JP2008159326A - Contact switching device - Google Patents

Contact switching device Download PDF

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JP2008159326A
JP2008159326A JP2006344863A JP2006344863A JP2008159326A JP 2008159326 A JP2008159326 A JP 2008159326A JP 2006344863 A JP2006344863 A JP 2006344863A JP 2006344863 A JP2006344863 A JP 2006344863A JP 2008159326 A JP2008159326 A JP 2008159326A
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conductive fluid
semiconductor substrate
insulating substrate
substrate
storage chamber
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Koji Yokoyama
浩司 横山
Riichi Uotome
利一 魚留
Shoichi Kobayashi
昌一 小林
Katsumi Kakimoto
勝己 垣本
Hideki Ueda
英喜 上田
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Panasonic Electric Works Co Ltd
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Matsushita Electric Works Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a contact switching device capable of preventing flowing out of a conductive fluid from an injection port. <P>SOLUTION: The contact switching device has the body part 1 which has a housing chamber 1d in which a conductive fluid L is stored and a pair of contacts 5a, 6a are installed and an injection port 2f for injecting the conductive fluid L into the housing chamber 1d. The housing chamber 1d has a hollow part 1a, having a larger volume than other portions and a second channel 1c which is a passage of the conductive fluid L of which one end side is connected to the hollow part 1a and the contacts 5a, 6a are exposed at the other end side; and since the step portion 20 protruding to the lower part in the second channel 1c is formed into a single body with a substrate 2, the height dimension in the vertical direction of the second channel 1c is made smaller than the height dimension in vertical direction of the hollow part 1a. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、接点開閉装置に関する。   The present invention relates to a contact switching device.

従来から、圧電素子の駆動によって液体金属を動かすことで接点を開閉する接点開閉装置(液体金属スイッチ)が提供されており、例えば特許文献1に開示されているようなものがある。この接点開閉装置は、複数のコンタクトを外部に露出した状態で有する圧電基板層と、前記コンタクトと接続される複数の圧電素子及び各圧電素子間を分離する不活性の駆動流体を有する駆動装置流体槽層と、圧電素子によって押圧される薄膜層と、回路基板に接続される複数のスイッチ・コンタクト及び各スイッチ・コンタクト間を接続する液体金属及びスイッチング流体を有する液体金属チャネル層と、スイッチ・コンタクトと接続される回路を有する回路基板層とから成る。該接点開閉装置の動作を以下に説明する。圧電基板層の一対のコンタクト間に電圧を印加すると、該一対のコンタクトに接続された圧電素子が伸長し、該圧電素子の伸長に伴って薄膜層が押圧される。薄膜層が押圧されることによって液体金属チャネル層のスイッチング流体の圧力が上昇し、スイッチング流体の圧力の上昇によって液体金属によるスイッチ・コンタクト間の接続が切断され、而して回路基板層の回路上の接点を開放するようになっている。この接点開閉装置では、接点開閉装置の組立時に駆動流体を注入口から駆動装置流体槽層に注入し、その後注入口を封止することで駆動流体を駆動装置流体槽層に充填している。
特開2004−319477号公報
Conventionally, a contact opening / closing device (liquid metal switch) that opens and closes a contact by moving a liquid metal by driving a piezoelectric element has been provided, for example, as disclosed in Patent Document 1. This contact switching device includes a piezoelectric substrate layer having a plurality of contacts exposed to the outside, a plurality of piezoelectric elements connected to the contacts, and a driving device fluid having an inert driving fluid separating each piezoelectric element A tank layer, a thin film layer pressed by a piezoelectric element, a plurality of switch contacts connected to a circuit board, a liquid metal channel layer having a liquid metal and a switching fluid connecting each switch contact, and a switch contact And a circuit board layer having a circuit connected thereto. The operation of the contact switching device will be described below. When a voltage is applied between the pair of contacts of the piezoelectric substrate layer, the piezoelectric element connected to the pair of contacts expands, and the thin film layer is pressed as the piezoelectric element expands. When the thin film layer is pressed, the pressure of the switching fluid in the liquid metal channel layer rises, and the increase in the pressure of the switching fluid breaks the connection between the switch contacts by the liquid metal, and thus on the circuit board layer circuit. The contact of is open. In this contact switching device, when the contact switching device is assembled, the driving fluid is injected into the driving device fluid tank layer from the inlet, and then the driving fluid is filled in the driving device fluid tank layer by sealing the inlet.
JP 2004-319477 A

ところで、上記のような接点開閉装置の他に、導電性流体が収納されるとともに一対の接点が露設される収納室を有する本体部と、本体部を部分的に変形させることで導電性流体を移動させ、一対の接点間の導通状態を切り換えるアクチュエータとを備えた接点開閉装置が知られている。しかしながら、このような接点開閉装置において、上記従来例の駆動流体の注入と同様に、導電性流体を注入口から収納室に注入した後に注入口を封止すると、導電性流体を注入してから注入口を封止するまでの間は注入口が開放されているので、収納室内の導電性流体が逆流して注入口から流出してしまう虞があった。   By the way, in addition to the contact switching device as described above, a conductive fluid is stored, and a main body having a storage chamber in which a pair of contacts are exposed, and a conductive fluid by partially deforming the main body. There is known a contact opening / closing device provided with an actuator that moves the switch and switches the conduction state between the pair of contacts. However, in such a contact switching device, as in the case of injecting the driving fluid in the conventional example, when the conductive fluid is injected from the inlet into the storage chamber and the inlet is sealed, the conductive fluid is injected. Since the injection port is open until the injection port is sealed, there is a possibility that the conductive fluid in the storage chamber flows backward and flows out of the injection port.

本発明は、上記の点に鑑みて為されたもので、注入口から導電性流体が流出するのを防止することができる接点開閉装置を提供することを目的とする。   The present invention has been made in view of the above points, and an object of the present invention is to provide a contact switching apparatus capable of preventing a conductive fluid from flowing out from an inlet.

請求項1の発明は、上記目的を達成するために、導電性流体が収納される収納室及び導電性流体を収納室内に注入するための注入口を有する本体部と、少なくとも一部を収納室内に臨ませた状態で設けられる一乃至複数の接点と、本体部の厚み方向における収納室の壁部を変形させて導電性流体を移動させることによって接点の間を導電性流体を介して導通又は開放させる駆動手段とを備え、前記収納室は、他の部分よりも容積の大きい空洞部と、導電性流体の移動方向に直交する断面の面積が空洞部よりも狭く且つ一端側で空洞部と連結するとともに他端側に前記接点が露出する流路部とから成り、流路部の厚み方向における高さ寸法が空洞部の厚み方向における高さ寸法よりも小さいことを特徴とする。   In order to achieve the above object, a first aspect of the present invention provides a main body having a storage chamber for storing a conductive fluid and an inlet for injecting the conductive fluid into the storage chamber, and at least a part of the storage chamber. One or a plurality of contacts provided in a state of being exposed to each other, and the conductive fluid is moved by deforming the wall portion of the storage chamber in the thickness direction of the main body portion to move between the contacts through the conductive fluid. Drive means for opening, and the storage chamber has a cavity with a volume larger than that of the other part, a cross-sectional area perpendicular to the moving direction of the conductive fluid is narrower than the cavity, and a cavity on one end side. The channel portion is connected to the other end and the contact point is exposed to the other end, and the height dimension in the thickness direction of the channel portion is smaller than the height dimension in the thickness direction of the cavity portion.

請求項2の発明は、請求項1の発明において、本体部は、半導体基板と絶縁基板とから成り、前記収納室は、半導体基板側に形成された溝部を塞ぐようにして絶縁基板を接合して形成され、流路部において絶縁基板から半導体基板に向かう方向に突出した段部を絶縁基板に一体に形成したことを特徴とする。   According to a second aspect of the present invention, in the first aspect of the invention, the main body portion includes a semiconductor substrate and an insulating substrate, and the storage chamber joins the insulating substrate so as to close a groove formed on the semiconductor substrate side. And a step portion protruding in the direction from the insulating substrate toward the semiconductor substrate in the flow path portion is formed integrally with the insulating substrate.

請求項3の発明は、請求項1の発明において、本体部は、半導体基板と絶縁基板とから成り、前記収納室は、半導体基板側に形成された溝部を塞ぐようにして絶縁基板を接合して形成され、流路部において半導体基板から絶縁基板に向かう方向に突出した段部を半導体基板に一体に形成したことを特徴とする。   According to a third aspect of the present invention, in the first aspect of the present invention, the main body portion includes a semiconductor substrate and an insulating substrate, and the storage chamber joins the insulating substrate so as to close a groove formed on the semiconductor substrate side. And a step portion protruding in the direction from the semiconductor substrate toward the insulating substrate in the flow path portion is formed integrally with the semiconductor substrate.

請求項4の発明は、請求項1の発明において、本体部は、半導体基板と絶縁基板とから成り、前記収納室は、半導体基板側に形成された溝部を塞ぐようにして絶縁基板を接合して形成され、流路部において半導体基板から絶縁基板に向かう方向に突出した第一の段部を半導体基板に一体に形成し且つ絶縁基板から半導体基板に向かう方向に突出した第二の段部を絶縁基板に一体に形成したことを特徴とする。   According to a fourth aspect of the present invention, in the first aspect of the invention, the main body portion includes a semiconductor substrate and an insulating substrate, and the storage chamber joins the insulating substrate so as to close a groove formed on the semiconductor substrate side. The first step portion formed in the flow path portion and projecting in the direction from the semiconductor substrate toward the insulating substrate is formed integrally with the semiconductor substrate, and the second step portion projecting in the direction from the insulating substrate toward the semiconductor substrate is formed. It is formed integrally with an insulating substrate.

請求項5の発明は、請求項4の発明において、第一の段部及び第二の段部は、導電性流体の移動方向における長さ寸法が互いに異なることを特徴とする。   The invention of claim 5 is characterized in that, in the invention of claim 4, the first step portion and the second step portion have different lengths in the moving direction of the conductive fluid.

請求項1の発明によれば、流路部の厚み方向における高さ寸法を空洞部の厚み方向における高さ寸法よりも小さくしたので、流路部における表面張力の影響を大きくすることができ、したがって導電性流体を収納室内に注入した後に導電性流体が注入口側へ戻ろうとするのを表面張力によって抑えることができ、導電性流体が注入口から本体部外部へと流出するのを防止することができる。   According to the invention of claim 1, since the height dimension in the thickness direction of the flow path part is made smaller than the height dimension in the thickness direction of the cavity part, the influence of the surface tension in the flow path part can be increased. Therefore, the surface tension can prevent the conductive fluid from returning to the inlet after the conductive fluid is injected into the storage chamber, and the conductive fluid is prevented from flowing out of the main body from the inlet. be able to.

請求項2の発明によれば、流路部において絶縁基板から半導体基板に向かう方向に突出した段部を絶縁基板に一体に形成したので、流路部の厚み方向における高さ寸法が空洞部の厚み方向における高さ寸法よりも小さくなるために流路部における表面張力の影響を大きくすることができ、したがって導電性流体を収納室内に注入した後に導電性流体が注入口側へ戻ろうとするのを表面張力によって抑えることができ、導電性流体が注入口から本体部外部へと流出するのを防止することができる。   According to the invention of claim 2, since the step portion protruding in the direction from the insulating substrate to the semiconductor substrate in the flow path portion is integrally formed with the insulating substrate, the height dimension in the thickness direction of the flow path portion is the cavity portion. Since it is smaller than the height dimension in the thickness direction, the influence of the surface tension in the flow path portion can be increased, so that after the conductive fluid is injected into the storage chamber, the conductive fluid tries to return to the inlet side. Can be suppressed by the surface tension, and the conductive fluid can be prevented from flowing out of the main body from the inlet.

請求項3の発明によれば、流路部において半導体基板から絶縁基板に向かう方向に突出した段部を半導体基板に一体に形成したので、流路部の厚み方向における高さ寸法が空洞部の厚み方向における高さ寸法よりも小さくなるために流路部における表面張力の影響を大きくすることができ、したがって導電性流体を収納室内に注入した後に導電性流体が注入口側へ戻ろうとするのを表面張力によって抑えることができ、導電性流体が注入口から本体部外部へと流出するのを防止することができる。   According to the invention of claim 3, since the step portion protruding in the direction from the semiconductor substrate to the insulating substrate in the flow path portion is formed integrally with the semiconductor substrate, the height dimension in the thickness direction of the flow path portion is the cavity portion. Since it is smaller than the height dimension in the thickness direction, the influence of the surface tension in the flow path portion can be increased, so that after the conductive fluid is injected into the storage chamber, the conductive fluid tries to return to the inlet side. Can be suppressed by the surface tension, and the conductive fluid can be prevented from flowing out of the main body from the inlet.

請求項4の発明によれば、流路部において半導体基板から絶縁基板に向かう方向に突出した第一の段部を半導体基板に一体に形成し且つ絶縁基板から半導体基板に向かう方向に突出した第二の段部を絶縁基板に一体に形成したので、流路部の厚み方向における高さ寸法が空洞部の厚み方向における高さ寸法よりも小さくなるために流路部における表面張力の影響を大きくすることができ、したがって導電性流体を収納室内に注入した後に導電性流体が注入口側へ戻ろうとするのを表面張力によって抑えることができ、導電性流体が注入口から本体部外部へと流出するのを防止することができる。   According to the invention of claim 4, the first step portion protruding in the direction from the semiconductor substrate toward the insulating substrate in the flow path portion is formed integrally with the semiconductor substrate, and the first step portion protruding in the direction toward the semiconductor substrate from the insulating substrate. Since the second step portion is formed integrally with the insulating substrate, the height dimension in the thickness direction of the flow path portion is smaller than the height dimension in the thickness direction of the cavity portion, so that the influence of the surface tension in the flow path portion is increased. Therefore, it is possible to prevent the conductive fluid from returning to the inlet side after injecting the conductive fluid into the storage chamber by the surface tension, and the conductive fluid flows out of the main body from the inlet. Can be prevented.

請求項5の発明によれば、第一の段部及び第二の段部を導電性流体の移動方向における長さ寸法が互いに異なるように形成したので、流路部の厚み方向における高さ寸法が空洞部の厚み方向における高さ寸法よりも小さくなるために流路部における表面張力の影響を大きくすることができ、したがって導電性流体を収納室内に注入した後に導電性流体が注入口側へ戻ろうとするのを表面張力によって抑えることができ、導電性流体が注入口から本体部外部へと流出するのを防止することができる。   According to the invention of claim 5, since the first step portion and the second step portion are formed so that the length dimension in the moving direction of the conductive fluid is different from each other, the height dimension in the thickness direction of the flow path portion. Is smaller than the height dimension in the thickness direction of the cavity portion, so that the influence of the surface tension in the flow path portion can be increased, so that after the conductive fluid is injected into the storage chamber, the conductive fluid moves to the inlet side. The return can be suppressed by the surface tension, and the conductive fluid can be prevented from flowing out of the main body from the inlet.

以下、本発明の接点開閉装置の実施形態について図面を用いて説明する。但し、以下の説明では図1(c)における上下を上下方向と定める。本実施形態は、図1(a),(b)に示すように、導電性流体Lが収納されるとともに一対の接点5a,6aが露設される収納室1d及び該収納室1dに導電性流体Lを注入するための注入口2fを有する本体部1と、注入口2fを閉塞する閉塞板4と、収納室1d内に収納された導電性流体Lを移動させ、一対の接点5a,6a間の導通状態を切り換える駆動手段であるアクチュエータ7とを備える。尚、本実施形態では、導電性流体Lとして常温常圧(25℃、1気圧)で液体の金属(例えば、水銀)を用いている。   Hereinafter, embodiments of the contact switching device of the present invention will be described with reference to the drawings. However, in the following description, the vertical direction in FIG. In the present embodiment, as shown in FIGS. 1A and 1B, the storage chamber 1d in which the conductive fluid L is stored and the pair of contacts 5a and 6a are exposed, and the storage chamber 1d are electrically conductive. The main body 1 having an injection port 2f for injecting the fluid L, the closing plate 4 for closing the injection port 2f, and the conductive fluid L stored in the storage chamber 1d are moved to move the pair of contacts 5a, 6a. And an actuator 7 which is a driving means for switching between the conductive states. In the present embodiment, a liquid metal (for example, mercury) at normal temperature and normal pressure (25 ° C., 1 atm) is used as the conductive fluid L.

本体部1は、図1(c)〜(e)に示すように、基板2と絶縁基板3とを用いて構成される。基板2は、例えば単結晶のシリコン基板から成り、図1(c)に示すように、その前面には略矩形状の凹部2aが設けられている。この基板2の後面において凹部2aに対応する部位には、導電性流体Lを収納する空洞部1a用の凹所2bが設けられており、図1(b)に示すように、この凹所2bは略菱形に形成されている。また、基板2において凹部2aの底壁部は薄膜状のダイアフラム部2cとなっており、該ダイアフラム部2cの略中央部には、前方へ突出する角錘台形の突部2dが一体に突設されている(図1(c)参照)。   As shown in FIGS. 1C to 1E, the main body 1 is configured using a substrate 2 and an insulating substrate 3. The substrate 2 is made of, for example, a single crystal silicon substrate, and as shown in FIG. 1 (c), a substantially rectangular recess 2a is provided on the front surface thereof. A recess 2b for the cavity 1a for storing the conductive fluid L is provided on the rear surface of the substrate 2 corresponding to the recess 2a. As shown in FIG. Is formed in a substantially diamond shape. Further, in the substrate 2, the bottom wall portion of the recess 2a is a thin-film diaphragm portion 2c, and a truncated pyramid-shaped projection 2d protruding forward is integrally formed at a substantially central portion of the diaphragm portion 2c. (See FIG. 1C).

基板2の後面において凹所2bの一端側(図1(b)における右端側)には、空洞部1a内に導電性流体Lを注入するための通路となる第1チャンネル1b用の第1溝部2eが形成されている。第1溝部2eは、略矩形状に形成されるとともに、略正方形状の注入口2fによって基板2の前面側と連通している(図1(c)参照)。注入口2fは、第1チャンネル1b内に導電性流体Lを注入するために設けられており、導電性流体Lを注入した後に略矩形状のガラス板から成る閉塞板4によって閉塞される(図1(a)参照)。   On the rear surface of the substrate 2, on the one end side of the recess 2b (the right end side in FIG. 1B), the first groove portion for the first channel 1b serving as a passage for injecting the conductive fluid L into the cavity portion 1a. 2e is formed. The first groove 2e is formed in a substantially rectangular shape, and communicates with the front side of the substrate 2 through a substantially square inlet 2f (see FIG. 1C). The injection port 2f is provided to inject the conductive fluid L into the first channel 1b, and is closed by the closing plate 4 made of a substantially rectangular glass plate after the conductive fluid L is injected (see FIG. 1 (a)).

一方、基板2の後面において凹所2bの他端側(図1(b)における左端側)には、導電性流体Lが移動する流路となる第2チャンネル1c用の略コ字状の第2溝部2gが形成されている。また、第2溝部2gには、図1(c)に示すように、その上面から下方に突出する段部20が基板2と一体に形成されている。   On the other hand, on the other end side of the recess 2b on the rear surface of the substrate 2 (the left end side in FIG. 1B), a substantially U-shaped first channel for the second channel 1c serving as a flow path through which the conductive fluid L moves. Two groove portions 2g are formed. Further, as shown in FIG. 1C, a step portion 20 that protrudes downward from the upper surface of the second groove portion 2 g is formed integrally with the substrate 2.

尚、上記の凹部2a、凹所2b、突部2d、各溝部2e,2g、注入口2f及び段部20は、ICP(Inductively Coupled Plasma)エッチング等の半導体製造プロセスを利用して基板2に形成してあるが、上記のような半導体製造プロセスは周知であるので、ここでは詳細な説明を省略する。また、基板2の代わりに、基板2と同様の形状に形成された絶縁性を有する樹脂基板等を用いるようにしても構わない。   The concave portion 2a, the concave portion 2b, the protruding portion 2d, the groove portions 2e and 2g, the injection port 2f, and the step portion 20 are formed on the substrate 2 using a semiconductor manufacturing process such as ICP (Inductively Coupled Plasma) etching. However, since the semiconductor manufacturing process as described above is well known, detailed description thereof is omitted here. Further, instead of the substrate 2, an insulating resin substrate formed in the same shape as the substrate 2 may be used.

絶縁基板3は、例えば基板2と略同一の外形寸法を有する透明なガラス基板から成り、基板2の後面に陽極接合等によって接合される。尚、絶縁基板3として、ガラス基板のほかに絶縁性を有する樹脂基板を用いるようにしても構わない。   The insulating substrate 3 is made of, for example, a transparent glass substrate having substantially the same outer dimensions as the substrate 2 and is bonded to the rear surface of the substrate 2 by anodic bonding or the like. In addition to the glass substrate, an insulating resin substrate may be used as the insulating substrate 3.

このように絶縁基板3を基板2の後面に接合することにより、凹所2b及び第1溝部2e並びに第2溝部2gの後面開口がそれぞれ閉塞される。そして、絶縁基板3により後面開口が閉塞された凹所2bが、導電性流体Lを収納する空洞部1aとして、絶縁基板3により後面開口が閉塞された第1溝部2eが、導電性流体Lを空洞部1aに注入するための第1チャンネル1bとして、絶縁基板3により後面開口が閉塞された第2溝部2gが、導電性流体Lの流路となる第2チャンネル1cとしてそれぞれ用いられ、これら空洞部1aと第1チャンネル1b及び第2チャンネル1cとによって導電性流体Lが移動自在に収納される収納室1dが構成される。   By thus bonding the insulating substrate 3 to the rear surface of the substrate 2, the rear surface openings of the recess 2b, the first groove portion 2e, and the second groove portion 2g are respectively closed. Then, the recess 2b whose rear opening is closed by the insulating substrate 3 serves as a cavity 1a for accommodating the conductive fluid L, and the first groove 2e whose rear opening is closed by the insulating substrate 3 serves as the conductive fluid L. As the first channel 1b for injecting into the cavity 1a, the second groove 2g whose rear opening is closed by the insulating substrate 3 is used as the second channel 1c serving as the flow path of the conductive fluid L, respectively. A storage chamber 1d in which the conductive fluid L is movably stored is constituted by the portion 1a, the first channel 1b, and the second channel 1c.

ここで、第2溝部2gには前記段部20が基板2と一体に形成されているために、第2チャンネル1cの上下方向の高さ寸法は空洞部1aの上下方向の高さ寸法よりも小さくなっている(図1(c)参照)。   Here, since the step portion 20 is formed integrally with the substrate 2 in the second groove portion 2g, the vertical dimension of the second channel 1c is higher than the vertical dimension of the cavity portion 1a. It is smaller (see FIG. 1 (c)).

一方、絶縁基板3において、基板2の第2溝部2gに対向する部位、即ち、第2チャンネル1cの底面部となる部位には、貫設孔(スルーホール)3aが4つ貫設されている(図1(b),(d)参照)。これら4つの貫設孔3aのそれぞれの内周面及び前面開口には、ともに導電性金属材料を用いためっき層から成る接点5a,6aが交互に形成されており、これにより絶縁基板3を基板2に接合した際には、各一対の接点5a,6aが第2チャンネル1c内に露設されることになる。尚、各接点5a,6a用の導電性金属材料としては、導電性流体Lに対する濡れ性が良いもの(例えば、半田)を用いることが好ましい。   On the other hand, in the insulating substrate 3, four through holes 3 a are formed through a portion of the substrate 2 that faces the second groove 2 g, that is, a portion that becomes the bottom surface of the second channel 1 c. (See FIGS. 1B and 1D). Contact points 5a and 6a made of a plating layer using a conductive metal material are alternately formed on the inner peripheral surface and the front opening of each of the four through holes 3a. When joined to 2, each pair of contacts 5a, 6a is exposed in the second channel 1c. As the conductive metal material for each contact 5a, 6a, it is preferable to use a material (for example, solder) that has good wettability with respect to the conductive fluid L.

また、絶縁基板3の後面には、銅等の導電性金属材料を用いた一対の電極パッド5b,6bがそれぞれ形成されており、電極パッド5bは配線パターン5cによって一対の接点5aに、電極パッド6bは配線パターン6cによって一対の接点6aにそれぞれ接続されている。   A pair of electrode pads 5b and 6b using a conductive metal material such as copper are formed on the rear surface of the insulating substrate 3, and the electrode pad 5b is connected to the pair of contacts 5a by the wiring pattern 5c. 6b is connected to a pair of contacts 6a by a wiring pattern 6c.

ところで、接点5aは上述したように2つ設けられているが、導電性流体Lが収納室1dに注入された後には、何れか1つのみが残されて他方の接点5aが電極パッド5bから電気的に切断される。この点は接点6aにおいても同様であり、これにより導電性流体Lの注入量のばらつきに対応できるようにしている。例えば、導電性流体Lの注入量が少なく導電性流体Lが何れの接点5a,6aとも接触していない場合と、導電性流体Lの注入量が多く導電性流体Lが接点5aとのみ接触している場合とでは、接点開閉の動作が異なってしまうため、前者の場合には、第2チャンネル1cの奥側となる他端側(図1(b)における右側)の接点5a,6aがそれぞれ電極パッド5b,6bから切断され、後者の場合には、第2チャンネル1cの手前側となる一端側(図1(b)における左側)の接点5aが電極パッド5bから切断されるとともに、第2チャンネル1cの奥側の接点6aが電極パッド6bから切断される。このようにすることで、導電性流体Lの注入量のばらつきに依らず安定した開閉性能を発揮することができる。   By the way, although the two contacts 5a are provided as described above, after the conductive fluid L is injected into the storage chamber 1d, only one of them is left and the other contact 5a is connected to the electrode pad 5b. Electrically disconnected. This also applies to the contact point 6a, and this makes it possible to cope with variations in the injection amount of the conductive fluid L. For example, when the amount of the conductive fluid L injected is small and the conductive fluid L is not in contact with any of the contacts 5a and 6a, the amount of the conductive fluid L injected is large and the conductive fluid L contacts only the contact 5a. In the former case, the contacts 5a, 6a on the other end side (the right side in FIG. 1 (b)), which is the back side of the second channel 1c, are different from each other. The electrode 5b is cut from the electrode pads 5b and 6b. In the latter case, the contact 5a on one end side (the left side in FIG. 1B) on the front side of the second channel 1c is cut from the electrode pad 5b and the second The contact 6a on the back side of the channel 1c is cut from the electrode pad 6b. By doing in this way, the stable opening / closing performance can be exhibited irrespective of the variation in the injection amount of the conductive fluid L.

アクチュエータ7は、例えば扁平な棒状に形成された圧電振動子から成り、先端部を凹部2aと対向させると同時に突部2dの先端に当接させる形で基板2の前面に接合された片持ち梁構造を有している。而して、アクチュエータ7の厚み方向に電圧を印加すれば、固定されていないアクチュエータ7の先端部がダイアフラム部2cに近づく方向に撓んで突部2dを押圧し、これにより基板2のダイアフラム部2cが凹所2b側へ変形する(撓む)ことになる。そして、電圧の印加を停止すれば、アクチュエータ7が突部2を押圧しなくなり、これによりダイアフラム部2cが元の状態に復帰することになる。   The actuator 7 is made of, for example, a piezoelectric vibrator formed in a flat rod shape, and is a cantilever joined to the front surface of the substrate 2 in such a manner that the tip portion is opposed to the recess 2a and at the same time is brought into contact with the tip of the projection 2d. It has a structure. Thus, when a voltage is applied in the thickness direction of the actuator 7, the tip of the unfixed actuator 7 bends in a direction approaching the diaphragm portion 2 c and presses the protrusion 2 d, thereby the diaphragm portion 2 c of the substrate 2. Will be deformed (flexed) toward the recess 2b. When the application of the voltage is stopped, the actuator 7 does not press the protrusion 2 and the diaphragm portion 2c is restored to the original state.

次に、本実施形態の動作について説明する。まず、電圧が印加されていない状態では、アクチュエータ7が動作しないためにダイアフラム部2cが変形していない。この時、収納室1dに収納されている導電性流体Lは何れの接点5a,6aとも接触しておらず、接点5a,6a間は絶縁(開成)されている(オフ状態)。   Next, the operation of this embodiment will be described. First, in a state where no voltage is applied, the actuator 7 does not operate, so that the diaphragm portion 2c is not deformed. At this time, the conductive fluid L stored in the storage chamber 1d is not in contact with any of the contacts 5a and 6a, and the contacts 5a and 6a are insulated (opened) (off state).

このオフ状態から電圧を印加してアクチュエータ7を駆動すると、アクチュエータ7の先端部が突部2dを押圧し、これによりダイアフラム部2cが後方に押し下げられる。ダイアフラム部2cが押し下げられると、空洞部1aの容積が減少し、これにより空洞部1a内に収納されている導電性流体Lが第2チャンネル1c側へ移動させられ、一対の接点5a,6aが導電性流体Lによって短絡(閉成)される(オン状態)。   When a voltage is applied from this OFF state to drive the actuator 7, the tip of the actuator 7 presses the protrusion 2d, and thereby the diaphragm 2c is pushed backward. When the diaphragm portion 2c is pushed down, the volume of the cavity portion 1a is reduced, whereby the conductive fluid L accommodated in the cavity portion 1a is moved to the second channel 1c side, and the pair of contacts 5a and 6a are moved. Short-circuited (closed) by the conductive fluid L (ON state).

そして、このオン状態から電圧の印加を停止すれば、アクチュエータ7によって変形させられていたダイアフラム部2cが元の状態に復帰する。これに伴って空洞部1aの容積が元に戻るため、第2チャンネル1c側に移動していた導電性流体Lが空洞部1a側に戻り、一対の接点5a,6aが開成される(オフ状態)。   When the application of voltage is stopped from this on state, the diaphragm portion 2c deformed by the actuator 7 returns to the original state. Along with this, the volume of the cavity 1a returns to the original, so that the conductive fluid L that has moved to the second channel 1c side returns to the cavity 1a side, and the pair of contacts 5a and 6a are opened (OFF state). ).

以下、導電性流体Lを収納室1dに注入する方法について図面を用いて説明する。まず、導電性流体Lが蓄えられた流体槽8aを有する真空チャンバ8内に本体部1を配置し、真空チャンバ8内を真空ポンプ(図示せず)を用いて真空引きすることで、真空チャンバ8内及び本体部1の収納室1d内を所定の真空度まで減圧する(図2(a)参照)次に、本体部1を流体槽8aに浸し(図2(b)参照)、真空チャンバ8内の圧力を上昇させると、真空チャンバ8内の圧力が収納室1d内の圧力よりも大きくなるために、流体槽8aに蓄えられた導電性流体Lが注入口2fから収納室1d内に浸入する(図2(c)参照)。そして、収納室1dに所定の導電性流体Lが注入されるまで真空チャンバ8内の圧力を上昇させた後に(図2(d)参照)、本体部1を流体槽8aから取り出し、閉塞板4を基板2の前面に接合して注入口2fを閉塞することで、導電性流体Lの収納室1dへの注入工程が終了する。尚、流体槽8aに本体部1を浸す際に、凹部2aにも導電性流体Lが浸入するが、凹部2aに溜まった導電性流体Lは注入口2fを閉塞板4で閉塞した後に除去するため、ここでは凹部2aに溜まる導電性流体Lの図示を省略している。   Hereinafter, a method for injecting the conductive fluid L into the storage chamber 1d will be described with reference to the drawings. First, the main body portion 1 is disposed in a vacuum chamber 8 having a fluid tank 8a in which the conductive fluid L is stored, and the vacuum chamber 8 is evacuated using a vacuum pump (not shown), whereby a vacuum chamber is obtained. 8 and the storage chamber 1d of the main body 1 are depressurized to a predetermined degree of vacuum (see FIG. 2A). Next, the main body 1 is immersed in the fluid tank 8a (see FIG. 2B), and a vacuum chamber is obtained. When the pressure in the chamber 8 is increased, the pressure in the vacuum chamber 8 becomes larger than the pressure in the storage chamber 1d, so that the conductive fluid L stored in the fluid tank 8a enters the storage chamber 1d from the inlet 2f. It penetrates (see FIG. 2 (c)). Then, after increasing the pressure in the vacuum chamber 8 until a predetermined conductive fluid L is injected into the storage chamber 1d (see FIG. 2D), the main body 1 is taken out from the fluid tank 8a, and the blocking plate 4 Is bonded to the front surface of the substrate 2 to close the injection port 2f, whereby the step of injecting the conductive fluid L into the storage chamber 1d is completed. When the main body 1 is immersed in the fluid tank 8a, the conductive fluid L also enters the recess 2a. However, the conductive fluid L accumulated in the recess 2a is removed after the inlet 2f is closed by the closing plate 4. Therefore, illustration of the conductive fluid L that accumulates in the recess 2a is omitted here.

ここで、本実施形態では、前述のように第2溝部2gに段部20を基板2と一体に形成することで第2チャンネル1cの上下方向の高さ寸法を空洞部1aの上下方向の高さ寸法よりも小さくしている。このため、空洞部1aと比較して第2チャンネル1cにおける表面張力の影響を大きくすることができるので、導電性流体Lを収納室1d内に注入した後に導電性流体Lが注入口2f側へ戻ろうとするのを表面張力によって抑えることができ、導電性流体Lが注入口2fから本体部1外部へと流出するのを防止することができる。   Here, in the present embodiment, as described above, the step portion 20 is formed integrally with the substrate 2 in the second groove portion 2g, so that the height dimension of the second channel 1c in the vertical direction is set to the height in the vertical direction of the cavity portion 1a. It is smaller than the size. For this reason, since the influence of the surface tension in the second channel 1c can be increased as compared with the hollow portion 1a, the conductive fluid L moves toward the inlet 2f after the conductive fluid L is injected into the storage chamber 1d. The return can be suppressed by the surface tension, and the conductive fluid L can be prevented from flowing out of the main body 1 from the inlet 2f.

また、第2チャンネル1cの上下方向の高さ寸法を小さくすることで、アクチュエータ7によってダイアフラム部2cを撓ませる際に、空洞部1aから押し出される導電性流体Lが高さ寸法を小さくしない場合と比べて第2チャンネル1c内を大きく移動することができる。   In addition, when the height of the second channel 1c in the vertical direction is reduced, the conductive fluid L pushed out from the cavity 1a does not reduce the height when the actuator 7 deflects the diaphragm 2c. Compared with the second channel 1c, it can move largely.

尚、上記のように段部20を基板2と一体に形成するのではなく、図3(a)に示すように、第2チャンネル1cにおいて絶縁基板3の上面から上方に突出する段部30を絶縁基板3と一体に形成してもよく、この場合でも上記段部20を設ける場合と同様に第2チャンネル1cの上下方向の高さ寸法を空洞部1aの上下方向の高さ寸法よりも小さくすることができるので、上記と同様の効果を奏することができる。また、図3(b)に示すように、第2チャンネル1cにおいて基板2及び絶縁基板3の何れにも段部20,30を設けてもよく、更には、図3(c)に示すように、第2チャンネル1cにおいて段部30の導電性流体Lの移動方向(図3(c)における左右方向)の長さ寸法を段部20の前記左右方向の長さ寸法よりも大きくしても構わない。これらの場合においても上記段部20を設ける場合と同様に第2チャンネル1cの上下方向の高さ寸法を空洞部1aの上下方向の高さ寸法よりも小さくすることができるので、上記と同様の効果を奏することができる。   Instead of forming the step portion 20 integrally with the substrate 2 as described above, as shown in FIG. 3A, a step portion 30 protruding upward from the upper surface of the insulating substrate 3 in the second channel 1c is formed. In this case, the height of the second channel 1c in the vertical direction is smaller than the height in the vertical direction of the cavity 1a. Therefore, the same effect as described above can be obtained. Further, as shown in FIG. 3B, step portions 20 and 30 may be provided on both the substrate 2 and the insulating substrate 3 in the second channel 1c, and further, as shown in FIG. 3C. In the second channel 1c, the length dimension of the step portion 30 in the moving direction of the conductive fluid L (left and right direction in FIG. 3C) may be larger than the length dimension of the step portion 20 in the left and right direction. Absent. Also in these cases, the height dimension in the vertical direction of the second channel 1c can be made smaller than the height dimension in the vertical direction of the cavity portion 1a as in the case where the step portion 20 is provided. There is an effect.

本発明の実施形態の接点開閉装置を示す図で、(a)は概略前面図で、(b)は概略後面図で、(c)はA−A’線断面矢視図で、(d)はB−B’線断面矢視図で、(e)はC−C’線断面矢視図である。BRIEF DESCRIPTION OF THE DRAWINGS It is a figure which shows the contact switching device of embodiment of this invention, (a) is a schematic front view, (b) is a schematic rear view, (c) is a sectional view on the AA 'line | wire, (d) Is a sectional view taken along the line BB ', and (e) is a sectional view taken along the line CC'. 同上の導電性流体の注入方法を示す図で、(a)は本体部を導電性流体に浸す前を示す図で、(b)は本体部を導電性流体に浸した直後を示す図で、(c)はチャンバ内の圧力を上昇させた場合を示す図で、(d)はチャンバ内の圧力を所定の値まで上昇させた場合を示す図である。It is a figure which shows the injection | pouring method of a conductive fluid same as the above, (a) is a figure which shows before immersing a main-body part in a conductive fluid, (b) is a figure which shows immediately after immersing a main-body part in a conductive fluid, (C) is a figure which shows the case where the pressure in a chamber is raised, (d) is a figure which shows the case where the pressure in a chamber is raised to a predetermined value. 同上の他の構成を示す図で、(a)は絶縁基板に段部を設けた場合を示す断面図で、(b)は基板及び絶縁基板の何れにも段部を設けた場合を示す断面図で、(c)は基板に設けた段部と絶縁基板に設けた段部とで長さ寸法を異ならせた場合を示す断面図である。It is a figure which shows another structure same as the above, (a) is sectional drawing which shows the case where a step part is provided in an insulated substrate, (b) is a cross section which shows the case where a step part is provided in both a board | substrate and an insulated substrate FIG. 4C is a cross-sectional view showing a case where the length of the step provided on the substrate is different from that of the step provided on the insulating substrate.

符号の説明Explanation of symbols

1 本体部
1a 空洞部
1c 第2チャンネル(流路部)
1d 収納室
20 段部
2c ダイアフラム部(壁部)
2f 注入口
5a,6a 接点
7 アクチュエータ(駆動手段)
L 導電性流体
DESCRIPTION OF SYMBOLS 1 Main-body part 1a Cavity part 1c 2nd channel (flow-path part)
1d Storage room 20 Step part 2c Diaphragm part (wall part)
2f Inlet 5a, 6a Contact 7 Actuator (drive means)
L Conductive fluid

Claims (5)

導電性流体が収納される収納室及び導電性流体を収納室内に注入するための注入口を有する本体部と、少なくとも一部を収納室内に臨ませた状態で設けられる一乃至複数の接点と、本体部の厚み方向における収納室の壁部を変形させて導電性流体を移動させることによって接点の間を導電性流体を介して導通又は開放させる駆動手段とを備え、前記収納室は、他の部分よりも容積の大きい空洞部と、導電性流体の移動方向に直交する断面の面積が空洞部よりも狭く且つ一端側で空洞部と連結するとともに他端側に前記接点が露出する流路部とから成り、流路部の厚み方向における高さ寸法が空洞部の厚み方向における高さ寸法よりも小さいことを特徴とする接点開閉装置。   A storage chamber in which the conductive fluid is stored, a main body having an inlet for injecting the conductive fluid into the storage chamber, and one or more contacts provided in a state where at least a part thereof faces the storage chamber; Drive means for conducting or opening between the contacts via the conductive fluid by moving the conductive fluid by deforming the wall of the storage chamber in the thickness direction of the main body, and A hollow portion having a volume larger than that of the portion, and a flow path portion in which an area of a cross section perpendicular to the moving direction of the conductive fluid is smaller than that of the hollow portion and is connected to the hollow portion on one end side and the contact is exposed on the other end side A contact opening / closing device characterized in that the height dimension in the thickness direction of the flow path portion is smaller than the height dimension in the thickness direction of the cavity portion. 前記本体部は、半導体基板と絶縁基板とから成り、前記収納室は、半導体基板側に形成された溝部を塞ぐようにして絶縁基板を接合して形成され、流路部において絶縁基板から半導体基板に向かう方向に突出した段部を絶縁基板に一体に形成したことを特徴とする請求項1記載の接点開閉装置。   The main body portion includes a semiconductor substrate and an insulating substrate, and the storage chamber is formed by bonding the insulating substrate so as to close a groove formed on the semiconductor substrate side. 2. The contact switching device according to claim 1, wherein a stepped portion projecting in a direction toward is integrally formed on the insulating substrate. 前記本体部は、半導体基板と絶縁基板とから成り、前記収納室は、半導体基板側に形成された溝部を塞ぐようにして絶縁基板を接合して形成され、流路部において半導体基板から絶縁基板に向かう方向に突出した段部を半導体基板に一体に形成したことを特徴とする請求項1記載の接点開閉装置。   The main body portion includes a semiconductor substrate and an insulating substrate, and the storage chamber is formed by bonding the insulating substrate so as to close a groove formed on the semiconductor substrate side, and the insulating substrate is separated from the semiconductor substrate in the flow path portion. 2. The contact switching device according to claim 1, wherein a stepped portion projecting in a direction toward is formed integrally with the semiconductor substrate. 前記本体部は、半導体基板と絶縁基板とから成り、前記収納室は、半導体基板側に形成された溝部を塞ぐようにして絶縁基板を接合して形成され、流路部において半導体基板から絶縁基板に向かう方向に突出した第一の段部を半導体基板に一体に形成し且つ絶縁基板から半導体基板に向かう方向に突出した第二の段部を絶縁基板に一体に形成したことを特徴とする請求項1記載の接点開閉装置。   The main body portion includes a semiconductor substrate and an insulating substrate, and the storage chamber is formed by bonding the insulating substrate so as to close a groove formed on the semiconductor substrate side, and the insulating substrate is separated from the semiconductor substrate in the flow path portion. The first step portion protruding in the direction toward the semiconductor substrate is integrally formed on the semiconductor substrate, and the second step portion protruding in the direction from the insulating substrate toward the semiconductor substrate is formed integrally on the insulating substrate. Item 1. The contact switching apparatus according to Item 1. 前記第一の段部及び第二の段部は、導電性流体の移動方向における長さ寸法が互いに異なることを特徴とする請求項4記載の接点開閉装置。   The contact switching device according to claim 4, wherein the first step portion and the second step portion have different lengths in the moving direction of the conductive fluid.
JP2006344863A 2006-12-21 2006-12-21 Contact switching device Withdrawn JP2008159326A (en)

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