JP2008146091A5

JP2008146091A5 -

Info

Publication number: JP2008146091A5
Application number: JP2008005043A
Authority: JP
Filing date: 2008-01-11
Publication date: 2010-04-08

Claims

Arranged at the intersection of the scanning line and the signal line,
An electro-optic element, a storage capacitor, a sampling transistor, and a drive transistor;
Hold capacitor is connected between the source and gate of the drive transistor,
Support lamp ring transistor is connected between the gate and the signal Line of the drive transistor,
A method of driving a pixel circuit optic element conductive is connected between the source and the predetermined power supply potential of the drive transistor,
After drive transistor is applied with a predetermined voltage which is turned between the gate and source of the drive transistor, the first operation to approach the source potential of the drive transistor gate voltage,
When Sa lamp ring transistor is selected by the scanning line, and a second operation of holding the hold capacitor samples the input signal from the signal Line,
Drive transistor, in response to the held signal voltage hold capacitor, a third operation of the current driving the electric optical element,
A driving method of a pixel circuit including:

The first operation, a current flows into the drive transistor in the on state, the driving method of the pixel circuit according to claim 1, by reducing the voltage between the gate and source of the drive transistor to detect the threshold voltage .

Picture element circuit includes a switching transistor connected between the power supply and the drive transistor,
Switch ing transistor, said an ON state when performing the first operation, the driving method of the pixel circuit according to claim 2, current flows into the drive transistor.

The first operation, a voltage is applied between the gate and source of the drive transistor, while the drive transistors turned on, the electric optical element in a reverse bias state, a current flows into the drive transistor on the other hand, the driving method of the pixel circuit according to claim 1 in electrical optical element of the reverse bias state so that no current flows.

It is arranged at the intersection of the scanning line and the signal line,
An electro-optic element, a storage capacitor, a sampling transistor, and a drive transistor;
Hold capacitor is connected between the source and gate of the drive transistor,
Support lamp ring transistor is connected between the gate and the signal Line of the drive transistor,
Electric-optical element between the source and the predetermined power supply potential of the drive transistor is connected,
Sa pump ring transistor, when selected by the scanning line, and held in hold capacitor samples the input signal from the signal Line,
Drive transistor in response to the held signal voltage hold capacitor, the electric optical element and the current driving,
Prior to the current driving the electric optical element, after applying a predetermined voltage to drive transistor is turned on between the gate and source of the drive transistor, having means to bring the source potential of the drive transistor gate potential Pixel circuit.

Said means, a current flows into the drive transistor in the on state, the pixel circuit according to claim 5 for detecting the threshold voltage by reducing the voltage between the gate and source of the drive transistor.

Includes a switching transistor connected between the power supply and the drive transistor,
The means is the switch ring transistor is turned on, the pixel circuit according to claim 6 supplying a current to drive the transistor.

It said means applies a voltage between the gate and source of the drive transistor, while the drive transistors turned on, electrical and optical element in a reverse bias state, while supplying a current to drive the transistor, reverse the pixel circuit according to claim 5 in electrical optical element biased to ensure no current flows.

Arranged at the intersection of the scanning line and the signal line,
An electro-optic element, a storage capacitor, a sampling transistor, and a drive transistor;
Hold capacitor is connected between the source and gate of the drive transistor,
Support lamp ring transistor is connected between the gate and the signal Line of the drive transistor,
Electric-optical element between the source and the predetermined power supply potential of the drive transistor is connected,
Sa pump ring transistor, when selected by the scanning line, and held in hold capacitor samples the input signal from the signal Line,
Drive transistor in response to the held signal voltage hold capacitor, the electric optical element and the current driving,
Prior to the current driving the electric optical element, after applying a predetermined voltage to drive transistor is turned on to the gate and source of the drive transistor, drive voltage and another voltage applied to the source over the scan is applied to the source of the transistor, the pixel circuit closer toward the source potential of the drive transistor to the gate potential.

Flowing a current to the drive transistor in the on state, the pixel circuit according to claim 9 for detecting the threshold voltage by reducing the voltage between the gate and source of the drive transistor.

Includes a switching transistor connected between the power supply and the drive transistor,
In switch ing transistor is turned on, the pixel circuit according to claim 10 supplying a current to drive the transistor.

By applying a Jo Tokoro voltage to the gate and source of the drive transistor, while the drive transistors turned on, the electric optical element in a reverse bias state,
Claim While supplying a current to drive transistor by applying a voltage and another voltage applied to the source over the scan to the source of the drive transistor, the electric optical element in the reverse bias state so that no current flows 9 the pixel circuit according to.