JP2008126380A - Grinding machine and manufacturing method for disc-shaped substrate - Google Patents

Grinding machine and manufacturing method for disc-shaped substrate Download PDF

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JP2008126380A
JP2008126380A JP2006316342A JP2006316342A JP2008126380A JP 2008126380 A JP2008126380 A JP 2008126380A JP 2006316342 A JP2006316342 A JP 2006316342A JP 2006316342 A JP2006316342 A JP 2006316342A JP 2008126380 A JP2008126380 A JP 2008126380A
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polishing
disk
laminated
substrate
opening
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JP4252087B2 (en
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Kazuyuki Haneda
和幸 羽根田
Yosuke Sato
陽介 佐藤
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Citizen Seimitsu Co Ltd
Resonac Holdings Corp
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Showa Denko KK
Citizen Seimitsu Co Ltd
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Priority to JP2006316342A priority Critical patent/JP4252087B2/en
Priority to US11/944,004 priority patent/US7837536B2/en
Priority to CN 200710186662 priority patent/CN101186020B/en
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a grinding machine capable of promoting the supply of a grinding fluid to a grinding work area and uniformly grinding a laminated work in the laminated direction of the laminated work, and a manufacturing method for a disc-shaped substrate. <P>SOLUTION: In this grinding mechanism, the laminated work 140 is rotated by inserting a grinding brush 150 into a center hole 141 of the laminated work 140 supported by a rotating table and supplying slurry from slurry supplying nozzles 123 to the upper surface of the laminated work 140, thereby rotating the grinding brush 150 and concurrently moving it to and fro at a predetermined stroke in the axial direction (vertical direction) to grind the inner circumferential surface of the center hole 141 (the inner circumferential surfaces of the disc-shaped substrates 10). In the laminated work 140, a number of disc-shaped substrates 10 are laminated and slurry introducing spacers 160 for supplying the slurry from the outer circumferential surface into the center hole 141 are interposed between the disc-shaped substrates 10 at each predetermined number and supported by a holder 200. Further, a cover 300 is attached so as to cover the laminated portion of the disc-shaped substrates 10. During the grinding work, the slurry flowing inside the cover 300 is supplied to the center hole 141 through the slurry introducing spacers 160. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、例えば磁気記録媒体用ガラス基板などの円盤状基板の内周を研磨する研磨装置等に関する。   The present invention relates to a polishing apparatus for polishing an inner periphery of a disk-shaped substrate such as a glass substrate for a magnetic recording medium.

記録メディアとしての需要の高まりを受け、近年、円盤状基板であるディスク基板の製造が活発化している。このディスク基板の一つである磁気ディスク基板としては、アルミ基板とガラス基板とが広く用いられている。アルミ基板は加工性も高く安価である点に特長があり、一方のガラス基板は強度、表面の平滑性、平坦性に優れている点に特長がある。特に最近ではディスク基板の小型化と高密度化の要求が著しく高くなり、基板の表面の粗さが小さく高密度化を図ることが可能なガラス基板の注目度が高まっている。   In response to the increasing demand for recording media, the manufacture of disk substrates, which are disk-shaped substrates, has recently become active. As a magnetic disk substrate which is one of the disk substrates, an aluminum substrate and a glass substrate are widely used. An aluminum substrate is characterized by high workability and low cost, and one glass substrate is characterized by excellent strength, surface smoothness, and flatness. In particular, recently, the demand for miniaturization and high density of the disk substrate has been remarkably increased, and the degree of attention of the glass substrate capable of achieving high density with small roughness of the surface of the substrate has increased.

このような磁気ディスク基板の製造装置に関する公報記載の従来技術として、中心孔を有するガラスディスクの内周面を研磨する技術が存在する(例えば、特許文献1、2参照。)。
この特許文献1では、ガラスディスクを積層した積層ガラスディスクを中心軸回りに回転可能にセッティングし、軸回りに無数のブラシ毛を持つ軸付研磨ブラシを積層ガラスディスクの中心孔に挿入する。そして、この軸付研磨ブラシを、往復移動させつつ積層ガラスディスクの回転方向とは逆方向に回転させて、積層ガラスディスクの内周面を研磨している。
また、特許文献2では、浮遊砥粒を含有した研磨液にガラス基板を浸漬することで、液切れによる研磨不足や研磨不良を来すことのない研磨方法が提案されている。また、この特許文献2では、回転軸上に螺旋状に植毛されたブラシ毛を回転させて研磨することで、被研磨面に常に新鮮な研磨液を循環供給し、研磨効率、再現性および精度を高める技術が開示されている。
As a conventional technique described in a gazette related to such a magnetic disk substrate manufacturing apparatus, there is a technique for polishing an inner peripheral surface of a glass disk having a center hole (see, for example, Patent Documents 1 and 2).
In Patent Document 1, a laminated glass disk on which glass disks are laminated is set so as to be rotatable around a central axis, and a shaft-equipped polishing brush having innumerable brush bristles around the axis is inserted into the central hole of the laminated glass disk. Then, the inner peripheral surface of the laminated glass disk is polished by rotating the polishing brush with a shaft in a direction opposite to the rotation direction of the laminated glass disk while reciprocating.
Further, Patent Document 2 proposes a polishing method in which a glass substrate is immersed in a polishing liquid containing floating abrasive grains so as not to cause insufficient polishing or poor polishing due to liquid breakage. Moreover, in this patent document 2, by rotating the brush hair helically planted on the rotation shaft and polishing it, a fresh polishing liquid is always circulated and supplied to the surface to be polished, so that the polishing efficiency, reproducibility and accuracy are improved. A technique for enhancing the above is disclosed.

図13に、従来の円盤状基板の内周面を研磨する方法の一例を示す。
図13に示す研磨方法では、円盤状基板10を中心軸方向に多数積層して構成された積層ワーク501が、図示しない回転テーブルに軸方向を縦にして装着されている。積層ワーク501の中心孔501Aには、図示しない回転駆動軸に上端で連結された軸状の研磨ブラシ502が挿入配置されている。また、積層ワーク501の上側には、砥粒を含む研磨液を供給するノズル503が配置されている。
そして、ノズル503から積層ワーク501の上面に研磨液を供給しつつ、積層ワーク501を回転させ、また、研磨ブラシ502を回転させつつその軸方向に往復移動させて、積層ワーク501の中心孔501Aの内周面(すなわち円盤状基板10の内周面)を研磨する。
研磨ブラシ502は、軸芯の周囲にブラシ列が所定の間隔(ブラシ隙間)を有して所定のピッチで螺旋状に設けられている。これにより、ブラシ隙間もブラシ列と同じピッチで螺旋状に形成されている。
FIG. 13 shows an example of a method for polishing the inner peripheral surface of a conventional disk-shaped substrate.
In the polishing method shown in FIG. 13, a laminated work 501 constituted by laminating a large number of disk-like substrates 10 in the central axis direction is mounted on a rotary table (not shown) with the axial direction vertical. In the center hole 501A of the laminated workpiece 501, a shaft-like polishing brush 502 connected at the upper end to a rotation drive shaft (not shown) is inserted and disposed. A nozzle 503 for supplying a polishing liquid containing abrasive grains is disposed on the upper side of the laminated work 501.
Then, while supplying the polishing liquid from the nozzle 503 to the upper surface of the laminated workpiece 501, the laminated workpiece 501 is rotated, and the polishing brush 502 is rotated and reciprocated in the axial direction thereof, so that the center hole 501 </ b> A of the laminated workpiece 501. The inner peripheral surface (that is, the inner peripheral surface of the disk-shaped substrate 10) is polished.
In the polishing brush 502, brush rows are provided in a spiral shape at a predetermined pitch with a predetermined interval (brush gap) around the axis. Thus, the brush gap is also formed in a spiral shape at the same pitch as the brush row.

この図13に示すような研磨方法において、積層ワーク501の上面に供給された研磨液は、研磨作業中、図13中に矢印で示すように流れて研磨作業域(研磨ブラシ502と積層ワーク501の内周面との間)に供給される。すなわち、研磨液は、積層ワーク501の中心孔501Aに流入し、研磨ブラシ502のブラシ隙間を通って研磨作業面に達する。そして、この研磨液は、研磨ブラシ502の回転によるブラシ隙間の螺旋の作用によって下部に向かって移動して行く。そして、最終的には積層ワーク501の中心孔501Aの下端から下側に排出される。   In the polishing method as shown in FIG. 13, the polishing liquid supplied to the upper surface of the laminated workpiece 501 flows as shown by an arrow in FIG. 13 during the polishing operation and flows into the polishing work area (the polishing brush 502 and the laminated workpiece 501). Between the inner peripheral surface and the inner peripheral surface. That is, the polishing liquid flows into the center hole 501A of the laminated work 501 and reaches the polishing work surface through the brush gap of the polishing brush 502. Then, the polishing liquid moves downward by the action of the spiral of the brush gap caused by the rotation of the polishing brush 502. And finally, it is discharged from the lower end of the center hole 501A of the laminated work 501 to the lower side.

特開平11−33886号公報Japanese Patent Laid-Open No. 11-33886 特開平11−221742号公報JP-A-11-221742

しかしながら、上記のごとき従来の内周面の研磨方法では、研磨作業域である積層ワークの上下方向において、均一かつ充分に研磨液を供給することが難しく、そのために積層ワークの上下方向において研磨が不均一となるという問題があった。   However, in the conventional polishing method for the inner peripheral surface as described above, it is difficult to supply the polishing liquid uniformly and sufficiently in the vertical direction of the laminated work which is the polishing work area. There was a problem of non-uniformity.

すなわち、上述したように、研磨作業中、積層ワークの上面に供給された研磨液は、この上面から狭いブラシ隙間を通って研磨作業域に達し、研磨作業を行いつつ徐々に下方に移動する。このために、研磨作業域に供給される研磨液の量が限定されるとともに、研磨液の供給箇所が上面だけであることから、研磨に用いられる研磨液の量が積層箇所によって大きく異なってしまう。その結果、積層ワークにおける積層箇所によって内周研磨の研磨状態が異なり、積層ワークを構成する個々の円盤状基板に対してバラツキの少ない、かつ精度の高い内周研磨を行うことが難しかった。   That is, as described above, during the polishing operation, the polishing liquid supplied to the upper surface of the laminated work reaches the polishing operation area through the narrow brush gap from the upper surface, and gradually moves downward while performing the polishing operation. For this reason, the amount of polishing liquid supplied to the polishing work area is limited, and since the polishing liquid supply location is only the top surface, the amount of polishing liquid used for polishing varies greatly depending on the lamination location. . As a result, the polishing state of the inner circumference polishing differs depending on the lamination location in the laminated workpiece, and it was difficult to perform the inner circumference polishing with little variation and high accuracy with respect to the individual disk-shaped substrates constituting the laminated workpiece.

本発明は、以上のような技術的課題を解決するためになされたものであって、その目的とするところは、研磨作業域への研磨液の供給を促進し、積層ワークの積層方向において均一に研磨することのできる研磨装置および円盤状基板の製造方法を提供することにある。   The present invention has been made in order to solve the technical problems as described above. The object of the present invention is to promote the supply of the polishing liquid to the polishing work area and be uniform in the stacking direction of the stacked workpieces. An object of the present invention is to provide a polishing apparatus and a method for manufacturing a disk-shaped substrate that can be polished.

かかる目的を達成するために、本発明は、中心部に開孔を有する円盤状基板の内周面を研磨する研磨装置であって、円盤状基板を複数枚積層させた積層ワークをセッティングするセッティング手段と、積層ワークの円盤状基板の開孔に挿入されて回転するブラシと、積層ワークを覆うカバー部材と、カバー部材により覆われた積層ワークの円盤状基板の開孔に対して研磨液を流入する研磨液流入手段と、を備えたことを特徴とする。   In order to achieve such an object, the present invention is a polishing apparatus for polishing an inner peripheral surface of a disk-shaped substrate having an opening in the center, and is a setting for setting a laminated work in which a plurality of disk-shaped substrates are stacked. Means, a brush that is inserted into and rotated in the opening of the disc-shaped substrate of the laminated workpiece, a cover member that covers the laminated workpiece, and a polishing liquid for the aperture of the disc-like substrate of the laminated workpiece that is covered by the cover member And a polishing liquid inflow means for flowing in.

ここで、セッティング手段は、装着された円盤状基板間に、中心に開孔とこの開孔と外周部とを連通させる連通部を備えた導入スペーサを挟んで積層ワークをセッティングし、研磨液流入手段は、連通部を介して積層ワークの開孔に対して研磨液を流入させることを特徴とすれば、例えば積層ワークに挿入されるブラシの軸方向を鉛直方向とした場合に、その積層ワークの下方や中間部分などに配置される円盤状基板に対しても良好な内周研磨が実現できる点で好ましい。   Here, the setting means sets the laminated workpiece between the mounted disk-shaped substrates with an introduction spacer provided with an opening at the center and a communication portion for communicating the opening and the outer periphery, and the polishing liquid flows in. The means is characterized in that the polishing liquid is allowed to flow into the opening of the laminated workpiece through the communication portion. For example, when the axial direction of the brush inserted into the laminated workpiece is a vertical direction, the laminated workpiece It is preferable in that good inner periphery polishing can be realized even for a disk-shaped substrate disposed below or in the middle of the substrate.

また、カバー部材は、研磨液を積層ワークの外周面に沿って導入スペーサまで導くように形成されてなることを特徴とすれば、積層ワークの外周面から円盤状基板の内孔に、効率良く研磨液を供給することが可能となる。
さらに、カバー部材は、積層ワークの外周面との間に所定の空隙をもって積層ワークを覆うことを特徴とすることができる。
また、カバー部材は、下端近傍に研磨液の排出孔を備えることを特徴とすることができる。
Further, if the cover member is formed so as to guide the polishing liquid along the outer peripheral surface of the laminated workpiece to the introduction spacer, the cover member can be efficiently passed from the outer peripheral surface of the laminated workpiece to the inner hole of the disk-shaped substrate. It becomes possible to supply polishing liquid.
Furthermore, the cover member can be characterized by covering the laminated workpiece with a predetermined gap between the cover member and the outer peripheral surface of the laminated workpiece.
Further, the cover member may be characterized by including a polishing liquid discharge hole in the vicinity of the lower end.

他の観点から捉えると、本発明は、中心部に開孔を有する円盤状基板の内周面を研磨して円盤状基板を製造する円盤状基板の製造方法であって、研磨の対象となる円盤状基板を複数枚積層した積層ワークを保持する保持工程と、保持工程により保持された積層ワークの外周面をカバー部材で覆う工程と、カバー部材で覆われ保持工程により保持された積層ワークの円盤状基板の開孔にブラシを挿入してブラシを回転し、開孔に研磨液を流入させて研磨する研磨工程と、を有することを特徴とする。   From another point of view, the present invention is a disk-shaped substrate manufacturing method for manufacturing a disk-shaped substrate by polishing an inner peripheral surface of a disk-shaped substrate having an opening in the center, and is a target of polishing. A holding step of holding a laminated workpiece in which a plurality of disk-shaped substrates are laminated, a step of covering the outer peripheral surface of the laminated workpiece held in the holding step with a cover member, and a laminated workpiece covered with the cover member and held in the holding step A polishing step of inserting a brush into the opening of the disk-shaped substrate, rotating the brush, and allowing a polishing liquid to flow into the opening to perform polishing.

ここで、保持工程は、装着された円盤状基板間に、中心に開孔とこの開孔の外周部とを連通させる連通部とを備えた導入スペーサを挟み、研磨工程は、カバー部材を用いて、導入スペーサの連通部を介して円盤状基板の開孔に研磨液を流入させることを特徴とすることができる。
また、保持工程は、円盤状基板を積層保持する基板ホルダに円盤状基板を装着する工程を、さらに有し、円盤状基板を積層保持した基板ホルダを保持することを特徴とすることができる。
Here, the holding step sandwiches an introduction spacer having an opening and a communication portion that communicates the outer periphery of the opening between the mounted disk-shaped substrates, and the polishing step uses a cover member. Thus, the polishing liquid can be introduced into the opening of the disk-shaped substrate through the communicating portion of the introduction spacer.
The holding step may further include a step of mounting the disk-shaped substrate on a substrate holder for stacking and holding the disk-shaped substrate, and holding the substrate holder that holds the disk-shaped substrate in a stacked manner.

以上のように構成された本発明によれば、これらの構成を採用しない場合に比べて、研磨作業域へ研磨液をより均一に供給することが可能となり、積層ワークの積層方向における研磨の不均等を抑制することができる。   According to the present invention configured as described above, it becomes possible to more uniformly supply the polishing liquid to the polishing work area, compared to the case where these configurations are not adopted, and polishing failure in the stacking direction of the stacked workpieces. Evenness can be suppressed.

以下、添付図面を参照して、本発明の実施の形態について詳細に説明する。
はじめに、図1−1および図1−2に基づいて本実施の形態が適用される円盤状基板(ディスク基板)10の製造工程を説明する。
この製造工程は、まず図1−1(a)に示す1次ラップ工程にて、円盤状基板(ワーク)10の原材料を定盤21に載置し、円盤状基板10の平面11を削る。このとき、円盤状基板10を載置した定盤21の表面には、例えばダイヤモンドの砥粒が散りばめられる。次に、図1−1(b)に示す内外周研削工程にて、円盤状基板10の中心に設けられた開孔(hole)12を内周砥石22によって研削し、円盤状基板10の外周13を外周砥石23によって研削する。このとき、内周砥石22と外周砥石23で円盤状基板10の内周面と外周面を挟み込んで同時加工することで、内径と外径の同軸度を確保し易くすることができる。そして、図1−1(c)に示す外周研磨工程では、外周研磨用ブラシ24を用いて円盤状基板10の外周13が研磨される。その後、図1−1(d)に示す2次ラップ工程にて、円盤状基板10を定盤21に載置し、円盤状基板10の平面11を更に削る。
Embodiments of the present invention will be described below in detail with reference to the accompanying drawings.
First, a manufacturing process of a disk-shaped substrate (disk substrate) 10 to which the exemplary embodiment is applied will be described with reference to FIGS. 1-1 and 1-2.
In this manufacturing process, first, the raw material of the disc-shaped substrate (work) 10 is placed on the surface plate 21 in the primary lapping step shown in FIG. 1-1A, and the flat surface 11 of the disc-shaped substrate 10 is shaved. At this time, for example, diamond abrasive grains are scattered on the surface of the surface plate 21 on which the disk-shaped substrate 10 is placed. Next, in the inner and outer peripheral grinding step shown in FIG. 1B, the hole 12 provided at the center of the disc-shaped substrate 10 is ground by the inner peripheral grindstone 22, and the outer periphery of the disc-shaped substrate 10 is 13 is ground by the outer peripheral grindstone 23. At this time, it is possible to easily ensure the coaxiality of the inner and outer diameters by sandwiching the inner and outer peripheral surfaces of the disc-shaped substrate 10 with the inner and outer peripheral grinding stones 22 and 23 and simultaneously processing them. In the outer periphery polishing step shown in FIG. 1-1C, the outer periphery 13 of the disk-shaped substrate 10 is polished using the outer periphery polishing brush 24. Thereafter, in the secondary lapping step shown in FIG. 1-1D, the disc-like substrate 10 is placed on the surface plate 21, and the plane 11 of the disc-like substrate 10 is further shaved.

次いで、図1−2(e)に示す内周研磨工程にて、円盤状基板10の中心の開孔12に研磨ブラシ150を挿入し、円盤状基板10の開孔12を研磨する。その後、図1−2(f)に示す1次ポリッシュ工程にて、円盤状基板10を定盤21に載置し、円盤状基板10の平面11を磨く。このときの研磨には、例えば不織布(研磨布)として硬質ポリッシャが用いられる。更に、図1−2(g)に示す2次ポリッシュ工程にて、軟質ポリッシャを用いた平面研磨が行われる。その後、図1−2(h)に示す最終洗浄・検査工程にて洗浄と検査が行われて、円盤状基板(ディスク基板)10が製造される。   Next, in the inner periphery polishing step shown in FIG. 1-2E, a polishing brush 150 is inserted into the central opening 12 of the disk-shaped substrate 10, and the opening 12 of the disk-shaped substrate 10 is polished. Thereafter, the disk-shaped substrate 10 is placed on the surface plate 21 in the primary polishing step shown in FIG. 1-2 (f), and the flat surface 11 of the disk-shaped substrate 10 is polished. For this polishing, for example, a hard polisher is used as a non-woven fabric (abrasive cloth). Further, planar polishing using a soft polisher is performed in the secondary polishing step shown in FIG. Thereafter, cleaning and inspection are performed in the final cleaning / inspection step shown in FIG. 1-2 (h), and the disk-shaped substrate (disk substrate) 10 is manufactured.

つぎに、上述の内周研磨工程にて用いられる研磨装置について説明する。
図2は研磨装置100の外観を示す斜視図であり、図3は研磨機構110の縦断面(一部)を示した図である。尚、図2は研磨機構110の研磨ヘッド120が上方に位置する研磨作業前の準備状態を示し、図3は研磨ヘッド120が下降した作業中の状態を示している。このために、図2および図3における研磨ヘッド120の位置は一致していない。
図2および図3に示す研磨装置100は、研磨対象部材である円盤状基板10が複数枚積層されて成る積層ワーク140(後に詳述する)が取り付けられ、この積層ワーク140に対して研磨作業を行うものである。
研磨装置100は、ベースフレーム101に、左右一対の研磨機構110L,110Rを並列に備えている。これにより、二組の積層ワーク140に対して同時に研磨作業を行うことができるようになっている。尚、左右の研磨機構110L,110Rは同様な構成となっており、以下、研磨機構110として説明する。
Next, a polishing apparatus used in the above inner periphery polishing step will be described.
FIG. 2 is a perspective view showing an external appearance of the polishing apparatus 100, and FIG. 3 is a view showing a longitudinal section (part) of the polishing mechanism 110. As shown in FIG. 2 shows a preparatory state before the polishing operation in which the polishing head 120 of the polishing mechanism 110 is positioned above, and FIG. 3 shows a state in which the polishing head 120 is lowered. For this reason, the positions of the polishing heads 120 in FIGS. 2 and 3 do not match.
The polishing apparatus 100 shown in FIGS. 2 and 3 is provided with a laminated work 140 (to be described in detail later) formed by laminating a plurality of disc-like substrates 10 as members to be polished, and the polishing work is performed on the laminated work 140. Is to do.
The polishing apparatus 100 includes a base frame 101 provided with a pair of left and right polishing mechanisms 110L and 110R in parallel. As a result, the polishing work can be simultaneously performed on the two sets of laminated workpieces 140. The left and right polishing mechanisms 110L and 110R have the same configuration, and will be described below as the polishing mechanism 110.

ベースフレーム101には、浮遊砥粒を含有した研磨液であるスラリを収容するスラリタンク102が配設されている。また、図示しないが、スラリタンク102に収容されたスラリを循環駆動するポンプや、研磨装置の制御装置等が設けられている。
研磨機構110は、ベースフレーム101に立設されたコラム111に鉛直方向に移動可能に支持された研磨ヘッド120と、その下側に配設された回転テーブル130とを備えている。
The base frame 101 is provided with a slurry tank 102 that contains a slurry that is a polishing liquid containing floating abrasive grains. Although not shown, a pump for circulating and driving the slurry stored in the slurry tank 102, a control device for the polishing apparatus, and the like are provided.
The polishing mechanism 110 includes a polishing head 120 supported by a column 111 erected on the base frame 101 so as to be movable in the vertical direction, and a rotary table 130 disposed below the polishing head 120.

研磨ヘッド120は、後述する研磨ブラシ150の一端部を把持して、この研磨ブラシ150を鉛直に支持するチャック121を備えている。このチャック121は、図示しないモータ等の駆動手段によって回転駆動されるようになっている。
チャック121の周囲には、下側に開放する円筒状のカバー122が、チャック121を覆い更に所定の高さまで垂下して設けられている。そしてカバー122の内側に、チャック121に隣接してスラリ供給ノズル123が設けられている。このスラリ供給ノズル123は、回転テーブル130に装着された積層ワーク140の上面に向かって開口している。
研磨ヘッド120は、コラム111に沿って鉛直に所定のストロークで昇降移動可能に設けられており、図示しない昇降駆動手段によって昇降駆動されるようになっている。
The polishing head 120 includes a chuck 121 that holds one end of a polishing brush 150 (described later) and supports the polishing brush 150 vertically. The chuck 121 is rotationally driven by driving means such as a motor (not shown).
A cylindrical cover 122 that opens downward is provided around the chuck 121 so as to cover the chuck 121 and further hang down to a predetermined height. A slurry supply nozzle 123 is provided inside the cover 122 adjacent to the chuck 121. The slurry supply nozzle 123 is open toward the upper surface of the laminated workpiece 140 mounted on the rotary table 130.
The polishing head 120 is vertically movable along a column 111 with a predetermined stroke so as to be moved up and down by a lift driving means (not shown).

回転テーブル130は、所定の径からなる円盤状部材で形成され、その上面に積層ワーク140を取り付けることができるように構成されている。この回転テーブル130は、研磨ヘッド120の下側に配設されており、図示しないモータ等の駆動手段によって所定の回転数で回転駆動されるようになっている。その中央には、所定径の開口131が形成され、その内部に回転テーブル130とは独立して支持軸受け132が設けられている。この支持軸受け132は、研磨ブラシ150の先端を回転可能に支持するものである。
また、この回転テーブル130の周囲および下側を覆うように、上方に開口する有底円筒状のスラリ受け133が設けられている。更に、スラリ受け133の上側に、上下に開口する円筒状のカバー134が設けられている。このカバー134の正面側には、扉135が開閉可能に設けられている。
The turntable 130 is formed of a disk-shaped member having a predetermined diameter, and is configured so that the laminated workpiece 140 can be attached to the upper surface thereof. The rotary table 130 is disposed below the polishing head 120 and is driven to rotate at a predetermined rotational speed by a driving means such as a motor (not shown). An opening 131 having a predetermined diameter is formed at the center, and a support bearing 132 is provided inside the opening 131 independently of the rotary table 130. The support bearing 132 supports the tip of the polishing brush 150 in a rotatable manner.
Further, a bottomed cylindrical slurry receiver 133 that opens upward is provided so as to cover the periphery and the lower side of the turntable 130. Furthermore, a cylindrical cover 134 that opens up and down is provided on the upper side of the slurry receiver 133. A door 135 is provided on the front side of the cover 134 so as to be openable and closable.

研磨ヘッド120に設けられたスラリ供給ノズル123と、回転テーブル130に設けられたスラリ受け133とは、それぞれベースフレーム101に設けられたスラリタンク102と図示しない配管によって接続されている。そして、スラリタンク102の内部に収容したスラリをスラリ供給ノズル123に供給し、スラリ受け133が受けたスラリをスラリタンク102に回収するようになっている。つまり、スラリはスラリタンク102からスラリ供給ノズル123へ、スラリ受け133からスラリタンク102へと循環するようになっている。   A slurry supply nozzle 123 provided on the polishing head 120 and a slurry receiver 133 provided on the rotary table 130 are connected to a slurry tank 102 provided on the base frame 101 by a pipe (not shown). Then, the slurry accommodated in the slurry tank 102 is supplied to the slurry supply nozzle 123, and the slurry received by the slurry receiver 133 is collected in the slurry tank 102. That is, the slurry circulates from the slurry tank 102 to the slurry supply nozzle 123 and from the slurry receiver 133 to the slurry tank 102.

このような研磨機構110は、図3に示すように、回転テーブル130の上面に積層ワーク140を支持し、研磨ヘッド120のチャック121に研磨ブラシ150の上端を支持する。そして、研磨ヘッド120の下降によって研磨ブラシ150を積層ワーク140の中心孔141に挿入し、研磨ブラシ150の下端を支持軸受け132に支持させた状態とする。この状態で、スラリ供給ノズル123からスラリを吐出して積層ワーク140の上面に供給し、回転テーブル130(積層ワーク140)を回転させると共に、研磨ブラシ150を回転させつつその軸方向(上下方向)に所定のストロークで往復移動させる。これによって、積層ワーク140の中心孔141の内周面(円盤状基板10の内周面)を研磨するものである。本実施の形態では、積層ワーク140(回転テーブル130)の回転方向は上側から見て反時計回り、研磨ブラシ150の回転方向はこれとは逆の上側から見て時計回りに設定される。   As shown in FIG. 3, the polishing mechanism 110 supports the laminated workpiece 140 on the upper surface of the rotary table 130 and supports the upper end of the polishing brush 150 on the chuck 121 of the polishing head 120. Then, the polishing brush 150 is inserted into the center hole 141 of the laminated workpiece 140 by the lowering of the polishing head 120, and the lower end of the polishing brush 150 is supported by the support bearing 132. In this state, the slurry is discharged from the slurry supply nozzle 123 and supplied to the upper surface of the laminated workpiece 140 to rotate the rotary table 130 (laminated workpiece 140) and rotate the polishing brush 150 in the axial direction (vertical direction). To reciprocate with a predetermined stroke. As a result, the inner peripheral surface of the center hole 141 of the laminated workpiece 140 (the inner peripheral surface of the disk-shaped substrate 10) is polished. In the present embodiment, the rotation direction of the laminated workpiece 140 (rotary table 130) is set counterclockwise when viewed from above, and the rotation direction of the polishing brush 150 is set clockwise when viewed from the opposite side.

図4は、この研磨機構110にて用いられる研磨ブラシ150を示す斜視図である。また、図5は研磨ブラシ150の軸方向の一部を拡大した断面図である。
研磨ブラシ150は、図4に示すように、ステンレス合金鋼等によって形成され所定の直径からなる軸芯151の周囲に、ブラシ基材としてのブラシ列152が所定のピッチで螺旋状に設けられている。ブラシ列152の間には所定の間隔(ブラシ隙間153)が設定されており、このブラシ隙間153もブラシ列152と同じく螺旋状に軸方向に連続している。尚、ブラシ列152(ブラシ隙間153)の螺旋方向は、いわゆる左巻き(反時計回りで遠ざかる方向)となっており、時計回りの回転でブラシ隙間153内のスラリを上側から下側に向けて(基端側から先端側に向けて)駆動し得るようになっている。
FIG. 4 is a perspective view showing a polishing brush 150 used in the polishing mechanism 110. FIG. 5 is an enlarged cross-sectional view of a part of the polishing brush 150 in the axial direction.
As shown in FIG. 4, the polishing brush 150 has a brush row 152 as a brush base material spirally provided at a predetermined pitch around an axis 151 made of stainless alloy steel and having a predetermined diameter. Yes. A predetermined interval (brush gap 153) is set between the brush rows 152, and this brush gap 153 is also continuous in the axial direction spirally like the brush rows 152. Note that the spiral direction of the brush row 152 (brush gap 153) is a so-called left-handed (counter-clockwise direction), and the slurry in the brush gap 153 is directed from the upper side to the lower side by clockwise rotation ( It can be driven from the proximal side to the distal side.

研磨ブラシ150の毛先までの寸法を含む外径は、例えば、円盤状基板10の内径12mmに対して直径13mmとする。
軸芯151は、ブラシ領域より両端側にそれぞれ所定量突出しており、一方はチャック121による被把持部151A、他方は支持軸受け132に支持される先細りの被支持部151Bとなっている。
The outer diameter including the dimension to the bristles of the polishing brush 150 is, for example, 13 mm in diameter with respect to the inner diameter 12 mm of the disc-like substrate 10.
The shaft core 151 protrudes by a predetermined amount from the brush region to both ends. One is a gripped portion 151A by the chuck 121, and the other is a tapered supported portion 151B supported by the support bearing 132.

このような研磨ブラシ150は、軸芯151の周囲にブラシ列152を所定のピッチで螺旋状に巻き付けて固定した後、ブラシ列152の毛先を所定外径にカットして形成される。
ブラシ列152は、図5に示すように、所定長さのブラシ毛材154を、芯金155を巻くようにその中央部分で二つ折りにし、その芯金155を巻回する屈曲部分を外側から基部金具156でカシメる。これによって、ブラシ列152のブラシ毛材154は芯金155に一体に固定され、図5に示すように軸芯151に対して列状に形成されている。このブラシ毛材154は、例えば、ナイロン等によって、径0.1mmに形成される。
基部金具156は、図5中に示すように、軸芯151の周囲にて、軸方向に互いに当接させながら螺旋状に巻き付けることで、ブラシ列152の間隔(ピッチ)およびブラシ隙間153が一定となるように形成されている。つまり、基部金具156の幅は、ブラシ毛材154を芯金155に固定する機能において必要な最小限の幅より大きく、ブラシ列152のピッチを規定する寸法にて設定されている。
The polishing brush 150 is formed by fixing the brush row 152 around the shaft 151 by spirally winding the brush row 152 at a predetermined pitch and then cutting the bristles of the brush row 152 to a predetermined outer diameter.
As shown in FIG. 5, the brush row 152 has a brush bristle material 154 of a predetermined length folded in half at the center so that the cored bar 155 is wound, and a bent part around which the cored bar 155 is wound is formed from the outside. Crimp with base bracket 156. Thereby, the brush bristle material 154 of the brush row 152 is integrally fixed to the cored bar 155, and is formed in a row with respect to the shaft core 151 as shown in FIG. The brush bristle material 154 is formed with a diameter of 0.1 mm using, for example, nylon.
As shown in FIG. 5, the base metal fitting 156 is wound spirally around the shaft core 151 while being in contact with each other in the axial direction, so that the interval (pitch) of the brush rows 152 and the brush gap 153 are constant. It is formed to become. That is, the width of the base metal fitting 156 is larger than the minimum width necessary for the function of fixing the brush bristle material 154 to the core metal 155 and is set to a dimension that defines the pitch of the brush rows 152.

つぎに、この積層ワーク140について説明する。
図6は積層ワーク140の全体斜視図、図7は円盤状基板10の積層過程を示す斜視図、図8は円盤状基板10の積層途中に介装されるスラリ導入スペーサ160を示す図である。また、図9はカバー300と、積層ワーク140へのカバー300の装着を説明する図である。更に、図10は研磨作業状態の断面図である。
図6に示す積層ワーク140は、図7に示すようにして円盤状基板10を多数(例えば150枚)積層した状態で、ホルダ200に支持されている。
Next, the laminated workpiece 140 will be described.
6 is an overall perspective view of the laminated workpiece 140, FIG. 7 is a perspective view showing a lamination process of the disk-like substrate 10, and FIG. 8 is a view showing a slurry introduction spacer 160 interposed in the middle of the lamination of the disk-like substrate 10. . FIG. 9 is a view for explaining the cover 300 and the attachment of the cover 300 to the laminated workpiece 140. Further, FIG. 10 is a cross-sectional view of the polishing operation state.
The laminated workpiece 140 shown in FIG. 6 is supported by the holder 200 in a state where a large number (for example, 150) of the disk-like substrates 10 are laminated as shown in FIG.

ホルダ200は、上下の支持円盤(上部支持円盤210,下部支持円盤220)が、周方向に複数本(例えば4本)配置された連結バー230によって所定の間隔で連結されて構成されている。そして、この上部支持円盤210、下部支持円盤220および連結バー230によって形成される空間(内部)に、積層された円盤状基板10が収容され、この積層された円盤状基板10が、上部支持円盤210の上側に締着される固定円盤240によって、ホルダ200に固定される。このホルダ200は、ステンレス合金鋼等によって形成されている。   The holder 200 is configured by connecting upper and lower support disks (upper support disk 210 and lower support disk 220) at predetermined intervals by a plurality of connection bars 230 arranged in the circumferential direction (for example, four). The stacked disk-shaped substrate 10 is accommodated in a space (inside) formed by the upper support disk 210, the lower support disk 220, and the connecting bar 230, and the stacked disk-shaped substrate 10 is stored in the upper support disk. It is fixed to the holder 200 by a fixed disk 240 fastened to the upper side of 210. The holder 200 is made of stainless alloy steel or the like.

上側の上部支持円盤210は、所定厚さの円盤状で、その中央に、積層された円盤状基板10を内部に装着するための開孔211が形成されている。
下側の下部支持円盤220は、所定厚さの円盤部221の下面側に、大径の装着フランジ222を備えている。その中央には、スラリの流通および研磨ブラシ150を挿通するための開孔223が形成されている。円盤部221の直径は、上部支持円盤210の直径より所定量大きく設定されている。
固定円盤240は、上部支持円盤210とほぼ同径で所定厚さからなる円盤状部材であり、その中央に、後述する上部押さえ233と嵌合する嵌合孔241が形成されている。そして、上部支持円盤210の上面にて、中心を一致させてボルトによって固定されるようになっている。
The upper support disc 210 on the upper side has a disc shape with a predetermined thickness, and an opening 211 for mounting the stacked disc-like substrate 10 inside is formed in the center thereof.
The lower support disc 220 on the lower side includes a large-diameter mounting flange 222 on the lower surface side of the disc portion 221 having a predetermined thickness. In the center, an opening 223 for passing the slurry and inserting the polishing brush 150 is formed. The diameter of the disk portion 221 is set to be larger than the diameter of the upper support disk 210 by a predetermined amount.
The fixed disk 240 is a disk-shaped member having the same diameter and a predetermined thickness as the upper support disk 210, and a fitting hole 241 for fitting with an upper presser 233 described later is formed at the center thereof. Then, on the upper surface of the upper support disk 210, the centers are matched and fixed with bolts.

このようなホルダ200には、図7に示すように積層治具としてのセンタリングシャフト232を用いて積層された円盤状基板10が装着される。
すなわち、センタリングシャフト232に、下部押さえ231を挿入して取り付け、ついで円盤状基板10を順次嵌合することで、その中心の開孔12を基準として位置決めされた状態で円盤状基板10を積層する。そして最後に上部押さえ233をセンタリングシャフト232に挿入して取り付ける。これにより、センタリングシャフト232に嵌合して積層された円盤状基板10が、下部押さえ231と上部押さえ233との間に挟まれた状態となる。
As shown in FIG. 7, such a holder 200 is mounted with a disk-shaped substrate 10 laminated using a centering shaft 232 as a lamination jig.
That is, the lower holding member 231 is inserted and attached to the centering shaft 232, and then the disc-like substrate 10 is sequentially fitted, so that the disc-like substrate 10 is laminated in a state of being positioned with reference to the opening 12 at the center. . Finally, the upper presser 233 is inserted into the centering shaft 232 and attached. As a result, the disc-like substrate 10 fitted and stacked on the centering shaft 232 is sandwiched between the lower presser 231 and the upper presser 233.

下部押さえ231は、外径が円盤状基板10の外径と略等しいかそれより大きい所定厚さの円盤状の部材である。その内径は、円盤状基板10の内径より大きく設定されている。
上部押さえ233は、円盤状基板10と外径が略等しい本体部233Aの上側に、小径部233Bが形成されて二段の外形に形成されている。その中央には、スラリの流通および研磨ブラシ150を挿通するための開孔233Cが形成されている。
これら上部押さえ233および下部押さえ231は、例えば、ポリアセタール等の樹脂により形成されている。
センタリングシャフト232は、下端に下部支持円盤220の開孔223(図10参照)に嵌合する大径部232Aと、その上側に下部押さえ231の内径に嵌合する中径部(図示せず)を有している。そのさらに上側に、円盤状基板10が嵌合する位置決め軸部232Bが立設されているものである。
The lower presser 231 is a disk-shaped member having a predetermined thickness whose outer diameter is substantially equal to or larger than the outer diameter of the disk-shaped substrate 10. The inner diameter is set larger than the inner diameter of the disc-like substrate 10.
The upper presser 233 is formed in a two-step outer shape by forming a small-diameter portion 233B on the upper side of the main body portion 233A having an outer diameter substantially equal to that of the disc-like substrate 10. In the center, an opening 233C for passing the slurry and inserting the polishing brush 150 is formed.
These upper presser 233 and lower presser 231 are made of a resin such as polyacetal, for example.
The centering shaft 232 has a large-diameter portion 232A that fits in the opening 223 (see FIG. 10) of the lower support disk 220 at the lower end, and a medium-diameter portion (not shown) that fits in the inner diameter of the lower presser 231 on the upper side. have. On the further upper side, a positioning shaft portion 232B into which the disc-like substrate 10 is fitted is erected.

上記のごとくセンタリングシャフト232に嵌合して積層された円盤状基板10は、ホルダ200の内部に、図6の上側から上部支持円盤210の開孔211(図10参照)を介して挿置される。そして、上部支持円盤210の上側に締着された固定円盤240によって、下部支持円盤220に押圧されて、積層された円盤状基板10が固定される。このとき、上部押さえ233の小径部233Bに固定円盤240の嵌合孔241が嵌合する。
センタリングシャフト232は、積層された円盤状基板10が固定された後、図6の下側から抜き取られる。
これにより、積層された円盤状基板10の開孔12によって中心孔141(図6、図10参照)が形成される。この中心孔141の上端は、上部に開放する上部押さえ233の開孔233Cに繋がり、中心孔141の下端は下部押さえ231の内径部および下部支持円盤220の開孔223に繋がっている。
The disc-like substrate 10 fitted and stacked on the centering shaft 232 as described above is inserted into the holder 200 from the upper side of FIG. 6 through the opening 211 (see FIG. 10) of the upper support disc 210. The Then, the stacked disk-shaped substrate 10 is fixed by being pressed against the lower support disk 220 by the fixed disk 240 fastened to the upper side of the upper support disk 210. At this time, the fitting hole 241 of the fixed disk 240 is fitted into the small diameter portion 233B of the upper presser 233.
The centering shaft 232 is extracted from the lower side of FIG. 6 after the stacked disk-shaped substrate 10 is fixed.
As a result, a center hole 141 (see FIGS. 6 and 10) is formed by the opening 12 of the stacked disk-shaped substrate 10. The upper end of the center hole 141 is connected to the opening 233 </ b> C of the upper presser 233 that opens upward, and the lower end of the center hole 141 is connected to the inner diameter portion of the lower presser 231 and the opening 223 of the lower support disk 220.

ここで、ホルダ200内に積層された円盤状基板10の間には、所定枚数毎に研磨液流入手段としてのスラリ導入スペーサ160が設けられる。これは、前述のセンタリングシャフト232に円盤状基板10を順次嵌合する際に、所定枚数毎にスラリ導入スペーサ160を挟み込ませることで設置される。本実施の形態では、全積層厚さを三等分するように2個のスラリ導入スペーサ160が介装されている。例えば円盤状基板10を150枚積層する場合では、例えば50枚毎に1個のスラリ導入スペーサ160が介装される。   Here, a slurry introducing spacer 160 as a polishing liquid inflow means is provided between the disk-shaped substrates 10 stacked in the holder 200 every predetermined number. This is installed by sandwiching the slurry introduction spacer 160 every predetermined number when the disc-like substrate 10 is sequentially fitted to the centering shaft 232 described above. In the present embodiment, two slurry introduction spacers 160 are interposed so that the total stack thickness is divided into three equal parts. For example, when 150 disc-like substrates 10 are stacked, for example, one slurry introduction spacer 160 is interposed for every 50 substrates.

スラリ導入スペーサ160は、図8(a)に斜視図,図8(b)にその断面図を示すように、所定の厚さで外径が円盤状基板10と略等しい円盤状に、例えばポリアセタール等の樹脂によって形成されている。中央には円盤状基板10の内径より大きい開孔161が形成されており、また、外周面には所定深さの溝162が形成されている。更に、その溝162の底(外周面)と開孔161の内周面とを連通して所定径の貫通供給孔163が、周方向に等角度間隔で複数個(例えば8個(45度間隔)、形成されている。   As shown in the perspective view of FIG. 8A and the cross-sectional view of FIG. 8B, the slurry introduction spacer 160 is formed into a disk shape having a predetermined thickness and an outer diameter substantially equal to the disk-shaped substrate 10, for example, polyacetal. It is formed with resin. An opening 161 larger than the inner diameter of the disc-like substrate 10 is formed at the center, and a groove 162 having a predetermined depth is formed on the outer peripheral surface. Furthermore, a plurality of (for example, eight (45 degree intervals, for example)) through feed holes 163 having a predetermined diameter communicate with the bottom (outer peripheral surface) of the groove 162 and the inner peripheral surface of the opening 161 in the circumferential direction. ), Formed.

ここで、本実施の形態では、上記のごとく多数の円盤状基板10が積層されてホルダ200に収容されてなる積層ワーク140に、その円盤状基板10が積層された部位を覆うようにカバー300が装着されて研磨作業に供される。
このカバー300は、例えば、薄いシート状の樹脂フィルム等によって上下端が開放する円筒状(直管状)に形成されている。これは、当初から円筒状に形成されている場合の他に、例えば矩形の樹脂フィルムシートを取り付け時に丸めて両端を接合して形成することもできる。そして、その内径は、ホルダ200の下部支持円盤220の円盤部221に隙間なく嵌合し得るように設定される。カバー300の高さは、ホルダ200の下部支持円盤220の装着フランジ222の上面から、上部支持円盤210の上面までの高さより所定量高くなるように設定されている。また、カバー300の下縁近傍には、所定径の排出孔301が周方向に所定間隔で複数個、開孔形成されている。
Here, in the present embodiment, as described above, the cover 300 is formed so as to cover the portion where the disk-shaped substrate 10 is stacked on the stacked work 140 formed by stacking the many disk-shaped substrates 10 and accommodated in the holder 200. Is mounted for polishing work.
The cover 300 is formed in a cylindrical shape (straight tube) whose upper and lower ends are opened by, for example, a thin sheet-like resin film. In addition to the case where it is formed in a cylindrical shape from the beginning, for example, a rectangular resin film sheet can be rounded at the time of attachment and both ends can be joined. And the inner diameter is set so that it can fit in the disk part 221 of the lower support disk 220 of the holder 200 without a gap. The height of the cover 300 is set to be a predetermined amount higher than the height from the upper surface of the mounting flange 222 of the lower support disk 220 of the holder 200 to the upper surface of the upper support disk 210. A plurality of discharge holes 301 having a predetermined diameter are formed in the vicinity of the lower edge of the cover 300 at predetermined intervals in the circumferential direction.

上記のごとく形成されたカバー300は、図9に示すように、積層ワーク140にその上側から被せるようにして外挿され、下端をホルダ200の下部支持円盤220の円盤部221に嵌合させて装着される。
そして、積層ワーク140にカバー300が装着された状態では、カバー300の上端縁は積層ワーク140の上面より所定量高くなる。また、カバー300の内周と上部支持円盤210の側周面との間に、所定の幅の流通間隙142が形成される。これは、上部支持円盤210の直径より下部支持円盤220の円盤部221の直径が大きく形成され、カバー300は下部支持円盤220の円盤部221に嵌合する直径の直管状に形成されていることによる。尚、上部支持円盤210と下部支持円盤220の円盤部221とが同一直径に形成されたホルダ200では、カバー300を上部が広がるテーパ状として流通間隙142が形成されるようにする。
更に、カバー300の下部に形成された排出孔301は、カバー300の装着状態で下部支持円盤220の円盤部221の上面より上側に位置する。
これにより、カバー300は、その下端である下部開口部がホルダ200の下部支持円盤220によって塞がれて、積層ワーク140の周囲を覆い(積層ワーク140を内部に収容し)、上方に開口する円筒容器状を成す。
As shown in FIG. 9, the cover 300 formed as described above is extrapolated so as to cover the laminated workpiece 140 from above, and the lower end is fitted to the disk portion 221 of the lower support disk 220 of the holder 200. Installed.
When the cover 300 is attached to the laminated workpiece 140, the upper edge of the cover 300 is higher than the upper surface of the laminated workpiece 140 by a predetermined amount. A flow gap 142 having a predetermined width is formed between the inner periphery of the cover 300 and the side peripheral surface of the upper support disc 210. This is because the diameter of the disk part 221 of the lower support disk 220 is formed larger than the diameter of the upper support disk 210, and the cover 300 is formed in a straight tube having a diameter that fits into the disk part 221 of the lower support disk 220. by. In the holder 200 in which the upper support disc 210 and the disc portion 221 of the lower support disc 220 are formed to have the same diameter, the flow gap 142 is formed so that the cover 300 has a tapered shape in which the upper portion extends.
Further, the discharge hole 301 formed in the lower part of the cover 300 is positioned above the upper surface of the disk part 221 of the lower support disk 220 when the cover 300 is attached.
Thereby, the lower opening part which is the lower end of the cover 300 is closed by the lower support disk 220 of the holder 200, covers the periphery of the laminated work 140 (accommodates the laminated work 140 inside), and opens upward. Forms a cylindrical container.

そして、上記のごとくカバー300が装着された積層ワーク140は、ホルダ200の下部支持円盤220の装着フランジ222が、研磨機構110の回転テーブル130にボルトによって締着されることで、回転テーブル130に装着される。ここまでの、ホルダ200に円盤状基板10を積層して支持させて、回転テーブル130に装着する構成が、本実施の形態における本発明のセッティング手段である。尚、カバー300の装着工程はこれに限るものではなく、積層ワーク140を回転テーブル130に装着した後、積層ワーク140にカバー300を被せる工程としても良い。   Then, the laminated workpiece 140 to which the cover 300 is mounted as described above is attached to the rotary table 130 by fastening the mounting flange 222 of the lower support disk 220 of the holder 200 to the rotary table 130 of the polishing mechanism 110 with bolts. Installed. The configuration so far described in which the disc-like substrate 10 is stacked and supported on the holder 200 and mounted on the rotary table 130 is the setting means of the present invention in the present embodiment. The mounting process of the cover 300 is not limited to this, and the process of covering the laminated work 140 with the cover 300 after the laminated work 140 is mounted on the rotary table 130 may be employed.

つぎに、研磨作業中の積層ワーク140の断面図である図10を参照して、研磨作業および研磨作業中におけるスラリの流れについて説明する。
研磨作業は、前述のごとく、スラリ供給ノズル123からスラリを吐出して積層ワーク140の上面に供給し、回転テーブル130を回転させると共に、研磨ブラシ150を回転させつつその軸方向(上下方向)に所定のストロークで往復移動させて行う。
積層ワーク140の上面に供給されたスラリは、図10中に矢印で示すように、ホルダ200の上部に開放する上部押さえ233の開孔233Cから積層ワーク140の中心孔141に流入すると共に、流通間隙142を通って積層ワーク140の外周とカバー300との間に流入する。これらに流入し得なかった余剰のスラリは、カバー300の上縁から外側に溢れ、外周面を伝って流下する。
Next, with reference to FIG. 10 which is a cross-sectional view of the laminated workpiece 140 during the polishing operation, the flow of the slurry during the polishing operation and the polishing operation will be described.
As described above, the polishing operation is performed by discharging the slurry from the slurry supply nozzle 123 and supplying it to the upper surface of the laminated workpiece 140, rotating the rotary table 130 and rotating the polishing brush 150 in the axial direction (vertical direction). It is performed by reciprocating with a predetermined stroke.
The slurry supplied to the upper surface of the laminated workpiece 140 flows into the central hole 141 of the laminated workpiece 140 from the opening 233C of the upper presser 233 that opens to the upper portion of the holder 200 as shown by an arrow in FIG. It flows between the outer periphery of the laminated workpiece 140 and the cover 300 through the gap 142. Excess slurry that could not flow into these overflows outward from the upper edge of the cover 300 and flows down along the outer peripheral surface.

積層ワーク140の中心孔141に流入したスラリは、螺旋状に形成された研磨ブラシ150のブラシ毛材154(図5参照)と、この研磨ブラシ150の回転、更にスラリの自重などによって下方に送られ、下部支持円盤220の開孔223から流れ出る。また、流通間隙142を通って積層ワーク140の外周とカバー300との間に流入したスラリは、積層ワーク140の外面を伝って流下し、その一部がカバー300の下部の排出孔301から流出する。
このように積層ワーク140の外面を伝わらせてスラリを流し、この外面からも中心孔141にスラリを供給している。これにより、研磨ブラシ150による研磨作業域(中心孔141の内周面)には、上部支持円盤210の開孔211から流入したスラリばかりでなく、外周側からもスラリが供給されることとなる。
The slurry that has flowed into the center hole 141 of the laminated work 140 is sent downward by the brush bristle material 154 (see FIG. 5) of the spirally formed polishing brush 150, the rotation of the polishing brush 150, and the weight of the slurry. And flows out from the opening 223 of the lower support disk 220. Further, the slurry that flows between the outer periphery of the laminated workpiece 140 and the cover 300 through the circulation gap 142 flows down along the outer surface of the laminated workpiece 140, and a part thereof flows out from the discharge hole 301 at the lower portion of the cover 300. To do.
In this way, the slurry is caused to flow along the outer surface of the laminated workpiece 140, and the slurry is also supplied from this outer surface to the center hole 141. As a result, not only the slurry flowing from the opening 211 of the upper support disk 210 but also the slurry is supplied to the polishing work area (the inner peripheral surface of the center hole 141) by the polishing brush 150 from the outer peripheral side. .

すなわち、研磨ブラシ150と積層ワーク140との相対移動に起因する圧力変化によって、図10中の矢印Xで示すように、積層ワーク140の外周側に存在するスラリが、スラリ導入スペーサ160の貫通供給孔163を介して研磨作業域に供給される。
これにより、積層ワーク140の上端からだけではなく、積層ワーク140の途中から(例えば50枚ごとに)下部の研磨作業域にも新鮮なスラリが供給されることとなる。このため、積層ワーク140の中心孔141の内周面(円盤状基板10の内周面)を、その上下方向においてより均等に研磨することができる。また、研磨作業域に多くのスラリが供給されるため、研磨作業効率が向上し、研磨作業時間を短縮することができる。
That is, due to the pressure change caused by the relative movement between the polishing brush 150 and the laminated workpiece 140, the slurry existing on the outer peripheral side of the laminated workpiece 140 is supplied through the slurry introduction spacer 160 as shown by the arrow X in FIG. It is supplied to the polishing work area through the hole 163.
Thus, fresh slurry is supplied not only from the upper end of the laminated workpiece 140 but also from the middle of the laminated workpiece 140 (for example, every 50 sheets) to the lower polishing work area. For this reason, the inner peripheral surface of the center hole 141 of the laminated workpiece 140 (the inner peripheral surface of the disk-shaped substrate 10) can be more evenly polished in the vertical direction. In addition, since a large amount of slurry is supplied to the polishing work area, the polishing work efficiency is improved and the polishing work time can be shortened.

ここで、このスラリ導入スペーサ160の貫通供給孔163を介した研磨作業域へのスラリの供給は、貫通供給孔163の外側にスラリが存在すれば足りる。従って、本実施の形態では、2個のスラリ導入スペーサ160が存在する位置まで、スラリが積層ワーク140の外周面を伝って流下していればよい。つまり、カバー300全体にスラリが充満してその中に積層ワーク140が完全に浸漬していることを要さない。
積層ワーク140の外周とカバー300との間にスラリを流入させる流通間隙142の間隔と、カバー300の下縁近傍に形成される排出孔301の径および数は、このような作用によってスラリが良好に供給されるように設定される。
Here, it is sufficient for the slurry to be supplied to the polishing work area via the through supply hole 163 of the slurry introduction spacer 160 if the slurry exists outside the through supply hole 163. Therefore, in the present embodiment, it is sufficient that the slurry flows down along the outer peripheral surface of the laminated workpiece 140 to the position where the two slurry introduction spacers 160 exist. That is, it is not necessary that the entire cover 300 is filled with slurry and the laminated workpiece 140 is completely immersed therein.
The distance between the flow gap 142 for allowing the slurry to flow between the outer periphery of the laminated workpiece 140 and the cover 300 and the diameter and number of the discharge holes 301 formed in the vicinity of the lower edge of the cover 300 provide good slurry. Is set to be supplied.

つぎに、上述した研磨装置100にて実行される内周研磨工程について、更に詳細に説明する。
図11は、内周研磨工程の流れを示すフローチャートである。
内周研磨工程では、まず、円盤状基板10を取り付け治具(センタリングシャフト232)に嵌合して順次積層する(ステップ101)。
ここで、円盤状基板10の所定枚数(例えば50枚)毎に、スラリ導入スペーサ160を介装し(ステップ102)、円盤状基板10の所定枚数(例えば150枚)の積層を完了する(ステップ103)。
Next, the inner periphery polishing process executed by the polishing apparatus 100 described above will be described in more detail.
FIG. 11 is a flowchart showing the flow of the inner circumference polishing step.
In the inner periphery polishing step, first, the disk-shaped substrate 10 is fitted into a mounting jig (centering shaft 232) and sequentially laminated (step 101).
Here, a slurry introduction spacer 160 is interposed for every predetermined number of disk-shaped substrates 10 (for example, 50 sheets) (step 102), and the stacking of the predetermined number of disk-shaped substrates 10 (for example 150 sheets) is completed (step). 103).

つぎに、取り付け治具に重ねられ積層された円盤状基板10をホルダ200にセットして積層ワーク140を形成する(ステップ104)。
ついで、その積層ワーク140にカバー300を装着する(ステップ105)。
そして、カバー300が装着された積層ワーク140を、研磨装置100の回転テーブル130に装着する(ステップ106)。
以上の工程で、研磨装置100への積層ワーク140の取り付けが終了する。
Next, the disk-shaped substrate 10 stacked on the mounting jig is set on the holder 200 to form a stacked workpiece 140 (step 104).
Next, the cover 300 is attached to the laminated workpiece 140 (step 105).
Then, the laminated workpiece 140 to which the cover 300 is attached is attached to the rotary table 130 of the polishing apparatus 100 (step 106).
With the above steps, the attachment of the laminated workpiece 140 to the polishing apparatus 100 is completed.

尚、前述したように、積層ワーク140にカバー300を装着するステップ(S105)は、積層ワーク140を研磨装置100の回転テーブル130に装着するステップ(S106)の後としても良い。また、研磨装置100の研磨ヘッド120への研磨ブラシ150の装着(チャック121による研磨ブラシ150の把持)は、上記工程の前後に適宜設定する。   As described above, the step of attaching the cover 300 to the laminated workpiece 140 (S105) may be after the step of attaching the laminated workpiece 140 to the rotary table 130 of the polishing apparatus 100 (S106). Further, the mounting of the polishing brush 150 to the polishing head 120 of the polishing apparatus 100 (the holding of the polishing brush 150 by the chuck 121) is appropriately set before and after the above process.

ついで、ポンプを駆動してスラリ供給ノズル123からスラリを積層ワーク140の上面に吐出させる(ステップ107)。そして、積層ワーク140の中心孔141およびカバー300の内部(積層ワーク140の外周面)にスラリが流下する状態で、研磨機構110の研磨ヘッド120を下降させて、その研磨ヘッド120によって支持される研磨ブラシ150を積層ワーク140の中心孔141に挿入する(ステップ108)。   Next, the pump is driven to discharge the slurry from the slurry supply nozzle 123 onto the upper surface of the laminated workpiece 140 (step 107). Then, the polishing head 120 of the polishing mechanism 110 is lowered and supported by the polishing head 120 in a state where the slurry flows into the center hole 141 of the stacked workpiece 140 and the inside of the cover 300 (the outer peripheral surface of the stacked workpiece 140). The polishing brush 150 is inserted into the center hole 141 of the laminated workpiece 140 (step 108).

この状態にて、スラリを供給しながら、研磨ブラシ150を所定方向(第1の方向)に回転させ、積層ワーク140(回転テーブル130)を研磨ブラシ150とは逆方向(第2の方向)に回転させて研磨を行う(ステップ109)。またこのとき、図10の白矢印に示すように、研磨ブラシ150を積層ワーク140の軸方向(上下方向)に往復移動させる(ステップ110)。このように往復移動させることによって、積層ワーク140に接触する研磨ブラシ150の位置を変化させ、研磨ブラシ150の同一位置によって積層ワーク140の同一の箇所を研磨することによる研磨の偏りを防止し、より均一化された研磨が可能となる。この研磨作業を予め定められた研磨時間行い(ステップ111)、研磨時間が経過すると、研磨装置を停止させる(ステップ112)。
その後、積層ワーク140を回転テーブル130から取り外し(ステップ113)、更に、ホルダ200から円盤状基板10を装着時とは逆の工程で取り外す(ステップ114)。
In this state, while supplying the slurry, the polishing brush 150 is rotated in a predetermined direction (first direction), and the laminated workpiece 140 (the rotary table 130) is rotated in the direction opposite to the polishing brush 150 (second direction). Polishing is performed by rotating (step 109). At this time, as indicated by the white arrow in FIG. 10, the polishing brush 150 is reciprocated in the axial direction (vertical direction) of the laminated workpiece 140 (step 110). By reciprocating in this way, the position of the polishing brush 150 in contact with the laminated workpiece 140 is changed, and the unevenness of polishing caused by polishing the same portion of the laminated workpiece 140 by the same position of the polishing brush 150 is prevented. More uniform polishing is possible. This polishing operation is performed for a predetermined polishing time (step 111), and when the polishing time has elapsed, the polishing apparatus is stopped (step 112).
Thereafter, the laminated workpiece 140 is removed from the turntable 130 (step 113), and further, the disk-shaped substrate 10 is removed from the holder 200 in the reverse process to that at the time of mounting (step 114).

つぎに、本実施の形態の構成(以下本願構成と称す)と、従来構成である比較例とを比較実験した結果を説明する。
実験は、下記のごとき条件で研磨作業を行い、その後、円盤状基板10の全数または所定数をサンプリングして内周の直径を計測した。
本願構成では、円盤状基板10を150枚積層し、50枚ごとにスラリ導入スペーサ160を介装した。すなわち、スラリ導入スペーサ160は2個用いた。
図12は、その実験結果を示し、(a)は本願構成によって研磨したもの、(b)は比較例によって研磨したものである。横軸は積層した円盤状基板10の位置(上部〜下部)を示し、縦軸は被研磨面の内径(円盤状基板10の内径)を示している。本願構成についてはa−1〜a−9の合計9回の試験を実施し、比較例についてはb−1〜b−3の合計3回の試験を実施した。
Next, the results of a comparative experiment between the configuration of the present embodiment (hereinafter referred to as the present configuration) and a comparative example that is a conventional configuration will be described.
In the experiment, the polishing operation was performed under the following conditions, and then the total number or a predetermined number of the disk-shaped substrates 10 were sampled to measure the inner diameter.
In the configuration of the present application, 150 disc-like substrates 10 were stacked, and a slurry introduction spacer 160 was interposed for every 50 substrates. That is, two slurry introduction spacers 160 were used.
FIG. 12 shows the experimental results, where (a) is polished by the configuration of the present application, and (b) is polished by a comparative example. The horizontal axis indicates the position (upper to lower) of the stacked disk-shaped substrates 10, and the vertical axis indicates the inner diameter of the surface to be polished (the inner diameter of the disk-shaped substrate 10). A total of nine tests, a-1 to a-9, were performed for the configuration of the present application, and a total of three tests, b-1 to b-3, were performed for the comparative example.

実験条件(共通)は、下記の通りである。
○円盤状基板(1.89インチガラス磁気ディスク)
材料:結晶化ガラス
外径:48mm
内径:12mm
厚さ:0.7mm
○ワーク積層体
積層した円盤状基板の数:150枚
測定サンプル数:55(抜き取り)〜150(全数)
回転数:55rpm
○使用研磨ブラシ
外径:φ13
材質:66ナイロン
線径:0.90mm
回転数:1500rpm
揺動速度:240mm/分
○研磨ブラシ切り込み量
0.5mm
この研磨ブラシ切り込み量とは、研磨ブラシ150の中心をワーク積層体140の中心に対してズラした(切り込んだ)量である。
○スラリ(研磨液)
比重:1.2
○加工時間
14〜28分(所定の研磨量を基準に設定)
Experimental conditions (common) are as follows.
-Disc substrate (1.89 inch glass magnetic disk)
Material: Crystallized glass Outer diameter: 48mm
Inner diameter: 12mm
Thickness: 0.7mm
○ Work Laminate Number of laminated disk-shaped substrates: 150 Number of measurement samples: 55 (sampling) to 150 (total number)
Rotation speed: 55rpm
○ Used polishing brush outer diameter: φ13
Material: 66 nylon Wire diameter: 0.90mm
Rotation speed: 1500rpm
Swing speed: 240mm / min
○ Abrasive brush cutting depth 0.5mm
The amount of cutting of the polishing brush is an amount by which the center of the polishing brush 150 is displaced (cut) from the center of the workpiece laminate 140.
○ Slurry (polishing liquid)
Specific gravity: 1.2
○ Processing time: 14 to 28 minutes (set based on a predetermined polishing amount)

実験の結果、(b)に示す比較例(従来構成)では、円盤状基板10の配置位置で(上部と下部とで)、内径に略5/1000mmの差が生じた。これに対して、本実施の形態を適用した構成では、上部と下部との内径差を略2.5/1000mm以下に抑えることができた。また、所定の研磨量の加工に要する時間も、比較例が平均で25.3分であったのに対して、本実施の形態では19.2分と約75%に短縮することができた。これにより、本構成の有効性が確認できた。
尚、本願構成であっても、下部の円盤状基板10の内径が小さくなる傾向がある。これは、スラリ導入スペーサ160の介装位置を下側に偏在させ、また、設ける数を増やし、下部へのスラリの供給を促進させること等で改善することが可能である。
As a result of the experiment, in the comparative example (conventional configuration) shown in (b), there was a difference of about 5/1000 mm in the inner diameter at the position where the disk-shaped substrate 10 was arranged (upper and lower). On the other hand, in the configuration to which the present embodiment is applied, the inner diameter difference between the upper part and the lower part can be suppressed to about 2.5 / 1000 mm or less. In addition, the time required for processing a predetermined polishing amount was 25.3 minutes on average in the comparative example, whereas in this embodiment, it was reduced to about 75%, 19.2 minutes. . This confirmed the effectiveness of this configuration.
Even in the configuration of the present application, the inner diameter of the lower disk-shaped substrate 10 tends to be small. This can be improved by unevenly disposing the interposed position of the slurry introduction spacer 160, increasing the number of the spacers to be provided, and promoting the supply of the slurry to the lower portion.

以上、詳述したように、本実施の形態によれば、積層ワーク140を覆うカバー300によって、積層ワーク140の積層途中(スラリ導入スペーサ160)から中心孔141にスラリを供給することができる。
ここで、一般に、限られた量の研磨液で研磨作業を行う場合には、下部に行くほど研磨液に含まれる砥粒が摩滅して研磨機能が低下する。その結果、積層ワーク140の上部と下部とでは研磨の進捗が異なることとなり、積層ワーク140の中心孔141が下側に向かって先細りのテーパ状を呈する。つまり、上部では研磨の進行が速く大径化する一方、下部では研磨の進行が遅く相対的に小径の状態に留まる。このため、上部に位置した円盤状基板10と下部に位置した円盤状基板10とで等しい研磨仕上げ精度が得られず、精度にバラツキを生じてしまう。
しかしながら、本実施の形態によれば、従来ではスラリが供給され難かった下部の研磨作業域にも新鮮なスラリが供給されることとなり、積層ワーク140の中心孔141の内周面(円盤状基板10の内周面)の研磨を、積層ワーク140の上下方向において均等に行うことができる。また、研磨作業域にスラリを潤沢に供給することができるために研磨作業効率が向上し、研磨作業時間を短縮することができる。
なお、本願発明は上記実施の形態に示す構成に限定されるものではなく、適宜変更可能なものである。
As described above in detail, according to the present embodiment, slurry can be supplied to the center hole 141 from the middle of the laminated workpiece 140 (slurry introduction spacer 160) by the cover 300 that covers the laminated workpiece 140.
Here, in general, when a polishing operation is performed with a limited amount of polishing liquid, the abrasive grains contained in the polishing liquid are worn away and the polishing function is lowered toward the lower part. As a result, the progress of polishing differs between the upper part and the lower part of the laminated work 140, and the center hole 141 of the laminated work 140 has a tapered shape that tapers downward. In other words, the polishing progresses quickly and increases in diameter in the upper part, while the polishing progresses slowly in the lower part and remains in a relatively small diameter state. For this reason, the same polishing finishing accuracy cannot be obtained between the disc-like substrate 10 located at the upper portion and the disc-like substrate 10 located at the lower portion, resulting in variations in accuracy.
However, according to the present embodiment, fresh slurry is also supplied to the lower polishing work area where it has conventionally been difficult to supply slurry, and the inner peripheral surface (disk-shaped substrate) of the center hole 141 of the laminated workpiece 140 is supplied. 10 inner peripheral surface) can be evenly polished in the vertical direction of the laminated workpiece 140. Further, since the slurry can be sufficiently supplied to the polishing work area, the polishing work efficiency is improved and the polishing work time can be shortened.
In addition, this invention is not limited to the structure shown in the said embodiment, It can change suitably.

(a)〜(d)は、本実施の形態が適用される円盤状基板(ディスク基板)の製造工程を示した図である。(A)-(d) is the figure which showed the manufacturing process of the disk shaped board | substrate (disk board | substrate) to which this Embodiment is applied. (e)〜(h)は、本実施の形態が適用される円盤状基板(ディスク基板)の製造工程を示した図である。(E)-(h) is the figure which showed the manufacturing process of the disk shaped board | substrate (disk board | substrate) to which this Embodiment is applied. 研磨装置の外観斜視図である。1 is an external perspective view of a polishing apparatus. 研磨機構の縦断面図である。It is a longitudinal cross-sectional view of a grinding | polishing mechanism. 研磨機構が用いる研磨ブラシを示す斜視図である。It is a perspective view which shows the grinding | polishing brush which a grinding | polishing mechanism uses. 研磨ブラシの軸方向拡大断面図である。It is an axial direction expanded sectional view of a polishing brush. 積層ワークの全体斜視図である。It is the whole laminated work perspective view. 円盤状基板の積層過程を示す斜視図である。It is a perspective view which shows the lamination | stacking process of a disk shaped board | substrate. スラリ導入スペーサを示す図であり、(a)は斜視図、(b)は断面図である。It is a figure which shows a slurry introduction | transduction spacer, (a) is a perspective view, (b) is sectional drawing. 積層ワークへのカバーの装着を説明する図である。It is a figure explaining mounting | wearing of the cover to a laminated workpiece. 研磨作業中の積層ワークの断面図である。It is sectional drawing of the laminated workpiece in grinding | polishing operation | work. 内周研磨工程の流れを示すフローチャートである。It is a flowchart which shows the flow of an inner periphery grinding | polishing process. 本願構成と比較例とを比較実験した結果を説明する図である。It is a figure explaining the result of having conducted a comparative experiment with this application composition and a comparative example. 従来から行われていた円盤状基板の内周研磨方法を説明するための図である。It is a figure for demonstrating the inner periphery grinding | polishing method of the disk shaped board | substrate conventionally performed.

符号の説明Explanation of symbols

10…円盤状基板、12…開孔、100…研磨装置、123…スラリ供給ノズル、140…積層ワーク、150…研磨ブラシ、160…スラリ導入スペーサ(研磨液流入手段)、163…貫通供給孔、200…ホルダ、300…カバー DESCRIPTION OF SYMBOLS 10 ... Disk-shaped board | substrate, 12 ... Opening hole, 100 ... Polishing apparatus, 123 ... Slurry supply nozzle, 140 ... Laminate work, 150 ... Polishing brush, 160 ... Slurry introduction spacer (polishing liquid inflow means), 163 ... Through supply hole, 200 ... Holder, 300 ... Cover

Claims (8)

中心部に開孔を有する円盤状基板の内周面を研磨する研磨装置であって、
前記円盤状基板を複数枚積層させた積層ワークをセッティングするセッティング手段と、
前記積層ワークの前記円盤状基板の前記開孔に挿入されて回転するブラシと、
前記積層ワークを覆うカバー部材と、
前記カバー部材により覆われた前記積層ワークの前記円盤状基板の前記開孔に対して研磨液を流入する研磨液流入手段と
を備えた研磨装置。
A polishing apparatus for polishing an inner peripheral surface of a disc-shaped substrate having an opening in the center,
Setting means for setting a laminated work in which a plurality of the disk-shaped substrates are laminated;
A brush which is inserted into the opening of the disk-shaped substrate of the laminated workpiece and rotates,
A cover member covering the laminated workpiece;
A polishing apparatus comprising: a polishing liquid inflow means for flowing a polishing liquid into the opening of the disk-shaped substrate of the laminated work covered by the cover member.
前記セッティング手段は、装着された前記円盤状基板間に、中心に開孔と当該開孔と外周部とを連通させる連通部を備えた導入スペーサを挟んで前記積層ワークをセッティングし、
前記研磨液流入手段は、前記連通部を介して前記積層ワークの前記開孔に対して研磨液を流入させることを特徴とする請求項1に記載の研磨装置。
The setting means sets the laminated workpiece between the mounted disc-shaped substrates with an introduction spacer having a communication portion that communicates the opening and the outer periphery with the opening at the center,
The polishing apparatus according to claim 1, wherein the polishing liquid inflow unit causes the polishing liquid to flow into the opening of the laminated workpiece through the communication portion.
前記カバー部材は、研磨液を前記積層ワークの外周面に沿って前記導入スペーサまで導くように形成されてなることを特徴とする請求項2に記載の研磨装置。   The polishing apparatus according to claim 2, wherein the cover member is formed to guide the polishing liquid along the outer peripheral surface of the laminated workpiece to the introduction spacer. 前記カバー部材は、前記積層ワークの外周面との間に所定の空隙をもって当該積層ワークを覆うことを特徴とする請求項1に記載の研磨装置。   The polishing apparatus according to claim 1, wherein the cover member covers the laminated workpiece with a predetermined gap between the outer circumferential surface of the laminated workpiece. 前記カバー部材は、下端近傍に研磨液の排出孔を備えることを特徴とする請求項4に記載の研磨装置。   The polishing apparatus according to claim 4, wherein the cover member includes a polishing liquid discharge hole in the vicinity of a lower end thereof. 中心部に開孔を有する円盤状基板の内周面を研磨して円盤状基板を製造する円盤状基板の製造方法であって、
研磨の対象となる前記円盤状基板を複数枚積層した積層ワークを保持する保持工程と、
前記保持工程により保持された前記積層ワークの外周面をカバー部材で覆う工程と、
前記カバー部材で覆われ前記保持工程により保持された前記積層ワークの前記円盤状基板の前記開孔にブラシを挿入して当該ブラシを回転し、当該開孔に研磨液を流入させて研磨する研磨工程と、
を有する円盤状基板の製造方法。
A method for manufacturing a disk-shaped substrate, in which a disk-shaped substrate is manufactured by polishing an inner peripheral surface of a disk-shaped substrate having an opening in the center,
A holding step for holding a laminated work in which a plurality of the disk-shaped substrates to be polished are laminated;
Covering the outer peripheral surface of the laminated workpiece held by the holding step with a cover member;
Polishing by inserting a brush into the opening of the disk-shaped substrate of the laminated workpiece, which is covered with the cover member and held by the holding step, and rotating the brush to allow polishing liquid to flow into the opening. Process,
The manufacturing method of the disk-shaped board | substrate which has this.
前記保持工程は、装着された前記円盤状基板間に、中心に開孔と当該開孔と外周部とを連通させる連通部とを備えた導入スペーサを挟み、
前記研磨工程は、前記カバー部材を用いて、前記導入スペーサの前記連通部を介して前記円盤状基板の前記開孔に研磨液を流入させることを特徴とする請求項6に記載の円盤状基板の製造方法。
The holding step sandwiches an introduction spacer having an opening and a communicating portion that communicates the opening and the outer peripheral portion at the center between the mounted disc-shaped substrates,
The disk-shaped substrate according to claim 6, wherein in the polishing step, a polishing liquid is caused to flow into the opening of the disk-shaped substrate through the communication portion of the introduction spacer using the cover member. Manufacturing method.
前記保持工程は、
前記円盤状基板を積層保持する基板ホルダに当該円盤状基板を装着する工程をさらに有し、前記円盤状基板を積層保持した当該基板ホルダを保持することを特徴とする請求項6に記載の円盤状基板の製造方法。
The holding step includes
The disk according to claim 6, further comprising a step of mounting the disk-shaped substrate on a substrate holder for stacking and holding the disk-shaped substrate, and holding the substrate holder on which the disk-shaped substrate is stacked and held. Method for manufacturing a substrate.
JP2006316342A 2006-11-22 2006-11-22 Polishing apparatus and disk-shaped substrate manufacturing method Expired - Fee Related JP4252087B2 (en)

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Family Cites Families (1)

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