JP2008043762A - 動的焦点スポット偏向時のｘ線管出力の減定格を少なくする方法 - Google Patents

動的焦点スポット偏向時のｘ線管出力の減定格を少なくする方法 Download PDF

Info

Publication number
JP2008043762A
JP2008043762A JP2007208753A JP2007208753A JP2008043762A JP 2008043762 A JP2008043762 A JP 2008043762A JP 2007208753 A JP2007208753 A JP 2007208753A JP 2007208753 A JP2007208753 A JP 2007208753A JP 2008043762 A JP2008043762 A JP 2008043762A
Authority
JP
Japan
Prior art keywords
electron beam
anode
ray tube
focal spot
computer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2007208753A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008043762A5 (enExample
Inventor
Sergio Lemaitre
セルジオ・ルメットル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2008043762A publication Critical patent/JP2008043762A/ja
Publication of JP2008043762A5 publication Critical patent/JP2008043762A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/36—Temperature of anode; Brightness of image power
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/52—Target size or shape; Direction of electron beam, e.g. in tubes with one anode and more than one cathode

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • X-Ray Techniques (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2007208753A 2006-08-16 2007-08-10 動的焦点スポット偏向時のｘ線管出力の減定格を少なくする方法 Pending JP2008043762A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/465,110 US7945024B2 (en) 2006-08-16 2006-08-16 Method for reducing X-ray tube power de-rating during dynamic focal spot deflection

Publications (2)

Publication Number Publication Date
JP2008043762A true JP2008043762A (ja) 2008-02-28
JP2008043762A5 JP2008043762A5 (enExample) 2012-08-16

Family

ID=38955115

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007208753A Pending JP2008043762A (ja) 2006-08-16 2007-08-10 動的焦点スポット偏向時のｘ線管出力の減定格を少なくする方法

Country Status (3)

Country Link
US (1) US7945024B2 (enExample)
JP (1) JP2008043762A (enExample)
DE (1) DE102007038508A1 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010063758A (ja) * 2008-09-12 2010-03-25 Toshiba Corp Ｘ線ｃｔ装置及びｘ線ｃｔ装置のデータ収集方法
US8300768B2 (en) 2009-08-28 2012-10-30 Kabushiki Kaisha Toshiba X-ray tube and X-ray CT apparatus
JP2015522910A (ja) * 2012-05-22 2015-08-06 コーニンクレッカ フィリップス エヌ ヴェ Ｘ線管の回転標的ディスクの周辺方向での動的焦点スポットのジャンプの間での電子ビームのブランキング
JP2017531903A (ja) * 2014-10-06 2017-10-26 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線発生装置のための修正構成

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102119585B (zh) * 2008-05-22 2016-02-03 弗拉迪米尔·叶戈罗维奇·巴拉金 带电粒子癌症疗法患者定位的方法和装置
US9058910B2 (en) * 2008-05-22 2015-06-16 Vladimir Yegorovich Balakin Charged particle beam acceleration method and apparatus as part of a charged particle cancer therapy system
US8841866B2 (en) 2008-05-22 2014-09-23 Vladimir Yegorovich Balakin Charged particle beam extraction method and apparatus used in conjunction with a charged particle cancer therapy system
US8901509B2 (en) * 2008-05-22 2014-12-02 Vladimir Yegorovich Balakin Multi-axis charged particle cancer therapy method and apparatus
WO2009142544A2 (en) * 2008-05-22 2009-11-26 Vladimir Yegorovich Balakin Charged particle cancer therapy beam path control method and apparatus
CA2725315C (en) * 2008-05-22 2015-06-30 Vladimir Yegorovich Balakin X-ray method and apparatus used in conjunction with a charged particle cancer therapy system
US8896239B2 (en) * 2008-05-22 2014-11-25 Vladimir Yegorovich Balakin Charged particle beam injection method and apparatus used in conjunction with a charged particle cancer therapy system
CN102119586B (zh) * 2008-05-22 2015-09-02 弗拉迪米尔·叶戈罗维奇·巴拉金 多场带电粒子癌症治疗方法和装置
US8761342B2 (en) * 2008-12-08 2014-06-24 Koninklijke Philips N.V. Compensation of anode wobble for X-ray tubes of the rotary-anode type
BRPI0924903B8 (pt) 2009-03-04 2021-06-22 Zakrytoe Aktsionernoe Obshchestvo Protom aparelho para geração de um feixe de íons negativos para uso em uma terapia por radiação de partículas carregadas e método para geração de um feixe de íons negativos para uso com terapia por radiação de partículas carregadas
US8385506B2 (en) * 2010-02-02 2013-02-26 General Electric Company X-ray cathode and method of manufacture thereof
US8938050B2 (en) 2010-04-14 2015-01-20 General Electric Company Low bias mA modulation for X-ray tubes
US10290460B2 (en) 2016-09-07 2019-05-14 General Electric Company X-ray tube with gridding electrode
US11058893B2 (en) * 2017-06-02 2021-07-13 Precision Rt Inc. Kilovoltage radiation therapy
CN110664420B (zh) * 2019-10-11 2023-04-07 上海联影医疗科技股份有限公司 焦点校正方法、装置、计算机设备和计算机可读存储介质
JP7465697B2 (ja) * 2020-03-24 2024-04-11 住友重機械工業株式会社 荷電粒子の照射制御装置
EP4567856A1 (en) * 2023-12-07 2025-06-11 Koninklijke Philips N.V. Electron beam focal spot

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4631742A (en) * 1985-02-25 1986-12-23 General Electric Company Electronic control of rotating anode microfocus x-ray tubes for anode life extension
US6778633B1 (en) * 1999-03-26 2004-08-17 Bede Scientific Instruments Limited Method and apparatus for prolonging the life of an X-ray target
JP2005528773A (ja) * 2002-05-31 2005-09-22 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ Ｘ線管

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4631742A (en) * 1985-02-25 1986-12-23 General Electric Company Electronic control of rotating anode microfocus x-ray tubes for anode life extension
US6778633B1 (en) * 1999-03-26 2004-08-17 Bede Scientific Instruments Limited Method and apparatus for prolonging the life of an X-ray target
JP2005528773A (ja) * 2002-05-31 2005-09-22 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ Ｘ線管

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010063758A (ja) * 2008-09-12 2010-03-25 Toshiba Corp Ｘ線ｃｔ装置及びｘ線ｃｔ装置のデータ収集方法
US8300768B2 (en) 2009-08-28 2012-10-30 Kabushiki Kaisha Toshiba X-ray tube and X-ray CT apparatus
JP2015522910A (ja) * 2012-05-22 2015-08-06 コーニンクレッカ フィリップス エヌ ヴェ Ｘ線管の回転標的ディスクの周辺方向での動的焦点スポットのジャンプの間での電子ビームのブランキング
JP2017531903A (ja) * 2014-10-06 2017-10-26 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線発生装置のための修正構成

Also Published As

Publication number Publication date
US20080043916A1 (en) 2008-02-21
DE102007038508A1 (de) 2008-02-21
US7945024B2 (en) 2011-05-17

Similar Documents

Publication Publication Date Title
JP2008043762A (ja) 動的焦点スポット偏向時のｘ線管出力の減定格を少なくする方法
JP5877985B2 (ja) 電子ビーム・システムを動作させる方法及びシステム
CN101996837B (zh) 控制用于产生x射线的电子束的装置和方法以及x射线管
JP2004528682A (ja) ２つのフィラメントにより焦点が静電制御されるｘ線管
US20090060140A1 (en) Focal spot temperature reduction using three-point deflection
DE102010060869A1 (de) Röntgenröhre zur Mikrosekunden-Röntgenintensitätsumschaltung
US11244801B2 (en) X-ray generation device and X-ray image capture system
US8923484B2 (en) Motion correction system and method for an x-ray tube
JP5984367B2 (ja) 放射線発生装置及びそれを用いた放射線撮影システム
JP2021052003A (ja) 超高速ｔｅｍ用途のための高速ブランカーのあるパルス化ｃｆｅ電子源
WO2010058330A1 (en) X-ray tube with switchable grid for gating of electron beam current during voltage breakdown
EP4059037A1 (en) Constant discharge current bleeder
TW536737B (en) Device for generating electron beams and exposure device using electron beams
JP4828895B2 (ja) Ｘ線管装置の電圧印加方法およびｘ線管装置
CN115793765A (zh) 一种有源电流控制电路
CN103582275B (zh) 异步运行焦斑抖动降低的旋转阳极的方法和x射线辐射器
EP3204959B1 (en) Modification arrangement for an x-ray generating device
CN114402411B (zh) 平衡针对双能量x射线成像系统的x射线输出
EP4567856A1 (en) Electron beam focal spot
Wang et al. Investigation on explosive emission and attenuation processes of an intense current electron beam diode with annular graphite cathode via 24 framing camera
KR101092213B1 (ko) Ｘ선 발생장치 및 그의 동작방법
EP3872835B1 (de) Rotierbare röntgenröhre
Trubitsyn et al. High-power microfocus X-ray installation
WO2025153337A1 (en) Adjustment of anode frequency based on scan operation
JPS585950A (ja) Ｘ線管

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20100805

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20100805

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110801

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120702

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120703

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120928

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20121106