JP2008198974A5 - - Google Patents

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Publication number
JP2008198974A5
JP2008198974A5 JP2007226126A JP2007226126A JP2008198974A5 JP 2008198974 A5 JP2008198974 A5 JP 2008198974A5 JP 2007226126 A JP2007226126 A JP 2007226126A JP 2007226126 A JP2007226126 A JP 2007226126A JP 2008198974 A5 JP2008198974 A5 JP 2008198974A5
Authority
JP
Japan
Prior art keywords
gas
processing
shearer
nanobubbles
supply unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007226126A
Other languages
Japanese (ja)
Other versions
JP2008198974A (en
JP5252861B2 (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2007226126A priority Critical patent/JP5252861B2/en
Priority claimed from JP2007226126A external-priority patent/JP5252861B2/en
Priority to CN2008800019551A priority patent/CN101578688B/en
Priority to TW97101146A priority patent/TWI415694B/en
Priority to PCT/JP2008/050264 priority patent/WO2008087903A1/en
Publication of JP2008198974A publication Critical patent/JP2008198974A/en
Publication of JP2008198974A5 publication Critical patent/JP2008198974A5/ja
Application granted granted Critical
Publication of JP5252861B2 publication Critical patent/JP5252861B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Claims (1)

基板を処理液によって処理する処理装置であって、
ナノバブルを発生させ、そのナノバブルを上記処理液に混合させるナノバブル発生手段
を備え、
上記ナノバブル発生手段は、
内部に剪断室が形成された気体剪断器と、
上記気体剪断器の軸方向の一端部に設けられ上記気体を上記剪断室に旋回させて供給する気体供給部と、
上記気体剪断器の一端部の外周面に設けられ上記処理液を上記剪断室に旋回させて供給し、上記気体との旋回速度の差によって上記気体から上記ナノバブルを発生させる液体供給部と
によって構成されていることを特徴とする基板の処理装置。
A processing apparatus for processing a substrate with a processing liquid,
A nanobubble generating means for generating nanobubbles and mixing the nanobubbles with the processing solution;
The nanobubble generating means is:
A gas shearer having a shear chamber formed therein;
A gas supply unit provided at one end of the gas shearer in the axial direction to supply the gas by swirling the gas into the shear chamber;
A liquid supply unit that is provided on the outer peripheral surface of one end of the gas shearer and that rotates and supplies the processing liquid to the shearing chamber and generates the nanobubbles from the gas due to a difference in swirling speed with the gas. A substrate processing apparatus.
JP2007226126A 2007-01-15 2007-08-31 Substrate processing equipment Active JP5252861B2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2007226126A JP5252861B2 (en) 2007-01-15 2007-08-31 Substrate processing equipment
CN2008800019551A CN101578688B (en) 2007-01-15 2008-01-11 Apparatus and method for processing substrate
TW97101146A TWI415694B (en) 2007-01-15 2008-01-11 Substrate processing device and processing method thereof
PCT/JP2008/050264 WO2008087903A1 (en) 2007-01-15 2008-01-11 Apparatus and method for processing substrate

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007006061 2007-01-15
JP2007006061 2007-01-15
JP2007226126A JP5252861B2 (en) 2007-01-15 2007-08-31 Substrate processing equipment

Publications (3)

Publication Number Publication Date
JP2008198974A JP2008198974A (en) 2008-08-28
JP2008198974A5 true JP2008198974A5 (en) 2010-10-14
JP5252861B2 JP5252861B2 (en) 2013-07-31

Family

ID=39757617

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007226126A Active JP5252861B2 (en) 2007-01-15 2007-08-31 Substrate processing equipment

Country Status (3)

Country Link
JP (1) JP5252861B2 (en)
CN (1) CN101578688B (en)
TW (1) TWI415694B (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010153475A (en) * 2008-12-24 2010-07-08 Sokudo Co Ltd Substrate treatment apparatus and substrate treatment method
JP5666086B2 (en) 2008-12-25 2015-02-12 ジルトロニック アクチエンゲゼルシャフトSiltronic AG Silicon wafer cleaning equipment
JP2010221069A (en) * 2009-03-19 2010-10-07 Kanto Auto Works Ltd Washing method of coating machine and coating apparatus
JP5656245B2 (en) * 2010-06-17 2015-01-21 芝浦メカトロニクス株式会社 Cleaning method and cleaning device
JP2012170872A (en) * 2011-02-21 2012-09-10 Shibaura Mechatronics Corp Substrate cleaning apparatus, substrate cleaning method and apparatus and method for manufacturing display
JP2013191779A (en) * 2012-03-14 2013-09-26 Toshiba Corp Processor and processing method
CN104898324B (en) * 2014-03-07 2017-11-17 芝浦机械电子株式会社 Connect liquid processing device, connect liquid processing method, substrate board treatment and substrate processing method using same
KR101519630B1 (en) * 2014-03-31 2015-05-14 (주) 에스엠씨 An etching system
TWI648098B (en) * 2017-11-14 2019-01-21 亞智科技股份有限公司 Gas-liquid mixing apparauts, process equipment and gas-liquid mixing method
CN107952741A (en) * 2017-11-30 2018-04-24 江苏维仪工业科技有限公司 A kind of application method of micro-nano generator in plating is washed
JPWO2019156180A1 (en) * 2018-02-09 2021-04-30 国立大学法人 東京大学 Dissolution system for poorly water-soluble organic compounds, dissolution method for poorly water-soluble organic compounds, and odor detection system
CN110153057A (en) * 2018-02-14 2019-08-23 特铨股份有限公司 Substrate cleaning apparatus and substrate-cleaning method
CN110045522A (en) * 2019-03-22 2019-07-23 湖南飞优特电子科技有限公司 A kind of undesirable control device of LCD processing procedure PI dust stain
CN110473773B (en) * 2019-08-22 2022-03-22 北京北方华创微电子装备有限公司 Wafer cleaning method and wafer cleaning equipment
JP7265467B2 (en) * 2019-12-17 2023-04-26 株式会社荏原製作所 Resist removal system and resist removal method
JP7265466B2 (en) * 2019-12-17 2023-04-26 株式会社荏原製作所 Resist removal system and resist removal method
KR102303107B1 (en) * 2020-03-31 2021-09-16 주식회사 디엠에스 Apparatus for melting of carbon dioxide gas and apparatus for treating substrate comprising the same
KR20230043947A (en) * 2020-10-23 2023-03-31 가부시키가이샤 사무코 Cleaning method of piping of single-wafer type wafer cleaning equipment

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6382601B1 (en) * 1997-12-30 2002-05-07 Hirofumi Ohnari Swirling fine-bubble generator
JP3397154B2 (en) * 1997-12-30 2003-04-14 博文 大成 Revolving microbubble generator
JP2001269631A (en) * 2000-03-27 2001-10-02 Dainippon Screen Mfg Co Ltd Substrate cleaning device
JP2004121962A (en) * 2002-10-01 2004-04-22 National Institute Of Advanced Industrial & Technology Method and apparatus for using nanometer-bubble
JP2006147617A (en) * 2004-11-16 2006-06-08 Dainippon Screen Mfg Co Ltd Substrate processor and particle removing method
JP2006179765A (en) * 2004-12-24 2006-07-06 Dainippon Screen Mfg Co Ltd Substrate processing apparatus and particle removing method
US7392814B2 (en) * 2004-12-24 2008-07-01 Dainippon Screen Mfg. Co., Ltd. Substrate processing apparatus and method

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