JP2009253366A - Variable delay circuit - Google Patents

Variable delay circuit Download PDF

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JP2009253366A
JP2009253366A JP2008095186A JP2008095186A JP2009253366A JP 2009253366 A JP2009253366 A JP 2009253366A JP 2008095186 A JP2008095186 A JP 2008095186A JP 2008095186 A JP2008095186 A JP 2008095186A JP 2009253366 A JP2009253366 A JP 2009253366A
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delay
variable
unit
delay unit
circuit
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Hiroaki Katsurai
宏明 桂井
Jun Terada
純 寺田
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Nippon Telegraph and Telephone Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To continuously set fine delay time highly accurately in a wide variable width without being limited to the variable range of a variable load capacity in a simple and small-sized configuration. <P>SOLUTION: A variable delay circuit comprises: a delay part A and a delay part B connected in parallel between an input terminal and an output terminal, for outputting the input signals of the input terminal to the output terminal with delay time Ta and Tb (Ta>Tb) when operated alone respectively; and a current control part for inputting analog control signals X and Y, changing a current amount flowing to the delay part A and the delay part B correspondingly to the difference (X-Y), and setting the delay time continuously changing correspondingly to the difference (X-Y) between the delay time Ta and Tb. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、入力信号を遅延させ、かつ遅延時間を制御できる可変遅延回路に関する。   The present invention relates to a variable delay circuit capable of delaying an input signal and controlling a delay time.

光送受信システムでは、光伝送路の経路長差、波長分散等によるスキュー、半導体集積回路内における配線長差によるスキューなどを補償するために、入力信号やクロック信号に対して微小な遅延時間を高精度かつ広い可変幅で設定できる可変遅延回路が必要である。   In optical transmission / reception systems, a small delay time is increased for input signals and clock signals to compensate for differences in path lengths of optical transmission lines, skew due to wavelength dispersion, etc., and skew due to differences in wiring length in semiconductor integrated circuits. A variable delay circuit that can be set with high accuracy and a wide variable width is required.

図9は、従来の可変遅延回路の構成例を示す(非特許文献1)。
図において、従来の可変遅延回路は、インバータに可変負荷容量を接続した複数の遅延回路91をカスケードに接続し、各遅延回路91の出力をそれぞれ分岐してセレクタ92に入力し、その1つを選択して出力することにより、各遅延回路の容量値と遅延回路の段数に応じた遅延時間を設定する構成である。
P.Chen,et al.,"A Portable Digitally Controlled Oscillator Using Novel Varactors", IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-II:EXPRESS BRIEFS, VOL.52,NO.5,MAY 2005
FIG. 9 shows a configuration example of a conventional variable delay circuit (Non-Patent Document 1).
In the figure, in the conventional variable delay circuit, a plurality of delay circuits 91 each having a variable load capacitance connected to an inverter are connected in cascade, the outputs of the respective delay circuits 91 are branched and input to a selector 92, one of which is input. By selecting and outputting, the delay time according to the capacitance value of each delay circuit and the number of stages of the delay circuit is set.
P. Chen, et al., "A Portable Digitally Controlled Oscillator Using Novel Varactors", IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-II: EXPRESS BRIEFS, VOL.52, NO.5, MAY 2005

従来の可変遅延回路は、遅延回路の段数に応じて遅延時間の可変幅を広くとることができるが、各遅延回路の遅延時間が固定であれば、最小遅延幅は1つの遅延回路に設定される遅延時間に制限される。   The conventional variable delay circuit can take a wide variable range of the delay time according to the number of stages of the delay circuit, but if the delay time of each delay circuit is fixed, the minimum delay width is set to one delay circuit. The delay time is limited.

また、可変負荷容量を用いて遅延時間を設定する構成では、負荷容量の可変範囲に制限があるため、1段での可変幅が小さくなり、広い可変幅を得るためには多段に接続する必要があった。一方、1段で広い可変幅を得るためには大きな容量を用いればよいが、高速信号を扱う場合に波形が劣化する問題があった。さらに、遅延時間を高精度に制御するためには、回路構成が複雑になり、回路面積が増大する問題があった。   In addition, in the configuration in which the delay time is set using a variable load capacity, the variable range of the load capacity is limited, so that the variable width in one stage is small, and in order to obtain a wide variable width, it is necessary to connect in multiple stages. was there. On the other hand, a large capacity may be used to obtain a wide variable width in one stage, but there is a problem that the waveform deteriorates when a high-speed signal is handled. Furthermore, in order to control the delay time with high accuracy, there is a problem that the circuit configuration becomes complicated and the circuit area increases.

本発明は、簡単かつ小型な構成で、可変負荷容量の可変範囲に制限されることなく、微小な遅延時間を高精度かつ広い可変幅で連続的に設定することができる可変遅延回路を提供することを目的とする。   The present invention provides a variable delay circuit capable of continuously setting a minute delay time with high accuracy and a wide variable width without being limited to a variable range of a variable load capacitance with a simple and small configuration. For the purpose.

本発明の可変遅延回路は、入力端子と出力端子との間に並列に接続され、それぞれ単独動作させたときに入力端子の入力信号を遅延時間Ta ,Tb (Ta >Tb )で出力端子に出力する遅延部Aおよび遅延部Bと、アナログ制御信号X,Yを入力し、その差分(X−Y)に応じて遅延部Aおよび遅延部Bに流れる電流量を変化させ、遅延時間Ta ,Tb 間で差分(X−Y)に応じて連続的に変化する遅延時間を設定する電流制御部とを備える。   The variable delay circuit of the present invention is connected in parallel between an input terminal and an output terminal, and outputs the input signal of the input terminal to the output terminal with delay times Ta and Tb (Ta> Tb) when operated individually. The delay unit A and the delay unit B and the analog control signals X and Y are input, the amount of current flowing through the delay unit A and the delay unit B is changed according to the difference (X−Y), and the delay times Ta and Tb A current control unit that sets a delay time that continuously changes according to the difference (X−Y).

電流制御部は、ベースにアナログ制御信号X,Yを入力する2つのトランジスタのコレクタを遅延部Aおよび遅延部Bに接続し、共通エミッタを電流源に接続した構成である。   The current control unit has a configuration in which the collectors of two transistors that input analog control signals X and Y to the base are connected to the delay unit A and the delay unit B, and the common emitter is connected to the current source.

遅延部Aおよび遅延部Bの前段にそれぞれバッファ回路を接続し、各バッファ回路を介して入力端子と遅延部Aおよび遅延部Bを接続した構成としてもよい。   A buffer circuit may be connected to the preceding stage of the delay unit A and the delay unit B, and the input terminal, the delay unit A, and the delay unit B may be connected to each other through each buffer circuit.

遅延部Aに負荷容量を接続するか、遅延部Bにピーキング容量を接続するか、遅延部Bにピーキングコイルを接続し、遅延時間Ta ,Tb がTa >Tb となるように設定する構成としてもよい。   A configuration in which a load capacitor is connected to the delay unit A, a peaking capacitor is connected to the delay unit B, or a peaking coil is connected to the delay unit B, and the delay times Ta and Tb are set so that Ta> Tb is satisfied. Good.

本発明の可変遅延回路は、それぞれ固有の遅延時間Ta ,Tb (Ta >Tb )を有する遅延部Aおよび遅延部Bに流れる電流を、電流制御部を用いてアナログ制御信号X,Yの差分に応じて制御することにより、遅延時間Ta ,Tb の範囲内で連続的に遅延時間を変化させることができる。これにより、簡単かつ小型な構成で、微小な遅延時間を高精度かつ広い可変幅で連続的に可変させることができる。   In the variable delay circuit of the present invention, the current flowing through the delay unit A and the delay unit B having their own delay times Ta and Tb (Ta> Tb) is converted into the difference between the analog control signals X and Y using the current control unit. By controlling accordingly, the delay time can be continuously changed within the range of the delay times Ta and Tb. As a result, a minute delay time can be continuously varied with high accuracy and a wide variable width with a simple and small configuration.

(第1の実施形態)
図1は、本発明の可変遅延回路の第1の実施形態を示す。
図において、入力端子INと出力端子OUTとの間に、遅延部A11と遅延部B12が並列に接続される。遅延部A11と遅延部B12は、それぞれ固有の遅延時間Ta ,Tb (Ta >Tb )を有し、それぞれ単独動作させたときに入力端子の入力信号を遅延時間Ta ,Tb (Ta >Tb )で出力端子に出力する。遅延部A11と遅延部B12には電流制御部13が接続される。電流制御部13は、アナログ制御信号X,Yを入力し、その差分(X−Y)に応じて遅延部A11と遅延部B12に流れる電流量を変化させ、遅延時間Ta ,Tb 間で差分(X−Y)に応じて連続的に変化する遅延時間を設定する。
(First embodiment)
FIG. 1 shows a first embodiment of the variable delay circuit of the present invention.
In the figure, a delay unit A11 and a delay unit B12 are connected in parallel between an input terminal IN and an output terminal OUT. The delay unit A11 and the delay unit B12 have their own delay times Ta and Tb (Ta> Tb), and when they are operated independently, the input signals at the input terminals are delayed by the delay times Ta and Tb (Ta> Tb). Output to the output terminal. A current control unit 13 is connected to the delay unit A11 and the delay unit B12. The current control unit 13 receives the analog control signals X and Y, changes the amount of current flowing through the delay unit A11 and the delay unit B12 according to the difference (X−Y), and determines the difference between the delay times Ta and Tb ( A delay time that continuously changes in accordance with (XY) is set.

(第2の実施形態)
図2は、本発明の可変遅延回路の第2の実施形態を示す。
本実施形態の特徴は、第1の実施形態における遅延部A11と遅延部B12の前段にバッファ回路14,15を接続し、各バッファ回路14,15を介して入力端子INと遅延部A11および遅延部B12とを接続したところにある。これにより、並列接続される遅延部A11および遅延部B12の回路構成にかかわらず互いの干渉を回避することができる。
(Second Embodiment)
FIG. 2 shows a second embodiment of the variable delay circuit of the present invention.
A feature of the present embodiment is that buffer circuits 14 and 15 are connected in front of the delay unit A11 and the delay unit B12 in the first embodiment, and the input terminal IN, the delay unit A11, and the delay are connected via the buffer circuits 14 and 15, respectively. Part B12 is connected. Thereby, mutual interference can be avoided regardless of the circuit configurations of the delay unit A11 and the delay unit B12 connected in parallel.

(遅延部の構成例)
図3は、図1および図2に示す遅延部A11および遅延部B12の第1の構成例(基本構成)を示す。遅延部の基本構成は、差動トランジスタ回路を用いたバッファ回路であり、差動入力IN,INを差動トランジスタ21,22の各ベースに接続し、各コレクタから所定の遅延を有する差動出力OUT,OUTを取り出す構成である。
(Configuration example of delay unit)
FIG. 3 shows a first configuration example (basic configuration) of the delay unit A11 and the delay unit B12 shown in FIGS. The basic configuration of the delay unit is a buffer circuit using a differential transistor circuit, in which differential inputs IN and IN are connected to the bases of the differential transistors 21 and 22, and differential outputs having a predetermined delay from each collector. In this configuration, OUT and OUT are taken out.

図4に示す遅延部の第2の構成例は、図3のバッファ回路に負荷容量31,32を接続した構成である。その充放電時間に相当する立ち上がり時間Tr 、立ち下がり時間Tf の分だけ遅延時間が増加する。図5に示す遅延部の第3の構成例は、図3のバッファ回路にピーキング容量33を接続した構成である。ピーキング容量33は、Tr,Tf を減少させるように働くため、遅延時間が減少する。図6に示す遅延部の第3の構成例は、図3のバッファ回路にピーキングコイル34,35を接続した構成である。ピーキングコイル34,35も同様にTr,Tf を減少させるように働くため、遅延時間が減少する。   The second configuration example of the delay unit shown in FIG. 4 is a configuration in which load capacitors 31 and 32 are connected to the buffer circuit of FIG. The delay time increases by the rise time Tr and fall time Tf corresponding to the charge / discharge time. The third configuration example of the delay unit shown in FIG. 5 is a configuration in which a peaking capacitor 33 is connected to the buffer circuit of FIG. Since the peaking capacitor 33 works to reduce Tr and Tf, the delay time is reduced. The third configuration example of the delay unit shown in FIG. 6 is a configuration in which peaking coils 34 and 35 are connected to the buffer circuit of FIG. Similarly, the peaking coils 34 and 35 work to reduce Tr and Tf, so that the delay time is reduced.

この負荷容量31,32を用いた構成を遅延部A11とし、ピーキング容量33またはピーキングコイル34,35を用いた構成を遅延部B12として組み合わせることにより、それぞれに設定される固有の遅延時間Ta ,Tb について、Ta >Tb となるように設定することができる。さらに、負荷容量31,32、ピーキング容量33、ピーキングコイル34,35の各値を大きくすることにより、遅延時間Ta ,Tb をそれぞれ大きくし、可変遅延範囲を広げることができる。   By combining the configuration using the load capacitors 31 and 32 as the delay unit A11 and the configuration using the peaking capacitor 33 or the peaking coils 34 and 35 as the delay unit B12, the inherent delay times Ta and Tb set for the respective units. Can be set such that Ta> Tb. Furthermore, by increasing the values of the load capacitors 31 and 32, the peaking capacitor 33, and the peaking coils 34 and 35, the delay times Ta and Tb can be increased, respectively, and the variable delay range can be expanded.

(実施例構成)
図7は、本発明の可変遅延回路の実施例構成を示す。
図7において、本実施例構成の遅延部A11、遅延部B12、電流制御部13、バッファ回路14,15は、図2に示す第2の実施形態に対応する。また、遅延部A11は、図4に示す差動トランジスタ21,22と負荷容量31,32を用いた構成であり、遅延部B12は図5に示す差動トランジスタ23,24とピーキング容量33を用いた構成である。なお、遅延部B12のピーキング容量33は、図6に示すピーキングコイル34,35に代えてもよい。これにより、遅延部A11と遅延部B12の遅延時間Ta ,Tb は、Ta >Tb の関係になるように設定される。
(Example configuration)
FIG. 7 shows an embodiment of the variable delay circuit according to the present invention.
In FIG. 7, the delay unit A11, the delay unit B12, the current control unit 13, and the buffer circuits 14 and 15 of the configuration of the present embodiment correspond to the second embodiment shown in FIG. The delay unit A11 has a configuration using the differential transistors 21 and 22 and the load capacitors 31 and 32 shown in FIG. 4, and the delay unit B12 uses the differential transistors 23 and 24 and the peaking capacitor 33 shown in FIG. It was the composition that was. Note that the peaking capacitor 33 of the delay unit B12 may be replaced with the peaking coils 34 and 35 shown in FIG. As a result, the delay times Ta and Tb of the delay unit A11 and the delay unit B12 are set so that Ta> Tb.

電流制御部13は、差動トランジスタ21,22の共通エミッタにコレクタが接続され、ベースにアナログ制御信号Xが接続されるトランジスタ25と、差動トランジスタ23,24の共通エミッタにコレクタが接続され、ベースにアナログ制御信号Yが接続されるトランジスタ26と、トランジスタ25,26の共通エミッタに接続される電流源41により構成される。   The current control unit 13 has a collector connected to a common emitter of the differential transistors 21 and 22, a transistor 25 connected to the analog control signal X to the base, and a collector connected to a common emitter of the differential transistors 23 and 24. A transistor 26 having an analog control signal Y connected to the base and a current source 41 connected to a common emitter of the transistors 25 and 26 are configured.

このアナログ制御信号X,Yに十分な差、例えば± 100mV程度の差がある場合には、トランジスタ25,26がスイッチとして動作し、遅延部A11だけまたは遅延部B12だけに電流が流れ、遅延時間tは、
t=Ta またはt=Tb
に設定される。一方、アナログ制御信号X,Yが同じ大きさ、またはその差が小さい場合には、遅延部A11および遅延部B12にはその差分(X−Y)に応じた電流が流れ、
Ta >t>Tb
となる遅延時間tが設定される。
When the analog control signals X and Y have a sufficient difference, for example, a difference of about ± 100 mV, the transistors 25 and 26 operate as switches, a current flows only in the delay unit A11 or only in the delay unit B12, and the delay time t is
t = Ta or t = Tb
Set to On the other hand, when the analog control signals X and Y have the same magnitude or the difference between them is small, a current corresponding to the difference (X−Y) flows through the delay unit A11 and the delay unit B12.
Ta>t> Tb
The delay time t is set.

図8は、本発明の可変遅延回路の動作例を示す。ここでは、10Gbit/s の1ビット分のパルスを示す。アナログ制御信号X,Yの差分(X−Y)が0のとき、遅延時間tは、
t=(Ta+Tb)/2
となる。この状態から、例えばYを固定してXを増やしていけば遅延時間tはTa に近づき、Xが所定値を超えると遅延時間tはTa に等しくなり、逆にXを減らしていけば遅延時間tはTb に近づき、やがて遅延時間tはTb に等しくなる。すなわち、差分(X−Y)がおよそ0〜± 100mVの範囲にあるとき、遅延時間tは、
Ta >t>Tb
となり、それ以上の差分(± 100mV)になると、遅延時間は、
t=Ta またはt=Tb
となることが確認された。このときの可変遅延範囲は10ps程度であった。
FIG. 8 shows an operation example of the variable delay circuit of the present invention. Here, a pulse of one bit of 10 Gbit / s is shown. When the difference (X−Y) between the analog control signals X and Y is 0, the delay time t is
t = (Ta + Tb) / 2
It becomes. From this state, for example, if Y is fixed and X is increased, the delay time t approaches Ta, and if X exceeds a predetermined value, the delay time t becomes equal to Ta, and conversely if X is decreased, the delay time is increased. t approaches Tb, and eventually the delay time t becomes equal to Tb. That is, when the difference (X−Y) is in the range of approximately 0 to ± 100 mV, the delay time t is
Ta>t> Tb
When the difference is more than ± 100mV, the delay time is
t = Ta or t = Tb
It was confirmed that The variable delay range at this time was about 10 ps.

なお、この可変遅延回路を多段接続することにより、さらに大きな可変遅延量を連続的に設定することができる。   Note that a larger variable delay amount can be continuously set by connecting the variable delay circuits in multiple stages.

本発明の可変遅延回路の第1の実施形態を示す図。The figure which shows 1st Embodiment of the variable delay circuit of this invention. 本発明の可変遅延回路の第2の実施形態を示す図。The figure which shows 2nd Embodiment of the variable delay circuit of this invention. 遅延部の第1の構成例(基本構成)を示す図。The figure which shows the 1st structural example (basic structure) of a delay part. 遅延部の第2の構成例を示す図。The figure which shows the 2nd structural example of a delay part. 遅延部の第3の構成例を示す図。The figure which shows the 3rd structural example of a delay part. 遅延部の第4の構成例を示す図。The figure which shows the 4th structural example of a delay part. 本発明の可変遅延回路の実施例構成を示す図。The figure which shows the Example structure of the variable delay circuit of this invention. 本発明の可変遅延回路の動作例を示す図。The figure which shows the operation example of the variable delay circuit of this invention. 従来の可変遅延回路の構成例を示す図。The figure which shows the structural example of the conventional variable delay circuit.

符号の説明Explanation of symbols

11 遅延部A
12 遅延部B
13 電流制御部
14,15 バッファ回路
21,22 差動トランジスタ
23,24 差動トランジスタ
25,26 トランジスタ
31,32 負荷容量
33 ピーキング容量
34,35 ピーキングコイル
41 電流源
11 Delay part A
12 Delay part B
13 Current controller 14, 15 Buffer circuit 21, 22 Differential transistor 23, 24 Differential transistor 25, 26 Transistor 31, 32 Load capacity 33 Peaking capacity 34, 35 Peaking coil 41 Current source

Claims (6)

入力端子と出力端子との間に並列に接続され、それぞれ単独動作させたときに入力端子の入力信号を遅延時間Ta ,Tb (Ta >Tb )で出力端子に出力する遅延部Aおよび遅延部Bと、
アナログ制御信号X,Yを入力し、その差分(X−Y)に応じて前記遅延部Aおよび前記遅延部Bに流れる電流量を変化させ、前記遅延時間Ta ,Tb 間で差分(X−Y)に応じて連続的に変化する遅延時間を設定する電流制御部と
を備えたことを特徴とする可変遅延回路。
A delay unit A and a delay unit B that are connected in parallel between the input terminal and the output terminal and output the input signal of the input terminal to the output terminal with delay times Ta and Tb (Ta> Tb) when operated individually. When,
Analog control signals X and Y are input, the amount of current flowing through the delay unit A and the delay unit B is changed according to the difference (X−Y), and the difference (X−Y) between the delay times Ta and Tb. And a current control unit that sets a delay time that continuously changes in response to a variable delay circuit.
請求項1に記載の可変遅延回路において、
前記電流制御部は、ベースにアナログ制御信号X,Yを入力する2つのトランジスタのコレクタを前記遅延部Aおよび前記遅延部Bに接続し、共通エミッタを電流源に接続した構成である
ことを特徴とする可変遅延回路。
The variable delay circuit according to claim 1,
The current control unit has a configuration in which collectors of two transistors that input analog control signals X and Y to a base are connected to the delay unit A and the delay unit B, and a common emitter is connected to a current source. A variable delay circuit.
請求項1に記載の可変遅延回路において、
前記遅延部Aおよび前記遅延部Bの前段にそれぞれバッファ回路を接続し、各バッファ回路を介して前記入力端子と前記遅延部Aおよび前記遅延部Bを接続した構成である
ことを特徴とする可変遅延回路。
The variable delay circuit according to claim 1,
A variable circuit is characterized in that a buffer circuit is connected in front of each of the delay unit A and the delay unit B, and the input terminal and the delay unit A and the delay unit B are connected via the buffer circuits. Delay circuit.
請求項1に記載の可変遅延回路において、
前記遅延部Aに負荷容量を接続し、前記遅延時間Ta ,Tb がTa >Tb となるように設定する構成である
ことを特徴とする可変遅延回路。
The variable delay circuit according to claim 1,
A variable delay circuit, wherein a load capacitor is connected to the delay unit A, and the delay times Ta and Tb are set such that Ta> Tb.
請求項1に記載の可変遅延回路において、
前記遅延部Bにピーキング容量を接続し、前記遅延時間Ta ,Tb がTa >Tb となるように設定する構成である
ことを特徴とする可変遅延回路。
The variable delay circuit according to claim 1,
A variable delay circuit, wherein a peaking capacitor is connected to the delay unit B, and the delay times Ta and Tb are set such that Ta> Tb.
請求項1に記載の可変遅延回路において、
前記遅延部Bにピーキングコイルを接続し、前記遅延時間Ta ,Tb がTa >Tb となるように設定する構成である
ことを特徴とする可変遅延回路。
The variable delay circuit according to claim 1,
A variable delay circuit, wherein a peaking coil is connected to the delay unit B, and the delay times Ta and Tb are set such that Ta> Tb.
JP2008095186A 2008-04-01 2008-04-01 Variable delay circuit Withdrawn JP2009253366A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010233180A (en) * 2009-03-30 2010-10-14 Nippon Telegr & Teleph Corp <Ntt> Variable delay circuit
JP2014212376A (en) * 2013-04-17 2014-11-13 日本電信電話株式会社 Variable delay device and method of delay amount adjustment of the same
JP2014212391A (en) * 2013-04-17 2014-11-13 日本電信電話株式会社 Variable delay device and method of delay amount adjustment of the same
JP2023045108A (en) * 2021-09-21 2023-04-03 アンリツ株式会社 Variable delay circuit, variable delay method, signal generation device and signal generation method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010233180A (en) * 2009-03-30 2010-10-14 Nippon Telegr & Teleph Corp <Ntt> Variable delay circuit
JP2014212376A (en) * 2013-04-17 2014-11-13 日本電信電話株式会社 Variable delay device and method of delay amount adjustment of the same
JP2014212391A (en) * 2013-04-17 2014-11-13 日本電信電話株式会社 Variable delay device and method of delay amount adjustment of the same
JP2023045108A (en) * 2021-09-21 2023-04-03 アンリツ株式会社 Variable delay circuit, variable delay method, signal generation device and signal generation method
JP7432567B2 (en) 2021-09-21 2024-02-16 アンリツ株式会社 Signal generation device and signal generation method

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