JP2008275387A5 - - Google Patents

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JP2008275387A5
JP2008275387A5 JP2007117477A JP2007117477A JP2008275387A5 JP 2008275387 A5 JP2008275387 A5 JP 2008275387A5 JP 2007117477 A JP2007117477 A JP 2007117477A JP 2007117477 A JP2007117477 A JP 2007117477A JP 2008275387 A5 JP2008275387 A5 JP 2008275387A5
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JP
Japan
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JP2007117477A
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Japanese (ja)
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JP4908303B2 (en
JP2008275387A (en
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JP2007117477A 2007-04-26 2007-04-26 X-ray single crystal orientation measuring apparatus and measuring method thereof Active JP4908303B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007117477A JP4908303B2 (en) 2007-04-26 2007-04-26 X-ray single crystal orientation measuring apparatus and measuring method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007117477A JP4908303B2 (en) 2007-04-26 2007-04-26 X-ray single crystal orientation measuring apparatus and measuring method thereof

Publications (3)

Publication Number Publication Date
JP2008275387A JP2008275387A (en) 2008-11-13
JP2008275387A5 true JP2008275387A5 (en) 2009-06-04
JP4908303B2 JP4908303B2 (en) 2012-04-04

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JP2007117477A Active JP4908303B2 (en) 2007-04-26 2007-04-26 X-ray single crystal orientation measuring apparatus and measuring method thereof

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JP (1) JP4908303B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5464665B2 (en) * 2010-09-29 2014-04-09 株式会社リガク X-ray crystal orientation measuring apparatus and X-ray crystal orientation measuring method
EP3128317B1 (en) * 2015-08-07 2022-01-05 Xnovo Technology ApS X-ray multigrain crystallography
CN106124542B (en) * 2016-07-22 2019-03-01 东北大学 The method for carrying out crystal non-destructive testing using Multifunctional X-ray direction finder
JP7050273B2 (en) * 2017-08-22 2022-04-08 国立大学法人金沢大学 Diffractive ring measuring device
CN114184629B (en) * 2021-10-09 2024-04-09 中国航发北京航空材料研究院 Orientation distribution function-based single crystal material pole figure pole point calibration method

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2107560A (en) * 1981-10-07 1983-04-27 Rolls Royce A method for determining the orientation of a crystal
JPH01240842A (en) * 1988-03-23 1989-09-26 Hikari Gijutsu Kenkyu Kaihatsu Kk Detector for diffracted corpuscular beam
JPH02145948A (en) * 1988-11-28 1990-06-05 Kawasaki Steel Corp Measurement of texture by energy scattering
JPH05312736A (en) * 1992-05-13 1993-11-22 Rigaku Corp Apparatus and method of x-ray measurement of single crystal orientation
JP3678730B2 (en) * 2003-02-26 2005-08-03 株式会社日鉄エレックス X-ray foreign matter inspection method and apparatus
JP4226973B2 (en) * 2003-08-21 2009-02-18 株式会社リガク X-ray crystal orientation measuring apparatus with crystal sample holding device
JP3904543B2 (en) * 2003-10-14 2007-04-11 株式会社リガク X-ray crystal orientation measuring apparatus and X-ray crystal orientation measuring method
JP3759524B2 (en) * 2003-10-17 2006-03-29 株式会社リガク X-ray analyzer
JP3919756B2 (en) * 2004-02-27 2007-05-30 株式会社リガク X-ray crystal orientation measuring device, crystal sample holding device using the same, and crystal orientation cutting method used therefor
JP4563701B2 (en) * 2004-03-17 2010-10-13 株式会社リガク X-ray crystal orientation measuring apparatus and X-ray crystal orientation measuring method
JP4685877B2 (en) * 2005-11-02 2011-05-18 株式会社リガク Method and apparatus for measuring orientation distribution of microcrystalline grains

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