG. 5) and the external space. The heat generated from the semiconductor light emitting element (101, not shown in FIG. 5) passes through a plurality of heat exhaust ports 206 formed in the phosphor layer 202 and is released to the external space.

排熱口206は、作製方法として、切削、注型などの加工方法で作製される。尚、その形状、サイズ、位置などは不問である。   The heat exhaust port 206 is manufactured by a processing method such as cutting or casting as a manufacturing method. The shape, size, position, etc. are not questioned.

尚、図6に示すように、半導体発光装置200は、蛍光体層202が電極一体基板103上に当接する箇所に、逆三角形状の脚部208を複数設けた構造としても良い。例えば、蛍光体層202の下部を山切りに加工する。   As shown in FIG. 6, the semiconductor light emitting device 200 may have a structure in which a plurality of inverted triangular legs 208 are provided at locations where the phosphor layer 202 abuts on the electrode integrated substrate 103. For example, the lower part of the phosphor layer 202 is processed into a mountain.

この場合、電極一体基板103と蛍光体層202との間に形成された断面三角形の間隙が排熱口206aとしての機能を有する。   In this case, a gap having a triangular cross section formed between the electrode integrated substrate 103 and the phosphor layer 202 has a function as the heat exhaust port 206a.

このような構造を有した蛍光体層202の作製方法として、上述と同様に切削、注型などの加工方法で作製される。尚、これらの脚部208は、電極一体基板103、または絶縁性物質104に接着剤(不図示)などで固着される。   As a method for producing the phosphor layer 202 having such a structure, it is produced by a processing method such as cutting or casting as described above. These leg portions 208 are fixed to the electrode integrated substrate 103 or the insulating material 104 with an adhesive (not shown) or the like.

以上に説明した本実施の形態の半導体発光装置200でも、第1の実施の形態と同様の効果を奏する構成とすることができる。
蛍光体層202の形状は、勿論、ここでも、図6に示すような直方体だけでなく、ドーム状、円錐状でも可能である。
The semiconductor light emitting device 200 of the present embodiment described above can also be configured to achieve the same effects as those of the first embodiment.
Of course, the shape of the phosphor layer 202 is not limited to a rectangular parallelepiped as shown in FIG.

(第3の実施の形態)
第3の実施の形態について説明する。図7は、第3の実施の形態に係る半導体発光装置を示す分解斜視図、図8は図7のVIII−VIII線に沿った半導体発光装置を示す断面図である。尚、本実施の形態においても、第1の実施の形態にて説明した半導体発光装置100と同一の構成要素については、それらの説明を省略すると共に、同一の符号を用いる場合がある。
(Third embodiment)
A third embodiment will be described. FIG. 7 is an exploded perspective view showing the semiconductor light emitting device according to the third embodiment, and FIG. 8 is a cross-sectional view showing the semiconductor light emitting device along the line VIII-VIII in FIG. In the present embodiment, the same components as those of the semiconductor light emitting device 100 described in the first embodiment will not be described and the same reference numerals may be used.

前記第1、第2の実施の形態に係る半導体発光装置100,200においては、排熱口106,206(206a)を蛍光体層102,202、または蛍光体層102,202と電極一体基板103の間隙に設けたが、第3の実施の形態に係る半導体発光装置300は、図7に示すように電極一体基板303にも排熱口309を設けた構成となっている。   In the semiconductor light emitting devices 100 and 200 according to the first and second embodiments, the heat exhaust ports 106 and 206 (206a) are made to be the phosphor layers 102 and 202, or the phosphor layers 102 and 202 and the electrode integrated substrate 103. However, the semiconductor light emitting device 300 according to the third embodiment has a configuration in which the heat exhaust port 309 is also provided in the electrode integrated substrate 303 as shown in FIG.

具体的には、電極一体基板303は、リード電極303a,303b部分の夫々に、空間層105に連通するように半導体発光素子101が実装されている面からその反対面に向かった上下方向に開口する孔部である排熱口309を形成されている。   Specifically, the electrode-integrated substrate 303 is opened in the vertical direction from the surface on which the semiconductor light emitting element 101 is mounted to the opposite surface so as to communicate with the space layer 105 in each of the lead electrodes 303a and 303b. A heat exhaust port 309 which is a hole to be formed is formed.

これにより、本実施の形態の半導体発光装置300は、蛍光体層102に設けた排熱口106と、電極一体基板303に設けた排熱口309の2方向から、半導体発光素子101から発生した空間層105に放熱された熱308が外部へ容易に逃げることになる。すなわち、半導体発光装置300は、半導体発光装置100からの熱308が蛍光体層102と電極一体基板303の間に形成された排熱口306、および電極一体基板303に形成された排熱口309を介して外部空間に放出される。このような構造により、半導体発光装置300は、第1の形態の効果に加え、半導体発光素子101からの熱をより効果的に放熱することが可能である。   As a result, the semiconductor light emitting device 300 of the present embodiment is generated from the semiconductor light emitting element 101 from the two directions of the heat exhaust port 106 provided in the phosphor layer 102 and the heat exhaust port 309 provided in the electrode integrated substrate 303. The heat 308 radiated to the space layer 105 easily escapes to the outside. That is, in the semiconductor light emitting device 300, the heat 308 from the semiconductor light emitting device 100 is formed between the phosphor layer 102 and the electrode integrated substrate 303, and the heat exhaust port 309 formed in the electrode integrated substrate 303. To the outside space. With such a structure, the semiconductor light emitting device 300 can dissipate heat from the semiconductor light emitting element 101 more effectively in addition to the effects of the first embodiment.

尚、半導体発光素子101に電気を供給できるような構造であれば、電極一体基板303に設けた排熱口309の形状、サイズ、位置は、不問である。   Note that the shape, size, and position of the heat exhaust port 309 provided in the electrode integrated substrate 303 are not particularly limited as long as electricity can be supplied to the semiconductor light emitting element 101.

(第4の実施の形態)
第4の実施の形態について説明する。図9は、第4の実施の形態に係る半導体発光装置を示す分解斜視図、図10は図9のX−X線に沿った半導体発光装置の断面図である。
(Fourth embodiment)
A fourth embodiment will be described. FIG. 9 is an exploded perspective view showing the semiconductor light emitting device according to the fourth embodiment, and FIG. 10 is a cross-sectional view of the semiconductor light emitting device along the line XX in FIG.

尚、本実施の形態において、第3の実施の形態にて説明した半導体発光装置300と同一の構成要素については、それらの説明を省略すると共に、同一の符号を用いる場合がある。   In the present embodiment, the same components as those of the semiconductor light emitting device 300 described in the third embodiment are not described and the same reference numerals may be used.

本実施の形態に係る半導体発光装置400は、図9に示す、電極一体基板303のリード電極303a,303b間に配設された絶縁体である絶縁物質404にも、複数の排熱口410を設けた構成となっている。   In the semiconductor light emitting device 400 according to the present embodiment, a plurality of heat exhaust ports 410 are also provided in the insulating material 404 that is an insulator disposed between the lead electrodes 303a and 303b of the electrode integrated substrate 303 shown in FIG. It is the provided structure.

リード電極303a,303b同士の短絡を防止するために設けた絶縁物質404は、空間層105に連通するように、半導体発光素子101が実装されている面からその反対面に向かった上下方向に開口する孔部となる、少なくとも1つ以上の複数の排熱口410が形成されている。   The insulating material 404 provided to prevent short-circuit between the lead electrodes 303a and 303b is opened in the vertical direction from the surface on which the semiconductor light emitting element 101 is mounted to the opposite surface so as to communicate with the space layer 105. At least one or more heat exhaust ports 410 serving as holes to be formed are formed.

すなわち、これら複数の排熱口410は、半導体発光素子101が実装されている面からその反対面に向かった上下に向けて、絶縁物質404内を貫通するように形成されている。この絶縁物質404は、リード電極303a,303b同士の短絡を防止する機能を有していれば、排熱口410の形状、サイズは不問である。また、これら複数の排熱口410は、切削、注型加工などで形成される。   That is, the plurality of heat exhaust ports 410 are formed so as to penetrate through the insulating material 404 from the surface on which the semiconductor light emitting element 101 is mounted toward the opposite side. If the insulating material 404 has a function of preventing a short circuit between the lead electrodes 303a and 303b, the shape and size of the heat exhaust port 410 are not limited. The plurality of heat exhaust ports 410 are formed by cutting, casting, or the like.

本実施の形態の半導体発光装置400は、半導体発光素子101から発生した熱408が蛍光体層102に設けた排熱口106と、電極一体基板303に設けた排熱口309と、絶縁物質404に設けた排熱口410と、の複数箇所を介して外部空間へ放出される。すなわち、半導体発光装置400は、第3の形態の効果に加え、半導体発光素子101からの熱を、より効果的に放熱することが可能である。   In the semiconductor light emitting device 400 of the present embodiment, the heat exhaust port 106 provided in the phosphor layer 102 by the heat 408 generated from the semiconductor light emitting element 101, the heat exhaust port 309 provided in the electrode integrated substrate 303, and the insulating material 404. It is discharged to the external space through a plurality of locations of the heat exhaust port 410 provided in the. That is, the semiconductor light emitting device 400 can dissipate the heat from the semiconductor light emitting element 101 more effectively in addition to the effect of the third embodiment.

以上の説明から、半導体発光素子101から発生した熱408は、空間層105および排熱口106、309、410を通して外部空間に放出される。従って、空間層105に半導体発光素子101から発生した熱408が停滞することが無いため、蛍光体層102が経時的に劣化するのを防止することができる。これにより、上述の各実施の形態と同様に、長寿命な半導体発光装置400を実現できる。   From the above description, the heat 408 generated from the semiconductor light emitting device 101 is released to the external space through the space layer 105 and the heat exhaust ports 106, 309, 410. Therefore, since the heat 408 generated from the semiconductor light emitting element 101 does not stagnate in the space layer 105, the phosphor layer 102 can be prevented from deteriorating with time. Thereby, the semiconductor light emitting device 400 having a long life can be realized as in the above-described embodiments.

なお、上記各実施の形態では、半導体発光素子101として発光ダイオードを用いたが、これに限定されることなく、レーザダイオードを用いても良いことは勿論である。   In each of the above embodiments, a light emitting diode is used as the semiconductor light emitting element 101. However, the present invention is not limited to this, and it is needless to say that a laser diode may be used.

以上の各実施の形態に記載した発明は、その実施の形態、および変形例に限ることなく、その他、実施段階ではその要旨を逸脱しない範囲で種々の変形を実施し得ることが可能である。さらに、上記実施の形態には、種々の段階の発明が含まれており、開示される複数の構成要件における適宜な組合せにより種々の発明が抽出され得る。   The invention described in each of the above-described embodiments is not limited to the embodiments and modifications, and various modifications can be made without departing from the scope of the invention in the implementation stage. Further, the above embodiments include inventions at various stages, and various inventions can be extracted by appropriately combining a plurality of disclosed constituent elements.

例えば、実施の形態に示される全構成要件から幾つかの構成要件が削除されても、発明が解決しようとする課題が解決でき、発明の効果で述べられている効果が得られる場合には、この構成要件が削除された構成が発明として抽出され得る。   For example, even if several constituent requirements are deleted from all the constituent requirements shown in the embodiment, the problem to be solved by the invention can be solved, and the effect described in the effect of the invention can be obtained. A configuration from which this configuration requirement is deleted can be extracted as an invention.

100,200,300,400…半導体発光装置
101…半導体発光素子
102,202…蛍光体層
103,303…電極一体基板
103a,103b,303a,303b…リード電極
104 絶縁性物質
105 空間層
106,206,206a,309,410…排熱口
DESCRIPTION OF SYMBOLS 100, 200, 300, 400 ... Semiconductor light-emitting device 101 ... Semiconductor light emitting element 102, 202 ... Phosphor layer 103, 303 ... Electrode integrated substrate 103a, 103b, 303a, 303b ... Lead electrode 104 Insulating substance 105 Spatial layers 106, 206 , 206a, 309, 410 ... Heat exhaust port

特開2007-194525号公報JP 2007-194525 A

Claims (6)

半導体発光素子と、
前記半導体発光素子を接触しないように覆う蛍光体を含む封止樹脂と、
前記封止樹脂、及び前記半導体発光素子が配設される基板と、
前記封止樹脂によって形成され、前記半導体発光素子が配置される空間層と、
前記空間層と連通する排熱口と、
を具備することを特徴とする半導体発光装置。
A semiconductor light emitting device;
A sealing resin containing a phosphor covering the semiconductor light emitting element so as not to contact;
A substrate on which the sealing resin and the semiconductor light emitting element are disposed;
A space layer formed of the sealing resin and in which the semiconductor light emitting element is disposed;
A heat exhaust port communicating with the space layer;
A semiconductor light emitting device comprising:
前記排熱口は、少なくとも1つ以上有することを特徴とする請求項1に記載の半導体発光装置。   The semiconductor light emitting device according to claim 1, wherein at least one heat exhaust port is provided. 前記排熱口は、前記封止樹脂に設けられていることを特徴とする請求項1、または請求項2に記載の半導体発光装置。   The semiconductor light emitting device according to claim 1, wherein the heat exhaust port is provided in the sealing resin. 前記排熱口は、前記基板に設けられていることを特徴とする請求項3に記載の半導体発光装置。   The semiconductor light emitting device according to claim 3, wherein the heat exhaust port is provided in the substrate. 前記排熱口は、前記基板の一対の電極の夫々に設けられていることを特徴とする請求項4に記載の半導体発光装置。   The semiconductor light emitting device according to claim 4, wherein the heat exhaust port is provided in each of a pair of electrodes of the substrate. 前記排熱口は、前記一対の電極間に配設される絶縁体に設けられていることを特徴とする請求項5に記載の半導体発光装置。   The semiconductor light emitting device according to claim 5, wherein the heat exhaust port is provided in an insulator disposed between the pair of electrodes.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012011363A1 (en) * 2010-07-23 2012-01-26 シャープ株式会社 Light-emitting device and manufacturing method therefor
JP2019036721A (en) * 2017-08-18 2019-03-07 ルーメンス カンパニー リミテッド Manufacturing method of light-emitting device, and manufacturing method of light-emitting method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012011363A1 (en) * 2010-07-23 2012-01-26 シャープ株式会社 Light-emitting device and manufacturing method therefor
US9065031B2 (en) 2010-07-23 2015-06-23 Sharp Kabushiki Kaisha Light-emitting device with liquid-repellent layer and manufacturing method therefore
JP5756803B2 (en) * 2010-07-23 2015-07-29 シャープ株式会社 Light emitting device and manufacturing method thereof
JP2019036721A (en) * 2017-08-18 2019-03-07 ルーメンス カンパニー リミテッド Manufacturing method of light-emitting device, and manufacturing method of light-emitting method

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