JP2008309723A - Rim slippage measuring device and rim slippage measuring technique - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a rim slippage measuring device and a rim slippage measuring technique capable of measuring continuously rim slippage during the rotation period of measuring object tire with high versatility. <P>SOLUTION: The rim slippage measuring device 1 is equipped with an asperity detecting sensor 2 prepared for facing to a tire depth array TD3 during the rotation period of measuring object tire T surface of which the tire depth array TD3 produced continuously on an irregular base in tire circumferential direction is formed on to detect asperity of the tire depth array TD3, a rotational positioning sensor 3 detecting a reference limb rotational position of a limb R, an asperity array wave pattern producing section 46 producing asperity array wave pattern based on asperity detected for quota per one rotation of the measuring object tire T started from the reference limb rotational position detected, and a rim slippage determination section 48 determining rim slippage based on the reference asperity array wave pattern produced during the rotation of the measuring object tire T before the measurement of rim slippage and the rotating asperity array wave pattern produced repeatedly during the rotation of the measuring object tire T during the measurement of rim slippage. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a rim displacement measuring apparatus and a rim displacement measuring method, and more particularly to a rim displacement measuring apparatus and a rim displacement measuring method for measuring a rim displacement with respect to a rim of a measurement target tire assembled with a rim.

  Conventionally, a change relative to a rim of a measurement target tire assembled with a rim, that is, a rim deviation has been measured. Conventional measurement of rim displacement is performed by marking the measurement target tire and rim and visually observing the displacement of the marking with a scale or the like. However, in the conventional measurement of rim deviation, when the measurement target tire deviates more than one lap with respect to the rim when an impact force, for example, a large braking force is repeatedly applied to the measurement target tire, the rim deviation is accurately measured. There was a problem that it was difficult. Further, in the conventional measurement of the rim displacement, there is a problem that the reading error of the measurer increases, the measurement results vary, and the measurement accuracy is low.

  Therefore, measurement of rim displacement using a rim displacement measuring device has been proposed. For example, as shown in Patent Document 1, a rim deviation measuring device is provided on a rim (disk), and the rotation of a roller of the rim deviation amount measuring device brought into contact with the measurement target tire by pulling the measurement target tire (tire). The rim deviation with respect to the rim of the measurement target tire is measured based on the angle. Moreover, as shown in patent document 2, the rim | limb deviation | shift with respect to the rim | limb of a measurement object tire is measured based on the conduction | electrical_connection state of the some conducting wire which comprises the electrically conductive body affixed on the bead.

JP 2002-71529 A JP 2005-193711 A

  However, the rim deviation measuring device shown in Patent Document 1 has a problem that it cannot measure the rim deviation that occurs when the measurement target tire rotates. In addition, there is a problem that even if a rim shift occurs a plurality of times in one measurement, the generated rim shift cannot be measured continuously. Moreover, in the rim deviation measuring apparatus shown in Patent Document 2, it is necessary to provide a conducting body on the measurement target tire for measuring the rim deviation, and the dedicated configuration for measuring the rim deviation on the measurement target tire used in the implementation market. There was a problem that elements had to be added, and versatility was low.

  Therefore, the present invention has been made in view of the above, and has a rim displacement measuring apparatus and a rim displacement measuring method that are highly versatile and can continuously measure rim displacement during rotation of a measurement target tire. It is intended to provide.

  In order to solve the above-described problems and achieve the object, according to the present invention, the measurement target tire of the measurement target tire in which the concave and convex arrangement formed continuously irregularly in the tire circumferential direction is formed on the tire surface is a rim. In the rim displacement measuring device that measures the rim displacement with respect to the assembled rim, the unevenness detecting means that is disposed to face the unevenness array when the measurement target tire rotates and detects unevenness in the unevenness array, and the rim reference A rim rotation position detecting means for detecting a rim rotation position; and a concavo-convex array waveform generating means for generating a concavo-convex array waveform based on the concavo-convex detected for one rotation of the measurement target tire from the detected reference rim rotation position; Reference irregularity array waveform generated during rotation of the measurement target tire before the rim deviation measurement and the measurement object during the rim deviation measurement And rim deviation determining means for determining a rim deviation on the basis of the rotation irregularities sequence waveforms generated repeatedly during rotation of the tire, characterized in that it comprises a.

  Also, in the present invention, in the rim displacement measuring device, the concave / convex array is a land groove array including land portions and groove portions formed in a tire circumferential direction on a tread surface of the measurement target tire. .

  Further, in the present invention, a rim shift for measuring a rim shift of a measurement target tire having a concavo-convex arrangement formed on the tire surface in a tire circumferential direction with respect to a rim on which the measurement target tire is assembled. In the measurement method, before the rim displacement measurement, a procedure for generating a reference unevenness waveform based on the unevenness in the unevenness array for one rotation of the measurement target tire from the reference rim rotation position of the rim, and during the rim displacement measurement In addition, a procedure for repeatedly generating a rotation unevenness array waveform based on the unevenness in the unevenness array for one rotation of the measurement target tire from the reference rim rotation position of the rim, based on the reference unevenness array waveform and the rotational unevenness array waveform And determining the rim displacement.

  According to the present invention, since the uneven arrangement formed on the tire surface is irregular, when the rim deviation occurs, the rotation uneven arrangement waveform generated after the occurrence of the rim deviation and the reference uneven arrangement waveform do not match. The rim deviation of the measurement target tire can be determined. Here, the rotation unevenness waveform is repeatedly generated when the measurement target tire rotates. Accordingly, it is possible to continuously measure the rim deviation during rotation of the measurement target tire. In addition, the rim deviation measuring device measures the rim deviation of the measurement target tire if a concavo-convex arrangement formed continuously irregularly in the tire circumferential direction, for example, a land groove arrangement, is formed on the tire surface of the measurement target tire. Therefore, it is possible to measure rim deviation without adding a dedicated component to the measurement target tire. Therefore, as long as the measurement target tire is provided with a concavo-convex arrangement, the rim shift can be measured in any measurement target tire, so that versatility can be enhanced.

  In the present invention, the rim deviation measuring device further includes binarization processing means for binarizing the generated reference unevenness array waveform and the rotated unevenness array waveform.

  Also, in the present invention, in the rim deviation measuring apparatus, the rim deviation determining means performs a logical operation on the binarized reference irregularity array waveform and the binarized rotation unevenness array waveform obtained by the binarization process. The rim deviation is determined based on the integrated value of the values or the correlation function.

  According to the present invention, the rim deviation determination means is configured to calculate, for example, an integrated value or correlation of values calculated by a logical operation based on the binarized reference binarized uneven pattern waveform and binarized rotating uneven pattern waveform. Rim deviation can be measured based on the function. Therefore, it is possible to measure the rim displacement with higher accuracy than when measuring the rim displacement based on the reference unevenness array waveform and the rotational unevenness array waveform including noise.

  Further, in the present invention, in the rim displacement measuring apparatus, the rim displacement determining means adds a rim displacement amount to the binarized rotation unevenness array waveform determined to be the rim displacement and the binarized reference unevenness array waveform. Rim deviation amount addition binarization reference concavo-convex array waveform logical operation is performed, and rim deviation amount in the rim deviation amount addition binarization reference concavo-convex array waveform that matches the binarized rotation concavo-convex array waveform determined as the rim deviation It is characterized by determining to.

  According to the present invention, it is possible to measure the amount of rim displacement when a rim displacement occurs based on the binarized rotation unevenness waveform determined as rim displacement and the rim displacement amount addition binarization reference unevenness array waveform. it can. Therefore, it is possible to accurately measure a change in the amount of rim displacement during rim displacement measurement.

  The rim deviation measuring device and the rim deviation measuring method according to the present invention are highly versatile and have the effect of being able to continuously measure rim deviation during rotation of the measurement target tire.

Hereinafter, the present invention will be described in detail with reference to the drawings. In addition, this invention is not limited by the best form for implementing this invention. In addition, constituent elements in the following embodiments include those that can be easily assumed by those skilled in the art or those that are substantially the same. In the following embodiment, the rim deviation measuring device measures the rim deviation with respect to the rim of the measurement target tire mounted on the vehicle, but the present invention is not limited to this, and the tire test is performed. You may measure the rim shift | offset | difference with respect to the rim | limb of the measurement object tire assembled | attached to the machine.
[Embodiment]

  FIG. 1 is a diagram illustrating a configuration example of a rim displacement measuring apparatus according to an embodiment. The rim deviation measuring device 1 measures the rim deviation with respect to the rim R of the measurement target tire T assembled to the rim mounted on the vehicle 100. The unevenness detecting sensor 2, the rotational position sensor 3, the control device 4, and the like. , And the input / output device 5.

  Here, in general, the tread pattern formed by the land portion and the groove portion of the tire has a pattern arrangement in which a plurality of patterns having different sizes in the tire circumferential direction are combined for noise countermeasures. That is, the tire has a land groove array composed of land portions and groove portions that are formed irregularly and continuously in the tire circumferential direction. In the embodiment, the measurement target tire T is formed with three land groove arrays TD1, TD2, and TD3 including land portions TL and groove portions TG that are formed irregularly and continuously in the tire circumferential direction. Therefore, the measurement target tire T is formed with a land groove array, that is, an uneven array, which is formed irregularly and continuously in the tire circumferential direction. In the embodiment, the rim deviation is measured based on the land groove array TD3 out of the three land groove arrays TD1, TD2, and TD3.

  The vehicle 100 rotates the tire T to be measured in contact with the actual road surface 200. The vehicle 100 includes an axle 101, an engine 102, and a brake device 103.

  The axle 101 supports the rim assembled measurement target tire T in a freely rotatable manner. One end of the axle 101 (the left end in the figure) in the axial direction can be fixed to the rim R, and the other end (the right end in the figure) is connected to the engine 102. Here, when the measurement target tire T is fixed to the axle 101, the measurement target tire T is assembled to the rim R, and the rim R on which the measurement target tire T is assembled is fixed to the axle 101. . In the vehicle 100, the measurement target tire T is fixed to the axle 101, and the measurement target tire T is arranged in the vertical direction, that is, the load direction (arrow A direction) and the yaw direction around the vertical direction, that is, the tire slip direction ( A support mechanism is provided that is movably supported in the direction of arrow B in FIG. Further, the vehicle 100 is provided with a steering mechanism that moves the measurement target tire T in the tire slip direction (the arrow B direction in the figure).

  The engine 102 applies a tire rotational force around the axle 101 to the measurement target tire T, that is, in the tire rotational direction (the arrow C direction in the figure). Thereby, the vehicle 100 accelerates. The engine 102 is connected to the driving control device of the vehicle 100, and the tire torque applied to the measurement target tire T by the driving control signal output based on the depression amount of the accelerator pedal by the driver's operation. Is to adjust.

  The brake device 103 applies a tire braking force around the axle 101 to the measurement target tire T, that is, in the tire rotation direction (the arrow C direction in the figure). Thereby, the vehicle 100 decelerates. The brake device 103 is connected to a brake pedal operated by the driver via a brake path, and adjusts the tire braking force applied to the measurement target tire T according to the depression amount of the brake pedal.

  Here, the rim deviation of the measurement target tire T occurs when the tire rotation force by the engine 102 or the tire braking force by the brake device 103 is applied to the measurement target tire T. It will be. The tire impact force is defined as a tire rotational force or a tire braking force that causes a rim displacement of the measurement target tire.

  The unevenness detecting sensor 2 is an unevenness detecting means. The unevenness detection sensor 2 detects unevenness in the unevenness array formed on the measurement target tire T. In the embodiment, the unevenness detection sensor 2 is, for example, a laser displacement sensor, and is disposed to face the land groove array TD3 that is the unevenness array when the measurement target tire T rotates. That is, the unevenness detection sensor 2 detects unevenness in the land groove array TD3 that is the uneven structure when the measurement target tire T rotates, as a displacement of the distance from the unevenness detection sensor 2 to the tread surface, that is, the land groove array TD3. . The unevenness detection sensor 2 is connected to the control device 4 and outputs a displacement corresponding to the unevenness in the land groove array TD3 to the control device 4 as an output signal.

  The rotational position sensor 3 is a rim rotational position detecting means. The rotational position sensor 3 detects a reference rim rotational position of the rim R. In the embodiment, the rotational position sensor 3 is provided with respect to the axle 101, and detects the rotational position of the axle 101, thereby determining the reference rim rotational position of the rim R based on the detected rim rotational position of the axle 101. It is to detect. The rotation position sensor 3 is connected to the control device 4 and outputs the detected reference rim rotation position to the control device 4 as a reference signal. Therefore, the control device 4 can detect from the reference rim rotation position of the rim R until the measurement target tire T makes one rotation based on the interval at which the rotation position sensor 3 detects the reference rim rotation position.

  The control device 4 controls the rim deviation measuring device 1 according to the embodiment. The control device 4 includes at least an input / output unit (I / O) 41, a processing unit 42, and a storage unit 43. The input / output unit (I / O) 41, the processing unit 42, and the storage unit 43 are connected to each other, for example, and can exchange data with each other. An input / output device 5 is connected to the control device 4. In the control device 4 of the rim deviation measuring apparatus 1, the processing unit 42 reads the rim deviation measurement program into a memory (not shown) of the processing unit 42 and performs calculation, so that the reference concavo-convex array waveform and the rotational concavo-convex array waveform are detected from the detected concavo-convex. Is generated, and the rim deviation is measured based on the binarized reference irregularity array waveform and the binarized rotation irregularity array waveform that have been binarized.

  The processing unit 42 includes a memory such as a RAM and a ROM, and a CPU (Central Processing Unit). The processing unit 42 includes at least an unevenness acquisition unit 44, a rim rotation position acquisition unit 45, an unevenness array waveform generation unit 46, a binarization processing unit 47, and a rim deviation determination unit 48. The unevenness acquisition unit 44 acquires the unevenness detected by the unevenness detection sensor 2, that is, the displacement of the distance from the unevenness detection sensor 2 to the land groove array TD3 in the embodiment. The rim rotation position acquisition unit 45 acquires the timing at which the reference rim rotation position is detected by the rotation position sensor 3 that is a rim rotation position detection means. The unevenness array waveform generation unit 46 generates an unevenness array waveform based on the unevenness detected for one rotation of the measurement target tire T from the detected reference rim rotation position. The concavo-convex array waveform generation unit 46 generates a reference concavo-convex array waveform when the measurement target tire T rotates before the rim shift measurement, and repeatedly generates a rotation concavo-convex array waveform when the measurement target tire T rotates during the rim shift measurement. is there. The binarization processing unit 47 binarizes the reference unevenness array waveform and the rotational unevenness array waveform generated by the unevenness array waveform generation unit 46. The binarization processing unit 47 binarizes the reference unevenness array waveform and the rotational unevenness array waveform to generate a binarized reference unevenness array waveform and a binarized rotation unevenness array waveform. The rim displacement determination unit 48 determines rim displacement based on the reference unevenness array waveform and the rotational unevenness array waveform generated by the unevenness array waveform generation unit 46. In the embodiment, the rim deviation determination unit 48 determines the rim deviation based on the binarization reference unevenness array waveform and the binarized rotation unevenness array waveform generated by the binarization processing unit 47. Note that the processing unit 42 appropriately stores a numerical value in the middle of the calculation in the storage unit 43 and appropriately takes out the stored numerical value from the storage unit 43 and performs the calculation. The processing unit 42 may be realized by dedicated hardware instead of the rim deviation measurement program.

  The storage unit 43 stores a rim deviation measurement program in which a rim deviation measurement method for realizing the rim deviation measurement method according to the embodiment is incorporated. Here, the memory | storage part 43 can be comprised by storage means, such as memory like RAM (Random Access Memory). The storage unit 43 may be provided in the processing unit 42. In the storage unit 43, for example, the generated reference concavo-convex array waveform and the rotated concavo-convex array waveform, the generated binarized reference concavo-convex array waveform and the binarized rotational concavo-convex array waveform, and the measured rim deviation amount are stored. Stored as appropriate.

  The rim deviation measurement program is not necessarily limited to a single configuration, but cooperates with a program already stored in a computer system, for example, a separate program represented by an OS (Operating System). The function may be achieved. Further, a rim deviation measurement program for realizing the functions of the concave / convex array waveform generation unit 46, the binarization processing unit 47, and the rim deviation determination unit 48 of the processing unit 42 is stored in a computer-readable recording medium, and the recording medium The rim deviation measurement method according to the present invention may be executed by causing the computer system to read and execute the rim deviation measurement program recorded in the above. The “computer system” here includes an OS and hardware such as peripheral devices.

  The input / output device 5 includes an input device 51 and an output device 52. The input device 51 inputs, for example, data based on the measurement condition (including the traveling condition of the vehicle 100) of the rim deviation of the measurement target tire T by the rim deviation measurement apparatus 1 and other data to the control apparatus 4. As the input device 51, an input device such as a keyboard, a mouse, and a microphone can be used.

  Further, the output device 52 includes the operation state of the rim deviation measuring device 1, the generated reference unevenness array waveform and the rotational unevenness array waveform, the binarized reference unevenness array waveform and the binary generated by the binarization processing unit 47. The data such as the rotational rotation unevenness waveform and the measured rim displacement amount are displayed. As the output device 52, a CRT (Cathode Ray Tube), a liquid crystal display device, or the like can be used. These data may be output to a printer (not shown). Here, the input / output device 5 may be provided in a terminal device (not shown) and may be configured to be able to access the control device 4 via a portable terminal by either a wired or wireless method. Further, the detection data detected by the unevenness detection sensor 2 and the rotational position sensor 3 is temporarily stored in a storage device, and stored by a computer system including at least the control device 4 and the input / output device 5 provided outside the vehicle 100. The control device 4 may measure the rim deviation based on the detection data stored in the device.

  Next, the rim deviation measuring method of the rim deviation measuring apparatus 1 according to the embodiment will be described. FIG. 2 is an operation flowchart of the rim deviation measuring apparatus according to the embodiment. FIG. 3 is a diagram illustrating a generated reference land groove array waveform. FIG. 4 is a diagram showing binarized binarized reference land groove array waveforms. FIG. 5 is a diagram showing a generated rotating land groove array waveform (after occurrence of a rim shift). FIG. 6 is a diagram illustrating a binarized binarized rotating land groove array waveform (after occurrence of a rim deviation). FIG. 7 is a diagram showing the relationship between the calculated exclusive OR and the rim rotation position (before the occurrence of rim deviation). FIG. 8 is a diagram showing the relationship between the calculated exclusive OR and the rim rotation position (after rim deviation has occurred). FIG. 9 is a diagram illustrating the generated rim shift amount addition binarization reference land groove array waveform. FIG. 10 is a diagram showing the relationship between the exclusive OR integrated value and the rim deviation amount.

  First, as shown in FIG. 2, the vehicle 100 is caused to travel (step ST1). Here, the driver of the vehicle 100 applies a tire rotational force to the measurement target tire T by the engine 102 by operating an accelerator pedal (not shown), and causes the vehicle 100 to travel at a predetermined traveling speed V, for example.

  Next, the concave / convex array waveform generation unit 46 of the processing unit 42 generates a reference concave / convex array waveform (step ST2). Here, the concavo-convex array waveform generation unit 46 uses the displacement of the distance from the concavo-convex detection sensor 2 acquired by the concavo-convex acquisition unit 44 to the land groove array TD3 and the rotational position sensor 3 acquired by the rim rotational position acquisition unit 45. Based on the timing at which the reference rim rotation position of the axle 101 is detected, that is, the timing of one rotation based on the reference rim rotation position of the rim R, the reference unevenness array waveform that is the unevenness array waveform before starting the rim deviation measurement is obtained. Generate. As a result, the concavo-convex array waveform generation unit 46 generates a reference concavo-convex array waveform based on the concavo-convex detected in one rotation of the measurement target tire T from the reference rim rotation position of the rim R.

  Here, in the generated reference concavo-convex array waveform, the vertical axis represents the output value of the concavo-convex detection sensor, that is, the displacement of the distance from the concavo-convex detection sensor 2 to the land groove array TD3, and the horizontal axis represents the reference rim rotation position from the rim R. When the rim rotation position, that is, the rotation angle, a waveform as shown in FIG. 3 is obtained. In the generated reference concavo-convex array waveform, the first peak (the land portion unevenness detection sensor output value detected when the unevenness detection sensor 2 faces the land portion TL) and the second peak (the unevenness detection sensor 2 has the groove portion TG). And the groove unevenness detection sensor output value detected when facing each other). The generated reference irregularity array waveform is a waveform based on the land groove array TD3 that is irregularly and continuously formed in the tire circumferential direction of the measurement target tire T. Therefore, the width of the rim rotation position for each first peak and The width of the rim rotation position for each second peak is not regular but irregular. In addition, it is preferable that the displacement of the distance from the unevenness detection sensor 2 for generating the reference unevenness array waveform to the land groove array TD3 is a displacement after the rotation of the measurement target tire T is stabilized. Further, the unevenness array waveform generation unit 46 may generate the reference unevenness array waveform by generating the reference unevenness array waveform a plurality of times and averaging the multiple reference unevenness array waveforms. Further, the generated reference unevenness array waveform is stored in the storage unit 43 as appropriate.

  Next, as shown in FIG. 2, the binarization processing unit 47 of the processing unit 42 binarizes the generated reference unevenness array waveform (step ST3). Here, the binarization processing unit 47 binarizes the reference unevenness array waveform generated by the unevenness array waveform generation unit 46 to generate a binarized reference unevenness array waveform. The binarization processing by the binarization processing unit 47 binarizes the unevenness detection sensor output value with a reference value and converts it into 0 and 1 data. Here, the reference value is in the range of 10% to 90% when the groove unevenness detection sensor output value is 0% and the land unevenness detection sensor output value is 100%. In consideration of wear of the measurement target tire T, a range of 10% to 20% is preferable.

  In the generated binarized reference unevenness array waveform, the vertical axis represents the binarized unevenness detection sensor output value (0 and 1), and the horizontal axis represents the rim rotation position from the reference rim rotation position of the rim R, that is, the rotation. Assuming an angle, a waveform as shown in FIG. 4 is obtained. In the generated binarized reference uneven pattern waveform, a waveform having a top peak (1) and a bottom peak (0) is repeated. In the generated binarized reference concavo-convex array waveform, the generated reference concavo-convex array waveform is irregular in that the width of the rim rotation position for each first peak and the width of the rim rotation position for each second peak are not regular. Therefore, the width of the rim rotation position for each top peak and the width of the rim rotation position for each bottom peak are not regular but irregular. Note that the generated binarization reference unevenness waveform is stored in the storage unit 43 as appropriate.

  Next, as shown in FIG. 2, rim displacement measurement by the rim displacement measuring apparatus 1 is started (step ST4). Here, the vehicle 100 is caused to travel under traveling conditions based on the measurement conditions of the rim displacement of the measurement target tire T by the rim displacement measurement apparatus 1. The vehicle 100 applies a tire rotational force and a tire braking force to the measurement target tire T based on traveling conditions. In this case, a rim shift may occur in the measurement target tire T.

  Next, the concavo-convex array waveform generation unit 46 of the processing unit 42 generates a rotational concavo-convex array waveform (step ST5). Here, the concavo-convex array waveform generation unit 46 uses the displacement of the distance from the concavo-convex detection sensor 2 acquired by the concavo-convex acquisition unit 44 to the land groove array TD3 and the rotational position sensor 3 acquired by the rim rotational position acquisition unit 45. Based on the timing at which the reference rim rotation position of the axle 101 is detected, that is, the timing of one rotation based on the reference rim rotation position of the rim R, a rotation unevenness array waveform that is an unevenness array waveform during rim deviation measurement is generated. Thereby, the unevenness array waveform generation unit 46 generates a rotational unevenness waveform based on the unevenness detected for one rotation of the measurement target tire T from the reference rim rotation position of the rim R.

  Here, the generated rotation uneven | corrugated arrangement | sequence waveform becomes the same as the reference | standard uneven | corrugated arrangement | sequence waveform shown in FIG. 3, when rim deviation | shift has not generate | occur | produced. On the other hand, when a rim shift occurs, the vertical axis is the unevenness detection sensor output value, that is, the displacement of the distance from the unevenness detection sensor 2 to the land groove array TD3, and the horizontal axis is the rim rotation position from the reference rim rotation position of the rim R. That is, assuming the rotation angle, the waveform is as shown in FIG. The rotation unevenness array waveform generated after the rim shift has occurred is a shift of the rim rotation position of the reference unevenness array waveform. Further, the generated rotation unevenness array waveform is stored in the storage unit 43 as appropriate.

  Next, as shown in FIG. 2, the binarization processing unit 47 of the processing unit 42 binarizes the generated rotation unevenness arrangement waveform (step ST6). Here, the binarization processing unit 47 binarizes the rotation unevenness array waveform generated by the unevenness array waveform generation unit 46 to generate a binarized rotation unevenness array waveform. The binarization processing by the binarization processing unit 47 binarizes the unevenness detection sensor output value with a reference value and converts it into 0 and 1 data. Here, the reference value is the same as the reference value in step ST3.

  Here, the generated binarized rotation unevenness array waveform is the same as the binarized reference unevenness array waveform shown in FIG. 4 when no rim deviation occurs. On the other hand, if a rim shift occurs, the vertical axis represents the binarized unevenness detection sensor output value (0 and 1), and the horizontal axis represents the rim rotation position from the reference rim rotation position of the rim R, that is, the rotation angle. The waveform is as shown in FIG. The binarized rotation unevenness array waveform generated after the rim shift has occurred is a shift of the rim rotation position of the binarized reference unevenness array waveform. Specifically, for example, in the binarized rotation unevenness array waveform shown in FIG. 6, the unevenness detection sensor output value S corresponding to the reference rim rotation position 0 of the binarized reference unevenness array waveform shown in FIG. Is an unevenness detection sensor output value S ′ corresponding to. That is, the binarized rotation unevenness waveform generated after the rim shift occurs is the one in which the rim rotation position of the binarization reference unevenness array waveform is shifted by 30 degrees.

  Next, the rim deviation determination unit 48 determines whether or not there is a rim deviation with respect to the rim R of the measurement target tire T (step ST7). Here, first, the rim deviation determination unit 48 determines whether or not there is a rim deviation based on the binarization reference unevenness array waveform and the binarized rotation unevenness array waveform binarized by the binarization processing unit 47. judge. Specifically, the rim deviation determination unit 48 performs a logical operation of the binarized reference unevenness array waveform and the binarized rotation unevenness array waveform, and in the embodiment, performs an exclusive OR for each rim rotation position. It is determined whether or not the integrated value of the values is 0.

  Here, when the rim deviation does not occur, as described above, the generated binarized rotation unevenness array waveform is the same as the binarized reference unevenness array waveform. Therefore, the exclusive OR at each rim rotation position is calculated as 0 as shown in FIG. As a result, the rim deviation measuring apparatus 1 determines that the rim deviation determining unit 48 has not caused a rim deviation with respect to the rim R of the measurement target tire T (No in step ST7). On the other hand, when a rim shift occurs, as described above, the generated binarized rotation uneven pattern waveform is a shift of the rim rotation position of the binarized reference uneven pattern waveform. Therefore, the exclusive OR at each rim rotation position is calculated as either 0 or 1 as shown in FIG. Thereby, the rim deviation measuring device 1 determines that the rim deviation determination unit 48 has a rim deviation with respect to the rim R of the measurement target tire T (Yes in step ST7), and measures the rim deviation of the measurement target tire T. Can do. As described above, the rim deviation determination unit 48 is a value calculated by exclusive OR in the embodiment based on the binarized reference irregularity array waveform and the binarized rotation unevenness array waveform. The rim deviation can be measured based on the integrated value. Therefore, it is possible to measure the rim displacement with higher accuracy than when measuring the rim displacement based on the reference unevenness array waveform and the rotational unevenness array waveform including noise.

  Next, as shown in FIG. 2, when the rim deviation determination unit 48 determines that there is a rim deviation with respect to the rim R of the measurement target tire T (Yes in step ST7), the rim deviation amount addition binarization reference unevenness array waveform. Is generated (step ST8). Here, the rim deviation determination unit 48 generates a rim deviation amount addition binarization reference unevenness array waveform obtained by adding the rim deviation amount θ to the binarization reference unevenness array waveform generated by the binarization processing unit 47. That is, the rim shift amount addition binarization reference unevenness array waveform generated by the rim shift determination unit 48 is obtained by shifting the rim rotation position by the rim shift amount θ by the binarization reference unevenness array waveform.

  Next, the rim deviation determination unit 48 determines whether or not the binarized rotation unevenness waveform determined to be a rim deviation matches the rim deviation amount addition binarization reference unevenness array waveform (step ST9). Here, the rim deviation determination unit 48 performs an exclusive operation for each of the rim rotation positions in the logical operation of the binarized rotation unevenness waveform determined as the rim deviation and the rim deviation amount addition binarization reference unevenness array waveform. A logical OR is performed to determine whether the integrated value of the calculated values is at least 50, preferably 0.

  Here, when the rim deviation amount addition binarization reference unevenness array waveform is generated, the rim deviation amount θ added to the binarization reference unevenness array waveform is the same as the rim deviation amount of the implementation of the measurement target tire T As shown in FIG. 9, the generated rim deviation amount addition binarization reference unevenness array waveform is the same as the binarized rotation unevenness array waveform shown in FIG. Therefore, since the exclusive OR at each rim rotation position is calculated as 0, the integrated value becomes 0 as indicated by T in FIG. As a result, the rim deviation determination unit 48 determines that the binarized rotational uneven pattern waveform determined as the rim shift matches the rim shift amount addition binarized reference uneven pattern waveform (Yes in step ST9). On the other hand, when generating the rim deviation amount addition binarization reference unevenness array waveform, the rim deviation amount θ added to the binarization reference unevenness array waveform is different from the rim deviation amount of the implementation of the measurement target tire T. The rim deviation amount addition binarization reference unevenness array waveform is not the same as the binarized rotation unevenness array waveform shown in FIG. Therefore, since the exclusive OR at each rim rotation position is calculated as either 0 or 1, the integrated value exceeds 0 (the part excluding T in FIG. 10). Thereby, the rim deviation determination unit 48 determines that the binarized rotation unevenness waveform determined as the rim deviation does not match the rim deviation amount addition binarization reference unevenness array waveform (No in step ST9). .

  Next, when the rim deviation determination unit 48 determines that the binarized rotation unevenness waveform determined as rim deviation matches the rim deviation amount addition binarization reference unevenness array waveform (Yes in step ST9), the rim deviation is determined. When generating the quantity-added binarized reference uneven pattern waveform, the rim shift amount θ added to the binarized reference uneven pattern waveform is determined as the rim shift amount (step ST10). As a result, the rim deviation amount when the rim deviation occurs can be measured based on the binarized rotation irregularity array waveform determined to be the rim deviation and the rim deviation amount addition binarization reference irregularity array waveform. Therefore, it is possible to accurately measure a change in the amount of rim displacement during rim displacement measurement.

  Further, when the rim deviation determination unit 48 determines that the binarized rotation uneven pattern waveform determined to be the rim shift does not match the rim shift amount addition binarization reference uneven pattern waveform (No in step ST9), the rim shift determination unit 48 again performs the rim shift. A deviation amount addition binarization reference unevenness array waveform is generated (step ST8), and the binarized rotation unevenness array waveform determined to be a rim deviation coincides with the regenerated rim deviation amount addition reference unevenness array waveform. It is determined whether or not to perform (step ST9). Here, when the rim deviation amount addition binarization reference unevenness array waveform is generated again, the rim deviation amount θ to be added is increased. For example, the rim deviation amount θ is increased from 0 degrees by 1 degree each time a rim deviation amount addition binarization reference unevenness array waveform is generated.

  Next, it is determined whether or not the rim displacement measurement by the rim displacement measuring apparatus 1 has been completed (step ST11). If it is determined that the rim displacement measurement is being performed by the rim displacement measurement apparatus 1 (No in step ST11), the concavo-convex array waveform generation unit 46 generates the rotation concavo-convex array waveform again (step ST5), and the binarization processing unit 47. To generate a binarized rotation unevenness array waveform (step ST6), and determine whether or not there is a rim shift based on the binarized reference unevenness array waveform and binarized rotation unevenness array waveform generated again (step ST7). ). In other words, in the rim deviation measuring apparatus 1, if the rim deviation is being measured, the rotation unevenness waveform is repeatedly generated, and the rim deviation is measured and the rim deviation amount is determined. Even when the rim deviation determination unit 48 determines that there is no rim deviation with respect to the rim R of the measurement target tire T (No in step ST7), it is determined whether or not the rim deviation measurement by the rim deviation measurement device 1 is completed. (Step ST11).

  Next, when it is determined that the rim deviation measurement by the rim deviation measurement apparatus 1 is completed (Yes in step ST11), the rim deviation measurement method of the rim deviation measurement apparatus 1 according to the embodiment is terminated.

  As described above, since the land groove array TD3 which is the uneven arrangement is irregular, if the rim deviation occurs, the rotation uneven arrangement waveform generated after the occurrence of the rim deviation and the reference uneven arrangement waveform do not coincide with each other. The deviation determination unit 48 can determine the rim deviation of the measurement target tire T. Here, the rotation unevenness waveform is repeatedly generated when the measurement target tire rotates. Accordingly, it is possible to continuously measure the rim deviation when the measurement target tire T rotates. Further, the rim deviation measuring device 1 can measure the rim deviation of the measurement target tire T as long as the uneven surface is formed on the surface of the measurement target tire T, and therefore, a dedicated component is added to the measurement target tire T. Rim deviation can be measured without doing so. Therefore, as long as the measurement target tire T is provided with a concavo-convex arrangement, the rim shift can be measured for any measurement target tire T. Therefore, versatility can be enhanced. The rim deviation measuring device 1 can measure the rim deviation without contacting the measurement target tire T. Moreover, since the measurement object tire used in the actual market can be used as the measurement object tire T capable of measuring the rim deviation by the rim deviation measurement device 1, the reliability of the measured rim deviation is high.

  In the above embodiment, a laser displacement sensor is used as the unevenness detection sensor 2 which is an unevenness detection means, but the present invention is not limited to this. The unevenness detecting means only needs to be able to detect the unevenness of the land groove array TD3 which is an unevenness array. For example, a camera is used as the unevenness detection sensor 2, and the unevenness is detected based on an image captured by the camera. May be.

  In the above embodiment, the land groove array TD3 on the tread surface is used as the uneven structure, but the present invention is not limited to this. The uneven arrangement may be formed on the tire surface of the measurement target tire T irregularly and continuously in the tire circumferential direction, and may be formed, for example, on a sidewall portion (not shown).

  In the above embodiment, the determination of the rim shift and the determination of the rim shift amount are performed using the integrated value of the exclusive OR, but the present invention is not limited to this, and the correlation function may be used. good. In the above embodiment, exclusive OR is used as the logical operation, but the present invention is not limited to this, and logical OR or logical product may be used.

  In the above embodiment, the rim deviation is measured based on the reference unevenness array waveform and the rotational unevenness array waveform generated based only on the land groove array TD3 as the unevenness array, but the present invention is not limited to this. Absent. For example, the reference concavo-convex array waveform and the rotational concavo-convex array waveform may be generated by the concavo-convex array waveform generation unit 46 for each of the plurality of concavo-convex arrays, for example, for each of the trench arrays TD1 to TD3. In this case, a binarized reference unevenness array waveform and a binarized rotation unevenness array waveform based on the reference unevenness array waveform and the rotational unevenness array waveform generated by the binarization processing unit 47 are generated, and the rim deviation determination unit 48 is generated. The logical operation of the binarized reference uneven array waveform and the binarized rotating uneven array waveform is performed for each land groove array TD1 to TD3, and the calculated values for each land groove array TD1 to TD3, or the land groove arrays TD1 to TD3. The rim deviation may be measured based on the average value of each value. As a result, even when there is an influence of noise such as vehicle vibration when the vehicle 100 is traveling, the accuracy of measurement of the rim deviation can be improved. In addition, a rim shift amount addition binarized reference uneven pattern waveform is generated by the rim shift determination unit 48 for each of the trench arrays TD1 to TD3, and the binarized rotation uneven pattern waveform determined as the rim shift by the rim shift determination unit 48. And the rim deviation amount addition binarization reference unevenness array waveform logical operation is performed for each of the land groove arrays TD1 to TD3, and the land groove arrays TD1 to TD3 determined based on the calculated values of the land groove arrays TD1 to TD3. The average value of the rim shift amounts may be used as the rim shift amount.

  As described above, the rim deviation measuring apparatus and the rim deviation measuring method according to the present invention are useful for the rim deviation measuring apparatus and the rim deviation measuring method for measuring the rim deviation of the measurement target tire assembled to the rim mounted on the vehicle. In particular, it is highly versatile and suitable for continuously measuring the rim deviation during rotation of the measurement target tire.

It is a figure which shows the structural example of the rim deviation | shift measuring apparatus concerning embodiment. It is an operation | movement flowchart of the rim deviation | shift measuring apparatus concerning embodiment. It is a figure which shows the produced | generated reference | standard land groove array waveform. It is a figure which shows the binarized binarization reference land groove array waveform. It is a figure which shows the produced | generated rotation land groove array waveform (after rim shift | offset | difference generation | occurrence | production). It is a figure which shows the binarized binarization rotation land groove arrangement | sequence waveform (after rim deviation | shift occurrence). It is a figure which shows the relationship (before rim deviation | occurrence | production occurrence) between the calculated exclusive OR and a rim rotation position. It is a figure which shows the relationship (after rim shift | offset | difference) between the calculated exclusive OR and a rim rotation position. It is a figure which shows the produced | generated rim deviation | shift amount addition binarization reference | standard land groove array waveform. It is a figure which shows the relationship between an exclusive OR integrated value and a rim deviation | shift amount.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Rim deviation measuring device 2 Concavity and convexity detection sensor (Concavity and convexity detection means)
3 Rotation position sensor (Rim rotation position detection means)
4 control device 41 input / output unit 42 processing unit 43 storage unit 44 unevenness acquisition unit 45 rim rotation position acquisition unit 46 unevenness waveform generation unit (unevenness array waveform generation means)
47 Binarization processing unit (binarization processing means)
48 Rim deviation determination unit (rim deviation determination means)
DESCRIPTION OF SYMBOLS 5 Input / output device 51 Input device 52 Output device 100 Vehicle 101 Axle 102 Engine 103 Brake device T Tire to be measured R Rim TD1 to TD3 Trench arrangement (unevenness arrangement)
TG Groove TL Land

Claims (6)

In the rim deviation measuring device for measuring the rim deviation of the measurement target tire formed on the tire surface with the irregular array formed irregularly and continuously in the tire circumferential direction with respect to the rim on which the measurement target tire is assembled,
Concavity and convexity detection means that is arranged opposite to the concave and convex arrangement during rotation of the measurement target tire and detects irregularities in the concave and convex arrangement,
Rim rotation position detection means for detecting a reference rim rotation position of the rim;
A concavo-convex array waveform generating means for generating a concavo-convex array waveform based on the concavo-convex detected for one rotation of the measurement target tire from the detected reference rim rotation position;
Rim deviation is determined based on a reference irregularity array waveform generated during rotation of the measurement target tire before the rim deviation measurement and a rotation irregularity arrangement waveform repeatedly generated during rotation of the measurement target tire during measurement of the rim deviation. Rim deviation determination means;
A rim deviation measuring device comprising:   The rim deviation measuring device according to claim 1, wherein the uneven arrangement is a land groove array including land portions and groove portions formed in a tire circumferential direction on a tread surface of the measurement target tire.   The rim deviation measuring device according to claim 1, further comprising: binarization processing means for binarizing the generated reference unevenness array waveform and rotation unevenness array waveform.   The rim deviation determination means performs a logical operation on the binarized binarized reference uneven array waveform and binarized rotation uneven array waveform, and based on an integrated value or a correlation function of the calculated values. The rim deviation measuring device according to claim 3, wherein the rim deviation measuring device is determined.   The rim deviation determination means includes a binarized rotation unevenness waveform determined as the rim deviation and a rim deviation amount addition binarization reference unevenness array waveform obtained by adding a rim deviation amount to the binarized reference unevenness array waveform. 5. The rim shift amount in the binarized reference uneven array waveform that is the same as the binarized rotation uneven array waveform determined to be the rim shift is calculated and determined as the rim shift amount. Rim displacement measuring device. In the rim deviation measuring method for measuring the rim deviation of the measurement target tire formed by irregularly and continuously forming in the tire circumferential direction on the tire surface with respect to the rim on which the measurement target tire is assembled,
Before the rim deviation measurement, a procedure for generating a reference concavo-convex array waveform based on the concavo-convex in the concavo-convex array for one rotation of the measurement target tire from the reference rim rotation position of the rim;
During the rim deviation measurement, a procedure for repeatedly generating a rotational unevenness waveform based on the unevenness in the unevenness array for one rotation of the measurement target tire from the reference rim rotation position of the rim;
A procedure for determining rim deviation based on the reference unevenness array waveform and the rotational unevenness array waveform;
A rim deviation measuring method comprising:

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