JP2010210416A - Acceleration sensor - Google Patents

Acceleration sensor Download PDF

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JP2010210416A
JP2010210416A JP2009056941A JP2009056941A JP2010210416A JP 2010210416 A JP2010210416 A JP 2010210416A JP 2009056941 A JP2009056941 A JP 2009056941A JP 2009056941 A JP2009056941 A JP 2009056941A JP 2010210416 A JP2010210416 A JP 2010210416A
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weight
acceleration
parts
portions
acceleration sensor
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Masafumi Okada
全史 岡田
Nobuyuki Ibara
伸行 茨
Hitoshi Yoshida
仁 吉田
Hideki Ueda
英喜 上田
Takashi Mori
岳志 森
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Panasonic Electric Works Co Ltd
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Panasonic Electric Works Co Ltd
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<P>PROBLEM TO BE SOLVED: To supply an acceleration sensor which can be miniaturized, while suppressing deterioration in the detection sensitivity. <P>SOLUTION: Weight parts 4 and 5 have recessed parts 11 and 13 opened in the underside and solid parts 12 and 14, excluding the recessed parts 11 and 13, which are formed integrally. In the recessed parts 11 and 13, an embedded part 17, consisting of a material having a specific gravity twice or higher that of a material forming the solid parts 12 and 14, is formed in each section divided by two reinforcing walls 16 and 16. Thus, the dimensions can be lessened, without changing the weight of the weight parts 4 and 5, and as a result, miniaturization can be attained, while suppressing deterioration in the detection sensitivity. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、静電容量型の加速度センサに関するものである。   The present invention relates to a capacitance type acceleration sensor.

従来、図7に示すように可動電極を有する直方体形状の重り部100と、重り部100の長手方向における略中央において重り部100を回動自在に支持する一対のビーム部101と、一対のビーム部101を結ぶ直線(ビーム軸)を境界線とした重り部100の表面のそれぞれ一方側及び他方側に対し所定距離をあけて対向配置された第1及び第2の固定電極102,103とを備える加速度センサが知られている。この加速度センサは、ビーム軸を回動軸とした重り部100の回動に伴う可動電極(重り部100の固定電極102,103との対向部位)と第1および第2の固定電極102,103間の静電容量の変化を差動検出することにより、重り部100に印加された加速度を検出する。このような加速度センサでは、加速度が印加された際にビーム軸を回動軸としたモーメントが重り部100に発生するように、重り部100の裏面のビーム軸を境界線とした一方側(図7における右側)に凹部104を形成することにより、ビーム軸を境界線とした重り部100の一方側(右側)と他方側(左側)とで重量が異なるようにしている(例えば、特許文献1参照)。   Conventionally, as shown in FIG. 7, a rectangular parallelepiped weight part 100 having a movable electrode, a pair of beam parts 101 that rotatably supports the weight part 100 at a substantially center in the longitudinal direction of the weight part 100, and a pair of beams First and second fixed electrodes 102 and 103 arranged to face each other on the one side and the other side of the weight part 100 with a straight line (beam axis) connecting the parts 101 as a boundary line. An acceleration sensor provided is known. This acceleration sensor includes a movable electrode (a portion facing the fixed electrodes 102 and 103 of the weight portion 100) and the first and second fixed electrodes 102 and 103 that accompany the rotation of the weight portion 100 about the beam axis. The acceleration applied to the weight part 100 is detected by differentially detecting the change in capacitance between the two. In such an acceleration sensor, when the acceleration is applied, one side having the beam axis on the back surface of the weight part 100 as a boundary line is generated so that a moment with the beam axis as a rotation axis is generated in the weight part 100 (see FIG. 7 is formed on the one side (right side) and the other side (left side) of the weight part 100 with the beam axis as a boundary line (for example, Patent Document 1). reference).

特表2008−544243号公報Special table 2008-544243 gazette

ところで、従来例において重り部100のサイズを小さくすると重り部100の重量も減少し、加速度が印加された際にビーム軸を回動軸としたモーメントが減少して検出感度が低下してしまう虞があった。   By the way, when the size of the weight part 100 is reduced in the conventional example, the weight of the weight part 100 is also reduced, and when the acceleration is applied, the moment with the beam axis as the rotation axis is reduced and the detection sensitivity may be lowered. was there.

本発明は上記事情に鑑みて為されたものであり、その目的は、検出感度の低下を抑えつつ小型化が図れる加速度センサを供給することにある。   The present invention has been made in view of the above circumstances, and an object thereof is to provide an acceleration sensor that can be downsized while suppressing a decrease in detection sensitivity.

請求項1の発明は、上記目的を達成するために、一面に可動電極が設けられた重り部と、重り部を回動軸の回りに回動自在に支持するビーム部と、可動電極に対向して配置される固定電極とを備え、重り部は、少なくとも一部が当該一部を除く他の部位よりも2倍以上の比重を有する材料で形成されていることを特徴とする。   In order to achieve the above object, the invention according to claim 1 is a weight portion having a movable electrode provided on one surface thereof, a beam portion for rotatably supporting the weight portion around a rotation shaft, and the movable electrode. The weight portion is formed of a material having a specific gravity that is twice or more that of other portions excluding the portion.

請求項1の発明によれば、重り部の少なくとも一部が当該一部を除く他の部位よりも2倍以上の比重を有する材料で形成されているので、例えば、重り部の重量を変えずに大きさを小さくすることができる。その結果、検出感度の低下を抑えつつ小型化が図れる。   According to the first aspect of the present invention, since at least a part of the weight part is formed of a material having a specific gravity that is twice or more that of other parts excluding the part, for example, the weight of the weight part is not changed. The size can be reduced. As a result, downsizing can be achieved while suppressing a decrease in detection sensitivity.

請求項2の発明は、請求項1の発明において、前記重り部は、前記材料で形成された部位と、当該部位よりも重量の少ない部位とが回動方向に沿って並ぶように形成されていることを特徴とする。   According to a second aspect of the present invention, in the first aspect of the invention, the weight portion is formed such that a portion formed of the material and a portion having a weight less than the portion are aligned along the rotation direction. It is characterized by being.

本発明によれば、検出感度の低下を抑えつつ小型化が図れる。   According to the present invention, downsizing can be achieved while suppressing a decrease in detection sensitivity.

本発明の実施形態を示し、(a)はセンサチップの下面図、(b)は断面図である。1 shows an embodiment of the present invention, (a) is a bottom view of a sensor chip, and (b) is a cross-sectional view. 同上の分解斜視図である。It is an exploded perspective view same as the above. (a)〜(e)は同上の製造方法を説明するための断面図である。(A)-(e) is sectional drawing for demonstrating the manufacturing method same as the above. (a),(b)は同上における重り部の別の構成を示す断面図である。(A), (b) is sectional drawing which shows another structure of the weight part in the same as the above. 同上の変形例を示す上面図である。It is a top view which shows the modification same as the above. 同上の変形例を示す上面図である。It is a top view which shows the modification same as the above. 従来例を示し、(a)は断面図、(b)は平面図である。A prior art example is shown, (a) is a sectional view and (b) is a plan view.

以下、図面を参照して本発明の実施形態を詳細に説明する。但し、以下の説明では図2におけるx軸方向を縦方向、y軸方向を横方向、z軸方向を上下方向と定める。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In the following description, however, the x-axis direction in FIG. 2 is defined as the vertical direction, the y-axis direction as the horizontal direction, and the z-axis direction as the vertical direction.

本実施形態は、図2に示すように外形が矩形平板状であるセンサチップ1と、センサチップ1の上面側に固定される上部固定板2aと、センサチップ1の下面側に固定される下部固定板2bとを備えている。センサチップ1は、上下方向から見て矩形の2つの枠部3a,3bが長手方向(横方向)に並設されたフレーム部3と、枠部3a,3bの内周面に対して隙間を空けた状態で枠部3a,3b内に配置された直方体形状の重り部4,5と、枠部3a,3bの内周面と重り部4,5の側面を連結してフレーム部3に対して重り部4,5を回動軸の回りに回動自在に支持する各一対のビーム部6a,6b及び7a,7bと、重り部4,5の上面に形成される可動電極4a,5aとを備えている。   In this embodiment, as shown in FIG. 2, the sensor chip 1 whose outer shape is a rectangular flat plate, the upper fixing plate 2 a fixed to the upper surface side of the sensor chip 1, and the lower portion fixed to the lower surface side of the sensor chip 1 And a fixed plate 2b. The sensor chip 1 has a gap with respect to the frame part 3 in which two rectangular frame parts 3a and 3b viewed in the vertical direction are arranged in the longitudinal direction (lateral direction) and the inner peripheral surface of the frame parts 3a and 3b. The rectangular parallelepiped weight parts 4 and 5 arranged in the frame parts 3a and 3b in the opened state, the inner peripheral surface of the frame parts 3a and 3b and the side surfaces of the weight parts 4 and 5 are connected to the frame part 3 And a pair of beam portions 6a, 6b and 7a, 7b that support the weight portions 4, 5 so as to be rotatable about a rotation axis, and movable electrodes 4a, 5a formed on the upper surfaces of the weight portions 4, 5. It has.

重り部4,5は、図1に示すように一面(下面)に開口する凹部11,13と凹部11,13を除く充実部12,14が一体に形成されている。凹部11,13は、開口面の法線方向(上下方向)から見て平面視四角形に形成されるとともに、凹部11,13の内壁面及び底壁面と結合され且つ上下方向から見てそれぞれ対角線上に配置されて互いに交差する2つの補強壁16,16が内部に設けられている。さらに、2つの補強壁16,16で区切られた凹部11,13の各区画内には、充実部12,14を形成している材料に対して比重が2倍以上の材料からなる埋込部17が形成されている。   As shown in FIG. 1, the weight portions 4, 5 are integrally formed with concave portions 11, 13 opening on one surface (lower surface) and solid portions 12, 14 excluding the concave portions 11, 13. The recesses 11 and 13 are formed in a square shape in plan view when viewed from the normal direction (vertical direction) of the opening surface, and are coupled to the inner wall surface and the bottom wall surface of the recesses 11 and 13 and are diagonally viewed from the vertical direction. The two reinforcing walls 16 and 16 which are arrange | positioned and mutually cross | intersect are provided in the inside. Further, in each of the sections of the recesses 11 and 13 separated by the two reinforcing walls 16 and 16, an embedded portion made of a material having a specific gravity more than twice that of the material forming the solid portions 12 and 14. 17 is formed.

ここで、本実施形態では充実部12,14がシリコン(比重:2.33[g/cm3])で形成されているので、埋込部17を形成する材料としてはニッケル(比重:8.90[g/cm3])、タングステン(比重:19.3[g/cm3])、クロム(比重:7.87[g/cm3])、パラジウム(比重:12.02[g/cm3])、白金(比重:21.45[g/cm3])、マンガン(比重:7.43[g/cm3])などを用いればよい。 Here, in the present embodiment, since the solid portions 12 and 14 are formed of silicon (specific gravity: 2.33 [g / cm 3 ]), the material for forming the embedded portion 17 is nickel (specific gravity: 8. 90 [g / cm 3 ]), tungsten (specific gravity: 19.3 [g / cm 3 ]), chromium (specific gravity: 7.87 [g / cm 3 ]), palladium (specific gravity: 12.02 [g / cm 3 ]), platinum (specific gravity: 21.45 [g / cm 3 ]), manganese (specific gravity: 7.43 [g / cm 3 ]), or the like may be used.

一対のビーム部6a,6bは、横方向に対向する枠部3aの内周面における縦方向の中央部に一端が連結され、重り部4の側面における凹部11と充実部12の境界付近に他端が連結されている。同じく一対のビーム部7a,7bは、横方向に対向する枠部3bの内周面における縦方向の中央部に一端が連結され、重り部5の側面における凹部13と充実部14の境界付近に他端が連結されている。つまり、一対のビーム部6aと6b、7aと7bをそれぞれ結ぶ直線が回動軸となり、回動軸の回りに各重り部4,5が回動することになる。また、センサチップ1は、後述するように半導体の微細加工技術によりシリコン基板(シリコンSOI基板)を加工して形成されるものであり、重り部4,5の上面を含む部分が可動電極4a,5aとなる。尚、図2では図示を省略しているが、重り部4,5の上面及び下面には、重り部4,5が上部固定板2a及び下部固定板2bに直接衝突することを防止するための突起部15a〜15gが突設されている。   One end of the pair of beam portions 6a and 6b is connected to the central portion in the vertical direction on the inner peripheral surface of the frame portion 3a facing in the horizontal direction, and the other is near the boundary between the concave portion 11 and the solid portion 12 on the side surface of the weight portion 4. The ends are connected. Similarly, one pair of beam portions 7a and 7b is connected at one end to the longitudinal center portion of the inner peripheral surface of the frame portion 3b facing in the lateral direction, and near the boundary between the concave portion 13 and the solid portion 14 on the side surface of the weight portion 5. The other end is connected. That is, a straight line connecting the pair of beam portions 6a and 6b and 7a and 7b serves as a rotation shaft, and the weight portions 4 and 5 rotate around the rotation shaft. The sensor chip 1 is formed by processing a silicon substrate (silicon SOI substrate) by a semiconductor microfabrication technique as will be described later, and the portions including the upper surfaces of the weight portions 4 and 5 are movable electrodes 4a, 5a. Although not shown in FIG. 2, the weights 4 and 5 are prevented from directly colliding with the upper fixing plate 2a and the lower fixing plate 2b on the upper and lower surfaces of the weights 4 and 5, respectively. Protrusions 15a to 15g are projected.

上部固定板2aは、石英ガラスなどの絶縁材料製であって、その下面には、上下方向に沿ってセンサチップ1の重り部4(可動電極4a)と対向する位置に第1の固定電極20aと第2の固定電極20bが縦方向に並設されるとともに、上下方向に沿ってセンサチップ1の重り部5(可動電極5a)と対向する位置に第1の固定電極21aと第2の固定電極21bが縦方向に並設されている。また、上部固定板2aは、縦方向の一端側に5つの貫通孔22a〜22eが横方向に並べて貫設されている。さらに、上部固定板2aの下面には各固定電極20a,20b及び21a,21bと電気的に接続された複数の導電パターン(図示せず)が形成されている。   The upper fixed plate 2a is made of an insulating material such as quartz glass, and on the lower surface thereof, the first fixed electrode 20a is located at a position facing the weight portion 4 (movable electrode 4a) of the sensor chip 1 along the vertical direction. And the second fixed electrode 20b are juxtaposed in the vertical direction, and the first fixed electrode 21a and the second fixed electrode 20a are positioned at positions facing the weight portion 5 (movable electrode 5a) of the sensor chip 1 along the vertical direction. Electrodes 21b are arranged in the vertical direction. Further, the upper fixing plate 2a is provided with five through holes 22a to 22e arranged side by side on one end side in the vertical direction. Further, a plurality of conductive patterns (not shown) electrically connected to the fixed electrodes 20a, 20b and 21a, 21b are formed on the lower surface of the upper fixed plate 2a.

一方、センサチップ1の縦方向一端側にはフレーム部3から離間された合計4つの電極部8a,8b,9a,9bが並設されている。これら4つの電極部8a,8b,9a,9bは、上面における略中央に金属膜からなる検出電極80a,80b,90a,90bがそれぞれ形成されるとともに、枠部3a,3bに臨む端部の上面に金属膜からなる圧接電極81a,81b,91a,91bがそれぞれ形成されている。尚、フレーム部3上面の電極部8b,9aの間には接地電極10が形成されている。そして、センサチップ1の上面に上部固定板2aが接合されると、上部固定板2aの下面に形成されている導電パターンと圧接電極81a,81b,91a,91bが圧接接続されることで各検出電極80a,80b,90a,90bが各固定電極20a,20b,21a,21bと電気的に接続されるとともに、上部固定板2aの貫通孔22a〜22dを通して各検出電極80a,80b,90a,90bが外部に露出する(図1(b)参照)。尚、接地電極10も貫通孔22eを通して外部に露出する。   On the other hand, a total of four electrode portions 8 a, 8 b, 9 a, and 9 b separated from the frame portion 3 are arranged in parallel on one longitudinal end side of the sensor chip 1. The four electrode portions 8a, 8b, 9a, and 9b are formed with detection electrodes 80a, 80b, 90a, and 90b made of a metal film substantially at the center on the upper surface, and upper surfaces of end portions facing the frame portions 3a and 3b. Further, press contact electrodes 81a, 81b, 91a, 91b made of a metal film are formed respectively. A ground electrode 10 is formed between the electrode portions 8b and 9a on the upper surface of the frame portion 3. Then, when the upper fixing plate 2a is joined to the upper surface of the sensor chip 1, each of the detection is performed by press-connecting the conductive pattern formed on the lower surface of the upper fixing plate 2a and the press contact electrodes 81a, 81b, 91a, 91b. The electrodes 80a, 80b, 90a, 90b are electrically connected to the fixed electrodes 20a, 20b, 21a, 21b, and the detection electrodes 80a, 80b, 90a, 90b are passed through the through holes 22a-22d of the upper fixed plate 2a. It is exposed to the outside (see FIG. 1B). The ground electrode 10 is also exposed to the outside through the through hole 22e.

下部固定板2bは、上部固定板2aと同じく石英ガラスなどの絶縁材料製であって、その上面には上下方向に沿ってセンサチップ1の重り部4,5と対向する位置にそれぞれ付着防止膜23a,23bが形成されている。この付着防止膜23a,23bは、アルミニウム系合金等の固定電極20a,…と同じ材料で形成されており、回動した重り部4,5の下面が下部固定板2bに付着することを防止している。   The lower fixing plate 2b is made of an insulating material such as quartz glass like the upper fixing plate 2a, and has an adhesion preventing film on the upper surface thereof at positions facing the weight portions 4 and 5 of the sensor chip 1 along the vertical direction. 23a and 23b are formed. These adhesion preventing films 23a, 23b are made of the same material as the fixed electrodes 20a,... Such as an aluminum alloy, and prevent the lower surfaces of the rotated weight parts 4, 5 from adhering to the lower fixed plate 2b. ing.

ここで、本実施形態では、枠部3a、重り部4、ビーム部6a,6b、可動電極4a、第1及び第2の固定電極20a,20b、検出電極80a,80bと、枠部3b、重り部5、ビーム部7a,7b、可動電極5a、第1及び第2の固定電極21a,21b、検出電極81a,81bとで各々加速度センサが構成され、重り部4,5の向き(凹部11,13と充実部12,14の配置)を180度反転させた状態で2つの加速度センサが一体に形成されている。   Here, in the present embodiment, the frame portion 3a, the weight portion 4, the beam portions 6a and 6b, the movable electrode 4a, the first and second fixed electrodes 20a and 20b, the detection electrodes 80a and 80b, the frame portion 3b and the weight. Part 5, beam parts 7a and 7b, movable electrode 5a, first and second fixed electrodes 21a and 21b, and detection electrodes 81a and 81b each constitute an acceleration sensor, and the direction of weight parts 4 and 5 (recesses 11 and The two acceleration sensors are integrally formed in a state in which the arrangement 13 and the solid portions 12 and 14 are inverted 180 degrees.

次に、本実施形態の検出動作について説明する。   Next, the detection operation of this embodiment will be described.

まず、一方の重り部4にx軸方向の加速度が印加された場合を考える。x軸方向に加速度が印加されると重り部4が回動軸の回りに回動して可動電極4aと第1の固定電極20a並びに第2の固定電極20bとの間の距離が変化し、その結果、可動電極4aと各固定電極20a,20bとの間の静電容量C1,C2も変化する。ここで、x軸方向の加速度が印加されていないときの可動電極4aと各固定電極20a,20bとの間の静電容量をC0とし、加速度の印加によって生じる静電容量の変化分をΔCとすれば、x軸方向の加速度が印加されたときの静電容量C1,C2は、
C1=C0−ΔC …(1)
C2=C0+ΔC …(2)
と表すことができる。
First, consider a case where an acceleration in the x-axis direction is applied to one weight portion 4. When acceleration is applied in the x-axis direction, the weight portion 4 rotates around the rotation axis, and the distance between the movable electrode 4a and the first fixed electrode 20a and the second fixed electrode 20b changes. As a result, the capacitances C1 and C2 between the movable electrode 4a and the fixed electrodes 20a and 20b also change. Here, the capacitance between the movable electrode 4a and the fixed electrodes 20a and 20b when no acceleration in the x-axis direction is applied is C0, and the change in capacitance caused by the application of acceleration is ΔC. Then, the capacitances C1 and C2 when the acceleration in the x-axis direction is applied are
C1 = C0−ΔC (1)
C2 = C0 + ΔC (2)
It can be expressed as.

同様に、他方の重り部5にx軸方向の加速度が印加された場合、可動電極5aと各固定電極21a,21bとの間の静電容量C3,C4は、
C3=C0−ΔC …(3)
C4=C0+ΔC …(4)
と表すことができる。
Similarly, when acceleration in the x-axis direction is applied to the other weight portion 5, the capacitances C3 and C4 between the movable electrode 5a and the fixed electrodes 21a and 21b are:
C3 = C0−ΔC (3)
C4 = C0 + ΔC (4)
It can be expressed as.

ここで、静電容量C1〜C4の値は、検出電極80a,80b及び81a,81bから取り出す電圧信号を演算処理することで検出することができる。そして、一方の加速度センサから得られる静電容量C1,C2の差分値CA(=C1−C2)と、他方の加速度センサから得られる静電容量C3,C4の差分値CB(=C3−C4)との和(±4ΔC)を算出すれば、この差分値CA,CBの和に基づいてx軸方向に印加された加速度の向きと大きさを演算することができる。   Here, the values of the capacitances C1 to C4 can be detected by performing arithmetic processing on voltage signals taken out from the detection electrodes 80a and 80b and 81a and 81b. Then, the difference value CA (= C1-C2) between the capacitances C1, C2 obtained from one acceleration sensor and the difference value CB (= C3-C4) between the capacitances C3, C4 obtained from the other acceleration sensor. Is calculated (± 4ΔC), the direction and magnitude of the acceleration applied in the x-axis direction can be calculated based on the sum of the difference values CA and CB.

次に、一方の重り部4にz軸方向の加速度が印加された場合を考える。z軸方向に加速度が印加されると重り部4が回動軸の回りに回動して可動電極4aと第1の固定電極20a並びに第2の固定電極20bとの間の距離が変化し、その結果、可動電極4aと各固定電極20a,20bとの間の静電容量C1,C2も変化する。ここで、z軸方向の加速度が印加されていないときの可動電極4aと各固定電極20a,20bとの間の静電容量をC0とし、加速度の印加によって生じる静電容量の変化分をΔCとすれば、z軸方向の加速度が印加されたときの静電容量C1,C2は、
C1=C0+ΔC …(5)
C2=C0−ΔC …(6)
と表すことができる。
Next, consider a case where acceleration in the z-axis direction is applied to one weight portion 4. When acceleration is applied in the z-axis direction, the weight portion 4 rotates about the rotation axis, and the distance between the movable electrode 4a and the first fixed electrode 20a and the second fixed electrode 20b changes. As a result, the capacitances C1 and C2 between the movable electrode 4a and the fixed electrodes 20a and 20b also change. Here, the capacitance between the movable electrode 4a and the fixed electrodes 20a and 20b when no acceleration in the z-axis direction is applied is C0, and the change in capacitance caused by the application of acceleration is ΔC. Then, the capacitances C1 and C2 when the acceleration in the z-axis direction is applied are:
C1 = C0 + ΔC (5)
C2 = C0−ΔC (6)
It can be expressed as.

同様に、他方の重り部5にz軸方向の加速度が印加された場合、可動電極5aと各固定電極21a,21bとの間の静電容量C3,C4は、
C3=C0−ΔC …(7)
C4=C0+ΔC …(8)
と表すことができる。
Similarly, when acceleration in the z-axis direction is applied to the other weight portion 5, the capacitances C3 and C4 between the movable electrode 5a and the fixed electrodes 21a and 21b are:
C3 = C0−ΔC (7)
C4 = C0 + ΔC (8)
It can be expressed as.

そして、一方の加速度センサから得られる静電容量C1,C2の差分値CA(=C1−C2)と、他方の加速度センサから得られる静電容量C3,C4の差分値CB(=C3−C4)との差(±4ΔC)を算出すれば、この差分値CA,CBの差に基づいてz軸方向に印加された加速度の向きと大きさを演算することができる。尚、差分値CA,CBの和と差に基づいてx軸方向及びz軸方向の加速度の向き及び大きさを求める演算処理については従来周知であるから詳細な説明を省略する。   Then, the difference value CA (= C1-C2) between the capacitances C1, C2 obtained from one acceleration sensor and the difference value CB (= C3-C4) between the capacitances C3, C4 obtained from the other acceleration sensor. Is calculated (± 4ΔC), the direction and magnitude of the acceleration applied in the z-axis direction can be calculated based on the difference between the difference values CA and CB. Since the calculation processing for obtaining the direction and magnitude of acceleration in the x-axis direction and the z-axis direction based on the sum and difference of the difference values CA and CB is well known in the art, detailed description thereof will be omitted.

次に、図3を参照して本実施形態の製造方法を説明する。   Next, the manufacturing method of this embodiment will be described with reference to FIG.

本実施形態は、図3(a)に示すように支持基板30a及び中間酸化膜30b、活性層30cからなるシリコンSOI基板を半導体の微細加工技術を利用して加工することにより形成される。まず、シリコンSOI基板の両面にシリコン酸化膜やフォトレジスト膜などのマスク材料31を形成し、重り部4,5に対応する位置のマスク材料31を除去した後、TMAH(テトラメチル水酸化アンモニウム溶液)やKOH(水酸化カリウム溶液)などを利用した湿式エッチング、あるいは反応性イオンエッチング(RIE)などの乾式エッチングを行うことにより、シリコンSOI基板の上面及び下面に重り部4,5が変位するための空間(凹所)32a,32bを形成する(図3(b)参照)。   As shown in FIG. 3A, the present embodiment is formed by processing a silicon SOI substrate including a support substrate 30a, an intermediate oxide film 30b, and an active layer 30c using a semiconductor microfabrication technique. First, a mask material 31 such as a silicon oxide film or a photoresist film is formed on both surfaces of a silicon SOI substrate, and after removing the mask material 31 at a position corresponding to the weights 4 and 5, a TMAH (tetramethyl ammonium hydroxide solution) is formed. ), KOH (potassium hydroxide solution) or other wet etching, or dry etching such as reactive ion etching (RIE), the weights 4 and 5 are displaced on the upper and lower surfaces of the silicon SOI substrate. Spaces (recesses) 32a and 32b are formed (see FIG. 3B).

そして、凹所32a,32bの底面の所定位置にシリコン酸化膜又はカーボンナノチューブからなる突起部15a〜15gを形成する。このとき、スパッタリングや蒸着成膜を利用して金属膜からなる検出電極80a,80b,90a,90b並びに圧接電極81a,81b,91a,91bを形成する(図3(c)参照)。   Then, protrusions 15a to 15g made of a silicon oxide film or carbon nanotube are formed at predetermined positions on the bottom surfaces of the recesses 32a and 32b. At this time, detection electrodes 80a, 80b, 90a, 90b and press-contact electrodes 81a, 81b, 91a, 91b made of a metal film are formed by using sputtering or vapor deposition (see FIG. 3C).

続いて、支持基板30a及び中間酸化膜30bの順にシリコンSOI基板の下面をエッチングすることで重り部4,5(凹部11,13並びに充実部12,14、補助壁16)を形成し、さらにニッケル、タングステン、クロム、パラジウム、白金、マンガンなどのシリコンよりも比重が2倍以上大きい材料を補助壁16で区画された凹部11,13内に埋め込むことで埋込部17を形成した後、付着防止膜23a,23bが上面に形成された下部固定板2bをシリコンSOI基板の下面に陽極接合する(図3(d)参照)。   Subsequently, the bottom portions of the silicon SOI substrate are etched in the order of the support substrate 30a and the intermediate oxide film 30b to form the weight portions 4 and 5 (the recess portions 11 and 13 and the solid portions 12 and 14 and the auxiliary wall 16). After the formation of the embedded portion 17 by embedding a material having a specific gravity more than twice that of silicon, such as tungsten, chromium, palladium, platinum, and manganese, into the recesses 11 and 13 defined by the auxiliary wall 16, the adhesion prevention is performed. The lower fixing plate 2b having the films 23a and 23b formed on the upper surface is anodically bonded to the lower surface of the silicon SOI substrate (see FIG. 3D).

最後に、貫通孔22a〜22e及び第1及び第2の固定電極20a,20b,21a,21bが形成された上部固定板2aをシリコンSOI基板の上面に陽極接合することにより、本実施形態の製造工程は完了する(図3(e)参照)。   Finally, the upper fixing plate 2a in which the through holes 22a to 22e and the first and second fixed electrodes 20a, 20b, 21a, and 21b are formed is anodically bonded to the upper surface of the silicon SOI substrate, thereby manufacturing the present embodiment. The process is completed (see FIG. 3 (e)).

而して本実施形態によれば、重り部4,5の少なくとも一部(埋込部17)が当該一部を除く他の部位(充実部12,14)よりも2倍以上の比重を有する材料で形成されているので、例えば、重り部4,5の重量を変えずに大きさを小さくすることができ、その結果、検出感度の低下を抑えつつ小型化が図れるものである。   Thus, according to the present embodiment, at least a part of the weight parts 4 and 5 (embedded part 17) has a specific gravity more than twice that of other parts (solid parts 12 and 14) excluding the part. Since it is made of a material, for example, it is possible to reduce the size without changing the weight of the weight portions 4 and 5, and as a result, it is possible to reduce the size while suppressing a decrease in detection sensitivity.

ここで、充実部12,14の材料よりも比重が2倍以上大きい材料を凹部11,13内に埋め込む代わりに、図4(a)に示すように、比重が2倍以上大きい材料からなる質量部18を凹部11,13が形成されていた部位に形成しても構わない。あるいは、図4(b)に示すように補助壁16や凹部11,13の内壁を取り除くとともに、充実部12,14を可動電極4a,5aを形成している材料(シリコン)よりも比重が2倍以上大きい材料で形成しても構わない。   Here, instead of embedding a material whose specific gravity is twice or more larger than that of the material of the solid portions 12 and 14 in the recesses 11 and 13, as shown in FIG. The portion 18 may be formed at a portion where the concave portions 11 and 13 were formed. Alternatively, as shown in FIG. 4B, the auxiliary walls 16 and the inner walls of the recesses 11 and 13 are removed, and the solid portions 12 and 14 have a specific gravity 2 higher than that of the material (silicon) forming the movable electrodes 4a and 5a. It may be made of a material that is twice or more larger.

尚、本実施形態はx軸とz軸の2軸方向の加速度を検出する加速度センサを例示したが、図5に示すように上述した加速度センサ1をxy平面内で90度回転対称に配置すれば、x軸、z軸にy軸を加えた3軸方向の加速度を検出する加速度センサが実現できる。あるいは、図6に示すように3つの加速度センサを同一チップ面内に配置し、第1の加速度センサS1に対して、第2及び第3の加速度センサS2,S3がチップ面内で90度及び180度回転対称に配置しても、同様にx軸、z軸にy軸を加えた3軸方向の加速度を検出する加速度センサが実現できる。   In this embodiment, the acceleration sensor that detects the acceleration in the biaxial directions of the x axis and the z axis is exemplified. However, as shown in FIG. 5, the acceleration sensor 1 described above may be arranged 90 degrees rotationally symmetrical in the xy plane. For example, an acceleration sensor that detects acceleration in the three-axis direction in which the y-axis is added to the x-axis and z-axis can be realized. Alternatively, as shown in FIG. 6, three acceleration sensors are arranged in the same chip surface, and the second and third acceleration sensors S2 and S3 are 90 degrees in the chip surface with respect to the first acceleration sensor S1. Even if arranged 180 degrees rotationally symmetric, an acceleration sensor that detects acceleration in the three-axis direction by adding the y-axis to the x-axis and z-axis can be realized.

1 センサチップ
4,5 重り部
4a,5a 可動電極
6a,6b ビーム部
7a,7b ビーム部
11,13 凹部
12,14 充実部
17 埋込部
20a,21a 第1の固定電極
20b,21b 第2の固定電極
DESCRIPTION OF SYMBOLS 1 Sensor chip 4,5 Weight part 4a, 5a Movable electrode 6a, 6b Beam part 7a, 7b Beam part 11,13 Recessed part 12,14 Filling part 17 Embedded part 20a, 21a 1st fixed electrode 20b, 21b 2nd Fixed electrode

Claims (2)

一面に可動電極が設けられた重り部と、重り部を回動軸の回りに回動自在に支持するビーム部と、可動電極に対向して配置される固定電極とを備え、重り部は、少なくとも一部が当該一部を除く他の部位よりも2倍以上の比重を有する材料で形成されていることを特徴とする加速度センサ。   A weight portion provided with a movable electrode on one surface, a beam portion that rotatably supports the weight portion around a rotation axis, and a fixed electrode disposed to face the movable electrode, the weight portion, An acceleration sensor, characterized in that at least a part is formed of a material having a specific gravity twice or more that of other parts excluding the part. 前記重り部は、前記材料で形成された部位と、当該部位よりも重量の少ない部位とが回動方向に沿って並ぶように形成されていることを特徴とする請求項1記載の加速度センサ。   2. The acceleration sensor according to claim 1, wherein the weight portion is formed so that a portion formed of the material and a portion having a weight less than the portion are aligned along a rotation direction.
JP2009056941A 2009-03-10 2009-03-10 Acceleration sensor Withdrawn JP2010210416A (en)

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