JP2010040481A - Device for determining whether terminal crimping state is good or not, device for processing terminal crimping, method of determining whether terminal crimping state is good or not, and program for determining whether terminal crimping state is good or not - Google Patents

Device for determining whether terminal crimping state is good or not, device for processing terminal crimping, method of determining whether terminal crimping state is good or not, and program for determining whether terminal crimping state is good or not Download PDF

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JP2010040481A
JP2010040481A JP2008205528A JP2008205528A JP2010040481A JP 2010040481 A JP2010040481 A JP 2010040481A JP 2008205528 A JP2008205528 A JP 2008205528A JP 2008205528 A JP2008205528 A JP 2008205528A JP 2010040481 A JP2010040481 A JP 2010040481A
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crimping
pressure
waveform
terminal
terminal crimping
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JP5205174B2 (en
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Tetsuya Yano
哲也 矢野
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Shinmaywa Industries Ltd
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Shinmaywa Industries Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To determine whether crimping is good or not as properly as possible, even if there is a deviation in a time base direction between a pressure waveform and a reference waveform. <P>SOLUTION: This device is to determine whether a terminal crimping state is good or not. A physical value corresponding to the rate of pressure change is found based on the pressure waveform detected as a terminal is crimped to determine whether crimping is good or not based on the physical value. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

この発明は、電線に端子を圧着する際に端子圧着状態の良否判別を行う技術に関する。   The present invention relates to a technique for determining pass / fail of a terminal crimping state when a terminal is crimped to an electric wire.

端子圧着状態の不良を検出する方法として、特許文献1に開示のものがある。特許文献1では、圧着時における圧力センサからの出力波形と基準波形とを比較し、その差が所定の公差を越えているときに圧着不良と判定している。   As a method for detecting a defect in the terminal crimping state, there is a method disclosed in Patent Document 1. In Patent Document 1, an output waveform from a pressure sensor at the time of pressure bonding is compared with a reference waveform, and when the difference exceeds a predetermined tolerance, it is determined that there is a pressure bonding failure.

特開2005−135820号公報JP 2005-135820 A

しかしながら、特許文献1に開示の技術では、圧力センサからの出力波形と基準波形とが時間軸方向にずれてしまうと、圧着良否判定の精度が悪くなる。   However, in the technique disclosed in Patent Document 1, if the output waveform from the pressure sensor and the reference waveform are shifted in the time axis direction, the accuracy of the pressure-bonding determination is deteriorated.

そこで、本発明は、圧力波形と基準波形との時間軸方向のずれがあっても、なるべく適切に圧着良否判別を行うことを目的とする。   In view of the above, an object of the present invention is to appropriately determine whether or not the pressure bonding is good even if there is a deviation in the time axis direction between the pressure waveform and the reference waveform.

上記課題を解決するため、第1の態様に係る端子圧着状態良否判別装置は、端子の圧着良否判別を行う端子圧着状態良否判別装置であって、端子圧着に伴って検出される圧力波形が入力される圧力波形入力部と、前記圧力波形に基づいて圧力変化速度に応じた物理量を求め、前記物理量に基づいて圧着良否判別を行う良否判別部とを備えるものである。   In order to solve the above-described problem, the terminal crimping state pass / fail judgment device according to the first aspect is a terminal crimping state pass / fail judgment device for performing terminal crimping pass / fail judgment, and a pressure waveform detected along with terminal crimping is input. And a pass / fail judgment unit that obtains a physical quantity corresponding to the pressure change speed based on the pressure waveform and judges the crimping pass / fail based on the physical quantity.

第2の態様は、第1の態様に係る端子圧着状態良否判別装置であって、前記良否判別部は、所定の基準波形に基づいて所定の圧力範囲における圧力変化速度に応じた値として求められた基準物理量と、前記圧力波形に基づいて前記所定の圧力範囲における圧力変化速度に応じた値として求められた物理量とを比較することで、圧着良否判別を行うものである。   A second aspect is a terminal crimping state pass / fail discrimination device according to the first aspect, wherein the pass / fail discrimination unit is obtained as a value according to a pressure change rate in a predetermined pressure range based on a predetermined reference waveform. By comparing the reference physical quantity with the physical quantity obtained as a value corresponding to the pressure change rate in the predetermined pressure range based on the pressure waveform, the good / bad pressure determination is performed.

第3の態様は、第1又は第2の態様に係る端子圧着状態良否判別装置であって、前記圧着良否判別部は、所定の圧着初期期間において前記圧力波形と所定の基準波形との相関度合に基づいて圧着良否判別を行い、所定の圧着終期期間において前記圧力波形と所定の基準波形との相関度合に基づいて圧着良否判別を行うものである。   A third aspect is a terminal crimping state pass / fail discrimination device according to the first or second aspect, wherein the crimping pass / fail judgment unit has a correlation degree between the pressure waveform and a predetermined reference waveform in a predetermined initial crimping period. Is determined on the basis of the pressure, and is determined based on the degree of correlation between the pressure waveform and the predetermined reference waveform in a predetermined crimping end period.

第4の態様は、第1の態様に係る端子圧着状態良否判別装置であって、前記圧着良否判別部は、所定の圧着初期期間において前記圧力波形と所定の基準波形との相関度合に基づいて圧着良否判別を行い、所定の圧着終期期間において前記圧力波形と所定の基準波形との相関度合に基づいて圧着良否判別を行い、さらに、前記所定の圧着初期期間における前記基準波形の圧力範囲と前記所定の圧着終期期間における前記基準波形の圧力範囲との間の所定の圧力範囲において圧力変化速度に応じたと値として求められた基準物理量と、前記圧力波形に基づいて前記所定の圧力範囲における圧力変化速度に応じた値として求められた前記物理量とを比較することで、圧着良否判別を行うものである。   A 4th aspect is a terminal crimping | compression-bonding quality determination apparatus which concerns on a 1st aspect, Comprising: The said crimping | crimping quality determination part is based on the correlation degree of the said pressure waveform and a predetermined | prescribed reference waveform in the predetermined crimping | bonding initial period. Crimping pass / fail judgment is performed, and crimping pass / fail judgment is made based on the degree of correlation between the pressure waveform and a predetermined reference waveform in a predetermined crimping end period, and further, the pressure range of the reference waveform in the predetermined crimping initial period and the A reference physical quantity obtained as a value corresponding to a pressure change speed in a predetermined pressure range between the pressure range of the reference waveform in a predetermined crimping end period, and a pressure change in the predetermined pressure range based on the pressure waveform By comparing the physical quantity obtained as a value corresponding to the speed, the quality determination of the crimping is performed.

第5の態様に係る端子圧着加工装置は、端子圧着を行う一対の圧着型と、前記一対の圧着型を相対的に接近及び離隔移動させる圧着駆動部と、前記一対の圧着型に設けられ、端子圧着に伴う圧力波形を検出する圧力検出部と、第1〜第4のいずれかに記載の端子圧着状態良否判別装置と、を備えるものである。   A terminal crimping processing apparatus according to a fifth aspect is provided in a pair of crimping molds for performing terminal crimping, a crimp driving unit that relatively moves the pair of crimping molds closer to and away from each other, and the pair of crimping molds, The pressure detection part which detects the pressure waveform accompanying terminal crimping, and the terminal crimping state quality determination apparatus in any one of the 1st-4th are provided.

第6の態様に係る端子圧着状態良否判別方法は、端子の圧着良否判別を行う端子圧着状態良否判別方法であって、(a)端子圧着に伴って検出される圧力波形に基づいて圧力変化速度に応じた物理量を求めるステップと、(b)前記物理量に基づいて圧着良否判別を行うステップと、を備えるものである。   The terminal crimping state pass / fail judgment method according to the sixth aspect is a terminal crimping state pass / fail judgment method for performing terminal crimping pass / fail judgment, and (a) Pressure change rate based on a pressure waveform detected along with terminal crimping. And (b) determining whether or not the crimping is good based on the physical quantity.

第7の態様に係る端子圧着状態良否判別プログラムは、端子圧着に際して検出される圧力波形に基づいて端子の圧着良否判別を行うための端子圧着状態良否判別プログラムであって、コンピュータに、(a)端子圧着に伴って検出される圧力波形に基づいて圧力変化速度に応じた物理量を求める処理と、(b)前記物理量に基づいて圧着良否判別を行う処理と、を実現させるための端子圧着状態良否判別プログラムである。   A terminal crimping state pass / fail judgment program according to a seventh aspect is a terminal crimping state pass / fail judgment program for performing terminal crimping pass / fail judgment based on a pressure waveform detected at the time of terminal crimping. Terminal crimping condition pass / failure state for realizing a process for obtaining a physical quantity corresponding to the pressure change rate based on a pressure waveform detected along with terminal crimping, and (b) a process for determining crimping pass / fail based on the physical quantity. It is a discrimination program.

第1の態様によると、圧力変化速度に応じた物理量に基づいて、圧着良否判別を行うため、圧力波形と基準波形との時間軸方向のずれがあっても、なるべく適切に圧着良否判別を行うことができる。   According to the first aspect, since the crimping quality determination is performed based on the physical quantity corresponding to the pressure change rate, the bonding quality determination is appropriately performed as much as possible even if there is a deviation in the time axis direction between the pressure waveform and the reference waveform. be able to.

第2の態様によると、基準波形と圧力波形とで、同程度の圧力範囲で、圧力変化速度に応じた物理量を比較することができ、より精度よく圧着良否判別を行うことができる。   According to the second aspect, the physical quantity corresponding to the pressure change rate can be compared between the reference waveform and the pressure waveform in the same pressure range, and the crimping quality determination can be performed with higher accuracy.

通常、圧着の初期及び終期では、圧力変化は比較的小さくなる。このため、圧力波形と基準波形との時間軸方向のずれによる影響は小さい。そこで、第3の態様のように、圧着初期期間及び圧着終期期間においては、前記圧力波形と所定の基準波形との相関度合に基づいてより適切な圧着良否判定を行うことができる。   Usually, the pressure change is relatively small in the initial and final stages of crimping. For this reason, the influence by the shift | offset | difference of the time-axis direction of a pressure waveform and a reference waveform is small. Therefore, as in the third aspect, in the initial crimping period and the final crimping period, it is possible to perform more appropriate crimping determination based on the degree of correlation between the pressure waveform and the predetermined reference waveform.

また、通常、圧着の初期及び終期では、圧力変化は比較的小さくなり、圧着初期期間と圧着終期期間との間では圧力変化が比較的大きい。そこで、第4の態様のように、圧着初期期間及び圧着終期期間においては、前記圧力波形と所定の基準波形との相関度合に基づいてより適切な圧着良否判定を行うことができる。また、前記所定の圧着初期期間における前記基準波形の圧力範囲と前記所定の圧着終期期間における前記基準波形の圧力範囲との間の所定の圧力範囲において圧力変化速度に応じたと値として求められた基準物理量と、前記圧力波形に基づいて前記所定の圧力範囲における圧力変化速度に応じた値として求められた物理量とを比較することで、圧力波形と基準波形との時間軸方向のずれがあっても、同程度の圧力範囲で、圧力変化速度に応じた物理量を比較することができ、より精度よく圧着良否判別を行うことができる。   In general, the pressure change is relatively small at the initial and final stages of pressure bonding, and the pressure change is relatively large between the initial pressure bonding period and the final pressure bonding period. Therefore, as in the fourth aspect, in the initial crimping period and the final crimping period, it is possible to perform more appropriate crimping determination based on the degree of correlation between the pressure waveform and the predetermined reference waveform. Further, a reference obtained as a value according to a pressure change rate in a predetermined pressure range between the pressure range of the reference waveform in the predetermined crimping initial period and the pressure range of the reference waveform in the predetermined crimping final period. By comparing the physical quantity with the physical quantity obtained as a value corresponding to the pressure change rate in the predetermined pressure range based on the pressure waveform, even if there is a time axis direction deviation between the pressure waveform and the reference waveform The physical quantity corresponding to the pressure change rate can be compared within the same pressure range, and the crimping quality can be determined with higher accuracy.

また、第5〜第7の態様によると、圧力変化速度に応じた物理量に基づいて、圧着良否判別を行うため、圧力波形と基準波形との時間軸方向のずれがあっても、なるべく適切に圧着良否判別を行うことができる。   In addition, according to the fifth to seventh aspects, since the crimping quality determination is performed based on the physical quantity corresponding to the pressure change rate, even if there is a time axis direction deviation between the pressure waveform and the reference waveform, it is as appropriate as possible. Crimping quality can be determined.

以下、実施の形態に係る端子圧着加工装置について説明する。   Hereinafter, the terminal crimping apparatus according to the embodiment will be described.

図1は端子圧着加工装置10を示す概略正面図であり、図2は端子圧着機構装置20を示す概略側面図である。   FIG. 1 is a schematic front view showing a terminal crimping apparatus 10, and FIG. 2 is a schematic side view showing a terminal crimping mechanism apparatus 20.

この端子圧着加工装置10は、端子圧着機構装置20と端子圧着状態良否判別装置30とを備えている。端子圧着機構装置20は、電線12の端部に端子14を圧着する端子圧着処理を行う装置であり、端子圧着状態良否判別装置30は端子の圧着良否判別を行う装置である。   The terminal crimping apparatus 10 includes a terminal crimping mechanism device 20 and a terminal crimping state pass / fail discrimination device 30. The terminal crimping mechanism device 20 is a device that performs a terminal crimping process for crimping the terminal 14 to the end portion of the electric wire 12, and the terminal crimping state pass / fail judgment device 30 is a device that performs terminal crimping pass / fail judgment.

<1.端子圧着機構装置>
端子圧着機構装置20は、横向きにした略U字状の支持部材21と、一対の圧着型22,25と、圧着駆動部26と、圧力検出部24とを備えている。
<1. Terminal crimping mechanism device>
The terminal crimping mechanism device 20 includes a substantially U-shaped support member 21 that is turned sideways, a pair of crimping dies 22 and 25, a crimping drive unit 26, and a pressure detection unit 24.

一対の圧着型22,25は、下側の圧着型22と上側の圧着型25とを有しており、それらの間で端子14を圧着可能に構成されている。   The pair of crimping dies 22, 25 has a lower crimping die 22 and an upper crimping die 25, and the terminal 14 can be crimped between them.

下側の圧着型22は、支持部材21の下部ベース部21a上に上向き突出で取付けられている。また、下部ベース部21aには、下側の圧着型22に隣設して支持台22aが取付けられている。そして、端子14の圧着部14aを下側の圧着型22上に載置すると共に、端子14の他の部分を支持台22a上に載置した状態で、端子14が載置状に支持可能に構成されている。   The lower crimping die 22 is mounted on the lower base portion 21 a of the support member 21 so as to protrude upward. A support base 22a is attached to the lower base portion 21a so as to be adjacent to the lower crimping die 22. And while the crimping | compression-bonding part 14a of the terminal 14 is mounted on the lower crimping | compression-bonding type | mold 22, the terminal 14 can be supported in mounting state in the state which mounted the other part of the terminal 14 on the support stand 22a. It is configured.

また、下部ベース部21a内であって下側の圧着型22の下方に、当該下側の圧着型22と接触した状態で圧力伝達部材23が配設されている。また、圧力伝達部材23の下方に、当該圧力伝達部材23と接触した状態で圧力検出部24が配設されている。そして、端子圧着時に下側の圧着型22に作用する圧力が、圧力伝達部材23を介して圧力検出部24に伝達されるように構成されている。圧力検出部24は、ひずみゲージ、ピエゾ素子、光ファイバ式圧力センサ等、圧力に応じた電気信号を出力するセンサによって構成されている。そして、端子圧着時に生じた圧力が圧力伝達部材23を介して圧力検出部24に伝達されると、圧力検出部24はその圧力変化に応じた圧力波形を電気信号として出力するように構成されている。   In addition, a pressure transmission member 23 is disposed in the lower base portion 21 a and below the lower crimping die 22 in contact with the lower crimping die 22. A pressure detection unit 24 is disposed below the pressure transmission member 23 in contact with the pressure transmission member 23. And it is comprised so that the pressure which acts on the crimping | compression-bonding type | mold 22 of the lower side at the time of terminal crimping may be transmitted to the pressure detection part 24 via the pressure transmission member 23. FIG. The pressure detection unit 24 includes a sensor that outputs an electrical signal corresponding to pressure, such as a strain gauge, a piezoelectric element, or an optical fiber pressure sensor. When the pressure generated during terminal crimping is transmitted to the pressure detection unit 24 via the pressure transmission member 23, the pressure detection unit 24 is configured to output a pressure waveform corresponding to the pressure change as an electrical signal. Yes.

なお、上記圧力検出部24は、上側の圧着型25側に組込まれていてもよいし、一対の圧着型22,25の双方側に組込まれていてもよい。後者の場合、それぞれで検出される圧力波形のそれぞれに対して後述する圧着良否判別処理を行ってもよいし、それぞれの検出波形の平均波形に対して後述する圧着良否判別処理を行ってもよい。   The pressure detector 24 may be incorporated on the upper crimping die 25 side or on both sides of the pair of crimping die 22 and 25. In the latter case, a crimping pass / fail discrimination process described later may be performed on each of the pressure waveforms detected in each, or a crimp pass / fail discrimination process described later may be performed on the average waveform of each detected waveform. .

また、圧着駆動部26は、トグルリンク機構、エアシリンダ、油圧シリンダ等により構成されており、上記支持部材21の上方支持部分21bに設けられている。圧着駆動部26には、上側の圧着型25が垂下状姿勢で昇降可能に支持されている。この圧着駆動部26の駆動により、上型の圧着型25が下側の圧着型22に対して接近及び離隔移動されるように構成されている。なお、圧着駆動部26は、一対の圧着型22,25を相対的に接近及び離隔移動させる構成であればよい。   The crimp driving unit 26 includes a toggle link mechanism, an air cylinder, a hydraulic cylinder, and the like, and is provided on the upper support portion 21 b of the support member 21. An upper crimping die 25 is supported on the crimping drive unit 26 so as to be lifted and lowered in a hanging posture. The upper crimping die 25 is moved toward and away from the lower crimping die 22 by driving the crimping drive unit 26. In addition, the crimping | compression-bonding drive part 26 should just be the structure which moves a pair of crimping | die crimping | die 22 and 25 relatively and apart.

また、この端子圧着機構装置20には、複数の端子14を連続的に下側の圧着型22に供給する端子供給機構部28と、電線12を予め設定された所定長に切断し、その端部を皮剥ぎして端子14の圧着部14a内に配設する処理を連続的に行う電線処理機構部29とが組込まれている。そして、電線12に端子14を圧着する端子圧着処理を連続的に行えるように構成されている。これらの端子供給機構部28及び電線処理機構部29については、周知構成を含む種々構成を適用可能であるので、詳細な説明は省略する。   Further, the terminal crimping mechanism device 20 includes a terminal supply mechanism unit 28 that continuously supplies the plurality of terminals 14 to the lower crimping die 22, and the electric wire 12 is cut into a predetermined length, and ends thereof An electric wire processing mechanism 29 for continuously performing the process of peeling the part and disposing it in the crimping part 14a of the terminal 14 is incorporated. And it is comprised so that the terminal crimping process which crimps | bonds the terminal 14 to the electric wire 12 can be performed continuously. Since various configurations including known configurations can be applied to the terminal supply mechanism section 28 and the wire processing mechanism section 29, detailed description thereof will be omitted.

<2.端子圧着状態良否判別装置>
図3は端子圧着状態良否判別装置30のハードウエア構成を示すブロック図である。端子圧着状態良否判別装置30は、上記圧力検出部24で検出された圧力波形を入力可能に当該圧力検出部24に電気的に接続されており、その圧力波形に基づいて端子の圧着良否判別を行うように構成されている。
<2. Terminal crimping condition pass / fail judgment device>
FIG. 3 is a block diagram showing a hardware configuration of the terminal crimping state pass / fail discrimination device 30. The terminal crimping state pass / fail discrimination device 30 is electrically connected to the pressure detection unit 24 so that the pressure waveform detected by the pressure detection unit 24 can be input, and the terminal crimping pass / fail judgment is made based on the pressure waveform. Configured to do.

より具体的には、端子圧着状態良否判別装置30は、CPU32、内部記憶装置34、外部記憶装置35等がバスライン31を介して相互接続された一般的なコンピュータによって構成されている。内部記憶装置34は、基本プログラム等を格納したROM及びデータを一時的に保持するRAM等を含んでおり、外部記憶装置35はフラッシュメモリ或はハードディスク装置等の不揮発性の記憶装置によって構成されている。外部記憶装置35には、後述する圧着良否判別処理を行うための判別プログラム35aが格納されている。この判別プログラム35aに従って、主制御部としてのCPU32が演算処理を行うことにより、後述するように端子14の圧着良否判別を行う良否判別部等の各種機能が実現されるように構成されている。判別プログラム35aは、通常、予め外部記憶装置35に格納されるものであるが、CD−ROM或はDVD−ROM、フラッシュメモリ等の記録媒体に記録された状態で提供され、或は、ネットワークを介した外部サーバからのダウンロードなどにより提供され、追加的又は交換的に外部記憶装置35に格納されるものであってもよい。   More specifically, the terminal crimping state pass / fail judgment device 30 is configured by a general computer in which a CPU 32, an internal storage device 34, an external storage device 35, and the like are interconnected via a bus line 31. The internal storage device 34 includes a ROM that stores basic programs and the like, and a RAM that temporarily stores data, and the external storage device 35 is configured by a nonvolatile storage device such as a flash memory or a hard disk device. Yes. The external storage device 35 stores a discrimination program 35a for performing a crimping pass / fail discrimination process described later. The CPU 32 as the main control unit performs arithmetic processing in accordance with the determination program 35a, so that various functions such as a pass / fail determination unit for determining the pass / fail determination of the terminal 14 as described later are realized. The discrimination program 35a is normally stored in advance in the external storage device 35, but is provided in a state of being recorded on a recording medium such as a CD-ROM, DVD-ROM, flash memory, or the like. It may be provided by downloading from an external server through the Internet, and may be stored in the external storage device 35 in addition or exchange.

また、上記外部記憶装置35には、基準波形35b、基準波形35bに基づく判別範囲設定処理に供される判別範囲設定パラメータ35c、判別処理に供される判別しきい値パラメータ35dが記憶されている。   Further, the external storage device 35 stores a reference waveform 35b, a determination range setting parameter 35c used for a determination range setting process based on the reference waveform 35b, and a determination threshold parameter 35d used for a determination process. .

また、この端子圧着状態良否判別装置30では、圧力波形入力回路部36、信号出力回路部37、入力部38及び表示部39も、バスライン31に接続されている。   In the terminal crimping state pass / fail discrimination device 30, the pressure waveform input circuit unit 36, the signal output circuit unit 37, the input unit 38 and the display unit 39 are also connected to the bus line 31.

圧力波形入力回路部36は、AD変換回路等によって構成されており、圧力検出部24で検出された圧力波形がアナログ信号で入力されると、これをデジタル信号に変換するように構成されている。この圧力波形入力回路部36でデジタル信号に変換された圧力波形は、逐次内部記憶装置34或は外部記憶装置35に記憶され、後述する基準波形設定及び判別範囲設定処理、圧着良否判別処理に供される。   The pressure waveform input circuit unit 36 is configured by an AD conversion circuit or the like. When the pressure waveform detected by the pressure detection unit 24 is input as an analog signal, the pressure waveform input circuit unit 36 is configured to convert the pressure waveform into a digital signal. . The pressure waveform converted into a digital signal by the pressure waveform input circuit unit 36 is sequentially stored in the internal storage device 34 or the external storage device 35, and is used for reference waveform setting and determination range setting processing and crimping pass / fail determination processing described later. Is done.

信号出力回路部37は、CPU32による制御下、他の機器への制御信号等を出力する出力回路である。ここでは、後述するように端子圧着機構装置20に対するエラー停止信号等が、信号出力回路部37を介して出力され、端子圧着機構装置20に与えられる。   The signal output circuit unit 37 is an output circuit that outputs a control signal and the like to other devices under the control of the CPU 32. Here, as will be described later, an error stop signal or the like for the terminal crimping mechanism device 20 is output via the signal output circuit unit 37 and given to the terminal crimping mechanism device 20.

入力部38は、各種スイッチ、タッチパネル等により構成されており、基準波形処理開始指示及び圧着良否判別処理開始指示等、本端子圧着状態良否判別装置30に対する諸指示を受付可能に構成されている。   The input unit 38 includes various switches, a touch panel, and the like, and is configured to receive various instructions for the terminal crimping state pass / fail judgment device 30 such as a reference waveform processing start instruction and a crimping pass / fail judgment start instruction.

表示部39は、液晶表示装置、ランプ等により構成されており、CPU32による制御下、端子圧着の良否判別結果、圧力波形等の諸情報を表示可能に構成されている。   The display unit 39 includes a liquid crystal display device, a lamp, and the like, and is configured to be able to display various information such as a result of determining whether or not the terminal is crimped and a pressure waveform under the control of the CPU 32.

図4は端子圧着状態良否判別装置30の機能ブロック図である。同図に示すように、端子圧着状態良否判別装置30は、信号前処理部32aと、圧着波形取得部32bと、基準波形処理部32cと、圧着良否判別部32dとを備えており、圧着良否判別部32dは、第1判別処理部32d1と、第2判別処理部32d2と、第3判別処理部32d3とを備えている。これらの各機能は、上記したようにCPU32が判別プログラム35aに従って所定の演算処理を行うことにより実現される。   FIG. 4 is a functional block diagram of the terminal crimping state pass / fail discrimination device 30. As shown in the figure, the terminal crimping state pass / fail judgment device 30 includes a signal pre-processing unit 32a, a crimp waveform acquisition unit 32b, a reference waveform processing unit 32c, and a crimp pass / fail judgment unit 32d. The determination unit 32d includes a first determination processing unit 32d1, a second determination processing unit 32d2, and a third determination processing unit 32d3. Each of these functions is realized by the CPU 32 performing predetermined arithmetic processing according to the determination program 35a as described above.

上記信号前処理部32aには、圧力検出部24から圧力波形入力回路部36を介してデジタル信号として入力された圧力波形に対して、DC成分を除去するオフセット処理、所定周波数成分を除去するフィルタ処理等を行うように構成されている。   The signal preprocessing unit 32a includes an offset process for removing a DC component and a filter for removing a predetermined frequency component from the pressure waveform input as a digital signal from the pressure detection unit 24 via the pressure waveform input circuit unit 36. It is configured to perform processing and the like.

圧着波形取得部32bは、上記のように前処理された圧力波形に基づいて、1回の圧着分の圧力波形をサンプリングするように構成されている。以下では、圧力波形のうち1回の圧着分の圧力波形部分を、圧着波形ということがある。   The crimp waveform acquisition unit 32b is configured to sample a pressure waveform for one crimp based on the pressure waveform preprocessed as described above. Below, the pressure waveform part for one press-bonding among pressure waveforms may be called a press-fit waveform.

圧着波形取得部32bでサンプリングされ取得された圧着波形は、基準波形処理部32c又は圧着良否判別部32dに与えられる。   The crimping waveform sampled and acquired by the crimping waveform acquisition unit 32b is provided to the reference waveform processing unit 32c or the crimping quality determination unit 32d.

基準波形処理部32cは、圧着波形取得部32bより与えられる圧着波形に基づき基準波形及び判別範囲設定パラメータ35cを設定して外部記憶装置35に記憶させる。   The reference waveform processing unit 32 c sets the reference waveform and the discrimination range setting parameter 35 c based on the crimp waveform provided from the crimp waveform acquisition unit 32 b and stores the reference waveform and the discrimination range setting parameter 35 c in the external storage device 35.

圧着良否判別部32dは、上記基準波形35b及び判別範囲設定パラメータ35c、判別しきい値パラメータ35dと、圧着波形取得部32bより与えられる圧着波形とに基づいて、第1判別処理部32d1と第2判別処理部32d2と第3判別処理部32d3とのそれぞれで圧着良否判別処理を実行するように構成されている。第1判別処理部32d1は圧着初期期間において圧着波形と基準波形35bとの相関度合を示す差に基づいて圧着良否判別を行い、第2判別処理部32d2は、圧着中間期間において圧力変化速度に応じた物理量に基づいて圧着良否判別を行い、第3判別処理部32d3は圧着終期期間において圧着波形と所定の波形35bとの相関度合を示す相関係数に基づいて圧着良否判別を行うように構成されている。   The crimping determination unit 32d includes a first determination processing unit 32d1 and a second determination processing unit 32d1 based on the reference waveform 35b, the determination range setting parameter 35c, the determination threshold parameter 35d, and the compression waveform provided by the compression waveform acquisition unit 32b. Each of the determination processing unit 32d2 and the third determination processing unit 32d3 is configured to execute the crimping quality determination processing. The first discrimination processing unit 32d1 performs the pass / fail judgment based on the difference indicating the degree of correlation between the crimping waveform and the reference waveform 35b in the initial crimping period, and the second discrimination processing unit 32d2 responds to the pressure change rate during the crimping intermediate period. The third discrimination processing unit 32d3 is configured to perform the crimping quality determination based on the correlation coefficient indicating the degree of correlation between the crimping waveform and the predetermined waveform 35b in the final crimping period. ing.

そして、圧着良否判別部32dは、第1判別処理部32d1、第2判別処理部32d2及び第3判別処理部32d3での判別結果に基づいて、表示部39の表示制御、端子圧着機構装置20のエラー停止制御等を行うように構成されている。   Then, the crimping quality determination unit 32d performs display control of the display unit 39 based on the determination results of the first determination processing unit 32d1, the second determination processing unit 32d2, and the third determination processing unit 32d3. It is configured to perform error stop control and the like.

なお、上記端子圧着状態良否判別装置30が行う一部或は全部の機能は、専用の論理回路等でハードウェア的に実現されてもよい。   Note that some or all of the functions performed by the terminal crimping state pass / fail judgment device 30 may be realized by hardware using a dedicated logic circuit or the like.

<3.端子圧着状態良否判別装置の処理>
端子圧着状態良否判別装置30による基準波形の設定及び判別範囲の設定処理と、端子の圧着良否判別処理について説明する。
<3. Processing of terminal crimping state pass / fail judgment device>
A reference waveform setting and discrimination range setting process and a terminal crimping quality determination process by the terminal crimping state pass / fail determination apparatus 30 will be described.

<3.1.基準波形処理>
図5は基準波形の設定及び判別範囲の設定処理を示すフローチャートである。
<3.1. Reference waveform processing>
FIG. 5 is a flowchart showing the reference waveform setting and discrimination range setting processing.

まず、本装置の利用者等が、端子圧着機構装置20に端子圧着開始指示を与えると共に、端子圧着状態良否判別装置30に基準波形処理開始指示を与える。すると、圧力検出部24で検出された圧力波形が、時間tの経過と圧力Pの変化を示す圧力波形情報として圧力波形入力回路部36を通じて入力される。この際の圧着波形PWSは、図6に示すように、比較的小さな圧力部分の後に比較的大きな圧力を呈する上向き凸波形が連なる波形として観察される。なお、複数回の圧着を行った場合には、上記圧着波形PWSが間隔をあけて連続的に連なる波形として観測される。なお、上記圧着波形は、端子14の種類等によって異なるため、必ずしも上記のような波形形状として観測されるわけではない。   First, a user or the like of this apparatus gives a terminal crimping start instruction to the terminal crimping mechanism apparatus 20 and gives a reference waveform processing start instruction to the terminal crimping state pass / fail judgment apparatus 30. Then, the pressure waveform detected by the pressure detection unit 24 is input through the pressure waveform input circuit unit 36 as pressure waveform information indicating the passage of time t and the change in the pressure P. As shown in FIG. 6, the crimping waveform PWS at this time is observed as a waveform in which upward convex waveforms exhibiting a relatively large pressure are connected after a relatively small pressure portion. In addition, when the crimping is performed a plurality of times, the crimping waveform PWS is observed as a continuous waveform with an interval. In addition, since the said crimping waveform changes with kinds etc. of the terminal 14, it is not necessarily observed as a waveform shape as mentioned above.

端子圧着状態良否判別装置30は、基準波形処理開始指示を受付けると、ステップS1において、基準波形35bを取得する。   Upon receiving the reference waveform processing start instruction, the terminal crimping state pass / fail discrimination device 30 acquires the reference waveform 35b in step S1.

基準波形35bは、取得された1回圧着分の圧着波形PWSをそのまま基準波形35bとして設定するものであってもよいし、取得された複数回圧着分の圧着波形PWSの平均波形を基準波形35bとして設定するものであってもよい。   The reference waveform 35b may be obtained by setting the acquired crimp waveform PWS for one-time crimping as the reference waveform 35b as it is, or an average waveform of the acquired multiple-time crimp waveforms PWS is used as the reference waveform 35b. It may be set as

なお、圧力検出部24から入力される圧力波形に対して圧着波形PWSの取得は例えば次のようにして行われる。すなわち、圧着波形PWSの有無を、圧力Pが予め設定されたサンプリングトリガ圧力値Ps以上になったか否か(或はサンプリングトリガ圧力値Psよりも大きくなったか否か)をもって判断する。所定のサンプリングトリガ圧力値Psは、例えば、過去に行った試行結果に基づき、圧着波形の圧力ピーク値に対する数十%値として決定した値を用いることができる。また、サンプリング期間TSを、例えば、圧力Pが所定のサンプリングトリガ圧力値Psになった時間taをサンプリング基準時間taとして、その前の期間TSa及びその後の期間TSbとで規定される期間TSとして設定することができる。その前の期間TSa及びその後の期間TSbは、上記サンプリング基準時間taを基準として圧着良否判別上有効な圧着波形が現れる期間として実験的に或は経験的に判断された値を用いることができる。以下では、上記サンプリング期間TSが開始された時間をサンプリング開始時間t0ということがある。もっとも、圧力波形の有無及びサンプリング期間の設定は、上記例に限られない。例えば、一定の圧力範囲内でサンプリングしてもよいし、端子圧着機構装置20における圧着動作に連動して所定期間内でサンプリングしてもよい。もっとも、圧力波形の変化に応じてサンプリングを行うことで、端子圧着機構装置20からの動作信号を受けることなくサンプリングを行うことができ、構成の簡易化を図ることができる。   In addition, acquisition of the crimping waveform PWS with respect to the pressure waveform input from the pressure detection unit 24 is performed as follows, for example. That is, the presence / absence of the crimp waveform PWS is determined based on whether or not the pressure P is equal to or higher than a preset sampling trigger pressure value Ps (or whether or not it is greater than the sampling trigger pressure value Ps). As the predetermined sampling trigger pressure value Ps, for example, a value determined as a value of several tens of percent with respect to the pressure peak value of the crimping waveform based on a past trial result can be used. Further, the sampling period TS is set as a period TS defined by the preceding period TSa and the subsequent period TSb, for example, the time ta when the pressure P becomes a predetermined sampling trigger pressure value Ps as the sampling reference time ta. can do. For the previous period TSa and the subsequent period TSb, values determined experimentally or empirically as periods in which a crimping waveform effective for the judgment of crimping quality can be used with reference to the sampling reference time ta. Hereinafter, the time when the sampling period TS is started may be referred to as a sampling start time t0. However, the presence / absence of the pressure waveform and the setting of the sampling period are not limited to the above example. For example, sampling may be performed within a certain pressure range, or sampling may be performed within a predetermined period in conjunction with the crimping operation in the terminal crimping mechanism device 20. However, by performing sampling according to the change in the pressure waveform, sampling can be performed without receiving an operation signal from the terminal crimping mechanism device 20, and the configuration can be simplified.

上記のように基準波形35bを設定した後、ステップS1からステップS2に移行する。ステップS2において、端子圧着状態良否判別装置30は、基準波形35bにおいて圧力ピーク値Ymaxを求め、圧力ピーク値Ymaxに基づいて圧力区分Ya,Ybを算出し、算出した圧力区分Ya,Ybを判別範囲設定パラメータ35cとして外部記憶装置35に記憶する。   After setting the reference waveform 35b as described above, the process proceeds from step S1 to step S2. In step S2, the terminal crimping state pass / fail discrimination device 30 obtains the pressure peak value Ymax in the reference waveform 35b, calculates the pressure segments Ya and Yb based on the pressure peak value Ymax, and determines the calculated pressure segments Ya and Yb in the discrimination range. The setting parameter 35c is stored in the external storage device 35.

図7は基準波形を示す図である。同図に示すように、圧力ピーク値Ymaxは、基準波形35bにおける圧力の最高値として求められる。その他、圧力ピーク値Ymaxは、複数回分の圧着波形PWSにおける圧力の最高値として求めてられてもよい。また、区分圧力Ya,Ybは、例えば、上記圧力ピーク値Ymaxに、入力部38等を通じて予め設定された所定の割合の値を乗じた値として算出される。区分圧力Ya,Ybは、圧着波形PWSにおいて圧力変化が大きい中間期間に対応する圧力範囲を含むように設定され、例えば、圧力ピーク値Ymaxに0.7を乗じて区分圧力Yaが算出され、圧力ピーク値Ymaxに0.3を乗じて区分圧力Ybが算出される。これにより、複数種の端子圧着を行う場合でも、種類別に圧力区分Ya,Ybを設定しなくとも、求められた圧力ピーク値Ymaxに割合の値を生じて適切な区分圧力Ya,Ybを設定することができる。もっとも、区分圧力Ya,Ybは、利用者等により直接入力設定された値であってもよい。   FIG. 7 shows a reference waveform. As shown in the figure, the pressure peak value Ymax is obtained as the maximum pressure value in the reference waveform 35b. In addition, the pressure peak value Ymax may be obtained as the maximum pressure value in the crimping waveform PWS for a plurality of times. The section pressures Ya and Yb are calculated, for example, as values obtained by multiplying the pressure peak value Ymax by a predetermined ratio value set in advance through the input unit 38 or the like. The section pressures Ya and Yb are set so as to include a pressure range corresponding to an intermediate period in which the pressure change is large in the crimping waveform PWS. For example, the section pressure Ya is calculated by multiplying the pressure peak value Ymax by 0.7. The segment pressure Yb is calculated by multiplying the peak value Ymax by 0.3. As a result, even when a plurality of types of terminal crimping are performed, even if the pressure categories Ya and Yb are not set for each type, a ratio value is generated in the obtained pressure peak value Ymax, and appropriate segment pressures Ya and Yb are set. be able to. However, the section pressures Ya and Yb may be values directly input and set by a user or the like.

ステップS2終了後、ステップS3に進む。ステップS3では、端子圧着状態良否判別装置30は、基準波形35bと区分圧力Yaとに基づいて基準時Xaを求め、求めた基準時Xaを判別範囲設定パラメータ35cとして外部記憶装置35に記憶する。基準時Xaは、基準波形35bが区分圧力Yaになった時点Xa、つまり、X軸を時間、Y軸を圧力とするXY座標に基準波形35bを重畳した場合、基準波形35bとY=Yaとの交点のX座標を示す時間Xaである。   After step S2, the process proceeds to step S3. In step S3, the terminal crimping state pass / fail discriminating device 30 obtains the reference time Xa based on the reference waveform 35b and the section pressure Ya, and stores the obtained reference time Xa in the external storage device 35 as the discriminating range setting parameter 35c. The reference time Xa is the time Xa when the reference waveform 35b reaches the segment pressure Ya, that is, when the reference waveform 35b is superimposed on the XY coordinates with the X axis as time and the Y axis as pressure, the reference waveform 35b and Y = Ya This is a time Xa indicating the X coordinate of the intersection.

ステップS3終了後、ステップS4に進む。ステップS4では、端子圧着状態良否判別装置30は、基準波形35bと区分圧力Ybとに基づいて基準時Xbを求め、求めた基準時Xbを判別範囲設定パラメータ35cとして外部記憶装置35に記憶する。基準時Xbは、基準波形35bが区分圧力Ybになった時点Xb、つまり、X軸を時間、Y軸を圧力とするXY座標に基準波形35bを重畳した場合、基準波形35bとY=Ybとの交点のX座標を示す時間Xbである。   After step S3 ends, the process proceeds to step S4. In step S4, the terminal crimping state pass / fail discrimination device 30 obtains the reference time Xb based on the reference waveform 35b and the segment pressure Yb, and stores the obtained reference time Xb in the external storage device 35 as the discrimination range setting parameter 35c. The reference time Xb is the time Xb when the reference waveform 35b reaches the segment pressure Yb, that is, when the reference waveform 35b is superimposed on the XY coordinates with the X axis as time and the Y axis as pressure, the reference waveform 35b and Y = Yb It is time Xb which shows the X coordinate of the intersection of these.

ステップS4終了後、ステップS5に進み、端子圧着状態良否判別装置30は、基準波形35bにおける圧力ピーク値Ymaxと入力部38等を通じて予め設定された所定の設定値Xcとに基づいて判定終了時間Xeを求め、この判定終了時間Xeを判別範囲設定パラメータ35cとして外部記憶装置35に記憶する。より具体的には、基準波形35bにおいて圧力ピーク値Ymaxを呈する時間に所定の設定値Xcを加算することで、判定終了時間Xeが求められる。   After step S4 ends, the process proceeds to step S5, where the terminal crimping state pass / fail determination device 30 determines the determination end time Xe based on the pressure peak value Ymax in the reference waveform 35b and a predetermined set value Xc preset through the input unit 38 or the like. This determination end time Xe is stored in the external storage device 35 as the determination range setting parameter 35c. More specifically, the determination end time Xe is obtained by adding a predetermined set value Xc to the time when the pressure peak value Ymax is exhibited in the reference waveform 35b.

以上により基準波形35bの設定及び判別範囲の設定処理が終了する。本処理の終了後には、基準波形35bと、圧力区分Ya,Yb、基準時Xa,Xb及び判定終了時間Xeを含む判別範囲設定パラメータ35cが外部記憶装置35に設定記憶される。   Thus, the setting of the reference waveform 35b and the determination range setting process are completed. After the end of this process, the reference waveform 35b, the discrimination range setting parameter 35c including the pressure classifications Ya and Yb, the reference times Xa and Xb, and the determination end time Xe are set and stored in the external storage device 35.

なお、基準波形35bと、圧力区分Ya,Yb、基準時Xa,Xb及び判定終了時間Xeを含む判別範囲設定パラメータ35cは、端子14の種類及び電線12の種類等で特定される端子加工条件に対する圧着良否判別基準として用いられることが好ましい。このため、端子14の種類及び電線12の種類等の端子加工条件が変った場合には、新たに別の基準波形35bと判別範囲設定パラメータ35cとを設定することが好ましい。もっとも、端子14の種類及び電線12の種類変更が、検出されるべき圧力波形に影響を与えない或はあまり影響を与えない程度の変更である場合には、同一の基準波形35bと判別範囲設定パラメータ35cとを用いてもよい。   The discriminating range setting parameter 35c including the reference waveform 35b, the pressure classifications Ya and Yb, the reference times Xa and Xb, and the judgment end time Xe corresponds to the terminal processing conditions specified by the type of the terminal 14 and the type of the electric wire 12. It is preferable to be used as a criterion for determining whether or not pressure bonding is acceptable. For this reason, when terminal processing conditions, such as the kind of terminal 14 and the kind of electric wire 12, change, it is preferable to newly set another reference waveform 35b and the discrimination range setting parameter 35c. However, if the change in the type of the terminal 14 and the type of the electric wire 12 is such a change that does not affect the pressure waveform to be detected or does not affect the pressure waveform to be detected, the same reference waveform 35b and the discrimination range setting are set. The parameter 35c may be used.

また、上記基準波形35bの設定及び判別範囲の設定処理は、端子14の圧着処理を行う毎に必ず行う必要はない。例えば、既に行った処理により、特定の端子14及び特定の電線12に関して、基準波形35bと判別範囲設定パラメータ35cが既に得られている場合には、それらの基準波形35bと判別範囲設定パラメータ35cを用いて後述する端子14の圧着状態良否判別を行ってもよい。   Further, the setting process of the reference waveform 35b and the setting process of the discrimination range are not necessarily performed every time the terminal 14 is crimped. For example, when the reference waveform 35b and the discrimination range setting parameter 35c have already been obtained for the specific terminal 14 and the specific electric wire 12 by the processing already performed, the reference waveform 35b and the discrimination range setting parameter 35c are set to It may be used to determine whether the terminal 14 is in a crimped state, which will be described later.

<3.2.端子の圧着良否判別処理>
端子圧着状態良否判別装置30は、各端子14の圧着作業中において検出される圧着波形に基づいて圧着良否判別を行うものであり、ここでは、圧着波形PWにおける圧着初期期間において圧着波形PWと基準波形35bとの相関度合を示す差に基づいて圧着良否判別を行い(第1圧着良否判別処理)、圧着波形PWにおける圧着終期期間において圧着波形PWと基準波形35bとの相関度合を示す相関係数に基づいて圧着良否判別を行い(第3圧着良否判別処理)、これらの間の期間と想定される中間期間で圧力変化速度に応じた物理量に基づいて圧着良否判別を行う(第2圧着良否判別処理)。
<3.2. Terminal crimping judgment process>
The terminal crimping state pass / fail judgment device 30 performs the crimping pass / fail judgment based on the crimping waveform detected during the crimping operation of each terminal 14. Here, the crimping waveform PW and the reference in the initial crimping period of the crimping waveform PW are used. Crimping quality determination is performed based on the difference indicating the degree of correlation with the waveform 35b (first pressing quality determination process), and a correlation coefficient indicating the degree of correlation between the crimping waveform PW and the reference waveform 35b in the crimping final period of the crimping waveform PW. Is determined based on the pressure (third pressure bonding determination process), and is determined based on a physical quantity corresponding to the pressure change rate in an intermediate period assumed between these (second pressure determination determination) processing).

この圧着良否判別処理について、図8に示すフローチャートを用いてより具体的に説明する。   The crimping pass / fail discrimination process will be described more specifically with reference to the flowchart shown in FIG.

すなわち、利用者等が、端子圧着機構装置20に連続的な端子圧着開始指示を与えると共に、端子圧着状態良否判別装置30に圧着良否判別処理開始指示を与える。すると、圧力検出部24で検出された圧力波形が圧力波形入力回路部36を通じて入力される。端子圧着状態良否判別装置30は、圧着良否判別処理開始指示を受付けると、ステップS10に示すように、圧着波形PWのサンプリングを行う。圧着波形PWのサンプリングは、上記基準波形35bを取得する際にサンプリングしたのと同様の基準時間ta及び期間TSでサンプリングすればよい。   That is, a user or the like gives a terminal crimping start instruction to the terminal crimping mechanism device 20 and also gives a crimping pass / fail judgment processing start instruction to the terminal crimping state pass / fail judgment device 30. Then, the pressure waveform detected by the pressure detection unit 24 is input through the pressure waveform input circuit unit 36. When the terminal crimping state pass / fail judgment device 30 receives the crimping pass / fail judgment start instruction, the crimping waveform PW is sampled as shown in step S10. The crimping waveform PW may be sampled at the same reference time ta and period TS as sampled when the reference waveform 35b is acquired.

なお、図9は、X軸を時間、Y軸を圧力とするXY座標に基準波形35bと圧着時に検出された圧着波形PW例を示した図である。基準波形35bと圧着波形PWとは、それぞれのサンプリング開始時間t0を同一時間に揃えるように重ね合されており、説明の便宜上、サンプリング開始時間t0=0であるとして説明する。以下の処理説明では、必要に応じて図9を参照して説明する。   FIG. 9 is a diagram showing an example of the crimp waveform PW detected at the time of crimping with the reference waveform 35b on the XY coordinates where the X axis is time and the Y axis is pressure. The reference waveform 35b and the crimp waveform PW are overlapped so that the respective sampling start times t0 are aligned with each other. For convenience of explanation, it is assumed that the sampling start time t0 = 0. In the following process description, description will be made with reference to FIG. 9 as necessary.

ステップS10に続いて、端子圧着状態良否判別装置30は、サンプリングされた圧着波形PWに対して第1圧着良否判別処理(ステップS11〜S15)と、第2圧着良否判別処理(ステップS16〜S21)、第3圧着良否判別処理(ステップS22〜S25)とを並列的に実行する。なお、各処理は、必ずしも分散処理或は時分割処理等により並列的に実行される必要はなく、逐次処理されてもよい。要するに、1回の端子圧着に対して上記3つの処理が行われればよい。   Subsequent to step S10, the terminal crimping state pass / fail judgment device 30 performs first crimping pass / fail judgment processing (steps S11 to S15) and second crimping pass / fail judgment processing (steps S16 to S21) for the sampled crimp waveform PW. The third pressure bonding quality determination process (steps S22 to S25) is executed in parallel. Each process does not necessarily have to be executed in parallel by distributed processing or time-division processing, and may be performed sequentially. In short, the above three processes may be performed for one terminal crimping.

各処理について順番に説明する。   Each process will be described in turn.

第1圧着良否判別処理は、圧着初期期間T1(0〜Xb)において圧着波形PWと基準波形35bとの差に基づいて圧着良否判別を行う処理である。   The first crimping quality determination process is a process of determining the crimping quality based on the difference between the crimping waveform PW and the reference waveform 35b in the initial crimping period T1 (0 to Xb).

すなわち、端子圧着状態良否判別装置30は、ステップS11で、圧着初期期間(0〜Xb)において圧着波形PWと基準波形35bとの相関係数(Cor)を下記数式に基づいて算出する。   That is, in step S11, the terminal crimping state pass / fail discrimination device 30 calculates the correlation coefficient (Cor) between the crimping waveform PW and the reference waveform 35b in the initial crimping period (0 to Xb) based on the following equation.

Figure 2010040481
Figure 2010040481

ステップS11において相関係数(Cor)が算出されると、ステップS12に進む。ステップS12では、相関係数(Cor)が所定の相関係数しきい値(S(Cor))よりも小さいか否かを判別する。なお、相関係数しきい値(S(Cor))は、判別しきい値パラメータ35dの一種として、予め入力部38等を通じて入力設定され外部記憶装置35に記憶された値である。この判別結果、相関係数(Cor)が所定の相関係数しきい値(S(Cor))よりも小さくはない、つまり、圧着初期期間(0〜Xb)において圧着波形PWと基準波形35bとの相関度合が高いと判別された場合には、圧着良好であるとして本第1圧着良否判別処理を終了する。一方、相関係数(Cor)が所定の相関係数しきい値(S(Cor))よりも小さい、つまり、圧着初期期間(0〜Xb)において圧着波形PWと基準波形35bとの相関度合が低いと判別された場合には、圧着不良であるとして、ステップS13に進む。   When the correlation coefficient (Cor) is calculated in step S11, the process proceeds to step S12. In step S12, it is determined whether or not the correlation coefficient (Cor) is smaller than a predetermined correlation coefficient threshold value (S (Cor)). The correlation coefficient threshold value (S (Cor)) is a value that is input and set in advance through the input unit 38 or the like as one type of the discrimination threshold parameter 35d and stored in the external storage device 35. As a result of the determination, the correlation coefficient (Cor) is not smaller than the predetermined correlation coefficient threshold value (S (Cor)), that is, the crimping waveform PW and the reference waveform 35b in the initial crimping period (0 to Xb). If it is determined that the degree of correlation is high, the first crimping pass / fail discrimination process is terminated by determining that the crimping is satisfactory. On the other hand, the correlation coefficient (Cor) is smaller than a predetermined correlation coefficient threshold value (S (Cor)), that is, the correlation degree between the crimping waveform PW and the reference waveform 35b in the crimping initial period (0 to Xb). If it is determined to be low, it is determined that there is a crimping failure and the process proceeds to step S13.

なお、ステップS11において、相関係数(Cor)が所定の相関係数しきい値(S(Cor))と同じである場合には、圧着良好及び圧着不良のいずれに判別してもよい。   In step S11, when the correlation coefficient (Cor) is the same as the predetermined correlation coefficient threshold value (S (Cor)), it may be determined whether the pressure bonding is good or the pressure bonding is bad.

ステップS13では、表示部39に不良表示である旨を表示すると共に、端子圧着をエラー停止させる旨の信号を端子圧着機構装置20に与える。これにより、端子圧着機構装置20による端子14の圧着処理は一時的に停止される。この後、ステップS14に進む。   In step S <b> 13, the display unit 39 displays a failure display, and gives a signal to the terminal crimping mechanism device 20 to stop the terminal crimping error. Thereby, the crimping process of the terminal 14 by the terminal crimping mechanism apparatus 20 is stopped temporarily. Thereafter, the process proceeds to step S14.

ステップS14では、入力部38等を通じた確認リセット指示の入力の有無が判断され、入力無しと判断されるとステップS14の処理を繰返し、入力有りと判断されるとステップS15に進む。すなわち、利用者が、端子14の圧着の不良を認識して、当該不良品の排除、端子圧着機構装置20の状態確認等を行った後、確認リセット指示を入力すると、ステップS14からステップS15に進む。   In step S14, it is determined whether or not a confirmation reset instruction is input through the input unit 38 or the like. If it is determined that there is no input, the process in step S14 is repeated. If it is determined that there is an input, the process proceeds to step S15. That is, when the user recognizes a defect in crimping of the terminal 14, removes the defective product, checks the state of the terminal crimping mechanism device 20, etc., and inputs a confirmation reset instruction, the process proceeds from step S 14 to step S 15. move on.

ステップS15では、表示部39におけるエラー表示を解除すると共にエラー停止させる旨の信号を解除する。これにより、端子圧着機構装置20による端子14の圧着処理が継続可能な状態となり、本第1圧着良否判別処理を終了する。   In step S15, the error display on the display unit 39 is canceled and the signal to stop the error is canceled. As a result, the terminal 14 can be continuously crimped by the terminal crimping mechanism device 20, and the first crimping pass / fail discrimination process ends.

第2圧着良否判別処理は、圧力変化速度に応じた物理量に基づいて圧着良否判別を行う処理である。より具体的には、第2圧着良否判別処理は、所定の圧力範囲(Yb〜Ya)において、基準波形35bに基づいて圧力変化速度に応じた基準物理量(Sr)を求めると共に、同圧力範囲(Yb〜Ya)において圧着波形PWに基づいて圧力変化速度に応じた物理量(Sd)を求め、基準物理量(Sr)と物理量(Sd)とを比較することで圧着良否判別を行う処理である。   The second crimping quality determination process is a process for determining the crimping quality based on a physical quantity corresponding to the pressure change speed. More specifically, in the second pressure bonding quality determination process, in a predetermined pressure range (Yb to Ya), a reference physical quantity (Sr) corresponding to the pressure change rate is obtained based on the reference waveform 35b, and the pressure range ( Yb-Ya) is a process of determining the bonding quality by determining the physical quantity (Sd) corresponding to the pressure change speed based on the crimping waveform PW and comparing the reference physical quantity (Sr) and the physical quantity (Sd).

すなわち、端子圧着状態良否判別装置30は、ステップS16において、基準波形35bにおける圧力変化速度に応じた物理量として、圧力範囲(Yb〜Ya)における圧力変化速度(Sr=(Ya−Yb)/(Xb−Xa))を算出する(図9で一点鎖線で示す直線の傾き参照)。上記圧力範囲(Yb−Ya)は、圧着初期期間(0〜Xb)における基準波形35bの圧力範囲(区分圧力Yb以下)と圧着終期期間(Xa〜Xe)における基準波形35bの圧力範囲(区分圧力Ya以上)との間の圧力範囲(Yb〜Ya)として設定された範囲である。上記値Xa,Xb,Ya,Ybは、判別範囲設定パラメータ35cとして予め求められた値を用いることができる。この後、ステップS17に進む。   That is, in step S16, the terminal crimping state pass / fail discrimination device 30 uses the pressure change rate (Sr = (Ya−Yb) / (Xb) in the pressure range (Yb to Ya) as a physical quantity corresponding to the pressure change rate in the reference waveform 35b. -Xa)) is calculated (see the slope of the straight line shown by the one-dot chain line in FIG. 9). The pressure range (Yb−Ya) is a pressure range (segment pressure Yb or less) of the reference waveform 35b in the initial crimping period (0 to Xb) and a pressure range (segment pressure) of the reference waveform 35b in the final crimping period (Xa to Xe). Ya or more) is a range set as a pressure range (Yb to Ya). As the values Xa, Xb, Ya, and Yb, values obtained in advance as the determination range setting parameter 35c can be used. Thereafter, the process proceeds to step S17.

ステップS17では、圧着波形PWにおける圧力変化速度に応じた物理量として、上記と同じ圧力範囲(Yb〜Ya)における圧力変化速度(Sd=(Ya−Yb)/(Xd1−Xd2))を算出する(図9で二点鎖線で示す直線の傾き参照)。上記時間Xd1は、圧着波形PWにおいて圧力がYaになった時間であり、時間Xd2は、圧着波形PWにおいて圧力がYbになった時間である。この後、ステップS18に進む。   In step S17, the pressure change rate (Sd = (Ya−Yb) / (Xd1−Xd2)) in the same pressure range (Yb to Ya) as described above is calculated as a physical quantity corresponding to the pressure change rate in the crimping waveform PW ( (See the slope of the straight line shown by the two-dot chain line in FIG. 9). The time Xd1 is the time when the pressure becomes Ya in the crimping waveform PW, and the time Xd2 is the time when the pressure becomes Yb in the crimping waveform PW. Thereafter, the process proceeds to step S18.

ステップS18では、上記圧力変化速度Sr,Sdを比較することで、圧着良否判別を行う。すなわち、上記で算出された圧力変化速度Sr,Sdの値を、圧力変化評価値(VP)=|(Sr/Sd)−1|×100、で表される式に代入して、圧力変化評価値(VP)の値を算出する。そして、圧力変化評価値(VP)が所定の圧力変化しきい値(S(VP))よりも大きいか否かを判別する。なお、圧力変化しきい値(S(VP))は、判別しきい値パラメータ35dの一種として、予め入力部38等を通じて入力設定され外部記憶装置35に記憶された値である。この判別結果、圧力変化評価値(VP)が所定の圧力変化しきい値(S(VP))よりも大きくない、つまり、圧力変化速度Sr,Sdが比較的近似していると判別された場合には、圧着良好であるとして本第2圧着良否判別処理を終了する。一方、圧力変化評価値(VP)が所定の圧力変化しきい値(S(VP))よりも大きい、つまり、圧力変化速度Sr,Sdが比較的異なっていると判別された場合には、圧着不良であるとして、ステップS19に進む。   In step S18, the pressure change speeds Sr and Sd are compared to determine whether or not the pressure bonding is good. That is, the values of the pressure change rates Sr and Sd calculated above are substituted into an expression represented by the pressure change evaluation value (VP) = | (Sr / Sd) −1 | × 100, and the pressure change evaluation is performed. The value (VP) is calculated. Then, it is determined whether or not the pressure change evaluation value (VP) is larger than a predetermined pressure change threshold value (S (VP)). The pressure change threshold value (S (VP)) is a value that is input and set in advance through the input unit 38 or the like as one type of the discrimination threshold parameter 35d and stored in the external storage device 35. As a result of the determination, when it is determined that the pressure change evaluation value (VP) is not larger than the predetermined pressure change threshold value (S (VP)), that is, it is determined that the pressure change speeds Sr and Sd are relatively approximate. In this case, the second crimping pass / fail discrimination process is terminated because the crimping is good. On the other hand, when it is determined that the pressure change evaluation value (VP) is larger than the predetermined pressure change threshold value (S (VP)), that is, the pressure change speeds Sr and Sd are relatively different, the pressure bonding is performed. The processing proceeds to step S19 as being defective.

なお、ステップS18において、圧力変化評価値(VP)と圧力変化しきい値(S(VP))とが同じである場合には、圧着良好及び圧着不良のいずれに判別してもよい。   In step S18, when the pressure change evaluation value (VP) and the pressure change threshold value (S (VP)) are the same, it may be determined whether the pressure bonding is good or the pressure bonding is poor.

また、ステップS18において、圧力変化速度Sr,Sdの差を所定のしきい値と比較することで、圧着良否判別を行ってもよい。もっとも、上記のように圧力変化速度Sr,Sdの比に基づいて圧着良否判別を行うことで、複数種の端子圧着を行う場合でも、圧力変化速度Sr,Sdの大小に拘らず、統一的な基準で圧着良否判別を行えるという利点がある。   Further, in step S18, it may be determined whether or not the pressure bonding is good by comparing the difference between the pressure change rates Sr and Sd with a predetermined threshold value. However, as described above, by performing the crimping quality determination based on the ratio of the pressure change rates Sr and Sd, even when a plurality of types of terminal crimping are performed, the pressure change rates Sr and Sd can be unified regardless of the magnitude. There is an advantage that it is possible to determine whether the crimping is good or not by reference.

ステップS19では、表示部39に不良表示である旨を表示すると共に、端子圧着をエラー停止させる旨の信号を端子圧着機構装置20に与える。これにより、端子圧着機構装置20による端子14の圧着処理は一時的に停止される。この後、ステップS20に進む。   In step S19, the display unit 39 displays a failure indication and gives a signal to the terminal crimping mechanism device 20 to stop the terminal crimping error. Thereby, the crimping process of the terminal 14 by the terminal crimping mechanism apparatus 20 is stopped temporarily. Thereafter, the process proceeds to step S20.

ステップS20では、入力部38等を通じた確認リセット指示の入力の有無が判断され、入力無しと判断されるとステップS20の処理を繰返し、入力有りと判断されるとステップS21に進む。すなわち、利用者が、端子14の圧着の不良を認識して、当該不良品の排除、端子圧着機構装置20の状態確認等を行った後、確認リセット指示を入力すると、ステップS20からステップS21に進む。   In step S20, it is determined whether or not a confirmation reset instruction is input through the input unit 38 or the like. If it is determined that there is no input, the process in step S20 is repeated, and if it is determined that there is an input, the process proceeds to step S21. That is, when the user recognizes a defect in crimping of the terminal 14, removes the defective product, checks the state of the terminal crimping mechanism device 20, etc., and then inputs a confirmation reset instruction, the process proceeds from step S 20 to step S 21. move on.

ステップS21では、表示部39におけるエラー表示を解除すると共にエラー停止させる旨の信号を解除する。これにより、端子圧着機構装置20による端子14の圧着処理が継続可能な状態となり、本第2圧着良否判別処理を終了する。   In step S21, the error display on the display unit 39 is canceled and the signal to stop the error is canceled. As a result, the terminal 14 can be continuously crimped by the terminal crimping mechanism device 20, and the second crimping determination process is terminated.

第3圧着良否判別処理は、圧着終期期間T3(Xa〜Xe)において圧着波形PWと基準波形35bとの相関係数に基づいて圧着良否判別を行う処理である。   The third crimping pass / fail judgment process is a process for judging the crimping pass / fail based on the correlation coefficient between the crimping waveform PW and the reference waveform 35b in the crimping final period T3 (Xa to Xe).

すなわち、端子圧着状態良否判別装置30は、ステップS22で、圧着初期期間(Xa〜Xe)における各時間において、圧着波形PWにおける圧力検出値と基準波形35bにおける圧力基準値との差の絶対値(VA)を求め、圧着初期期間(Xa〜Xe)における全ての時間に関する絶対値(VA)が、圧力差しきい値(S(VA))よりも大きいか否かを判別する。なお、圧力差しきい値(S(VA))は、判別しきい値パラメータ35dの一種として、予め入力部38等を通じて入力設定され外部記憶装置35に記憶された値である。この判別結果、圧着初期期間(Xa〜Xe)における全ての時間における絶対値(VA)が圧力差しきい値(S(VA))よりも大きくない、つまり、圧着終期期間T3(Xa〜Xe)において圧着波形PWと基準波形35bとの差が比較的小さいと判別された場合には、圧着良好であるとして本第3圧着良否判別処理を終了する。一方、圧着初期期間(Xa〜Xe)におけるいずれかの時間の絶対値(VA)が圧力差しきい値(S(VA))よりも大きい、つまり、圧着終期期間T3(Xa〜Xe)において圧着波形PWと基準波形35bとの差が比較的大きいと判別された場合には、圧着不良であるとして、ステップS23に進む。   That is, in step S22, the terminal crimping state pass / fail discrimination device 30 determines the absolute value of the difference between the pressure detection value in the crimping waveform PW and the pressure reference value in the reference waveform 35b at each time in the initial crimping period (Xa to Xe). VA) is obtained, and it is determined whether or not the absolute value (VA) relating to all the times in the initial pressure bonding period (Xa to Xe) is larger than the pressure difference threshold value (S (VA)). The pressure difference threshold value (S (VA)) is a value that is input and set in advance through the input unit 38 or the like as a kind of the discrimination threshold parameter 35d and stored in the external storage device 35. As a result of the determination, the absolute value (VA) at all times in the initial crimping period (Xa to Xe) is not larger than the pressure difference threshold value (S (VA)), that is, in the final crimping period T3 (Xa to Xe). When it is determined that the difference between the crimping waveform PW and the reference waveform 35b is relatively small, the third crimping pass / fail discrimination process is terminated as the crimping is good. On the other hand, the absolute value (VA) of any time in the initial crimping period (Xa to Xe) is larger than the pressure difference threshold value (S (VA)), that is, the crimping waveform in the final crimping period T3 (Xa to Xe). If it is determined that the difference between the PW and the reference waveform 35b is relatively large, it is determined that there is a crimping failure and the process proceeds to step S23.

なお、ステップS22において、複数の時間箇所で絶対値(VA)が圧力差しきい値(S(VA))よりも大きくなる場合に、圧着不良であると判別してもよい。また、各時間の絶対値(VA)が圧力差しきい値(S(VA))と同じである場合には、圧着良好及び圧着不良のいずれに判別してもよい。   In step S22, when the absolute value (VA) becomes larger than the pressure difference threshold value (S (VA)) at a plurality of time points, it may be determined that there is a pressing failure. Moreover, when the absolute value (VA) of each time is the same as a pressure difference threshold value (S (VA)), it may be discriminated as either good crimping or poor crimping.

ステップS23では、表示部39に不良表示である旨を表示すると共に、端子圧着をエラー停止させる旨の信号を端子圧着機構装置20に与える。これにより、端子圧着機構装置20による端子14の圧着処理は一時的に停止される。この後、ステップS24に進む。   In step S23, the display unit 39 displays a failure indication and gives a signal to the terminal crimping mechanism device 20 to stop the terminal crimping error. Thereby, the crimping process of the terminal 14 by the terminal crimping mechanism apparatus 20 is stopped temporarily. Thereafter, the process proceeds to step S24.

ステップS24では、入力部38等を通じた確認リセット指示の入力の有無が判断され、入力無しと判断されるとステップS24の処理を繰返し、入力有りと判断されるとステップS25に進む。すなわち、利用者が、端子14の圧着の不良を認識して、当該不良品の排除、端子圧着機構装置20の状態確認等を行った後、確認リセット指示を入力すると、ステップS24からステップS25に進む。   In step S24, it is determined whether or not a confirmation reset instruction is input through the input unit 38 or the like. If it is determined that there is no input, the process of step S24 is repeated. If it is determined that there is an input, the process proceeds to step S25. That is, after the user recognizes the crimping failure of the terminal 14 and eliminates the defective product, confirms the state of the terminal crimping mechanism device 20, etc., and inputs a confirmation reset instruction, the process proceeds from step S24 to step S25. move on.

ステップS25では、表示部39におけるエラー表示を解除すると共にエラー停止させる旨の信号を解除する。これにより、端子圧着機構装置20による端子14の圧着処理が継続可能な状態となり、本第3圧着良否判別処理を終了する。   In step S25, the error display on the display unit 39 is canceled and the signal for stopping the error is canceled. As a result, the terminal 14 can be continuously crimped by the terminal crimping mechanism device 20, and the third crimping pass / fail discrimination process is terminated.

そして、上記第1圧着良否判別処理(ステップS11〜S15)と、第2圧着良否判別処理(ステップS16〜S21)、第3圧着良否判別処理(ステップS22〜S25)のそれぞれにおいて、圧着良好と判別され、或は、圧着不良との判別後にエラー停止解除がなされて、判別処理が終了すると、ステップS26に示すように端子14を圧着する生産継続が可能な状態となる。そして、再度端子14の圧着が行われ、当該圧着に伴って取得された圧着波形PWに基づいて、第1圧着良否判別処理と第2圧着良否判別処理と第3圧着良否判別処理とを繰返す。これにより、連続的に圧着される端子14に対して逐次圧着良否判別が行われる。   In each of the first pressure bonding quality determination process (steps S11 to S15), the second pressure bonding quality determination process (steps S16 to S21), and the third pressure bonding quality determination process (steps S22 to S25), it is determined that the pressure bonding is good. Alternatively, after the error stop is canceled after the determination of the crimping failure, and the determination process is completed, the terminal 14 can be continuously crimped as shown in step S26. Then, the terminal 14 is crimped again, and the first crimping quality determination process, the second crimping quality determination process, and the third crimping quality determination process are repeated based on the crimping waveform PW acquired along with the crimping. As a result, whether the crimping is successful or not is successively performed on the terminals 14 that are continuously crimped.

以上のように構成された端子圧着状態良否判別装置、端子圧着加工装置、端子圧着状態良否判別方法及び端子圧着状態良否判別プログラムによると、圧着波形PWに基づいて圧力変化速度に応じた物理量を求め、この物理量に基づいて圧着良否判別を行うため、基準波形35bと圧着波形PWとの時間軸方向のずれがあっても、なるべく適切に圧着良否判別を行うことができる。   According to the terminal crimping state pass / fail judgment device, terminal crimping processing device, terminal crimping state pass / fail judgment method and terminal crimping state pass / fail judgment program configured as described above, the physical quantity corresponding to the pressure change rate is obtained based on the crimping waveform PW. Since the crimping quality determination is performed based on this physical quantity, it is possible to appropriately determine the crimping quality as much as possible even if there is a deviation in the time axis direction between the reference waveform 35b and the crimping waveform PW.

特に、基準波形35bと圧着波形PWとで、同じ圧力範囲(Yb〜Ya)で、圧力変化速度に応じた物理量を比較しているため、基準波形35bと圧着波形PWとの時間軸方向のずれに拘らず、圧着良否判別を行うことができる。   In particular, since the physical quantity corresponding to the pressure change speed is compared between the reference waveform 35b and the crimping waveform PW in the same pressure range (Yb to Ya), the deviation in the time axis direction between the reference waveform 35b and the crimping waveform PW. Regardless of whether or not, it is possible to determine whether or not the crimping is good.

ところで、通常、圧着の初期及び終期では圧力変化は小さくなる。このため、基準波形35bと圧着波形PWとの時間軸方向のずれによる影響は小さい。そこで、圧着初期期間(0〜Xb)及び圧着終期期間(Xa〜Xe)では、基準波形35bと圧着波形PWとの相関度合に基づいて圧着良否判別を行うことで、より適切な圧着良否判別を行うことができる。   By the way, normally, the pressure change becomes small in the initial stage and the final stage of the crimping. For this reason, the influence by the shift | offset | difference of the time-axis direction of the reference | standard waveform 35b and the crimping | compression-bonding waveform PW is small. Therefore, in the initial crimping period (0 to Xb) and the final crimping period (Xa to Xe), it is possible to determine whether the crimping is more appropriate by performing the crimping quality determination based on the degree of correlation between the reference waveform 35b and the crimping waveform PW. It can be carried out.

この場合に、基準波形35bと圧着波形PWとの相関度合に基づく圧着良否判別処理としては、上記のように圧力差自体に対する比較又は相関係数に対する比較等種々値を用いた判別を採用することができる。   In this case, as the crimping quality determination process based on the correlation degree between the reference waveform 35b and the crimping waveform PW, the discrimination using various values such as the comparison with respect to the pressure difference itself or the comparison with respect to the correlation coefficient as described above is adopted. Can do.

また、通常、圧着初期期間(0〜Xb)と圧着終期期間(Xa〜Xe)との間では圧力変化が比較的大きい。このため、上記のように圧力変化速度を比較する圧力範囲としては、基準波形35bにおいて圧着初期期間(0〜Xb)と圧着終期期間(Xa〜Xe)との間の圧力範囲(Yb〜Ya)に設定することが好ましい。   In general, the pressure change is relatively large between the initial crimping period (0 to Xb) and the final crimping period (Xa to Xe). For this reason, as the pressure range for comparing the pressure change speed as described above, the pressure range (Yb to Ya) between the initial crimping period (0 to Xb) and the final crimping period (Xa to Xe) in the reference waveform 35b. It is preferable to set to.

{変形例}
なお、上記実施形態は例示であり、本発明は上記実施形態に限定されるものではなく、様々な変形が可能である。
{Modifications}
In addition, the said embodiment is an illustration and this invention is not limited to the said embodiment, A various deformation | transformation is possible.

例えば、上記実施形態では、第1圧着良否判別処理と第2圧着良否判別処理と第3圧着良否判別処理とを行っているが、第1圧着良否判別処理と第3圧着良否判別処理との少なくとも一方を省略してもよい。   For example, in the above-described embodiment, the first pressure bonding quality determination process, the second pressure bonding quality determination process, and the third pressure bonding quality determination process are performed, but at least the first pressure bonding quality determination process and the third pressure bonding quality determination process are performed. One may be omitted.

上記実施形態では、基準波形35b及び圧着波形PWのそれぞれにおいて、圧力変化速度に応じた物理量として、圧力変化量を時間変化量で除した値Sr,Sdを用いているが、圧力変化速度に応じた物理量の例はそのような例に限られない。例えば、一定範囲で圧力変化するのに要する時間そのものを、圧力変化速度に応じた物理量として採用してもよい。また、基準波形35b及び圧着波形PWのそれぞれにおいて、所定の時間範囲内での圧力変化速度に応じた物理量を求めてもよい。要するに、圧力変化速度に応じて変動する物理量であればよい。   In the above embodiment, values Sr and Sd obtained by dividing the pressure change amount by the time change amount are used as the physical quantities according to the pressure change rate in each of the reference waveform 35b and the crimp waveform PW. Examples of physical quantities are not limited to such examples. For example, the time itself required for pressure change within a certain range may be adopted as a physical quantity corresponding to the pressure change speed. Further, in each of the reference waveform 35b and the crimping waveform PW, a physical quantity corresponding to the pressure change rate within a predetermined time range may be obtained. In short, any physical quantity that varies depending on the pressure change rate may be used.

なお、上記各実施形態及び各変形例で説明した各構成は、相互に矛盾しない限り適宜組合わせることができる。   In addition, each structure demonstrated by each said embodiment and each modification can be suitably combined unless it mutually contradicts.

端子圧着加工装置を示す概略正面図である。It is a schematic front view which shows a terminal crimping processing apparatus. 端子圧着機構装置を示す概略側面図である。It is a schematic side view which shows a terminal crimping mechanism apparatus. 端子圧着状態良否判別装置のハードウエア構成を示すブロック図である。It is a block diagram which shows the hardware constitutions of a terminal crimping state quality determination apparatus. 端子圧着状態良否判別装置の機能ブロック図である。It is a functional block diagram of a terminal crimping state pass / fail discrimination device. 基準波形の設定及び判別範囲の設定処理を示すフローチャートである。It is a flowchart which shows the setting process of the setting of a reference waveform and a discrimination range. 圧着波形の例を示す図である。It is a figure which shows the example of a crimping waveform. 基準波形の例を示す図である。It is a figure which shows the example of a reference waveform. 圧着良否判別処理を示すフローチャートである。It is a flowchart which shows a crimping | compression-bonding quality determination process. 基準波形例と圧着波形例との関係を示す図である。It is a figure which shows the relationship between the example of a reference waveform, and the example of a crimping | compression-bonding waveform.

符号の説明Explanation of symbols

10 端子圧着加工装置
12 電線
14 端子
20 端子圧着機構装置
22,25 圧着型
24 圧力検出部
26 圧着駆動部
30 端子圧着状態良否判別装置
32c 基準波形処理部
32d 圧着良否判別部
32d1 第1判別処理部
32d2 第2判別処理部
32d3 第3判別処理部
35 外部記憶装置
35a 判別プログラム
35b 基準波形
35c 判別範囲設定パラメータ
35d 判別しきい値パラメータ
36 圧力波形入力回路部
PW 圧着波形
Sr,Sd 圧力変化速度
T1 圧着初期期間
T3 圧着終期期間
Xa,Xb 基準時
Xe 判定終了時間
Ya,Yb 圧力区分
DESCRIPTION OF SYMBOLS 10 Terminal crimping processing apparatus 12 Electric wire 14 Terminal 20 Terminal crimping mechanism apparatus 22, 25 Crimp type | mold 24 Pressure detection part 26 Crimp drive part 30 Terminal crimping state quality determination apparatus 32c Reference | standard waveform processing part 32d Crimp quality determination part 32d1 1st determination process part 32d2 Second discrimination processing unit 32d3 Third discrimination processing unit 35 External storage device 35a Discrimination program 35b Reference waveform 35c Discrimination range setting parameter 35d Discrimination threshold parameter 36 Pressure waveform input circuit unit PW Crimping waveform Sr, Sd Pressure change rate T1 Crimping Initial period T3 Crimp final period Xa, Xb Reference time Xe Judgment end time Ya, Yb Pressure classification

Claims (7)

端子の圧着良否判別を行う端子圧着状態良否判別装置であって、
端子圧着に伴って検出される圧力波形が入力される圧力波形入力部と、
前記圧力波形に基づいて圧力変化速度に応じた物理量を求め、前記物理量に基づいて圧着良否判別を行う良否判別部と、
を備える端子圧着状態良否判別装置。
A terminal crimping state pass / fail discrimination device that performs terminal crimping pass / fail discrimination,
A pressure waveform input unit to which a pressure waveform detected along with terminal crimping is input;
A physical quantity corresponding to a pressure change rate is obtained based on the pressure waveform, and a pass / fail judgment unit that performs crimping quality judgment based on the physical quantity;
A terminal crimping state pass / fail discrimination device comprising:
請求項1記載の端子圧着状態良否判別装置であって、
前記良否判別部は、所定の基準波形に基づいて所定の圧力範囲における圧力変化速度に応じた値として求められた基準物理量と、前記圧力波形に基づいて前記所定の圧力範囲における圧力変化速度に応じた値として求められた物理量とを比較することで、圧着良否判別を行う、端子圧着状態良否判別装置。
The terminal crimping state quality determination device according to claim 1,
The pass / fail judgment unit responds to a reference physical quantity obtained as a value corresponding to a pressure change rate in a predetermined pressure range based on a predetermined reference waveform and a pressure change rate in the predetermined pressure range based on the pressure waveform. A terminal crimping state pass / fail discrimination device that performs crimping pass / fail judgment by comparing the physical quantity obtained as a measured value.
請求項1又は請求項2記載の端子圧着状態良否判別装置であって、
前記圧着良否判別部は、所定の圧着初期期間において前記圧力波形と所定の基準波形との相関度合に基づいて圧着良否判別を行い、所定の圧着終期期間において前記圧力波形と所定の基準波形との相関度合に基づいて圧着良否判別を行う、端子圧着状態良否判別装置。
The terminal crimping state pass / fail discrimination device according to claim 1 or 2,
The crimping pass / fail judgment unit performs crimping pass / fail judgment based on a degree of correlation between the pressure waveform and a predetermined reference waveform in a predetermined initial crimping period, and between the pressure waveform and the predetermined reference waveform in a predetermined crimping final period. A terminal crimping state pass / fail discrimination device that performs crimping pass / fail discrimination based on the degree of correlation.
請求項1記載の端子圧着状態良否判別装置であって、
前記圧着良否判別部は、
所定の圧着初期期間において前記圧力波形と所定の基準波形との相関度合に基づいて圧着良否判別を行い、所定の圧着終期期間において前記圧力波形と所定の基準波形との相関度合に基づいて圧着良否判別を行い、さらに、前記所定の圧着初期期間における前記基準波形の圧力範囲と前記所定の圧着終期期間における前記基準波形の圧力範囲との間の所定の圧力範囲において圧力変化速度に応じたと値として求められた基準物理量と、前記圧力波形に基づいて前記所定の圧力範囲における圧力変化速度に応じた値として求められた前記物理量とを比較することで、圧着良否判別を行う、端子圧着状態良否判別装置。
The terminal crimping state quality determination device according to claim 1,
The crimping pass / fail judgment part is
Crimping quality determination is performed based on the degree of correlation between the pressure waveform and a predetermined reference waveform in a predetermined crimping initial period, and crimping quality is determined based on the degree of correlation between the pressure waveform and a predetermined reference waveform in a predetermined crimping end period. Further, as a value according to the pressure change rate in a predetermined pressure range between the pressure range of the reference waveform in the predetermined crimping initial period and the pressure range of the reference waveform in the predetermined crimping final period The terminal crimping state determination is performed by comparing the obtained reference physical quantity with the physical quantity obtained as a value corresponding to the pressure change speed in the predetermined pressure range based on the pressure waveform. apparatus.
端子圧着を行う一対の圧着型と、
前記一対の圧着型を相対的に接近及び離隔移動させる圧着駆動部と、
前記一対の圧着型に設けられ、端子圧着に伴う圧力波形を検出する圧力検出部と、
請求項1〜請求項4のいずれかに記載の端子圧着状態良否判別装置と、
を備える端子圧着加工装置。
A pair of crimping dies for terminal crimping;
A crimp driving unit that relatively moves the pair of crimping molds closer to and away from each other; and
A pressure detector provided in the pair of crimping molds to detect a pressure waveform associated with terminal crimping;
The terminal crimping state pass / fail discrimination device according to any one of claims 1 to 4,
A terminal crimping apparatus comprising:
端子の圧着良否判別を行う端子圧着状態良否判別方法であって、
(a)端子圧着に伴って検出される圧力波形に基づいて圧力変化速度に応じた物理量を求めるステップと、
(b)前記物理量に基づいて圧着良否判別を行うステップと、
を備える端子圧着状態良否判別方法。
A method for determining whether or not a terminal is crimped to determine whether or not the terminal is crimped.
(A) obtaining a physical quantity according to the pressure change rate based on a pressure waveform detected along with terminal crimping;
(B) a step of performing the crimping quality determination based on the physical quantity;
A terminal crimping state quality determination method comprising:
端子圧着に際して検出される圧力波形に基づいて端子の圧着良否判別を行うための端子圧着状態良否判別プログラムであって、コンピュータに、
(a)端子圧着に伴って検出される圧力波形に基づいて圧力変化速度に応じた物理量を求める処理と、
(b)前記物理量に基づいて圧着良否判別を行う処理と、
を実現させるための端子圧着状態良否判別プログラム。
A terminal crimping state pass / fail determination program for determining whether or not a terminal is crimped based on a pressure waveform detected at the time of terminal crimping.
(A) a process for obtaining a physical quantity according to the pressure change speed based on a pressure waveform detected along with terminal crimping;
(B) a process of determining whether the crimping is good or bad based on the physical quantity;
Terminal crimping condition pass / fail judgment program for realizing
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015212635A (en) * 2014-05-01 2015-11-26 三菱電機株式会社 Threshold waveform creation device
CN109655242A (en) * 2017-10-10 2019-04-19 中国商用飞机有限责任公司 For detecting the method and apparatus for the reliability that harness is connect with termination case

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0927378A (en) * 1995-07-13 1997-01-28 Yazaki Corp Detecting device of wire terminal crimp failure
JP2002352931A (en) * 2001-03-19 2002-12-06 Yazaki Corp Terminal pressure contact state determining method
JP2005131690A (en) * 2003-10-31 2005-05-26 True Soltec Kk Device for detecting defective press-contact of terminal

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0927378A (en) * 1995-07-13 1997-01-28 Yazaki Corp Detecting device of wire terminal crimp failure
JP2002352931A (en) * 2001-03-19 2002-12-06 Yazaki Corp Terminal pressure contact state determining method
JP2005131690A (en) * 2003-10-31 2005-05-26 True Soltec Kk Device for detecting defective press-contact of terminal

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015212635A (en) * 2014-05-01 2015-11-26 三菱電機株式会社 Threshold waveform creation device
CN109655242A (en) * 2017-10-10 2019-04-19 中国商用飞机有限责任公司 For detecting the method and apparatus for the reliability that harness is connect with termination case

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