JP2010170621A - Terminal connection structure for small space - Google Patents
Terminal connection structure for small space Download PDFInfo
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- JP2010170621A JP2010170621A JP2009013444A JP2009013444A JP2010170621A JP 2010170621 A JP2010170621 A JP 2010170621A JP 2009013444 A JP2009013444 A JP 2009013444A JP 2009013444 A JP2009013444 A JP 2009013444A JP 2010170621 A JP2010170621 A JP 2010170621A
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本発明は、狭スペースにて複数の端子を導通することができる狭スペース用端子導通構造に係り、特に多数の磁気ヘッド素子を搭載するローバーの複数端子に接地用ワイヤをワイヤボンディングする際に好適な狭スペース用端子導通構造に関する。 The present invention relates to a narrow space terminal conducting structure capable of conducting a plurality of terminals in a narrow space, and is particularly suitable when wire bonding a ground wire to a plurality of terminals of a row bar on which a large number of magnetic head elements are mounted. The present invention relates to a terminal conduction structure for a narrow space.
近年の磁気ディスク装置用の磁気ヘッドは、ウェハと呼ばれる多数の半導体素子を搭載したものを棒状に切断したローバーを生成し、このローバーの状態で磁気ヘッド素子のギャップ深さを所定深さに研磨するためのラップが行われ、このラップ作業に必要なワイヤボンディング作業は、磁気ヘッド素子の静電破壊を防止するため、磁気ヘッド素子の端子を接地した状態で行う必要がある。 In recent years, magnetic heads for magnetic disk devices have produced a row bar by cutting a large number of semiconductor elements called wafers into rods, and in this row state, the gap depth of the magnetic head element is polished to a predetermined depth. In order to prevent electrostatic breakdown of the magnetic head element, it is necessary to perform the wire bonding work necessary for the wrapping work with the terminal of the magnetic head element grounded.
従来技術によるワイヤボンディング作業は、図4に示す如く、ステンレス鋼(SUS)等の導電性材料によるマウントツール50の側面にローバー60を接着して取り付け、該ローバー60の磁気ヘッド素子端子とワイヤ80の一端を介して導通するためのフレキシブル基板(PCB)10をマウントツール50上に搭載し、該PCB10のパッド11を導通ボルト52及びマウントツール50を介して接地した状態において、ワイヤボンディング機構70によりワイヤ80の他端とPCB10とを溶接することによって行われる。 As shown in FIG. 4, the wire bonding operation according to the prior art is performed by attaching a row bar 60 to the side surface of a mounting tool 50 made of a conductive material such as stainless steel (SUS) and attaching the magnetic head element terminal of the row bar 60 to the wire 80. In a state where a flexible substrate (PCB) 10 for conducting through one end of the PCB 10 is mounted on the mounting tool 50 and the pad 11 of the PCB 10 is grounded through the conducting bolt 52 and the mounting tool 50, the wire bonding mechanism 70 This is done by welding the other end of the wire 80 and the PCB 10.
尚、前述の被溶接物を接地しながらワイヤボンディングを行う技術は、例えば下記特許文献1に記載され、該特許文献1には、チップ上のボンディングパットがチップ内部を介して接地する技術が記載されている。 A technique for performing wire bonding while grounding the workpiece to be welded is described in, for example, the following Patent Document 1, which describes a technique in which a bonding pad on a chip is grounded through the inside of the chip. Has been.
特開2008−78626号公報 JP 2008-78626 A
磁気ヘッド素子用のローバーの接地を行いながらワイヤボンディングを行う従来装置は、図4に示した如く、PCB10他端の複数のパッド11に複数のプローブ13を押さえ板51により押さえつけながら磁気ヘッド素子の接地を行うため、ワイヤボンディング機構70の下面と前記押さえ板51を支持するための導通ボルト52の先端とが干渉し、図中の符号Hで示す間隔を大きくしなければならず、ワイヤボンディング作業が困難であると言う不具合があった。これを具体的に説明すると、磁気ヘッド素子のローバーが高密度に端子が配置され、これに対応する位置に設けられたPCB10の端子も高密度に配置され、ワイヤボンディング機構70も前述の高密度配置の端子に近接してボンディングを行う必要があるため、前述の間隔Hに要求される寸法は2mm以下が要求されるにもかかわらず、従来装置においては10mm以下に間隔を狭めることが困難であると言う不具合があった。 As shown in FIG. 4, the conventional apparatus that performs wire bonding while grounding the magnetic head element row bar presses a plurality of probes 13 against a plurality of pads 11 on the other end of the PCB 10 while holding the magnetic head element. In order to perform grounding, the lower surface of the wire bonding mechanism 70 interferes with the tip of the conduction bolt 52 for supporting the pressing plate 51, and the interval indicated by the symbol H in the drawing must be increased, and wire bonding work is performed. There was a problem that it was difficult. Specifically, the terminals of the magnetic head element are arranged at high density, the terminals of the PCB 10 provided at the corresponding positions are also arranged at high density, and the wire bonding mechanism 70 is also arranged at the above-described high density. Since it is necessary to perform bonding in close proximity to the arranged terminals, it is difficult to reduce the distance to 10 mm or less in the conventional apparatus, although the dimension required for the distance H is 2 mm or less. There was a defect that there was.
本発明の目的は、狭スペースであっても複数端子とプローブとの接触を確実に行うことができる狭スペース用端子導通構造を提供することである。 An object of the present invention is to provide a terminal connection structure for a narrow space that can reliably contact a plurality of terminals and a probe even in a narrow space.
前記目的を達成するため本発明は、格子状に配置された複数のパッドと導通する狭スペース用端子導通構造であって、
前記複数のパッドと同配列の交差部を有する格子状の梁部と、当該梁部の交差部に前記複数のパッドと接触する導電性の突出部とを有する導通金属製の薄板部と、
該薄板部の突出部を複数のパッドに押圧するための押さえ板とを備えることを第1の特徴とする。
In order to achieve the above object, the present invention is a terminal conductive structure for a narrow space that conducts with a plurality of pads arranged in a grid pattern,
A conductive metal thin plate portion having a grid-like beam portion having intersections in the same arrangement as the plurality of pads, and a conductive protrusion contacting the plurality of pads at the intersection portion of the beam portions,
A first feature is that a pressing plate for pressing the protruding portion of the thin plate portion against a plurality of pads is provided.
また本発明は、第1の特徴の狭スペース用端子導通構造において、前記薄板部が、内部に前記押さえ板を収納する凹形状を形成するように折曲したことを第2の特徴とする。 The second feature of the present invention is that, in the narrow space terminal conducting structure according to the first feature, the thin plate portion is bent so as to form a concave shape that accommodates the pressing plate therein.
また本発明は、前記何れかの特徴の狭スペース用端子導通構造において、前記押さえ板の押圧力を分散して前記薄板部に伝達する弾性特性を有するクッションを前記押さえ板と薄板部の間に配置したことを第3の特徴とする。 In the narrow space terminal conduction structure according to any one of the above features, the present invention provides a cushion having an elastic property that disperses the pressing force of the pressing plate and transmits it to the thin plate portion between the pressing plate and the thin plate portion. The arrangement is the third feature.
また本発明は、前記何れかの特徴の狭スペース用端子導通構造において、前記薄板部を接地したことを第4の特徴とし、前記何れかの特徴の狭スペース用端子導通構造において、前記薄板部の材質をステンレス綱としたことを第5の特徴とする。 According to a fourth aspect of the present invention, there is provided the narrow space terminal conducting structure according to any one of the above features, wherein the thin plate portion is grounded, and the thin plate portion is disposed in the narrow space terminal conducting structure according to any one of the above features. A fifth feature is that the material is stainless steel.
本発明による狭スペース用端子導通構造は、複数のパッドと同配列の交差部を有する格子状の梁部及び該格子状の交差部に複数パッドと接触する導電性の突出部とを有する導通金属製の薄板部と、該突出部をプローブとして格子状に配置された複数のパッドに押圧する押さえ板とを有することによって、突出部を複数のパッドに均一に押し当てることができ、従って狭スペースにて複数パッドと導通することができる。 A terminal conductive structure for a narrow space according to the present invention is a conductive metal having a grid-like beam portion having intersecting portions arranged in the same arrangement as a plurality of pads, and a conductive protrusion contacting the plurality of pads at the lattice-like intersecting portions. By having a thin plate portion made of metal and a pressing plate that presses against a plurality of pads arranged in a grid pattern with the protruding portion as a probe, the protruding portion can be uniformly pressed against the plurality of pads, and thus a narrow space Can be conducted with a plurality of pads.
以下、本発明の一実施形態による狭スペース用端子導通構造の図面を参照して詳細に説明する。
本実施形態による狭スペース用端子導通構造は、図1にその分解斜視を示す如く、PCB10上の格子状に配置された多数のパッド11に対応して下方に突出する多数のプローブ13(突出部)が設けられた凹形状の薄板12と、該薄板12のプローブ13を弾性をもって押圧するためのクッション14と、該クッション14を押圧する押さえ板15とから構成される。尚、PCB10のパッド11は、複数の端子を格子状に63個(3×21)有し、ラップ作業時に抵抗値変化を検出するための端子であり、本実施形態による狭スペース用端子導通構造は当該パッド11を利用してワイヤボンディング時の接地を行うものである。
Hereinafter, a terminal space structure for a narrow space according to an embodiment of the present invention will be described in detail with reference to the drawings.
As shown in the exploded perspective view of FIG. 1, the terminal conductive structure for a narrow space according to the present embodiment has a large number of probes 13 (protruding portions) projecting downward corresponding to a large number of pads 11 arranged in a grid on the PCB 10. ), A cushion 14 for pressing the probe 13 of the thin plate 12 with elasticity, and a pressing plate 15 for pressing the cushion 14. Incidentally, the pad 11 of the PCB 10 has 63 (3 × 21) plural terminals in a grid shape, and is a terminal for detecting a change in resistance value during lapping work. The terminal conduction structure for narrow space according to the present embodiment. Uses the pad 11 for grounding at the time of wire bonding.
前記薄板12は、導電性のステンレス鋼(SUS)板から製造され、その裏側から見た一部を示す図2の如く、凹形状の平坦裏部分に複数の空間部12bを打ち抜くことによって格子状の梁部12aを交差して設け、該梁部12aの交差箇所にパッド11方向に突出する多数の円柱状のプローブ13をエッチングによって形成している。 The thin plate 12 is manufactured from a conductive stainless steel (SUS) plate and has a lattice shape by punching a plurality of space portions 12b into a concave flat back portion as shown in FIG. A plurality of columnar probes 13 protruding in the direction of the pad 11 are formed by etching at the intersections of the beam portions 12a.
このため本実施形態によるプローブ13は、薄板12の梁部12aによって十字の4方向に弾性的に支持され、図3に示す如く、クッション14を介して押さえ板15により押圧されることによって、パッド11に均等に押し付けられる。また前記薄板12は、図4に示したマウントツール50の導通ボルト52に取り付けられて接地するように構成されている。従って本実施形態による狭スペース用端子導通構造は、プローブ13が格子状の梁部12aの交差箇所において弾性的に支持され、且つ押さえ板15が前記クッション14の上面を平面的に押圧することによって、磁気ヘッド素子の接地を狭スペースにおいても均等且つ確実に行うことができる。 For this reason, the probe 13 according to the present embodiment is elastically supported in the four directions of the cross by the beam portion 12a of the thin plate 12, and is pressed by the pressing plate 15 via the cushion 14 as shown in FIG. 11 evenly. The thin plate 12 is attached to the conduction bolt 52 of the mounting tool 50 shown in FIG. Therefore, in the terminal conduction structure for a narrow space according to the present embodiment, the probe 13 is elastically supported at the intersection of the lattice-like beam portions 12a, and the pressing plate 15 presses the upper surface of the cushion 14 in a plane. In addition, the magnetic head element can be grounded evenly and reliably even in a narrow space.
本実施形態による狭スペース用端子導通構造は、導電性の長板形状の薄板を折曲して凹形とし、その凹部内にクッション14及び押さえ板15を収納するため、前記薄板12の突出したプローブ13を含む高さ方向寸法を2mm以下に形成することができ、従って図4に示したワイヤボンディング機構を用いた場合であっても、磁気ヘッド素子の良好な接地を維持しながら、ワイヤボンディング作業を行うことができる。 The narrow space terminal conducting structure according to the present embodiment is formed by bending the thin plate 12 in order to fold a conductive long plate-shaped thin plate into a concave shape and house the cushion 14 and the pressing plate 15 in the concave portion. The height direction dimension including the probe 13 can be formed to 2 mm or less. Therefore, even when the wire bonding mechanism shown in FIG. 4 is used, wire bonding is performed while maintaining good grounding of the magnetic head element. Work can be done.
11:パッド、12:薄板、12a:梁部、12b:空間部、13:プローブ、14:クッション、15:押さえ板、50:マウントツール、51:押さえ板、52:導通ボルト、60:ローバー、70:ワイヤボンディング機構、80:ワイヤ。 11: pad, 12: thin plate, 12a: beam portion, 12b: space portion, 13: probe, 14: cushion, 15: pressing plate, 50: mount tool, 51: pressing plate, 52: conduction bolt, 60: rover, 70: Wire bonding mechanism, 80: Wire.
Claims (5)
前記複数のパッドと同配列の交差部を有する格子状の梁部と、該梁部の交差部に前記複数のパッドと接触する導電性の突出部とを有する導通金属製の薄板部と、
該薄板部の突出部を複数のパッドに押圧するための押さえ板とを備える狭スペース用端子導通構造。 A terminal conduction structure for a narrow space that conducts with a plurality of pads arranged in a grid pattern,
A thin plate portion made of conductive metal having lattice-shaped beam portions having intersections in the same arrangement as the plurality of pads, and conductive protrusions that contact the plurality of pads at the intersection portions of the beam portions,
A terminal conductive structure for a narrow space, comprising a pressing plate for pressing the protruding portion of the thin plate portion against a plurality of pads.
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Cited By (1)
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JP2012119049A (en) * | 2010-12-02 | 2012-06-21 | Tdk Corp | Burn-in test method and burn-in test device |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2012119049A (en) * | 2010-12-02 | 2012-06-21 | Tdk Corp | Burn-in test method and burn-in test device |
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