JP2008275387A5 - - Google Patents
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- JP2008275387A5 JP2008275387A5 JP2007117477A JP2007117477A JP2008275387A5 JP 2008275387 A5 JP2008275387 A5 JP 2008275387A5 JP 2007117477 A JP2007117477 A JP 2007117477A JP 2007117477 A JP2007117477 A JP 2007117477A JP 2008275387 A5 JP2008275387 A5 JP 2008275387A5
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007117477A JP4908303B2 (en) | 2007-04-26 | 2007-04-26 | X-ray single crystal orientation measuring apparatus and measuring method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007117477A JP4908303B2 (en) | 2007-04-26 | 2007-04-26 | X-ray single crystal orientation measuring apparatus and measuring method thereof |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008275387A JP2008275387A (en) | 2008-11-13 |
JP2008275387A5 true JP2008275387A5 (en) | 2009-06-04 |
JP4908303B2 JP4908303B2 (en) | 2012-04-04 |
Family
ID=40053521
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007117477A Active JP4908303B2 (en) | 2007-04-26 | 2007-04-26 | X-ray single crystal orientation measuring apparatus and measuring method thereof |
Country Status (1)
Country | Link |
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JP (1) | JP4908303B2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5464665B2 (en) * | 2010-09-29 | 2014-04-09 | 株式会社リガク | X-ray crystal orientation measuring apparatus and X-ray crystal orientation measuring method |
EP3128317B1 (en) * | 2015-08-07 | 2022-01-05 | Xnovo Technology ApS | X-ray multigrain crystallography |
CN106124542B (en) * | 2016-07-22 | 2019-03-01 | 东北大学 | The method for carrying out crystal non-destructive testing using Multifunctional X-ray direction finder |
JP7050273B2 (en) * | 2017-08-22 | 2022-04-08 | 国立大学法人金沢大学 | Diffractive ring measuring device |
CN114184629B (en) * | 2021-10-09 | 2024-04-09 | 中国航发北京航空材料研究院 | Orientation distribution function-based single crystal material pole figure pole point calibration method |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2107560A (en) * | 1981-10-07 | 1983-04-27 | Rolls Royce | A method for determining the orientation of a crystal |
JPH01240842A (en) * | 1988-03-23 | 1989-09-26 | Hikari Gijutsu Kenkyu Kaihatsu Kk | Detector for diffracted corpuscular beam |
JPH02145948A (en) * | 1988-11-28 | 1990-06-05 | Kawasaki Steel Corp | Measurement of texture by energy scattering |
JPH05312736A (en) * | 1992-05-13 | 1993-11-22 | Rigaku Corp | Apparatus and method of x-ray measurement of single crystal orientation |
JP3678730B2 (en) * | 2003-02-26 | 2005-08-03 | 株式会社日鉄エレックス | X-ray foreign matter inspection method and apparatus |
JP4226973B2 (en) * | 2003-08-21 | 2009-02-18 | 株式会社リガク | X-ray crystal orientation measuring apparatus with crystal sample holding device |
JP3904543B2 (en) * | 2003-10-14 | 2007-04-11 | 株式会社リガク | X-ray crystal orientation measuring apparatus and X-ray crystal orientation measuring method |
JP3759524B2 (en) * | 2003-10-17 | 2006-03-29 | 株式会社リガク | X-ray analyzer |
JP3919756B2 (en) * | 2004-02-27 | 2007-05-30 | 株式会社リガク | X-ray crystal orientation measuring device, crystal sample holding device using the same, and crystal orientation cutting method used therefor |
JP4563701B2 (en) * | 2004-03-17 | 2010-10-13 | 株式会社リガク | X-ray crystal orientation measuring apparatus and X-ray crystal orientation measuring method |
JP4685877B2 (en) * | 2005-11-02 | 2011-05-18 | 株式会社リガク | Method and apparatus for measuring orientation distribution of microcrystalline grains |
-
2007
- 2007-04-26 JP JP2007117477A patent/JP4908303B2/en active Active
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