JP2009531675A5 - - Google Patents

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Publication number
JP2009531675A5
JP2009531675A5 JP2009501869A JP2009501869A JP2009531675A5 JP 2009531675 A5 JP2009531675 A5 JP 2009531675A5 JP 2009501869 A JP2009501869 A JP 2009501869A JP 2009501869 A JP2009501869 A JP 2009501869A JP 2009531675 A5 JP2009531675 A5 JP 2009531675A5
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JP
Japan
Prior art keywords
scale
carrier
electrode
voltage
electrodes
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JP2009501869A
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English (en)
Japanese (ja)
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JP4982554B2 (ja
JP2009531675A (ja
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Priority claimed from PCT/EP2007/000404 external-priority patent/WO2007112796A1/de
Publication of JP2009531675A publication Critical patent/JP2009531675A/ja
Publication of JP2009531675A5 publication Critical patent/JP2009531675A5/ja
Application granted granted Critical
Publication of JP4982554B2 publication Critical patent/JP4982554B2/ja
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JP2009501869A 2006-03-29 2007-01-18 担持体にスケールを保持するための方法ならびに担持体とスケールを備えた組立体 Active JP4982554B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102006014789.8 2006-03-29
DE102006014789 2006-03-29
PCT/EP2007/000404 WO2007112796A1 (de) 2006-03-29 2007-01-18 Verfahren zum halten eines massstabs an einem träger sowie anordnung mit einem träger und einem massstab

Publications (3)

Publication Number Publication Date
JP2009531675A JP2009531675A (ja) 2009-09-03
JP2009531675A5 true JP2009531675A5 (https=) 2012-03-29
JP4982554B2 JP4982554B2 (ja) 2012-07-25

Family

ID=37891991

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009501869A Active JP4982554B2 (ja) 2006-03-29 2007-01-18 担持体にスケールを保持するための方法ならびに担持体とスケールを備えた組立体

Country Status (5)

Country Link
US (1) US7549234B2 (https=)
EP (1) EP2002216B1 (https=)
JP (1) JP4982554B2 (https=)
CN (1) CN101416031A (https=)
WO (1) WO2007112796A1 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7707739B2 (en) * 2005-11-04 2010-05-04 Dr. Johannes Heidenhain Gmbh Method for attaching a scale to a carrier, a scale, and carrier having a scale
DE102008043353A1 (de) * 2008-10-31 2010-05-06 Dr. Johannes Heidenhain Gmbh Längenmesseinrichtung
JP5162800B2 (ja) * 2009-03-24 2013-03-13 株式会社ミツトヨ リニアスケール
DE102009044917A1 (de) * 2009-09-23 2011-04-07 Dr. Johannes Heidenhain Gmbh Längenmesseinrichtung
DE102009047120A1 (de) * 2009-11-25 2011-05-26 Dr. Johannes Heidenhain Gmbh Anordnung mit einem an einem Träger befestigten Maßstab
DE102011079446A1 (de) 2011-07-20 2013-02-07 Robert Bosch Gmbh Sensoreinrichtung, insbesondere für die Verwendung in einem Kraftfahrzeug
CN103322900B (zh) * 2013-06-21 2016-02-03 深圳市华星光电技术有限公司 一种靶材的刻蚀量测装置及量测方法
TWI656596B (zh) * 2014-08-26 2019-04-11 Asml Holding N. V. 靜電夾具及其製造方法
DE102016201088A1 (de) * 2016-01-26 2017-07-27 Dr. Johannes Heidenhain Gmbh Verfahren zum Bearbeiten einer Maßverkörperung
DE102019206523A1 (de) 2019-05-07 2020-11-12 Zf Friedrichshafen Ag Leistungsmodul mit gehäusten Leistungshalbleitern zur steuerbaren elektrischen Leistungsversorgung eines Verbrauchers
EP3892962B1 (de) 2020-04-08 2023-03-08 Dr. Johannes Heidenhain GmbH Anordnung für eine positionsmessung
WO2023076359A1 (en) * 2021-10-28 2023-05-04 Entegris, Inc. Electrostatic chuck that includes upper ceramic layer that includes a dielectric layer, and related methods and structures

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3635511A1 (de) * 1986-10-18 1988-04-28 Zeiss Carl Fa Halterung fuer mass- und formverkoerperung
EP0288613A1 (en) 1987-05-01 1988-11-02 Agfa-Gevaert N.V. Electrostatic holder
JPH0814485B2 (ja) * 1988-01-25 1996-02-14 株式会社ミツトヨ スケール精度測定装置及び測定方法
DE3929629A1 (de) * 1989-09-06 1991-03-07 Zeiss Carl Fa Laengen- oder winkelmesseinrichtung
DE19512892C2 (de) * 1995-04-06 1998-11-05 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
US5838529A (en) * 1995-12-22 1998-11-17 Lam Research Corporation Low voltage electrostatic clamp for substrates such as dielectric substrates
DE19854318A1 (de) * 1998-11-25 2000-05-31 Heidenhain Gmbh Dr Johannes Längenmeßeinrichtung
US6772531B1 (en) * 1999-11-30 2004-08-10 Renishaw Plc Measurement apparatus including a track for a measurement scale and apparatus for tensioning the scale
US7289212B2 (en) 2000-08-24 2007-10-30 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method and device manufacturing thereby
JP2003036573A (ja) * 2001-07-26 2003-02-07 Pioneer Electronic Corp ディスク原盤製造装置
US6867377B2 (en) * 2000-12-26 2005-03-15 Emcore Corporation Apparatus and method of using flexible printed circuit board in optical transceiver device
DE10153147A1 (de) 2001-10-27 2003-05-08 Zeiss Carl Verfahren zum Aufbringen eines Maßstabes auf einen Träger
US6754062B2 (en) * 2002-02-27 2004-06-22 Praxair S.T. Technology, Inc. Hybrid ceramic electrostatic clamp
JP4024600B2 (ja) * 2002-06-25 2007-12-19 株式会社ミツトヨ 枠多点固定タイプのユニット型直線変位測定装置、及び、その固定方法
US8043797B2 (en) * 2004-10-12 2011-10-25 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7196770B2 (en) * 2004-12-07 2007-03-27 Asml Netherlands B.V. Prewetting of substrate before immersion exposure
WO2007008792A2 (en) * 2005-07-08 2007-01-18 Nexgensemi Holdings Corporation Apparatus and method for controlled particle beam manufacturing
US7707739B2 (en) * 2005-11-04 2010-05-04 Dr. Johannes Heidenhain Gmbh Method for attaching a scale to a carrier, a scale, and carrier having a scale
US7804582B2 (en) * 2006-07-28 2010-09-28 Asml Netherlands B.V. Lithographic apparatus, method of calibrating a lithographic apparatus and device manufacturing method

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