JP2009294174A - Gas sampling device - Google Patents

Gas sampling device Download PDF

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JP2009294174A
JP2009294174A JP2008150577A JP2008150577A JP2009294174A JP 2009294174 A JP2009294174 A JP 2009294174A JP 2008150577 A JP2008150577 A JP 2008150577A JP 2008150577 A JP2008150577 A JP 2008150577A JP 2009294174 A JP2009294174 A JP 2009294174A
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gas
furnace
sampling
dust
cooling
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JP4983731B2 (en
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Naoki Sato
直樹 佐藤
Kazuo Minami
和夫 南
Yosuke Fujita
洋介 藤田
Hiroshi Yamazaki
比呂志 山崎
Yaichi Yoneda
彌一 米田
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Nippon Steel Corp
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Sumitomo Metal Industries Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To prevent a cooling tube from being clogged, even when collected sampling gas contains high-concentration dust. <P>SOLUTION: This gas sampling device is a device installed on a furnace wall of a metallurgical furnace, for sampling furnace gas. When being installed on the furnace wall, the device is constituted by integrating in a body: a water cooling probe 1 whose tip part is positioned over the furnace outside from the furnace wall inner surface; a dust collector 2 connected to the base end side positioned out of the furnace of the water cooling probe 1, for removing coarse particulate dust from sampling gas collected from the tip of the water cooling probe 1; and a cooling device 3 arranged on the downstream side of the dust collector 2, for cooling the sampling gas from which the coarse particulate dust is removed. Since the dust collector is arranged on the upstream side of the cooling device, clogging of the cooling tube is not generated, even when the collected gas contains high-concentration dust. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、高炉等の冶金炉の炉壁に設置され、高濃度のダストを含有する高温の炉内ガスをサンプリングする装置に関するものである。   The present invention relates to an apparatus for sampling a high-temperature furnace gas containing a high concentration of dust, which is installed on a furnace wall of a metallurgical furnace such as a blast furnace.

この種のサンプリング装置によってサンプリングされた、燃焼炉の排気ガス(以下、排ガスと略す。)や高炉の炉内ガスなどの高温で高濃度のダストを含有するガスは、成分分析に供される場合が多い。   Gases containing high-concentration dust at high temperatures, such as combustion furnace exhaust gas (hereinafter abbreviated as exhaust gas) and blast furnace furnace gas, sampled by this type of sampling device, are used for component analysis There are many.

しかしながら、サンプリングした前記ガスは、高温で高濃度のダストを含有するので、サンプリングした状態のままでは成分分析を行うことができず、冷却してガス温度を下げるのと共に、ガス中のダストを除去する必要がある。そのためには、サンプリングガスの冷却や除塵等の処理を事前に行う装置を併設する必要があり、自ずと装置自体が大掛かりになる。   However, because the sampled gas contains high-concentration dust at high temperatures, component analysis cannot be performed in the sampled state, and the gas temperature is lowered by cooling and dust in the gas is removed. There is a need to. For this purpose, it is necessary to install a device for performing sampling gas cooling, dust removal, and the like in advance, and the device itself becomes large.

例えば、石炭燃焼用ボイラーから排出される燃焼排ガス中のSO2、NOx、CO2、COなどの成分を連続分析するために、ガス採取部より採取した燃焼排ガスに含まれる粉塵や煤塵をサイクロンによって分離除去する装置が、特許文献1、2に開示されている。
特開平8−254486号公報 特開平9−311098号公報
For example, in order to continuously analyze components such as SO 2 , NOx, CO 2 , and CO in combustion exhaust gas discharged from a coal combustion boiler, the dust and soot contained in the combustion exhaust gas collected from the gas sampling unit are collected by a cyclone. Devices for separating and removing are disclosed in Patent Documents 1 and 2.
JP-A-8-254486 JP-A-9-311098

しかしながら、冶金炉においては、高炉下部のように1000℃を超える高温ガスの吸引を行う場合もあり、その場合には、ガス採取部を保護するために冷却が必要となる。従って、高温で高濃度のダストを含有する炉内ガスをサンプリングする装置として、特許文献1、2で開示された技術を適用することは困難である。   However, in the metallurgical furnace, there is a case where high temperature gas exceeding 1000 ° C. is sucked as in the lower part of the blast furnace, and in that case, cooling is required to protect the gas sampling part. Therefore, it is difficult to apply the techniques disclosed in Patent Documents 1 and 2 as an apparatus for sampling a furnace gas containing high-temperature and high-concentration dust.

また、高炉でのガス成分測定装置において、サイクロン式除塵機を用いたガスサンプリング装置が、特許文献3に開示されている。
実開平2−95835号公報
In addition, in a gas component measuring apparatus in a blast furnace, a gas sampling apparatus using a cyclone dust remover is disclosed in Patent Document 3.
Japanese Utility Model Publication 2-95835

しかしながら、特許文献3で開示された装置には、サンプリングガスの冷却器が設けられていないため、高炉ガスのような高温のガスをサンプリングする場合には、サンプルガス供給管自体がガス温度にまで熱せられて破損に至る場合がある。破損を防ぐためには、サンプルガス供給管自体を長距離に亘って冷却する必要があり、さらに大掛かりな設備になる。   However, since the apparatus disclosed in Patent Document 3 is not provided with a sampling gas cooler, when sampling a high-temperature gas such as a blast furnace gas, the sample gas supply pipe itself reaches the gas temperature. May be damaged by heating. In order to prevent breakage, it is necessary to cool the sample gas supply pipe itself over a long distance, resulting in a larger facility.

これらの問題を解決するために、出願人は、高炉内の高温かつ高濃度ダストを含むガスをサンプリングする装置を特許文献4で提案した。この装置は、高炉内からの高温ガス採取部、冷却器、除塵器を、それぞれに関して機能を保持しながら、かつ一体構造の装置とすることで、省スペース化を図っている。
特開2006−249501号公報
In order to solve these problems, the applicant has proposed an apparatus for sampling a gas containing high-temperature and high-concentration dust in a blast furnace in Patent Document 4. This device saves space by making the high-temperature gas sampling unit, the cooler, and the dust remover from the blast furnace into an integrated structure while maintaining the functions of each.
JP 2006-249501 A

この特許文献4で提案した装置は、高温雰囲気から保護するため、ガス採取部を冷却しており、さらにサンプリングガス自体を冷却する冷却器も備えている。そして、これらをコンパクトな一体構造とすることで、採取されたサンプリングガスはガス採取部近傍でも冷却されて低温でガス分析計に送ることができるため、ガス分析計までのガス供給管が破損する心配は少なくなる。   The device proposed in Patent Document 4 cools the gas sampling unit in order to protect it from a high temperature atmosphere, and further includes a cooler that cools the sampling gas itself. And by making these into a compact integrated structure, the collected sampling gas is cooled even in the vicinity of the gas sampling section and can be sent to the gas analyzer at a low temperature, so the gas supply pipe to the gas analyzer is damaged. There is less worry.

しかしながら、特許文献4の装置でも、高炉の炉下部のように溶融物の存在が多くなる部位で使用する際には、ガス採取部に侵入した炉内の滴下溶融スラグが急冷されて固化し、ガス採取部を閉塞してしまうという問題が生じる場合がある。また、ガス採取部、冷却器、除塵器の順に配置されているため、採取されたサンプリングガスが高濃度ダストを含む場合、螺旋状の冷却管が詰まってしまう場合もある。   However, even in the apparatus of Patent Document 4, when used at a site where the presence of the melt increases like the lower part of the blast furnace, the dropped molten slag in the furnace that has entered the gas sampling part is rapidly cooled and solidified. There may be a problem that the gas sampling unit is blocked. Further, since the gas sampling unit, the cooler, and the dust remover are arranged in this order, when the collected sampling gas contains high-concentration dust, the spiral cooling pipe may be clogged.

ガス採取部の閉塞や冷却管の詰りが発生した際には、炉を停機している状態であっても、装置を取り付けた状態のまま内部を掃除する手立てがなく、装置一式を取外して詰りを除去しなければならないといったメンテナンス性の問題もある。   When the gas sampling unit is clogged or the cooling pipe is clogged, even if the furnace is stopped, there is no way to clean the inside with the equipment attached, and the set of equipment is removed and clogged. There is also a problem of maintainability that must be removed.

本発明が解決しようとする問題点は、以下の点である。
(1)冷却器は除塵器の上流に配置されているので、採取されたサンプリングガスが高濃度ダストを含む場合、螺旋状の冷却管が詰まる場合がある。冷却器は本体と一体であるため、冷却管が詰まった際にはこれを取除くことが困難、もしくは不可能である。
The problems to be solved by the present invention are as follows.
(1) Since the cooler is arranged upstream of the dust remover, when the collected sampling gas contains high-concentration dust, the spiral cooling pipe may be clogged. Since the cooler is integral with the main body, it is difficult or impossible to remove the cooling pipe when it is clogged.

(2)高炉の炉下部のように溶融物が多い部位での使用は、ガス採取部に侵入した滴下溶融スラグが急冷されて固化し、ガス採取部が閉塞してサンプリングガスの流量不足や測定不可能に至る場合がある。ガス採取部は内部で螺旋状の冷却管へと直結されているので、閉塞した場合、この閉塞を取り除くことは困難、もしくは不可能である。 (2) Use in a part where there is a lot of melt, such as in the lower part of a blast furnace, the dripped molten slag that has penetrated into the gas sampling part is rapidly cooled and solidified, and the gas sampling part is closed and the sampling gas flow rate is insufficient. It may be impossible. Since the gas sampling section is directly connected to the spiral cooling pipe inside, it is difficult or impossible to remove this blockage when blocked.

本発明のガスサンプリング装置は、
採取したサンプリングガスが高濃度ダストを含む場合であっても冷却管を詰まらせないようにするために、
冶金炉の炉壁への設置時、先端部が炉壁内面から炉外側に亘って位置する水冷プローブと、
この水冷プローブの炉外に位置する基端側に接続され、水冷プローブの先端より採取されたサンプリングガスから粗粒ダストを取り除く除塵器と、
この除塵器の下流側に配置され、前記粗粒ダストが取り除かれたサンプリングガスを冷却する冷却装置と、
が一体として構成されていることを最も主要な特徴としている。
The gas sampling device of the present invention comprises:
In order not to clog the cooling pipe even if the collected sampling gas contains high concentration dust,
When installing the metallurgical furnace on the furnace wall, a water-cooled probe whose tip is located from the furnace wall inner surface to the furnace outer side,
A dust remover that is connected to the proximal end located outside the furnace of the water-cooled probe and removes coarse dust from the sampling gas collected from the tip of the water-cooled probe;
A cooling device that is disposed downstream of the dust remover and cools the sampling gas from which the coarse dust has been removed;
The main feature is that it is configured as a single unit.

本発明のガスサンプリング装置において、前記水冷プローブの先端部の管内径を20mm以上とした場合には、ガス採取部に侵入した炉内の滴下溶融スラグが固化した場合であっても、水冷プローブを閉塞させることがない。   In the gas sampling device of the present invention, when the pipe inner diameter of the tip of the water-cooled probe is 20 mm or more, the water-cooled probe can be used even when the molten dripping slag in the furnace that has entered the gas sampling section is solidified. There is no blockage.

また、本発明のガスサンプリング装置において、前記水冷プローブを、前記除塵器の横断面における中心より外周側の位置に接続させた場合には、除塵器の内部でサイクロンが発生し、サンプリングガスに含まれる粗粒ダストを効率良く除去できるようになる。   In the gas sampling device of the present invention, when the water-cooled probe is connected to a position on the outer peripheral side from the center in the cross section of the dust remover, a cyclone is generated inside the dust remover and is included in the sampling gas. Coarse grain dust can be efficiently removed.

また、本発明のガスサンプリング装置において、前記冷却装置が、直管からなる冷却管を多数備えた構成で、前記除塵器と反対の側に取り外しが可能な蓋を設けたものとした場合は、冷却機の内部の掃除が可能になる。その際、直管からなる冷却管は、個別に取外すことが出来、単体での取り替えを可能とすることが望ましい。   Further, in the gas sampling device of the present invention, when the cooling device is provided with a number of cooling tubes made of straight pipes and provided with a removable lid on the side opposite to the dust remover, The inside of the cooler can be cleaned. At that time, it is desirable that the cooling pipe made of a straight pipe can be removed individually and replaced as a single unit.

また、本発明のガスサンプリング装置において、前記水冷プローブの下流側に清掃用配管を備えるようにすれば、この清掃用配管を介して炉外側から水冷プローブ内の掃除を容易に行うことができる。   In the gas sampling device of the present invention, if a cleaning pipe is provided on the downstream side of the water-cooled probe, the inside of the water-cooled probe can be easily cleaned from the outside of the furnace via the cleaning pipe.

本発明では、冷却装置の上流側に除塵器を配置したので、採取されたガスが高濃度ダストを含む場合であっても、冷却管の閉塞を発生させることがない。   In the present invention, since the dust remover is arranged on the upstream side of the cooling device, the cooling pipe is not blocked even if the collected gas contains high-concentration dust.

以下、本発明を実施するための最良の形態について、添付図面を用いてさらに詳細に説明する。
本発明例では、高炉の炉下部であるボッシュ(朝顔)部からシャフト(炉胸)下部の1箇所ないし数箇所において、高炉炉内からガスを採取する場合について説明する。
Hereinafter, the best mode for carrying out the present invention will be described in more detail with reference to the accompanying drawings.
In the present invention example, a case will be described in which gas is sampled from the blast furnace at one or several places below the shaft (furnace chest) from the Bosch (morning glory) part, which is the lower part of the blast furnace.

高炉炉内から採取するガスは、高温(1000〜1200℃)で、かつ、高圧(150〜400kPa)であり、連続的に採取するためには、冷却装置が必須である。
従って、本発明のガスサンプリング装置は、図1〜図4に示すような装置構成を採用している。
The gas collected from the blast furnace is high temperature (1000 to 1200 ° C.) and high pressure (150 to 400 kPa), and a cooling device is essential for continuous collection.
Therefore, the gas sampling apparatus of the present invention employs an apparatus configuration as shown in FIGS.

図1において、1は炉外側から炉壁に差込まれて固定配置されるプローブであり、中央部は空洞(以下、中央空洞部1aという。)で、この中央空洞部1aの外周部1bに通水して水冷する構造となっている。プローブ1の材質は特に限定するものではないが、冷却性能を確保できる銅または銅合金製が望ましい。   In FIG. 1, reference numeral 1 denotes a probe that is fixedly placed by being inserted into the furnace wall from the outside of the furnace. A central part is a cavity (hereinafter referred to as a central cavity part 1 a), and an outer peripheral part 1 b of the central cavity part 1 a is provided. It is structured to pass water and cool. The material of the probe 1 is not particularly limited, but is preferably made of copper or a copper alloy that can ensure cooling performance.

このプローブ1における中央空洞部1aの内径は、プローブ1に例えば炉内の滴下溶融スラグが侵入して固化した場合でも、プローブ1の中央空洞部1aを閉塞しないように、例えば20mm以上となされている。   The inner diameter of the central cavity portion 1a in the probe 1 is set to, for example, 20 mm or more so as not to block the central cavity portion 1a of the probe 1 even when dripped molten slag in the furnace enters the probe 1 and solidifies. Yes.

前記プローブ1の先端から採取された炉内のガス(サンプリングガス)は、プローブ1の中央空洞部1aを通過して除塵器2に導入される。この除塵器2として、添付図面に示した発明例では、サイクロン式のものを示している。   The gas in the furnace (sampling gas) collected from the tip of the probe 1 passes through the central cavity 1 a of the probe 1 and is introduced into the dust remover 2. As the dust remover 2, in the invention example shown in the accompanying drawings, a cyclone type is shown.

すなわち、プローブ1の先端から採取されたサンプリングガスは、図2に示すように、除塵器2を水平に横断して見た場合に、中心ではなく、中心より外周側の位置に導入される。このような構成とすることで、ガス流速の低下と相俟って、サンプリングガス中に含まれる粗粒ダストを効率良く沈降して除去することができる。   That is, the sampling gas collected from the tip of the probe 1 is introduced not at the center but at the outer peripheral side from the center when viewed horizontally across the dust remover 2 as shown in FIG. By adopting such a configuration, it is possible to efficiently settle and remove coarse dust contained in the sampling gas in combination with a decrease in the gas flow rate.

粗粒ダストを除去した後のサンプリングガスは、除塵器2の下流側に配置された冷却装置3に導かれて冷却される。発明例では、メンテナンス性を考慮して、直管からなる冷却管3aを多数備えた構成の冷却装置3を設けている。   The sampling gas after removing the coarse dust is guided to the cooling device 3 arranged on the downstream side of the dust remover 2 to be cooled. In the example of the invention, in consideration of maintainability, the cooling device 3 having a large number of cooling pipes 3a made of straight pipes is provided.

このように粗粒ダストが取り除かれ、かつ冷却されたサンプリングガスは、冷却装置3を出た後、更にフィルターを通過させて微細なダストを取り除いた後にガス分析計に導入される。   After the coarse dust has been removed and cooled, the sampling gas is introduced into the gas analyzer after leaving the cooling device 3 and passing through a filter to remove fine dust.

ところで、発明例では、冷却装置3の、前記除塵器2と反対の側に、図3に示すように、取り外しが可能な蓋3bを設けている。このような構成とすれば、この蓋3bを開放することで、図4に示すように、清掃用ノズル4aにより、多数の冷却管3aの内部を個別に清掃でき、また、交換が必要な時には、冷却装置3を単体で取り替えることができる。   By the way, in the example of an invention, as shown in FIG. 3, the cover 3b which can be removed is provided in the side opposite to the said dust remover 2 of the cooling device 3. As shown in FIG. With this configuration, by opening the lid 3b, the interior of the multiple cooling pipes 3a can be individually cleaned by the cleaning nozzle 4a as shown in FIG. The cooling device 3 can be replaced as a single unit.

また、発明例では、図2に示すように、前記除塵器2におけるプローブ1の連結部と相対する位置にも清掃用配管5を設けている。このような構成では、図4に示すように、この配管5の蓋5aをとって清掃用ノズル4bを挿入すれば、炉外側からプローブ1の中央空洞部1aの清掃を行うことができる。   In the example of the invention, as shown in FIG. 2, a cleaning pipe 5 is also provided at a position facing the connecting portion of the probe 1 in the dust remover 2. In such a configuration, as shown in FIG. 4, the central cavity 1 a of the probe 1 can be cleaned from the outside of the furnace by removing the cover 5 a of the pipe 5 and inserting the cleaning nozzle 4 b.

5aaは前記蓋5aに設けられた栓部材であり、サンプリング時にプローブ1から除塵器2に導入されたガスが清掃用配管5に侵入しないように、清掃用配管5の除塵器2との接続側に挿入されるものである。なお、この栓部材5aaの先端面の形状は、図2に示すように、除塵器2の内周面と同じ形状とすることが望ましい。   5aa is a plug member provided on the lid 5a, and the side of the cleaning pipe 5 connected to the dust remover 2 so that the gas introduced from the probe 1 into the dust remover 2 does not enter the cleaning pipe 5 during sampling. Is to be inserted. In addition, as for the shape of the front end surface of this plug member 5aa, it is desirable to make it the same shape as the internal peripheral surface of the dust remover 2, as shown in FIG.

以下、本発明の効果を確認するために、図1に示したサンプリング装置を使用して、90日間連続使用した時の、冷却管3aの閉塞性を確認した。比較として、出願人が特許文献4で提案した従来のサンプリング装置を使用した場合についても冷却管の閉塞性を確認した。その結果を下記表1に示す。   Hereinafter, in order to confirm the effect of the present invention, using the sampling device shown in FIG. 1, the obstruction of the cooling pipe 3 a when used continuously for 90 days was confirmed. As a comparison, the obstruction of the cooling pipe was also confirmed when the conventional sampling device proposed by the applicant in Patent Document 4 was used. The results are shown in Table 1 below.

Figure 2009294174
Figure 2009294174

表1に示すように、本発明では冷却前に除塵するので、従来と異なり、90日間の連続使用の間、粗粒ダストによる冷却管3aの詰まりは皆無であった。また、プローブ1の中央空洞部1aの内径を20mm以上とした場合は、滴下溶融スラグの侵入固化によるプローブ1の閉塞が無いことも確認でき、中央空洞部1aの内径を16mmとした場合においても軽微な閉塞により吸引量が低下する場合はあったが、いずれの場合も安定的にサンプリングを継続することができた。   As shown in Table 1, since dust is removed before cooling in the present invention, unlike the conventional case, there was no clogging of the cooling pipe 3a due to coarse dust during continuous use for 90 days. Further, when the inner diameter of the central cavity 1a of the probe 1 is set to 20 mm or more, it can be confirmed that the probe 1 is not blocked by the intrusion and solidification of the dripping molten slag, and even when the inner diameter of the central cavity 1a is set to 16 mm. Although there was a case where the suction amount decreased due to slight blockage, sampling could be continued stably in any case.

また、定期休風時にプローブ1内で固化したスラグを確認したが閉塞には至っておらず、蓋5aを取り外して容易に除去することが出来た。   Moreover, although the solidified slag was confirmed in the probe 1 during the periodical break, it was not closed and could be easily removed by removing the lid 5a.

このように、本発明では、プローブ1の閉塞や冷却管3aの詰りを改善することができるので、メンテナンスに要する時間の短縮も可能となり、測定頻度を増加することが可能になる。   As described above, according to the present invention, since the blockage of the probe 1 and the clogging of the cooling pipe 3a can be improved, the time required for maintenance can be shortened, and the measurement frequency can be increased.

本発明は上記の最良の形態例に限らず、各請求項に記載された技術的思想の範囲内で、適宜実施の形態を変更しても良いことは言うまでもない。   It goes without saying that the present invention is not limited to the above-described best embodiment, and that the embodiment may be appropriately changed within the scope of the technical idea described in each claim.

本発明は、ボッシュ部からシャフト下部の範囲のみならず、他の部位に設置してガスを採取する場合にも適用できる。   The present invention can be applied not only to the range from the Bosch part to the lower part of the shaft, but also when collecting gas by installing in other parts.

本発明のガスサンプリング装置の側面図である。It is a side view of the gas sampling device of the present invention. 図1のA−A断面図である。It is AA sectional drawing of FIG. 本発明のガスサンプリング装置の図である。It is a figure of the gas sampling apparatus of this invention. 本発明のガスサンプリング装置の冷却装置の上部に設けた蓋を開放し、冷却装置の多管直管内とプローブの清掃を行っている状態を示した図である。It is the figure which showed the state which open | released the cover provided in the upper part of the cooling device of the gas sampling device of this invention, and is cleaning the inside of the multi-tube straight pipe | tube of a cooling device, and a probe.

符号の説明Explanation of symbols

1 プローブ
1a 中央空洞部
2 除塵器
3 冷却装置
3a 冷却管
3b 蓋
5 清掃用配管
DESCRIPTION OF SYMBOLS 1 Probe 1a Central cavity part 2 Dust remover 3 Cooling device 3a Cooling pipe 3b Cover 5 Cleaning piping

Claims (6)

冶金炉の炉壁に設置して炉内ガスをサンプリングする装置であって、
前記炉壁への設置時、先端部が炉壁内面から炉外側に亘って位置する水冷プローブと、
この水冷プローブの炉外に位置する基端側に接続され、水冷プローブの先端より採取されたサンプリングガスから粗粒ダストを取り除く除塵器と、
この除塵器の下流側に配置され、前記粗粒ダストが取り除かれたサンプリングガスを冷却する冷却装置と、
が一体として構成されていることを特徴とするガスサンプリング装置。
A device that is installed on the furnace wall of a metallurgical furnace and samples the gas in the furnace,
When installed on the furnace wall, a water-cooled probe whose tip is located from the furnace wall inner surface to the furnace outer side,
A dust remover that is connected to the proximal end located outside the furnace of the water-cooled probe and removes coarse dust from the sampling gas collected from the tip of the water-cooled probe;
A cooling device that is disposed downstream of the dust remover and cools the sampling gas from which the coarse dust has been removed;
A gas sampling device characterized in that is configured as a single unit.
前記水冷プローブは、先端部の管内径が20mm以上であることを特徴とする請求項1に記載のガスサンプリング装置。   The gas sampling apparatus according to claim 1, wherein the water-cooled probe has a tube inner diameter of 20 mm or more at a distal end portion. 前記水冷プローブは、前記除塵器の横断面における中心より外周側の位置に接続されていることを特徴とする請求項1又は2に記載のガスサンプリング装置。   The gas sampling apparatus according to claim 1 or 2, wherein the water-cooled probe is connected to a position on the outer peripheral side from the center in the cross section of the dust remover. 前記冷却装置は、直管からなる冷却管を多数備えた構成で、前記除塵器と反対の側に取り外しが可能な蓋を設けたものであることを特徴とする請求項1〜3の何れかに記載のガスサンプリング装置。   The said cooling device is a structure provided with many cooling pipes which consist of a straight pipe | tube, and provided with the lid | cover which can be removed on the opposite side to the said dust remover, The any one of Claims 1-3 characterized by the above-mentioned. The gas sampling device described in 1. 前記直管からなる冷却管は、個別に取り外すことが出来、単体での取り替えが可能であることを特徴とする請求項4に記載のガスサンプリング装置。   The gas sampling device according to claim 4, wherein the cooling pipe made of the straight pipe can be removed individually and can be replaced alone. 前記水冷プローブの下流側に清掃用配管を備えたことを特徴とする請求項1〜5の何れかに記載のガスサンプリング装置。   The gas sampling device according to claim 1, further comprising a cleaning pipe on a downstream side of the water-cooled probe.
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