JP2007335260A - Connection structure between connection terminal of substrate, and covered conductor wire - Google Patents

Connection structure between connection terminal of substrate, and covered conductor wire Download PDF

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JP2007335260A
JP2007335260A JP2006166531A JP2006166531A JP2007335260A JP 2007335260 A JP2007335260 A JP 2007335260A JP 2006166531 A JP2006166531 A JP 2006166531A JP 2006166531 A JP2006166531 A JP 2006166531A JP 2007335260 A JP2007335260 A JP 2007335260A
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connection
conductor wire
substrate
connection terminal
wire
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Yoshisato Kurahashi
義学 倉橋
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Epson Imaging Devices Corp
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Epson Imaging Devices Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To secure soldering reliability regarding a connecting structure between a connection terminal of a substrate and a covered conductor wire when an especially thin covered wire is used. <P>SOLUTION: A connection wire 20 is soldered to the connection terminal 14 of the substrate 12, and a solder connection part 40 is formed. Here, the connection wire 20 has a conductor wire 24 exposed from the covering at the tip of the covered conductor wire 16, and a thin metal plate 18 for pin contact is caulked there partly including the covering 22. The length of the metal thin plate 18 for the pin contact is longer than that which is determined based on the size of the connection terminal 14. The caulked metal thin plate 18 for the pin contact becomes to have a pin-shaped metal thin plate 30. The solder connection part 40 is formed by means that the pin-shaped thin metal plate 30 including the conductor wire 24 and the connection terminal 14 are connected to each other by soldering at a wider contact area than that of the conductor wire 24. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、基板の接続端子と被覆導体線との接続構造に係り、特に細い被覆導体線を基板の接続端子に半田付けで接続する基板の接続端子と被覆導体線との接続構造に関する。   The present invention relates to a connection structure between a connection terminal of a substrate and a covered conductor wire, and more particularly to a connection structure between the connection terminal of the substrate and the covered conductor wire that connects a thin covered conductor wire to the connection terminal of the substrate by soldering.

小型の携帯情報機器には、情報を表示するディスプレイとして液晶表示素子が用いられ、これに電子部品を実装するために、COG(Chip on Glass)技術、あるいはFPC(Flexible Print Circuit)等を用いた細密な実装技術が用いられている。これらは、多数の接続箇所をまとめて実装するのに適しているが、基板上の1つ2つあるいは数個の接続箇所と外部の接続箇所とを結ぶためにこれらの技術を用いると専用の装置、治具等を揃える必要があり、かえって手間がかかり、コストも高くなる。このような事情から、簡単な半田付け装置を用いて基板の接続端子とリード端子等の導体線との半田付けが行われることがある。   A liquid crystal display element is used as a display for displaying information in a small portable information device, and COG (Chip on Glass) technology or FPC (Flexible Print Circuit) is used to mount an electronic component on the display. Fine packaging technology is used. These are suitable for mounting a large number of connection points together, but if these technologies are used to connect one or two or several connection points on the board and external connection points, they are dedicated. It is necessary to prepare equipment, jigs, etc., which takes time and increases the cost. Under such circumstances, there are cases where the connection terminals of the substrate and the conductor wires such as the lead terminals are soldered using a simple soldering apparatus.

基板の接続端子と導体線との間の半田付けの信頼性を上げるには、半田と接続端子及び導体線との間の接触面積を広くすることと、半田の濡れ性の管理が必要であることが知られている。半田と対象物との間の接触面積が少ないと、接合面積が少ないので、接続強度の確保が困難になる。また、半田の濡れ性が悪いと接続強度が低く、信頼性が低下する。そのために半田の濡れ性の評価が必要である。半田の濡れ性の評価として、フィレットを観察することが行われる。フィレットとは、リード端子の側面に、半田が高温状態で液化し、表面張力で吸い上げられて形成される状態のことで、半田の濡れ性がよいと、フィレットがなだらかに変化する。したがって、フィレットの観察によって半田の濡れ性を判断できる。   In order to increase the reliability of soldering between the connection terminal of the board and the conductor wire, it is necessary to widen the contact area between the solder, the connection terminal and the conductor wire, and to manage the wettability of the solder. It is known. If the contact area between the solder and the object is small, it is difficult to ensure the connection strength because the bonding area is small. Further, if the solder wettability is poor, the connection strength is low and the reliability is lowered. Therefore, it is necessary to evaluate solder wettability. As an evaluation of the wettability of the solder, a fillet is observed. A fillet is a state in which solder is liquefied on the side surface of a lead terminal at a high temperature and sucked up by surface tension. When the solder wettability is good, the fillet changes smoothly. Therefore, the wettability of the solder can be determined by observing the fillet.

例えば、特許文献1には、液晶表示素子のガラス基板の一辺端に延出形成された外部接続用の電極端子に接続する構造として、従来例としては金属薄板よりなるクリップピンで挟持する方法、金属薄板を平板に打ち抜いたフラットピン端子を電極端子に半田付けする方法が述べられ、前者では接触面積が少なく、後者においてはパターン間隔が小さくなったときに隣接電極端子同士を短絡してしまう課題を指摘している。そして、フラットピン端子に小円孔からなる切欠部、あるいは両側辺に波形等の連続凹みを持って形成した切欠部を設けることで、十分な接触面積でありながら半田のはみ出しを防ぐことができることが開示されている。   For example, in Patent Document 1, as a structure for connecting to an electrode terminal for external connection formed to extend on one side edge of a glass substrate of a liquid crystal display element, as a conventional example, a method of sandwiching with a clip pin made of a thin metal plate, A method of soldering a flat pin terminal obtained by punching a thin metal plate to a flat electrode is described. The former has a small contact area, and the latter has a problem of short-circuiting adjacent electrode terminals when the pattern interval is small. Point out. And it is possible to prevent the solder from protruding while providing a sufficient contact area by providing notches with small circular holes on the flat pin terminals or notches formed with continuous depressions such as corrugations on both sides. Is disclosed.

また、特許文献2には、半田の濡れ性の判定を確実にし、半田付け後の接続強度を確保するため、対向する半田付け端子において、一方の半田付け端子の端子幅が両端部から中央部に向かって徐々に狭くなった鼓形状として、一方の半田付け端子の幅又は面積を他方の半田付け端子の幅又は面積より狭くすることが開示されている。   Further, in Patent Document 2, in order to ensure the determination of the wettability of the solder and ensure the connection strength after soldering, the terminal width of one soldering terminal is the center part from both ends to the opposite soldering terminal. As a drum shape gradually becoming narrower toward the surface, it is disclosed that the width or area of one soldering terminal is made narrower than the width or area of the other soldering terminal.

実開昭63−115120号公報Japanese Utility Model Publication No. 63-115120 特開平4−32166号公報Japanese Patent Laid-Open No. 4-32166

上記のように、数少ない接続箇所の接合には、簡単な半田付け装置を用いて基板の接続端子と導体線との間の半田付けを行うことができる。ところで、小型の携帯情報機器において、COG技術やFPC接続を用いないで、簡単な半田付け装置で半田付けを行う必要があるところは、細かい半田付けであることが多い。たとえば、特に細い導体線を用いて、狭い面積の接続端子上で半田付けを行うことが要求される。このような場合、細い導体線であることもあり、半田に対する接触面積をあまり多くとれない上、FPC配線のように半田付け中央部に対して半田付け端部の幅を広くすることができないため、半田付け端部における強度を確保することが困難となる。また、狭い面積の接続端子上であるので、半田に対する接触面積を多くとると、導体線上のフィレットを観察することができなくなる。このように、特に細い導体線を基板の接続端子に半田付けで接続する場合に、半田付けの信頼性の確保が困難となる。   As described above, a small number of connection locations can be joined by soldering between the connection terminals of the substrate and the conductor wires using a simple soldering apparatus. By the way, in a small portable information device, a part that needs to be soldered with a simple soldering device without using COG technology or FPC connection is often fine soldering. For example, it is required to perform soldering on a connection terminal having a small area using a particularly thin conductor wire. In such a case, since it may be a thin conductor wire, the contact area with respect to the solder cannot be increased so much and the width of the soldering end portion cannot be increased with respect to the soldering central portion like the FPC wiring. It is difficult to ensure the strength at the soldering end. Further, since the connection terminals are on a small area, if the contact area with the solder is increased, the fillet on the conductor wire cannot be observed. As described above, it is difficult to ensure the reliability of soldering when particularly thin conductor wires are connected to the connection terminals of the substrate by soldering.

本発明の目的は、半田付けの信頼性を確保できる基板の接続端子と被覆導体線との接続構造を提供することである。他の目的は、特に細い導体線を用いる半田付けの信頼性を確保できる基板の接続端子と被覆導体線との接続構造を提供することである。   An object of the present invention is to provide a connection structure between a connection terminal of a substrate and a coated conductor wire that can ensure soldering reliability. Another object of the present invention is to provide a connection structure between a connection terminal of a substrate and a coated conductor wire that can ensure the reliability of soldering using a thin conductor wire.

本発明に係る基板の接続端子と被覆導体線との接続構造は、基板の接続端子と、被覆導体線の先端において被覆から導体線が露出され、露出された前記導体線と前記被覆の一部を含んで金属薄板部がカシメられた接続線と、前記接続端子上に配置された前記金属薄板部と前記接続端子とが半田により接続された接続部と、を有することを特徴とする。   In the connection structure between the connection terminal of the substrate and the covered conductor wire according to the present invention, the conductor wire is exposed from the coating at the connection terminal of the substrate and the tip of the covered conductor wire, and the exposed conductor wire and a part of the coating And a connection line in which the metal thin plate portion is crimped, and a connection portion in which the metal thin plate portion and the connection terminal arranged on the connection terminal are connected by solder.

また、前記接続線の前記導体線は、0.3mm以下の外径を有することが好ましい。また、前記接続線は、前記被覆を含む外径で0.8mm以下であることが好ましい。   Moreover, it is preferable that the said conductor wire of the said connection wire has an outer diameter of 0.3 mm or less. Moreover, it is preferable that the said connecting wire is 0.8 mm or less by the outer diameter containing the said coating | cover.

また、本発明に係る基板の接続端子と被覆導体線との接続構造において、前記基板は、液晶表示用バックライトモジュールの発光素子を搭載する基板であり、前記接続線は、液晶表示用バックライトモジュールと外部回路とを接続する接続線であることが好ましい。   In the connection structure between the connection terminal of the substrate and the covered conductor wire according to the present invention, the substrate is a substrate on which a light emitting element of a backlight module for liquid crystal display is mounted, and the connection line is a backlight for liquid crystal display. A connection line connecting the module and an external circuit is preferable.

上記構成により、接続線は、被覆導体線の先端において被覆から導体線が露出され、露出された導体線と被覆の一部を含んで金属薄板部がカシメられている。そして接続部は、接続端子上に配置された金属薄板部と前記接続端子とが半田により接続されている。被覆導体線の先端にカシメられた金属薄板部は、被覆が取り除かれて露出された導体線に比べ、外周面積も格段に広く、また強度も強い。そこで、これと基板の接続端子とを半田付けすれば、露出導体線の場合に比較し、半田と対象物との間の接触面積を各段に広く確保でき、接続強度を向上させることができる。また、半田のフィレットは、金属薄板部上において十分に観察できる。また、金属薄板の強度によって、例えば、繰り返し曲げ等に対し、露出導体線に比較し、格段に丈夫になる。したがって、半田付けの信頼性を向上させることができる。   With the above configuration, the connecting wire is exposed from the coating at the tip of the coated conductor wire, and the thin metal plate portion is crimped including the exposed conductor wire and a part of the coating. In the connection portion, the metal thin plate portion disposed on the connection terminal and the connection terminal are connected by solder. The thin metal plate portion crimped to the tip of the coated conductor wire has a significantly larger outer peripheral area and higher strength than the conductor wire exposed after the coating is removed. Therefore, if this is soldered to the connection terminal of the board, the contact area between the solder and the object can be secured widely in each stage and the connection strength can be improved as compared with the case of the exposed conductor wire. . The solder fillet can be sufficiently observed on the thin metal plate portion. Further, depending on the strength of the thin metal plate, for example, with respect to repeated bending or the like, it is much stronger than the exposed conductor wire. Therefore, the reliability of soldering can be improved.

また、接続線の導体線は、0.3mm以下の外径を有する。接続線は、被覆を含む外径で0.8mm以下である。これ以上の太さの場合は、通常の半田付け構造でも十分な信頼性を確保できる。したがって、上記構成によって、特に細い導体線を用いる場合に、半田付けの信頼性を確保できる。   The conductor wire of the connecting wire has an outer diameter of 0.3 mm or less. The connecting wire is 0.8 mm or less in outer diameter including the coating. If the thickness is larger than this, sufficient reliability can be ensured even with a normal soldering structure. Therefore, with the above configuration, it is possible to ensure the reliability of soldering when using a particularly thin conductor wire.

また、この接続構造は、液晶表示用バックライトモジュールの発光素子を搭載する基板に、外部回路と接続する接続線を半田付けするものである。発光素子搭載基板から外部に引き出される接続線は2本程度と少ない。したがって、小型携帯機器の実装に用いられるCOG技術やFPC接続法を適用するより、簡単な半田付け装置で半田付けを行う方法が適している。このような用途の場合に、上記構成によって、半田付けの信頼性を向上させることができる。   Further, this connection structure is to solder a connection line connected to an external circuit to a substrate on which a light emitting element of a backlight module for liquid crystal display is mounted. There are as few as two connection lines drawn out from the light emitting element mounting substrate. Therefore, a method of performing soldering with a simple soldering apparatus is more suitable than applying the COG technique or FPC connection method used for mounting small portable devices. In the case of such an application, the reliability of soldering can be improved by the above configuration.

以下に図面を用いて、本発明に係る実施の形態につき詳細に説明する。以下では、液晶表示用バックライトモジュールの発光素子を搭載する基板に、外部回路と接続する接続線を半田付けする場合を説明するが、これは一例であって、簡単な半田付け装置で半田付けを行うものであれば、それ以外の電子機器モジュールに接続線を半田付けする場合であってもよい。また、以下で述べる材質、寸法等は、説明のための一例であって、用途に応じ、それ以外の材質、寸法等を用いることができる。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In the following, the case of soldering a connection line connected to an external circuit to a substrate on which a light emitting element of a liquid crystal display backlight module is mounted is described as an example, and soldering is performed with a simple soldering device. If it is what performs this, the case where a connection line is soldered to other electronic device modules may be sufficient. The materials, dimensions, and the like described below are examples for explanation, and other materials, dimensions, and the like can be used depending on the application.

図1は、液晶表示用バックライトモジュール10の発光素子を搭載する基板12と、図示されていない外部回路とを電気的に接続するための接続構造を示す図である。ここでは、バックライトモジュール10の裏面側、つまり液晶表示パネルが貼り付けられバックライトの光が供給される表面側と反対側の裏面側が示されている。この裏面側のカバーが一部切り欠かれて、図示されていない発光素子が搭載される基板12の一部が露出し、そこに外部回路と接続される接続端子14が延ばされてきて配置されている。   FIG. 1 is a diagram showing a connection structure for electrically connecting a substrate 12 on which a light emitting element of a backlight module for liquid crystal display 10 is mounted and an external circuit (not shown). Here, the back surface side of the backlight module 10, that is, the back surface side opposite to the front surface side to which the liquid crystal display panel is attached and the light of the backlight is supplied is shown. A part of the back side cover is cut away to expose a part of the substrate 12 on which a light-emitting element (not shown) is mounted, and a connection terminal 14 connected to an external circuit is extended and arranged there. Has been.

接続端子14は、その先が図示されていない発光素子の端子に接続される矩形状の導体パターンで、例えば、銅配線の上に半田メッキ等が施されている。図1では、発光素子のプラス端子とマイナス端子に対応して2つの接続端子14が示されている。この接続端子14に、図示されていない外部回路と接続される接続線20が、簡単な半田付け装置によって半田付けされる。図1では、半田接続部40が示されている。   The connection terminal 14 is a rectangular conductor pattern that is connected to a terminal of a light emitting element (not shown). For example, solder plating or the like is performed on a copper wiring. In FIG. 1, two connection terminals 14 are shown corresponding to the plus terminal and the minus terminal of the light emitting element. A connection line 20 connected to an external circuit (not shown) is soldered to the connection terminal 14 by a simple soldering apparatus. In FIG. 1, the solder connection portion 40 is shown.

図2は、接続線20の構造、半田付けの方法を説明する図である。図2(a)は、接続線20を形成するための要素を示す図で、(b)は、接続線20の構造を説明する図である。(c)は、接続線20を基板12の接続端子14に半田付けを行った接続構造を説明する図である。図2は、別の観点からいえば、基板の接続端子と被覆導体線との間の接続方法の手順を示す図でもあるので、以下では、手順にそって、これらの要素の構造を説明する。   FIG. 2 is a diagram for explaining the structure of the connection line 20 and the soldering method. FIG. 2A is a diagram showing elements for forming the connection line 20, and FIG. 2B is a diagram for explaining the structure of the connection line 20. (C) is a diagram illustrating a connection structure in which the connection line 20 is soldered to the connection terminal 14 of the substrate 12. FIG. 2 is also a diagram showing a procedure of a connection method between the connection terminal of the substrate and the covered conductor wire from another viewpoint. In the following, the structure of these elements will be described along the procedure. .

基板の接続端子と接続線とを接続するには、まず、接続線を構成する部品を準備する(部品準備工程)。図2(a)には、準備された各部品の様子が示されている。すなわち、図2(a)の左側に被覆導体線16が示され、右側にピンコンタクト用金属薄板18が示されている。   In order to connect the connection terminal of the board and the connection line, first, a component constituting the connection line is prepared (component preparation step). FIG. 2A shows the state of each prepared component. That is, the coated conductor wire 16 is shown on the left side of FIG. 2A, and the pin contact metal thin plate 18 is shown on the right side.

被覆導体線16は、複数の導体単線を撚り線とした導体線24を適当な絶縁被覆材からなる被覆22で覆ったもので、その先端は被覆22が取り除かれて導体線24が露出している。被覆導体線16の太さは、これが接続される基板12の接続端子14の大きさ等で選択されるが、例えば、約3mm角以下の接続端子14の場合には、被覆22を含む外径で約0.8mm以下、導体線24の外径で約0.3mm以下のものが選択される。例えば、デファクトスタンダードとして、被覆を含む外径で0.38mm、導体線外径で0.24mmの被覆導体線のものを用いることができる。   The covered conductor wire 16 is obtained by covering a conductor wire 24 in which a plurality of single conductor wires are stranded wires with a coating 22 made of an appropriate insulating coating material, and the conductor wire 24 is exposed at the tip thereof by removing the coating 22. Yes. The thickness of the coated conductor wire 16 is selected depending on the size of the connection terminal 14 of the substrate 12 to which the coated conductor wire 16 is connected. For example, in the case of the connection terminal 14 of about 3 mm square or less, the outer diameter including the coating 22 Is about 0.8 mm or less, and the conductor wire 24 has an outer diameter of about 0.3 mm or less. For example, as a de facto standard, a coated conductor wire having an outer diameter including a coating of 0.38 mm and a conductor wire outer diameter of 0.24 mm can be used.

ピンコンタクト用金属薄板18は、小型コネクタの部品として用いられるもので、コネクタのメス側コンタクトに挿入するオス側コンタクトを形成するための部品である。具体的には、導体線の外周にこの金属薄板を巻き付けるように適当なカシメ治具を用いてカシメて取り付け、全体としてピン形状とするものである。図2(a)では、カシメ前のままの形状のピンコンタクト用金属薄板18の平面図と側面図が示されている。ピンコンタクト用金属薄板18は、デファクトスタンダードの被覆導体線の大きさに合わせてそれぞれ市販されているので、それをそのまま用いることができる。   The pin contact metal thin plate 18 is used as a component of a small connector, and is a component for forming a male contact inserted into the female contact of the connector. Specifically, it is attached by caulking with an appropriate caulking jig so that the thin metal plate is wound around the outer periphery of the conductor wire, and the whole is formed into a pin shape. FIG. 2A shows a plan view and a side view of the pin contact metal thin plate 18 in a shape as it is before crimping. Since the pin contact metal thin plate 18 is commercially available in accordance with the size of the de facto standard coated conductor wire, it can be used as it is.

市販のピンコンタクト用金属薄板18は、上記のようにコネクタに用いられるように設計されているので、その長さは、被覆導体線16の太さに比べて十分長い。そして、被覆導体線16を基板12の接続端子14に半田付けする際には、その接続端子14の大きさは、被覆導体線16の太さに対し、数倍程度の長さと幅である。したがって、通常の場合、市販のピンコンタクト用金属薄板18の長さは、半田付けに用いられる接続端子14の大きさで決まる長さに比べ、長くなる。   Since the commercially available pin contact metal thin plate 18 is designed to be used for a connector as described above, the length thereof is sufficiently longer than the thickness of the coated conductor wire 16. When the coated conductor wire 16 is soldered to the connection terminal 14 of the substrate 12, the size of the connection terminal 14 is about several times longer and wider than the thickness of the coated conductor wire 16. Therefore, in a normal case, the length of the commercially available pin contact metal thin plate 18 is longer than the length determined by the size of the connection terminal 14 used for soldering.

もちろん、これとは別に、被覆導体線16、あるいは基板12の接続端子14の形状、寸法等にあわせ、被覆導体線16の先端にカシメて取り付けることのできる金属薄板を準備し、これを用いるものとしてもよい。金属薄板の材質としては、例えば適当な金属メッキ等の表面処理が施された金属を用いることができ、その板厚は、例えば、0.1mm程度が好ましい。   Of course, apart from this, a metal thin plate that can be attached by crimping to the tip of the coated conductor wire 16 according to the shape, size, etc. of the coated conductor wire 16 or the connection terminal 14 of the substrate 12 is prepared and used. It is good. As the material of the metal thin plate, for example, a metal that has been subjected to surface treatment such as appropriate metal plating can be used, and the thickness is preferably about 0.1 mm, for example.

ピンコンタクト用金属薄板18の長さと、導体線24の長さの関係は、前者が後者より十分長くなるように設定するのが好ましい。導体線24が太くて、それ自体の強度が十分ある場合には、ピンコンタクト用金属薄板18は、導体線24の部分のみを覆ってカシメて取り付けることができるが、上記寸法の被覆導体線16は細くて、それ自体の強度がそれほど強くない。したがって、後述の半田付けの強度確保の観点からも、被覆22の部分も含んでカシメて取り付けることができる寸法設定が望ましい。また、基板12の接続端子14の寸法もあまり大きくないので、後述の半田付けの際に接続線20の先端が接続端子14からあまりはみ出さないことを考慮すると、被覆22から露出する導体線24の長さは、カシメられたときにピンコンタクト用金属薄板18の長さの範囲に納められることが好ましい。実際には、被覆導体線16の太さに応じてピンコンタクト用金属薄板18の長さが定まるので、その長さよりも、被覆導体線16の先端の導体線24の長さを短くすることが望ましい。   The relationship between the length of the pin contact metal thin plate 18 and the length of the conductor wire 24 is preferably set so that the former is sufficiently longer than the latter. When the conductor wire 24 is thick and its own strength is sufficient, the pin contact thin metal plate 18 can be attached by caulking while covering only the conductor wire 24 portion. Is thin and its strength is not so strong. Therefore, from the viewpoint of securing the soldering strength, which will be described later, it is desirable to set the dimensions so that the cover 22 can be crimped and attached. Further, since the dimension of the connection terminal 14 of the substrate 12 is not so large, the conductor wire 24 exposed from the coating 22 is taken into consideration that the tip of the connection wire 20 does not protrude so much from the connection terminal 14 during soldering described later. It is preferable that the length of the pin is within the range of the length of the pin contact metal thin plate 18 when crimped. Actually, since the length of the pin contact thin metal plate 18 is determined according to the thickness of the coated conductor wire 16, the length of the conductor wire 24 at the tip of the coated conductor wire 16 can be made shorter than that length. desirable.

図2(b)は、被覆導体線16の先端にピンコンタクト用金属薄板18をカシメて取り付けて接続線20を形成する(カシメ取り付け工程)様子を示す図である。ここでは、ピンコンタクト用薄板がカシメられて、ピン形状金属薄板30として示されている。なお側面図も合わせて示されている。ピンコンタクト用金属薄板18の取り付けは、上記のように、被覆22の一部を含んでカシメられ、先端の導体線24は、ピン形状金属薄板30の内部に納められ、その先には突き出していない。カシメ取り付けは、適当なピンコンタクトカシメ治具を用いて行うことができる。   FIG. 2B is a diagram illustrating a state in which the pin contact metal thin plate 18 is caulked and attached to the tip of the coated conductor wire 16 to form the connection line 20 (caulking attachment process). Here, the pin contact thin plate is crimped and shown as a pin-shaped metal thin plate 30. A side view is also shown. As described above, the pin contact metal thin plate 18 is caulked by including a part of the coating 22, and the conductor wire 24 at the tip is accommodated in the pin-shaped metal thin plate 30 and protrudes beyond the end. Absent. The caulking attachment can be performed using an appropriate pin contact caulking jig.

図2(c)は、適当な半田付け装置を用いて、基板12の接続端子14に接続線20を半田付けして半田接続部40を形成する(半田付け工程)様子を示す図である。半田は、鉛フリー半田が用いられる。上記の寸法例では、ピンコンタクト用金属薄板18の長さは接続端子14の寸法より長く設定されるので、接続線20のピン形状金属薄板30の配置は、その先端が接続端子14からはみ出さないようにすることが好ましい。図2(c)では、接続端子14の範囲にピン形状金属薄板30の先端が収まるような配置で示されている。ピン形状金属薄板30の先端が接続端子14の範囲からはみ出す場合でも、そのはみ出し量は、隣接する他の要素との干渉や接触等を考慮して、少なく抑えることが好ましい。   FIG. 2C is a view showing a state in which the connecting wire 20 is soldered to the connecting terminal 14 of the substrate 12 to form the solder connecting portion 40 (soldering step) using an appropriate soldering apparatus. As the solder, lead-free solder is used. In the above dimension example, the length of the pin contact metal thin plate 18 is set longer than the size of the connection terminal 14, and therefore, the tip of the pin-shaped metal thin plate 30 of the connection line 20 protrudes from the connection terminal 14. It is preferable not to do so. In FIG. 2 (c), the pin-shaped metal thin plate 30 is shown in an arrangement in which the tip of the pin-shaped metal thin plate 30 is within the range of the connection terminal 14. Even when the tip of the pin-shaped metal thin plate 30 protrudes from the range of the connection terminal 14, it is preferable to suppress the amount of protrusion in consideration of interference and contact with other adjacent elements.

このようにして形成された半田接続部40の特性を、通常の方法で半田付けする場合を示す図3と比較して説明する。図3は、図2(a)に関連して説明した被覆導体線16を用いて、基板12の接続端子14にそのまま半田付けする様子を示す図である。被覆導体線16は、その先端部において被覆22が取り除かれて、導体線24が露出している。   The characteristics of the solder connection portion 40 thus formed will be described in comparison with FIG. 3 showing a case where soldering is performed by a normal method. FIG. 3 is a diagram showing a state in which the coated conductor wire 16 described in relation to FIG. 2A is soldered to the connection terminal 14 of the substrate 12 as it is. The coated conductor wire 16 has the coating 22 removed at the tip, and the conductor wire 24 is exposed.

図2(c)に示されるように、基板12の接続端子14と接続線20との間の半田付けにより形成される半田接続部40は、ピン形状金属薄板30を接続端子14の範囲に渡って覆っている。これに対し、通常の方法を示す図3では、接続端子14の範囲における導体線24の部分に渡って半田接続部60が形成される。ピン形状金属薄板30の外形は導体線24に比較して大きいので、図2(c)の半田接続部40は、図3の半田接続部60に比べ、広い接触面積で、半田が対象物に接合している。これにより、導体線24に半田付けする通常の方法に比べ、半田付けにおける接続強度が向上する。   As shown in FIG. 2 (c), the solder connection portion 40 formed by soldering between the connection terminal 14 and the connection line 20 of the substrate 12 extends the pin-shaped metal thin plate 30 over the range of the connection terminal 14. Covered. On the other hand, in FIG. 3 showing a normal method, the solder connection portion 60 is formed over the portion of the conductor wire 24 in the range of the connection terminal 14. Since the outer shape of the pin-shaped metal thin plate 30 is larger than that of the conductor wire 24, the solder connection portion 40 in FIG. 2C has a wider contact area than the solder connection portion 60 in FIG. It is joined. Thereby, compared with the usual method of soldering to the conductor wire 24, the connection strength in soldering improves.

また、ピン形状金属薄板30は、被覆導体線の被覆22の一部をカシメて取り付けられているので、外部から力が加わったときに力の集中する半田接続部40の被覆22側の端部がピン形状金属薄板30で補強される。これにより、さらに、基板の接続端子と被覆導体線との接続構造の強度が向上する。   In addition, since the pin-shaped metal thin plate 30 is attached by crimping a part of the covering 22 of the covering conductor wire, the end portion on the covering 22 side of the solder connection portion 40 where the force is concentrated when a force is applied from the outside. Is reinforced by the pin-shaped metal thin plate 30. This further improves the strength of the connection structure between the connection terminal of the substrate and the coated conductor wire.

また、図2に示されるように、ピン形状金属薄板30の長さは接続端子14の大きさより十分長く、ピン形状金属薄板30の根元は、半田接続部40の外にある。したがって、半田のフィレットは、金属薄板部上において十分に観察できる。   Further, as shown in FIG. 2, the length of the pin-shaped metal thin plate 30 is sufficiently longer than the size of the connection terminal 14, and the root of the pin-shaped metal thin plate 30 is outside the solder connection portion 40. Therefore, the solder fillet can be sufficiently observed on the thin metal plate portion.

上記構成の接続構造の強度試験の結果について図4、図5を用いて説明する。図4は、強度試験として繰り返し曲げ試験の様子を説明する図で、図5はその結果を示す図である。繰り返し曲げ試験は、上記構成の接続構造を有する液晶表示用バックライトモジュール10について、接続線20の先に質量Wの錘50を取り付け、この錘50の自重によって接続線20に引張負荷を与え、その状態で、液晶表示用バックライトモジュール10を引張負荷の方向に対し±45度の角度で振ることで、半田接続部40に曲げ負荷をかけることで行った。強度評価は、±45度の往復曲げを1回とし、これを繰り返し、半田接続部40が破壊する繰り返し回数の大小で行った。また、比較例として、図3に示す通常半田処理による接続構造についても同様の試験を行なった。   The result of the strength test of the connection structure having the above configuration will be described with reference to FIGS. FIG. 4 is a diagram for explaining the state of a repeated bending test as a strength test, and FIG. 5 is a diagram showing the results. In the repeated bending test, for the liquid crystal display backlight module 10 having the connection structure having the above-described configuration, a weight 50 having a mass W is attached to the tip of the connection line 20, and a tensile load is applied to the connection line 20 by its own weight. In this state, the liquid crystal display backlight module 10 was shaken at an angle of ± 45 degrees with respect to the direction of the tensile load, thereby applying a bending load to the solder connection portion 40. The strength evaluation was performed by repeating the reciprocal bending of ± 45 degrees once, and repeating this to determine the number of repetitions at which the solder connection portion 40 was broken. As a comparative example, a similar test was performed on the connection structure by the normal soldering process shown in FIG.

負荷としての錘50の質量Wは、200g、150g、100gの3種類を用いた。また、接続線20は、プラス端子用とマイナス端子用の2本があるので、それぞれについて試験を行なった。また、試験のサンプル数は5とした。半田接続部の破壊の判定は、接続線20が液晶表示用バックライトモジュール10から分離するか否かで行った。   As the mass W of the weight 50 as a load, three types of 200 g, 150 g, and 100 g were used. In addition, since there are two connecting wires 20 for the plus terminal and for the minus terminal, each was tested. The number of samples in the test was 5. Judgment of destruction of a solder connection part was performed by whether the connection line 20 isolate | separated from the backlight module 10 for liquid crystal displays.

図5は、繰り返し曲げ試験の結果を示す図である。図5(a),(b),(c)は、それぞれ、負荷としての錘50の質量が200g、150g、100gについて、半田接続部が破壊した繰り返し数を示す。それぞれについて、「ピンコンタクト法」の欄には、上記構成の接続構造の5つのサンプルについての結果を示し、「通常半田処理」の欄には、図3の接続構造の5つのサンプルについての結果を示す。端子の欄の+、−は、2本の接続線20の種類を区別するものである。   FIG. 5 is a diagram showing the results of a repeated bending test. FIGS. 5A, 5B, and 5C show the number of repetitions at which the solder connection portion is broken when the mass of the weight 50 as a load is 200 g, 150 g, and 100 g, respectively. For each, the “pin contact method” column shows the results for the five samples of the connection structure of the above configuration, and the “normal soldering” column shows the results for the five samples of the connection structure of FIG. Indicates. “+” And “−” in the terminal column distinguish the types of the two connection lines 20.

図5の結果からは、「通常半田処理」に比べ、上記接続構造の「ピンコンタクト法」は、破壊に至る繰り返し曲げの回数にして、およそ1.5倍から2倍の寿命を有することが分かる。このように、上記接続構造は、通常の半田付け処理による接続構造に比較して、格段の接続強度を有している。   From the results shown in FIG. 5, it can be seen that the “pin contact method” of the above connection structure has a life of approximately 1.5 to 2 times in terms of the number of times of repeated bending leading to breakage compared to “normal soldering”. I understand. Thus, the connection structure has a remarkable connection strength as compared with a connection structure formed by a normal soldering process.

本発明に係る実施の形態の接続構造が適用される例として、液晶表示用バックライトモジュールの発光素子を搭載する基板と、図示されていない外部回路とを電気的に接続するための接続構造を示す図である。As an example to which the connection structure of the embodiment according to the present invention is applied, a connection structure for electrically connecting a substrate on which a light emitting element of a backlight module for liquid crystal display is mounted and an external circuit (not shown) is provided. FIG. 本発明に係る実施の形態において、接続線の構造、半田付けの方法を説明する図である。In embodiment which concerns on this invention, it is a figure explaining the structure of a connection line, and the method of soldering. 通常の方法で半田付けする接続構造を説明する図である。It is a figure explaining the connection structure soldered by a normal method. 本発明に係る実施の形態の接続構造に対する強度試験として繰り返し曲げ試験の様子を説明する図である。It is a figure explaining the mode of a repeated bending test as a strength test with respect to the connection structure of embodiment which concerns on this invention. 繰り返し曲げ試験の結果を、本発明に係る実施の形態の接続構造と、通常の方法による接続構造について比較する図である。It is a figure which compares the result of a repeated bending test about the connection structure of embodiment which concerns on this invention, and the connection structure by a normal method.

符号の説明Explanation of symbols

10 バックライトモジュール、12 基板、14 接続端子、16 被覆導体線、18 ピンコンタクト用金属薄板、20 接続線、22 被覆、24 導体線、30 ピン形状金属薄板、40,60 半田接続部、50 錘。   10 Backlight Module, 12 Substrate, 14 Connection Terminal, 16 Coated Conductor Wire, 18 Pin Contact Metal Thin Plate, 20 Connection Wire, 22 Cover, 24 Conductor Wire, 30 Pin Shape Metal Thin Plate, 40, 60 Solder Connection, 50 Weight .

Claims (4)

基板の接続端子と、
被覆導体線の先端において被覆から導体線が露出され、露出された前記導体線と前記被覆の一部を含んで金属薄板部がカシメられた接続線と、
前記接続端子上に配置された前記金属薄板部と前記接続端子とが半田により接続された接続部と、
を有することを特徴とする基板の接続端子と被覆導体線との接続構造。
The connection terminal of the board,
A conductor wire is exposed from the sheath at the tip of the sheathed conductor wire, and the exposed conductor wire and a connecting wire in which the metal thin plate portion is crimped including a part of the sheath;
A connection part in which the metal thin plate part and the connection terminal arranged on the connection terminal are connected by solder;
A connection structure between a connection terminal of a substrate and a covered conductor wire, characterized by comprising:
請求項1に記載の接続構造において、
前記接続線の前記導体線は、0.3mm以下の外径を有することを特徴とする基板の接続端子と被覆導体線との接続構造。
The connection structure according to claim 1,
The connection structure between the connection terminal of the substrate and the covered conductor wire, wherein the conductor wire of the connection wire has an outer diameter of 0.3 mm or less.
請求項1に記載の接続構造において、
前記接続線は、前記被覆を含む外径で0.8mm以下であることを特徴とする基板の接続端子と被覆導体線との接続構造。
The connection structure according to claim 1,
A connection structure between a connection terminal of a substrate and a coated conductor wire, wherein the connection wire has an outer diameter of 0.8 mm or less including the coating.
請求項1に記載の接続構造において、
前記基板は、液晶表示用バックライトモジュールの発光素子を搭載する基板であり、
前記接続線は、前記液晶表示用バックライトモジュールと外部回路とを接続する接続線であることを特徴とする基板の接続端子と被覆導体線との接続構造。
The connection structure according to claim 1,
The substrate is a substrate on which a light emitting element of a backlight module for liquid crystal display is mounted,
The connection line is a connection line for connecting the liquid crystal display backlight module and an external circuit, and the connection structure between the connection terminal of the substrate and the covered conductor line.
JP2006166531A 2006-06-15 2006-06-15 Connection structure between connection terminal of substrate, and covered conductor wire Pending JP2007335260A (en)

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US11456546B2 (en) 2011-05-10 2022-09-27 Saint-Gobain Glass France Pane having an electrical connection element
US11217907B2 (en) 2011-05-10 2022-01-04 Saint-Gobain Glass France Disk having an electric connecting element
US10355378B2 (en) 2011-05-10 2019-07-16 Saint-Gobain Glass France Pane having an electrical connection element
JP2016505194A (en) * 2012-09-14 2016-02-18 サン−ゴバン グラス フランスSaint−Gobain Glass France Panel with electrical connection elements
US9967967B2 (en) 2012-09-14 2018-05-08 Saint-Gobain Glass France Pane having an electrical connection element
JP2017216239A (en) * 2012-09-14 2017-12-07 サン−ゴバン グラス フランスSaint−Gobain Glass France Panel with electrical connection element, method for producing the same, and use of the same
US9837727B2 (en) 2012-09-14 2017-12-05 Saint-Gobain Glass France Pane having an electrical connection element
KR101768784B1 (en) 2012-09-14 2017-08-16 쌩-고벵 글래스 프랑스 Pane having an electrical connection element
JP2016505195A (en) * 2012-09-14 2016-02-18 サン−ゴバン グラス フランスSaint−Gobain Glass France Panel with electrical connection elements

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