JP2010212408A - Method for preventing close adhesion among mutual cut sheet, and device for preventing close adhesion used for the same - Google Patents

Method for preventing close adhesion among mutual cut sheet, and device for preventing close adhesion used for the same Download PDF

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JP2010212408A
JP2010212408A JP2009056186A JP2009056186A JP2010212408A JP 2010212408 A JP2010212408 A JP 2010212408A JP 2009056186 A JP2009056186 A JP 2009056186A JP 2009056186 A JP2009056186 A JP 2009056186A JP 2010212408 A JP2010212408 A JP 2010212408A
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cut
thin plate
thin plates
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Kazuyuki Kishi
一之 岸
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FUASHIRITEI KK
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Abstract

<P>PROBLEM TO BE SOLVED: To sufficiently supply the surface of each cut sheet with a treatment liquid by providing a method for preventing close adhesions among mutual cut sheets in case of washing and a device for preventing the close adhesions in the method. <P>SOLUTION: In the method for preventing the close adhesions among the mutual cut sheets, an ingot is cut continuously in a laminar shape, a sheet group 4 fixing one end of each cut sheet 8 is used as an object. Bubbles 11 are mixed among the sheets 8 of the sheet group 4 in a process of immersing the sheet group 4 fixing one end of each cut sheet 8 in a treatment liquid tank 2 convecting the treatment liquid 1 and removing impurities from the surface of each cut sheet 8. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

この発明は、切断薄板相互間の密着防止方法及びその方法に用いられる密着防止装置に関する。   The present invention relates to an adhesion prevention method between cut thin plates and an adhesion prevention apparatus used in the method.

従来、半導体素子や太陽電池に用いられるシリコンインゴットは、製品素材として使えるようにワイヤソーで切断して薄い板状にする(以下、切断後の板状となったものを本願では「切断薄板」という)。切断直後の各切断薄板は、その後の洗浄処理の便宜のため、片側が接着剤にて保持され、それぞれ分離してばらばらとならないようにされている(以下、切断薄板のこのような状態のものを本願では「薄板群」という)。   Conventionally, silicon ingots used for semiconductor elements and solar cells are cut into thin plates by using a wire saw so that they can be used as product materials (hereinafter referred to as “cut thin plates” in this application) ). Each cut sheet immediately after cutting is held on one side by an adhesive for the convenience of subsequent cleaning treatment, so that it is not separated and separated (hereinafter referred to as the cut sheet in this state). Is referred to as a “thin plate group” in this application).

この各切断薄板を洗浄する工程の一工程はスラリー洗浄と呼ばれているが、代表的なスラリー洗浄は、各切断薄板をスプレー水洗し、その後、水洗、洗浄液による洗浄、水洗、剥離液による接着剤の剥離、水洗と順を追って洗浄していくことになる。   One step of washing each cut sheet is called slurry washing, but typical slurry washing involves spray washing each cut sheet with water, and then washing with water, washing with washing liquid, washing with water, and adhesion with stripping solution. It will be washed in the order of agent peeling and water washing.

スラリー洗浄において、各切断薄板は、切断時に用いられる液体の汚れがスラリー状に付着しているため、処理液を各切断薄板のまわりに対流させ、その液自体の洗浄力と対流効果によって、表面の汚れを落とす工程が行われている。その際、各切断薄板は上記のようにそれぞれの片側が接着剤で保持されているが、処理液で汚れを落とした後は、剥離液による接着剤の剥離によって、接着剤が溶かされ各切断薄板がバラバラにされる。   In slurry cleaning, each cutting thin plate is contaminated with liquid dirt used at the time of cutting, so the treatment liquid is convected around each cutting thin plate, and the surface of the cutting thin plate is cleaned by the cleaning power and convection effect of the liquid itself. The process of removing dirt is performed. At that time, each cut thin plate is held with an adhesive on one side as described above, but after removing the dirt with the treatment liquid, the adhesive is melted by peeling the adhesive with the peeling liquid, and each cutting The thin plate is broken apart.

そして、スラリー洗浄後は、よりきめ細かい汚れを落とすために各切断薄板一枚一枚に本洗浄が施される。   Then, after the slurry cleaning, in order to remove finer dirt, the main cleaning is performed on each cut thin plate one by one.

特開2008−98439号公報(0016段、0017段、0050段、0060段)JP 2008-98439 A (0016, 0017, 0050, 0060) 特開2008−103701号公報(0013段)JP 2008-103701 A (0013 stage)

ところで、片側が保持されている各切断薄板相互の間は、0.2mm程度しかない。このため、スラリー洗浄の最初の水洗の際、水の表面張力の影響やその他の影響を受け、隣り合う各切断薄板は互いに密着しやすい状態となっている。その結果、薄板群には、各切断薄板相互が密着した部分が散見され、密着した状態の面には処理液が行き渡らないので、洗浄不良になりやすいという問題が生じていた。このように各切断薄板相互が密着してしまった部分は、汚れが部分的に多く残留し、その後の本洗浄工程においても、洗浄不良となり、最終的には不良品となってしまう。   By the way, there is only about 0.2 mm between the cut thin plates holding one side. For this reason, at the time of the first water washing of the slurry washing, the adjacent cut thin plates are in close contact with each other due to the influence of the surface tension of water and other influences. As a result, in the thin plate group, there are scattered portions where the cut thin plates are in close contact with each other, and the treatment liquid does not spread over the close contact surface, which causes a problem that cleaning is liable to occur. In this way, the portions where the cut thin plates are in close contact with each other are left with a large amount of dirt, resulting in poor cleaning even in the subsequent main cleaning step, and ultimately defective products.

また、近時の傾向として、省資源の見地から、各切断薄板はより薄くされることが要請されており、上記問題はますます深刻なものとなっている。   Further, as a recent trend, from the viewpoint of resource saving, each cut sheet is required to be thinner, and the above problem becomes more serious.

この発明は、従来技術の以上のような問題に鑑み創案されたもので、洗浄時の各切断薄板相互間の密着を防ぐ技術を提供し、それによって処理液を各切断薄板表面に十分に供給しようとするものである。   The present invention was devised in view of the above problems of the prior art, and provides a technique for preventing adhesion between the respective cut thin plates during cleaning, thereby sufficiently supplying the treatment liquid to the surface of each cut thin plate. It is something to try.

従来より、基板の処理液工程において、気泡を用いれば、種々の洗浄処理効率が向上することは、様々な文献から知られている(例えば、上記特許文献1、2)。   Conventionally, it is known from various documents that various cleaning processing efficiencies can be improved by using bubbles in the substrate processing liquid process (for example, Patent Documents 1 and 2).

当初、本発明者らは、このような公知の知見に基づき、シリコンウエハ等の切断薄板の洗浄処理工程においても、その洗浄処理効率を向上させることができるのではないかと考え、その効果確認のために、本洗浄と同条件の下、すなわち、インゴットを切断して得られた1枚ごとの薄板を処理液内に入れ、そこに気泡を吹き付けて試験を行ったが、予想した以上の芳しい洗浄効果は得られなかった。   Initially, the present inventors thought that the cleaning processing efficiency could be improved even in the cleaning processing step of a cutting thin plate such as a silicon wafer based on such known knowledge, and the effect was confirmed. Therefore, under the same conditions as the main cleaning, that is, each thin plate obtained by cutting the ingot was put into the treatment liquid, and air bubbles were blown there, and the test was performed. No cleaning effect was obtained.

一方、いわゆるスラリー洗浄と同条件下、すなわち、各切断薄板の片端を固定した薄板群の状態で気泡を混入して試験を行ったところ、今度は一転、驚くべきことに洗浄効果が格段に向上した。   On the other hand, when the test was performed with air bubbles mixed under the same conditions as so-called slurry cleaning, that is, in the state of a thin plate group in which one end of each cut thin plate was fixed, this time, the cleaning effect was remarkably improved. did.

本発明者らは、この実験結果を子細に検討した結果、スラリー洗浄においては、気泡が直接洗浄効果を高めたのではなく、薄板群における各切断薄板相互の隙間を積極的に形成させ、それが洗浄効果を高めたのではないかと考えた。すなわち、気泡が隙間に入り、そこで弾力を付与して隙間形成に助力したとすると、そこに処理液が効率的に侵入することとなり、薄板表面の隅々まで処理液が接触して、洗浄効果が高まることになる。そこで、その推論を確認するため、後述する実施例に記載した試験を行ったところ、切断薄板相互の隙間を確実に、しかも均等に形成させる結果が得られ、本発明者らの推論が肯定できる結果となった。   As a result of careful examination of the results of this experiment, the present inventors, in slurry cleaning, did not directly increase the cleaning effect of bubbles, but actively formed gaps between the cut thin plates in the thin plate group. Thought that the cleaning effect was enhanced. In other words, if bubbles enter the gap and give elasticity to assist in forming the gap, the treatment liquid efficiently penetrates into the gap, and the treatment liquid comes into contact with every corner of the thin plate surface. Will increase. Therefore, in order to confirm the inference, when the test described in the example described later was performed, the result of forming the gap between the cut thin plates reliably and evenly was obtained, and the inference of the present inventors can be affirmed As a result.

このような本発明者らが見出した新規な知見は、上記したような、まさにスラリー洗浄における問題点を解決できる技術そのものであり、そこで本発明者らは、この新規な知見に基づいた本発明を創案するに至った。すなわち、本発明に係る切断薄板相互間の密着防止方法は、インゴットを薄板状に連続的に切断し、各切断薄板の片端を固定した薄板群を、処理液が対流する処理液槽に浸して、各切断薄板の表面から不純物を除去する工程の際、前記各切断薄板の片端を固定した薄板群の薄板相互間に、気泡を混入させることを特徴とするものである。   Such a novel finding found by the present inventors is the technology itself that can solve the problems in the slurry cleaning as described above, and therefore, the inventors of the present invention based on the novel finding. It came to invent. That is, the method for preventing adhesion between the cut thin plates according to the present invention is a method in which an ingot is continuously cut into a thin plate shape, and a thin plate group in which one end of each cut thin plate is fixed is immersed in a processing liquid tank in which processing liquid is convected. In the step of removing impurities from the surface of each cut thin plate, air bubbles are mixed between the thin plates of the thin plate group to which one end of each cut thin plate is fixed.

ここで、前記気泡とは、薄板群の切断薄板相互間の隙間に侵入できる大きさであることが必要であり、例えば薄板が半導体素子のシリコンウエハのような場合、気泡も超微細なマイクロバブルやナノバブルといわれる大きさのもの、すなわち直径1000分の1mmから100万分の1mm程度の大きさのものとなる。また、各切断薄板の素材のインゴットは、シリコンインゴットに限られず、他のインゴットも含まれる。   Here, the bubble needs to have a size that can penetrate into the gap between the cut thin plates of the thin plate group. For example, when the thin plate is a silicon wafer of a semiconductor element, the bubble is also an ultrafine microbubble. Or a size called nanobubble, that is, a diameter of about 1 / 1,000,000 mm to 1 / 1,000,000 mm. Moreover, the ingot of the material of each cut thin plate is not limited to a silicon ingot, and other ingots are included.

上記方法は、気泡発生装置と、発生させた気泡を薄板群の各切断薄板の薄板相互間に混入するように噴射させる噴射装置があれば、容易に実施できる。そこで、そのような装置についても、請求項2の発明として提案する。   The above method can be easily carried out if there is an air bubble generating device and an injection device that injects the generated air bubbles so as to be mixed between the thin plates of the respective cut thin plates of the thin plate group. Therefore, such an apparatus is also proposed as the invention of claim 2.

この発明によれば、処理液中の気泡が、隣合う各切断薄板の間に入り込み、その弾力によって各切断薄板相互の密着を防ぐことができる。そのため、処理液が各切断薄板相互間に完全に入り込むことになり、洗浄不良となるのが防げる。   According to the present invention, the bubbles in the processing liquid can enter between the adjacent cut thin plates, and the elasticity of the bubbles can prevent the cut thin plates from being adhered to each other. For this reason, the processing liquid completely enters between the respective cut thin plates, thereby preventing a cleaning failure.

また、処理液から各切断薄板を取り出しても、気泡が付着したままの状態であるときは、隣り合う切断薄板は、互いに離れたままの状態を維持することができる。したがって、本洗浄工程でも各切断薄板の隙間に処理液が行き渡り、洗浄精度が格段に向上する。   Further, even if each cut thin plate is taken out from the processing liquid, if the bubbles remain attached, the adjacent cut thin plates can be kept separated from each other. Therefore, in the main cleaning process, the processing liquid spreads in the gaps between the respective cut thin plates, and the cleaning accuracy is greatly improved.

スラリー洗浄装置の概略図であって、本発明が適用された実施形態例を示す図である。It is the schematic of a slurry washing | cleaning apparatus, Comprising: It is a figure which shows the embodiment example to which this invention was applied. 図1の処理液槽部分の説明図である。It is explanatory drawing of the process liquid tank part of FIG.

本願に係る発明の具体的実施形態例を図面に基づき説明する。本形態例は、シリコンインゴットから半導体素子や太陽電池の基材を得るための一工程であるスラリー洗浄が実施される装置において、本発明が適用される例である。なお、以下に示す形態例はあくまでも本発明の一例であって、適用される気泡発生装置、気泡噴射装置はもちろんのこと、噴射ノズル、ポンプ、処理液槽の具体的形態についても、それらに本発明が限定されないことは当然である。   Specific embodiments of the invention according to the present application will be described with reference to the drawings. This embodiment is an example in which the present invention is applied to an apparatus in which slurry cleaning, which is one step for obtaining a semiconductor element or a solar cell base material from a silicon ingot, is performed. It should be noted that the embodiments shown below are merely examples of the present invention, and not only the applied bubble generation device and bubble injection device, but also the specific forms of the injection nozzle, pump, and processing liquid tank are included in these examples. Of course, the invention is not limited.

図1はスラリー洗浄装置の概略図であり、図中、1は処理液、2は処理液槽、3は循環装置、4はシリコンインゴットを切断して得られる薄板群、5はポンプ、6は噴射装置、7は噴射ノズル、8は切断薄板、9は固定接着部、10は気泡発生装置、11はナノバブルである。   FIG. 1 is a schematic view of a slurry cleaning apparatus, in which 1 is a processing liquid, 2 is a processing liquid tank, 3 is a circulation device, 4 is a group of thin plates obtained by cutting a silicon ingot, 5 is a pump, 6 is An injection device, 7 is an injection nozzle, 8 is a cut thin plate, 9 is a fixed adhesive portion, 10 is a bubble generating device, and 11 is a nanobubble.

スラリー洗浄装置は、図示のように、処理液1が充填された処理液槽2と、該処理液槽2内の処理液1を循環対流させるため循環装置3と、シリコンインゴットを切断して得られる薄板群4を上下に移動自在に支持する支持装置(図示なし)とから構成される。循環装置3は、槽底部から処理液1を抜き、抜いた処理液1を槽に返すためのポンプ5と、該ポンプ5によって処理液1を槽に戻す際、槽内に対流を起こさせるための噴射装置6とから構成され、これらを結ぶ流路によって循環流路が形成されている。前記噴射装置6は、先端に噴射ノズル7を備える。支持装置は、処理液槽2の上部に配置され、移動機構によって薄板群4を処理液槽2内で上げ下げする。ここで、薄板群4は、従来技術で説明したように、シリコンインゴットがワイヤソーで連続的に切断されて切断薄板8が形成され、それら各切断薄板8が各上端を固定接着部9で一つに保持されることにより形成される。   As shown in the figure, the slurry cleaning device is obtained by cutting the treatment liquid tank 2 filled with the treatment liquid 1, the circulation device 3 for circulating the treatment liquid 1 in the treatment liquid tank 2 and the silicon ingot. And a supporting device (not shown) for supporting the thin plate group 4 to be movable up and down. The circulation device 3 draws the processing liquid 1 from the bottom of the tank and returns the extracted processing liquid 1 to the tank, and in order to cause convection in the tank when the processing liquid 1 is returned to the tank by the pump 5. And a circulation flow path is formed by a flow path connecting them. The injection device 6 includes an injection nozzle 7 at the tip. The support device is disposed on the upper part of the processing liquid tank 2, and raises and lowers the thin plate group 4 in the processing liquid tank 2 by a moving mechanism. Here, as described in the prior art, the thin plate group 4 is formed by continuously cutting a silicon ingot with a wire saw to form a cut thin plate 8, and each of the cut thin plates 8 has one upper end at each fixed adhesive portion 9. It is formed by being held in the.

そして、本形態例では、このようなスラリー洗浄装置において、ポンプ5と噴射装置6との間の流路に、気泡発生装置10が配置されるとともに、前記噴射装置6の噴射ノズル7が、後述する薄板群4の薄板相互間に向かうように設定されている。   In this embodiment, in such a slurry cleaning apparatus, the bubble generation device 10 is disposed in the flow path between the pump 5 and the injection device 6, and the injection nozzle 7 of the injection device 6 is described later. The thin plate group 4 is set so as to face between the thin plates.

本形態例の気泡発生装置10は、超微細のいわゆるナノバブル11を発生させるための装置であり、まず前記ポンプ5の負圧を利用して気体を吸引し、気体と循環処理液から成る気液混合体を作り、該気液混合体を自身が備えるミキサにおいて攪拌混合してナノバブル11を生成する。このようなナノバブル11は、他の処理液1と同様に循環流路を流れていき、噴射装置6によって処理液槽2内で噴射される。そして、本形態例では、噴射装置6のノズル7が薄板群4の薄板相互間に向かうように設定されているので(図2中、矢印が噴射方向)、気泡発生装置10において生成されたナノバブル11は、処理液1と一緒に薄板相互間に向かい、その隙間に積極的に混入していくことになる。   The bubble generating device 10 of the present embodiment is a device for generating ultrafine so-called nanobubbles 11. First, a gas is sucked using the negative pressure of the pump 5, and a gas-liquid consisting of a gas and a circulating processing liquid is used. A mixture is prepared, and the gas-liquid mixture is stirred and mixed in a mixer provided therein to generate nanobubbles 11. Such nanobubbles 11 flow in the circulation flow path in the same manner as the other processing liquids 1 and are jetted in the processing liquid tank 2 by the jetting device 6. In this embodiment, since the nozzle 7 of the injection device 6 is set so as to face between the thin plates of the thin plate group 4 (in FIG. 2, the arrow is the injection direction), the nanobubbles generated in the bubble generation device 10 11 goes to the space between the thin plates together with the processing liquid 1 and is actively mixed in the gap.

以上よりなる本形態例において、支持装置を下降させて、各切断薄板8の上端を固定した薄板群4を、処理液層2内のうち噴射ノズル7が設置される位置まで下げていく。薄板群4は、充填された処理液1に浸かった状態で、噴射ノズル7から噴射される処理液1を受けることになる。この噴射処理液1には、ナノバブル11が混入されており、それが薄板群4の各切断薄板相互の隙間に混入していく。これにより、各切断薄板相互の密着が防止され、弾力のある均一な隙間が形成されるので、そこに処理液1が隅々まで浸透して各切断薄板8の表面に接触し、その表面から不純物を除去することになる。   In the present embodiment configured as described above, the support device is lowered to lower the thin plate group 4 in which the upper ends of the respective cut thin plates 8 are fixed to a position in the processing liquid layer 2 where the injection nozzle 7 is installed. The thin plate group 4 receives the treatment liquid 1 ejected from the ejection nozzle 7 while being immersed in the filled treatment liquid 1. In the jetting treatment liquid 1, nanobubbles 11 are mixed and mixed into the gaps between the cut thin plates of the thin plate group 4. As a result, the cut thin plates are prevented from closely contacting each other, and an elastic and uniform gap is formed, so that the treatment liquid 1 penetrates into every corner and contacts the surface of each cut thin plate 8, and from the surface. Impurities will be removed.

なお、以上の形態例では、処理液とナノバブルの噴射装置が共通であったが、これらは別々の噴射装置を用いても良いことは当然である。その点を含めて、本発明が以上の形態例に限定されないことはいうまでもなく、気泡が切断薄板相互間の密着防止方法に用いられていれば、その気泡発生装置や気泡噴射装置の機能や噴射ノズル、ポンプ、処理液層の大きさ、形状等は適宜変更可能であり、もちろんそれらも本発明の範囲に含まれるものである。   In the above embodiment, the treatment liquid and the nanobubble injection device are common, but it is natural that separate injection devices may be used. Including that point, it goes without saying that the present invention is not limited to the above-described embodiments, and if the bubbles are used in a method for preventing adhesion between cut thin plates, the function of the bubble generating device or bubble jetting device is used. The size, shape, etc. of the injection nozzle, pump, and treatment liquid layer can be changed as appropriate, and these are of course included in the scope of the present invention.

本発明の基礎的知見となる、ナノバブルによる隙間形成効果を確認するための試験を行った。上記実施形態例の気泡発生装置において、ナノバブルを発生させ、それを噴射ノズルから処理液とともに噴射させた場合(本発明の試験例)と、ナノバブルを発生させずに処理液のみ噴射ノズルから噴射させた場合(比較例)のそれぞれの場合について、薄板群の各切断薄板相互の隙間状態を確認した。その結果によると、本発明の試験例では、各切断薄板相互間には綺麗に隙間ができている状態であるのに対し、比較例では、各切断薄板は相互に密着している状態となっている。この実験結果により、ナノバブルを用いた方が、各切断薄板が相互に密着する部分が少なく均等に隙間が生じることが明瞭に確認できた。   A test for confirming a gap forming effect by nanobubbles, which is a basic knowledge of the present invention, was conducted. In the bubble generating apparatus of the above embodiment, when nano bubbles are generated and sprayed together with the processing liquid from the spray nozzle (test example of the present invention), only the processing liquid is sprayed from the spray nozzle without generating nano bubbles. In each case (comparative example), the gap state between the cut thin plates of the thin plate group was confirmed. According to the results, in the test example of the present invention, there is a clean gap between the cut thin plates, whereas in the comparative example, the cut thin plates are in close contact with each other. ing. From these experimental results, it was clearly confirmed that the use of nanobubbles had fewer portions where the cut thin plates were in close contact with each other, and gaps were evenly formed.

この発明は、基板の処理液工程に利用できる技術である。   The present invention is a technique that can be used in a substrate processing liquid process.

1 処理液
2 処理液槽
4 シリコンインゴットを切断して得られる薄板群
6 噴射装置
7 噴射ノズル
8 切断薄板
10 気泡発生装置
11 ナノバブル(気泡)
1 Treatment liquid
2 Treatment tank
4 Thin plate group obtained by cutting silicon ingot
6 Injection device
7 Injection nozzle
8 Cutting sheet
10 Bubble generator
11 Nano bubbles

Claims (2)

インゴットを薄板状に連続的に切断し、各切断薄板の片端を固定した薄板群を、
処理液が対流する処理液槽に浸して、各切断薄板の表面から不純物を除去する工程の際、
前記各切断薄板の片端を固定した薄板群の薄板相互間に、気泡を混入させることを特徴とする切断薄板相互間の密着防止方法。
A group of thin plates in which ingots are continuously cut into thin plates and one end of each cut thin plate is fixed,
In the process of removing impurities from the surface of each cut thin plate by immersing in a treatment liquid tank in which the treatment liquid convects,
A method for preventing adhesion between cut thin plates, wherein bubbles are mixed between the thin plates of the thin plate group to which one end of each cut thin plate is fixed.
気泡発生装置と、
発生させた気泡を各切断薄板相互間に混入するように噴射させる噴射装置と、
からなることを特徴とする請求項1の切断薄板相互間の密着防止方法に用いられる密着防止装置。
A bubble generating device;
An injection device for injecting the generated bubbles so as to be mixed between the respective cut thin plates;
The adhesion prevention apparatus used for the adhesion prevention method between the cut thin plates of Claim 1 characterized by these.
JP2009056186A 2009-03-10 2009-03-10 Method for preventing close adhesion among mutual cut sheet, and device for preventing close adhesion used for the same Pending JP2010212408A (en)

Priority Applications (1)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012028438A (en) * 2010-07-21 2012-02-09 Air Water Inc Method and device for making wafer into multiple sheets
JP2015073009A (en) * 2013-10-03 2015-04-16 パナソニックIpマネジメント株式会社 Wafer cleaning device and wafer cleaning method
KR20230017041A (en) * 2021-07-27 2023-02-03 주식회사 유토시스 Apparatus for Separating Wafer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012028438A (en) * 2010-07-21 2012-02-09 Air Water Inc Method and device for making wafer into multiple sheets
JP2015073009A (en) * 2013-10-03 2015-04-16 パナソニックIpマネジメント株式会社 Wafer cleaning device and wafer cleaning method
KR20230017041A (en) * 2021-07-27 2023-02-03 주식회사 유토시스 Apparatus for Separating Wafer
KR102550990B1 (en) * 2021-07-27 2023-07-04 주식회사 유토시스 Apparatus for Separating Wafer

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