JP2009115534A - Centrifugal force applying device and specimen liquid analyzer - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a centrifugal force applying device capable of changing accurately a chip attitude, simplifying a wiring structure, and determining a generation case of an obstacle such as damage of a chip holding part. <P>SOLUTION: This device includes three portions 26c-26e to be detected having each different light reflection characteristic, provided on each different spot on an exposed part of the outer peripheral surface of a microchip 200; and an attitude sensor 14 for irradiating laser light to a portion 26d to be detected when the attitude of the microchip 200 is on a normal attitude rotation angle position, to a portion 26c to be detected when the attitude of the microchip 200 is on a right attitude rotation angle position, and to a portion 26e to be detected when the attitude of the microchip 200 is on a left attitude rotation angle position, on an attitude detection rotation angle position, and capable of receiving its reflected light. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a device for applying a centrifugal force to a chip and a device for analyzing a sample liquid, and in particular, the posture of the chip can be accurately changed, the wiring structure can be simplified, and the chip holding portion is broken. The present invention relates to a centrifugal force application device and a sample liquid analyzer that can determine when a failure such as the above occurs.

Collect blood as the sample liquid, centrifuge the collected blood to separate red blood cells, white blood cells, lymphocytes, platelets, blood coagulation factors, etc. in the blood, pH value of components such as serum obtained by separation, There are analytical methods for measuring the concentration of oxygen or carbon dioxide.
As a measurement method, for example, a measurement target liquid containing a light-absorbing component obtained by adding a reagent to a test liquid such as serum is irradiated with light emitted from a light source, and thereby the measurement target liquid is transmitted. The concentration of the detection target component in the liquid to be inspected is calculated from the absorbance obtained by causing the light-receiving unit to receive the received light.

In recent years, μ-TAS (Total Analysis System) and Lab. on. An analysis method using a microchip called “Chip” (micro total analysis system or on-chip laboratory) has attracted attention.
For example, a microchip in which a minute groove-like structure called a microcapillary is formed on a chip of several centimeters and a channel is formed by covering the structure is used. Then, the DNA is put in a neutral gel. Since the DNA has a charge, it is moved in the microcapillary channel by electrophoresis and separated by the difference in total charge due to the difference in molecular weight. In addition, researches are being actively conducted to detect a reaction by a reagent, such as an analysis of absorbance, by putting another reagent in the middle of a substance moving through the microcapillary.

Conventionally, as a microchip used for analysis of a sample liquid, for example, a test chip described in Patent Document 1 is known.
The inspection chip described in Patent Document 1 has at least one quantification unit that quantifies the target component in the sample. The quantification unit rotates the inspection chip around a predetermined rotation axis to thereby extract the target component from the sample. A centrifuge tube to be centrifuged, connected to one end of the centrifuge tube, and connected to the weighing tube for weighing the target component by rotation around the rotation axis, and the weighing tube to centrifuge the target component Transfer means for transferring from the tube to the weighing tube, at least one reagent reservoir for storing the reagent, and the reagent reservoir and the weighing tube are connected to the weighing tube and are introduced from the weighing tube by re-rotation around the rotation axis Photodetection in which the target component is connected to the mixing unit and the mixing unit where the target component is mixed with the reagent introduced from the reagent reservoir by rotation about the rotation axis, and the mixed substance in which the reagent and the target component are mixed is passed. Road A light inlet connected to the light detection path for introducing light into the light detection path, and a light outlet connected to the light detection path for extracting light after passing through the light detection path. Yes.

As a device for centrifuging the inspection chip described in Patent Document 1, for example, a microchip centrifuge described in Patent Document 2 is known.
The microchip centrifuge described in Patent Document 2 is a microchip centrifuge that performs separation while maintaining a microchip having a separation unit, a weighing unit, and a mixing unit at a predetermined rotation angle. A first rotating body that is rotated by a motor, and one or a plurality of second rotating bodies that hold the microchip and that are rotatable about the rotation axis of the first rotating body, When the motor is rotated at the rotational angle, the first rotating body, the second rotating body, and the microchip are rotated together to perform the centrifugal separation, and the rotation of the motor is stopped. In this state, the second rotating body is rotated to hold the microchip at another predetermined rotation angle.

In the second aspect, when the microchip is rotated 90 [deg.] Clockwise, the operator lifts the rotary lever upward against the spring force of the spring band, and the rotation restricting groove and the main shaft connecting pin are engaged with each other. Is released and the rotary lever is rotated 180 ° counterclockwise. As a result, since the engagement pin provided on the rotation lever is in a state of being engaged with the sub-rotation gear, the sub-rotation gear also rotates counterclockwise by 180 [°] and meshes with the sub-rotation gear. The second rotating body rotates 90 [°] clockwise, and the microchip rotates 90 [°] clockwise (the same document [0017]).
JP 2005-114438 A JP 2006-110491 A

  However, in the technique described in Patent Document 2, in order to rotate the microchip 90 [°] clockwise, it is necessary to rotate the rotation lever 180 [°] counterclockwise. There is a problem that it is difficult to accurately change the attitude of the microchip to a predetermined rotation angle position by visually checking how much the microchip has rotated while rotating the rotary lever. there were. If accurate rotation cannot be realized, not only a sufficient measurement result cannot be obtained, but there is a possibility that the chip holding part is damaged or the microchip is dropped.

Thus, a configuration is conceivable in which a rotation sensor such as a resolver is provided on the rotation shaft of the second rotating body, and the operator rotates the microchip while looking at the detection result of the rotation sensor.
However, in such a configuration, since the second rotating body is provided on the first rotating body, the wiring of the rotation sensor must be taken out through the rotation shaft of the first rotating body, There is a problem that the wiring structure becomes complicated. Further, when a failure such as breakage of the chip holding part or dropping of the microchip occurs during the centrifugation, there is a problem that the rotation sensor cannot detect the damage or the like.

  Therefore, the present invention has been made paying attention to such an unsolved problem of the conventional technology, and can change the attitude of the chip accurately and simplifies the wiring structure, An object of the present invention is to provide a centrifugal force applying device and a sample liquid analyzer that can determine when a failure such as breakage of a chip holding portion has occurred.

  [Invention 1] In order to achieve the above object, the centrifugal force application device of Invention 1 separates the components of the sample liquid in accordance with the centrifugal force applied in a predetermined direction, and the components after the separation are determined on the chip. A centrifugal force applying device that applies a centrifugal force in the predetermined direction to the chip by holding and rotating a tip for analyzing a sample liquid that can be guided to a position in a posture in which the centrifugal force is applied in the predetermined direction. A first rotating body rotatable around an axis orthogonal to the predetermined direction, first rotating means for rotating the first rotating body, a chip holding unit for holding the chip, and the first A second rotating body provided at a position away from the rotation center of the one rotating body and capable of rotating the tip holding portion around the orthogonal axis; a second rotating means for rotating the second rotating body; Hold the tip posture A first centrifuge control that rotates by means, and a second centrifuge that maintains the posture of the chip at a rotation angle position of the second rotating body different from that at the time of the first centrifuge control and rotates by the first rotation means. A centrifuge control unit that performs centrifuge control; a first detected unit that is provided on a portion of the outer peripheral surface of the chip that is exposed from the chip holding unit in a state of being held by the chip holding unit, and having different light reflection characteristics; In a second detected portion and a posture detection rotation angle position that is a rotation angle position of the first rotating body for detecting the posture of the chip, the posture of the chip is a first rotation angle position of the second rotating body. When the position of the chip is at the second rotational angle position of the second rotating body, the second detected portion can be irradiated with light and the reflected light can be received. Equipped with various attitude sensors Yeah.

  If it is such a structure, the 1st centrifugation control which hold | maintains a chip | tip in a chip | tip holding | maintenance part, maintains the attitude | position of a chip | tip by a centrifuge control means, and rotates by a 1st rotation means will be performed. As a result, the first rotating body rotates around the axis orthogonal to the predetermined direction by the first rotating means, but the second rotating body is provided at a position away from the center of rotation of the first rotating body. , Rotate integrally with the first rotating body. And a chip | tip holding | maintenance part also rotates integrally with a 2nd rotary body. Therefore, a centrifugal force in a predetermined direction is applied to the chip by the rotation of the first rotating body.

When the first centrifugation control is completed, the second rotating body rotates the second rotating body to the first rotation angle position or the second rotation angle position, for example, at the posture detection rotation angle position by the second rotation means.
At this time, if the posture of the chip is the first rotation angle position, the irradiated light can be reflected by the first detected portion of the chip and received by the posture sensor, but the reflected light can be received. Since the light reflection characteristic is different from that of the detection unit, it is possible to detect that the posture of the chip is the first rotation angle position by the reflected light from the first detection target unit.

Further, when the posture of the chip is the second rotation angle position, the irradiated light can be reflected by the second detected portion of the chip and received by the posture sensor, but the reflected light can be received. Since the light reflection characteristic is different from that of the part, it is possible to detect that the posture of the chip is the second rotation angle position by the reflected light from the second detected part.
Further, when a failure such as breakage of the chip holding part or dropout of the chip occurs, even if the second rotation means rotates the first rotation angle position or the front and rear of the second rotation angle position, the reflected light is reflected by the attitude sensor. Since it may not be able to receive light and the detected part may not be detected, it can be determined that a failure has occurred.

  Thereafter, the centrifuge control unit performs the second centrifuge control for maintaining the posture of the chip at the first rotation angle position or the second rotation angle position and rotating by the first rotation unit. As a result, the first rotating means rotates the first rotating body around an axis orthogonal to the predetermined direction, and the second rotating body rotates integrally with the first rotating body. And a chip | tip holding | maintenance part also rotates integrally with a 2nd rotary body. Therefore, a centrifugal force in a predetermined direction is applied to the chip by the rotation of the first rotating body.

By applying centrifugal force in a predetermined direction, the components of the sample liquid are separated in the chip, and the separated components are guided to a predetermined position. In this state, measurement processing can be performed on a predetermined position.
Note that the reflected light cannot be received by the attitude sensor unless the attitude of the chip is at either the first rotation angle position or the second rotation angle position at the attitude detection rotation angle position. Therefore, the first rotation angle position and the second rotation angle position are not received. It can also be determined that the rotation angle position is other than the above. For example, if the second rotating means is configured to rotate the second rotating body to the first rotation angle position, the second rotation angle position, and the third rotation angle position in a predetermined order, the second rotation means is based on the detection result of the attitude sensor. Three rotational angle positions can be specified.

Here, the chip holding unit is for holding the chip, and does not require that the chip is actually held. Hereinafter, the same applies to the sample liquid analyzer of the invention 2.
Moreover, the 1st to-be-detected part and the 2nd to-be-detected part can implement | achieve a light reflection characteristic with a mirror, a color, a pattern, or undulation shape, for example. Hereinafter, the same applies to the sample liquid analyzer of the invention 2.

The second rotating means may be configured to automatically rotate the second rotating body with an actuator or the like, or may be configured to manually rotate the second rotating body with a rotating lever or the like. In the latter case, the rotation may be performed while looking at the detection result of the attitude sensor. Hereinafter, the same applies to the sample liquid analyzer of the invention 2.
Further, the first rotating body and the second rotating body may be, for example, an arm, a table, or a stage. Further, the shape may be planar like a plate or three-dimensional like a housing. Hereinafter, the same applies to the sample liquid analyzer of the invention 2.

Further, the first rotating means may rotate about the center of gravity of the first rotating body as the rotation center, or may rotate about the eccentric position of the first rotating body as the rotation center. Hereinafter, the same applies to the sample liquid analyzer of the invention 2.
Further, the second rotating means may rotate about the center of gravity of the second rotating body as the center of rotation, or may rotate about the eccentric position of the second rotating body as the center of rotation. Hereinafter, the same applies to the sample liquid analyzer of the invention 2.

  [Invention 2] On the other hand, in order to achieve the above object, the sample liquid analyzer of the invention 2 includes a measurement unit that performs an optical measurement process, and the sample liquid according to a centrifugal force applied in a predetermined direction. The sample liquid analyzing chip that can separate the components of the sample, mix the separated components and reagents, and guide the components after mixing the reagents to the measurement unit in a posture in which centrifugal force is applied in the predetermined direction. A sample liquid analyzer that applies a centrifugal force to the chip in the predetermined direction by holding and rotating the chip and performs the measurement process on the measurement unit, about an axis orthogonal to the predetermined direction A first rotating body that is rotatable, a first rotating means that rotates the first rotating body, a chip holding portion that holds the chip, and a position away from the rotation center of the first rotating body. And the chip holding portion around the orthogonal axis A second rotating body capable of rotating; a second rotating means for rotating the second rotating body; a first centrifuge control for maintaining the posture of the chip and rotating by the first rotating means; and the first centrifuge. The centrifuge control means for performing the second centrifuge control for maintaining the posture of the chip at the rotation angle position of the second rotating body different from that at the time of the separation control and rotating by the first rotation means, and measuring the chip A measurement sensor capable of irradiating light to the measurement unit of the chip held by the chip holding unit and receiving the transmitted light at a measurement rotation angle position that is a rotation angle position of the first rotating body for the purpose, and the chip The first and second detected parts having different light reflection characteristics provided in the portion exposed from the chip holding part while being held by the chip holding part in the outer peripheral surface of the chip, and the attitude of the chip Do In the attitude detection rotation angle position that is the rotation angle position of the first rotating body for the purpose, when the attitude of the chip is the first rotation angle position of the second rotating body, A posture sensor capable of irradiating the second detected portion with light and receiving the reflected light when the posture is the second rotation angle position of the second rotating body.

  If it is such a structure, the 1st centrifugation control which hold | maintains a chip | tip in a chip | tip holding | maintenance part, maintains the attitude | position of a chip | tip by a centrifuge control means, and rotates by a 1st rotation means will be performed. As a result, the first rotating body rotates around the axis orthogonal to the predetermined direction by the first rotating means, but the second rotating body is provided at a position away from the center of rotation of the first rotating body. , Rotate integrally with the first rotating body. And a chip | tip holding | maintenance part also rotates integrally with a 2nd rotary body. Therefore, a centrifugal force in a predetermined direction is applied to the chip by the rotation of the first rotating body.

When the first centrifugation control is completed, the second rotating body rotates the second rotating body to the first rotation angle position or the second rotation angle position, for example, at the posture detection rotation angle position by the second rotation means.
At this time, if the posture of the chip is the first rotation angle position, the irradiated light can be reflected by the first detected portion of the chip and received by the posture sensor, but the reflected light can be received. Since the light reflection characteristic is different from that of the detection unit, it is possible to detect that the posture of the chip is the first rotation angle position by the reflected light from the first detection target unit.

Further, when the posture of the chip is the second rotation angle position, the irradiated light can be reflected by the second detected portion of the chip and received by the posture sensor, but the reflected light can be received. Since the light reflection characteristic is different from that of the part, it is possible to detect that the posture of the chip is the second rotation angle position by the reflected light from the second detected part.
Further, when a failure such as breakage of the chip holding part or dropout of the chip occurs, even if the second rotation means rotates the first rotation angle position or the front and rear of the second rotation angle position, the reflected light is reflected by the attitude sensor. Since it may not be able to receive light and the detected part may not be detected, it can be determined that a failure has occurred.

  Thereafter, the centrifuge control unit performs the second centrifuge control for maintaining the posture of the chip at the first rotation angle position or the second rotation angle position and rotating by the first rotation unit. As a result, the first rotating means rotates the first rotating body around an axis orthogonal to the predetermined direction, and the second rotating body rotates integrally with the first rotating body. And a chip | tip holding | maintenance part also rotates integrally with a 2nd rotary body. Therefore, a centrifugal force in a predetermined direction is applied to the chip by the rotation of the first rotating body.

  By applying a centrifugal force in a predetermined direction, the components of the sample liquid are separated in the chip, the separated components and the reagent are mixed, and the components after the reagent mixing are guided to the measurement unit. In this state, when the first rotation means is rotated to the measurement rotation angle position, the irradiated light can be transmitted through the measurement unit of the chip and received by the measurement sensor. Measurement process.

  Note that the reflected light cannot be received by the attitude sensor unless the attitude of the chip is at either the first rotation angle position or the second rotation angle position at the attitude detection rotation angle position. Therefore, the first rotation angle position and the second rotation angle position are not received. It can also be determined that the rotation angle position is other than the above. For example, if the second rotating means is configured to rotate the second rotating body to the first rotation angle position, the second rotation angle position, and the third rotation angle position in a predetermined order, the second rotation means is based on the detection result of the attitude sensor. Three rotational angle positions can be specified.

  In addition, for the second centrifuge control, not only when the second rotating body is rotated to the first rotation angle position or the second rotation angle position, for example, the measurement unit is included in the measurement range of the measurement sensor at the measurement rotation angle position. So that the second rotating body may be rotated to the first rotation angle position or the second rotation angle position at the posture detection rotation angle position by the second rotation means.

  [Invention 3] In addition, the sample liquid analyzer of the invention 3 is the sample liquid analyzer of the invention 2, wherein the first liquid having different light reflection characteristics is provided at a different location of the exposed portion of the outer peripheral surface of the chip. A detection unit; a second detection unit; and a third detection unit. The posture sensor includes a first rotation angle position when the posture of the chip is the first rotation angle position at the posture detection rotation angle position. When the posture of the chip is at the second rotational angle position, the second detected portion is when the tip is at the third rotational angle position of the second rotating body. 3 It is possible to irradiate the detected part with light and receive the reflected light.

  With such a configuration, when the posture of the chip is the first rotation angle position at the posture detection rotation angle position, the irradiated light is reflected by the first detection portion by the posture sensor, and the reflected light is received. However, since the light reflection characteristics are different from those of the second detected portion and the third detected portion, the reflected light from the first detected portion detects that the posture of the chip is the first rotation angle position. can do.

In addition, when the posture of the chip is the second rotation angle position at the posture detection rotation angle position, the irradiated light is reflected by the second detection portion by the posture sensor, and the reflected light can be received. Since the light detection characteristics are different from those of the first detected part and the third detected part, it is possible to detect that the posture of the chip is the second rotational angle position by the reflected light from the second detected part.
In addition, when the posture of the chip is the third rotation angle position at the posture detection rotation angle position, the irradiated light can be reflected by the third detected portion by the posture sensor, and the reflected light can be received. Since the light detection characteristics are different from those of the first detected part and the second detected part, it is possible to detect that the posture of the chip is the third rotation angle position by the reflected light from the third detected part.

  Note that the reflected light cannot be received by the attitude sensor unless the attitude of the chip is any of the first rotation angle position, the second rotation angle position, and the third rotation angle position at the attitude detection rotation angle position. It can also be determined that the rotation angle position is other than the second rotation angle position and the third rotation angle position. For example, if the second rotating means is configured to rotate the second rotating body in a predetermined order to the first rotation angle position, the second rotation angle position, the third rotation angle position, and the fourth rotation angle position, The fourth rotation angle position can be specified based on the detection result.

  [Invention 4] Furthermore, the sample liquid analyzer of the invention 4 is the sample liquid analyzer of the invention 3, wherein the first centrifugal control is performed by the first rotation angle position, the second rotation angle position, and the third rotation. It comprises a first separation / rotation control that maintains the posture of the chip at any angular position and rotates the first rotating body a predetermined number of times by the first rotation means, and the second centrifugal control is performed by the first rotation means. To rotate the first rotating body to the attitude detection rotation angle position, and based on the detection result of the attitude sensor, the second rotation means causes the first rotation angle position, the second rotation angle position, and the first rotation Attitude control for changing the attitude of the chip to a rotation angle position different from that at the time of the first separation rotation control among the three rotation angle positions, and holding the changed attitude by the attitude control, and the first rotation means The first rotator and a second separation rotation control for a predetermined number of times rotation.

If it is such composition, the 1st separation rotation control will be performed by the centrifuge control means as the 1st centrifuge control.
In the first separation rotation control, the posture of the chip is held at any one of the first rotation angle position, the second rotation angle position, and the third rotation angle position, and the first rotation body is rotated a predetermined number of times by the first rotation means.

Next, posture control and second separation / rotation control are performed as the second centrifugal control by the centrifugal control means.
In the attitude control, the first rotating body rotates to the attitude detection rotation angle position by the first rotation means, and based on the detection result of the attitude sensor, the first rotation angle position, the second rotation angle position, and the second rotation means The posture of the chip is changed to a rotation angle position different from that at the time of the first separation rotation control among the third rotation angle positions.
In the second separation rotation control, the changed posture is maintained, and the first rotating body is rotated a predetermined number of times by the first rotating means.

  [Invention 5] Further, the sample liquid analyzer of the invention 5 is the sample liquid analyzer of the invention 4, wherein any two of the first rotation angle position, the second rotation angle position, and the third rotation angle position are used. Are the first measurement posture rotation angle position at which the measurement unit belongs to the first measurement range of the measurement sensor at the measurement rotation angle position, and the second measurement range of the measurement sensor at the measurement rotation angle position. And a second measurement posture rotation angle position to which the measurement unit belongs, and further, based on a detection result of the posture sensor, the second rotation means changes the posture of the chip to the first measurement posture rotation angle position. A first measurement control that changes the rotation of the first rotating body to the measurement rotation angle position by the first rotation means, and performs the measurement process by the measurement sensor; Based on the detection result, the second rotation means changes the tip attitude to the second measurement attitude rotation angle position, and the first rotation means rotates the first rotation body to the measurement rotation angle position. And a measurement control means for performing second measurement control for performing the measurement process by the measurement sensor.

With such a configuration, the first measurement control is performed by the measurement control means.
In the first measurement control, the attitude of the chip is changed to the first measurement attitude rotation angle position by the second rotation means based on the detection result of the attitude sensor, and the first rotation body is moved to the measurement rotation angle position by the first rotation means. Rotate. Since the measurement unit belongs to the first measurement range of the measurement sensor at the measurement rotation angle position, the first measurement process is performed on the measurement unit in the first measurement range of the measurement sensor.

Next, the second measurement control is performed by the measurement control means.
In the second measurement control, the attitude of the chip is changed to the second measurement attitude rotation angle position by the second rotation means based on the detection result of the attitude sensor, and the first rotation body is moved to the measurement rotation angle position by the first rotation means. Rotate. Since the measurement unit belongs to the second measurement range of the measurement sensor at the measurement rotation angle position, the second measurement process is performed on the measurement unit in the second measurement range of the measurement sensor. At this time, in the measurement sensor, for example, if the sensor characteristics are different between the first measurement range and the second measurement range, the second measurement control can obtain a measurement result different from the first measurement control.

[Invention 6] Further, the sample liquid analyzer of the invention 6 is the sample liquid analyzer of any one of the inventions 4 and 5, wherein the centrifugation control means is configured to perform the posture detection rotation based on a detection result of the posture sensor. The first rotating body is stopped at an angular position.
If it is such a structure, a 1st rotary body will stop at a attitude | position detection rotation angle position based on the detection result of an attitude | position sensor by a centrifuge control means.

  [Invention 7] In addition, the sample liquid analyzer of the invention 7 is the sample liquid analyzer of any one of the inventions 4 to 6, and further, based on the detection result of the attitude sensor, the posture of the chip is the first solution. A control prohibiting means for prohibiting the first centrifugation control or the second centrifugation control when it is not possible to determine any one of the first rotation angle position, the second rotation angle position, and the third rotation angle position; Prepare.

With such a configuration, when a failure such as breakage of the chip holding part or dropout of the chip occurs, the posture of the chip is determined based on the detection result of the posture sensor. Since it cannot be determined that the position is any of the third rotation angle position, the first centrifugation control or the second centrifugation control is prohibited by the control prohibiting unit.
Here, prohibiting the control includes interrupting the first centrifugation control or the second centrifugation control and not starting the first centrifugation process or the second centrifugation control.

  The prohibition of control includes passive or active prohibition. Passive prohibition means, for example, that when the first centrifuge control or the second centrifuge control is interrupted, a control signal indicating that the first centrifuge control or the second centrifuge control is performed is not given. Say. Active prohibition refers to, for example, giving a control signal indicating that the first centrifuge control or the second centrifuge control is interrupted when the first centrifuge control or the second centrifuge control is interrupted.

  As described above, according to the centrifugal force applying device of the invention 1 or the sample liquid analyzer of the invention 2, the posture sensor detects that the posture of the chip is the first rotation angle position or the second rotation angle position. As a result, it is possible to obtain an effect that the position of the chip can be accurately changed as compared with the conventional case. In addition, since the posture sensor is configured to irradiate the detected portion of the chip and receive the reflected light, it can be installed outside the first rotating body and the second rotating body, and the wiring structure The effect that simplification of this can be achieved is also acquired. Further, when a failure such as breakage of the chip holding portion or chip removal occurs, the reflected light is reflected by the attitude sensor even if the first rotation angle position or the second rotation angle position is rotated by the second rotation means. Since it may not be able to receive light and the detected part may not be detected, it is possible to determine that a failure has occurred. Furthermore, since the first rotation angle position and the second rotation angle position can be detected by one posture sensor, an effect that the number of parts can be reduced is also obtained.

On the other hand, according to the sample liquid analyzer of the second aspect, since the posture of the chip can be accurately changed, it is possible to reduce the possibility that the measurement result becomes insufficient.
Furthermore, according to the sample liquid analyzer of the third aspect, the first rotation angle position, the second rotation angle position, and the third rotation angle position can be detected, so that the first rotation angle position, the second rotation angle position, and There is an effect that the posture of the chip can be accurately changed to any one of the third rotation angle positions. In addition, since the first rotation angle position, the second rotation angle position, and the third rotation angle position can be detected by one posture sensor, an effect that the number of parts can be reduced is also obtained.

Further, according to the sample liquid analyzer of the fourth aspect of the present invention, the second rotation means is configured to chip at any one of the first rotation angle position, the second rotation angle position, and the third rotation angle position based on the detection result of the posture sensor. Therefore, the effect that the posture of the chip can be changed more accurately is obtained.
Furthermore, according to the sample liquid analyzer of the fifth aspect, the posture of the chip is changed to the rotation angle position where the measurement unit belongs to the measurement range of the measurement sensor at the measurement rotation angle position, and the first rotation to the measurement rotation angle position is performed. Since the body rotates and the measurement process is performed by the measurement sensor, there is an effect that it is not necessary to manually change the posture of the chip in order to perform the measurement process.

Furthermore, according to the sample liquid analyzer of the sixth aspect of the invention, since the first rotating body can be positioned by using the posture sensor together, there is an effect that it is not necessary to separately provide a rotation sensor on the first rotating body. It is done.
Furthermore, according to the sample liquid analyzer of the seventh aspect of the present invention, when a failure such as breakage of the chip holding part or dropout of the chip occurs, the first centrifugal control or the second centrifugal control is prohibited. The effect that it can improve is acquired.

Embodiments of the present invention will be described below with reference to the drawings. 1 to 28 are diagrams showing an embodiment of a centrifugal force applying device and a sample liquid analyzer according to the present invention.
In the present embodiment, the centrifugal force applying device and the sample liquid analyzer according to the present invention are applied to the case where the sample liquid is centrifuged and analyzed.
First, a schematic configuration of the sample liquid analyzer 100 will be described.

FIG. 1 is a perspective view showing a schematic configuration of the sample liquid analyzer 100.
FIG. 2 is a plan view showing a schematic configuration of the sample liquid analyzer 100.
As shown in FIGS. 1 (a) and 1 (b), the sample liquid analyzer 100 is provided with a base 1 having a hollow structure and a centrifugal force applied to the microchip 200 disposed on the base 1. An optical system that irradiates the apparatus 2 and the measurement unit 200a of the microchip 200 disposed on the base 1 with laser light and receives laser light (hereinafter referred to as transmitted light) that has passed through the measurement unit 200a. A measuring device 3, a temperature adjustment device 4 that is mounted in the lower part of the base 1 in the vertical direction and shares an internal space with the base 1 and adjusts the temperature inside the device to be constant, The light-shielding cover 5 that covers the upper surface portion and blocks light from the outside with respect to the upper surface portion is configured.

  Further, as shown in FIG. 2, the plate forming the upper surface portion of the base 1 (hereinafter referred to as the upper plate) is centrifugally moved to the left when the longitudinal direction is the left-right direction and the short direction is the front-rear direction. A force applying device 2 is disposed, and an optical measuring device 3 is disposed on the right side thereof. Furthermore, temperature adjustment vents 10 (rectangular) and 16 (circular) are provided along the front side of the upper plate, respectively, and the temperature adjustment vents 11 ( (Rectangular) and 17 (rectangular) are provided.

In addition, an opening / closing shutter 15 having a configuration in which a rectangular plate covering the ventilation hole 10 is detachably attached is provided in the vicinity of the ventilation hole 10 on the lower surface of the upper plate facing the inside of the base 1. By opening and closing the shutter 15, it is possible to change the area of the opening of the vent 10 and adjust the amount of air flowing into the upper surface of the base 1.
Further, a sensor installation plate 12 is erected on the rear side of the centrifugal force applying device 2 on the upper plate, and a reflective optical posture sensor 14 such as a photo reflector is provided on the plate 12. The detection direction is attached to the centrifugal force applying device 2 side.

Next, the configuration of the centrifugal force applying device 2 will be described.
FIG. 3 is a front view showing a schematic configuration of the centrifugal force applying device 2.
As shown in FIG. 3, the centrifugal force imparting device 2 rotates on a rotary arm 20 composed of a plate member having a rectangular plate surface, an arm rotary shaft 21 that is a rotary shaft of the rotary arm 20, and an arm rotary shaft 21. And an arm rotation mechanism 22 for applying a driving force.

  The arm rotation shaft 21 is inserted into a vertical shaft hole provided in the upper plate via a bearing (for example, a rolling bearing), and is supported so as to be rotatable about a vertical axis with respect to the upper plate. . The rotating arm 20 is joined to the upper end of the arm rotating shaft 21 so that the axial center position thereof matches the position of the center of gravity of the rotating arm 20, and the lower end of the arm rotating shaft 21 is a rotational drive constituting the arm rotating mechanism 22. The output shaft of the source is connected.

  The centrifugal force imparting device 2 further includes a rotary base rotary shaft that is a rotary shaft of the tip rotary base 23 in a vertical shaft hole provided through one end and the other end of the rotary arm 20 in the longitudinal direction. 24 is inserted through a bearing (not shown) so as to be rotatable about a vertical axis and immovable in the vertical direction. The tip turntable 23 is joined to the upper end of the turntable rotation shaft 24 so that the axial center position thereof matches the center of gravity of the tip turntable 23. Further, a part of the lower end side of the turntable rotating shaft 24 is inserted into a case of a turntable rotating mechanism 25 that rotates the turntable rotating shaft 24.

On the chip turntable 23, a chip holding unit 26 that holds the microchip 200 is rotatably provided together with the chip turntable 23.
The centrifugal force applying device 2 further includes a turntable driving force transmission mechanism 27 that transmits power for generating the rotation force of the turntable rotation shaft 24 to the turntable rotation mechanism 25.
The turntable driving force transmission mechanism 27 moves the pusher 27g straightly upward by the driving force of the solenoid, and the rotation angle position where the longitudinal direction of the rotating arm 20 and the longitudinal direction of the upper plate are orthogonal (hereinafter, posture detection). The transmission unit 25c of the turntable rotation mechanism 25 stopped at a rotation angle position) is pushed up to transmit the upward linear motion force to the turntable rotation mechanism 25.

FIG. 4 is a diagram showing a configuration for balancing the rotational balance when the centrifugal force is applied by the centrifugal force applying device 2. 2A is a plan view of the centrifugal force applying device 2, and FIGS. 2B and 2C are front views of the centrifugal force applying device 2. FIG.
As shown in FIG. 4A, the centrifugal force applying device 2 is configured such that the tip turntable 23 and the turntable rotate at positions symmetrical to the center of gravity of the turn arm 20 at both ends in the longitudinal direction of the turn arm 20. A chip rotation mechanism unit that changes the posture of the microchip 200 including the shaft 24, the rotary table rotation mechanism 25, and the chip holding unit 26 is provided. Both chip rotation mechanisms are adjusted to the same weight.

  As a result, the centrifugal force applying device 2 attaches the microchip 200 to the chip holding portions 26 at both ends of the rotating arm 20 as shown in FIGS. Can be made substantially the same, and the weight balance can be kept in equilibrium. Therefore, the rotary arm 20 can be rotated at a high speed with a stable balance.

Further, since centrifugal force can be simultaneously applied to the two microchips 200, centrifugal force can be efficiently applied to a large number of microchips 200.
In addition, when it is not necessary to make a configuration in which two centrifugal forces are applied at the same time, for example, one chip rotation mechanism unit is simply configured by combining the weight of the other chip rotation mechanism unit with the other analysis side. Also good. In this case, for example, if it is assumed to be applied to various types of microchips (for example, the same shape but different weights), only one chip holding unit 26 is provided in one chip rotation mechanism unit, By mounting a dummy chip having the same weight as that of the microchip 200 on the chip holding unit 26, the weight is balanced with the other chip rotation mechanism unit. In addition, when dedicated to a microchip having a constant weight, one chip rotation mechanism unit may be configured with a weight including the weight of the microchip. Thereby, it can be set as a simpler structure.

  With these configurations, the weight balance can be kept in balance, and the cost of the tip rotation mechanism portion on the side where centrifugal force is not applied to the microchip can be reduced.

Next, the configuration of the arm rotation mechanism 22 will be described.
FIG. 5 is a block diagram showing the configuration of the arm rotation mechanism 22.
As shown in FIG. 5, the arm rotation mechanism 22 includes a stepping motor 22a that is a rotation drive source of the arm rotation shaft 21, and a drive circuit 22b that drives the stepping motor 22a.
The stepping motor 22a is an HB type (Hybrid Type) two-phase excitation type motor, which sequentially excites two coils constituting each pole by a phase current supplied from the drive circuit 22b, and outputs a motor output shaft (rotor). ).

The stepping motor 22a further generates a holding current to generate a holding torque for holding the stopped state at a predetermined rotation angle position when the posture of the microchip 200 is changed or during a measurement process by the optical measuring device 3. Has the function of flowing.
The drive circuit 22b is composed of a switching circuit, and obtains electric power from a motor power supply (not shown) provided in the base 1 and supplies it from a control board (described later) provided in the base 1. The circuit is turned on / off according to the control signal (pulse signal) to be supplied, and when it is turned on, a phase current necessary for the rotation of the rotary arm 20 is supplied to the two coils constituting the pole of the stepping motor 22a.

Further, the motor output shaft (output shaft after deceleration if the motor has a speed reduction mechanism) and the arm rotation shaft 21 are directly connected by coupling or the like, and the rotational force of the motor output shaft is directly applied to the arm rotation shaft 21. Is transmitted to.
With the above configuration, in the centrifugal force applying device 2, when the stepping motor 22a rotationally drives the motor output shaft and the rotational force of the motor output shaft is transmitted to the arm rotation shaft 21, the arm rotation shaft 21 rotates, In conjunction with this rotation, the rotating arm 20 rotates around the vertical axis with the center of gravity as the center of rotation.
The centrifugal force applying device 2 is controlled to apply a centrifugal force to the microchip 200 by rotating the rotating arm 20 in the clockwise direction.

Next, the configuration of the microchip 200 will be described.
FIG. 6 is a diagram illustrating a shape example of the microchip 200. 2A is a plan view of the microchip 200, and FIG. 2B is a perspective view of the microchip 200. FIG.
As shown in FIG. 6A, the microchip 200 has a square shape in plan view. The sample liquid reservoir, the reagent reservoir, the weighing unit, the reagent mixing unit, the measuring unit 200a, the centrifuge and the sample liquid A plurality of substrates on which a guide microcapillary channel or the like is formed are laminated.

  The microchip 200 is formed using a material having a characteristic of transmitting laser light. For example, olefin resins such as polyethylene (PE) and polypropylene (PP), polyester resins such as polyethylene terephthalate (PET) and polybutylene terephthalate (PBT), polyamide resins such as nylon 6 and nylon 66, vinyl chloride resins, fluorine resins, etc. It is formed with the well-known resin.

The measurement unit 200a is provided along the right side of the microchip 200, and has three measurement points for performing measurement processing on the separated component mixed with the reagent in the optical measurement device 3.
As shown in FIGS. 6A and 6B, the microchip 200 is held by the chip holding portion 26 on the outer peripheral surface of the first side (the right side of the rear side in FIG. 6A). In the portion exposed from the chip holding portion 26 (hereinafter referred to as an exposed portion), the detected portion 26c is exposed on the outer peripheral surface of the second side (lower right side in FIG. 6A) right next to the first side. The detected portion 26d is provided in the portion, and the detected portion 26e is provided in the exposed portion of the outer peripheral surface of the third side (the left side on the front side in FIG. 6A) right next to the second side. The detected portions 26c to 26e are made of mirrors, and the detected portions 26c to 26e have different reflectances (or light absorption rates and transmittances). In addition, since the reflectance of the to-be-detected parts 26c-26e changes with time, it is preferable to perform calibration before driving the sample liquid analyzer 100.

The detected portions 26c to 26e are detection targets of the posture sensor 14, and are detected by the posture sensor 14 when the rotary arm 20 is stopped at the posture detection rotation angle position, and are detected by a control board (described later). Based on the results, the rotational angle position of the rotary arm 20 and the attitude of the microchip 200 are determined, and various controls such as positioning of the rotary arm 20 and changing the attitude of the microchip 200 are performed. Here, the attitude of the microchip 200 means an attitude around the rotation axis of the chip holding unit 26 in a state of being held by the chip holding unit 26.
Therefore, the plate 12 is formed higher than the heights of the detected portions 26c to 26e, and the posture sensor 14 is provided at the same height as the detected portions 26c to 26e.

Next, the configuration of the chip holding unit 26 will be described.
FIG. 7 is a diagram illustrating a structure example of the chip holding unit 26. FIG. 4A is a plan view of the chip holding unit 26, and FIG. 4B is a side view of the chip holding unit 26.
As shown in FIGS. 7A and 7B, the chip holding part 26 has a frame part 26a into which the microchip 200 can be fitted, and is on the side of the frame part 26a (in FIG. 7A, the center of the left side). ) Is provided with a chip pressing portion 26b.

Chip retention unit 26b, as shown in FIG. 7 (b), supports the longitudinal direction of the one end of the rectangular plate springs 26b ₂ to the pressing member 26b ₁ (e.g., screwed) and elongated plate spring 26b ₂ The other end of the direction is supported by the chip turntable 23. When the microchip 200 is mounted, the lower end portion of the pressing member 26b ₁ presses a part of the upper surface of the microchip 200 from above.

  The chip holding part 26 is provided with notches for exposing the detected parts 26c to 26e on the outer peripheral surface corresponding to the positions of the detected parts 26c to 26e in a state where the microchip 200 is held.

Next, a method for mounting the microchip 200 will be described.
FIG. 8 is a diagram illustrating a mounting example of the microchip 200. FIGS. 4A and 4B are side views of the microchip 200 and the chip holding unit 26, and FIG. 4C is a plan view of the microchip 200 and the chip holding unit 26.

When mounting the microchip 200 in the chip holding portion 26, as shown in FIG. 8 (a), arched in elastically deforming the plate spring 26b ₂ on the outside, the microchip 200 frame portion 26a parallel to the frame portion 26a of bring the top, as shown in FIG. 8 (b), the entire vertically push into the frame of the frame portion 26a, thereafter, it releases the elastic deformation of the plate spring 26b _2.

  As a result, as shown in FIG. 8C, the microchip 200 is fitted to the inner periphery of the frame portion 26a and is fixed to the chip holding portion 26 while being pressed from above by the chip pressing portion 26b. . Therefore, it is possible to prevent the microchip 200 from being detached from the chip holding part 26 due to the centrifugal force during the application of the centrifugal force, and to the flying direction by vibration or the like, regardless of the rotation angle position of the microchip 200. Even if force is generated, the microchip 200 can be hardly lifted by the pressing member 26b.

Next, a configuration when the posture of the microchip 200 is detected by the posture sensor 14 will be described.
FIG. 9 is a diagram illustrating a detection operation of the attitude sensor 14.
The microchip 200 can take four postures of 0 [°], 90 [°], 180 [°], and 270 [°] around the vertical axis by the rotation of the chip holding unit 26. Hereinafter, these rotation angle positions are defined as a normal posture rotation angle position, a right posture rotation angle position, a reverse posture rotation angle position, and a left posture rotation angle position.

  When the attitude of the microchip 200 is the normal attitude rotation angle position (0 [°]) at the attitude detection rotation angle position, as shown in FIG. 9A, the attitude sensor 14 applies laser light to the detected portion 26d. And the reflected light can be received. Therefore, the posture sensor 14 outputs an ON (hereinafter referred to as ON1) sensor signal corresponding to the intensity of reflected light from the detected portion 26d. Therefore, as shown in FIG. 9E, when the sensor signal of the attitude sensor 14 is ON1, it can be detected that the attitude of the microchip 200 is the normal attitude rotation angle position.

  When the posture of the microchip 200 is the right posture rotation angle position (90 [°]) at the posture detection rotation angle position, as shown in FIG. 9B, the posture sensor 14 applies laser light to the detected portion 26c. And the reflected light can be received. Therefore, the posture sensor 14 outputs an ON (hereinafter referred to as ON2) sensor signal corresponding to the intensity of the reflected light from the detected portion 26c. Therefore, as shown in FIG. 9E, when the sensor signal of the attitude sensor 14 is ON2, it can be detected that the attitude of the microchip 200 is the right attitude rotation angle position.

  When the posture of the microchip 200 is the reverse posture rotation angle position (180 [°]) at the posture detection rotation angle position, the posture sensor 14 is detected on the optical axis as shown in FIG. Since the portions 26c to 26e are not present, the reflected light cannot be received. Therefore, the posture sensor 14 outputs an OFF sensor signal. Therefore, as shown in FIG. 9E, when the sensor signal of the attitude sensor 14 is OFF, it can be detected that the attitude of the microchip 200 is the reverse attitude rotation angle position.

  When the attitude of the microchip 200 is the left attitude rotation angle position (270 [°]) at the attitude detection rotation angle position, as shown in FIG. 9D, the attitude sensor 14 applies laser light to the detected portion 26e. And the reflected light can be received. Therefore, the posture sensor 14 outputs an ON (hereinafter referred to as ON3) sensor signal corresponding to the intensity of reflected light from the detected portion 26e. Therefore, as shown in FIG. 9E, when the sensor signal of the attitude sensor 14 is ON3, it can be detected that the attitude of the microchip 200 is the right attitude rotation angle position.

  Note that when the posture of the microchip 200 is the reverse posture rotation angle position, the sensor signal of the posture sensor 14 is OFF. Therefore, from the sensor signal of the posture sensor 14, the posture of the microchip 200 is the reverse posture rotation angle position. However, it may be impossible to distinguish whether a failure such as breakage of the chip holding portion 26 or dropping of the microchip 200 has occurred. Therefore, for example, it is possible to determine whether or not there is a failure by rotating the tip turntable 23 once from the reverse posture rotation angle position. If it is not an obstacle, sensor signals of ON1 to ON3 can be obtained at the normal posture rotation angle position, the right posture rotation angle position, and the left posture rotation angle position. Since a sensor signal cannot be obtained, it is possible to distinguish whether it is a reverse posture rotation angle position or a failure has occurred.

Next, the configuration of the turntable rotating mechanism 25 will be described.
FIG. 10 is a side view showing the configuration of the turntable rotating mechanism 25.
As shown in FIG. 10, the rotary table rotating mechanism 25 is fixedly supported below the chip rotary table 23 and on the lower surface of the rotary arm 20. The part is configured to be inserted from above. The upper surface of the case is configured to be covered with the lower surface portion of the rotary arm 20, and an opening is provided in the lower surface portion of the case.

A cylindrical cam 25a that rotates the rotary table rotation shaft 24 is provided in the case. The cam 25 a is provided so as to be slidable along the rotary table rotation shaft 24 by inserting a part of the rotary table rotation shaft 24 into the inner periphery thereof.
Two guide portions 25b extending in the vertical direction are formed on the wall in the case at positions facing each other in the horizontal direction.

Next, the configuration of the cam 25a will be described.
FIG. 11 is a diagram showing the configuration of the cam 25a. FIG. 4A is a front view of the cam 25a, and FIG. 4B is a bottom view of the cam 25a.
As shown in FIG. 11 (a), on the upper end surface of the cylindrical shape of the cam 25a, eight inclined surfaces 25m formed continuously along the circumferential direction and the back surface of each inclined surface 25m are formed. An upper end cam surface 25j composed of two walls 25n is formed. The inclined surface 25m has an inclination in which the upper end of the wall 25n is the top of the inclination and descends from the top toward the clockwise direction of the upper end surface.

  As shown in FIGS. 11 (a) and 11 (b), on the lower end surface of the cylindrical shape of the cam 25a, there are eight inclined surfaces 25p formed continuously along the circumferential direction, and a lower cam to be described later. A lower end cam surface 25o including eight pin fitting grooves 25q for fitting the pins 25e and eight walls 25r forming the back surface of each inclined surface 25p is formed. As shown in FIG. 11 (b), the inclined surface 25p, when viewed from the bottom surface side, has a “mountain” portion in the figure as the top of the inclination, from which the lower end position on the inclined side of the pin fitting groove 25q is inclined. As the end of the slope, it has a slope displaced in the clockwise direction. That is, the lower end cam surface 25o is formed with an inclined surface 25p having an inclination direction opposite to the direction of the inclined surface 25m of the upper end cam surface 25j when viewed upside down. From the viewpoint of FIG. 11A, the “mountain” portion shown in FIG. 11B is located at the lowest position of the lower end cam surface 25o.

The pin fitting groove 25q is a straight recess formed straightly upward along the wall surface of the wall 25r between each inclined surface 25p and the wall 25r which is the back surface of the adjacent inclined surface 25p.
Further, the inclination angle of each inclined surface 25m of the upper end cam surface 25j and the inclination angle of each inclined surface 25p of the lower end cam surface 25o are such that the upper end cam surface 25j is larger than the lower end cam surface 25o (the inclination is sharper). Formed at an angle). Therefore, the height of the wall 25n of the upper end cam surface 25j is higher than the height of the wall 25r of the lower end cam surface 25o.

Further, the cam 25a has a predetermined circumferential angle (for example, 22.5) between the position of the top of the wall 25n that is the top of each inclined surface 25m and the position of the top of the wall 25r that is the top of each inclined surface 25p. [°]) are shifted in the circumferential direction.
Further, as shown in FIGS. 11A and 11B, an annular transmission portion 25c is formed integrally with the cam 25a along the outer periphery of the lower end portion of the cam 25a. The transmission portion 25c is formed with two engagement grooves 25t that are engaged with the guide portion 25b provided on the inner wall of the case at positions facing each other in the radial direction. The diameter of the transmission portion 25c is slightly shorter (substantially the same length) than the diameter of the inner diameter of the case.

  As shown in FIG. 10, the transmission portion 25c integrally formed with the cam 25a engages the two guide portions 25b provided on the inner wall of the case with the two engagement grooves 25t of the transmission portion 25c, respectively. The cam 25a and the transmission portion 25c are disposed in the case so as to be slidable in the vertical direction along the guide portion 25b and the rotary base rotating shaft 24. In other words, the cam 25a and the transmission portion 25c can be moved up and down by the guide portion 25b while preventing them from rotating around the rotary table rotating shaft 24.

  On the other hand, two upper cam pins 25d are rotated on the outer peripheral surface of the insertion portion of the rotary table rotating shaft 24 inserted into the case at a height position within the upward movement range of the upper end cam surface 25j. It is provided at equal intervals along the circumferential direction of the table rotation shaft 24 at the same height. Further, on the outer peripheral surface of the insertion portion of the rotary base rotating shaft 24 inserted into the case, four lower cam pins 25e are located at a height position within the downward movement range of the lower end cam surface 25o. They are provided at equal intervals in the circumferential direction at equal intervals.

  The upper cam pin 25d is provided at a height position at which at least the inclined surfaces 25m of the upper cam surface 25j and the upper cam pin 25d do not come into contact when the cam 25a is at the lowermost position. Further, the lower cam pin 25e is at a height position at which at least the inclined surfaces 25p of the lower end cam surface 25o and the lower cam pin 25e do not contact when the cam 25a moves to the uppermost position. The lower cam pin 25e is provided at a height position where it is fitted in the pin fitting groove 25q of the lower end cam surface 25o when the cam 25a is moved to the lowermost position. That is, when the cam 25a is at the lowermost position, as shown in FIG. 11B, the four lower cam pins 25e are fitted in the pin fitting grooves 25q.

As shown in FIG. 10, the turntable rotating mechanism 25 further includes a coil spring 25f and a ring-shaped low slip for reducing sliding resistance at both ends due to rotation of the coil spring 25f when the coil spring 25f is expanded and contracted. A moving member 25g (for example, a ring-shaped spacer made of a resin material such as fluororesin) is disposed.
When the cam 25a and the transmission portion 25c are disposed in the case, the coil spring 25f is inserted through a portion of the lower end side of the rotary base rotating shaft 24 and the cam 25a inward, and the upper end portion of the coil spring 25f is connected to the rotary arm 20. Is disposed in the case with the lower end facing the upper surface of the transmission portion 25c.

  The coil spring 25f has the same rotational direction due to the torsional force when the coil spring 25f is contracted and the winding direction of the spring 25f, and the rotational direction when the spring 25f is restored from the contracted state and the winding direction of the spring 25f. Has a structure in which the opposite direction is the same direction. Thereby, the sliding resistance of the both ends of the coil spring 25f can be reduced, and a smooth expansion / contraction operation can be performed.

  When the low-sliding member 25g is provided with the coil spring 25f, the low-sliding member 25g is inserted through the rotary base rotating shaft 24 inward, between the upper end portion of the coil spring 25f and the lower surface of the rotary arm 20, and the lower end portion of the coil spring 25f. And a member interposed between the upper surface of the transmission portion 25c. By interposing the low sliding member 25g, in addition to reducing the sliding resistance due to the winding direction of the coil spring 25f, it is possible to further reduce the sliding resistance at both ends of the coil spring 25f, and a smoother expansion and contraction operation. Will be able to do.

The members that form the cam 25a, the upper cam pin 25d, the lower cam pin 25e, and the rotary base rotating shaft 24 are formed of a combination of materials that are less likely to cause galling. As combinations of the materials of these members, for example, any of the following four types (A) to (D) can be adopted.
(A) A combination of a cam 25a formed of nylon, an upper cam pin 25d and a lower cam pin 25e formed of hardened carbon steel such as S45C, and a rotary base rotary shaft 24 formed of iron.
(B) A cam 25a formed of stainless steel such as SUS304, an upper cam pin 25d and a lower cam pin 25e formed of hardened carbon steel such as S45C, and a turntable rotary shaft 24 formed of iron. combination.
(C) Cam 25a formed of stainless steel such as SUS304, upper cam pin 25d and lower cam pin 25e formed of hardened carbon steel such as S45C, and turntable rotary shaft formed of brass (brass) Combination with 24.
(D) A cam 25a formed of cast iron such as FC200, an upper cam pin 25d and a lower cam pin 25e formed of hardened carbon steel such as S45C, and a rotary base rotary shaft 24 formed of iron combination.

  That is, if the same metal material is slid, the affinity between the two becomes high and “galling (seizure)” is likely to occur. Therefore, the cam 25a, the upper cam pin 25d, the lower cam pin 25e, and the rotation By making the material of the table | shaft rotating shaft 24 into any combination of said (A)-(D), generation | occurrence | production of "galling" by the sliding parts can be made hard to raise | generate.

Next, the configuration of the turntable driving force transmission mechanism 27 will be described.
FIG. 12 is a vertical cross-sectional view showing the configuration of the turntable driving force transmission mechanism 27.
As shown in FIG. 12, the rotary table driving force transmission mechanism 27 includes a solenoid body 27a, a solenoid shaft 27b, a shock absorber 27c, a support bracket 27d that fixes and supports the shock absorber 27c with respect to the base 1, and a solenoid. An impact absorbing bracket 27e coupled to the lower end of the shaft 27b, a buffer member 27f (for example, a rubber sponge) attached to the tip of the solenoid shaft 27b, and a pusher 27g connected to the tip of the solenoid shaft 27b. It is configured.

The solenoid body 27a includes a coil, a fixed iron core inserted in the coil, a magnetic frame magnetically connected to the fixed iron core and surrounding the coil in a housing formed of a non-magnetic material, A movable iron core is provided in the housing so as to be movable toward and away from the fixed iron core.
The solenoid shaft 27b is inserted through a through hole provided in the movable iron core of the solenoid body 27a, and is attached so as not to move relative to the movable iron core in the axial direction. Accordingly, when a magnetic flux is generated by energizing the coil, the magnetic flux magnetizes the movable iron core, attracts the movable iron core toward the fixed iron core, and the solenoid shaft 27b attached to the movable iron core is attracted together with the movable iron core. That is, the solenoid shaft 27b is moved straight by the magnetic attraction force of the solenoid body 27a.

  The turntable driving force transmission mechanism 27 has a base 1 in which the tip of a solenoid shaft 27b is disposed upward in a direction perpendicular to the upper plate, and the magnetic attraction force by the solenoid body 27a. Thus, the solenoid shaft 27b is linearly moved in the upward direction, and the linearly moving force is transmitted to the transmitting portion 25c by the pusher 27g connected to the tip portion.

The solenoid shaft 27b is a force transmission body. A pusher 27g is coupled to the upper end side of the solenoid shaft 27b, and an impact absorbing bracket 27e is coupled to the lower end side of the solenoid shaft 27b. As a result, the pusher 27g and the shock absorbing bracket 27e are also moved straight upward.
The shock absorber 27c includes a cylinder, a piston rod that is inserted into a rod hole provided in the cylinder, a piston end that is fixed to a rear end portion of the piston rod, and that can be reciprocated in the cylinder. One end is supported by the rear end portion and the other end is supported by a return coil spring supported by the rear end portion in the cylinder.

Further, the shock absorber 27c is fixedly supported on the base 1 through a support bracket 27d with the tip of the piston rod facing the shock absorbing bracket 27e.
The periphery of the piston portion is sealed with a ring-shaped sealing member such as an O-ring to prevent liquid from passing between the periphery of the piston portion and the inner wall of the cylinder when moving in the cylinder. The rod hole is also sealed with a sealing member such as an O-ring so that liquid does not leak outside.

The piston part is provided with a through hole that is always opened in the reciprocating direction and a valved through hole that is opened according to the moving direction of the piston part.
A through hole with a valve opens the valve when the piston moves in the direction of the cylinder, allowing the liquid to pass through the through hole, and closes the valve when the piston moves in the direction opposite to the direction of the cylinder to allow the liquid to pass through. It has a structure that makes it impossible.

As a result, when the piston moves toward the inside of the cylinder, the piston moves through the through-hole and the valve-equipped through-hole that are always open while passing through the liquid sealed in the cylinder. The impact applied to the piston rod is absorbed by the resistance when passing through.
Further, when the piston portion moves in the cylinder due to the movement of the piston rod toward the inside of the cylinder, the return coil spring is contracted by receiving the force. When the force applied to the piston rod disappears, the restoring force of the coil spring pushes the piston part in the reverse direction, thereby closing the valve of the valved through hole, so that the piston part is always open. The piston rod and the piston part are returned to the initial positions by moving through the cylinder while passing the liquid only through the hole.

The shock absorbing bracket 27e moves straight toward the tip of the piston rod of the shock absorber 27c fixedly supported on the base 1 side, and collides with the tip of the piston rod along with the straight movement of the solenoid shaft 27b in the upward direction. It is configured as follows.
A shock-absorbing member 27f is attached to the tip of the solenoid shaft 27b, and when the pusher 27g collides with the transmission portion 25c, the shock due to the collision is absorbed.

  The pusher 27g has a cylindrical convex portion formed at the tip thereof, and at the time of pushing-up operation, the annular upper end surface of the cylindrical convex portion comes into contact with the annular lower surface of the transmission portion 25c, thereby transmitting the transmission portion 25c. Push up. As a result, the upward linear movement force is transmitted to the cam 25a formed integrally with the transmission portion 25c. The pusher 27g has an outer diameter at the tip thereof that is the same as or substantially the same as the diameter of the transmission portion 25c, and an inner diameter that is at least larger than the diameter of the rotary base rotating shaft 24.

  With the above configuration, when the solenoid shaft 27b moves linearly, the impact absorbing bracket 27e collides with the tip of the piston rod, and this collision force causes the piston to move in the cylinder while passing the liquid through the through hole. The impact due to the collision is absorbed by the resistance force at this time, and the solenoid shaft 27b moves the solenoid shaft 27b straight upward in the state where the impact is absorbed, and the pusher 27g at the tip of the solenoid shaft 27b is transferred to the transmission portion 25c. Collide. At this time, the shock at the time of collision is relieved by the buffer member 27f. Further, the depression formed inside the convex portion at the tip of the pusher 27g allows the lower end portion of the rotary table rotating shaft 24 to escape into the depression during the push-up operation, and the lower ends of the pusher 27g and the rotary table rotating shaft 24. The force can be transmitted to the transmitting portion 25c without contacting the portion.

  Further, when the rotary arm 20 is stopped at the posture detection rotation angle position, the upper plate has a position directly below the opening formed on the lower surface of the case of the rotary base rotation mechanism 25 on the rear end side of the rotary arm 20. A through hole having a diameter allowing the pusher 27g to reciprocate is provided. The through hole has a cylindrical shape with the axis of the rotary table rotation shaft 24 as the center of the circle. Then, the turntable drive force transmission mechanism 27 is inserted on the lower surface side of the posture detection rotation angle position on the upper plate by inserting the pusher 27g into the through hole in a state where the center of the pusher 27g and the center of the through hole are aligned. It is installed. The solenoid shaft 27b and the pusher 27g are disposed so that the entire pusher 27g can be accommodated in a through hole provided at the posture detection rotation angle position at the initial position when the solenoid body 27a is stopped.

FIG. 13 is a diagram illustrating the operation of the turntable rotating mechanism 25 when the pusher 27g is pushed up.
With the above configuration, when a control signal from a control board (described later) is input in a state where the rotary arm 20 is stopped at the posture detection rotation angle position, the turntable driving force transmission mechanism 27 responds to the control signal by the solenoid body. 27a is driven. As a result, the solenoid shaft 27b moves straight upward, and the pusher 27g connected to the upper end of the solenoid shaft 27b moves upward. At this time, the shock absorbing bracket 27e collides with the piston rod of the shock absorber 27c, and part of the shock when the solenoid shaft 27b moves straight is absorbed. The solenoid shaft 27b passes through a through-hole provided in the upper plate in a state where the shock is absorbed by the shock absorber 27c, passes through an opening on the lower surface of the case of the rotary base rotating mechanism 25, and reaches the lower surface of the transmission unit 25c. And reach.

On the other hand, as shown in FIG. 13A, the turntable rotating mechanism 25 has four lower cam pins 25e fitted in the pin fitting grooves 25q of the lower end cam surface 25o. That is, the cam 25a is located at the lowermost end together with the transmission portion 25c.
In this state, when the end surface of the annular convex portion of the pusher 27g collides upward with the annular lower surface of the transmission portion 25c due to the linear movement of the solenoid shaft 27b, the thrust force is integrally formed with the transmission portion 25c. As shown in FIG. 13B, the cam 25a along with the transmitting portion 25c moves straight along the rotary table rotating shaft 24 without rotating along the guide portion 25b. Move. By this linear movement, the two upper cam pins 25d abut against the corresponding two inclined surfaces 25m among the eight inclined surfaces 25m formed on the upper end cam surface 25j. On the other hand, the impact when the pusher 27g collides with the transmission portion 25c is alleviated by the buffer member 27f attached to the tip of the solenoid shaft 27b.

Further, as shown in FIG. 13B, the coil spring 25f interposed between the rotary arm 20 and the transmission portion 25c is contracted by receiving the force due to the upward linear movement of the cam 25a.
Subsequently, when the cam 25a moves upward from the state shown in FIG. 13B, the upward force transmitted from the cam 25a to the upper cam pin 25d as shown in FIG. The upper cam pin 25d slides along the inclined surface 25m formed on the upper end cam surface 25j from the contact position toward the inclined heel direction. That is, the upwardly moving force of the cam 25a in the upward direction is converted into the rotational driving force of the upper cam pin 25d, that is, the rotational driving force of the rotary base rotating shaft 24 by the inclined surface 25m of the upper end cam surface 25j. Thereby, the turntable rotating shaft 24 rotates in the clockwise direction.

FIG. 14 is a diagram showing the operation of the turntable rotating mechanism 25 after being pushed up by the pusher 27g.
As shown in FIG. 14A, the rotary table rotating shaft 24 rotates until the upper cam pin 25d moving along the inclined surface 25m collides with a wall 25n forming the back surface of the adjacent inclined surface 25m. When the movement is stopped by colliding with the wall 25n, the rotation stops there. That is, during the push-up operation of the cam 25a, the rotary table is rotated by a rotation angle corresponding to the moving distance from the time when the upper cam pin 25d comes into contact with the inclined surface 25m until it slides and collides with the wall 25n and stops. The shaft 24 rotates in the clockwise direction. Thereby, the chip | tip turntable 23 and the chip | tip holding | maintenance part 26 rotate clockwise.

In the present embodiment, the resistance at the time of sliding can be obtained by using a cam follower instead of the upper cam pin 25d on the outer peripheral surface of the rotary table rotating shaft 24 or by providing a bearing on the upper cam pin 25d. It is also possible to make it easier to rotate.
On the other hand, when the upper cam pin 25d collides with the wall 25n (when it is located at the base portion of the slope), when the drive of the solenoid body 27a is stopped in the rotary base driving force transmission mechanism 27, the rotary base In the rotating mechanism 25, since the push-up force of the pusher 27g is removed, the restoring force of the coil spring 25f that has shrunk due to the upward movement of the cam 25a causes the cam 25a together with the transmission portion 25c to be as shown in FIG. As shown, it moves straight down along the guide portion 25b without rotating.

At this time, the rotary table rotating shaft 24 is displaced in the clockwise direction due to the rotation at the time of push-up, and the four lower cam pins 25e fitted in the pin fitting groove 25q in the initial state are also shifted in the clockwise direction. By the downward movement of the cam 25a in the downward direction, the four lower cam pins 25e abut against the corresponding four of the eight inclined surfaces 25p formed on the lower end cam surface 25o.
The solenoid shaft 27b is moved downward by this force and its own weight because the pusher 27g is pushed by the transmitting portion 25c that moves downward by the restoring force of the coil spring 25f.

  Subsequently, when the cam 25a further moves downward from the state shown in FIG. 14 (b) by the restoring force of the coil spring 25f, as shown in FIG. 14 (c), the cam 25a moves to the lower cam pin 25e. The lower cam pin 25e is moved upward along the inclined surface 25p constituting the lower end cam surface 25o from the abutting position toward the pin fitting groove 25q by the transmitted downward force. Direction). That is, the downward moving force of the cam 25a is converted into the rotational driving force of the lower cam pin 25e, that is, the rotational driving force of the rotary table rotating shaft 24 by the inclined surface 25p. Rotate clockwise. As a result, the chip turntable 23 and the chip holding unit 26 rotate clockwise, and the rotation angle position of the microchip held by the chip holding unit 26 is further changed.

  Then, the lower cam pin 25e rotates until it collides with the wall forming the pin fitting groove 25q, and when it collides with the wall, the rotation stops there. The cam 25a moves downward even after colliding with the wall, and the lower cam pin 25e moves along the wall and fits into the pin fitting groove 25q. When the lower cam pin 25e is fitted in the pin fitting groove 25q, the downward movement of the cam 25a is also stopped. As a result, the rotary table rotating shaft 24 rotates clockwise by a rotation angle corresponding to the moving distance from when the lower cam pin 25e contacts the inclined surface 25p until it collides with the wall of the pin fitting groove 25q. Will do.

In the present embodiment, a cam follower is provided on the outer peripheral surface of the rotary table rotating shaft 24 instead of the lower cam pin 25e, or a bearing is provided on the lower cam pin 25e. It is also possible to reduce the resistance of the steel and make it easier to rotate.
In this manner, the centrifugal force applying device 2 rotates the rotating table rotating shaft 24 in the clockwise direction by the push-up operation of the rotating table driving force transmission mechanism 27, so that the microchip 200 held by the chip holding unit 26 is rotated. The posture can be changed.

  In addition, the inclination direction of the inclined surface 25p constituting the lower end cam surface 25o is set to be the direction in which the rotary table rotating shaft 24 is rotated clockwise (inclination extending from the lower right to the upper left), and the rotation arm 20 when the centrifugal force is applied. Since the rotation direction is the clockwise direction, when the rotary arm 20 is rotated at high speed in the clockwise direction, the lower cam pin 25e is pressed against the wall forming the pin fitting groove 25q. Power is added. Accordingly, when the rotary arm 20 is rotated and a centrifugal force is applied, it is possible to prevent the rotating base rotary shaft 24 from rotating due to the centrifugal force. It is possible to prevent centrifugal force from being applied in the direction.

Further, the cam 25a is configured such that the inclination angle of the inclined surface 25m of the upper end cam surface 25j is steeper than the inclination angle of the inclined surface 25p of the lower end cam surface 25o. The force required when sliding along the inclined surface 25m can be made smaller than the force required when sliding the lower cam pin 25e along the inclined surface 25p.
Since the force applied to the cam 25a by the restoring force of the coil spring 25f is larger than the force applied to the cam 25a when pushed up by braking by the shock absorber 27c, the inclination angle of the inclined surface 25m is steeper than the inclined surface 25p. As a result, the force required to slide the upper cam pin 25d is reduced.

On the other hand, when the cam 25a moves downward, a larger force is applied than when the cam 25a is pushed up, so that the lower cam pin 25e slides along the inclined surface 25p even if there is no inclination angle as much as the inclined surface 25m. Therefore, the inclination angle of the inclined surface 25p is made smaller than the inclination angle of the inclined surface 25m, and accordingly, the height of the wall forming the back surface is made lower than that of the wall 25n.
That is, since the height of the wall (the position of the apex of the slope) can be reduced, the height of the cam 25a can be reduced accordingly. Further, since the stroke distance of the solenoid shaft 27b can be shortened by the height of the wall, the height of the wall 25n forming the back surface of the inclined surface 25m and the wall 25r forming the back surface of the inclined surface 25p are reduced. Compared with the case where the height is the same, the turntable driving force transmission mechanism 27 can be reduced in size.

  Further, since the cam 25a has a configuration in which the upper end cam surface 25j is provided at the upper end of the cylindrical shape and the lower end cam surface 25o is provided at the lower end, the solenoid shaft is more than the configuration in which only one of the cam surfaces is provided. The stroke distance of 27b can be shortened. For example, in the configuration in which the cam surface is provided only at the upper end, if the inclination length of the inclined surface is doubled, the stroke distance of the solenoid shaft 27b is doubled, leading to an increase in the size of the device such as increasing the solenoid shaft 27b. Measures are needed.

  Further, the rotary table rotating mechanism 25 and the rotary table driving force transmission mechanism 27 are separated, and the push-up force of the rotary table driving force transmission mechanism 27 is rotated by rotating the rotary table by the vertical movement of the cam 25a along the rotary table rotating shaft 24. Since the rotary table rotating shaft 24 does not need to be moved up and down in order to rotate the rotating table rotating shaft 24, the chip rotating table 23 and the chip holding unit 26 are moved up and down. It can be rotated on the spot without moving. This eliminates the need for a structure in which the tip rotating table 23, the rotating table rotating shaft 24, and the chip holding portion 26 are moved up and down (can be fixedly supported). For example, the rotation of the arm rotating shaft 21 becomes unbalanced, Even if an upward force is applied to these components, the components can be prevented from floating.

Next, the configuration of the optical measurement device 3 will be described.
FIG. 15 is a diagram illustrating a configuration of the optical measurement device 3. 2A is a plan view of the optical measuring device 3, and FIGS. 2B and 2C are side views of the optical measuring device 3. FIG.
As shown in FIGS. 15A to 15C, the optical measuring device 3 includes a sensor head 30, a slide rail 32, a slide rail 33, a slider 34, a slider 35, and a slide auxiliary member 36. It is configured.

  The slide rails 32 and 33 are linear slide rails, and the rotary arm 20 stops at a rotation angle position (hereinafter referred to as a measurement rotation angle position) rotated 90 ° clockwise relative to the posture detection rotation angle position. In this case, both are fixedly supported on the base 1 in parallel with a predetermined distance in the front-rear direction on the right side of the tip rotation mechanism portion with respect to the stop position of the tip rotation mechanism portion.

  Further, sliders 34 and 35 are mounted on the slide rails 32 and 33 so as to be slidable along the rail portions. The sliders 34 and 35 have attachment portions extending in the height direction so that the sensor head 30 is disposed above the slide rails 32 and 33. The sliders 34 and 35 are fixed to the sensor head 30 through the attachment portion. Then, by reciprocating the sliders 34 and 35 along the rail portion, the sensor head 30 is linearly moved in a direction approaching and separating from the chip rotation mechanism portion. The slide rails 32 and 33 are provided at positions where the measurement processing can be performed on the microchip 200 held by the chip holding unit 26 when the sensor head 30 is closest to the chip rotation mechanism unit.

  The slide auxiliary member 36 has an L shape in which one ends of the two prismatic members 36a and 36b are coupled (for example, screwed), and the other end of the lower prismatic member 36b in which the L shape is turned upside down. Is fixedly supported on the base 1 so that the upper prismatic member 36a passes between the slide rails 32 and 33 and is parallel to them, and the upper prismatic member 36a is positioned higher than the upper plate. Yes. Thereby, the upper side prism member 36a is fixedly supported on the base 1 in a state where the other end portion is directed straight in the direction in which the sensor head 30 approaches.

The sensor head 30 has sliders 34 and 35 fixed to the sensor head 30 attached to the slide rails 32 and 33 so as to be slidable along the rail portions. Are slidably fitted along the upper side prism member 36a so as to be arranged on the upper plate.
Therefore, when the sliders 34 and 35 slide along the rail portion, the sensor head 30 also slides in the same movement direction as the sliders 34 and 35 along the slide portion and the upper side prism member 36a.

  Note that the slide movement mechanism and the slide auxiliary member 36 by the slide rails 32 and 33 can suppress the vertical movement of the sensor head 30 when the sensor head 30 approaches and separates, while keeping the sensor head 30 parallel to the upper surface of the base 1. It can be surely moved straight in the direction approaching and separating from the tip rotation mechanism. Thereby, the positioning of the chip holding unit 260 and the sensor head 30 can be performed with high accuracy, and the sensor head 30 is brought into contact with the chip holding unit 26 at the measurement rotation angle position (hereinafter referred to as a measurement processing position). Reproducibility for accurate movement can be ensured.

The optical measuring device 3 further includes a mandrel 37, a return spring portion 38, a solenoid 39, a solenoid shaft 40, and a transmission member 41.
The mandrel 37 is a mandrel of the coil springs 38a and 38b of the return spring 38, has a spring stopper at the tip, and is a straight line in the longitudinal direction of the upper prism member 36a below the upper prism member 36a. The rear end portion is fixedly supported by the lower-side prismatic member 36b so that the longitudinal axis of the mandrel 37 is parallel to the longitudinal axis.

The return spring portion 38 includes coil springs 38a and 38b and a ring-shaped connecting member 38c.
The two coil springs 38a and 38b are connected via a connecting member 38c, and a mandrel 37 fixedly supported by the lower side prism member 36b is inserted inside the two connected springs. Further, a stopper is provided at the tip of the mandrel 37, and this stopper prevents the spring from coming off. Further, the connecting member 38c is provided so as to be slidable along the mandrel 37. When receiving an external force, the connecting member 38c moves along the mandrel 37 while expanding and contracting the coil springs 38a and 38b.

The solenoid 39 has the same configuration as the solenoid of the turntable driving force transmission mechanism 27, generates a magnetic flux by energizing an internal coil, magnetizes the movable core, and the magnetic core is moved to the fixed core side by this magnetic force. The movable iron core is linearly moved in the same direction as the sliding direction of the sensor head 30 (a linear motion force is generated).
The solenoid shaft 40 is inserted into a through-hole provided in the movable iron core of the solenoid 39 and is attached so as not to be relatively movable in the axial direction with respect to the movable iron core. And go straight ahead.

The transmission member 41 is coupled on the same straight line as the distal end portion of the solenoid shaft 40, the coupling member 38c, and the coupling portion (not shown) of the sensor head 30, and the linear movement force of the solenoid shaft 40 is converted into the return spring portion 38 and It is transmitted almost simultaneously to the sensor head 30.
FIG. 16 is a diagram illustrating an example of the slide movement operation of the sensor head 30.
With the above configuration, when the solenoid 39 is driven to move the solenoid shaft 40 straightly as shown in FIG. 16A, the optical measuring device 3 receives the linearly moving force by the transmission member 41 and the connecting member 38c. Is transmitted to the coil springs 38a and 38b through the sensor head 30 and is transmitted to the sensor head 30 through the coupling portion of the sensor head 30. As a result, as shown in FIG. 16B, the coil spring 38a contracts and the coil spring 38b extends due to the linear movement force transmitted through the connecting member 38c. On the other hand, the sliders 34 and 35 move together with the sensor head 30 along the rail portions of the slide rails 32 and 33 along the rail portions of the slide rails 32 and 33 by the linear movement force transmitted through the coupling portion of the sensor head 30.

  Further, in the state shown in FIG. 16B, when the drive of the solenoid 39 is stopped and the linear movement force in the approaching direction is removed from the coupling portion of the sensor head 30 and the connecting member 38c, the coil springs 38a and 38b are restored. Due to the force, a linear movement force is generated in a direction in which the sensor head 30 is separated from the chip rotation mechanism, and the sensor head 30 is linearly moved in the separation direction along the rail portions of the slide rails 32 and 33. Thereby, the sensor head 30 moves the distance from the state in which the coil springs 38a and 38b expand and contract to the original length in the separating direction.

Next, the configuration of the sensor head 30 will be described.
FIG. 17 is a diagram illustrating a configuration of the sensor head 30. FIGS. 9A and 9B are plan views of the sensor head 30 when moved to the measurement processing position, and FIG. 10C is a plan view of the light receiving head 30f. FIGS. e) is a side view of the sensor head 30 when moving to the measurement processing position.

As shown in FIGS. 17A and 17B, the sensor head 30 includes a substantially U-shaped light emitting head 30a and a light receiving head 30f formed from a resin member (insulating member) such as nylon. The light emitting head 30a is arranged above the light receiving head 30f so that the light emitting heads 30a face each other in the vertical direction at positions where the shapes overlap.
The light emitting head 30a includes a laser light emitting unit 30b having a configuration in which three light emitting elements are arranged in a straight line in the front-rear direction at the left end of the rear part among the parts located in front of and behind the substantially U-shaped depression. (A circled portion (upper side) in the figure) is provided.

The light emitting head 30a further includes three light emitting elements in a direction orthogonal to the arrangement direction of the laser light emitting portions 30b on the left side of the front portion of the portions located in front of and behind the substantially U-shaped depression. Laser light emitting portions 30c (a portion surrounded by a circle (lower side) in the figure) arranged in a straight line are provided.
Each of the light emitting elements of the laser light emitting sections 30b and 30c has a laser light input port at one end and a laser light irradiation port at the other end, and a through hole formed in the light emitting head 30a in a vertical direction for each light emitting element. Is disposed inside. The laser beam input port is disposed above the through hole, and the laser beam irradiation port is disposed below the through hole.

The laser light emitting units 30b and 30c have a configuration in which the periphery of each light emitting element except for both ends where the input port and the irradiation port are formed is surrounded by an insulating member.
An optical fiber (not shown), which is a laser light transmission path, is connected to the laser light input port side. In the laser light emitting units 30b and 30c, laser light from a laser light source (for example, a semiconductor laser) disposed inside the base 1 is input from the input ports of the laser light emitting units 30b and 30c via optical fibers. Then, the input laser beam is irradiated from the irradiation port.

In addition, the laser light emission parts 30b and 30c are comprised so that the wavelength of the laser beam to irradiate may each differ. In this case, the wavelength of the laser beam may be adjustable.
For example, if the sample liquid is blood, the wavelength of the laser light is set in a range of 700 to 1200 [nm] (range of near-infrared light). Thus, for example, when plasma components that have been centrifuged and mixed with a reagent having an absorbance component are irradiated with laser light having different wavelengths, oxygenated hemoglobin in the blood is obtained from the transmitted light or reflected light. The amount, deoxygenated hemoglobin amount, total hemoglobin amount, oxygenated myoglobin amount, deoxygenated myoglobin amount, total myoglobin amount, and the like can be measured.

  As shown in FIGS. 17A and 17B, the light emitting elements constituting the laser light emitting units 30b and 30c are arranged such that the center of the irradiation port is the center of the three measurement points of the measurement unit 200a of the microchip 200. When the sensor head 30 is at the measurement processing position and the attitude of the microchip 200 is the normal attitude rotation angle position, the measurement point of the measurement unit 200a and the light emitting element of the laser emission unit 30b are arranged at the same interval. Are arranged so as to be in a positional relationship facing each other in the vertical direction. When the sensor head 30 is at the measurement processing position and the posture of the microchip 200 is the right posture rotation angle position, the measurement point of the measurement unit 200a and the light emitting element of the laser light emitting unit 30c are opposed to each other in the vertical direction. They are arranged in a relationship.

  That is, when the sensor head 30 is in the measurement processing position at the measurement rotation angle position and the microchip 200 is in the normal rotation angle position, as shown in FIG. When the three irradiation ports face the three measurement points of the measurement unit 200a in the vertical direction and the posture of the microchip 200 is the right posture rotation angle position, as shown in FIG. The three irradiation ports 30c respectively oppose the three measurement points of the measurement unit 200a in the vertical direction.

On the other hand, as shown in FIG. 17 (c), the light receiving head 30f has three light receiving elements in the front-rear direction at the left end of the rear part among the parts located in front of and behind the substantially U-shaped depression. Are provided with a laser light receiving portion 30g (a portion surrounded by a circle (upper side) in the figure) arranged in a straight line.
The light receiving head 30f further includes three light receiving elements in the direction orthogonal to the arrangement direction of the laser light receiving portions 30g on the left side of the front portion among the portions located in front of and behind the substantially U-shaped depression. Laser light receiving portions 30h (a circled portion (lower side) in the drawing) arranged in a straight line are provided.

Specifically, each light receiving element is provided at a position facing each light emitting element of the laser light emitting units 30b and 30c in the vertical direction.
Each of the light receiving elements of the laser light receiving units 30g and 30h is composed of a light receiving element such as a photodiode. A light receiving unit for transmitted light is provided at one end, and an output unit for an electrical signal corresponding to the amount of light received at the other end. Each light receiving element is disposed in a through hole formed in a direction perpendicular to the light receiving head 30f. The light receiving portion is disposed toward the upper side of the through hole, and the output portion is disposed toward the lower side of the through hole.

The laser light receiving portions 30g and 30h have a configuration in which the periphery of each light receiving element except for both ends where the light receiving portion and the output portion are formed is surrounded by an insulating member.
A signal line (not shown) is connected to the output unit. The laser light receiving units 30g and 30h transmit the sensor signal from the light receiving unit to a control board (described later) via a signal line.
Further, as shown in FIGS. 17A and 17B, the sensor head 30 is positioned at the corner on the rear side of the right side in the outer peripheral portion of the chip holding portion 26 that faces in the horizontal direction when moved to the measurement processing position. The front side of the right side in the outer periphery of the support member 30d that fixes the position of the microchip 200 and the sensor head 30 by contacting the inclined surface in accordance with the inclination of the corner, and the chip holding part 26 that is also horizontally opposed. A support member 30e for fixing the position of the microchip 200 and the position of the sensor head 30 together with the support member 30d by contacting an inclined surface matched with the inclination of the corner portion at the corner portion.

As shown in FIGS. 17D and 17E, the light emitting head 30a and the light receiving head 30f are opposed to each other in the vertical direction with a gap at the same shape position. On the side, the support member 30e sandwiches the light emitting head 30a and the light receiving head 30f, so that both are fixedly supported while the gap is maintained.
Here, the gap is provided in order to position the light emitting element on the upper side of the measuring unit 200a and the light receiving element on the lower side of the microchip 200 held by the chip holding unit 26 during the measurement process. During the measurement process, the microchip 200 held by the chip holding unit 26 is sandwiched together with the chip holding unit 26. Therefore, between the light emitting head 30a and the light receiving head 30f, at least the thickness in the vertical direction formed by the microchip 200 held by the chip holding unit 26, the chip holding unit 26, and the chip turntable 23 is greater than or equal to. A gap is formed.

  Further, the sensor head 30 includes a support member 30d in the radial direction from the center of the rotary arm 20 in accordance with the position of the far left corner of the chip holding portion 26, and the far right corner of the chip holding portion 26. The support member 30e is attached in accordance with the position of the sensor member 30. When the sensor head 30 is brought close to the chip rotation mechanism part, each inclined surface of the support member 30e presses each corner part of the chip holding part 26. Thus, the chip holder 26 is fixedly supported at an accurate measurement processing position.

  With the above configuration, when the rotary arm 20 is stopped at the measurement rotation angle position, when the sensor head 30 is brought close to the measurement processing position, the microscopic gap is formed in the gap formed between the light emitting head 30a and the light receiving head 30f. A part of the chip holding part 26 to which the chip 200 is mounted and the chip turntable 23 are sandwiched, and the inclined surfaces of the support members 30d and 30e abut against the corners of the chip holding part 26, so that the support members 30d and 30e The corners of the chip holding part 26 are pressed by the force transmitted from the solenoid 39. Thereby, the chip holding part 26 and the sensor head 30 are fixed and supported accurately at the measurement processing position.

  The sensor head 30 further irradiates the microchip 200 with laser light by the laser light emitting unit 30b when the microchip 200 is in the normal posture rotation angle position under the control of a control board (described later). When the posture is the right posture rotation angle position, the laser light emitting unit 30c irradiates the measuring unit 200a with laser light.

Therefore, the laser light emitted from the three irradiation ports of the laser light emitting unit 30b passes through the three measurement points of the measuring unit 200a and is received by the three light receiving units of the laser light receiving unit 30g. Laser light emitted from the three irradiation ports passes through three measurement points of the measurement unit 200a and is received by the three light receiving units of the laser light receiving unit 30h.
With such a configuration, in the centrifugal force imparting device 2, two types of laser beams having different wavelengths with respect to the microchip 200 stopped at the measurement rotation angle position only by changing the attitude of the microchip 200 by 90 °. Measurement processing can be performed. In addition, it can also be set as the structure which performs a measurement process with respect to two measurement parts simultaneously by providing a measurement part in the position corresponding to the laser light emission parts 30b and 30c of the microchip 200, respectively.

FIG. 18 is a diagram illustrating an example of the sensor head 30 formed using a black insulating member.
Further, as shown in FIGS. 18A to 18C, the sensor head 30 has a function of absorbing laser light in a member forming a substantially U-shaped body of the light emitting head 30a and the light receiving head 30f. The member is used.

The light absorbing member is generated by adding a functional dye having a property of absorbing light having a wavelength in the near infrared region (wavelength: 780 to 3000 nm) to the member forming the bodies of the light emitting head 30a and the light receiving head 30f. can do.
For example, laser light can be absorbed by adding the following pigments or dyes to the resin material. For example, black such as ceramic black, iron oxide (inorganic pigment), carbon black, bone black (organic pigment), yellow such as chrome yellow, ceramic yellow, zinc chromate yellow (inorganic pigment), nickel azo green yellow (organic pigment) Green pigments such as pigments, hydrochrome oxide green, chromium green (inorganic pigments), chromium oxide dull green, phthalocyanine green (organic pigments), black pigments, cyanine pigments, phthalocyanine pigments, thiol nickel complex pigments, indophenols Dyes such as metal complex, naphthoquinone, azo, triazole methane, and intermolecular CT dyes can be used.

  Specifically, a black pigment such as ceramic black is added to an insulating resin material such as nylon forming the bodies of the light emitting head 30a and the light receiving head 30f to add a light absorbing function. Due to this light absorption function, the scattered light of the laser light emitted from each light emitting element of the light emitting head 30a is absorbed almost without being reflected by the body surfaces of the light emitting head 30a and the light receiving head 30f. Generation and the like can be reduced.

In addition to the light emitting head 30a and the light receiving head 30f, the light absorbing function can be added to these materials not only for the support members 30d and 30e. Thereby, since the reflected light from the support members 30d and 30e can also be reduced, generation | occurrence | production of the malfunction by the scattered light of a laser beam, etc. can be reduced more.
Further, as described above, since the light emitting head 30a and the light receiving head 30f are formed of an insulator, electrical interference between the light emitting elements provided in the light emitting head 30a can be reduced. Thereby, it is possible to reduce the occurrence of defects (wavelength change, etc.) to the laser light due to electrical interference.

Furthermore, it is possible to prevent noise from being applied to the metal member forming the plurality of light receiving elements provided in the light receiving head 30f, or to reduce the amount of noise. As a result, it is possible to prevent an error in the measurement result due to noise or to reduce the amount of error.
Next, the configuration of the temperature adjustment device 4 will be described.
FIG. 19 is a diagram illustrating an internal configuration of the temperature adjustment device 4.

As shown in FIG. 19, the temperature adjustment device 4 is provided inside the housing 54, the temperature control unit 50 provided on the side of the housing 54, and the inside of the housing 54, and controls the temperature inside the housing 54. A temperature sensor 51 to be measured, a fan 52, a heating element 53 for converting electric energy into heat, and a temperature sensor 55 disposed in the vicinity of the light receiving head 30f are configured.
The temperature adjustment unit 50 measures the temperature inside the housing 54 and the temperature near the light receiving head 30f based on the voltage values input from the temperature sensors 51 and 55, and the temperature measured by the temperature measurement unit And a calorific value control unit for controlling the calorific value of the heat generating element 53 according to the above.

Usually, in order to obtain a stable sensor signal from the light receiving element, the heat generation amount is controlled based on the input from the temperature sensor 55 so as to keep the temperature in the vicinity of the light receiving head 30f constant. On the other hand, when it is determined by the input from the temperature sensor 51 that the temperature inside the housing 54 has increased significantly, special control such as stopping the supply of electric energy to the heating element 53 is performed.
The temperature sensors 51 and 55 are composed of thermocouples, and each output a voltage signal corresponding to a temperature difference in the vicinity of the arrangement position to the temperature control unit 50.

The fan 52 is a fan for blowing air that is driven by a motor, and is disposed in the vicinity of the heating element 53 in a direction in which air is blown toward the heating element 53. Note that the temperature control unit 50 may be configured to control the temperature by controlling not only the amount of heat generated by the heating element 53 but also the rotational speed of the fan 52 and the like.
The heating element 53 is composed of a member that converts electrical energy, such as a resistance heating element, into heat. The heating element 53 converts the electrical energy supplied from the temperature control unit 50 into heat, and the air inside the housing 54 is converted by this heat. Warm up.

FIG. 20 is a diagram illustrating an example of the air flow inside the sample liquid analyzer 100.
When the temperature adjusting unit 50 supplies electric energy to the heat generating body 53 by the temperature adjusting device 4, the electric energy is converted into heat in the heat generating body 53, and the air inside the housing 54 is warmed by this heat. On the other hand, the fan 52 is always rotating at a constant rotational speed, and the air heated by the heat generated by the heating element 53 passes through the inside of the base 1 by the wind generated by the fan 52 as shown in FIG. Move upward toward the top plate.

FIG. 21 is a diagram illustrating an example of the air flow in the upper surface portion of the base 1.
Then, as shown in FIG. 21, the air that has reached the lower surface of the upper plate passes through the vent 10 provided in the upper plate and enters a space formed by the upper surface portion of the base 1 and the light shielding cover 5. And flows in. The air flowing into the space warms the air around the centrifugal force applying device 2 and the optical measuring device 3, moves to the inside of the base 1 through the vent hole 11, and passes through the inside of the base 1. By returning to the inside of the housing 54, the inside of the sample liquid analyzer 100 is circulated.

  In this way, warm air generated by the temperature adjusting device 4 is appropriately circulated to warm the temperature in the space formed by the upper surface portion of the base 1 and the light shielding cover 5 and to keep the temperature in the space constant. Therefore, the temperature of the sample solution and the reagent injected into the sample solution reservoir in the microchip 200 can be kept constant. Further, it is possible to eliminate or reduce an error caused by a change in characteristics of the light receiving element with respect to a temperature change in the light receiving head 30f.

In addition, an opening / closing shutter 15 is provided for the ventilation opening 10, and the size of the opening of the ventilation opening 10 is adjusted by adjusting the opening / closing amount of the opening / closing shutter 15, and the upper surface portion of the base 1 and the light shielding cover. The amount of warmed air that flows into the space formed from the space 5 can be adjusted.
Next, the configuration of the control board 300 will be described.
FIG. 22 is a block diagram illustrating a configuration of the control board 300.

  As shown in FIG. 22, the control board 300 includes a CPU 302 that controls operations and the entire system based on a control program, a ROM 304 that stores a control program for the CPU 302 in a predetermined area, and data read from the ROM 304. And RAM 306 for storing calculation results required in the calculation process of CPU 302, and drive command output I / F 308, sensor input I / F 310, and communication I / F 312 that mediate input / output of data to / from an external device. These are connected to each other via a bus which is a signal line for transferring data so that data can be exchanged.

The drive command output I / F 308 is connected to the drive circuit 22b, the solenoid 28 of the turntable driving force transmission mechanism 27, and the solenoid 39. Therefore, the CPU 302 outputs a control signal to the drive circuit 22b and the solenoids 28 and 39 via the drive command output I / F 308.
Connected to the sensor input I / F 310 are an attitude sensor 14, a measurement sensor 31a including a laser light emitting unit 30b and a laser light receiving unit 30g, and a measurement sensor 31b including a laser light emitting unit 30c and a laser light receiving unit 30h. Therefore, the CPU 302 inputs sensor signals from the attitude sensor 14 and the measurement sensors 31a and 31b via the sensor input I / F 310.

An external computer (not shown) is connected to the communication I / F 312. Therefore, the CPU 302 communicates with an external computer via the communication I / F 312.
The CPU 302 activates a control program stored in a predetermined area such as the ROM 304, and executes chip set processing, motor origin determination processing, and sample liquid analysis processing shown in the flowcharts of FIGS. 23 to 25 in accordance with the control program.

First, chip set processing will be described.
FIG. 23 is a flowchart showing chipset processing.
The chip set process is a process for confirming whether or not measurement is possible when the microchip 200 is mounted on the chip holding unit 26. When the chip set process is executed in the CPU 302, as shown in FIG. The process proceeds to S100.

In step S100, it is determined whether the light shielding cover 5 is opened based on a sensor signal from an open / close sensor (not shown) provided on the light shielding cover 5, and when it is determined that the light shielding cover 5 is not opened. For (No), the process proceeds to step S102.
In step S102, it is determined whether the various sensors 14, 31a, 31b, etc. are outputting safety signs indicating that they are safe. If it is determined that a safety sign is being output (Yes), step S104 is performed. Migrate to

In step S104, the ALC signal is input from the drive circuit 22b, and after waiting for a predetermined time (for example, 10 [ms] or more) after the ALC signal is input, the process proceeds to step S106, and the ALC is performed based on the input ALC signal. Is determined to be normal, and when it is determined that ALC is normal (Yes), the process proceeds to step S108.
In step S108, a message indicating that the mounting of the microchip 200 is completed and measurement is possible is displayed on a display device (not shown) such as a liquid crystal display, and a series of processing is terminated and the original processing is restored.

On the other hand, when it is determined in step S106 that the ACL is not normal (No), the process proceeds to step S104.
On the other hand, when it is determined in step S102 that the various sensors 14, 31a, 31b, etc. do not output a safety sign (No), the process proceeds to step S110 and an error message indicating that the positions of the solenoids 28, 39 should be confirmed. Is displayed on the display device, and the process proceeds to step S102.

  On the other hand, when it is determined in step S100 that the light shielding cover 5 is open (Yes), the process proceeds to step S112, and an error message to the effect that the microchip 200 should be attached and the light shielding cover 5 should be closed is displayed on the display device. Display, and the process proceeds to step S100.

Next, motor origin determination processing will be described.
FIG. 24 is a flowchart showing motor origin determination processing.
The motor origin determination process is a process of driving the stepping motor 22a and the solenoid 39 to check whether the origin can be determined. When executed in the CPU 302, first, as shown in FIG. Transition.
In step S200, it is determined whether or not the light shielding cover 5 is opened based on a sensor signal from an open / close sensor provided on the light shielding cover 5, and when it is determined that the light shielding cover 5 is not opened (No). The process proceeds to step S202.

In step S202, it is determined whether the various sensors 14, 31a, 31b, etc. are outputting safety signs indicating that they are safe. If it is determined that a safety sign is being output (Yes), step S204 is performed. Migrate to
In step S204, the ALC signal is input from the drive circuit 22b, and after waiting for a predetermined time (for example, 10 [ms] or more) after the ALC signal is input, the process proceeds to step S206, and the ALC is based on the input ALC signal. Is determined to be normal, and when it is determined that the ALC is normal (Yes), the process proceeds to step S208.

  In step S208, a control signal indicating that the stepping motor 22a is rotated at a low speed is output to the drive circuit 22b, and the process proceeds to step S210 to determine whether or not the sensor signals of ON1 to ON3 are input from the attitude sensor 14. It is determined whether or not the detected portions 26c to 26e are detected by the posture sensor 14, and when it is determined that the detected portions 26c to 26e are detected by the posture sensor 14 (Yes), the posture detection rotation angle position is determined. Since the rotary arm 20 is positioned at step S212, the process proceeds to step S212, a control signal indicating that the stepping motor 22a is to be stopped is output to the drive circuit 22b, and the process proceeds to step S214.

  In step S214, a control signal indicating that the stepping motor 22a is rotated 90 [°] is output to the drive circuit 22b in order to rotate the rotating arm 20 stopped at the posture detection rotation angle position to the measurement rotation angle position. The process proceeds to step S216, a control signal indicating that the servo of the stepping motor 22a is turned off is output to the drive circuit 22b, and the process proceeds to step S218.

In step S218, the sensor head 30 is brought close to the measurement processing position in order to confirm whether or not the sensor head 30 can be brought into contact with the microchip 200 held by the chip holding unit 26 to shift to a measurable state. Is output to the solenoid 39, and the process proceeds to step S220.
In step S220, a control signal indicating that the servo of the stepping motor 22a is to be turned on is output to the drive circuit 22b, the process proceeds to step S222, and a message indicating that the origin has been determined is displayed on the display device. End the process and return to the original process.

On the other hand, if it is determined in step S210 that the detected portions 26c to 26e cannot be detected by the posture sensor 14 (No), the rotary arm 20 is not positioned at the posture detection rotation angle position, and the process proceeds to step S208.
On the other hand, when it is determined in step S206 that the ACL is not normal (No), the process proceeds to step S204.

On the other hand, when it is determined in step S202 that the various sensors 14, 31a, 31b, etc. do not output a safety sign (No), the process proceeds to step S224 and an error message indicating that the positions of the solenoids 28, 39 should be confirmed. Is displayed on the display device, and the process proceeds to step S202.
On the other hand, when it is determined in step S200 that the light shielding cover 5 is opened (Yes), the process proceeds to step S226, and an error message indicating that the light shielding cover 5 should be closed is displayed on the display device. Transition.

Next, the sample liquid analysis process will be described.
FIG. 25 is a flowchart showing the sample liquid analysis process.
In the sample liquid analysis process, centrifugal force is applied to the microchip 200 held by the chip holding unit 26 to separate the components of the sample liquid, the separated components and the reagents are mixed, and the components after the reagent mixing. When the CPU 302 executes the process, first, the process proceeds to step S300 as shown in FIG.

  In step S300, a control signal indicating that the stepping motor 22a is rotated in the first drive pattern is output to the drive circuit 22b. A drive pattern means the operation pattern of the stepping motor 22a driven based on a drive speed profile. The driving speed profile indicates a pattern of acceleration, deceleration, steady speed or stop of the stepping motor 22a. For example, how much the top speed of the stepping motor 22a is set, how much the acceleration or deceleration is set. The contents such as whether to set are specified.

  Next, the process proceeds to step S302, a control signal indicating that the stepping motor 22a is rotated in the second drive pattern is output to the drive circuit 22b, and the process proceeds to step S304 to determine whether the stepping motor 22a is stopped. If it is determined that it has been stopped (Yes), the process proceeds to step S306. If not (No), the process waits in step S304 until the stepping motor 22a stops.

Next, the process of steps S306 to S316 will be described. The processing in steps S306 to S316 is temporary origin movement processing for rotating the rotary arm 20 to the posture detection rotation angle position.
In step S306, a control signal indicating that the stepping motor 22a is rotated at a low speed is output to the drive circuit 22b, and the process proceeds to step S308 to determine whether or not the sensor signals of ON1 to ON3 are input from the attitude sensor 14. It is determined whether or not the detected portions 26c to 26e are detected by the posture sensor 14, and when it is determined that the detected portions 26c to 26e are detected by the posture sensor 14 (Yes), the posture detection rotation angle position is determined. Since the rotary arm 20 is positioned at step S310, the process proceeds to step S310, and a control signal indicating that the stepping motor 22a is to be stopped is output to the drive circuit 22b, and the process proceeds to step S318.

  On the other hand, when it is determined in step S308 that the detected portions 26c to 26e cannot be detected by the posture sensor 14 (No), the rotary arm 20 is not positioned at the posture detection rotation angle position, and the process proceeds to step S312. Then, after outputting the control signal in step S306, it is determined whether or not a predetermined time sufficient for one rotation of the rotary arm 20 has elapsed. If it is determined that the predetermined time has elapsed (Yes), step S314 is performed. Migrate to

In step S314, an error message indicating that a failure such as breakage of the chip holding unit 26 or dropout of the microchip 200 has occurred is displayed on the display device. To return to the original process.
On the other hand, when it is determined in step S312 that the predetermined time has not elapsed (No), the process proceeds to step S306.

Next, the process of steps S318 to S324 will be described. The processing in steps S318 to S324 is posture change processing for changing the posture of the microchip 200 at the posture detection rotation angle position.
In step S318, a control signal indicating that the pusher 27g is raised is output to the solenoid 28, and the process proceeds to step S320, and a control signal indicating that the pusher 27g is lowered is output to the solenoid 28. By one processing of steps S318 and S320, the chip turntable 23 and the chip holding unit 26 rotate 45 [°]. Along with this, the microchip 200 also rotates [°] 45 integrally with the chip holder 26.

Next, the process proceeds to step S322, and it is determined whether or not the processes of steps S318 and S320 have been executed twice. When it is determined that the processes have been executed twice (Yes), the process proceeds to step S324.
In step S324, based on the sensor signal from the attitude sensor 14, it is determined whether or not the attitude of the microchip 200 has been appropriately rotated by 90 [°]. Since the tip turntable 23 and the tip holder 26 rotate clockwise from the structure of the turntable driving force transmission mechanism 27, the sensor signal from the posture sensor 14 before rotation and the sensor signal from the posture sensor 14 after rotation. And based on the comparison result, it is determined whether or not the phase is advanced by 90 [°] before and after the rotation. For example, when the posture before rotation of the microchip 200 is the normal posture rotation angle position, it should be the right posture rotation angle position after the rotation, and therefore, based on the sensor signal from the posture sensor 14 after rotation. When it is determined that the position is not the right attitude rotation angle position, it is determined that the attitude of the microchip 200 is not properly rotated by 90 [°]. In this case, it can be determined that a failure such as breakage of the chip holding unit 26 or dropout of the microchip 200 has occurred during rotation. On the other hand, when it is determined that the position is the right attitude rotation angle position, it is determined that the attitude of the microchip 200 is appropriately rotated by 90 [°].

As a result of step S324, when it is determined that the attitude of the microchip 200 is appropriately rotated by 90 [°] (Yes), the process proceeds to step S326, but when it is determined that it is not (No), the process proceeds to step S314. To do.
On the other hand, when it is determined in step S322 that the processes in steps S318 and S320 are not executed twice (No), the process proceeds to step S318.

On the other hand, in step S326, a control signal indicating that the stepping motor 22a is rotated in the third drive pattern is output to the drive circuit 22b, and the process proceeds to step S328 to rotate the stepping motor 22a in the fourth drive pattern. The control signal shown is output to the drive circuit 22b, and the process proceeds to step S330.
In step S330, a control signal indicating that the stepping motor 22a is rotated in the fifth drive pattern is output to the drive circuit 22b, and the process proceeds to step S332 to indicate that the stepping motor 22a is rotated in the sixth drive pattern. The signal is output to the drive circuit 22b, and the process proceeds to step S334.

In step S334, it is determined whether or not the processes of steps S330 and S332 have been executed 27 times. When it is determined that the processes have been executed 27 times (Yes), the process proceeds to step S336.
In step S336, a control signal indicating that the stepping motor 22a is rotated in the seventh drive pattern is output to the drive circuit 22b, the process proceeds to step S338, and temporary origin movement processing similar to steps S306 to S316 is performed. The process proceeds to step S340.

In step S340, a control signal indicating that the stepping motor 22a is rotated by 90 [°] is output to the drive circuit 22b in order to rotate the rotating arm 20 stopped at the posture detection rotation angle position to the measurement rotation angle position. The process proceeds to step S342.
In step S342, a first measurement process for performing the first measurement process on the measurement unit 200a of the microchip 200 is executed. In the first measurement processing, a control signal indicating that the sensor head 30 is brought close to the measurement processing position is output to the solenoid 39, a control signal indicating execution of measurement is output to the measurement sensor 31a, and a sensor signal is input from the measurement sensor 31a. Then, a control signal indicating that the sensor head 30 is separated from the measurement processing position is output to the solenoid 39.

Next, the process proceeds to step S344, the first measurement result data indicating the input sensor signal is output to the external computer, the process proceeds to step S346, and the temporary origin movement process similar to steps S306 to S316 is executed. The process proceeds to S348, the posture changing process similar to that in steps S318 to S324 is executed, and the process proceeds to step S350.
In step S350, a control signal indicating that the stepping motor 22a is rotated by 90 [°] is output to the drive circuit 22b in order to rotate the rotating arm 20 stopped at the posture detection rotation angle position to the measurement rotation angle position. The process proceeds to step S352.

  In step S352, a second measurement process for performing a second measurement process on the measurement unit 200a of the microchip 200 is executed. In the second measurement process, a control signal indicating that the sensor head 30 is approached to the measurement process position is output to the solenoid 39, a control signal indicating execution of measurement is output to the measurement sensor 31b, and a sensor signal is input from the measurement sensor 31b. Then, a control signal indicating that the sensor head 30 is separated from the measurement processing position is output to the solenoid 39.

Next, the process proceeds to step S354, the second measurement result data indicating the input sensor signal is output to the external computer, the process proceeds to step S356, and a message indicating that the measurement is completed is displayed on the display device. End the process and return to the original process.
On the other hand, when it is determined in step S334 that the processes of steps S330 and S332 have not been executed 27 times (No), the process proceeds to step S330.

Next, the operation of the present embodiment will be described.
Hereinafter, the actual operation of the sample liquid analyzer 100 in the case where blood is used as the measurement target sample liquid and the blood absorbance measurement is performed using the blood analysis microchip 200 will be described.
The microchip 200 for blood analysis includes at least a blood reservoir for collecting blood collected from a measurement subject, three reagent reservoirs for collecting reagents, and a first centrifugal direction (the orientation of the microchip 200 is the left orientation rotational angle position). A microcapillary channel (for example, U-shaped) having a structure for centrifuging blood in a blood reservoir into a blood cell component and a plasma component in response to the application of a centrifugal force to the rotating arm 20 in the longitudinal direction at the time Centrifugal force formed in the second centrifugal direction (the outward direction in the longitudinal direction of the rotary arm 20 when the microchip 200 is in the normal posture rotation angle position). A weighing unit that weighs the plasma component in accordance with the application, a mixing unit that mixes the weighed plasma component and the reagent in the reagent reservoir, and the absorbance of the reagent-mixed plasma component Measuring portion 200a having three measurement points for performing constant is formed. The weighing unit is configured to weigh plasma components to obtain three measurement target components, and the mixing unit mixes the three measurement target components and the reagent. Note that the reagents to be mixed usually differ depending on the measurement target and measurement content, and the same type of reagent may be mixed for the three measurement target components, or different reagents may be mixed. Here, since the absorbance measurement is performed, the reagent for adding the light absorption function to the measurement object is stored in the three reagent reservoirs.

  In addition, the sample liquid analyzer 100 generates a control signal for each control target by causing the control board 300 to execute a control program, and controls each control target using the generated control signal. (2) Weighing the separated component (plasma) after centrifugation, mixing the separated component and the reagent, and moving the separated component mixed with the reagent to the measuring unit, (3) going to the measuring unit Irradiation of the laser beam of the first wavelength to the separated component that has moved and reception of each transmitted light, (4) output of the first measurement result data that is the measurement result of the first wavelength to an external computer, and (5) to the measurement unit And 6 steps of automatically irradiating the separated component that has moved and receiving the laser light of the second wavelength and receiving each transmitted light, and (6) outputting the second measurement result data as the measurement result of the second wavelength to the external computer. To start There.

  When the sample liquid analyzer 100 is turned on, first, the temperature adjustment device 4 is driven, and by supplying electric energy from the temperature adjustment unit 50, the heating element 53 generates heat to warm the surrounding air, and the fan 52 Driven to send warmed air into the base 1. The air sent into the inside of the base 1 flows into the space formed by the upper surface portion of the base 1 and the light shielding cover 5 through the vent 10 and raises the temperature in the space.

Further, the temperature adjustment unit 50 measures the temperature in the space near the light receiving head 30f by the input voltage from the temperature sensor 55 disposed in the vicinity of the sensor head 30 so that the measured temperature approaches the set temperature. In addition, the amount of power supplied to the heating element 53 is adjusted so as to be kept constant.
On the other hand, the blood of the measurement subject (for example, 20 [μl]) is injected into the blood reservoir formed on the microchip 200. The microchip 200 into which blood has been injected into the blood reservoir is attached to the chip holder 26 at one end of the rotary arm 20. At this time, the posture of the microchip 200 is set to the left posture rotation angle position. Note that an unused microchip 200 (or a dummy chip) is attached to the chip holding portion 26 at the other end of the rotary arm 20 to balance the weight balance at both ends.

FIG. 26 is a diagram illustrating an operation when a centrifugal force is applied.
When the microchip 200 is mounted on the chip holding unit 26 and a start button (not shown) is pressed, first, the process (1) including the first centrifugation control is performed through steps S300 to S304.
When step (1) is started, a control signal to be supplied to the drive circuit 22b is generated on the control board 300, and the generated control signal is supplied to the drive circuit 22b. The drive circuit 22b switches ON / OFF of the switching circuit based on the supplied control signal, and supplies a phase current to the stepping motor 22a. By supplying this phase current, the stepping motor 22a is rotationally driven, and this rotational driving force is transmitted to the arm rotating shaft 21 to rotate the arm rotating shaft 21. When the arm rotation shaft 21 rotates, the rotation arm 20 to which the arm rotation shaft 21 is coupled rotates clockwise as shown in FIG. Here, a rotating arm at a rotation speed (for example, 3000 [times / minute]) and a rotation time (for example, 15 minutes) sufficient to separate the injected blood (whole blood) into a blood cell component and a plasma component 20 is rotated at high speed. This rotation gives a centrifugal force in the first centrifugal direction. Then, when the rotary arm 20 is rotated for a necessary time, the step (1) is completed, and the whole blood injected into the blood reservoir of the microchip 200 is centrifuged into a blood cell component and a plasma component.

When the step (1) is completed, the step (2) including the second centrifugation control is subsequently performed through steps S306 to S336.
When the process (2) is started, first, the arm rotation mechanism 22 is driven in response to a control signal from the control board 300, and the chip holding unit 26 holding the measurement target microchip 200 is changed to FIG. As shown in b), the rotary arm 20 is rotated to the posture detection rotation angle position so as to stop at the posture detection rotation angle position, and stopped at that position.

The rotation angle position of the rotary arm 20 is detected by detecting the detected portion 26e by the attitude sensor 14. At this time, when a failure such as breakage of the chip holding unit 26 or dropout of the microchip 200 occurs, the posture detection rotation angle position cannot be determined depending on the detection result of the posture sensor 14, so that the control is performed through step S316. Is interrupted.
In step (2), since it is necessary to apply a centrifugal force in the second centrifugal direction, the posture of the microchip 200 is changed.

  First, in order to change the attitude of the microchip 200, the control board 300 outputs a control signal to the turntable driving force transmission mechanism 27, drives the solenoid body 27a, and applies an impact to the solenoid shaft 27b with the shock absorber 27c. While being relaxed, it is moved straight upward, and the transmitting portion 25c facing the pusher 27g in the vertical direction is pushed up by the pusher 27g. As a result, the cam 25 a formed integrally with the transmission portion 25 c is pushed up along the rotary base rotating shaft 24.

  When the cam 25a is pushed up, the push-up force is converted into the turning force of the turntable rotating shaft 24 by the upper end cam surface 25j and the upper cam pin 25d, and the turntable rotating shaft 24 rotates clockwise. Thereafter, when the drive of the solenoid body 27a is stopped, in the rotating base rotating mechanism 25, the cam 25a moves linearly downward along the rotating base rotating shaft 24 by the restoring force of the coil spring 25f, and the lower end cam surface 25o, By the lower cam pin 25e, the downward movement force of the cam 25a is converted into the rotational force of the rotary base rotating shaft 24, and the rotary base rotating shaft 24 further rotates clockwise.

FIG. 27 is a diagram illustrating an operation when the attitude of the microchip 200 is changed.
Here, the inclined surface 25m of the upper end cam surface 25j and the inclined surface of the lower end cam surface 25o so that the rotary table rotating shaft 24 is rotated 45 [°] clockwise by one vertical movement of the cam 25a. 25p is configured with an appropriate inclination angle and number, and the upper cam pin 25d and the lower cam pin 25e are configured with an appropriate number.

Therefore, as shown in FIG. 27 (a), the rotation of the rotary table rotating shaft 24 by one push-up operation (the vertical movement of the cam 25a) causes the chip rotary table 23 and the chip holding unit 26 to rotate 45 [° clockwise. ]Rotate. That is, the posture of the microchip 200 is changed to a posture rotated 45 [°] clockwise.
In order to orient the microchip 200 in the second centrifugal direction, it is necessary to set the attitude of the microchip 200 to the normal attitude rotation angle position, so the push-up operation is performed once again in the same procedure, and the attitude of the microchip 200 is further increased. The posture is changed to 45 [°] clockwise.

As a result, as shown in FIG. 27 (b), the microchip 200 is rotated 90 [°] clockwise relative to the posture shown in FIG. 26 (b) corresponding to the first centrifugal direction.
The attitude of the microchip 200 is detected by detecting the detected parts 26 c to 26 e by the attitude sensor 14. At this time, if the posture of the microchip 200 is the normal posture rotation angle position, the irradiated light can be reflected by the detected portion 26d by the posture sensor 14, and the reflected light can be received. Since the reflectance is different from that of 26c and 26e, it can be detected that the attitude of the microchip 200 is the normal attitude rotation angle position by the reflected light from the detected part 26d. Further, when a failure such as breakage of the chip holding unit 26 or dropout of the microchip 200 occurs, it is determined that the attitude of the microchip 200 is appropriately rotated by 90 [°] depending on the detection result of the attitude sensor 14. Therefore, the control is interrupted through step S316.

  When the attitude of the microchip 200 reaches the normal attitude rotation angle position, the control board 300 outputs a control signal to the arm rotation mechanism 22 to drive the arm rotation mechanism 22 and weigh the plasma component after centrifugation. The rotary arm 20 is rotated at a high speed with a sufficient rotation speed and rotation time. This rotation gives a centrifugal force in the second centrifugal direction. Then, when the rotary arm 20 is rotated for a necessary time, the step (2) is completed, the plasma components are weighed and the three plasma components to be measured are collected in the three weighing sections, and the three plasma components weighed are measured. And three reagent reservoir reagents are mixed, and the mixed plasma components move to corresponding points in the three measurement points of the measurement unit 200a.

FIG. 28 is a diagram illustrating an operation during the measurement process of the optical measurement device 3.
When the step (2) is completed, the step (3) including the first measurement process is subsequently performed through steps S338 to S342.
When the step (3) is started, the control board 300 drives the arm rotation mechanism 22 in order to make the measurement unit 200a face the sensor head 30, and as shown in FIG. The rotary arm 20 is rotated to a measurement rotation angle position rotated 90 [deg.] Clockwise from the position, and stopped at that position.

  When the rotary arm 20 stops at the measurement rotation angle position, the control board 300 outputs a control signal for driving the solenoid 39 to the solenoid 39. As a result, the solenoid 39 is driven, the solenoid shaft 40 moves straight, and the transmission member 41 coupled to itself moves straight. The transmission member 41 transmits the linear motion force of the solenoid shaft 40 to the return spring portion 38 and the sensor head 30 substantially simultaneously via the connecting member 38c. As a result, the sensor head 30 to which the sliders 34 and 35 are fixed is moved by the linear motion force transmitted through the coupling portion of the sensor head 30, as shown in FIG. It moves straight along the rail portions of the rails 32 and 33 in a certain direction (left direction) of the chip holding portion 26 holding the microchip 200. The sensor head 30 moves straight until the support members 30 d and 30 e abut on the corners of the chip holding unit 26. Then, by pressing the corners of the chip holding unit 26 with the support members 30d and 30e, the chip holding unit 26 and the sensor head 30 are positioned at the measurement processing position, and the positions are fixedly supported.

  When the sensor head 30 moves to the measurement processing position, the control board 300 outputs a control signal to the measurement sensor 31a, drives the laser light emitting unit 30b, and emits the first wavelength laser light from the three light emitting elements. Irradiation is performed toward three measurement points of the measurement unit 200a facing each other in the vertical direction. The irradiated laser light of the first wavelength passes through the plasma components after mixing the reagents present at the three measurement points, and the transmitted light is received by the three light receiving elements of the laser light receiving unit 30g. And the sensor signal according to the light quantity of this received transmitted light is output to the control board 300 via a signal line. Further, the solenoid 39 is turned off under the control of the control board 300, and the step (3) is completed. When the solenoid 39 is turned off, the sensor head 30 is separated from the chip rotation mechanism by the restoring force of the coil springs 38a and 38b, and returns to the initial position.

When the process (3) is completed, the process (4) is performed through the step S344.
When the process (4) is started, the control board 300 outputs the first measurement result data indicating the sensor signal from the light receiving element to the external computer, and the process (4) is completed.
When the step (4) is completed, the step (5) including the second measurement process is subsequently performed through steps S346 to S352.

When the step (5) is started, the control board 300 drives the arm rotation mechanism 22 to rotate 90 [°] counterclockwise from the measurement rotation angle position as shown in FIG. 27 (b). The rotary arm 20 is rotated to the posture detection rotation angle position and stopped at that position.
The rotation angle position of the rotary arm 20 is detected by detecting the detected part 26d by the attitude sensor 14. At this time, when a failure such as breakage of the chip holding unit 26 or dropout of the microchip 200 occurs, the posture detection rotation angle position cannot be determined depending on the detection result of the posture sensor 14, so that the control is performed through step S316. Is interrupted.

Further, the control board 300 drives the turntable driving force transmission mechanism 27 to perform the push-up operation twice, and rotates the attitude of the microchip 200 by 90 [°] clockwise from the current normal attitude rotation angle position. Change to the right posture rotation angle position.
The attitude of the microchip 200 is detected by detecting the detected parts 26 c to 26 e by the attitude sensor 14. At this time, if the posture of the microchip 200 is the right posture rotation angle position, the irradiated light can be reflected by the detected portion 26c by the posture sensor 14, and the reflected light can be received. Since the reflectance is different from that of 26d and 26e, it is possible to detect that the posture of the microchip 200 is the right posture rotation angle position by the reflected light from the detected portion 26c. Further, when a failure such as breakage of the chip holding unit 26 or dropout of the microchip 200 occurs, it is determined that the attitude of the microchip 200 is appropriately rotated by 90 [°] depending on the detection result of the attitude sensor 14. Therefore, the control is interrupted through step S316.

Next, the control board 300 drives the arm rotation mechanism 22 to make the measurement unit 200a face the sensor head 30, and as shown in FIG. °] The rotary arm 20 is rotated to the rotated measurement rotation angle position and stopped at that position.
When the rotary arm 20 stops at the measurement rotation angle position, the control board 300 moves the sensor head 30 in the same manner as in the step (3), and the support member 30d, 30e causes the chip holding unit 26 and the sensor to move at the measurement processing position. Positioning with the head 30 is performed and the position is fixedly supported.

  When the sensor head 30 moves to the measurement processing position, the control board 300 outputs a control signal to the measurement sensor 31b, drives the laser emission unit 30c, and emits laser light having a second wavelength different from the first wavelength. Irradiation is performed from three light emitting elements toward three measurement points of the measurement unit 200a facing each other in the vertical direction. The irradiated laser light of the second wavelength passes through the plasma components after mixing the reagents respectively present at the three measurement points, and the transmitted light is received by the three light receiving elements of the laser light receiving unit 30h. And the sensor signal according to the light quantity of this received transmitted light is output to the control board 300 via a signal line. Further, the solenoid 39 is turned off under the control of the control board 300, and the step (5) is completed. When the solenoid 39 is turned off, the sensor head 30 is separated from the chip rotation mechanism by the restoring force of the coil springs 38a and 38b, and returns to the initial position.

When the step (5) is completed, the step (6) is performed through the step S354.
When the process (6) is started, the control board 300 outputs the second measurement result data indicating the sensor signal from the light receiving element to the external computer, and the process (6) is completed.
The external computer analyzes the oxygenated hemoglobin amount, deoxygenated hemoglobin amount, total hemoglobin amount, etc. in the plasma based on the first measurement result data and the second measurement result data from the control board 300.

  In this manner, in the present embodiment, the rotating arm 20 that can rotate around the vertical axis, the arm rotating mechanism 22 that rotates the rotating arm 20, and the chip holding unit 26 that holds the microchip 200, A rotary table 20 provided at a position away from the center of rotation of the rotary arm 20 and capable of rotating the chip holder 26 around a vertical axis; and a rotary table rotating mechanism 25 for rotating the chip rotary table 23; Measurement sensors 31a and 31b that can irradiate laser light to the measurement unit 200a of the microchip 200 held by the chip holding unit 26 at the measurement rotation angle position and receive the transmitted light, and the outer peripheral surface of the microchip 200 are exposed. The two to-be-detected portions 26c and 26d that are provided in the portion and have different light reflection characteristics When the posture of 200 is the normal posture rotation angle position, the detected portion 26d is irradiated with laser light, and when the posture of the microchip 200 is the right posture rotation angle position, the detected portion 26c is irradiated with laser light and the reflected light is received. And a first centrifugal control that holds the posture of the microchip 200 at the left posture rotation angle position and rotates by the arm rotation mechanism 22, and the posture of the microchip 200 at the normal posture rotation angle position. The second centrifuge control that holds and rotates by the arm rotation mechanism 22 is performed.

  As a result, the attitude sensor 14 can detect that the attitude of the microchip 200 is the normal attitude rotation angle position or the right attitude rotation angle position. Can be changed. Further, since the posture sensor 14 is configured to irradiate the detected portions 26c and 26d of the microchip 200 with laser light and receive the reflected light, the posture sensor 14 is installed outside the rotary arm 20 and the chip turntable 23. Therefore, the wiring structure can be simplified. Further, when a failure such as breakage of the chip holding unit 26 or dropping of the microchip 200 occurs, the attitude sensor can be used even if the front and rear rotation angle positions are rotated by the rotary table rotation mechanism 25 before and after the normal rotation angle position. 14, the reflected light cannot be received and the detected portions 26c and 26d may not be detected, so that it is possible to determine that a failure has occurred. Furthermore, since the detection of the normal posture rotation angle position and the right posture rotation angle position can be performed by the single posture sensor 14, the number of parts can be reduced. Furthermore, since the attitude of the microchip 200 can be accurately changed, the possibility that the measurement result becomes insufficient can be reduced.

  Further, in the present embodiment, three detected portions 26c to 26e that are provided at different exposed portions of the outer peripheral surface of the microchip 200 and have different light reflection characteristics are provided, and the posture sensor 14 has a posture detection rotation angle. The position of the microchip 200 is detected when the position of the microchip 200 is the normal position rotation angle position, and the position of the microchip 200 is detected when the position of the microchip 200 is the right position rotation angle position. Is the left posture rotation angle position, it is possible to irradiate the detected portion 26e with laser light and receive the reflected light.

  As a result, the normal posture rotation angle position, the right posture rotation angle position, and the left posture rotation angle position can be detected, so that any one of the normal posture rotation angle position, the right posture rotation angle position, and the left posture rotation angle position can be detected. The posture of the chip 200 can be accurately changed. In addition, since the detection of the normal posture rotation angle position, the right posture rotation angle position, and the left posture rotation angle position can be performed by one posture sensor 14, the number of parts can be reduced.

Further, in the present embodiment, the turntable rotation mechanism 25 rotates the chip turntable 23 every 90 [°] by control of a predetermined unit.
Thereby, since the reverse posture rotation angle position can be further detected, the posture of the microchip 200 is set to any one of the normal posture rotation angle position, the right posture rotation angle position, the reverse posture rotation angle position, and the left posture rotation angle position. It can be changed accurately. In addition, since one posture sensor 14 can detect the normal posture rotation angle position, the right posture rotation angle position, the reverse posture rotation angle position, and the left posture rotation angle position, the number of parts can be reduced.

  Furthermore, in this embodiment, the first separation rotation control in which the posture of the microchip 200 is held at the left posture rotation angle position and the rotation arm 20 is rotated a predetermined number of times by the arm rotation mechanism 22 is performed as the first centrifugal separation control. Attitude control for rotating the rotary arm 20 to the attitude detection rotation angle position by the rotation mechanism 22 and changing the attitude of the microchip 200 to the normal attitude rotation angle position by the rotary table rotation mechanism 25 based on the detection result of the attitude sensor 14. The second separation rotation control is performed as the second centrifugal separation control, in which the posture after the change is maintained by the posture control and the arm rotation mechanism 22 rotates the rotation arm 20 a predetermined number of times.

Thereby, based on the detection result of the attitude sensor 14, the attitude of the microchip 200 is changed to the normal attitude rotation angle position by the turntable rotation mechanism 25, so that the attitude of the microchip 200 can be changed more accurately. .
Further, in the present embodiment, based on the detection result of the attitude sensor 14, the attitude of the microchip 200 is changed to the normal attitude rotation angle position by the turntable rotation mechanism 25 and rotated to the measurement rotation angle position by the arm rotation mechanism 22. Based on the first measurement control in which the arm 20 is rotated and measurement processing is performed by the measurement sensor 31a and the detection result of the attitude sensor 14, the attitude of the microchip 200 is changed to the right attitude rotation angle position by the rotary table rotation mechanism 25. Then, the rotary arm 20 is rotated to the measurement rotation angle position by the arm rotation mechanism 22, and the second measurement control for performing the measurement process by the measurement sensor 31b is performed.

  Thereby, the posture of the microchip 200 is changed to the rotation angle position where the measurement unit 200a belongs to the measurement range of the measurement sensors 31a and 31b at the measurement rotation angle position, and the rotary arm 20 rotates to the measurement rotation angle position. Since the measurement process is performed by the measurement sensors 31a and 31b, it is not necessary to manually change the attitude of the microchip 200 in order to perform the measurement process.

Further, in the present embodiment, the rotary arm 20 is stopped at the posture detection rotation angle position based on the detection result of the posture sensor 14.
As a result, the rotary arm 20 can be positioned together with the attitude sensor 14, so that it is not necessary to provide a separate rotary sensor for the rotary arm 20.
Further, in the present embodiment, when it is determined that the attitude of the microchip 200 does not properly rotate 90 [°] based on the detection result of the attitude sensor 14, the control is interrupted.

As a result, when a failure such as breakage of the chip holding unit 26 or dropping of the microchip 200 occurs, the control is interrupted, so that safety can be improved.
Furthermore, in the present embodiment, the sample liquid analyzer 100 can rotate the rotating arm 20 by the arm rotating mechanism 22 in the centrifugal force applying device 2 and controls a control signal supplied to the driving circuit 22b. .

Thereby, the rotation arm 20 can be stopped at a desired rotation angle position.
Further, in the present embodiment, the centrifugal force applying device 2 drives the turntable driving force transmission mechanism 27 to move the cam 25a up and down.
Thereby, the attitude | position of the microchip 200 hold | maintained at the chip | tip holding | maintenance part 26 can be changed.

Further, in the present embodiment, the centrifugal force imparting device 2 is provided with the tip rotation mechanism portion at the both ends of the rotary arm 20 at symmetrical positions in the longitudinal direction with respect to the center of gravity.
Thereby, the weight balance of the both ends of the rotation arm 20 can be kept in balance, and the rotation arm 20 can be rotated at high speed with a stable balance.
Further, in the present embodiment, the centrifugal force applying device 2 includes a rotary shaft driving force transmission mechanism 27, a shock absorber 27c fixedly supported on the base 1 side, and a solenoid shaft 27b that linearly moves by driving the solenoid body 27a. A shock absorbing bracket 27e is coupled to the rear end, and the shock absorbing bracket 27e collides with the tip of the piston rod when the solenoid shaft 27b moves straight.

Thereby, the impact at the time of the straight movement of the solenoid shaft 27b in the pushing-up operation can be absorbed.
Furthermore, in the present embodiment, the centrifugal force applying device 2 connects the pusher 27g to the tip of the solenoid shaft 27b constituting the turntable driving force transmission mechanism 27 via the buffer member 27f.

Thereby, the impact when the pusher 27g collides with the transmission part 25c can be absorbed.
Further, in the present embodiment, the centrifugal force imparting device 2 is configured such that the direction of rotation of the coil spring 25f by the twisting force when the coil spring 25f is contracted is the same as the winding direction of the spring 25f, and the spring 25f is contracted. Thus, the rotation direction at the time of restoration and the direction opposite to the winding direction of the spring 25f are the same direction.

Thereby, the sliding resistance of the both ends at the time of expansion / contraction of the coil spring 25f can be reduced. Therefore, the expansion / contraction operation of the coil spring 25f can be made smooth, so that the turntable rotary shaft 24 can be smoothly rotated.
Furthermore, in the present embodiment, the centrifugal force imparting device 2 includes the gap between the upper end of the coil spring 25f and the rotary arm 20 that constitute the turntable rotation mechanism 25, and the lower end of the coil spring 25f and the transmission unit 25c. In between, a ring-shaped low sliding member 25g was provided.

Thereby, the sliding resistance of the both ends of the coil spring 25f can be further reduced. Therefore, since the expansion and contraction operation of the coil spring 25f can be made smoother, the turntable rotary shaft 24 can be rotated more smoothly.
Further, in the present embodiment, the centrifugal force imparting device 2 is made of the material of the parts that form the cam 25a, the upper cam pin 25d, the lower cam pin 25e, and the rotary table rotating shaft 24 that constitute the rotary table rotating mechanism 25. The combination of (A)-(D) was comprised in any combination.

Thereby, it is possible to prevent or reduce the occurrence of a state in which the rotation of the rotary table rotating shaft 24 is prevented by galling between these components.
Further, in the present embodiment, the centrifugal force imparting device 2 uses the inclined surface 25m of the upper end cam surface 25j as an inclined surface that extends from the upper right to the lower left in the vertical direction, and the inclined surface 25p of the lower end cam surface 25o in the vertical direction. The inclined surface is from the lower right to the upper left, and the rotation direction of the rotary arm 20 is the clockwise direction.

Therefore, when the rotary arm 20 is rotated at a high speed clockwise to apply a centrifugal force, the lower cam pin 25e is pressed against the wall of the pin fitting groove 25q constituting the lower end cam surface 25o. Power is added to.
Thereby, it is possible to prevent the rotating base rotating shaft 24 from rotating when the centrifugal force is applied, and thus it is possible to prevent the posture of the microchip 200 from being changed when the centrifugal force is applied.

Further, in the present embodiment, the centrifugal force imparting device 2 holds the chip holding portion 26 by enclosing the entire outer periphery of the microchip 200 with the frame portion 26b, and a part of the microchip 200 by the pressing member 26b. It was configured to hold down from above.
As a result, it is possible to prevent the microchip 200 from being detached from the chip holding part 26 by the centrifugal force during the application of the centrifugal force, regardless of the rotation angle position of the microchip 200, and to be increased by vibration or the like. Even if a force in the direction is generated, the microchip 200 can be hardly lifted.

Further, in the present embodiment, the centrifugal force applying device 2 has the rotary table rotating mechanism 25 and the rotary table driving force transmission mechanism 27 as separate bodies, and the vertical movement of the cam 25 a along the rotary table rotating shaft 24 in the vertical direction. Thus, the push-up force of the turntable driving force transmission mechanism 27 is converted into the turn force of the turntable rotary shaft 24.
As a result, it is not necessary to move the rotary table rotating shaft 24 up and down in the vertical direction in order to rotate the rotary table rotating shaft 24. Therefore, the tip rotating table 23 and the chip holding unit 26 rotate on the spot without moving up and down. Can be made. Accordingly, the tip rotating table 23, the rotating table rotating shaft 24, and the chip holding portion 26 do not have to be vertically moved (can be fixed so as not to move up and down). Even if an upward force is applied to these components, the components can be reliably prevented from rising.

Further, in the present embodiment, the optical measuring device 3 is configured to move the sensor head 30 toward and away from the chip rotation mechanism along the upper side prism member 36 a and the slide rails 32 and 33.
Thereby, the movement in the front-rear direction and the up-down direction when the sensor head 30 moves in the approach and separation direction can be suppressed, and the sensor head 30 can be reliably moved in the approach and separation direction while keeping the sensor head 30 parallel to the upper surface of the base 1. It can be moved straight. Therefore, the chip holder 26 can be positioned with high accuracy, and reproducibility for movement to the accurate measurement processing position can be ensured.

Further, in the present embodiment, the optical measuring device 3 is provided with two laser light emitting units 30b and 30c, and the light emitting elements of the laser light emitting units 30b and 30c are arranged so that the L shape is reversed left and right. It was.
Accordingly, by changing the attitude of the microchip 200 by 90 [°], two types of measurements with different wavelengths can be performed at the same measurement rotation angle position.

Furthermore, in the present embodiment, in the optical measurement device 3, the members forming the light emitting head 30a and the light receiving head 30f are black insulating members.
Thereby, the amount of reflection that the laser light irradiated from each light emitting element of the light emitting head 30a reflects on the surface of the light receiving head 30f can be significantly reduced. Therefore, the occurrence of malfunction due to reflected light can be reduced.

Furthermore, it is possible to reduce the electrical interference between the light emitting elements provided in the light emitting head 30a due to the property of the insulating member. Thereby, it is possible to reduce the occurrence of defects (wavelength change, etc.) to the laser light due to electrical interference.
Furthermore, it is possible to prevent noise from being applied to the metal member forming the plurality of light receiving elements provided in the light receiving head 30f, or to reduce the amount of noise. As a result, it is possible to prevent an error in the measurement result due to noise or to reduce the amount of error.

Further, in the present embodiment, the optical measuring device 3 is provided with support members 30d and 30e on the rear end side and front end side of the light emitting head 30a and the light receiving head 30f, and moves the sensor head 30 to the centrifugal force applying device 2 side. In this case, the inclined surfaces of the support members 30 d and 30 e are in contact with the corners of the chip holding unit 26.
Thereby, the chip holding unit 26 and the sensor head 30 can be positioned at the measurement processing position, and the position can be fixedly supported.

  In the above embodiment, the microchip 200 corresponds to the chip of the invention 1 to 5 or 7, the rotary arm 20 corresponds to the first rotary body of the invention 1, 2, 4 to 6, and the arm rotation mechanism 22 Corresponding to the first rotating means of the invention 1, 2, 4 or 5, the chip turntable 23 corresponds to the second rotating body of the inventions 1 to 3. The turntable rotating mechanism 25 corresponds to the second rotating means of the invention 1, 2, 4 or 5, and steps S300 to S304 are the first centrifugation control of the invention 1, 2, 4 or 7, or the invention 4. Steps S306 to S336 correspond to the second centrifuge control of the invention 1, 2, 4 or 7.

  Moreover, in the said embodiment, step S306-S324 respond | corresponds to the attitude | position control of invention 4, step S326-S336 respond | corresponds to 2nd separate rotation control of invention 4, and step S300-S336 are invention 1, Corresponding to the centrifugation control means 2 or 6, steps S318 to S324 and S338 to S342 correspond to the first measurement control of the fifth aspect. Steps S348 to S352 correspond to the second measurement control of the invention 5, steps S318 to S324 and S338 to S352 correspond to the measurement control means of the invention 5, and steps S324 and S316 are the control prohibition of the invention 7. Corresponding to the means, the normal posture rotation angle position corresponds to the first rotation angle position of the invention 1 to 5 or 7, or the first measurement posture rotation angle position of the invention 5.

  In the above embodiment, the right posture rotation angle position corresponds to the second rotation angle position of Inventions 1 to 5 or 7, or the second measurement posture rotation angle position of Invention 5, and the left posture rotation angle position is Corresponding to the third rotational angle position of the invention 3 to 5 or 7, the measurement range of the measurement sensor 31a corresponds to the first measurement range of the invention 5. The measurement range of the measurement sensor 31b corresponds to the second measurement range of the fifth aspect.

In addition, in the said embodiment, although the to-be-detected parts 26c-26e were comprised as a mirror with a different reflectance, it is not restricted to this, The color (different color) with a different reflectance, and the pattern with different reflectance (a different pattern) Also, it can be configured as an undulating shape (difference in shape) having different reflectance.
FIG. 29 is a perspective view showing the detected parts 26c and 26d made of colors or patterns having different reflectivities.

When configured with colors having different reflectivities, for example, as shown in FIG. 29 (a), the detected portion 26c is composed of the first color (for example, orange), and the detected portion 26d has the first color. Consists of different second colors (eg red).
When the patterns are configured with different reflectances, for example, as shown in FIG. 29 (b), the detected part 26c is composed of a grid-like scale with a first interval, and the detected part 26d is Is also composed of a grid-like scale with short second intervals.

Moreover, in the said embodiment, although the attitude | position sensor 14 was provided in the one end side of the rotation arm 20, it is not restricted to this, As shown in FIG. Alternatively, the posture sensor 14b may be provided on the other end side of the rotary arm 20.
FIG. 30 is a diagram illustrating a case where posture sensors 14 a and 14 b are provided on both ends of the rotary arm 20.

Thereby, the attitude | positions of the microchip 200 hold | maintained at the chip | tip holding | maintenance part 26 of the both ends of the rotation arm 20 are each detectable. Further, the control for stopping the rotating arm 20 at the posture detection rotation angle position can be performed more accurately.
As shown in FIG. 30, the attitude sensor 14 b is provided at a position symmetrical to the attitude sensor 14 a with respect to the rotation center of the rotary arm 20. As a result, detection can be performed without receiving laser beam interference from the attitude sensor 14a.

  In the configuration of FIG. 30, when the microchip 200 is in the reverse posture rotation angle position, the sensor signals of the posture sensors 14a and 14b are both OFF. In this case, the sensor signals of the posture sensors 14a and 14b cannot distinguish whether the posture of the microchip 200 is the reverse posture rotation angle position or whether a failure such as breakage of the chip holding unit 26 or dropping of the microchip 200 has occurred. Sometimes.

  Therefore, the posture sensor 14b is installed on the left inner peripheral surface of the base 1 so that an ON sensor signal can be obtained at the reverse posture rotation angle position. Specifically, the posture sensor 14b detects the detected portion 26d when the posture of the microchip 200 is the normal posture rotation angle position, and detects the detected portion 26d when the posture of the microchip 200 is the right posture rotation angle position. In addition, when the posture of the microchip 200 is the reverse posture rotation angle position, the detected portion 26c is irradiated with laser light and the reflected light can be received. For example, when the posture of the microchip 200 is the reverse posture rotation angle position at the posture detection rotation angle position, it can be determined whether or not there is an obstacle by rotating the rotation arm 20 by 180 [°]. If it is not an obstacle, the attitude sensor 14b can obtain an ON2 sensor signal, and if it is an obstacle, a normal sensor signal cannot be obtained. can do.

Moreover, in the said embodiment, although the attitude | position sensor 14 was arrange | positioned in the front-back direction, it can also arrange | position not only to this but to the left-right direction. For example, the attitude sensor 14 may be installed on the left inner peripheral surface of the base 1.
Moreover, in the said embodiment, although provided with the one attitude | position sensor 14, not only this but two attitude | position sensors can also be provided and comprised. For example, one posture sensor can be installed at the same position as the posture sensor 14 and the other posture sensor can be installed on the left inner peripheral surface of the base 1 so that the optical axis is in the horizontal direction. In this case, if any two of the detected parts 26c to 26e are present, the normal posture rotation angle position, the right posture rotation angle position, the reverse posture rotation angle position, and the left posture rotation angle position can be detected.

Moreover, in the said embodiment, although it provided and comprised the three to-be-detected parts 26c-26e, it can also comprise not only this but any two among the to-be-detected parts 26c-26e.
Thus, when the detected portions 26c and 26d are provided, the normal posture rotation angle position and the right posture rotation angle position are provided, and when the detected portions 26d and 26e are provided, the normal posture rotation angle position and the left posture rotation angle position are indicated. When the detected parts 26c and 26e are provided, the right posture rotation angle position and the left posture rotation angle position can be detected.

  Further, in the above-described embodiment, the case where the control program stored in advance in the ROM 304 is executed in the processes shown in the flowcharts of FIGS. 23 to 25 has been described. However, the present invention is not limited to this. Alternatively, the program may be read from the storage medium storing the program indicating the above procedure into the RAM 306 and executed.

  Here, the storage medium is a semiconductor storage medium such as RAM or ROM, a magnetic storage type storage medium such as FD or HD, an optical reading type storage medium such as CD, CDV, LD, or DVD, or a magnetic storage type such as MO. / Optical reading type storage media, including any storage media that can be read by a computer regardless of electronic, magnetic, optical, or other reading methods.

  In the above embodiment, the centrifugal force applying device and the sample liquid analyzer according to the present invention are applied to the case where the sample liquid is centrifuged and analyzed. However, the present invention is not limited to this and does not depart from the gist of the present invention. The scope is applicable to other cases.

2 is a perspective view showing a schematic configuration of a sample liquid analyzer 100. FIG. 2 is a plan view showing a schematic configuration of a sample liquid analyzer 100. FIG. 2 is a front view showing a schematic configuration of a centrifugal force applying device 2. FIG. It is a figure which shows the structure which balances the rotational balance at the time of centrifugal force provision of the centrifugal force provision apparatus. 3 is a block diagram showing a configuration of an arm rotation mechanism 22. FIG. FIG. 3 is a diagram showing an example of the shape of a microchip 200. FIG. 3 is a view showing a structural example of a chip holding unit 26. 2 is a diagram showing an example of mounting a microchip 200. FIG. It is a figure which shows the detection operation of the attitude | position sensor. 4 is a side view showing the configuration of a turntable rotating mechanism 25. FIG. It is a figure which shows the structure of the cam 25a. FIG. 4 is a vertical sectional view showing a configuration of a turntable driving force transmission mechanism 27. It is a figure which shows operation | movement of the turntable rotation mechanism 25 at the time of pushing up with the pusher 27g. It is a figure which shows operation | movement of the turntable rotation mechanism 25 after pushing up with the pusher 27g. 2 is a diagram illustrating a configuration of an optical measurement device 3. FIG. 5 is a diagram illustrating an example of a slide movement operation of the sensor head 30. FIG. 2 is a diagram illustrating a configuration of a sensor head 30. FIG. It is a figure which shows an example of the sensor head 30 formed using the black insulating member. It is a figure which shows the internal structure of the temperature control apparatus. 2 is a diagram showing an example of air flow inside the sample liquid analyzer 100. FIG. FIG. 3 is a diagram illustrating an example of the air flow in the upper surface portion of the base 1. 3 is a block diagram showing a configuration of a control board 300. FIG. It is a flowchart which shows a chip set process. It is a flowchart which shows a motor origin determination process. It is a flowchart which shows a sample liquid analysis process. It is a figure which shows the operation | movement at the time of centrifugal force provision. FIG. 6 is a diagram illustrating an operation when the posture of the microchip 200 is changed. It is a figure which shows the operation | movement at the time of the measurement process of the optical measuring device. It is a perspective view which shows the to-be-detected parts 26c and 26d which consist of a color or a pattern from which a reflectance differs. FIG. 4 is a diagram illustrating a case where posture sensors 14 a and 14 b are provided on both ends of the rotary arm 20.

Explanation of symbols

DESCRIPTION OF SYMBOLS 100 ... Sample liquid analyzer, 200 ... Microchip, 200a ... Measuring part, 1 ... Base, 2 ... Centrifugal force imparting device, 3 ... Optical measuring device, 4 ... Temperature adjusting device, 5 ... Light shielding cover, 12 ... Plate 14, 14 a, 14 b ... posture sensor 10, 11, 16, 17 ... vent hole, 15 ... open / close shutter, 20 ... rotating arm, 21 ... arm rotating shaft, 22 ... arm rotating mechanism, 23 ... chip rotating table, 24 DESCRIPTION OF SYMBOLS: Rotary table rotating shaft, 25 ... Rotary table rotating mechanism, 26 ... Chip holding part, 22a ... Stepping motor, 22b ... Driving circuit, 25a ... Cam, 25b ... Guide part, 25c ... Transmission part, 25d ... Upper cam pin, 25e ... lower cam pin, 25f ... coil spring, 25g ... low sliding member, 25j ... upper end cam surface, 25m, 25p ... inclined surface, 25n 25r ... Wall, 25q ... Pin fitting groove, 25t ... Engaging groove, 25o ... Lower end cam surface, 26a ... Frame part, 26b ... Chip pressing part, 26c, 26d, 26e ... Detected part, 27 ... Turntable driving force Transmission mechanism 27a ... Solenoid body 27b, 40 ... Solenoid shaft 27c ... Shock absorber 27d ... Support bracket 27e ... Shock absorption bracket 27f ... Buffer member 27g ... Pusher 28, 39 ... Solenoid 30 ... Sensor head 30a ... Light emitting head, 30b, 30c ... Laser light emitting part, 30d, 30e ... Support member, 30f ... Light receiving head, 30g, 30h ... Laser light receiving part, 38a, 38b ... Coil spring, 38c ... Connecting member, 32, 33 ... Slide rail 34, 35 ... Slider 36 ... Slide auxiliary member 37 ... Mandrel, 38 ... Return spring part, 41 ... Transmission member, 50 ... Temperature control part, 51, 55 ... Temperature sensor, 52 ... Fan, 53 ... Heating element, 54 ... Housing, 300 ... Control board, 302 ... CPU, 304 ... ROM, 306 ... RAM, 308 ... Drive command output I / F, 310 ... Sensor input I / F, 312 ... Communication I / F

Claims (7)

A sample liquid analysis chip that can separate the components of the sample liquid according to the centrifugal force applied in a predetermined direction and guide the separated components to a predetermined position of the chip is applied with the centrifugal force in the predetermined direction. A centrifugal force imparting device that imparts centrifugal force to the chip in the predetermined direction by holding and rotating in a posture,
A first rotating body rotatable around an axis orthogonal to the predetermined direction, a first rotating means for rotating the first rotating body, a chip holding portion for holding the chip, and the first rotating body. A second rotating body provided at a position away from the rotation center and capable of rotating the chip holding portion around the orthogonal axis; a second rotating means for rotating the second rotating body; and a posture of the chip. The first centrifuge control for holding and rotating by the first rotation means, and the first rotation means for holding the posture of the chip at a rotation angle position of the second rotating body different from that at the time of the first centrifuge control. The centrifuge control means for performing the second centrifuge control that rotates by the above and the part of the outer peripheral surface of the chip that is exposed from the chip holding part while being held by the chip holding part, and has different light reflection characteristics First cover The orientation of the chip is the first rotational body position of the second rotating body at the position detection rotational angle position, which is the rotational angle position of the first rotating body for detecting the orientation of the tip and the second detected part. The first detected portion is irradiated with light when the rotation angle position is set, and the second detected portion is irradiated with light when the posture of the chip is the second rotation angle position of the second rotating body and the reflected light thereof. And a posture sensor capable of receiving light. It has a measuring unit that performs optical measurement processing, separates the components of the sample liquid according to the centrifugal force applied in a predetermined direction, mixes the separated components and reagents, and mixes the components after mixing the reagents. By holding and rotating the sample liquid analysis chip that can be guided to the measurement unit in a posture in which the centrifugal force is applied in the predetermined direction, the centrifugal force is applied to the chip in the predetermined direction, A sample liquid analyzer that performs the measurement process on a measurement unit,
A first rotating body rotatable around an axis orthogonal to the predetermined direction, a first rotating means for rotating the first rotating body, a chip holding portion for holding the chip, and the first rotating body. A second rotating body provided at a position away from the rotation center and capable of rotating the chip holding portion around the orthogonal axis; a second rotating means for rotating the second rotating body; and a posture of the chip. The first centrifuge control for holding and rotating by the first rotation means, and the first rotation means for holding the posture of the chip at a rotation angle position of the second rotating body different from that at the time of the first centrifuge control. And a centrifuge control means for performing a second centrifuge control for rotation by the rotation of the chip held by the chip holding unit at a measurement rotation angle position that is a rotation angle position of the first rotation body for measuring the chip. Above A measurement sensor that irradiates light to a fixed portion and can receive the transmitted light, and a light reflection characteristic provided on a portion of the outer peripheral surface of the chip that is exposed from the chip holding portion while being held by the chip holding portion. The first detected part and the second detected part having different from each other and the attitude detection rotation angle position that is the rotation angle position of the first rotating body for detecting the attitude of the chip, the attitude of the chip is the second Light is applied to the first detected portion when the rotation body is at the first rotation angle position, and light is applied to the second detection portion when the posture of the chip is the second rotation angle position of the second rotation body. And a posture sensor capable of receiving the reflected light. In claim 2,
Provided at different locations of the exposed portion of the outer peripheral surface of the chip, the first detected portion, the second detected portion and the third detected portion having different light reflection characteristics,
When the posture of the chip is at the first rotation angle position, the posture sensor is at the first detected portion when the posture of the chip is at the second rotation angle position. In addition, when the tip of the chip is at the third rotation angle position of the second rotating body, the third detected portion can be irradiated with light and the reflected light can be received. A specimen liquid analyzer characterized by the above. In claim 3,
In the first centrifugal separation control, the posture of the chip is maintained at any one of the first rotation angle position, the second rotation angle position, and the third rotation angle position, and the first rotation body is operated by the first rotation means. Comprising a first separation rotation control for rotating a predetermined number of times,
The second centrifuge control is configured to rotate the first rotating body to the posture detection rotation angle position by the first rotation unit, and based on the detection result of the posture sensor, the second rotation unit to rotate the first rotation unit. Attitude control for changing the attitude of the chip to a rotation angle position different from that at the time of the first separation rotation control among the rotation angle position, the second rotation angle position, and the third rotation angle position, and after the change by the attitude control And a second separation / rotation control in which the first rotating means is rotated a predetermined number of times by the first rotating means. In claim 4,
Any two of the first rotation angle position, the second rotation angle position, and the third rotation angle position belong to the first measurement range of the measurement sensor at the measurement rotation angle position. A first measurement attitude rotation angle position, and a second measurement attitude rotation angle position at which the measurement unit belongs to a second measurement range of the measurement sensor at the measurement rotation angle position.
Furthermore, based on the detection result of the attitude sensor, the attitude of the chip is changed to the first measurement attitude rotation angle position by the second rotation means, and the first rotation means reaches the measurement rotation angle position. Based on the first measurement control for rotating the rotating body and performing the measurement process by the measurement sensor, and the detection result of the attitude sensor, the second rotation means moves the rotation position of the chip to the second measurement attitude rotation angle position. It comprises a measurement control means for changing the posture, rotating the first rotating body to the measurement rotation angle position by the first rotation means, and performing a second measurement control for performing the measurement process by the measurement sensor. Sample liquid analyzer. In any one of Claims 4 and 5,
The centrifuge control unit stops the first rotating body at the posture detection rotation angle position based on a detection result of the posture sensor. In any one of Claims 4 thru | or 6,
Furthermore, based on the detection result of the attitude sensor, when it cannot be determined that the attitude of the chip is any one of the first rotation angle position, the second rotation angle position, and the third rotation angle position, A specimen liquid analyzer, comprising control prohibiting means for prohibiting the first centrifugation control or the second centrifugation control.

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