JP2008170407A - Scale reading system - Google Patents

Scale reading system Download PDF

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JP2008170407A
JP2008170407A JP2007029805A JP2007029805A JP2008170407A JP 2008170407 A JP2008170407 A JP 2008170407A JP 2007029805 A JP2007029805 A JP 2007029805A JP 2007029805 A JP2007029805 A JP 2007029805A JP 2008170407 A JP2008170407 A JP 2008170407A
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scale
vernier
main
reading
main scale
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Takashi Soma
嵩 相馬
Toru Yoshida
徹 吉田
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Abstract

<P>PROBLEM TO BE SOLVED: To remove a parallax when reading both scales, in calipers or the like using a scale reading method using overlapping of a main scale and a vernier scale. <P>SOLUTION: The present invention discloses constitution for removing the parallax when reading the scales, in a scale reading system of detection-reading the other scale positioned in the center of a scale clearance in one side of the respective scales by overlapping the main scale and the vernier scale. The problem to be solved is solved by contact-sliding a vernier scale plate with the vernier scale engraved as a slit, with respect to a main scale face. The parallax when reading the both scales is removed to allow precise, quick and sure reading. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明はバーニヤ式ノギスなどに用いられる副尺を用いた目盛読取方式の読取精度を高めた方式に関わる。詳しくは、従来のバーニヤ式ノギスなどは、主尺目盛と副尺目盛を対向させ、その一致位置を読取る方式である。これに対し本発明は、目盛幅と目盛間隙幅をほぼ等しくして、主尺目盛と副尺目盛の重ね合わせにより生じるモアレ縞を利用した目盛読取方式の改良に関する。  The present invention relates to a method in which the reading accuracy of a scale reading method using a vernier used in a vernier caliper is increased. Specifically, a conventional vernier caliper or the like is a method in which the main scale and the sub-scale are made to face each other and the coincidence position is read. On the other hand, the present invention relates to an improvement of a scale reading method using a moire fringe generated by superimposing a main scale and a sub scale, with the scale width and the scale gap width being substantially equal.

従来、半導体素子の製造プロセスにおいて、リソグラフィーによって基板上に形成される合成パターンの重ね合わせずれ量を検出する方法として、基板上に形成した主尺パターンと副尺パターンの重ね合わせによって形成されるモアレ縞の粗密から、重ね合わせずれ量を検出する方法が知られている(特許文献1)。本発明は、この周知の方法をノギスなどに適用するための構成に関わる。  2. Description of the Related Art Conventionally, in a semiconductor device manufacturing process, as a method for detecting an overlay deviation amount of a composite pattern formed on a substrate by lithography, a moire formed by superimposing a main scale pattern and a vernier pattern formed on the substrate. A method for detecting the amount of misalignment from the density of stripes is known (Patent Document 1). The present invention relates to a configuration for applying this known method to calipers and the like.

このモアレ縞を利用する方法においては、主尺目盛と副尺目盛の一致位置が、主尺目盛間隙の中心位置にある副尺目盛の位置となる。また、その目盛はモアレ縞の最も密な部分に位置する。更に、副尺目盛間隙の中心位置にある主尺目盛を検出読取ることで、最小読取値が通常の場合に比べて半減出来ることが知られている(特許文献1)。  In the method using the moire fringes, the coincidence position between the main scale and the minor scale is the position of the minor scale at the center position of the main scale gap. The scale is located at the densest part of the moire fringes. Furthermore, it is known that the minimum read value can be halved compared to a normal case by detecting and reading the main scale at the center position of the vernier scale gap (Patent Document 1).

副尺を用いた目盛読取方法においては、nを2以上の整数として、(n−1)主尺単位の長さをn等分した副尺を用いることにより、最小読取値が主尺単位の1/nの読取系が実現出来る。nの値をそのままにして最小読取値が半減出来れば、短い副尺で高い精度の読取が可能となる。この副尺を用いる目盛読取方法により高い精度の読取が可能となるのは、主尺目盛と副尺目盛の一致位置の移動が、モアレの原理により副尺自身の移動のn倍に拡大されることに由来していることを指摘したい。  In the scale reading method using a vernier, the minimum reading value is the main metric unit by using a vernier obtained by dividing n by the length of (n-1) main metric unit, where n is an integer of 2 or more. A 1 / n reading system can be realized. If the minimum reading value can be halved while keeping the value of n as it is, reading with high accuracy can be performed with a short vernier scale. The scale reading method using the vernier scale enables high-precision reading because the movement of the coincidence position between the main scale and the vernier scale is expanded to n times the movement of the vernier itself by the moire principle. I would like to point out that it is derived from this.

また、主尺目盛と副尺目盛の一致位置を検出する際の識別感度を高めることにより、誤読の確率を下げ確実な読取が可能となる。識別感度が高ければ読取作業時の照明が十分得られなくても確実な読取が可能である。そして、使用目的にもよるが、明視距離以上の離れた位置からでも確実な読取が可能となる。更に、主尺目盛と副尺目盛の一致位置検出の際に、一致位置の絞り込みが容易であれば、読取の迅速化が可能となる。
特許出願公開番号 特開平7−120221
Further, by increasing the identification sensitivity when detecting the coincidence position between the main scale and the minor scale, it is possible to reduce the probability of misreading and perform reliable reading. If the identification sensitivity is high, reliable reading is possible even if sufficient illumination is not obtained during reading operation. Depending on the purpose of use, reliable reading is possible even from a position away from the clear vision distance. Furthermore, when detecting the coincidence position between the main scale and the sub-scale, if the coincidence position can be easily narrowed down, reading can be speeded up.
Patent application publication number JP-A-7-120221

本発明は、上記の特徴をもつ副尺を用いた目盛読取方法を、ノギスなどに適用する際の課題を解決する。高い読取精度をもつノギスなどを実現するためには、製品に高い加工精度と、高い安定性が要求される。更に、上記読取方法を適用する場合、主尺および副尺目盛を重ね合わせる際に生じる視差が直接精度に影響を与えるため、それを取除くことが重要な課題となる。ここでは主尺目盛面と副尺目盛面を接触摺動させる副尺方式を提供する。  The present invention solves a problem in applying a scale reading method using a vernier having the above-described features to calipers and the like. In order to realize a caliper with high reading accuracy, the product is required to have high processing accuracy and high stability. Furthermore, when the above reading method is applied, the parallax generated when the main scale and the vernier scale are superimposed directly affects the accuracy, so that it is an important issue to remove them. Here, a vernier method is provided in which the main scale surface and the vernier scale surface are slid in contact with each other.

図1および図2は本発明に適用する目盛読取法の原理説明図である。主尺および副尺共にその目盛幅と目盛間隙幅がほぼ等しくとってあり、目盛は黒線で示されている。図中上側に主尺が、下側に副尺がそれぞれ水平に示され、中央部でその一部が互いに重なるように配置されている。主尺目盛と副尺目盛が重なり、幅の異なる黒線による平均的な濃淡による縞模様、或いはモアレ縞が生じる様子が示されている。  1 and 2 are explanatory views of the principle of the scale reading method applied to the present invention. The scale width and the scale gap width are almost equal for both the main scale and the sub-scale, and the scale is indicated by a black line. In the drawing, the main scale is shown on the upper side, and the sub-scale is shown on the lower side, and these are arranged so that parts of them overlap each other at the center. The main scale and the sub-scale are overlapped, and it is shown that a striped pattern due to average shading or moire fringes generated by black lines having different widths.

主尺の間隙には左から0、1、2、・・・、20と20まで番号が付されているが、これは主尺の最初の部分を示している。また、副尺の21個の目盛にはやはり左から0、2、4、・・・40と偶数の番号が40まで付されている。ここで、主尺単位(主尺目盛幅と主尺目盛間隙幅を加えた長さ)の19単位が、副尺単位(副尺目盛幅と副尺目盛間隙幅を加えた長さ)の20単位に相当している。つまり最少読取値が主尺単位の20分の1となる副尺の例を示している。これを図の上で確かめてみると次のようになる。即ち、主尺間隙0の右端から主尺間隙19の右端までの距離が、副尺目盛0の左端から副尺目盛40の左端までの距離に等しくなっている。  The main scale gaps are numbered 0, 1, 2,..., 20 and 20 from the left, indicating the first part of the main scale. In addition, the 21 scales of the vernier are also numbered with 0, 2, 4,. Here, 19 units of the main scale unit (the length obtained by adding the main scale graduation width and the main scale graduation gap width) are 20 vernier units (the length obtained by adding the sub-scale graduation width and the minor scale graduation gap width). It corresponds to the unit. That is, an example of a vernier whose minimum reading value is 1/20 of the main scale unit is shown. This can be confirmed on the diagram as follows. That is, the distance from the right end of the main scale gap 0 to the right end of the main scale gap 19 is equal to the distance from the left end of the sub scale 0 to the left end of the sub scale 40.

ここで注意したいのは、主尺については主尺目盛ではなく主尺間隙に番号が付されていることである。これは主尺間隙が従来の方法における主尺目盛の役割をしていることを意味している。従って主尺目盛と副尺目盛の一致位置とは、副尺目盛の中心線と主尺間隙の中心線が一致する位置で、それは副尺目盛が相隣り合う主尺目盛の間に挟まれその中心に位置することである。つまり挟まれた副尺目盛の両側には等しい幅の隙間が出来ている。これは2つの目盛の中心に目的の目盛を合わせる目盛の挟み込み法の条件と同じで、目盛の中心位置の判定が高い感度で行える。また、両側に等しい幅の隙間が出来る副尺目盛は、この副尺目盛に限られる。更に、この一致位置を示す副尺目盛がモアレ縞濃部の中央に位置していて、その一致位置の絞込みが容易となる。従って迅速且つ確実に一致位置を読取ることが出来る。  It should be noted that the main scale is numbered not on the main scale but on the main scale gap. This means that the main scale gap serves as a main scale in the conventional method. Therefore, the coincidence position of the main scale and the minor scale is the position where the center line of the minor scale and the center line of the main scale gap coincide, and it is sandwiched between adjacent major scales. It is located in the center. In other words, gaps of equal width are formed on both sides of the sandwiched vernier scale. This is the same as the condition of the graduation method for aligning the target graduation at the center of the two graduations, and the determination of the center position of the graduations can be performed with high sensitivity. Further, the vernier scale with a gap of equal width on both sides is limited to this vernier scale. Further, the vernier scale indicating the coincidence position is located at the center of the moire fringe dark portion, and the coincidence position can be easily narrowed down. Therefore, the coincidence position can be read quickly and reliably.

この状況は図1に示される。図中、副尺目盛20が2つの主尺目盛に挟まれている。図1は、副尺目盛0が主尺目盛間隙0と1の間の目盛と一致しているように、副尺がその0位置(主尺の間隙0と副尺の目盛0が一致した位置)から主尺単位の半分右に移動した状態を示すものである。その移動距離は副尺目盛の最大値40と一致目盛の20を用いて40分の20として求めることが出来る。  This situation is shown in FIG. In the figure, a vernier scale 20 is sandwiched between two main scales. FIG. 1 shows that the vernier scale is in the 0 position (the position where the main scale gap 0 and the vernier scale 0 coincide with each other, so that the vernier scale 0 coincides with the scale between the main scale graduations 0 and 1. ) To the right half of the main scale unit. The movement distance can be obtained as 20/40 using the maximum value 40 of the vernier scale and 20 of the coincidence scale.

次に上記とは逆に、主尺目盛と副尺目盛間隙が一致する場合を考える。図2には主尺間隙10と11の間の主尺目盛が、副尺目盛20と22に挟まれた状態が示されている。これは図1の状態から更に副尺を主尺単位の40分の1右に移動させることにより実現される。図1の矢印1は主尺単位の半分1/2を、図2の矢印2は副尺単位の半分1/2−1/40をそれぞれ示し、その差1/40が図1の状態から図2の状態への移動距離となる。副尺の0位置からの移動距離は副尺目盛20と22の間の値21(図示されず)を用いて40分の21として求めることが出来る。図1の場合と同様に挟まれた目盛の両側に等しい幅の隙間が出来ること、その位置がモアレ縞濃部の中央に位置することから、上述の場合と同様に迅速且つ確実に一致位置を読取ることが出来る。このように、最小読取値が20分の1の副尺を用いて、最小読取値40分の1が実現出来る。  Next, in contrast to the above, consider a case where the main scale graduation and the minor scale graduation coincide. FIG. 2 shows a state in which the main scale between the main scale gaps 10 and 11 is sandwiched between the minor scales 20 and 22. This is realized by further moving the vernier from the state of FIG. 1 to the right of 1/40 of the main scale unit. 1 indicates half ½ of the main scale unit, and arrow 2 of FIG. 2 indicates half ½-1 / 40 of the vernier unit. The difference 1/40 is shown in FIG. It becomes the movement distance to the state of 2. The movement distance from the 0 position of the vernier can be obtained as 21/40 using a value 21 (not shown) between the vernier scales 20 and 22. As in the case of FIG. 1, a gap having the same width is formed on both sides of the sandwiched scale, and the position is located at the center of the moire fringe dark portion. Can be read. In this way, a minimum read value of 1/40 can be realized by using a vernier whose minimum read value is 1/20.

次に本発明の効果が現われるために、主尺および副尺の目盛幅と目盛間隙幅が満たさなければならない条件を求める。図3は主尺単位を矩形波で表わした説明図である。高さのある部分が目盛を、高さの無い部分が間隙を表わす。水平方向の矢印3は主尺目盛幅を、4は主尺目盛間隙幅を表わす。前者の値をaとすると、後者の値は1−aで、その合計は主尺単位の1で矢印5で示される。図4は最小読取値が1/nである副尺について、副尺単位を図3と同様に矩形波で表わした説明図である。副尺目盛幅(矢印6で示す)が主尺と同じaと仮定すると、副尺間隙幅(矢印7で示す)は(1−a)−1/nとなり、副尺単位(矢印8で示す)はそれらの合計1−1/nとなる。  Next, in order for the effect of the present invention to appear, the conditions that the scale width and the scale gap width of the main scale and the sub scale must be satisfied are obtained. FIG. 3 is an explanatory diagram showing the main scale unit as a rectangular wave. A portion having a height represents a scale, and a portion having no height represents a gap. The horizontal arrow 3 represents the major scale width, and 4 represents the major scale gap width. If the former value is a, the latter value is 1-a, and the sum is 1 in main scale units and is indicated by an arrow 5. FIG. 4 is an explanatory diagram showing a vernier unit of a vernier whose minimum reading value is 1 / n, in the same manner as FIG. Assuming that the vernier scale width (indicated by arrow 6) is the same as that of the main scale, the vernier gap width (indicated by arrow 7) is (1-a) -1 / n, which is the unit of the vernier (indicated by arrow 8). ) Is a total of 1-1 / n thereof.

挟まれた目盛の両端に間隙が出来る条件は、副尺目盛間隙の方が主尺目盛間隙より小さくなるため、主尺目盛が相隣り合う2個の副尺目盛に挟まれる場合を考えればよい。つまり、主尺目盛の幅aが、副尺間隙幅(1−a)−1/nより小さくなければならない。この条件からaの上限を与える式a<1/2−1/2nが得られる。またこの両側間隙の和を副尺間隙幅のb%以下に押えるという条件から、aの下限を与える式(1−1/n)(100−b)/(200−b)<aが得られる。上記の説明では主尺目盛幅と副尺目盛幅が等しいと仮定したが、等しくない一般の場合にも同様の結果が得られることは明らかである。  The condition for creating a gap at both ends of the sandwiched scale is that the minor scale gap is smaller than the major scale gap, so the case where the major scale is sandwiched between two adjacent minor scales may be considered. . That is, the width a of the main scale should be smaller than the vernier gap width (1-a) -1 / n. From this condition, the formula a <1 / 2-1 / 2n giving the upper limit of a is obtained. Further, from the condition that the sum of the gaps on both sides is suppressed to b% or less of the vernier gap width, an expression (1-1 / n) (100−b) / (200−b) <a that gives the lower limit of a is obtained. . In the above description, it is assumed that the major scale width and the minor scale width are equal, but it is clear that the same result can be obtained even in a general case where they are not equal.

次に、上に述べた主尺目盛と副尺目盛の重ね合わせによる目盛読取方法の原理を、ノギスなどに適用する際の構成法を考える。主尺および副尺目盛を重ね合わす方法には、主尺目盛または副尺目盛のいずれかを透明な目盛板の上に刻み、目盛面同士を重ねて透明な目盛板側から目視する方法、また半透明鏡などのビームスプリッターを用いて光学的に両目盛を重ね合わせる方法などが考えられる。ここでは、不透明な板に副尺目盛をスリット(細隙)として刻んだ副尺目盛板を、主尺目盛面に重ね合わせることにより、スリットを通して目視出来る主尺目盛と副尺目盛の重ね合わせを視差無く行う方法を考える。  Next, a configuration method for applying the principle of the scale reading method described above by superimposing the main scale and the subscale to the caliper will be considered. To superimpose the main scale and the minor scale, either the main scale or the minor scale is engraved on the transparent scale plate, and the scale surfaces are overlapped and visually observed from the transparent scale plate side. A method of optically superimposing both graduations using a beam splitter such as a translucent mirror is conceivable. Here, by overlaying the main scale scale surface on the surface of the main scale scale, the main scale scale and the sub-scale scale that can be seen through the slit are overlapped. Consider a method without parallax.

図5は本発明に基づく目盛読取方式の説明図である。9などの目盛は主尺に刻まれた主尺目盛を、10などの間隙は主尺目盛間隙をそれぞれ示す。主尺目盛間隙には0、1、2、・・・と番号が付されており、0番が原点に相当する。11は不透明な板に13などのスリットが開けられた副尺目盛板で主尺の上を左右に接触摺動する。12などのスリット間隙は副尺目盛に相当し、0、2、4、・・・と偶数の番号が付されており、0番が原点に相当する。また、13などのスリットは副尺目盛間隙に相当する。この図は主尺と副尺の原点が一致している状態を示す。副尺目盛0番が主尺目盛間隙0番の中心に挟まれている。  FIG. 5 is an explanatory diagram of the scale reading system based on the present invention. A scale such as 9 indicates a main scale scale inscribed on the main scale, and a gap such as 10 indicates a main scale scale gap. The main scale graduations are numbered 0, 1, 2,..., And number 0 corresponds to the origin. 11 is a vernier scale plate in which slits such as 13 are formed in an opaque plate, and slides in contact with the left and right on the main scale. A slit gap such as 12 corresponds to a vernier scale, and is assigned with even numbers of 0, 2, 4,..., And 0 corresponds to the origin. A slit such as 13 corresponds to a vernier scale gap. This figure shows a state where the origins of the main scale and the vernier coincide. A minor scale 0 is sandwiched between the main scales 0.

図6は図5の状態から副尺目盛板が1/2n単位右に移動した状態を示す。主尺間隙0番と1番の間の主尺目盛が副尺目盛0番と2番の副尺目盛間隙の中心に挟まれている。  FIG. 6 shows a state in which the vernier scale plate is moved to the right by 1 / 2n unit from the state of FIG. The main scale between the main scale gaps 0 and 1 is sandwiched between the center of the minor scales 0 and 2.

図7は図5の状態から副尺目盛板が2/2n単位右に移動した状態を示す。副尺目盛2番が主尺目盛間隙1番の中心に挟まれている  FIG. 7 shows a state where the vernier scale plate has moved to the right by 2 / 2n units from the state of FIG. The minor scale 2 is sandwiched between the center of the main scale 1

以上詳述したように、副尺を用いる目盛読取方法において、主尺および副尺の目盛幅と目盛間隙幅をほぼ等しくとり、両尺を重ね合わせることで一致位置を読取ることが出来る。主尺目盛と副尺目盛の一致位置は、副尺目盛が相隣り合う主尺目盛の中心に挟まれる位置となる。また、一致位置として主尺目盛が相隣り合う副尺目盛の中心に挟まれる位置を加えることにより、従来方法に比べ最小読取値を半減出来る。  As described above in detail, in the scale reading method using the vernier scale, the scale width of the main scale and the vernier scale and the scale gap width are substantially equal, and the coincidence position can be read by overlapping both scales. The coincidence position between the main scale and the minor scale is a position where the minor scale is sandwiched between the centers of the adjacent major scales. Moreover, the minimum reading value can be halved as compared with the conventional method by adding a position where the main scale is sandwiched between the centers of the adjacent minor scales as the matching position.

この際、挟まれた目盛の両側に等しい幅の間隙が出来るなど、一致位置読取の際の認識感度が高くなる。更に、この一致位置は主尺と副尺の重ね合わせにより生じるモアレ縞の濃い部分の中央に位置するため、一致位置の絞込みが容易に行える。以上のような理由により、この方式を適用したノギスなどにおいては、迅速且つ確実な目盛読取が高精度で可能となる。  At this time, the recognition sensitivity at the time of reading the coincidence position is increased, for example, a gap having an equal width is formed on both sides of the sandwiched scale. Further, since the coincidence position is located at the center of the dark portion of the moire fringes generated by the superposition of the main scale and the sub-scale, the coincidence position can be easily narrowed down. For the reasons described above, a vernier caliper to which this method is applied enables quick and reliable scale reading with high accuracy.

なお、本発明による目盛読取方式を用いたノギスにおいては、副尺目盛板を金属製にすることで堅牢な構造に出来ること、副尺目盛板とスライダーを一体構造に出来るなどの特長がある。本発明による目盛読取方式は、近年ノギスなどに広く利用いられているロングバーニヤ方式に適用出来る他、マイクロメーターなどの回転位置の読取にも適用出来るのは勿論である。  The caliper using the scale reading method according to the present invention has features such that the vernier scale plate can be made of a metal and can have a robust structure, and the vernier scale plate and the slider can be integrated. The scale reading method according to the present invention can be applied not only to the long vernier method widely used in calipers in recent years, but also to the reading of the rotational position of a micrometer or the like.

主尺と副尺目盛の重ね合わせによる目盛読取方法をノギスなどに適用することで、目盛の読取を迅速且つ確実に行うと同時に、最小読取値を従来方法に比べて半減した高精度ノギスなどが実現出来る。  By applying the scale reading method by superimposing the main scale and the sub-scale scale to calipers, etc., the scale can be read quickly and reliably, and at the same time, high-precision calipers with a minimum reading value halved compared to the conventional method. It can be realized.

スライダー窓に副尺目盛をスリットとした副尺目盛板を取り付け、副尺目盛板が主尺目盛面に接触摺動するようにして、スリットを通して目視出来る主尺目盛と副尺目盛の重なりから読取を行うノギス。  Read from the overlap of the main scale and the vernier scale that can be seen through the slit by attaching a vernier scale plate with the vernier scale as a slit to the slider window and sliding the vernier scale plate in contact with the main scale surface. Calipers to do.

主尺単位を1mmとし、49mmを50等分した副尺を用いる目盛読取方法において、主尺および副尺目盛幅が0.48mm、主尺目盛間隙幅0.52mm、副尺目盛間隙幅0.5mm、とすることにより、最小読取値100分の1のノギスが実現出来る。  In a scale reading method using a main scale unit of 1 mm and a scale which is divided into 50 equal parts of 49 mm, the main scale and the minor scale width are 0.48 mm, the main scale gap width is 0.52 mm, and the minor scale gap width is 0. By setting the thickness to 5 mm, a caliper with a minimum reading value of 1/100 can be realized.

本発明に適用する目盛読取法の原理説明図Explanatory drawing of the principle of the scale reading method applied to the present invention 本発明に適用する目盛読取法の原理説明図Explanatory drawing of the principle of the scale reading method applied to the present invention 本発明に適用する主尺目盛単位を矩形波で示す説明図Explanatory drawing which shows the main scale unit applied to the present invention as a rectangular wave 本発明に適用する副尺目盛単位を矩形波で示す説明図Explanatory drawing which shows a vernier scale unit applied to the present invention by a rectangular wave 本発明の目盛読取方式の説明図(主尺と副尺の零点が一致した場合)Explanatory drawing of the scale reading system of the present invention (when the zero point of the main and vernier coincides) 本発明の目盛読取方式の説明図(副尺が主尺に対し1/2n単位右に移動した場合)Explanatory drawing of the scale reading system of the present invention (when the vernier moves to the right of the main scale by 1 / 2n unit) 本発明の目盛読取方式の説明図(副尺が主尺に対し2/2n単位右に移動した場合)Explanatory drawing of the scale reading system of the present invention (when the vernier moves to the right by 2 / 2n units with respect to the main scale)

符号の説明Explanation of symbols

1 主尺単位の半分の幅:1/2
2 副尺単位の半分の幅:1/2−1/40
3 主尺目盛幅:a
4 主尺目盛間隙幅:1−a
5 主尺目盛単位:1
6 副尺目盛幅:a
7 副尺目盛間隙幅:(1−a)−1/n
8 副尺目盛単位:1−1/n
9 主尺目盛
10 主尺目盛間隙
11 副尺目盛板
12 副尺目盛板スリット間隙(副尺目盛に相当)
13 副尺目盛板スリット(副尺目盛間隙に相当)
1 Half width of main scale unit: 1/2
2 Half width of vernier unit: 1 / 2-1 / 40
3 Main scale width: a
4 Main scale graduation gap width: 1-a
5 Main scale unit: 1
6 Major scale width: a
7 Minor scale gap width: (1-a) -1 / n
8 Vernier scale unit: 1-1 / n
9 Main scale 10 Main scale graduation 11 Sub-scale scale 12 Sub-scale scale slit slit (equivalent to minor scale)
13 Sub-scale plate slit (equivalent to the sub-scale scale gap)

Claims (1)

主尺目盛面に対し接触摺動する副尺目盛板の目盛間隙をスリットとし、前記各目盛の一方の目盛間隙の中心位置にある他方の目盛を検出読取るようにしたことを特徴とする目盛読取方式。  Graduation reading characterized in that the graduation gap of the minor graduation plate that contacts and slides on the main graduation scale surface is a slit, and the other graduation at the center position of one graduation gap of each of the graduations is detected and read. method.
JP2007029805A 2007-01-15 2007-01-15 Scale reading system Pending JP2008170407A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102247935B1 (en) * 2019-12-13 2021-05-06 한국기계연구원 Crack measuring apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102247935B1 (en) * 2019-12-13 2021-05-06 한국기계연구원 Crack measuring apparatus

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