JP2009058409A - Centrifugal force applying device and specimen liquid analyzer - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a centrifugal force applying device capable of automatically altering the angle-of-rotation position of a microchip, and a specimen liquid analyzer. <P>SOLUTION: The specimen liquid analyzer 100 includes a centrifugal force applying device 2, the specimen liquid analyzer 3, a temperature adjusting device 4, and an upper surface cover 5. The temperature adjusting device 4 is constituted so that a heating element 53 is heated by the supply of electric energy from a temperature conditioning part 50 to warm up the circumferential air, and a fan 52 is driven to send the heated air into a base stand 1. The air sent into the base stand 1 passes through a ventilating port 10 to flow in the space formed by the upper surface part of the base stand 1 and the upper surface cover 5 to raise the temperature in the space. Further, the temperature in the vicinity of the laser beam receiving part 30f in the space is measured on the basis of the input voltage from a temperature measuring probe 55 by the temperature conditioning part 50 and the feed quality of power to the heating element 53 is adjusted so that the measured temperature approaches a set temperature. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to an apparatus for applying a centrifugal force to a microchip, and more particularly, to a centrifugal force applying apparatus and a sample liquid analyzer that can automatically change the rotation angle position of a microchip.

Conventionally, as a sample liquid, for example, blood is collected, and the collected blood is centrifuged to separate red blood cells, white blood cells, lymphocytes, platelets, blood coagulation factors, etc. in the blood, serum obtained by the separation, etc. There is an analysis method for measuring the pH value and the concentration of oxygen, carbon dioxide or the like.
As a measurement method, for example, a measurement target liquid containing a light-absorbing component obtained by adding a reagent to a test liquid such as serum is irradiated with light emitted from a light source, thereby transmitting the measurement target liquid. The concentration of the detection target component in the liquid to be inspected is calculated from the absorbance obtained by causing the light receiving unit to receive the light that has been received.

In recent years, μ-TAS (Total Analysis System) and Lab. on. An analysis method using a microchip called “Chip” (micro total analysis system or on-chip laboratory) has attracted attention.
For example, a microchip in which a minute groove-like structure called a microcapillary is formed on a chip of several centimeters and a channel is formed by covering the structure is used. For example, DNA or the like is placed in a neutral gel. Since DNA has a charge, it is moved in a microcapillary channel by electrophoresis and separated by a difference in total charge due to a difference in molecular weight. In addition, researches are being actively conducted to detect a reaction by a reagent, such as analysis of absorbance described above, by putting another reagent in the middle of a substance moving through a microcapillary.

Examples of the microchip used for analyzing the sample liquid include a test chip described in Patent Document 1.
The inspection chip of Patent Document 1 has at least one quantification unit that quantifies a target component in a sample, and the quantification unit centrifuges the target component from the sample by rotating the inspection chip around a predetermined rotation axis. A centrifuge tube to be separated, connected to one end of the centrifuge tube, and connected to a weighing tube for weighing the target component by rotation around the rotation axis, and to the weighing tube, the target component being centrifuged The transfer means for transferring from the tube to the weighing tube, at least one reagent reservoir for storing the reagent, and the reagent reservoir and the weighing tube are connected to the weighing tube and introduced from the weighing tube by re-rotation around the rotation axis. The target component is connected to the mixing unit and the mixing unit in which the target component is mixed with the reagent introduced from the reagent reservoir by the rotation about the rotation axis, and the light passing through the mixed substance in which the reagent and the target component are mixed Detection path A light inlet connected to the light detection path for introducing light into the light detection path, and a light outlet connected to the light detection path for extracting light after passing through the light detection path. Yes.

Moreover, as an apparatus for centrifuging the inspection chip of Patent Document 1, there is a microchip centrifuge described in Patent Document 2, for example.
The microchip centrifuge of Patent Document 2 is a microchip centrifuge that performs separation while maintaining a microchip having a separation unit, a weighing unit, and a mixing unit at a predetermined rotation angle. A first rotating body that is rotated by a motor, and one or a plurality of second rotating bodies that hold the microchip and that are rotatably provided around the rotation axis of the first rotating body, When the motor is rotated at a predetermined rotation angle, the first and second rotating bodies and the microchip are rotated together to perform the centrifugal separation, and the rotation of the motor is stopped. The second rotating body is rotated to hold the microchip at another predetermined rotation angle.
JP 2005-114438 A JP 2006-110491 A

However, in the prior art of Patent Document 2 described above, the rotation angle position can be changed without directly touching the microchip. However, the change of the rotation angle position of the microchip still requires human hands, For example, when it is necessary to analyze a large number of microchips continuously, a very troublesome work is involved.
Therefore, the present invention has been made paying attention to such an unsolved problem of the conventional technology, and a centrifugal force applying device and a sample liquid capable of automatically changing the rotation angle position of the microchip. The object is to provide an analysis device.

[Invention 1] In order to achieve the above object, the centrifugal force imparting device of Invention 1 comprises:
In response to the application of centrifugal force in a predetermined direction, at least the sample liquid is centrifuged, and the sample liquid analysis microchip capable of guiding the separated components of the sample liquid after the centrifugation to a predetermined position of the chip, A centrifugal force applying device that rotates in a state of maintaining a posture corresponding to a predetermined direction and applies a centrifugal force to the microchip in a predetermined direction,
A base, a first rotating body rotatably provided about an axis perpendicular to the base, and a first actuator for generating a rotational driving force, the rotational driving force of the first actuator being A first driving mechanism that transmits the first rotating body to the first rotating body and rotationally drives the first rotating body, and a position that is a predetermined distance away from the rotational center position of the first rotating body. A second rotating body provided so as to be rotatable around a vertical axis, and a chip holding part for holding the microchip provided so as to be rotatable together with the second rotating body with respect to the second rotating body. A second drive mechanism that includes a second actuator, transmits the power of the second actuator to the second rotating body as its rotational driving force, and rotates the second rotating body; and is provided on the base. A covering body capable of covering the component parts, and the base A temperature adjusting means for adjusting the temperature around the components provided, characterized in that it comprises a.

  With such a configuration, for example, when the microchip is mounted in a posture in which a centrifugal force in a predetermined direction is applied to the chip holding portion and the first actuator is driven to rotate, the first rotating body is based at the center position, for example. In the case of being pivotally supported by the table, the rotational driving force is transmitted to the first rotating shaft that is the rotating shaft of the first rotating body, and the first rotating body is rotated around the vertical axis with the center position as the rotation center. Rotating drive. When the first rotating body is rotationally driven, the microchip held by the chip holding portion rotates while maintaining its posture. By this rotation, a centrifugal force in a predetermined direction is applied to the microchip.

  On the other hand, when the second actuator is driven, the power is driven by the second driving mechanism as a rotational driving force, for example, when the second rotating body is pivotally supported by the first rotating body, the rotational axis of the second rotating body. It is transmitted to a certain second rotating shaft, and the second rotating body is rotationally driven together with the chip holding part. Thereby, the rotation angle position of the microchip held by the chip holding part is changed. That is, the attitude of the microchip is changed.

Further, the covering body can cover the components such as the first rotating body, the second rotating body, and the chip holding portion provided on the base.
Moreover, the temperature around the components provided on the base can be adjusted by the temperature adjusting means.
Here, the predetermined direction corresponds to a plurality of types of directions according to the structure of the microchip. For example, if the microchip has a weighing unit that weighs the separation component in an amount necessary for measurement in addition to the above structure, the direction for centrifuging the sample liquid and the separation component are guided to the measurement unit. In addition to the direction for measuring, the direction for weighing the separated component corresponds. In addition, the direction for applying centrifugal force may overlap, for example, the direction for centrifuging and the direction for guiding to the measurement unit may be the same direction.

  The temperature adjusting means has, for example, a heat generation function by a metal heating element or the like, a cooling function by a Peltier element or the like, depending on the application, and the temperature on the base by these functions. The thing which adjusts is applicable. The same applies to the sample liquid analyzer of the invention 4 below.

[Invention 2] Further, the centrifugal force application device of Invention 2 is the centrifugal force application device according to Invention 1,
The base has a hollow structure;
The temperature adjusting means includes a plurality of ventilation holes provided by cutting out a part of the upper surface of the base, and a temperature detection unit that detects the temperature around the predetermined position provided at a predetermined position on the base. A casing provided with an internal space connected to the space of the hollow portion of the base, a heating element provided in the casing for generating heat by converting electric energy into heat, and the heating element Based on information on the temperature detected by the temperature detection unit and the air blowing unit that sends the air heated by the heat generated in the air to the base via either the space of the hollow part or the plurality of ventilation openings And a temperature control unit that adjusts the amount of electrical energy supplied to the heating element.

If it is such a structure, a heat generating body will generate | occur | produce heat with the electrical energy supplied from a temperature control part, and the air around a heat generating body is warmed by this heat. The warmed air is sent to the upper part of the base by, for example, a blower configured by a blower fan or the like, through the space in the hollow part of the base and the vent hole provided in the upper surface of the base. And the temperature around the component part provided on the base is raised by the warm air sent on the base.
In addition, when the temperature detection unit provided at a predetermined position on the base detects the surrounding temperature, the temperature adjustment unit converts the electric energy supplied to the heating element based on the detected temperature information, for example, The temperature around the component on the base is adjusted to be a constant temperature (predetermined temperature).

[Invention 3] Further, the centrifugal force application device of Invention 3 is the centrifugal force application device according to Invention 1,
A shutter mechanism that opens and closes a vent hole that passes when at least the warmed air is sent onto the base among the plurality of vent holes is provided on the base.
If it is such a structure, the quantity of the warm air sent on a base by opening and closing of a ventilation opening can be adjusted.

[Invention 4] On the other hand, the sample liquid analyzer of Invention 4 comprises:
It has a measuring unit that includes an area for performing optical measurement processing on the separated components of the sample liquid after centrifugation, and at least the sample liquid is centrifuged according to the application of centrifugal force in a predetermined direction. The sample liquid analysis microchip capable of guiding the separated component of the sample liquid after centrifugation and the reagent, and guiding the separated component after mixing the reagent to the measuring unit, has a posture corresponding to the predetermined direction. The measurement process is performed on the separated component after mixing the reagent guided to the measurement unit by applying a centrifugal force to the microchip in a predetermined direction by rotating in a held state. A sample liquid analyzer for performing
A base, a first rotating body rotatably provided about an axis perpendicular to the base, and a first actuator that generates a rotational driving force, the rotational driving force of the first actuator being A first driving mechanism that transmits the first rotating body to the first rotating body and rotationally drives the first rotating body, and a position separated from the rotational center position of the first rotating body by a predetermined distance from the first rotating body. A second rotating body provided so as to be rotatable around a vertical axis, and a chip holding part for holding the microchip provided so as to be rotatable together with the second rotating body with respect to the second rotating body. A second drive mechanism that includes a second actuator, transmits the power of the second actuator to the second rotating body as its rotational driving force, and rotates the second rotating body; and is provided on the base. The first rotating body is at a predetermined rotational angle position. A light irradiation unit capable of irradiating light to the measurement unit of the microchip held by the chip holding unit, a light receiving unit that receives light transmitted through the measurement unit, and the light reception An output unit that outputs information on the amount of light received by the unit, a covering that can cover the component provided on the base, and a temperature that adjusts the temperature around the component provided on the base And adjusting means.

  In such a configuration, in addition to the action of the centrifugal force applying device according to the first aspect, for example, a state in which the microchip is held on the chip holding portion in a posture in which the centrifugal force is applied in the first direction. Thus, when the first rotating body is rotated by controlling the first actuator, a centrifugal force is applied to the microchip held by the chip holding portion in the first direction, for example, a specimen liquid reservoir in the microchip. The sample liquid collected in is centrifuged. Subsequently, the second actuator is controlled to rotate the second rotating body, and the rotation angle position of the microchip is changed, for example, by 90 ° in a predetermined rotation direction, and centrifugal force is applied to the microchip in the second direction. When the first rotating body is rotated again in a state in which the posture is maintained and a centrifugal force is applied to the microchip in the second direction, for example, the reagent and the sample held in the reagent holding unit in the microchip The separated components of the liquid are mixed, and the separated components after mixing are guided to the measurement unit.

  Further, when the first rotating body is stopped at a predetermined rotation angle position, for example, laser light (near infrared light) or the like is applied to the measurement unit of the microchip held by the chip holding unit by the light irradiation unit. Light, and the light receiving unit receives light after passing through the measuring unit (and the separated component), and the output unit receives light quantity information (for example, absorbance information). Can be output to an internal analyzer, an external device, or the like.

Moreover, components such as the component provided on the base, the first rotator, the second rotator, and the chip holding unit can be covered with the cover. In addition, other components such as the light irradiating unit and the light receiving unit can be covered on the part provided on the base.
Moreover, the temperature around the components provided on the base can be adjusted by the temperature adjusting means.

  Here, the predetermined direction corresponds to a plurality of types of directions according to the structure of the microchip. For example, if the microchip has a structure that weighs the separation component in the amount required for measurement in addition to the above structure, the direction for centrifuging the sample liquid and the separation component are mixed with the reagent for measurement. In addition to the direction for guiding to the part, the direction for weighing the separated component corresponds. In addition, the directions may be overlapped, for example, the direction for centrifuging and the direction for mixing with the reagent and guiding to the measuring unit may be the same direction.

[Invention 5] Furthermore, the sample liquid analyzer of the invention 5 is the sample liquid analyzer of the invention 4,
The base has a hollow structure;
The temperature adjusting means includes a plurality of ventilation holes provided by cutting out a part of the upper surface of the base, and a temperature detection unit that detects the temperature around the predetermined position provided at a predetermined position on the base. A casing provided with an internal space connected to the space of the hollow portion of the base, a heating element provided in the casing for generating heat by converting electric energy into heat, and the heating element Based on information on the temperature detected by the temperature detection unit and the air blowing unit that sends the air heated by the heat generated in the air to the base via either the space of the hollow part or the plurality of ventilation openings And a temperature control unit that adjusts the amount of electrical energy supplied to the heating element.

  If it is such a structure, a heat generating body will generate | occur | produce heat with the electrical energy supplied from a temperature control part, and the air around a heat generating body is warmed by this heat. The warmed air is sent to the upper part of the base by, for example, a blower configured by a blower fan or the like, through the space in the hollow part of the base and the vent hole provided in the upper surface of the base. And the temperature around the component provided on the base is raised by the warm air sent onto the base.

  In addition, when the temperature detection unit provided at a predetermined position on the base detects the surrounding temperature, the temperature adjustment unit converts the electric energy supplied to the heating element based on the detected temperature information, for example, The temperature around the component on the base is adjusted to be a constant temperature (a predetermined temperature or a temperature set by the user).

[Invention 6] Furthermore, the sample liquid analyzer of the invention 6 is the sample liquid analyzer according to the invention 5,
The light receiving unit is provided on the base with a portion that receives at least light transmitted through the measurement unit,
The temperature detector is provided in the vicinity of a portion that receives the light.

  If it is such a structure, the temperature around the part which receives the light of a light-receiving part can be detected by a temperature detection part. That is, the temperature adjustment unit adjusts the electric energy supplied to the heating element based on this temperature so as to become a set constant temperature.

[Invention 7] Furthermore, the sample liquid analyzer of the invention 7 is the sample liquid analyzer according to any one of the inventions 4 to 6,
The covering is formed of a material having a light shielding property.
If it is such a structure, it can prevent that external light is irradiated to these structure parts at the time of coating | covering the structure part provided on the base with the coating body.

[Invention 8] Furthermore, the sample liquid analyzer according to Invention 8 is the sample liquid analyzer according to any one of Inventions 5 to 7,
A shutter mechanism that opens and closes a vent hole that passes when at least the warmed air is sent onto the base among the plurality of vent holes is provided on the base.
If it is such a structure, the quantity of the warm air sent on a base by opening and closing of a ventilation opening can be adjusted.

  As described above, according to the centrifugal force application devices of the first and second aspects, the centrifugal force can be applied in a predetermined direction to the microchip held in the posture at the predetermined rotation angle position, Since the rotation angle position of the microchip can be changed to a predetermined rotation angle position without applying, an effect that the sample liquid measurement process using the microchip can be performed efficiently is obtained. Furthermore, since the temperature around the components provided on the base can be adjusted, by adjusting the temperature around the component to keep it constant, for example, the microchip held in the chip holder It is possible to prevent the injected specimen liquid, reagent, and the like from being affected by the temperature difference.

Further, according to the centrifugal force imparting device of the invention 3, in addition to the effects of the inventions 1 and 2, the amount of air sent onto the base can be adjusted by the shutter mechanism, so that the temperature adjustment by the temperature adjustment unit In addition, the temperature around the constituent parts on the base can be adjusted by opening and closing the shutter.
In addition, according to the sample liquid analyzers of the inventions 4 and 5, in addition to the effects of the inventions 1 and 2, the change in the attitude of the microchip and the application of centrifugal force while maintaining the attitude corresponding to the predetermined direction (thereby The sample liquid is centrifuged, mixed with the reagent, and moved to the measuring unit), the characteristics of the separated components mixed with the reagent are measured, and the measurement results are output without a manual process. Therefore, it is possible to reduce the burden on the sample liquid analysis process. Moreover, since the temperature around the portion provided on the base among the light irradiation unit, the light receiving unit, and the output unit can be adjusted, it is possible to avoid an adverse effect caused by these temperature changes. can get.

  In addition, according to the sample liquid analyzer of the sixth aspect of the invention, in addition to the effects of the fourth and fifth aspects, the temperature around at least the light receiving part of the light receiving part can be adjusted. In the case where the light receiving element is affected by the temperature, the change in the light receiving information of the light receiving element due to the surrounding temperature change can be suppressed.

Further, according to the sample liquid analyzer of the invention 7, in addition to the effect of the invention 6, since the covering body has a light shielding property, the light receiving portion provided on the base is irradiated with the external light. The effect that it can prevent is acquired.
Moreover, according to the sample liquid analyzer of the invention 8, in addition to the effect of any one of the inventions 5 to 7, the amount of air sent onto the base can be adjusted by the shutter mechanism. In addition to the temperature adjustment by the part, the temperature around the constituent parts on the base can be adjusted also by opening and closing the shutter.

[First Embodiment]
Hereinafter, a first embodiment of the present invention will be described with reference to the drawings. FIGS. 1-21 is a figure which shows 1st Embodiment of the centrifugal-force provision apparatus and sample fluid analyzer which concern on this invention.
In the present embodiment, the sample liquid analyzer 100 according to the present invention includes a sample liquid reservoir, a reagent reservoir, a weighing unit, a reagent mixing unit, a measuring unit 200a, a microcapillary channel for centrifugation and for guiding a sample liquid, and the like. The present invention is applied to the microchip 200 having a structure in which a plurality of substrates on which are formed are stacked.

  In the present embodiment, the microchip 200 is formed using a material having a characteristic of transmitting laser light. For example, olefin resins such as polyethylene (PE) and polypropylene (PP), polyester resins such as polyethylene terephthalate (PET) and polybutylene terephthalate (PBT), polyamide resins such as nylon 6 and nylon 66, vinyl chloride resins, fluorine resins, etc. It is formed with the well-known resin.

First, based on FIG.1 and FIG.2, schematic structure of the sample liquid analyzer which concerns on this invention is demonstrated.
FIGS. 1A and 1B are perspective views showing a schematic configuration of a sample liquid analyzer 100 according to the present invention. FIG. 2 is a plan view showing a schematic configuration of the sample liquid analyzer 100 according to the present invention.
As shown in FIGS. 1A and 1B, the sample liquid analyzer 100 includes a base 1 having a hollow structure and a centrifugal force that applies a centrifugal force to the microchip 200 disposed on the base 1. An optical device that receives laser light (hereinafter referred to as transmitted light) that has been applied to the applying device 2 and the measurement unit 200a of the microchip 200 disposed on the base 1 and that has passed through the measurement unit 200a. Type measuring device 3, a temperature adjusting device 4 that is mounted on the lower portion of the base 1 in the vertical direction so as to share the internal space with the base 1, and adjusts the temperature inside the device to be constant, and the base 1 And an upper surface cover 5 that shields light from the outside from the upper surface portion.

  Further, as shown in FIG. 2, the plate forming the upper surface portion of the base 1 (hereinafter referred to as the upper plate) is centrifugally moved to the left when the long direction is the left-right direction and the short direction is the front-rear direction. A force applying device 2 is disposed, and an optical measuring device 3 is disposed on the right side thereof. Furthermore, temperature adjustment vents 10 (rectangular) and 16 (circular) are provided along the front side of the upper plate, respectively, and the temperature adjustment vents 11 ( (Rectangular) and 17 (rectangular) are provided.

In addition, an opening / closing shutter 15 having a configuration in which a rectangular plate covering the ventilation opening 10 is detachably attached is provided in the vicinity of the ventilation opening 10 on the lower surface of the upper plate facing the inside of the base 1. By opening and closing the plate, it is possible to change the area of the opening of the vent 10 and adjust the amount of air flowing into the upper surface of the base 1.
Further, as shown in FIG. 2, a sensor installation plate 12 is erected on the upper plate on the rear side of the centrifugal force applying device 2, and the plate 12 is a reflective type such as a photo reflector. Optical sensors 13 and 14 are attached with their detection directions directed toward the centrifugal force applying device 2.

Next, the configuration of the centrifugal force applying device 2 will be described with reference to FIG.
Here, FIG. 3 is a front view showing a schematic configuration of the centrifugal force applying device 2.
As shown in FIG. 3, the centrifugal force imparting device 2 rotates on a rotary arm 20 composed of a plate member having a rectangular plate surface, an arm rotary shaft 21 that is a rotary shaft of the rotary arm 20, and an arm rotary shaft 21. And an arm rotation mechanism 22 for applying a driving force.

  The arm rotation shaft 21 is inserted into a shaft hole provided in the upper plate of the base 1 via a bearing (for example, a rolling bearing), and is supported rotatably around a vertical axis with respect to the upper plate. Yes. Further, the rotary arm 20 is joined to the upper end of the arm rotary shaft 21 so that the axial center position thereof coincides with the center position of the rotary arm 20, and the arm rotary mechanism 22 is formed at the lower end of the arm rotary shaft 21. The output shaft of the rotational drive source is connected.

Here, FIG. 4 is a block diagram showing a detailed configuration of the arm rotation mechanism 22.
As shown in FIG. 4, the arm rotation mechanism 22 includes a stepping motor 22a that is a rotation drive source of the arm rotation shaft 21, and a drive circuit 22b that drives the stepping motor 22a.
In this embodiment, the stepping motor 22a is an HB type (Hybrid Type) two-phase excitation type motor, and sequentially excites two coils constituting each pole by the phase current supplied from the drive circuit 22b. The motor output shaft (rotor) is driven to rotate.

Further, the stepping motor 22a applies a holding current in order to generate a holding torque for holding the state stopped at a predetermined rotational angle position when the posture of the microchip 200 is changed or during the measurement process by the optical measuring device 3. It has a function.
The drive circuit 22b is composed of a switching circuit, obtains electric power from a motor power supply (not shown) arranged inside the base 1, and is supplied from a control board (not shown) arranged inside the base 1. The circuit is turned ON / OFF according to the control pulse signal to be supplied, and when it is turned ON, a phase current necessary for the rotation of the rotary arm 20 is supplied to the two coils constituting the pole of the stepping motor 22a.

In the present embodiment, as shown in FIG. 4, the motor output shaft (output shaft after deceleration when a deceleration mechanism is provided outside the motor) and the arm rotation shaft 21 are directly connected by a coupling or the like. The rotational force of the motor output shaft is directly transmitted to the arm rotation shaft 21.
With the above configuration, in the centrifugal force applying device 2, when the stepping motor 22a rotationally drives the motor output shaft and the rotational force of the motor output shaft is transmitted to the arm rotation shaft 21, the arm rotation shaft 21 rotates. In conjunction with this rotation, the rotary arm 20 rotates around the axis in the vertical direction with the center position as the rotation center.

In the present embodiment, the centrifugal force applying device 2 is controlled to apply the centrifugal force to the microchip 200 by rotating the rotating arm 20 in the clockwise direction.
Returning to FIG. 3, the centrifugal force imparting device 2 further includes a rotation shaft of the chip turntable 23 in a vertical shaft hole penetrating through one end and the other end of the rotation arm 20 in the longitudinal direction. A rotary base rotary shaft 24 is inserted through a bearing (not shown) so as to be rotatable around a vertical axis and immovable in the vertical direction. Further, the tip turntable 23 is joined to the upper end portion of the turntable rotation shaft 24 so that the center position thereof coincides with the axial center position of the turntable rotation shaft 24. In addition, a part of the lower end side of the turntable rotating shaft 24 is inserted into a case of a turntable rotating mechanism 25 that rotationally drives the turntable rotating shaft 24.

  Further, a chip holding unit 26 that holds the microchip 200 is rotatably provided on the chip turntable 23 together with the chip turntable 23. Hereinafter, based on FIG. 5, the detailed structure of the chip | tip holding | maintenance part 26 is demonstrated. Here, FIG. 5A is a diagram showing an example of the shape of the microchip 200, FIGS. 5B and 5C are diagrams showing an example of the structure of the chip holding portion 26, and FIG. 2A and 2F are a side view and a plan view of a chip holding unit 26 on which a microchip 200 is mounted.

Here, as shown in FIG. 5A, the microchip 200 has a square shape when seen in a plan view, and is used for performing a measurement process on a separated component mixed with a reagent in the optical measurement device 3. A measurement unit 200a having three measurement points is provided along the right side.
On the other hand, as shown in FIGS. 5B and 5C, the chip holding part 26 has a frame part 26a into which the microchip 200 can be fitted, and on the side of the frame part 26a (FIG. 5B). And in (c), the chip pressing part 26b is provided on the left side).

Here, as shown in FIG. 5C, the tip pressing portion 26b supports (for example, screws) one end of the rectangular plate spring 26b _{2 in} the longitudinal direction on the pressing member 26b ₁ , and the plate spring 26b _2. The other end in the longitudinal direction is supported by the chip turntable 23. When the microchip 200 is mounted, the lower end portion of the pressing member 26b ₁ presses a part of the upper surface of the microchip 200 from above.

  Further, the chip holder 26 is provided on the upper plate of the base 1 described above on the side of the frame 26a (on the rear side and the right side in FIGS. 5B and 5C). In addition, angular detection portions 26c and 26d that are detection targets of the sensors 13 and 14 are provided upright. The detected parts 26c and 26d are sensors when the rotary arm 20 is stopped at a rotation angle position (hereinafter referred to as a posture change position) in which the longitudinal direction of the rotation arm 20 and the longitudinal direction of the upper plate are orthogonal to each other. 13 and 14, and based on the detection result on the internal control board, the rotational angle position of the rotary arm 20 and the attitude (rotational angle position) of the microchip 200 are determined, and the positioning of the rotary arm 20 and the microchip 200 are determined. Various controls such as changing the posture of the camera are performed.

Accordingly, the sensor installation plate 12 is configured to be at least higher than the stop positions of the detected portions 26c and 26d, and the sensors 13 and 14 are at a height position at which the detected portions 26c and 26d of the plate 12 can be detected. Is provided.
Further, when the rotary arm 20 is stopped at the posture change position, the sensors 13 and 14 are arranged such that their detection parts are in front of the detected parts 26c and 26d. The sensors 13 and 14 are configured to irradiate the detected portions 26c and 26d with light at a predetermined incident angle so that the reflected light can be received, and to receive the reflected light. When the reflected light is not received, the detected part is not stopped in front of the sensor.

  With this configuration, the attitude of the microchip 200 can be determined from the detection states of the sensors 13 and 14. In the present embodiment, when both the detected portions 26c and 26d are detected, when both are not detected, when only the detected portion 26d is detected by the sensor 13, the detected portion 26c is detected by the sensor 14. Four types of postures (0 [°], 90 [°], 180 [°], and 270 [°]) of the microchip 200 are determined from the four patterns in the case where only the pattern is detected.

Further, when mounting the microchip 200 in the chip holding portion 26, as shown in FIG. 5 (d), to the outside of the plate spring 26b ₂ is elastically deformed Yoke, a microchip 200 parallel to the frame portion 26a bring the top of the frame portion 26a, as shown in FIG. 5 (e), the entire vertically push into the frame of the frame portion 26a, thereafter, to release the elastic deformation of the plate spring 26b _2. As a result, the pressing member 26b ₁ is returned to the original position by the restoring force of the leaf spring 26b ₂ , and the outer periphery of the microchip 200 is surrounded by the frame portion 26a as shown in FIG. Further, the lower end portion of the chip pressing portion 26b is in a state of pressing one end portion of the microchip 200 from above.

  That is, since the chip holding portion 26 holds the outer periphery of the microchip 200 with the frame portion 26a surrounded by the frame portion 26a, no matter what the rotation angle position of the microchip 200 is, centrifugal force is applied during the application of centrifugal force. On the other hand, the microchip 200 can be prevented from coming off, and even if a force is generated in the flying direction due to vibration or the like, the microchip 200 can be made difficult to float by the pressing member 26b.

  Further, as shown in FIG. 6 (a), the centrifugal force applying device 2 has the same weight at both ends in the longitudinal direction of the rotating arm 20 at symmetrical positions with respect to the center position of the rotating arm 20. A mechanism unit (hereinafter referred to as a chip rotation mechanism unit) that changes the rotation angle position (posture) of the microchip 200 including the rotation table 23, the rotation table rotation shaft 24, the rotation table rotation mechanism 25, and the chip holding unit 26 is provided. It is the composition which was made. Here, FIGS. 6A to 6C are diagrams showing a configuration for balancing the rotational balance when the centrifugal force is applied by the centrifugal force applying device 2.

  With this configuration, as shown in FIGS. 6B and 6C, the centrifugal force applying device 2 is applied to both ends by attaching the microchips 200 to the chip holding portions 26 at both ends of the rotating arm 20. The weight can be made substantially the same, and the weight balance can be kept in equilibrium. Therefore, the rotary arm 20 can be rotated at a high speed with a stable balance.

Further, since centrifugal force can be simultaneously applied to the two microchips 200, centrifugal force can be efficiently applied to a large number of microchips 200.
If there is no need to apply two centrifugal forces at the same time, for example, one chip rotation mechanism unit can be simply configured by combining the weight of the other chip rotation mechanism unit with the analysis side. Also good. In this case, for example, if it is assumed to be applied to various types of microchips (for example, the same shape but different weight), only one chip holding unit 26 is provided in one chip rotation mechanism unit, A dummy chip having the same weight as that of the microchip 200 is attached to the chip holding unit 26 to achieve a weight balance with the other chip rotation mechanism unit. In addition, when dedicated to a constant weight microchip, one chip rotation mechanism may be configured with a weight including the weight of the microchip. Thereby, it can be set as a simpler structure.

With these configurations, the weight balance can be kept in balance, and the cost of the tip rotation mechanism portion on the side where centrifugal force is not applied to the microchip can be reduced.
Returning to FIG. 3, the centrifugal force applying device 2 is further configured to include a turntable driving force transmission mechanism 27 that transmits power for generating the rotation force of the turntable rotation shaft 24 to the turntable rotation mechanism 25. The

The turntable driving force transmission mechanism 27 moves the pusher 27g straightly upward by the driving force of the solenoid, and stops the transmission portion 25c of the turntable rotation mechanism 25 stopped at the posture change position on the upper plate of the base 1. By pushing up, the rotary table rotating mechanism 25 is configured to transmit an upward linear motion force.
Next, based on FIG. 7, the detailed structure of the turntable rotation mechanism 25 is demonstrated.

Here, FIG. 7 is a side view showing a detailed configuration of the turntable rotation mechanism 25.
As shown in FIG. 7, the rotary table rotating mechanism 25 is fixedly supported below the chip rotary table 23 and on the lower surface of the rotary arm 20. The part is configured to be inserted from above. The upper surface of the case is configured to be covered with the lower surface portion of the rotary arm 20, and an opening is provided in the lower surface portion of the case.

The turntable rotation mechanism 25 is further provided in the case with a cylindrical cam 25a slidably inserted along the turntable rotation shaft 24 by inserting a part of the turntable rotation shaft 24 inside. ing. Further, two guide portions 25b extending in the vertical direction are formed at positions facing each other in the horizontal direction on the wall in the case sandwiching the rotary base rotating shaft 24 and the cam 25a.
Here, FIG. 8A is a front view of the cam 25a, and FIG. 8B is a bottom view of the cam 25a.

  As shown in FIG. 8A, the cam 25a forms eight inclined surfaces 25m formed continuously along the circumferential direction on the upper end surface of the cylindrical shape, and the back surface of each inclined surface 25m. An upper end cam surface 25j composed of eight walls 25n is formed. The inclined surface 25m has an inclination in which the upper end of the wall 25n is the top of the inclination and descends from the top toward the clockwise direction of the upper end surface.

  As shown in FIGS. 8A and 8B, the cam 25a further includes eight inclined surfaces 25p formed continuously along the circumferential direction on the cylindrical lower end surface, and a lower side described later. A lower end cam surface 25o including eight pin fitting grooves 25q for fitting the cam pins 25e and eight walls 25r forming the back surface of each inclined surface 25p is formed. As shown in FIG. 8 (b), the inclined surface 25p has a “mountain” portion in the drawing as the top of the inclination as seen from the bottom surface side, and the lower end position on the inclination side of the pin fitting groove 25q is inclined therefrom. As the end of the slope, it has a slope displaced in the clockwise direction. That is, the lower end cam surface 25o is formed with an inclined surface 25p having an inclination direction opposite to the direction of the inclined surface 25m of the upper end cam surface 25j when viewed upside down. From the viewpoint of FIG. 8A, the “mountain” portion shown in FIG. 8B is located at the lowest position of the lower end cam surface 25o.

The pin fitting groove 25q is a straight recess formed straightly upward along the wall surface of the wall 25r between each inclined surface 25p and the wall 25r which is the back surface of the adjacent inclined surface 25p. .
Further, the inclination angle of each inclined surface 25m of the upper end cam surface 25j and the inclination angle of each inclined surface 25p of the lower end cam surface 25o are such that the upper end cam surface 25j is larger than the lower end cam surface 25o (the inclination is sharper). Formed at an angle). Therefore, the height of the wall 25n of the upper end cam surface 25j is higher than the height of the wall 25r of the lower end cam surface 25o.

Further, the cam 25a has a predetermined circumferential angle (for example, 22.5) between the position of the top of the wall 25n that is the top of each inclined surface 25m and the position of the top of the wall 25r that is the top of each inclined surface 25p. [°]) are shifted in the circumferential direction.
Further, as shown in FIGS. 8A and 8B, an annular transmission portion 25c is formed integrally with the cam 25a along the outer periphery of the lower end portion of the cam 25a. The transmission portion 25c is formed with two engagement grooves 25t that are engaged with the guide portion 25b provided on the inner wall of the case at positions facing each other in the radial direction. The diameter of the transmission portion 25c is slightly shorter (substantially the same length) than the diameter of the inner diameter of the case.

  As shown in FIG. 7, the transmission portion 25c integrally formed with the cam 25a engages the two guide portions 25b provided on the inner wall of the case with the two engagement grooves 25t of the transmission portion 25c, respectively. The cam 25a and the transmission portion 25c are disposed in the case so as to be slidable in the vertical direction along the guide portion 25b and the rotary base rotating shaft 24. In other words, the cam 25a and the transmission portion 25c can be moved up and down by the guide portion 25b while preventing the cam 25a and the transmission portion 25c from rotating around the rotary table rotating shaft 24.

  On the other hand, on the outer peripheral surface of the insertion portion of the rotary base rotating shaft 24 inserted into the case, two upper cam pins 25d are located at a height position within the upward movement range of the upper end cam surface 25j of the cam 25a. Are provided at equal intervals along the circumferential direction of the rotary table rotation shaft 24 at the same height. Further, on the outer peripheral surface of the insertion portion of the rotary base rotating shaft 24 inserted into the case, four lower cam pins are located at a height position within the downward movement range of the lower end cam surface 25o of the cam 25a. 25e are provided at equal intervals in the circumferential direction at equal intervals.

  The upper cam pin 25d is provided at a height position where at least the inclined surfaces 25m of the upper cam surface 25j and the upper cam pin 25d do not contact when the cam 25a is at the lowermost position. Yes. Further, the lower cam pin 25e is at a height position at which at least the inclined surfaces 25p of the lower end cam surface 25o and the lower cam pin 25e do not contact when the cam 25a moves to the uppermost position. When the cam 25a is moved to the lowermost position, the lower cam pin 25e is provided at a height position that fits into the pin fitting groove 25q of the lower end cam surface 25o. That is, when the cam 25a is at the lowermost position, as shown in FIG. 8B, the four lower cam pins 25e are fitted in the pin fitting grooves 25q.

Returning to FIG. 7, the turntable rotating mechanism 25 is further provided with a ring-shaped low slip in the case for reducing the coil spring 25 f and sliding resistance at both ends due to the rotation of the coil spring 25 f during expansion and contraction. A moving member 25g (for example, a ring-shaped spacer made of a resin material such as a fluororesin) is disposed.
When the cam 25a and the transmission portion 25c are disposed in the case, the coil spring 25f is inserted through a portion of the lower end side of the rotary base rotating shaft 24 and the cam 25a inward, and the upper end portion of the coil spring 25f is connected to the rotary arm 20. Is disposed in the case with the lower end facing the upper surface of the transmission portion 25c.

  The coil spring 25f has the same rotational direction due to the torsional force when the coil spring 25f is contracted and the winding direction of the spring 25f, and the rotational direction when the spring 25f is restored from the contracted state and the spring 25f. Has a structure in which the direction opposite to the winding direction is the same direction. Thereby, the sliding resistance of the both ends of the coil spring 25f can be reduced, and a smooth expansion / contraction operation can be performed.

When the low-sliding member 25g is provided with the coil spring 25f, the low-sliding member 25g is inserted through the rotary base rotating shaft 24 inward, between the upper end portion of the coil spring 25f and the lower surface of the rotary arm 20, and the lower end portion of the coil spring 25f. And a member interposed between the upper surface of the transmission portion 25c. By interposing the low sliding member 25g, in addition to the reduction of the sliding resistance due to the winding direction of the coil spring 25f described above, the sliding resistance at both ends of the coil spring 25f can be further reduced. An expansion / contraction operation can be performed.
Further, in the present embodiment, the members forming the cam 25a, the upper cam pin 25d, the lower cam pin 25e, and the rotary base rotating shaft 24 are configured by a combination of materials that are less likely to cause galling. .

In the present embodiment, the combinations of the materials of the parts forming the cam 25a, the upper cam pin 25d, the lower cam pin 25e, and the rotary base rotating shaft 24 are shown in the following 4A. Use one of the streets.
(A) A combination of a cam 25a made of nylon, upper and lower cam pins 25d and 25e made of carbon steel such as hardened S45C, and a rotating base rotary shaft 24 made of iron.
(B) For example, a cam 25a formed of stainless steel such as SUS304, upper and lower cam pins 25d and 25e formed of carbon steel such as quenched S45C, and a rotary base rotating shaft 24 formed of iron combination.
(C) For example, a cam 25a formed of stainless steel such as SUS304, upper and lower cam pins 25d and 25e formed of carbon steel such as hardened S45C, and a rotating table rotating shaft formed of brass. Combination with 24.
(D) For example, a cam 25a formed of cast iron such as FC200, upper and lower cam pins 25d and 25e formed of carbon steel such as hardened S45C, for example, and a turntable rotating shaft 24 formed of iron Combination.

  That is, if the same metal material is slid, the affinity between the two becomes high and “galling (seizure)” is likely to occur. Therefore, the cam 25a, the upper cam pin 25d, the lower cam pin 25e, and the rotation By making the material of the table | shaft rotating shaft 24 into any combination of said (A)-(D), generation | occurrence | production of "galling" by the sliding parts can be made hard to raise | generate.

Next, a detailed configuration of the turntable driving force transmission mechanism 27 will be described with reference to FIG.
Here, FIG. 9 is a diagram showing a detailed configuration of the turntable driving force transmission mechanism 27.
As shown in FIG. 9, the rotary table driving force transmission mechanism 27 includes a solenoid body 27a, a solenoid shaft 27b, a shock absorber 27c, and a support bracket 27d that fixes and supports the shock absorber 27c with respect to the base 1. An impact absorbing bracket 27e coupled to the lower end of the solenoid shaft 27b, a buffer member 27f (for example, a rubber sponge) attached to the tip of the solenoid shaft 27b, and a pusher 27g connected to the tip of the solenoid shaft 27b. It is comprised including.

  The solenoid body 27a includes a coil, a fixed iron core inserted into the coil, a magnetic material made of a magnetic material that is magnetically connected to the fixed iron core and surrounds the coil in a housing formed of a nonmagnetic material. The frame includes a frame and a movable core provided in the housing so as to be movable toward and away from the fixed core. In the present embodiment, the solenoid shaft 27b is inserted into a through-hole provided in the movable iron core of the solenoid main body 27a and attached to the movable iron core so as not to be relatively movable in the axial direction. Accordingly, when a magnetic flux is generated by energizing the coil, the magnetic flux magnetizes the movable iron core, pulls the movable iron core toward the fixed iron core, and the solenoid shaft 27b attached to the movable iron core is drawn together with the movable iron core. That is, the solenoid shaft 27b is moved straight by the magnetic attraction force of the solenoid body 27a.

  In the present embodiment, the rotary table driving force transmission mechanism 27 is disposed inside the base 1 with the tip of the solenoid shaft 27 b facing upward in a direction perpendicular to the upper plate of the base 1. The solenoid shaft 27b is linearly moved upward by the magnetic attraction force of the solenoid body 27a, and this linear movement force is transmitted to the transmission part 25c of the rotary base rotation mechanism 25 by the pusher 27g connected to the tip part. .

The solenoid shaft 27b is a force transmission body. A pusher 27g is coupled to the upper end side of the solenoid shaft 27b, and an impact absorbing bracket 27e is coupled to the lower end side thereof. The solenoid shaft 27b is linearly moved upward by driving the solenoid body 27a. As a result, the pusher 27g and the shock absorbing bracket 27e also move straight upward.
The shock absorber 27c includes a cylinder, a piston rod inserted through a rod hole provided in the cylinder, a piston portion to which a rear end portion of the piston rod is fixed, and a reciprocating motion provided in the cylinder. One end is supported by the rear end portion of the piston portion, and the other end is supported by a return coil spring supported by the rear end portion in the cylinder.

Further, the shock absorber 27c is fixedly supported on the base 1 with the tip of the piston rod facing the shock absorbing bracket 27e via the support bracket 27d.
The periphery of the piston portion is sealed with a ring-shaped sealing member such as an O-ring, and prevents liquid from passing between the periphery of the piston portion and the inner wall of the cylinder when moving in the cylinder. The rod hole is also sealed with a seal member such as an O-ring so that liquid does not leak outside.

Further, the piston part is provided with a through hole that is always opened in the reciprocating direction and a valved through hole that is opened according to the moving direction of the piston part.
The through hole with valve opens the valve when the piston moves in the direction of the cylinder, allowing the liquid to pass through the through hole, and closes the valve when moving in the direction opposite to the direction of the cylinder to allow the liquid to pass through. It has a structure that makes it impossible.

As a result, when the piston moves toward the inside of the cylinder, the piston moves through the through-hole and the valve-equipped through-hole that are always open while passing through the liquid sealed in the cylinder. The impact applied to the piston rod is absorbed by the resistance when passing through.
Further, when the piston portion moves in the cylinder due to the movement of the piston rod toward the inside of the cylinder, the return coil spring is contracted by receiving the force. When the force applied to the piston rod disappears, the restoring force of the coil spring pushes the piston portion in the reverse direction, thereby closing the valve of the valved through hole, so that the piston portion is always open. The liquid moves through the cylinder only through the hole, and the piston rod and the piston part are returned to the initial positions.

The shock absorbing bracket 27e moves straight toward the tip of the piston rod of the shock absorber 27c fixedly supported on the base 1 side, and collides with the tip of the piston rod along with the straight movement of the solenoid shaft 27b in the upward direction. It is configured as follows.
Also, a shock absorbing member 27f is attached to the tip of the solenoid shaft 27b, and when the pusher 27g collides with the transmission portion 25c, the impact due to the collision is absorbed.

  The pusher 27g has a cylindrical convex portion formed at the tip thereof, and at the time of push-up operation, the annular upper end surface of the cylindrical convex portion comes into contact with the annular lower surface of the transmission portion 25c and the transmission portion Push up 25c. As a result, the upward linear movement force is transmitted to the cam 25a formed integrally with the transmission portion 25c. The pusher 27g has an outer diameter that is the same as or substantially the same as the diameter of the transmission portion 25c, and an inner diameter that is at least larger than the diameter of the rotary base rotating shaft 24.

  With the above configuration, when the solenoid shaft 27b moves linearly, the impact absorbing bracket 27e collides with the tip of the piston rod, and this collision force causes the piston to move in the cylinder while passing the liquid through the through hole. The impact due to the collision is absorbed by the resistance force at this time, and the solenoid shaft 27b moves the solenoid shaft 27b straightly in the upward direction in a state where the impact is absorbed, and the pusher 27g at the tip of the solenoid shaft 27b is moved to the turntable rotating mechanism. It is made to collide with 25 transmission parts 25c. At this time, the shock at the time of collision is relieved by the buffer member 27f. Further, the depression formed inside the convex portion at the tip of the pusher 27g allows the lower end portion of the rotary table rotating shaft 24 to escape into the depression during the push-up operation, and the lower ends of the pusher 27g and the rotary table rotating shaft 24. The force can be transmitted to the transmitting portion 25c without contacting the portion.

  Further, when the rotary arm 20 is stopped at the posture change position, the pusher is located at a position directly below the opening formed in the lower surface of the case of the rotary base rotary mechanism 25 on the rear end side of the rotary arm 20 in the upper plate. A through hole having a diameter that enables reciprocation of 27 g is provided. The through hole has a cylindrical shape with the axis of the rotary table rotation shaft 24 as the center of the circle. The turntable driving force transmission mechanism 27 is disposed on the lower surface side of the posture change position on the upper plate by inserting the pusher 27g into the through hole in a state where the center of the pusher 27g and the center of the through hole are aligned. Has been. The solenoid shaft 27b and the pusher 27g are arranged so that the entire pusher 27g can be accommodated in a through hole provided at the posture changing position at the initial position when the solenoid body 27a is stopped.

Here, FIGS. 10A to 10C are views showing the operation of the rotating base rotating mechanism 25 when the pusher 27g pushes up. FIGS. 11A to 11C are views showing the operation of the rotary base rotating mechanism 25 after being pushed up by the pusher 27g.
With the above configuration, when a control signal from a control board (not shown) in the base 1 is input while the rotary arm 20 is stopped at the posture change position, the rotary base driving force transmission mechanism 27 responds to the control signal. The solenoid body 27a is driven. As a result, the solenoid shaft 27b moves straight upward, and the pusher 27g connected to the upper end of the solenoid shaft 27b moves upward. At this time, the shock absorbing bracket 27e collides with the piston rod of the shock absorber 27c, and part of the shock when the solenoid shaft 27b moves straight is absorbed. The solenoid shaft 27b passes through a through hole provided in the upper plate of the base 1 in a state where the shock is absorbed by the shock absorber 27c, passes through an opening on the lower surface of the case of the rotary base rotation mechanism 25, and transmits the transmission portion 25c. To the bottom surface of

On the other hand, as shown in FIG. 10A, the turntable rotating mechanism 25 is in a state where the four lower cam pins 25e are respectively fitted in the pin fitting grooves 25q of the lower end cam surface 25o of the cam 25a. ing. That is, the cam 25a is positioned at the lowest end together with the transmission portion 25c.
In this state, when the end surface of the annular convex portion of the pusher 27g collides upward with the annular lower surface of the transmission portion 25c due to the rectilinear movement of the solenoid shaft 27b, the push-up force is integrally formed with the transmission portion 25c. As shown in FIG. 10 (b), the cam 25a together with the transmitting portion 25c is rotated upward along the rotary base rotating shaft 24 without rotating the cam 25a. Move straight ahead. By this linear movement, the two upper cam pins 25d abut against the corresponding two inclined surfaces 25m among the eight inclined surfaces 25m formed on the upper end cam surface 25j of the cam 25a. On the other hand, the impact when the pusher 27g collides with the transmission portion 25c is alleviated by the buffer member 27f attached to the tip of the solenoid shaft 27b.

Further, as shown in FIG. 10B, the coil spring 25f interposed between the rotary arm 20 and the transmission portion 25c is contracted by receiving the force due to the upward movement of the cam 25a.
Subsequently, when the cam 25a moves upward from the state shown in FIG. 10B, as shown in FIG. 10C, due to the upward force transmitted from the cam 25a to the upper cam pin 25d, The upper cam pin 25d slides along the inclined surface 25m formed on the upper end cam surface 25j of the cam 25a from the abutting position toward the inclined heel direction. That is, the upwardly moving force of the cam 25a in the upward direction is converted into the rotational driving force of the upper cam pin 25d, that is, the rotational driving force of the rotary base rotating shaft 24 by the inclined surface 25m of the upper end cam surface 25j. Thereby, the turntable rotating shaft 24 rotates in the clockwise direction.

  As shown in FIG. 11A, the rotary table rotating shaft 24 rotates until the upper cam pin 25d moving along the inclined surface 25m hits a wall 25n forming the back surface of the adjacent inclined surface 25m. When the movement is stopped by hitting the wall 25n, the rotation stops there. That is, during the push-up operation of the cam 25a, the rotary table rotating shaft is rotated by a rotation angle corresponding to the moving distance from when the upper cam pin 25d comes into contact with the inclined surface 25m until it slides and hits the wall 25n. 24 rotates clockwise. As a result, the chip turntable 23 and the chip holder 26 formed on the upper part thereof rotate in the clockwise direction.

In the present embodiment, the resistance at the time of sliding can be obtained by using a cam follower instead of the upper cam pin 25d on the outer peripheral surface of the rotary table rotating shaft 24 or by providing a bearing on the upper cam pin 25d. It is also possible to make it easier to rotate.
On the other hand, as shown in FIG. 11 (a), when the upper cam pin 25d is in contact with the wall 25n (when it is located at the base of the slope), the rotary table driving force transmission mechanism 27 uses the solenoid body. When the driving of the cam 27a is stopped, the push-up force of the pusher 27g is removed in the rotary base rotating mechanism 25. Therefore, the cam 25a is transferred to the transmission portion by the restoring force of the coil spring 25f that has shrunk by the upward movement of the cam 25a. Together with 25c, as shown in FIG. 11 (b), it moves straight forward along the guide portion 25b without rotating.

  At this time, the rotary table rotating shaft 24 is displaced in the clockwise direction due to the rotation at the time of push-up, and the four lower cam pins 25e fitted in the pin fitting groove 25q in the initial state are also shifted in the clockwise direction. By the downward movement of the cam 25a in the downward direction, the four lower cam pins 25e abut against the corresponding four of the eight inclined surfaces 25p formed on the lower end cam surface 25o of the cam 25a. .

The solenoid shaft 27b is moved downward by this force and its own weight because the pusher 27g is pushed by the transmitting portion 25c that moves downward by the restoring force of the coil spring 25f.
Subsequently, when the cam 25a further moves downward from the state shown in FIG. 11 (b) by the restoring force of the coil spring 25f, as shown in FIG. 11 (c), the cam 25a moves to the lower cam pin 25e. The lower cam pin 25e is moved upward along the inclined surface 25p constituting the lower end cam surface 25o from the abutting position (toward the pin fitting groove 25q) by the transmitted downward force. Direction). That is, the downward moving force of the cam 25a is converted into the rotational driving force of the lower cam pin 25e, that is, the rotational driving force of the rotating base rotating shaft 24 by the inclined surface 25p. Rotate clockwise. As a result, the chip turntable 23 and the chip holding part 26 formed on the upper part thereof rotate clockwise to further change the rotation angle position of the microchip held by the chip holding part 26.

  Then, as shown in FIG. 11C, the lower cam pin 25e rotates until it hits the wall forming the pin fitting groove 25q, and stops rotating when it hits the wall. The cam 25a moves downward even after hitting the wall, and the lower cam pin 25e moves along the wall and fits into the pin fitting groove 25q. When the lower cam pin 25e is fitted in the pin fitting groove 25q, the downward movement of the cam 25a is also stopped. As a result, the rotary base rotating shaft 24 rotates clockwise by a rotation angle corresponding to the moving distance from when the lower cam pin 25e contacts the inclined surface 25p until it hits the wall of the pin fitting groove 25q. It will be.

In the present embodiment, a cam follower is provided on the outer peripheral surface of the rotary table rotating shaft 24 instead of the lower cam pin 25e, or a bearing is provided on the lower cam pin 25e, so that the sliding time can be reduced. It is also possible to reduce the resistance of the steel and make it easier to rotate.
In this way, the centrifugal force imparting device 2 rotates the rotating table rotating shaft 24 in the clockwise direction by the push-up operation of the rotating table driving force transmission mechanism 27, so that the microchip 200 held by the chip holding unit 26 is rotated. The rotation angle position (posture) can be changed.

  Further, the inclined direction of the inclined surface 25p constituting the lower end cam surface 25o is set to a direction in which the rotary table rotating shaft 24 is rotated clockwise (inclination extending from the lower right to the upper left), and the rotating arm 20 at the time of applying centrifugal force. Since the rotation direction is clockwise, when the rotary arm 20 is rotated at a high speed in the clockwise direction, the lower cam pin 25e faces the wall forming the pin fitting groove 25q of the cam 25a. A force is applied in the pressing direction. Accordingly, when the rotary arm 20 is rotated and a centrifugal force is applied, it is possible to prevent the rotary table rotating shaft 24 from rotating due to the centrifugal force. It is possible to prevent centrifugal force from being applied in any direction.

Further, the cam 25a is configured such that the inclination angle of the inclined surface 25m of the upper end cam surface 25j is steeper than the inclination angle of the inclined surface 25p of the lower end cam surface 25o. The force required when sliding along the inclined surface 25m can be made smaller than the force required when sliding the lower cam pin 25e along the inclined surface 25p.
In the present embodiment, since the force applied to the cam 25a by the restoring force of the coil spring 25f is larger than the force applied to the cam 25a when pushed up by braking by the shock absorber 27c, the inclination angle of the inclined surface 25m is set. By making the angle steeper than the inclined surface 25p, the force required to slide the upper cam pin 25d is reduced.

On the other hand, when the cam 25a moves downward, a greater force is applied than when the cam 25a is pushed up, so that the lower cam pin 25e slides along the inclined surface 25p even if there is no inclination angle as much as the inclined surface 25m. Therefore, the inclination angle of the inclined surface 25p is made smaller than the inclination angle of the inclined surface 25m, and accordingly, the height of the wall forming the back surface is made lower than that of the wall 25n.
That is, since the wall height (inclination vertex position) can be lowered, the height of the cam 25a can be reduced accordingly. Further, since the stroke distance of the solenoid shaft 27b can be shortened by the height of the wall, the height of the wall 25n that forms the back surface of the inclined surface 25m and the wall 25r that forms the back surface of the inclined surface 25p. Compared to the case where the height of the rotary table is the same, the rotary table driving force transmission mechanism 27 can be downsized.

  Further, since the cam 25a has a configuration in which the upper end cam surface 25j is provided at the upper end of the cylindrical shape and the lower end cam surface 25o is provided at the lower end, the solenoid shaft is more than the configuration in which only one of the cam surfaces is provided. The stroke distance of 27b can be shortened. For example, in the configuration in which the cam surface is provided only at the upper end, if the inclination length of the inclined surface is doubled, the stroke distance of the solenoid shaft 27b is doubled, leading to an increase in the size of the device such as increasing the length of the solenoid shaft 27b. Measures are needed.

  Further, the rotary table rotating mechanism 25 and the rotary table driving force transmission mechanism 27 are separated, and the push-up force of the rotary table driving force transmission mechanism 27 is rotated by rotating the rotary table by the vertical movement of the cam 25a along the rotary table rotating shaft 24. Since the rotary table rotating shaft 24 does not need to be moved up and down in order to rotate the rotating table rotating shaft 24, the chip rotating table 23 and the chip holding unit 26 are provided. It can be rotated on the spot without moving up and down. This eliminates the need for a structure in which the tip rotating table 23, the rotating table rotating shaft 24, and the chip holding unit 26 are moved up and down (can be fixedly supported). For example, the rotation of the arm rotating shaft 21 becomes unbalanced, Even if an upward force is applied to these components, the components can be prevented from rising.

Next, a detailed configuration of the optical measuring device 3 will be described with reference to FIGS.
Here, FIG. 12A is a plan view of the optical measuring device 3, and FIGS. 12B and 12C are side views of the optical measuring device 3. FIG. FIGS. 13A and 13B are diagrams illustrating an example of the slide movement operation of the optical information measurement unit 30. FIG.
As shown in FIGS. 12A to 12C, the optical measurement device 3 includes an optical information measurement unit 30, a first slide rail 32, a second slide rail 33, a first slider 34, and a second slider. A slider 35 and a slide assisting member 36 are included.

  The first and second slide rails 32 and 33 are linear slide rails, and stop at a position (hereinafter referred to as a measurement position) where the rotary arm 20 is rotated 90 ° clockwise with respect to the posture change position. When fixed, a fixed distance is provided on the base 1 in parallel with a predetermined distance in the front-rear direction on the right side of the tip rotation mechanism portion with respect to the stop position of the tip rotation mechanism portion of the centrifugal force applying device 2. Has been.

  Further, first and second sliders 34 and 35 are mounted on the first and second slide rails 32 and 33 so as to be slidable along the rail portions. Further, the first and second sliders 34 and 35 have attachment portions extending in the height direction so that the optical information measuring unit 30 is disposed above the first and second slide rails 32 and 33. Yes. The first and second sliders 34 and 35 are fixed to the optical information measuring unit 30 through the attachment portion. The first and second sliders 34 and 35 are reciprocated along the rail portion so that the optical information measuring unit 30 moves straight in a direction approaching and separating from the tip rotation mechanism unit of the centrifugal force applying device 2. Move. The first and second slide rails 32 and 33 can perform measurement processing on the microchip 200 held by the chip holding unit 26 when the optical information measuring unit 30 is closest to the chip rotation mechanism unit. In the position.

  In the present embodiment, the slide auxiliary member 36 has an L-shape in which one ends of the two prismatic members 36a and 36b are coupled (for example, screwed), and the L-side is turned upside down. (Here, the prism member 36 b) is arranged so that the prism member 36 a passes between the first and second slide rails 32, 33 in parallel therewith and the prism member 36 a is more than the upper plate of the base 1. The base 1 is fixedly supported so as to be arranged at a high position. Thereby, the prism member 36a is fixedly supported on the base 1 in a state in which the other end portion is directed straight in the direction in which the optical information measuring unit 30 is approached.

The optical information measuring unit 30 attaches the first and second sliders 34 and 35 fixed to the optical information measuring unit 30 to the first and second slide rails 32 and 33 so as to be slidable along the rail portions. The prismatic member 36a is slidably fitted along the prismatic member 36a in the fitting opening provided in the upper plate of the base 1 so as to be slidable.
Therefore, when the first and second sliders 34 and 35 slide along the rail portion, the optical information measuring unit 30 also moves in the same movement direction as the first and second sliders 34 and 35 along the slide portion and the prism member 36a. Slide.

  Note that the slide movement mechanism by the first and second slide rails 32 and 33 and the slide auxiliary member 36 can suppress the vertical movement of the optical information measuring unit 30 when moving toward and away from the optical information measuring unit 30. While keeping parallel to the upper surface of the base 1, it can be surely moved straight in a direction approaching and separating from the chip rotation mechanism. As a result, the optical information measuring unit 30 during the measurement process and the microchip 200 held by the chip holding unit 26 can be accurately positioned, and reproducibility for movement to an accurate processing position can be ensured. it can.

The optical measuring device 3 further includes a mandrel 37, a return spring portion 38, a solenoid 39, a solenoid shaft 40, and a transmission member 41.
The mandrel 37 is a mandrel of the coil springs 38a and 38b of the return spring portion 38, has a spring stopper at the tip, and is a straight line in the longitudinal direction of the upper side prism member 36a below the upper side prism member 36a. The rear end portion is fixedly supported by the lower-side prismatic member 36b so that the longitudinal axis of the mandrel 37 is parallel to the longitudinal axis.

  The return spring portion 38 includes coil springs 38a and 38b and a ring-shaped connecting member 38c. The two coil springs 38a and 38b are connected via a connecting member 38c, and a mandrel 37 fixedly supported by the lower side prism member 36b is inserted inside the two connected springs. Further, a stopper is provided at the tip of the mandrel 37, and this stopper prevents the spring from coming off. Further, the connecting member 38c is provided so as to be slidable along the mandrel 37. When receiving an external force, the connecting member 38c moves along the mandrel 37 while expanding and contracting the coil springs 38a and 38b.

The solenoid 39 has the same configuration as that of the solenoid body 27a of the rotary table driving force transmission mechanism 27. The solenoid 39 generates a magnetic flux by energizing an internal coil to magnetize the movable iron core. By moving the core toward the fixed iron core, the movable iron core is moved straight in the same direction as the slide direction of the optical information measuring unit 30 (a straight movement force is generated).
The solenoid shaft 40 is inserted into a through-hole provided in the movable iron core of the solenoid 39 and is attached so as not to be relatively movable in the axial direction with respect to the movable iron core, and the movable iron core is generated by magnetic attraction generated by energization of the coil of the solenoid 39. And go straight ahead.

The transmission member 41 is coupled on the same straight line as the distal end portion of the solenoid shaft 40, the coupling member 38c, and the coupling portion (not shown) of the optical information measurement unit 30, and the linear movement force of the solenoid shaft 40 is converted to the return spring portion. 38 and the optical information measuring unit 30 are transmitted substantially simultaneously.
With the above configuration, as shown in FIG. 13A, the optical measuring device 3 is driven by the solenoid 39 to move the solenoid shaft 40 in a straight line, so that the straight movement force is transmitted to the transmission member 41 and the connecting member 38c. Is transmitted to the coil springs 38 a and 38 b through the optical information measuring unit 30 and is transmitted to the optical information measuring unit 30 through the coupling unit of the optical information measuring unit 30. As a result, as shown in FIG. 13B, the coil spring 38a is contracted and the coil spring 38b is extended by the linear movement force transmitted through the connecting member 38c. On the other hand, the first and second sliders 34 and 35 together with the optical information measuring unit 30 are moved to the rails of the first and second slide rails 32 and 33 by the linear movement force transmitted through the coupling unit of the optical information measuring unit 30. It moves straight along the part in the direction approaching the tip rotation mechanism part.

  Further, in the state shown in FIG. 13B, when the drive of the solenoid 39 is stopped and the linear movement force in the approaching direction is removed from the coupling portion and the connecting member 38c of the optical information measuring unit 30, the coil spring 38a and the coil Due to the restoring force of the spring 38b, a linear movement force is generated in a direction in which the optical information measurement unit 30 is separated from the chip rotation mechanism unit, and the optical information measurement unit 30 is moved along the rail portions of the first and second slide rails 32 and 33. And move straight in the direction of separation. Thereby, the optical information measurement part 30 moves the distance from the state which the coil springs 38a and 38b expanded / contracted to returning to the original length to a separation direction.

Next, a detailed configuration of the optical information measurement unit 30 will be described with reference to FIG.
14A and 14B are plan views of the optical information measuring unit 30 when moved to the measurement processing position, and FIG. 14C is a plan view of the laser light receiving unit 30g. ) And (e) are side views of the optical information measuring unit 30 when moving to the measurement processing position.
As shown in FIGS. 14A and 14B, the optical information measuring unit 30 is formed of a resin member (insulating member) such as nylon and has a substantially U-shaped laser beam irradiation unit 30a and a laser beam receiving unit. The laser beam irradiation unit 30a is disposed above the laser beam receiving unit 30f so that both of them are opposed to each other in the vertical direction at a position where the shapes overlap each other.

As shown in FIGS. 14 (a) and 14 (b), the laser light irradiation unit 30a has three laser heads at the left end of the rear part among the parts located in front of and behind the substantially U-shaped depression. Are arranged in a straight line in the vertical direction, and a first laser head portion 30b (a circled portion (upper side) in the figure) is provided.
Further, the laser beam irradiation unit 30a has three portions in the direction orthogonal to the arrangement direction of the first laser head portions 30b, on the left side of the front portion among the portions located in front of and behind the substantially U-shaped depression. A second laser head portion 30c (a portion surrounded by a circle (lower side) in the figure) having a configuration in which two laser heads are arranged in a straight line is provided.

  Each laser head of the first laser head unit 30b and the second laser head unit 30c has a laser beam input port at one end and a laser beam irradiation port at the other end, and the laser beam irradiation unit 30a is provided for each laser head. Is disposed in a through hole formed in a direction perpendicular to the vertical direction. Further, the laser light input port faces the hole above the through hole, and the laser light irradiation port faces the hole below the through hole.

That is, the first laser head unit 30b and the second laser head unit 30c have a configuration in which the periphery of each laser head except for both ends where the input port and the irradiation port are formed is surrounded by the insulating member.
In the present embodiment, an optical fiber (not shown) as a laser beam transmission path is further connected to the laser beam input port side. The first laser head unit 30b and the second laser head unit 30c are configured so that laser light from a laser light source (for example, a semiconductor laser) disposed in the base 1 is transmitted through the optical fiber through the first and first laser beams. 2 When input from the input ports of the laser head units 30b and 30c, the input laser beam is irradiated from the irradiation port.

In the present embodiment, the wavelengths of the laser beams irradiated by the first laser head unit 30b and the second laser head unit 30c are configured to be different from each other (or configured to be adjustable).
The wavelength of the laser light is set in the range of 700 to 1200 [nm] (near infrared light range), for example, if the sample liquid is blood. Thus, for example, when plasma components mixed with a reagent having an absorbance component are centrifuged and irradiated with laser light having a different wavelength, oxygenated hemoglobin in blood is obtained from the transmitted light or reflected light. The amount, deoxygenated hemoglobin amount, total hemoglobin amount, oxygenated myoglobin amount, deoxygenated myoglobin amount, total myoglobin amount, and the like can be measured.

  Further, in each of the three laser heads constituting the first laser head unit 30b and the second laser head unit 30c, in FIG. 14 (a) and FIG. 14 (b), the center of the irradiation port is the measurement unit 200a of the microchip 200. When the optical information measurement unit 30 is at the measurement processing position and the measurement unit 200a is at the rear side along the right side of the microchip 200 The measurement point and the laser head of the first laser head portion 30b are disposed so as to be in a positional relationship facing each other in the vertical direction. When the optical information measurement unit 30 is at the measurement position and the measurement unit 200a is at the right position along the front side of the microchip 200, the measurement point and the laser of the second laser head unit 30c It is arranged so as to be in a positional relationship facing the head in the vertical direction.

  That is, when the rotary arm 20 of the centrifugal force application device 2 is at the measurement position and the optical information measurement unit 30 of the optical measurement device 3 is at the measurement processing position, the posture of the microchip 200 is shown in FIG. In the state, the three irradiation ports of the first laser head unit 30b face the three measurement points of the measurement unit 200a in the vertical direction, respectively, while the microchip 200 is in the state shown in FIG. In some cases, the three irradiation ports of the second laser head unit 30c face the three measurement points of the measurement unit 200a in the vertical direction.

On the other hand, as shown in FIG. 14 (c), the laser light receiving unit 30f has 3 at the left end of the rear part among the parts located in front of and behind the substantially U-shaped depression. A first light receiving head portion 30g (a circled portion (upper side) in the figure) having a configuration in which two light receiving heads are arranged in a straight line in the vertical direction (coincident with the Y-axis direction) is provided.
Further, the laser light receiving unit 30f includes 3 in the direction orthogonal to the arrangement direction of the first light receiving heads 30g, on the left side of the front side portion among the portions located in front of and behind the substantially U-shaped depression. A second light receiving head portion 30h (a portion surrounded by a circle (lower side) in the figure) having a configuration in which two light receiving heads are arranged in a straight line is provided.

Specifically, each light receiving head is provided at a position facing each laser head of the first laser head unit 30b and the second laser head unit 30c in the vertical direction.
Each of the light receiving heads of the first light receiving head unit 30g and the second light receiving head unit 30h is composed of a light receiving element such as a photodiode. Each of the light receiving heads is disposed in a through hole formed in a direction perpendicular to the laser light receiving portion 30f. Further, the light receiving portion is disposed to face the hole on the upper surface side of the through hole, and the output portion is disposed to face the hole on the lower surface side of the through hole.

That is, the first light receiving head portion 30g and the second light receiving head portion 30h have a configuration in which the periphery of each light receiving head excluding both ends where the light receiving portion and the output portion are formed is surrounded by the insulating member.
Furthermore, an electrical cable (not shown) serving as an electrical signal transmission path is connected to the output unit. Then, the first light receiving head unit 30g and the second light receiving head unit 30h transmit an electric signal of the received light to a light receiving information processing unit (not shown) disposed inside the base 1 via an electric cable. To do.

  Furthermore, as shown in FIGS. 14A and 14B, the optical information measuring unit 30 has a corner on the right side rear side in the outer peripheral portion of the chip holding unit 26 facing in the horizontal direction when moved to the measurement processing position. A first support member 30d for fixing the position of the microchip 200 and the position of the optical information measuring unit 30 by contacting an inclined surface in accordance with the inclination of the corner portion, and a chip holding unit 26 that is also horizontally opposed. A second surface for fixing the position of the microchip 200 and the position of the optical information measuring unit 30 together with the first support member 30d by contacting an inclined surface matching the inclination of the corner with the corner on the front side of the right side of the outer periphery of And a support member 30e.

  As shown in FIGS. 14D and 14E, the laser beam irradiation unit 30a and the laser beam receiving unit 30f are opposed to each other in the vertical direction with a gap at the same shape position, as shown in FIGS. As shown in (b), the first support member 30d on the rear end side and the second support member 30e on the front end side sandwich the laser beam irradiation unit 30a and the laser beam receiving unit 30f to maintain the gap. In the state, both are fixedly supported.

  Here, the gap is provided to position the laser head on the upper side of the measuring unit 200a and the light receiving head on the lower side of the microchip 200 held by the chip holding unit 26 during the measurement process. During the measurement process, the microchip 200 held by the chip holding unit 26 is sandwiched together with the chip holding unit 26. Therefore, between the laser beam irradiation unit 30a and the laser beam receiving unit 30f, at least the vertical direction formed by the microchip 200 held by the chip holding unit 26, the chip holding unit 26, and the chip turntable 23 is formed. A gap having a thickness equal to or greater than the thickness is formed.

  Further, the first support member 30d and the second support member 30e are first aligned with the position of the corner on the rear side of one side facing the optical information measurement unit 30 of the chip holding unit 26 stopped in the measurement position in the horizontal direction. The second support member 30e is attached to the support member 30d in accordance with the position of the corner on the front side, and when the optical information measurement unit 30 is moved closer to the chip rotation mechanism unit, each inclined surface has each angle. The chip holding part 26 is fixed at an accurate measurement processing position.

  Further, as shown in FIGS. 14 (a) and 14 (b), the substantially U-shaped depressions formed in the laser beam irradiation unit 30a and the laser beam receiving unit 30f are arranged at the measurement processing position. During the movement, it serves to avoid contact between the detected parts 26 c and 26 d formed on the chip holding part 26 and the optical information measuring part 30. That is, when the optical information measurement unit 30 is moved closer to the chip rotation mechanism unit, the detected portion 26c or 26d enters the recess without contacting the optical information measurement unit 30, and when the measurement processing position is reached. Stop in the depression.

  With the above configuration, when the optical information measurement unit 30 is moved to the measurement processing position in the direction approaching the chip rotation mechanism unit when the rotary arm 20 is stopped at the measurement position, the laser beam irradiation unit 30a and the laser beam are moved. A part of the chip holding unit 26 and the chip turntable 23 on which the microchip 200 is mounted is sandwiched in a gap formed between the light receiving unit 30f and each of the first support member 30d and the second support member 30e. The inclined surface is in contact with the corner portion of the opposite side of the frame portion 26 a of the chip holding portion 26. That is, the first support member 30 d and the second support member 30 e press the corners with the force transmitted from the solenoid 39. Thereby, the positions of the laser beam irradiation unit 30a, the laser beam receiving unit 30f, and the measurement unit 200a are fixedly held at the measurement positions. That is, the positions of the laser light irradiation unit 30a and the laser light receiving unit 30f and the position of the chip holding unit 26 are fixed and held at an accurate measurement processing position.

  Further, in the present embodiment, when the microchip 200 is in the state shown in FIG. 14A by the control by the control board inside the base 1, the first laser head unit 30 b applies laser to the measuring unit 200 a. On the other hand, when the microchip 200 is in the state shown in FIG. 14B, the second laser head unit 30c is configured to irradiate the measurement unit 200a with laser light.

  Therefore, the laser light emitted from the three irradiation ports of the first laser head unit 30b passes through the three measurement points of the measurement unit 200a, and is received by the three light receiving units of the first light receiving head unit 30g. Laser light emitted from the three irradiation ports of the two laser head unit 30c passes through three measurement points of the measurement unit 200a and is received by the three light receiving units of the second light receiving head unit 30h.

With such a configuration, in the centrifugal force application device 2, the microchip 200 stopped at the measurement position can be measured with two types of laser beams having different wavelengths by simply changing the attitude of the microchip 200 by 90 °. Processing can be performed.
In addition, it is possible to configure the microchip 200 to perform measurement processing at two locations simultaneously by providing measurement portions at two locations in accordance with the positions of the first and second laser head portions 30b and 30c. is there.

Here, FIGS. 15A to 15C are diagrams illustrating an example of the optical information measurement unit 30 formed using a black insulating member.
In the present embodiment, the optical information measuring unit 30 further forms a substantially U-shaped body of the laser beam irradiation unit 30a and the laser beam receiving unit 30f, as shown in FIGS. A light absorbing member having a function of absorbing laser light is used for the member.

For the light absorbing member, a functional dye having a property of absorbing light having a wavelength in the near-infrared region (wavelength: 780 to 3000 nm) is added to the member forming the bodies of the laser light irradiation unit 30a and the laser light receiving unit 30f. Can be generated.
For example, laser light can be absorbed by adding the following pigments or dyes to the resin material. For example, black such as ceramic black, iron oxide (inorganic pigment), carbon black, bone black (organic pigment), yellow such as chrome yellow, ceramic yellow, zinc chromate yellow (inorganic pigment), nickel azo green yellow (organic pigment) Pigments, hydrochromic oxide green, chromium green (inorganic pigment), chromium oxide dull green, phthalocyanine green (organic pigment), etc. Dyes such as metal complex, naphthoquinone, azo, triazolemethane, and intermolecular CT dyes can be used.

  In the present embodiment, specifically, a black pigment such as ceramic black is added to a resin material of an insulator such as nylon forming the bodies of the laser beam irradiation unit 30a and the laser beam receiving unit 30f to absorb light. A function is added. With this light absorption function, the scattered light of the laser light emitted from each laser head of the laser light irradiation unit 30a is absorbed by the body surfaces of the laser light irradiation unit 30a and the laser light receiving unit 30f with almost no reflection. The occurrence of malfunctions due to reflected light can be reduced.

Note that not only the laser beam irradiation unit 30a and the laser beam receiving unit 30f but also the first support member 30d and the second support member 30e can add a light absorption function to these materials. Thereby, since the reflected light from these support members can also be reduced, generation | occurrence | production of the malfunction by the scattered light of a laser beam, etc. can be reduced more.
Further, as described above, since the laser light irradiation unit 30a and the laser light receiving unit 30f are formed of an insulator, electrical interference between a plurality of laser heads provided in the laser light irradiation unit 30a is caused. Can be reduced. Thereby, it is possible to reduce the occurrence of defects (such as wavelength changes) to the laser light due to electrical interference.

Furthermore, it is possible to prevent noise from being applied to the metal member forming the plurality of light receiving heads provided in the laser light receiving unit 30f, or to reduce the amount of noise. As a result, it is possible to prevent occurrence of errors in measurement results due to noise or reduce the amount of errors.
Next, the structure of the temperature control apparatus 4 is demonstrated based on FIGS.
Here, FIG. 16 is a diagram showing an internal configuration of the temperature adjusting device 4. FIG. 17 is a diagram showing an example of the air flow inside the sample liquid analyzer 100. FIG. 18 is a diagram illustrating an example of the air flow in the upper surface portion of the base 1.

  As shown in FIG. 16, the temperature adjusting device 4 includes a housing 54, a temperature control unit 50 provided on the side of the housing 54, and an inside of the housing 54 provided in the housing 54. A temperature measuring probe 51 for measuring temperature, a fan 52, a heating element 53 for converting electric energy into heat, and an upper plate of the base 1 are arranged in the vicinity of the laser light receiving unit 30f of the optical measuring device 3. And a temperature measuring probe 55 provided.

  The temperature adjustment unit 50 measures the temperature inside the casing 54 and the temperature in the vicinity of the laser light receiving unit 30f based on the voltage values input from the temperature measurement probes 51 and 55, and the temperature measurement And a calorific value control unit that controls the calorific value of the heat generating element 53 in accordance with the measured temperature of the unit. In the present embodiment, normally, in order to obtain stable light reception information, the heat generation amount is controlled based on the input from the temperature measurement probe 55 so as to keep the temperature in the vicinity of the laser light receiving unit 30f constant. On the other hand, when it is determined by the input from the temperature measurement probe 51 that the temperature inside the housing 54 has increased significantly, special control such as stopping the supply of electric energy to the heating element 53 is performed. .

The temperature measurement probes 51 and 55 are composed of thermocouples, and each output a voltage signal corresponding to a temperature difference in the vicinity of the arrangement position to the temperature adjustment unit 50.
The fan 52 is a fan for blowing air that is driven by a motor, and is disposed in the vicinity of the heating element 53 in a direction in which air is blown toward the heating element 53. Note that the temperature control unit 50 may be configured to control the temperature by controlling not only the amount of heat generated by the heating element 53 but also the rotational speed of the fan 52.

The heating element 53 is composed of a member that converts electrical energy, such as a resistance heating element, into heat. The heating element 53 converts the electrical energy supplied from the temperature adjustment unit 50 into heat, and the air inside the housing 54 is converted by this heat. Warm up.
When the temperature adjusting unit 50 supplies electric energy to the heating element 53 by the temperature adjusting device 4 having the above configuration, the electric energy is converted into heat in the heating element 53, and the air inside the casing 54 is warmed by this heat. . On the other hand, the fan 52 is always rotating at a constant rotational speed, and the air warmed by the heat generated by the heating element 53 passes through the inside of the base 1 by the wind generated by the fan 52 as shown in FIG. Then, it moves upward toward the upper plate of the base 1.

  Then, as shown in FIG. 18, the air that has reached the lower surface of the upper plate of the base 1 is formed from the upper surface portion of the base 1 and the upper surface cover 5 through the ventilation hole 10 provided in the upper plate. It flows into the space. Further, the air flowing into the space warms the air around the centrifugal force applying device 2 and the optical measuring device 3 and moves to the inside of the base 1 through the ventilation hole 11, and passes through the inside of the base 1. By passing through and returning to the inside of the housing 54, the inside of the sample liquid analyzer 100 is circulated.

  In this way, by appropriately circulating the warm air generated in the temperature adjusting device 4, the temperature in the space formed by the upper surface portion of the base 1 and the upper surface cover 5 is warmed, and the temperature in the space is also reduced. Since the sample liquid can be kept constant, the temperature of the sample liquid and the reagent injected into the sample liquid reservoir in the microchip 200 can be kept constant. Further, it is possible to eliminate or reduce an error generated in the laser light receiving unit 30f due to a characteristic change with respect to a temperature change of the light receiving element.

  As shown in FIG. 18, an opening / closing shutter 15 is provided for the ventilation opening 10, and the size of the opening of the ventilation opening 10 is adjusted by adjusting the opening / closing amount of the opening / closing plate of the opening / closing shutter 15. And the inflow amount of the warmed air into the space formed from the upper surface part of the base 1 and the upper surface cover 5 can be adjusted.

Next, the operation of the present embodiment will be described with reference to FIGS.
Here, FIG. 19A is a diagram illustrating an operation example when a centrifugal force is applied, and FIGS. 19B and 19C are diagrams illustrating an operation example when the posture of the microchip 200 is changed. 20A to 20C are views showing the posture of the microchip 200 in each process. FIGS. 21A to 21C are diagrams illustrating the operation of the optical measurement device 3 during the measurement process.
Hereinafter, the actual operation of the sample liquid analyzer 100 according to the present embodiment in the case where blood is used as the measurement target sample liquid and the blood absorbance measurement is performed using the blood analysis microchip 200 will be described.

  The microchip 200 for blood analysis contains at least a blood reservoir for collecting blood collected from a measurement subject, three reagent reservoirs for storing reagents, and blood in the reservoir according to the application of centrifugal force in the first direction. A centrifuge part formed from a microcapillary channel (for example, a U-shaped microcapillary channel) having a structure for centrifuging a blood cell component and a plasma component, according to application of centrifugal force in the second direction A weighing unit that weighs the plasma component, a mixing unit that mixes the plasma component weighed according to the application of the centrifugal force in the third direction and the reagent in the reagent reservoir, and the plasma component in which the reagent is mixed A measurement unit 200a having three measurement points for measuring absorbance is formed. The weighing unit is configured to weigh plasma components to obtain three measurement target components, and the mixing unit mixes the three measurement target components and the reagent. Note that the reagents to be mixed usually differ depending on the measurement target and measurement content, and the same type of reagent may be mixed for the three measurement target components, or different reagents may be mixed. Here, since the absorbance measurement is performed, a reagent for adding a light absorption function to the measurement object is stored in three reagent reservoirs.

  In addition, the sample liquid analyzer 100 according to the present embodiment includes a CPU 1 for executing a control program, a ROM storing a control program, a RAM for executing the program, and the like between these components. A control board (not shown) on which a bus for exchanging data and an IF circuit for exchanging data with each component are formed. Then, by executing a control program by the CPU, a control signal for each control object is generated, each component is controlled by the generated control signal, (1) centrifugation of blood (whole blood), ( 2) Weighing of separated component (plasma) after centrifugation, (3) Mixing of separated component and reagent and movement of separated component mixed with reagent to measuring unit, (4) Separating component moved to measuring unit Irradiating the laser beam with the first wavelength and receiving each transmitted light, (5) outputting the received light information with respect to the first wavelength to the external computer device, (6) second with respect to the separated component moved to the measuring unit Seven steps are automatically performed: irradiation of laser light of a wavelength and reception of each transmitted light, and (7) output of light reception information for the second wavelength to an external computer device.

  When the sample liquid analyzer 100 is turned on, first, the temperature adjustment device 4 is driven, and by supplying electric energy from the temperature adjustment unit 50, the heating element 53 generates heat to warm the surrounding air, and the fan 52 Driven to send warmed air into the base 1. The air sent into the inside of the base 1 flows into the space formed by the upper surface portion of the base 1 and the upper surface cover 5 through the vent hole 10 and raises the temperature in the space.

The temperature adjustment unit 50 measures the temperature in the vicinity of the laser light receiving unit 30f in the space by the input voltage from the temperature measurement probe 55 disposed in the vicinity of the optical information measurement unit 30, and the measured temperature Is adjusted so that the electric power supplied to the heating element 53 is kept constant so as to approach the set temperature.
On the other hand, the blood of the measurement subject (for example, 20 [μl]) is injected into the blood reservoir formed on the microchip 200 through a painless needle. The microchip 200 into which blood has been injected into the blood reservoir is mounted on the chip holder 26 of the chip turntable 23 formed at one end of the rotary arm 20 in a posture in which centrifugal force is applied in the first direction. Here, one microchip 200 to be measured in one measurement process is used, and an unused microchip 200 (or a dummy chip) is provided in the chip holder 26 formed at the other end of the rotary arm 20. To balance the weight balance at both ends.

  When the microchip 200 is mounted on the chip holding unit 26 and a start button (not shown) is pressed, the above-described step (1) is first started, and the drive circuit 22b of the arm rotation mechanism 22 is started on the control board inside the base 1. Is generated, and the generated pulse signal is supplied to the drive circuit 22b. The drive circuit 22b switches ON / OFF of the switching circuit based on the supplied pulse signal, and supplies a phase current to the stepping motor 22a. By supplying this phase current, the stepping motor 22a is rotationally driven, and this rotational driving force is transmitted to the arm rotating shaft 21 to rotate the arm rotating shaft 21. When the arm rotation shaft 21 rotates, the rotation arm 20 to which the arm rotation shaft 21 is coupled rotates clockwise as shown in FIG. Here, a rotating arm with a rotation speed (for example, 3000 [times / 1 minute]) and a rotation time (for example, 15 minutes) sufficient to separate the injected blood (whole blood) into a blood cell component and a plasma component 20 is rotated at high speed. By this rotation, a centrifugal force is applied to the microchip 200 held by the chip holding unit 26 in the first direction. By this centrifugal force, the whole blood injected into the blood reservoir of the microchip 200 is centrifuged into a blood cell component and a plasma component.

By rotating the rotary arm 20 for a necessary time, the step (1) is completed, and then the step (2) is started.
When step (2) is started, the arm rotation mechanism 22 is first driven in accordance with a control signal from the control board, and the turntable rotation mechanism corresponding to the chip holding unit 26 holding the measurement target microchip 200. As shown in FIG. 19 (b), the rotary arm 20 is rotated to a rotational angle position corresponding to the posture change position so as to stop at the posture change position on the upper surface of the base 1, and is stopped at that position. .

  In the present embodiment, the rotational angle position of the rotary arm 20 is detected by detecting the detected parts 26 c and 26 d provided on the frame part 26 a of the chip holding part 26 with the plate 12 erected on the upper surface of the base 1. This is performed by detecting with the sensors 13 and 14 provided in. The rotation angle position of the rotary arm 20 at which the measurement target chip holding unit 26 stops is set as the posture change position among the rotation angle positions detected by the detected parts 26c and 26d.

  In step (2), since it is necessary to apply a centrifugal force in the second direction of the microchip 200, the posture of the microchip 200 held by the chip holding portion 26 (the rotation angle position of the turntable rotary shaft 24). To change. Here, the rotation angle position of the microchip 200 in the first direction is 0 [°], the clockwise direction is the positive direction, the rotation angle position in the second direction is 90 [°], and the rotation in the third direction The angular position is 270 [°].

  First, in order to change the attitude of the microchip 200, the control board outputs a control signal to the turntable driving force transmission mechanism 27, drives the solenoid body 27a, and reduces the impact of the solenoid shaft 27b with the shock absorber 27c. The transmission part 25c that opposes the pusher 27g in the turntable rotating mechanism 25 in the vertical direction is pushed up by the pusher 27g. As a result, the cam 25 a formed integrally with the transmission portion 25 c is pushed up along the rotary base rotating shaft 24.

  When the cam 25a is pushed up, the push-up force is converted into the turning force of the rotating table rotating shaft 24 by the upper end cam surface 25j of the cam 25a and the upper cam pin 25d of the rotating table rotating shaft 24, and the rotating table rotates. The shaft 24 rotates clockwise. Thereafter, when the drive of the solenoid body 27a is stopped, in the rotary base rotating mechanism 25, the cam 25a linearly moves downward along the rotary base rotary shaft 24 by the restoring force of the coil spring 25f, and the lower end cam surface of the cam 25a. The downward moving force of the cam 25a is converted into the rotational force of the rotating table rotating shaft 24 by the lower cam pin 25e of the rotating table rotating shaft 24, and the rotating table rotating shaft 24 is further rotated clockwise. Rotate.

Here, the inclined surface 25m of the upper end cam surface 25j and the inclined surface of the lower end cam surface 25o so that the rotary table rotating shaft 24 is rotated 45 [°] clockwise by one vertical movement of the cam 25a. 25p is configured with an appropriate inclination angle and number, and the upper cam pin 25d and the lower cam pin 25e are configured with an appropriate number.
Accordingly, as shown in FIG. 19 (c), the rotation of the rotary table rotating shaft 24 by the above-described one push-up operation (the vertical movement of the cam 25a) causes the chip rotary table 23 and the chip holding unit 26 to rotate 45 [ °] Rotate. That is, the posture of the microchip 200 is changed to a posture rotated by 45 [°] clockwise.

Since the second direction is 90 [°], the above push-up operation is performed once again in the same procedure, and the posture of the microchip 200 is changed to a posture rotated 45 [°] clockwise.
Accordingly, as shown in FIG. 20A, the microchip 200 assumes a posture rotated 90 ° clockwise with respect to the posture shown in FIG. 19B corresponding to the first direction.

  Further, the detection of the attitude of the microchip 200 is performed in the same manner as the detection of the rotation angle position of the rotary arm 20, with the detected parts 26 c and 26 d of the chip holding part 26 placed on the upper surface of the base 1. This is performed by detecting with the sensors 13 and 14 provided in. Specifically, when the detected portion 26 c is detected by the sensor 13 and the detected portion 26 d is detected by the sensor 14, 0 [°], nothing is detected by the sensor 13, and the detected portion 26 d is detected by the sensor 14. Each posture is discriminated in accordance with the detected content, such as 90 [°] when is detected and 270 [°] when nothing is detected in both sensors.

  When the posture of the microchip 200 becomes the posture shown in FIG. 20A, the control board outputs a control signal (pulse signal) to the arm rotation mechanism 22 to drive the arm rotation mechanism 22 and to rotate the rotation arm 20. The centrifugal component is rotated at a rotation speed and a rotation time sufficient to weigh the plasma component after centrifugation, and a centrifugal force is applied to the second direction of the microchip 200. Thereby, the step (2) is completed, the plasma components are weighed, and the three plasma components to be measured are obtained (stored in the three weighing units).

  When the weighing of the plasma component (step (2)) is completed, the measured plasma component and the reagent stored in the reagent reservoir are then mixed, and the mixed plasma component is moved to the measurement point. Start (3). The control board first drives the turntable driving force transmission mechanism 27 to perform the push-up operation four times, and moves the cam 25a of the turntable rotation mechanism 25 up and down four times in the same manner as the change in the second direction. Thus, the turntable rotating shaft 24 is rotated 180 ° clockwise. As a result, the chip turntable 23 and the chip holding part 26 also rotate 180 [°], and the rotation angle position of the microchip 200 is changed to a position of 270 [°] as shown in FIG.

  When the attitude of the microchip 200 becomes the attitude shown in FIG. 20B, the control board outputs a control signal (pulse signal) to the arm rotation mechanism 22 to drive the arm rotation mechanism 22, The weighed plasma component and the reagent are mixed, and the mixed plasma component is rotationally driven at a rotation speed and a rotation time sufficient to move to each measurement point of the measurement unit 200a, and the third direction of the microchip 200 A centrifugal force is applied to. Thereby, the step (3) is completed, and the three plasma components weighed and the three reagent reservoir reagents are respectively mixed, and the plasma components after mixing are respectively at the three measurement points of the measuring unit 200a. Move to the corresponding point.

  When the application of the centrifugal force in the third direction of the microchip 200 is completed, the step (4) is started. First, the control board in the base 1 is subjected to the centrifugal force application device 2 in the same manner as described above in order to irradiate the measurement unit 200a of the microchip 200 with the laser beam and receive the transmitted light by the optical measurement device 3. The rotary table driving force transmission mechanism 27 is driven, and the pushing-up operation is performed twice. As shown in FIG. 20 (c), the microchip 200 is moved from the state of 270 [°] to 90 [deg.] Clockwise. °] Change to a rotated posture.

  When the microchip 200 is changed to the posture shown in FIG. 20 (c), the centrifugal force applying device is further arranged so that the measurement unit 200 a comes to a position (measurement position) facing the optical information measurement unit 30 of the optical measurement device 3. The second arm rotation mechanism 22 is driven to rotate the rotary arm 20 to a position rotated 90 ° clockwise from the stop position shown in FIG. 20C, as shown in FIG. And stop at that position.

  When the rotating arm 20 stops at the rotation angle position shown in FIG. 21A, the control board inside the base 1 outputs a drive signal for driving the solenoid 39 to the solenoid 39 of the optical measuring device 3. . As a result, the solenoid 39 is driven, the solenoid shaft 40 moves straight, and the transmission member 41 coupled to itself moves straight. The transmission member 41 transmits the linear motion force of the solenoid shaft 40 to the return spring portion 38 and the optical information measurement unit 30 substantially simultaneously via the connecting member 38c. As a result, the optical information measuring unit 30 to which the first and second sliders 34 and 35 are fixed by the linear movement force transmitted through the coupling portion of the optical information measuring unit 30 is as shown in FIG. Then, it moves straight along the prismatic member 36a and the rail portions of the first and second slide rails 32, 33 in a certain direction (left direction as viewed from directly above) of the chip holding portion 26 holding the microchip 200. The optical information measuring unit 30 moves straight until the first support member 30d and the second support member 30e each hit the corner of the chip holding unit 26 facing in the horizontal direction. The positions of the laser beam irradiation unit 30a and the laser beam receiving unit 30f of the optical information measurement unit 30 and the measurement unit 200a of the microchip 200 are pressed by the corners by the first support member 30d and the second support member 30e. Is positioned at an appropriate position for performing the measurement process, and the position is fixedly supported.

  When the optical information measuring unit 30 moves to the position shown in FIG. 21B, the control board inside the base 1 outputs a control signal to the optical measuring device 3 to drive the first laser head unit 30b. Then, the laser light of the first wavelength is emitted from the three laser heads toward the three measurement points of the measurement unit 200a facing in the vertical direction. The irradiated laser light of the first wavelength passes through the plasma components after mixing the reagents respectively present at the three measurement points, and the transmitted light is received by the three light receiving heads of the first light receiving head unit 30g. And the voltage signal according to the light quantity of this received transmitted light is output to the light reception information processing part inside the base 1 via an electric cable. Further, the solenoid 39 is turned off under the control of the control board, and the step (4) is completed.

When the solenoid 39 is turned off, the restoring force of the coil spring 38a and the coil spring 38b causes the optical information measurement unit 30 to move straight away in the direction away from the tip rotation mechanism unit and return to the initial position.
When the step (4) is completed, the light receiving information processing unit inside the base 1 sends the transmitted light information for the first wavelength to the outside via an I / F (not shown) based on the voltage signal from the light receiving head. Output (send) to a computer to complete the step (5). For example, digital data obtained by A / D converting a voltage signal (analog signal) from the light receiving head is output.

When the step (5) is completed, the control board inside the base 1 starts the above step (6), drives the arm rotation mechanism 22 of the centrifugal force applying device 2, and turns the rotary arm 20 into FIG. As shown in c), it is rotated from the stop position shown in FIG. 21 (a) to a position rotated 90 [deg.] counterclockwise and stopped at that position.
Further, the control board drives the turntable driving force transmission mechanism 27 of the centrifugal force applying device 2 to perform the push-up operation twice, and the microchip 200 is moved clockwise from the current 0 [°] state. The posture is changed by 90 [°].

Next, the control board drives the arm rotating mechanism 22 of the centrifugal force applying device 2 to rotate the rotating arm 20 by 90 [°] clockwise from the current stop position as shown in FIG. Rotate to the position (corresponding to the measurement position) and stop at that position.
When the rotating arm 20 stops at the rotational angle position shown in FIG. 21C, the control board inside the base 1 moves the optical information measuring unit 30 of the optical measuring device 3 in the same manner as in the step (4). Then, the first support member 30d and the second support member 30e perform measurement processing on the positions of the laser light irradiation unit 30a and the laser light receiving unit 30f of the optical information measurement unit 30 and the measurement unit 200a of the microchip 200. It is positioned at an appropriate position, and the position is fixedly supported.

  When the optical information measuring unit 30 moves to the position shown in FIG. 21C, the control board inside the base 1 outputs a control signal to the optical measuring device 3 to drive the second laser head unit 30c. Then, a laser beam having a second wavelength different from the first wavelength is emitted from the three laser heads toward the three measurement points of the measurement unit 200a facing each other in the vertical direction. The irradiated laser light of the second wavelength is transmitted through the plasma components after mixing the reagents respectively present at the three measurement points, and the transmitted light is received by the three light receiving heads of the second light receiving head unit 30h. A voltage signal corresponding to the amount of transmitted light received is output to the light receiving information processing unit inside the base 1 via an electric cable. Thereby, a process (6) is completed.

When the step (6) is completed, the light receiving information processing unit inside the base 1 sends the transmitted light information for the second wavelength to the outside via an I / F (not shown) based on the voltage signal from the light receiving head. Output (send) to a computer to complete the step (7).
In the present embodiment, the amount of oxygenated hemoglobin, the amount of deoxygenated hemoglobin, the amount of total hemoglobin, etc. in the plasma is analyzed by an external computer based on the light reception information (measurement result) of the transmitted light from the light receiving information processing unit. .

As described above, in the sample liquid analyzer 100 according to the present embodiment, in the centrifugal force applying device 2, the rotary arm 20 can be driven to rotate by the arm rotating mechanism 22, and the drive circuit 22b of the stepping motor 22a can be driven. By controlling the pulse signal to be supplied, the rotary arm 20 can be stopped at a desired rotation angle position.
Further, in the centrifugal force applying device 2, the rotary table driving force transmission mechanism 27 is driven to move the cam 25 a of the rotary table rotation mechanism 25 up and down, whereby the attitude of the microchip 200 held by the chip holding unit 26 ( (Rotational angle position) can be changed.

Further, in the centrifugal force applying device 2, since the tip rotation mechanism portion is provided at both ends of the rotary arm 20 at symmetrical positions in the longitudinal direction with respect to the center position thereof, the weight balance at both ends of the rotary arm 20 is balanced. The rotating arm 20 can be rotated at a high speed with a stable balance.
Further, in the centrifugal force applying device 2, the rotary table driving force transmission mechanism 27 is fixedly supported by the shock absorber 27c on the base 1 side, and the shock absorption is absorbed by the rear end portion of the solenoid shaft 27b that moves linearly by driving the solenoid body 27a. Since the bracket 27e is coupled so that the impact absorbing bracket 27e collides with the tip of the piston rod when the solenoid shaft 27b is linearly moved, it is possible to absorb the impact when the solenoid shaft 27b is linearly moved in the push-up operation.

Further, in the centrifugal force applying device 2, the pusher 27 g is connected to the distal end portion of the solenoid shaft 27 b constituting the turntable driving force transmission mechanism 27 via the buffer member 27 f, so that the pusher 27 g is transmitted to the turntable rotation mechanism 25. The impact when colliding with the part 25c can be absorbed.
Further, in the centrifugal force applying device 2, when the coil spring 25f is restored from the contracted state of the spring 25f, the rotational direction due to the torsional force when the coil spring 25f is contracted and the winding direction of the spring 25f are the same. Therefore, the sliding resistance at both ends during expansion and contraction of the coil spring 25f can be reduced. As a result, the expansion / contraction operation of the coil spring 25f can be made smooth, so that the turntable rotary shaft 24 can be smoothly rotated.

  Further, in the centrifugal force applying device 2, a ring shape is formed between the upper end portion of the coil spring 25f and the rotary arm 20 constituting the turntable rotation mechanism 25, and between the lower end portion of the coil spring 25f and the transmission portion 25c. Since the low sliding member 25g is provided, the sliding resistance at both ends of the coil spring 25f can be further reduced. As a result, the expansion / contraction operation of the coil spring 25f can be made smoother, so that the turntable rotary shaft 24 can be rotated more smoothly.

  Further, in the centrifugal force applying device 2, the combination of the materials of the parts forming the cam 25 a, the upper cam pin 25 d, the lower cam pin 25 e, and the rotary table rotating shaft 24 constituting the rotary table rotating mechanism 25 is described in (A ) To (D), it is possible to prevent or reduce the occurrence of a state in which the rotation of the rotary table rotating shaft 24 is hindered by galling between these components.

  Further, in the centrifugal force imparting device 2, the inclined surface 25m of the upper end cam surface 25j of the cam 25a of the turntable rotating mechanism 25 is an inclined surface extending from the upper right to the lower left in the vertical direction, and the inclined surface 25p of the lower end cam surface 25o is Since the inclined surface is directed from the lower right to the upper left in the vertical direction and the rotation direction of the rotary arm 20 is clockwise, the lower cam is rotated when the rotary arm 20 is rotated at high speed clockwise to apply centrifugal force. A force is applied to the working pin 25e in a direction in which the pin 25e is pressed toward the wall of the pin fitting groove 25q constituting the lower end cam surface 25o. Thereby, since it is possible to prevent the rotating base rotating shaft 24 from rotating when the centrifugal force is applied, it is possible to prevent the microchip 200 from rotating around the second rotating shaft when the centrifugal force is applied. it can.

  Further, in the centrifugal force imparting device 2, the chip holding part 26 is configured to hold the entire outer periphery of the microchip 200 with the frame part 26a and hold a part of the microchip 200 from above by the pressing member 26b. Therefore, it is possible to prevent the microchip 200 from coming off with respect to the centrifugal force during the application of the centrifugal force, regardless of the rotation angle position of the microchip 200, and the upward force by vibration or the like. Even if this occurs, the microchip 200 can be hardly lifted.

  Further, in the centrifugal force applying device 2, the rotary table rotating mechanism 25 and the rotary table driving force transmission mechanism 27 are separated, and the rotary table driving force is generated by the vertical movement of the cam 25 a along the rotary table rotating shaft 24. Since the push-up force of the transmission mechanism 27 is converted into the rotational force of the rotary base rotary shaft 24, it is necessary to move the rotary base rotary shaft 24 vertically in order to rotate the rotary base rotary shaft 24. Therefore, the chip turntable 23 and the chip holder 26 can be rotated on the spot without moving up and down. This eliminates the need for a structure in which the tip turntable 23, the turntable turn shaft 24, and the tip holding portion 26 are vertically moved (can be fixed so as not to move up and down). Even if an upward force is applied to these constituent parts due to imbalance, the constituent parts can be reliably prevented from rising.

  Further, in the optical measurement device 3, the optical information measurement unit 30 is configured to move toward and away from the chip rotation mechanism along the prismatic member 36a and the first and second slide rails 32 and 33. The movement of the optical information measuring unit 30 in the front and back direction and the vertical direction when moving in the approaching and separating direction can be suppressed, and the optical information measuring unit 30 can be reliably moved in the approaching and separating direction while keeping the optical information measuring unit 30 parallel to the upper surface of the base 1. Can be moved straight ahead. As a result, the optical information measuring unit 30 can be accurately positioned during the measurement process, and reproducibility with respect to the movement to the accurate measurement process position can be ensured.

  Further, in the optical measurement apparatus 3, the optical information measuring unit 30 includes two laser light irradiation units, the first laser head unit 30b and the second laser head unit 30c, and three each of the two irradiation units. Since the laser heads are arranged so that the L shape is reversed left and right, two types of measurements with different wavelengths can be performed at the same measurement position by changing the attitude of the microchip 200 by 90 [°].

Moreover, in the optical measuring device 3, since the member which forms the laser beam irradiation unit 30a and the laser beam receiving unit 30f is a black insulating member, the laser beam irradiated from each laser head of the laser beam irradiation unit 30a The amount of reflection reflected on the surface of the laser light receiving unit 30f can be greatly reduced. Thereby, the occurrence of malfunction due to reflected light can be reduced.
Furthermore, it is possible to reduce electrical interference between the plurality of laser heads provided in the laser beam irradiation unit 30a due to the nature of the insulating member. Thereby, it is possible to reduce the occurrence of defects (wavelength change or the like) to the laser light due to electrical interference.

Furthermore, it is possible to prevent noise from being applied to the metal member forming the plurality of light receiving heads provided in the laser light receiving unit 30f, or to reduce the amount of noise. As a result, it is possible to prevent occurrence of errors in measurement results due to noise or reduce the amount of errors.
Further, in the optical measuring device 3, the first support member 30d and the second support member 30e are provided at the upper and lower ends of the laser beam irradiation unit 30a and the laser beam receiving unit 30f as viewed from directly above, and the optical information measurement unit 30 is provided. Since the inclined surfaces of the first support member 30d and the second support member 30e are in contact with the corners of the chip holding part 26 when the centrifugal force applying device 2 is moved, the laser beam irradiation is thereby performed. The position of the part 30a and the laser light receiving part 30f and the position of the chip holding part 26 can be positioned at an accurate measurement processing position, and the positions can be fixedly supported.

In the first embodiment, the centrifugal force applying device 2 corresponds to the centrifugal force applying device according to any one of the inventions 1 to 3, and the base 1 is any one of the inventions 1 to 6 and 8. The rotating arm 20 corresponds to the first rotating body described in the first or fourth aspect, and the arm rotating mechanism 22 corresponds to the first driving mechanism described in the first or fourth aspect.
In the first embodiment, the chip turntable 23 corresponds to the second rotating body described in the invention 1 or 4, and the turntable rotating mechanism 25 and the turntable driving force transmission mechanism 27 are the invention 1 or 4 corresponds to the second drive mechanism described in FIG.

In the first embodiment, the optical measurement device 3 corresponds to the light irradiation unit and the light receiving unit described in the invention 4, and the light receiving information processing unit corresponds to the output unit described in the invention 4.
In the first embodiment, the temperature adjustment device 4 corresponds to the temperature adjustment means described in any one of the inventions 1, 2, 4 and 5, and receives input from the temperature measurement probes 51 and 55. The temperature detection unit that measures the temperature in the vicinity of the installation position is based on the temperature detection unit described in any one of Inventions 2, 5, and 6, and the vents 10, 11, 16, and 17 are provided in Inventions 2, 3, and 17, respectively. 5 and 8 corresponds to the ventilation opening described in any one of the above, the temperature adjustment unit 50 corresponds to the temperature adjustment unit described in the invention 2 or 5, and the open / close shutter 15 corresponds to the shutter described in the invention 3 or 8. Corresponding to the mechanism, the heating element 53 corresponds to the heating element described in the invention 2 or 5, and the blower fan 52 corresponds to the blowing unit described in the invention 2 or 5.

[Variation 1 of the first embodiment]
Next, Modification 1 of the first embodiment will be described with reference to FIG.
This modification is a microchip held on a chip holder 26 formed on a chip turntable 23 by rotating the rotary arm 20 at a high speed with respect to the centrifugal force applying device 2 in the first embodiment. When the centrifugal force is applied to 200, the position of the center of gravity is shifted from the rotation center position in the direction of applying the centrifugal force, and the mechanism that holds the shifted position and the position after the shift are shifted. And a mechanism for returning to the position. Therefore, the centrifugal force applying device according to the first embodiment except that a mechanism for shifting the position of the center of gravity and holding the position and a mechanism for returning the position after the shift to the position before the shift are added. 2 is the same configuration. Hereinafter, only the parts different from the first embodiment will be described in detail.

Here, Fig.22 (a)-(e) is a figure which shows an example of the change operation | movement of a gravity center position at the time of provision of centrifugal force.
The centrifugal force applying device 2 of the present modification includes an actuator such as a solenoid (not shown) with respect to the chip turntable 23 and the chip holding unit 26 of the first embodiment, and the rotation of the chip by driving the actuator. The base 23 and the chip holding unit 26 are slid in the direction in which the centrifugal force is applied, and an eccentric mechanism for holding the position after the slide is added.

Furthermore, the eccentric mechanism also includes a return mechanism for returning the positions of the chip turntable 23 and the chip holding portion 26 from the positions after being shifted to the positions before being shifted by the power of the actuator.
In this modification, when the rotary arm 20 is rotated to apply centrifugal force to the microchip 200 held by the chip holding unit 26, as shown in FIG. From the state where the rotation center position of the chip holding portion 26 and the axial center position of the rotary table rotation shaft 24 coincide with each other or substantially coincide with each other, the actuator of the eccentric mechanism is controlled, and the power is shown in FIG. As shown in the figure, the center of gravity of the microchip 200 held by the chip holder 26 is slid to the center of rotation of the rotary base rotary shaft 24 by sliding the chip turntable 23 and the chip holder 26 in the direction in which the centrifugal force is applied. The position is shifted toward the direction in which the centrifugal force is applied with respect to the position (circle mark in the figure) (cross mark in the figure). Further, after shifting, the holding torque is applied by continuing to pass an electric current through the actuator, and the position after the shifting is held.

  In addition, when changing the posture of the microchip 200 after the centrifugal force is applied, the centrifugal force applying device 2 of the present modified example first controls the actuator of the eccentric mechanism and uses the power to change the position of FIG. ), The chip turntable 23, the chip holder 26, and the microchip 200 are slid in the direction opposite to the direction in which the centrifugal force is applied, and the center of gravity position and the rotation center position of the turntable rotary shaft 24 are shown. Is returned to a state where they match or substantially match (a state before shifting by the eccentric mechanism). Thereafter, each of these components is rotated in the same manner as in the first embodiment. Here, when returning from the position after the shift to the position before the shift, it is possible to use a restoring force of an elastic body such as a coil spring instead of the power of the actuator.

  With the above-described configuration, the center of gravity position of the chip turntable 23 and the chip holder 26 (marked in the drawing) is directed from the rotation center position of the turntable rotating shaft 24 (marked in the drawing) to the direction of pressurization of centrifugal force. Since the centrifugal force can be applied in a state of being shifted, the centrifugal force applied to the center of gravity of the chip rotating table 23, the chip holding unit 26, and the microchip 200 during the application of the centrifugal force causes these to rotate the rotating table rotating shaft 24. Can be prevented from rotating around the axis.

[Modification 2 of the first embodiment]
Next, Modification 2 of the first embodiment will be described with reference to FIG.
The optical measuring device 3 in the first embodiment has the first support member 30d and the second support member when the optical information measurement unit 30 is moved in a direction approaching or separating from the chip rotation mechanism unit. 30e has a configuration in which the positions of the laser light irradiation unit 30a and the laser light receiving unit 30f of the optical information measurement unit 30 and the measurement unit 200a of the microchip 200 are positioned at an accurate position and fixedly held. On the other hand, the optical measuring device 3 of this modification has a fixing pin at the lower portion in the vertical direction of the optical information measuring unit 30 instead of the first support member 30d and the second support member 30e. Is fitted into a pin hole provided on the turntable rotating mechanism 25 side, so that the positions of the laser beam irradiation unit 30a and the laser beam receiving unit 30f and the measurement unit 200a of the microchip 200 are accurately determined. That fixedly holds the position is different from the first embodiment. Therefore, a pin for fixing the position is added instead of the first support member 30d and the second support member 30e of the optical information measuring unit 30 in the first embodiment, and the rotating base rotating mechanism 25 of the centrifugal force applying device 2 is added. The configuration is the same as that of the centrifugal force application device 2 and the optical measurement device 3 of the first embodiment except that a pin hole for fitting the pin is added. Hereinafter, only the parts different from the first embodiment will be described in detail.

Here, FIGS. 23A and 23B are diagrams in the case where the positions of the optical information measuring unit 30 and the microchip 200 during measurement processing are fixedly supported by the position fixing pins and pin holes in the present modification. It is a figure which shows the example of a structure.
As shown in FIG. 23 (a), the centrifugal force applying device 2 of the present modification is opposed to the optical information measuring unit 30 in the turntable rotating mechanism 25 when the rotating arm 20 stops at the rotation angle position during the measurement process. In this part, a pin hole 25u for position fixing is formed.

Furthermore, as shown in FIG. 23A, the optical measuring device 3 of the present modification has a position fixing pin 42 at the lower part of the optical information measuring unit 30, and the rotation angle of the rotating arm 20 during the measurement process. When stopped at the position, the pin tip of the pin 42 is fixedly supported via a support member 43 at a position facing a pin hole 25 u formed in the rotary base rotation mechanism 25.
With the above configuration, the solenoid 39 is driven, the solenoid shaft 40 is moved straight, and the optical information measuring unit 30 is stopped along the prism member 36a at the rotation angle position at the time of the measurement process. When moving straight forward, as shown in FIG. 23 (b), the optical information measuring unit 30 and the pin 42 fixedly supported at the lower part thereof move straightly and fit into the pin hole 25u of the turntable rotating mechanism 25. To do. By this fitting, the positions of the laser beam irradiation unit 30a and the laser beam receiving unit 30f of the optical information measurement unit 30 and the measurement unit 200a of the microchip 200 are positioned at appropriate positions for performing the measurement process, and The position can be fixedly supported.

[Modification 3 of the first embodiment]
Next, Modification 3 of the first embodiment will be described with reference to FIG.
The centrifugal force imparting device 2 in the first embodiment has a configuration in which the solenoid body 27a and the solenoid shaft 27b and the shock absorber 27c are separated in the rotating base driving force transmission mechanism 27. On the other hand, this modification differs from the first embodiment in that a solenoid with a shock absorber in which a solenoid body 27a and a solenoid shaft 27b are integrated with a shock absorber 27c is used. Therefore, the configuration is the same as that of the centrifugal force applying device 2 of the first embodiment except that a solenoid with a shock absorber is used. Hereinafter, only the parts different from the first embodiment will be described in detail.

Here, FIG. 24 is a diagram showing the configuration of the solenoid 28 with shock absorber.
As shown in FIG. 24, the solenoid 28 with shock absorber includes a solenoid portion 28a, a shock absorber portion 28b, a solenoid shaft of the solenoid portion 28a, and a shaft 28e that also serves as a piston rod of the shock absorber portion 28b. It has a configuration that includes it.

  Further, a buffer member 28f is provided at the tip of the shaft 28e, similarly to the buffer member 27f in the first embodiment. Furthermore, the front end portion where the buffer member 28f is provided is fitted in a fitting hole provided to open to the rear end side of the pusher 27g. The role of the buffer member 28f is the same as that of the buffer member 27f, and absorbs an impact when the pusher 27g is pushed up.

Except for the point that the shaft 28e is attached to the movable iron core, the other part of the solenoid 28a is the same as that of the solenoid main body 27a of the first embodiment.
Accordingly, the solenoid portion 28a generates a magnetic attraction force by energizing the coil, and pulls the shaft 28e toward the fixed iron core, thereby moving the shaft 28e straightly.
On the other hand, in the shock absorber portion 28b, a shaft hole (equivalent to the rod hole in the first embodiment) is provided in the cylinder, and a part of the rear end side of the shaft 28e is inserted into the shaft hole.

The shock absorber portion 28b has a piston portion 28c having one end fixed to the rear end portion of the shaft 28e, one end supported by the other end of the piston portion 28c, and the other end supported by the inner end portion of the cylinder. The coil spring 28d is included. Further, a viscous liquid (for example, oil) is sealed inside the cylinder.
The piston portion 28c is configured such that the outer periphery of the main body is sealed by a ring-shaped sealing member such as an O-ring, and the liquid sealed in the cylinder is prevented from passing between the outer periphery and the cylinder inner wall. . The shaft hole is also sealed with a ring-shaped sealing member such as an O-ring so that liquid does not leak outside.

  Further, the piston portion 28c is provided with a plurality of through holes that are always opened in the reciprocating direction, and a plurality of valved through holes that are opened according to the moving direction of the piston portion 28c. The through hole with valve has a configuration in which a plurality of openings are provided on the other end side with respect to one opening provided on the side where the shaft 28e of the piston portion 28c is fixed. Furthermore, inside the through hole with valve, a coiled ball that closes one opening on the side to which the shaft 28e is fixed, and a coil spring in which one end is supported by the steel ball and the other end is supported by a plurality of openings. (Hereinafter referred to as a valve spring) is provided. When the piston 28c moves in the direction in which the coil spring 28d extends (hereinafter referred to as the extension direction), the open / close valve is opened because the steel ball is pressed by the liquid in the cylinder to contract the valve spring. When the piston portion 28c moves in the direction in which the coil spring 28d is contracted (hereinafter referred to as the compression direction), the liquid in the cylinder pushes the steel ball in the direction closing the one opening, and the closed state is established. .

That is, when the piston portion 28c moves in the cylinder in the extending direction of the coil spring 28d, the liquid passes through both the through hole and the valved through hole, and the braking force generated during the passage (resistance in the direction opposite to the moving direction). Force) absorbs an impact when the shaft 28e moves straight toward the transmission unit 25c of the turntable rotation mechanism 25.
The coil spring 28d extends when the piston portion 28c extends in the extension direction, the solenoid portion 28a stops, and the driving force is removed from the shaft 28e. A force is generated to pull back to the initial position (position where no force is applied to the coil spring 28d). At this time, since the piston portion 28c moves through the liquid only through the through hole that is always open, a larger braking force is generated than when the shaft 28e moves upward.

  With the above configuration, the solenoid 28 with shock absorber drives the solenoid portion 28a and linearly moves the shaft 28e upward. In conjunction with this, the piston portion 28c in the cylinder moves straight in the extending direction of the coil spring 28d. To do. Due to the braking force of the liquid passing through the through hole and the valved through hole when the piston portion 28c moves straight, the impact when the shaft 28e moves straight is alleviated.

Further, when the pusher 27g collides with the transmission portion 25c and pushes up the transmission portion 25c, the push-up force is transmitted to the cam 25a. At this time, the shock when the pusher 27g collides with the transmission portion 25c is mitigated by the buffer member 28f attached to the tip of the shaft 28e.
On the other hand, when the energization of the coil of the solenoid portion 28a is turned off and the driving force is removed from the shaft 28e, the shaft 28e is subjected to the downward force of the cam 25a due to the restoration of the coil spring 25f in the rotating base rotating mechanism 25 in addition to its own weight. And it receives the restoring force of the coil spring 28d supported by the piston part 28c and moves downward. At this time, since the on-off valve of the valved through hole of the shock absorber portion 28b is closed, the piston portion 28c moves downward while passing the liquid in the cylinder only through the through hole that is always open. . That is, in the shock absorber portion 28b, a larger braking force is generated than in the upward movement. While receiving this braking force, the shaft 28e moves together with the cam 25a until the cam 25a reaches the lowermost end. When it reaches the lowermost end, it moves away from the cam 25a and finally returns to the initial position.

  Thus, the solenoid 28 with shock absorber can absorb the impact when moving downward in addition to the impact when moving upward in the shaft 28e. Further, in the downward movement of the shaft 28e, as described above, in addition to the own weight of the shaft 28e, the downward force of the cam 25a by the restoration of the coil spring 25f in the rotary base rotating mechanism 25 and the piston portion 28c are supported. In order to receive the restoring force of the coil spring 28d, a larger force is applied downward than when the shaft 28e is moved upward. Therefore, in this modification, the braking force when moving downward in the shaft 28e is made larger than the braking force when moving upward.

  Further, the solenoid 28 with a shock absorber according to this modification can be used in place of the solenoid 39 and the solenoid shaft 40 in the optical measuring device 3 of the first embodiment. In this case, the operation of the solenoid is configured to linearly move in the retracting direction, not in the direction of protruding the shaft 28e. As a result, when the solenoid portion 28a operates and linearly moves in the direction in which the shaft 28e is pulled out of the cylinder, the piston portion 28c moves straight in the direction in which the coil spring 28d extends. Due to the braking force generated by the liquid passing through the through hole during the rectilinear movement of the piston portion 28c, the impact during transmission of the rectilinear movement force to the optical information measuring unit 30 is reduced. Moreover, you may reverse the direction which provides the through-hole with a valve of the piston part 28c of the shock absorber part 28b.

  In the third modification, the shock absorber portion 28b has one opening portion at one end portion of the piston portion 28c and a plurality of opening portions at the other end portion, and one opening portion inside the piston portion 28c. A valved through-hole is provided which is constituted by a steel ball to be closed and a coil spring having one end supported by the steel ball and the other end supported by a plurality of openings, and the piston portion 28c is initialized by a return coil spring 28d. However, the present invention is not limited to this, and other configurations such as a known shock absorber configuration can be used as long as the configuration is such that the solenoid shaft and the piston rod are shared, such as the shaft 28e. is there.

  For example, a liquid chamber and a gas chamber are formed by sealing a gas in a cylinder and sealing a liquid from above the gas. When an impact is applied to the shaft 28e, the gas is compressed to increase the volume of the liquid chamber. Thus, it is also possible to adopt a configuration in which the piston portion 28c is moved in the direction of entry into the cylinder to absorb the impact, and after absorbing the impact, the piston portion 28c is returned to its original position by the gas pressure.

Further, a force for returning the position of the coil spring 28d to the shaft 28e, for example, between the solenoid portion 28a and the stopper portion that limits the movement range of the shaft 28e provided on the shaft 28e, instead of in the cylinder. If it is the structure which can transmit appropriately, it is good also as a structure provided outside a cylinder.
Moreover, in the said modification 3, although the structure of the shock absorber part 28b is made into the single cylinder structure, it is not restricted to this, The inner cylinder and the outer cylinder are provided, The multiple cylinder which pushes the liquid in an inner cylinder to an outer cylinder It is good also as a structure. In this case, the shaft 28e can be formed shorter than the single cylinder configuration.

In the third modification, a shock absorber is used as a means for absorbing an impact. However, the present invention is not limited to this, but the structure is similar to that of a single cylinder type shock absorber. Alternatively, a gas spring configured to fill each chamber configured with gas and absorb the impact by the pressure of the gas may be used. In this case as well, the piston rod with one end fixed to the piston and the other end extending outside the cylinder is integrally formed with the solenoid shaft of the solenoid, thereby saving space compared to providing a separate gas spring. In addition, a shock absorbing function can be added to the solenoid.
[Modification 4 of the first embodiment]
Next, Modification 4 of the first embodiment will be described with reference to FIG.

  The centrifugal force imparting device 2 in the first embodiment uses a restoring force of the coil spring 25f for the downward movement of the cam 25a along the rotary base rotating shaft 24 in the rotary base rotating mechanism 25. However, in this modification, the point of using the repulsive force between the same poles of the magnets is different from that of the first embodiment. Accordingly, the configuration is the same as that of the centrifugal force applying device 2 of the first embodiment except that two ring-shaped permanent magnets are used instead of the coil spring 25f. Hereinafter, only the parts different from the first embodiment will be described in detail.

Here, FIG. 25 is a diagram illustrating a configuration of the turntable rotation mechanism 25 of the present modification.
As shown in FIG. 25, the turntable rotation mechanism 25 of the present modification includes a cylindrical cam 25a, a guide portion 25b, and a transmission portion 25c. Since these detailed configurations are the same as those in the first embodiment, description thereof is omitted.
Further, the turntable rotating mechanism 25 includes magnets 25h and 25i formed from ring-shaped permanent magnets.

  The turntable rotating mechanism 25 of the present modified example inserts a part of the lower end side of the turntable rotating shaft 24 and the cam 25a inside the magnets 25h and 25i, and fixes and supports the magnet 25h to the upper rotating arm 20. The magnet 25i is fixedly supported by the lower transmission portion 25c. Further, the magnets 25h and 25i are arranged so that the same poles face each other, and when both approach each other, a downward force is applied to the transmission portion 25c by the repulsive force.

Further, the turntable rotating mechanism 25 includes an upper cam pin 25d and a lower cam pin 25e. Since these detailed configurations are the same as those in the first embodiment, description thereof is omitted.
With the above configuration, the rotary table rotating mechanism 25 is in a state where the upper cam pin 25d moved along the inclined surface hits the wall 25n and stopped after the cam 25a is pushed up by the rotary table driving force transmission mechanism 27. When the push-up force of the pusher 27g is removed, the cam 25a is guided together with the magnet 25i provided in the transmission portion 25c by the repulsive force of the magnets 25h and 25i that are approached by the upward movement of the cam 25a. It moves straight down along the portion 25b without rotating.
In addition, although the magnet 25h and 25i demonstrated the example comprised with the permanent magnet, you may comprise with other magnets, such as not only this but an electromagnet.

[Modification 5 of the first embodiment]
Next, Modification 5 of the first embodiment will be described with reference to FIG.
In the sample liquid analyzer 100 according to the first embodiment, the configuration of the chip holding unit 26 of the centrifugal force applying device 2 is configured by surrounding the microchip 200 with a frame portion 26a and using a holding member 26b. Although an example of a configuration in which a part of 200 is pressed from above is described as an example, in this modification, another configuration of the chip holding unit 26 will be described.

Further, the sample liquid analyzer 100 of the present modification is the sample liquid analyzer of the first embodiment except that at least one of the configuration of the chip holder 26 and the microchip 200 in the centrifugal force applying device 2 is different. The configuration is the same as 100. Therefore, only the parts different from the first embodiment will be described in detail below.
Here, FIGS. 26A to 26D are diagrams illustrating configuration examples of the chip holding unit and the microchip.

First, the configuration of the chip holding part 26A and the microchip 200A shown in FIG.
As shown in FIG. 26A, the chip holding portion 26A has a square-shaped holding base as viewed from directly above, and cylindrical protrusions at diagonal positions (two diagonal positions in the example in the figure). It is the structure which provided the part.

On the other hand, as shown in FIG. 26A, the microchip 200A is the same as the protrusion of the holding table at the diagonal position of the square chip (the same position as the holding table (two positions in the figure)). A fitting hole for fitting the protruding portion is formed in a positional relationship.
Then, the protrusions at the diagonal positions of the holding base of the chip holding part 26A are fitted into the fitting holes at the corresponding diagonal positions of the microchip 200A, and the microchip 200A is placed on the holding base, The microchip 200A is positioned and fixedly held.

In the example shown in FIG. 26 (a), two protrusions and fitting holes are provided at diagonal positions. However, the present invention is not limited to this, and two protrusions and fitting holes are provided at diagonal positions. Any number may be provided as long as it is provided.
Next, the configuration of the chip holding unit 26B shown in FIG.
Chip holding portion 26B, as shown in FIG. 26 (b), constituting the chip holding portion 26 in the first embodiment, the inclined surface is formed in the contact position between the microchip 200 of the pressing member 26b ₁ Te 'and _1, further a shape of the detected portion 26c and 26 d, a configuration having an inclined surface for pressing a portion of the outer edge of the microchip 200 from diagonally, they 26c' pressing member 26b and 26 d ' It was.

Then, when the microchip 200 is attached to the chip holding portion 26B, as shown in FIG. 26B, the leaf spring 26b ′ ₂ is elastically deformed outward, and the pressing member 26b ′ ₁ , the detected portion 26c ′, The microchip 200 is submerged so that the outer edge of each side with 26d 'is below the respective inclined surface, and the whole is pushed into the frame of the frame 26a.
Thus, a state in which the outer peripheral frame portion 26a is surrounded on headband shaped microchip 200 further 'by the elastic force of _2, the chip holding portion 26b' leaf spring 26b inclined surface _1, the detected portion 26c 'and 26d The inclined surface of 'is in a state of pressing the outer edge portion of the microchip 200 obliquely from above.

Next, the configuration of the chip holding unit 26C and the microchip 200C shown in FIG.
As shown in FIG. 26C, the chip holding portion 26C includes a square frame portion 26Ca. Projections (ribs) extending along the inner circumferential direction are formed on the frame 26Ca.

On the other hand, the outer periphery of the microchip 200C is provided with a groove-shaped notch that can be fitted with a protrusion along the circumferential direction.
Then, the microchip 200C is held by fitting the protrusion provided on the inner periphery of the frame portion 26Ca of the chip holding portion 26C into the notch of the microchip 200C.
Note that the protrusions may be provided over the entire circumference, or may be provided only on the inner surfaces of the two opposite sides. Similarly, the notches may be provided over the entire circumference, or may be provided only on the side surfaces of the two opposite sides.

Next, the configuration of the chip holding unit 26D and the microchip 200D shown in FIG.
As shown in FIG. 26 (d), the chip holding portion 26D is embedded in a square frame portion 26Da and a lateral hole opened inside the frame formed on the inner walls of the four sides of the frame portion 26Da. And a pressing member 26Db.

  The holding member 26Db has a spherical member at the tip, and one end of a coil spring is fixed to the spherical member, and the other end is supported by the end in each side hole on the four sides of the frame 26Da. Yes. The length of the coil spring is such that part or all of the spherical member protrudes from the side hole when the coil spring is not compressed (compressed). Is configured to fit inside the recess.

The microchip 200D is provided with depressions (holes in FIG. 26 (d)) into which the spherical members are inserted at positions corresponding to the horizontal holes of the frame part 26Da on the respective outer peripheral surfaces of the four sides.
The microchip 200D is pushed into the frame portion 26Da while aligning the positions of the spherical member and the depression while the coil spring of the pressing member 26Db is contracted, so that the spherical member is fitted into each depression on the outer periphery of the four sides of the microchip 200D. In this state, the entire microchip 200D is within the frame. Thereby, the microchip 200D is positioned and fixedly held.

[Second Embodiment]
Next, a second embodiment of the present invention will be described with reference to the drawings. FIG. 27 is a diagram showing a second embodiment of the centrifugal force applying apparatus and the sample liquid analyzing apparatus according to the present invention.
In the present embodiment, the centrifugal force applying device 2 in the sample liquid analyzing apparatus 100 of the first embodiment is changed to the centrifugal force applying device 6 shown in FIG. This is the same as the embodiment.
First, based on FIG. 27, the schematic structure of the centrifugal-force provision apparatus which concerns on this invention is demonstrated.
Here, FIG. 27 is a diagram showing a schematic configuration of the centrifugal force applying device 6 of the present embodiment.

  As shown in FIG. 27, the centrifugal force applying device 6 includes a rotary arm 60 (equivalent to the rotary arm 20) composed of a rectangular plate-shaped member, and an arm rotary shaft 61 (arm rotation) that is a rotary axis of the rotary arm 60. The rotary shaft rotating shaft 64 (which is equivalent to the shaft 21), a motor 62 and a power transmission mechanism 63 for applying a rotational driving force to the arm rotating shaft 61, and a rotating shaft 64 (equivalent to the chip rotating table 23). Equivalent to the rotary base rotary shaft 24), a tip rotary base 65, a rotary base drive mechanism 66 that rotationally drives the rotary base rotary shaft 64, a power supply line 67 that supplies power to the rotary base drive mechanism 66, and a control signal And a slip ring 68 for supplying electric power to the power supply line 67 and supplying a control signal to the signal line.

The rotary arm 60 has a passage through which the power line 67 and the signal line pass.
The arm rotation shaft 61 is supported on the upper plate of the base 1 so as to be rotatable around a vertical axis via a support member and a bearing (not shown) such as a rolling bearing. Further, a passage through which the power supply line 67 and the signal line pass is formed in the interior, like the rotary arm 60.

Further, the upper end of the arm rotation shaft 61 is joined to the rotation arm 60 so that the axial center position thereof coincides with the center position of the rotation arm 60, and the lower end of the arm rotation shaft 61 is connected to the slip ring 68.
The motor 62 is equivalent to the stepping motor 22a of the first embodiment, and generates a rotational driving force in response to a control signal (pulse signal) from a control board inside the base 1.

The power transmission mechanism 63 is composed of a combination of a belt and a pulley, or a gear, and converts the rotational driving force of the motor 62 into the rotational driving force of the arm rotating shaft 61 to the arm rotating shaft 61. It has a transmission mechanism.
The centrifugal force imparting device 6 is further inserted into one end and the other end of the rotating arm 60 in the longitudinal direction through shaft holes provided in the one end and the other end, respectively, and a rotary table rotating shaft 64 is not shown. It is rotatably provided around a vertical axis through a bearing. Further, the tip rotating table 65 is joined to the upper end portion of the rotating table rotating shaft 64 so that the center thereof coincides with the axis of the rotating table rotating shaft 64. Further, a part of the lower end side of the turntable rotation shaft 64 is connected to an output shaft of a turntable drive mechanism 66 that transmits a rotation drive force to the turntable rotation shaft 64. Note that a chip holding unit 26 (not shown) for holding the microchip 200 is provided on the chip turntable 65, as in the first embodiment.

  The turntable drive mechanism 66 includes a rotation drive source such as a rotary solenoid or a motor (for example, a stepping motor) that applies a rotation drive force to the turntable rotation shaft 64, and a drive circuit that drives the rotation drive source (depending on the type of motor). Includes a encoder), and drives the drive circuit and the rotation drive source with the electric power supplied from the power supply line 67 to apply a rotation driving force to the rotary table rotation shaft 64. In the present embodiment, positioning control of the rotational angle position of the rotary base rotating shaft 64 is performed based on a control signal from a signal line (not shown). The rotation drive source has a holding function of holding the rotation angle position (stop position) after rotating the chip turntable 65.

With the above configuration, by rotating the chip turntable 65 to a desired rotation angle position and stopping and holding at the rotation angle position, the attitude of the microchip 200 mounted on the chip holding unit is changed and the attitude is changed. Can be held.
One end of each of the power supply line 67 and the signal line passes through a passage formed in the arm rotation shaft 61 and the rotation arm 60, and is connected to a rotation drive source of the turntable drive mechanism 66 and a terminal of the drive circuit, respectively. The other end of the slip ring 68 is connected to a ring (current collecting ring) fitted outside the slip ring 68 so as to be energized.

  The slip ring 68 includes a stator, a rotation shaft having one end connected to the lower end of the arm rotation shaft 61 and the other end rotatably inserted into a shaft hole provided in the stator, and an outer periphery of the rotation shaft. The fitted ring, a metal piece (brush) provided in contact with the ring on the inner wall of the shaft hole of the stator, and a power input terminal (not shown) provided on the outside of the stator so as to be able to energize the metal piece And a signal input terminal (not shown), and a power supply line (not shown) provided in the base 1 is connected to the power input terminal, and a signal input terminal is connected to the signal input terminal. A signal line of a control board (not shown) provided inside the base 1 is connected.

  With the above configuration, when the centrifugal force applying device 6 applies a centrifugal force to the microchip 200 mounted on the chip holding unit, the motor 62 is rotationally driven according to a control signal from the control board inside the base 1. Then, the rotational driving force is transmitted to the arm rotation shaft 61 via the power transmission mechanism 63, and the arm rotation shaft 61 is rotated. This rotational force rotates the rotary arm 60 and applies a centrifugal force to the microchip 200. At this time, the power supply line 67 and the signal line are wired through the passage formed in the arm rotation shaft 61 and the rotation arm 60, and one end thereof is connected to the turntable drive mechanism 66 that rotates together with the arm rotation shaft 61. Since the other end is connected to the rotating shaft of the slip ring 68 provided on the lower end side of the arm rotating shaft 61, when the arm rotating shaft 61 rotates, the rotating shaft of the slip ring 68 also rotates together. The power line 67 and the signal line whose ends are connected to the inside of the rotating shaft are not twisted or entangled.

  On the other hand, when changing the posture of the microchip 200 held by the chip holding unit, the centrifugal force applying device 6 first receives the power from the power supply unit and the control signal from the control board inside the base 1. Electric power and control signals are supplied to the corresponding metal pieces through the power input terminals and signal input terminals provided on the stator of the slip ring 68, respectively. Since each metal piece is in contact with the ring so as to be energized, power is supplied to the power line 67 through each ring, and a control signal is supplied to the signal line. The supplied power and control signal are supplied to the turntable drive mechanism 66 through the power line 67 and the signal line. When the power and the control signal are supplied, the turntable drive mechanism 66 controls the rotation drive source (motor, rotary solenoid, etc.) based on the control signal in the drive circuit, and moves the rotation drive source in the rotation direction according to the control signal. Rotation is driven by a rotation angle corresponding to the control signal.

Further, when the rotation drive source is driven to rotate, the rotating table rotating shaft 64 rotates, and the chip rotating table 65 and the chip holding unit rotate at the same time. As a result, the posture of the microchip 200 mounted on the chip holding unit is changed by the rotation angle corresponding to the control signal.
Specifically, according to the control signal from the control board, the rotation angle position corresponding to the posture for weighing the separation component, mixing the separation component and the reagent, moving the separation component to the measurement position, etc. And change.

That is, the sample liquid analyzer 100 according to the present embodiment controls the microchip 200 to a desired rotation by controlling the rotation direction and rotation angle position of the rotation drive source of the turntable drive mechanism 66 in the centrifugal force applying device 6. It is possible to rotate in the direction by a desired rotation angle and hold the stopped state at the rotation angle position.
In the first embodiment, the stepping motor 22a is used as the rotation drive source of the arm rotation mechanism 22. However, the present invention is not limited to this, and a motor other than the stepping motor (for example, a DC motor, a brushless motor). , An induction motor or the like), or a configuration using an actuator other than the motor such as a rotary solenoid other than the motor. In this case, in order to detect the rotation angle position, it is used in combination with a device for detecting the rotation angle position such as an encoder.

  In the first embodiment, only the rotary table driving force transmission mechanism 27 is configured to mitigate the impact generated in the solenoid shaft 27b by the drive of the solenoid body 27a by the shock absorber 27c. Not only this but the solenoid 39 which moves a laser head along a slide rail is also good also as a structure which eases the impact at the time of a slide movement by a shock absorber similarly.

Moreover, in the said 1st Embodiment, although the rotation arm 20 was comprised with the rectangular plate-shaped member, you may comprise not only this but other shapes, such as a disk-shaped member.
In the first embodiment, the laser beam is irradiated from the top to the bottom. However, the present invention is not limited to this, and the laser beam may be irradiated from the bottom to the top. Accordingly, it is possible to more appropriately prevent external light such as light from a fluorescent lamp installed on the ceiling from entering the light receiving unit.

  In the first embodiment, an HB type stepping motor is used as the stepping motor 22a. However, the invention is not limited to this, and other types such as a PM type (Permanent Magnet Type) and a VR type (Variable Reluctance Type) are used. A configuration using a stepping motor of a mold may be used. In the case of using a PM type (Permanent Magnet Type) stepping motor, the holding force for holding the final state works by the permanent magnet, so that it is not necessary to pass a holding current.

  In the first embodiment, the sample liquid analyzer 100 is configured to output the light reception information of the transmitted light to an external computer. However, the present invention is not limited to this configuration. The internal computer system may be configured to analyze the oxygenated hemoglobin amount, the deoxygenated hemoglobin amount, the total hemoglobin amount, etc. in the plasma from the received light information of the transmitted light.

  Further, in the first and second embodiments, the rotary arms 20 and 60 have a rectangular shape, and a mechanism (second rotation mechanism) that changes the posture of the microchip 200 one by one at the symmetrical positions on both ends thereof. However, the present invention is not limited to this, and the rotary arms 20 and 60 are formed in different shapes such as a cross shape and a circular shape, and three or more second rotation mechanisms are provided at symmetrical positions where the respective weight balances can be balanced. It is good also as a structure.

  Further, in the first embodiment, a configuration is described in which inclined surfaces are formed on the upper end surface and the lower end surface of the cam 25a, and the moving force of the vertical movement of the cam 25a is converted into the rotational driving force of the rotary base rotating shaft 24. However, the present invention is not limited to this, and the rotating table rotating mechanism 25 is formed with an inclined surface only on the upper end surface of the cam 25a, and only the upper cam pin 25d is provided on the outer peripheral surface of the rotating table rotating shaft 24. Only when moving in the direction, the moving force may be converted into the rotating force of the turntable rotating shaft 24.

  In the first embodiment, the buffer member 27f is provided at the tip of the solenoid shaft 27b, and the pusher 27g reduces the impact at the time of collision with the transmission portion 25c by the buffer member 27f. The member may be provided on a member that collides with another member such as the solenoid shaft 40 or the transmission member 41 that transmits the driving force of the solenoid 39, and may be configured to relieve an impact generated at the time of the collision with the optical information measurement unit 30.

  Further, in the first embodiment, in the rotary table driving force transmission mechanism 27, the impact generated when the solenoid shaft 27b and the pusher 27g are linearly moved by the solenoid main body 27a is moved to the base 1 side by the support bracket 27d. The shock absorbing bracket 27e, which is fixedly supported and collides with the piston rod of the shock absorber 27c so as to move in a straight line in conjunction with the straight movement of the solenoid shaft 27b, absorbs it. The present invention may be applied to the shaft 40 to absorb an impact generated when the solenoid shaft 40 is linearly moved. In addition to the shock absorber, a buffer member may be provided on the surface of the member that collides with another member by driving the solenoid 39 such as the tip of the solenoid shaft 40 or the tip of the transmission member 41, so that the impact at the time of the collision can be reduced. .

Moreover, in the said modification 1, although it was set as the structure which hold | maintains the position after shifting by the eccentric mechanism with the motive power of an actuator, it is not restricted to this, For example, in the ball-point pen which inserts / removes a pen tip by knock of a knock member For example, a mechanism that holds the knocked state may be applied, and the position after shifting may be held without using the power of the actuator.
Moreover, in the said modification 2, although it was set as the structure which positions the 1st rotary body with respect to the optical information measurement part 30 by fitting the pin 42 in the pin hole 25u, it is not restricted to this but fitting other than a pin The protrusion is configured to be fitted to a fitting receiving part for fitting the fitting protrusion, or a fitting protrusion such as a pin 42 is provided in the rotary table rotating mechanism 25, for example, to receive a fitting hole such as a pin hole 25u. It is good also as a structure which provides a part in the optical information measurement part 30. FIG.

Moreover, in the said modification 2, although it was set as the structure which provides the pin hole 25u in the turntable rotation mechanism 25, it is not restricted to this, For example, the position which provides the pin 42 opposes other structural parts, such as the rotation arm 20. It is good also as a structure which changes to a position and provides the pin 42 in another structure part.
In the third modification, the liquid is sealed in the cylinder and the braking force is obtained by the resistance force when the liquid is passed through the through hole. However, the present invention is not limited to this. The shock absorber may be enclosed.

  Moreover, in the said modification 3, although the solenoid 28 with a shock absorber of the said structure is applied with respect to the turntable drive force transmission mechanism 27, it is not restricted to this, The optical information measurement part 30 is moved to approach and separate. As in the case of the solenoid 28 with the shock absorber, the mechanism portion including the solenoid 39, the solenoid shaft 40, and the transmission member 41, which constitutes the drive mechanism to be driven, is a shock in which the solenoid shaft 40 and the piston rod of the shock absorber are integrally configured. It is good also as a structure containing the solenoid with an absorber. As a result, it is possible to configure a solenoid having a shock absorber function in a smaller space than providing a shock absorber separately from the solenoid 39 and the solenoid shaft 40.

Further, it is possible to provide a buffer member at a location that collides with another member when transmitting force to the optical information measuring unit 30 such as the tip of the solenoid shaft 40 or the tip of the transmission member 41. Thereby, since the impact at the time of a collision can be relieved, the impact transmitted to the chip | tip holding | maintenance part 26 and the microchip 200 through the optical information measurement part 30 can be relieved.
In the second embodiment, the passages through which the power line 67 and the signal line pass are formed inside the rotary arm 60 and the arm rotary shaft 61. However, the present invention is not limited to this, and the rotary arm 60 and One or both of the arm rotation shafts 61 may have a hollow structure. As a result, the rotary arm 60 and the arm rotation shaft 61 can be formed with a simpler configuration than providing a passage inside.

(A) And (b) is a perspective view which shows schematic structure of the sample liquid analyzer 100 which concerns on this invention. It is the schematic block diagram which looked at the sample liquid analyzer 100 concerning the present invention from the upper surface. 2 is a front view showing a schematic configuration of a centrifugal force applying device 2. FIG. 4 is a block diagram showing a detailed configuration of an arm rotation mechanism 22. FIG. (A) is a figure which shows the example of a shape of the microchip 200, (b) and (c) is a figure which shows the structural example of the chip | tip holding | maintenance part 26, (d) is the example of mounting | wearing of the microchip 200. (E) And (f) is the side view and top view of the chip | tip holding | maintenance part 26 with which the microchip 200 was mounted | worn. (A)-(c) is a figure which shows the structure which balances the rotational balance at the time of the centrifugal force provision of the centrifugal force provision apparatus 2. FIG. 3 is a diagram showing a detailed configuration of a turntable rotating mechanism 25. FIG. (A) is a front view of the cam 25a, (b) is a bottom view of the cam 25a. FIG. 3 is a diagram showing a detailed configuration of a turntable driving force transmission mechanism 27. (A)-(c) is a figure which shows operation | movement of the turntable rotation mechanism 25 at the time of pushing up with the pusher 27g. (A)-(c) is a figure which shows operation | movement of the turntable rotation mechanism 25 after pushing up with the pusher 27g. (A) is a top view of the optical measuring device 3, (b), (c) is a side view of the optical measuring device 3. FIG. (A) And (b) is a figure which shows an example of the slide operation | movement of the optical information measurement part 30. FIG. (A) And (b) is a top view of the optical information measurement part 30 at the time of moving to a measurement process position, (c) is a top view of the laser beam light-receiving part 30g, (d) and (e) These are side views of the optical information measuring unit 30 when moving to the measurement processing position. (A)-(c) is a figure which shows an example of the optical information measurement part 30 formed using the black insulating member. It is a figure which shows the internal structure of the temperature control apparatus. 2 is a diagram showing an example of air flow inside the sample liquid analyzer 100. FIG. FIG. 3 is a diagram illustrating an example of the air flow in the upper surface portion of the base 1. (A) is a figure which shows the operation example at the time of centrifugal force provision, (b) And (c) is a figure which shows the operation example at the time of the attitude | position change of the microchip 200. FIG. (A)-(c) is a figure which shows the attitude | position of the microchip 200 in each process. (A)-(c) is a figure which shows the operation | movement at the time of the analysis of the optical measuring device 3. FIG. (A)-(e) is a figure which shows an example of the change operation | movement of a gravity center position at the time of provision of centrifugal force. (A) And (b) is a figure which shows the structural example in the case of fixing and supporting the position of the optical information measurement part 30 and the microchip 200 at the time of a measurement process by a pin and a pin hole in this modification. It is a figure which shows the structure of the solenoid 28 with a shock absorber. It is a figure which shows the structure of the turntable rotation mechanism 25 of this modification. (A)-(d) is a figure which shows the structural example of a chip | tip holding | maintenance part and a microchip. It is a figure which shows the structure of the centrifugal force provision apparatus 6 of this Embodiment.

Explanation of symbols

DESCRIPTION OF SYMBOLS 100 Sample liquid analyzer 200,200A-D Microchip 200a Measuring part 1 Base 2,6 Centrifugal force imparting apparatus 3 Optical measuring apparatus 4 Temperature control apparatus 5 Upper surface cover 13,14 Sensor 10,11,16,17 Ventilation opening 15 Opening / closing shutter 20, 60 Rotating arm 21, 61 Arm rotating shaft 22 Arm rotating mechanism 23, 65 Chip rotating table 24, 64 Rotary table rotating shaft 25 Rotary table rotating mechanism 26 Chip holding unit 27 Rotary table driving force transmission mechanism 28 Shock absorber Attached solenoid 30 optical information measuring unit 32 first slide rail 33 second slide rail 34 first slider 35 second slider 36 slide auxiliary member 37 mandrel 38 return spring portion 39 solenoid 40 solenoid shaft 41 transmission member 42 pin 43 support member 22a Stepping motor 22b drive circuit 25a 25b Guide member 25c Transmission portion 25d Upper cam pin 25e Lower cam pin 25f Coil spring 25g Low sliding member 25h, 25i Magnet 25j Upper end cam surface 25m, 25p Inclined surface 25n, 25r Wall 25q Pin fitting groove 25t Engagement Groove 25u Pin hole 25o Lower end cam surface 26a Frame portion 26b Chip pressing portion 26c, 26d Detected portion 27a Solenoid body 27b Solenoid shaft 27c Shock absorber 27d Support bracket 27e Shock absorption bracket 27f Buffer member 27g Pusher 30a Laser light irradiation portion 30b First Laser head part 30c Second laser head part 30d First support member 30e Second support member 30f Laser light receiving part 30g First light receiving head part 30h Second light receiving head part 38a, 38b Coil spring 38c Transmission member 50 Temperature control device 51, 55 Temperature Measurement Probe 52 Fan 53 Heating Element 54 Housing 62 Motor 63 Power Transmission Mechanism 66 Turntable Drive Mechanism 67 Power Line 68 Slip Ring

Claims (8)

In response to the application of centrifugal force in a predetermined direction, at least the sample liquid is centrifuged, and the sample liquid analysis microchip capable of guiding the separated components of the sample liquid after the centrifugation to a predetermined position of the chip, A centrifugal force applying device that rotates in a state of maintaining a posture corresponding to a predetermined direction and applies a centrifugal force to the microchip in a predetermined direction,
A base, a first rotating body rotatably provided about an axis perpendicular to the base, and a first actuator for generating a rotational driving force, the rotational driving force of the first actuator being A first driving mechanism that transmits the first rotating body to the first rotating body and rotationally drives the first rotating body, and a position that is a predetermined distance away from the rotational center position of the first rotating body. A second rotating body provided so as to be rotatable around a vertical axis, and a chip holding part for holding the microchip provided so as to be rotatable together with the second rotating body with respect to the second rotating body. A second drive mechanism that includes a second actuator, transmits the power of the second actuator to the second rotating body as its rotational driving force, and rotates the second rotating body; and is provided on the base. A covering body capable of covering the component parts, and the base Centrifugal force applying device, characterized in that it comprises a temperature adjusting means, the adjusting the temperature around the components provided in the. The base has a hollow structure;
The temperature adjusting means includes a plurality of ventilation holes provided by cutting out a part of the upper surface of the base, and a temperature detection unit that detects the temperature around the predetermined position provided at a predetermined position on the base. A casing provided with an internal space connected to the space of the hollow portion of the base, a heating element provided in the casing for generating heat by converting electric energy into heat, and the heating element Based on information on the temperature detected by the temperature detection unit and the air blowing unit that sends the air heated by the heat generated in the air to the base via either the space of the hollow part or the plurality of ventilation openings The centrifugal force applying device according to claim 1, further comprising a temperature control unit that adjusts an amount of electric energy supplied to the heating element.   The said base is provided with the shutter mechanism which opens and closes the vent hole which passes through at least when the said warmed air is sent on the said base among these ventilation openings. Centrifugal force applying device. It has a measuring unit that includes an area for performing optical measurement processing on the separated components of the sample liquid after centrifugation, and at least the sample liquid is centrifuged according to the application of centrifugal force in a predetermined direction. The sample liquid analysis microchip capable of guiding the separated component of the sample liquid after centrifugation and the reagent, and guiding the separated component after mixing the reagent to the measuring unit, has a posture corresponding to the predetermined direction. The measurement process is performed on the separated component after mixing the reagent guided to the measurement unit by applying a centrifugal force to the microchip in a predetermined direction by rotating in a held state. A sample liquid analyzer for performing
A base, a first rotating body rotatably provided about an axis perpendicular to the base, and a first actuator that generates a rotational driving force, the rotational driving force of the first actuator being A first driving mechanism that transmits the first rotating body to the first rotating body and rotationally drives the first rotating body, and a position separated from the rotational center position of the first rotating body by a predetermined distance from the first rotating body. A second rotating body provided so as to be rotatable around a vertical axis, and a chip holding part for holding the microchip provided so as to be rotatable together with the second rotating body with respect to the second rotating body. A second drive mechanism that includes a second actuator, transmits the power of the second actuator to the second rotating body as its rotational driving force, and rotates the second rotating body; and is provided on the base. The first rotating body is at a predetermined rotational angle position. A light irradiation unit capable of irradiating light to the measurement unit of the microchip held by the chip holding unit, a light receiving unit that receives light transmitted through the measurement unit, and the light reception An output unit that outputs information on the amount of light received by the unit, a covering that can cover the component provided on the base, and a temperature that adjusts the temperature around the component provided on the base And a sample liquid analyzer. The base has a hollow structure;
The temperature adjusting means includes a plurality of ventilation holes provided by cutting out a part of the upper surface of the base, and a temperature detection unit that detects the temperature around the predetermined position provided at a predetermined position on the base. A casing provided with an internal space connected to the space of the hollow portion of the base, a heating element provided in the casing for generating heat by converting electric energy into heat, and the heating element Based on information on the temperature detected by the temperature detection unit and the air blowing unit that sends the air heated by the heat generated in the air to the base via either the space of the hollow part or the plurality of ventilation openings The sample liquid analyzer according to claim 4, further comprising a temperature adjustment unit that adjusts an amount of electric energy supplied to the heating element. The light receiving unit is provided on the base with a portion that receives at least light transmitted through the measurement unit,
The sample liquid analyzer according to claim 5, wherein the temperature detection unit is provided in the vicinity of a portion that receives the light.   The sample liquid analyzer according to any one of claims 4 to 6, wherein the covering is made of a light-shielding material.   6. A shutter mechanism that opens and closes a ventilation port that passes when at least the warmed air is sent onto the base among the plurality of ventilation ports is provided on the base. Item 8. The sample liquid analyzer according to any one of Items 7 to 9.

Images