JP2008170400A5 - - Google Patents

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Publication number
JP2008170400A5
JP2008170400A5 JP2007006397A JP2007006397A JP2008170400A5 JP 2008170400 A5 JP2008170400 A5 JP 2008170400A5 JP 2007006397 A JP2007006397 A JP 2007006397A JP 2007006397 A JP2007006397 A JP 2007006397A JP 2008170400 A5 JP2008170400 A5 JP 2008170400A5
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JP
Japan
Prior art keywords
rotating body
vibration signal
acquiring
target
inspection
Prior art date
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Granted
Application number
JP2007006397A
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English (en)
Japanese (ja)
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JP5125107B2 (ja
JP2008170400A (ja
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Priority to JP2007006397A priority Critical patent/JP5125107B2/ja
Priority claimed from JP2007006397A external-priority patent/JP5125107B2/ja
Publication of JP2008170400A publication Critical patent/JP2008170400A/ja
Publication of JP2008170400A5 publication Critical patent/JP2008170400A5/ja
Application granted granted Critical
Publication of JP5125107B2 publication Critical patent/JP5125107B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007006397A 2007-01-15 2007-01-15 検査装置およびその制御方法、ならびに検査装置制御プログラム Expired - Fee Related JP5125107B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007006397A JP5125107B2 (ja) 2007-01-15 2007-01-15 検査装置およびその制御方法、ならびに検査装置制御プログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007006397A JP5125107B2 (ja) 2007-01-15 2007-01-15 検査装置およびその制御方法、ならびに検査装置制御プログラム

Publications (3)

Publication Number Publication Date
JP2008170400A JP2008170400A (ja) 2008-07-24
JP2008170400A5 true JP2008170400A5 (enExample) 2010-02-25
JP5125107B2 JP5125107B2 (ja) 2013-01-23

Family

ID=39698620

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007006397A Expired - Fee Related JP5125107B2 (ja) 2007-01-15 2007-01-15 検査装置およびその制御方法、ならびに検査装置制御プログラム

Country Status (1)

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JP (1) JP5125107B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5271771B2 (ja) * 2009-03-30 2013-08-21 日本電産サンキョー株式会社 異音検査装置および異音検査方法
US9008997B2 (en) * 2009-10-26 2015-04-14 Fluke Corporation System and method for vibration analysis and phase analysis of vibration waveforms using dynamic statistical averaging of tachometer data to accurately calculate rotational speed
JP6430234B2 (ja) * 2014-12-19 2018-11-28 公立大学法人県立広島大学 回転機械の振動解析装置およびプログラム
JP2017111018A (ja) * 2015-12-17 2017-06-22 ジヤトコ株式会社 異常検出装置、及び異常検出方法
JP7075496B2 (ja) * 2018-09-11 2022-05-25 株式会社日立国際電気 監視システム及び監視装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57191520A (en) * 1981-05-22 1982-11-25 Hitachi Ltd Oscillation monitor for rotary machine
JPH0450731A (ja) * 1990-06-19 1992-02-19 Toshiba Corp 回転機故障診断システム
JPH04232426A (ja) * 1990-12-28 1992-08-20 Nkk Corp 回転機械の診断方法及びその装置
JP3031777B2 (ja) * 1992-03-30 2000-04-10 株式会社トキメック 作業用警報装置
JP2672773B2 (ja) * 1993-08-27 1997-11-05 四国電力株式会社 軸芯の振動検出方法及びその軸芯の振動を用いた回転軸の異常判定方法
JP3202584B2 (ja) * 1996-02-29 2001-08-27 三菱自動車工業株式会社 振動分析方法とその装置
JPH10267749A (ja) * 1997-03-27 1998-10-09 Fukuoka Pref Gov Sangyo Kagaku Gijutsu Shinko Zaidan 切削加工における異常診断方法
JP2001221683A (ja) * 2000-02-09 2001-08-17 Suzuki Motor Corp 音評価装置及び方法並びに音評価用プログラムを記憶した記憶媒体
JP3651351B2 (ja) * 2000-03-27 2005-05-25 日産自動車株式会社 機械の異常検査装置
JP3333494B2 (ja) * 2000-05-10 2002-10-15 東京電力株式会社 装置の異常診断方法
JP4039295B2 (ja) * 2003-04-04 2008-01-30 株式会社デンソー ノッキング検出装置
JP3853807B2 (ja) * 2003-08-28 2006-12-06 本田技研工業株式会社 音振解析装置及び音振解析方法並びに音振解析用のプログラムを記録したコンピュータ読み取り可能な記録媒体及び音振解析用のプログラム
JP4349888B2 (ja) * 2003-11-18 2009-10-21 富士重工業株式会社 エンジン評価装置

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