JP2007299889A - Method of manufacturing ferroelectric element - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a ferroelectric element which can conduct heat treatment in an oxygen atmosphere in a state that the TiAlN of a hard mask material for etching a ferroelectric capacitor element remains. <P>SOLUTION: First, a multilayer film for forming a capacitor is formed on a base material by stacking a first conductive layer, a ferroelectric layer composed of a metal oxide dielectric, and a second conductive layer in order on the base material. Next, a hard mask including an TiAlN layer is formed on the multilayer film for forming a capacitor. Then, by etching using the hard mask, the first conductive layer, the ferroelectric layer, and the second conductive layer are formed into a bottom electrode, a ferroelectric thin film, and a top electrode, respectively, to manufacture a ferroelectric capacitor composed of the multilayer film for forming a capacitor. Thereafter, heat treatment is conducted in nitrogen to recover the crystal structure of the TiAlN mask layer remaining on the ferroelectric capacitor. Then, heat treatment is conducted in oxygen to recover the crystal structure of the ferroelectric thin film. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a method for manufacturing a ferroelectric element.

As a ferroelectric material in a semiconductor device, a material using SrBi ₂ Ta ₂ O ₉ or lead zirconate titanate (Pb (Zr _1-x Ti _x ) O ₃ ) has been put into practical use. In the following description, a compound group in which the composition ratio of SrBi ₂ Ta ₂ O ₉ is changed, an additive typified by Nb is added, or a compound group substituted with Nb is generically called SBT. In addition, a compound group in which the composition ratio of Pb (Zr _1-x Ti _x ) O ₃ is changed, or an additive such as La or Ca is added or substituted with these additives is collectively referred to as PZT. Further, BLTs obtained by adding lanthanum to bismuth titanate have been studied as ferroelectric materials. Each of these ferroelectric materials has a crystal structure of a perovskite structure, and this crystal structure is the origin of polarization and exhibits ferroelectricity.

  As a ferroelectric element that is a semiconductor device using a ferroelectric material, there is a ferroelectric memory. Ferroelectrics have the property of maintaining polarization in the direction of voltage application even when the voltage is removed. That is, the ferroelectric has spontaneous polarization. For this reason, the ferroelectric memory can be used as a nonvolatile memory.

  With reference to FIGS. 1A and 1B, a ferroelectric memory will be described. FIG. 1A is an equivalent circuit diagram of a basic cell (also referred to as a memory cell) of a ferroelectric memory. FIG. 1B is a schematic cross-sectional view of the memory cell. Here, the ferroelectric memory will be described on the assumption that a basic cell is composed of one transistor and one ferroelectric capacitor.

  Ferroelectric memories can be classified into a planar type and a stack type depending on the arrangement relationship between transistors and ferroelectric capacitors.

  In the planar type, the upper electrode of the capacitor and the diffusion layer of the transistor are electrically connected, and the capacitor cannot be formed immediately above the transistor. Therefore, since a transistor region and a capacitor region are provided in one basic cell, it is not suitable for miniaturization.

  On the other hand, the stack type has a configuration in which the lower electrode of the capacitor and the diffusion layer of the transistor are electrically connected, and the capacitor is formed on the transistor. For this reason, the stack type is excellent in miniaturization as compared with the planar type.

  A stacked memory cell will be described with reference to FIG.

  The stacked memory cell 10 includes a ferroelectric capacitor 51 on a base 20. The underlayer 20 is formed on the MOS transistor 30 formed in the region defined by the element isolation film 39, the first interlayer insulating film 40 formed on the MOS transistor 30, and the first interlayer insulating film 40. Further, a contact plug 42 for the lower electrode and a contact plug 44a for the first bit line (BL) are provided. The MOS transistor 30 includes a gate oxide film 36 and a gate electrode 38 formed on the silicon substrate 32, and a diffusion layer 34 that functions as a drain region and a source region formed on the silicon substrate 32. The gate electrode 38 also functions as a word line (WL). Therefore, in the following description, the word line (WL) is also described with the same reference numerals as the gate electrode. The lower electrode contact plug 42 and the first bit line contact plug 44a are electrically connected to the diffusion layer 34, respectively.

  The ferroelectric capacitor 51 is configured by sequentially laminating a lower electrode 53, a ferroelectric thin film 55, and an upper electrode 57. A second interlayer insulating film 41 is formed on the first interlayer insulating film 40 and the ferroelectric capacitor 51. In the second interlayer insulating film 41, a contact plug 44b for the second bit line (BL) and a contact plug 46 for the plate line (PL) are formed. A bit line (BL) 60 and a plate line (PL) 62 are formed on the second interlayer insulating film 41. The second bit line contact plug 44 b is electrically connected to the first bit line contact plug 44 a and the bit line 60. Therefore, the bit line (BL) 60 is electrically connected to one diffusion layer 34 of the MOS transistor 30. The plate line contact plug 46 is electrically connected to the upper electrode 57 of the ferroelectric capacitor 51 and the plate line (PL) 62.

  The ferroelectric capacitor 51 is formed by dry etching, for example. Therefore, a silicon oxide film is used as a mask used for etching a ferroelectric material (see, for example, Patent Document 1).

  Now, since noble metal materials such as Pt and Ir used as the electrodes of the ferroelectric capacitor 51 have extremely low reactivity, it is difficult to etch at a low temperature (from room temperature to about 80 ° C.). For this reason, the etching chamber may be heated to perform etching in a high temperature atmosphere. In this case, since there is no silicon oxide film in a high temperature atmosphere, TiN or TiAlN is used as a hard mask material (see, for example, Patent Document 2).

Depending on the etching conditions, a hard mask in which a silicon oxide film is stacked on TiN or TiAlN may be used (for example, see Patent Document 3).
JP 2002-151656 A JP 2003-318371 A JP 2001-244426 A

  Formation of the ferroelectric capacitor by etching causes crystal defects such as oxygen vacancies in the ferroelectric thin film of the ferroelectric capacitor. In order to recover this crystal defect, it is necessary to perform a heat treatment in an oxygen atmosphere after the etching process.

  However, when TiN is used as the hard mask material, if heat treatment is performed in an oxygen atmosphere with TiN remaining on the ferroelectric capacitor, TiN is oxidized, and volume expansion or partial delamination occurs. There is a case. If an interlayer insulating film covering the ferroelectric capacitor is formed in this state, a problem such as a step is generated on the upper surface of the interlayer insulating film. Therefore, TiN must be completely removed before heat treatment in an oxygen atmosphere. In order to completely remove this TiN, it is necessary to perform further etching after the formation of the ferroelectric capacitor. For this reason, there is a possibility that the characteristic deterioration of the ferroelectric capacitor may occur due to the thickness of the upper electrode being reduced.

  On the other hand, since TiAlN has oxidation resistance, if TiAlN is used as the hard mask material, heat treatment in an oxygen atmosphere is possible even when TiAlN remains.

  However, TiAlN may be damaged by etching and become unstable. Etching damage includes introduction of Cl, C, O, Ar, etc. into a crystal in the etching atmosphere, crystal defects due to the introduced element, change in composition ratio due to desorption of N, formation of surface irregularities, etc. There is. When TiAlN is in an unstable state as described above, the TiAlN is peeled off or aggregated by heat treatment in an oxygen atmosphere, that is, the oxidation resistance of TiAlN is lowered.

  Therefore, the inventor conducted intensive studies and found that the crystal structure and oxidation resistance of TiAlN were recovered by performing heat treatment in a nitrogen atmosphere before heat treatment in an oxygen atmosphere.

  The present invention has been made in view of the above-described problems, and an object of the present invention is to provide a method for manufacturing a ferroelectric element that enables heat treatment in an oxygen atmosphere in a state where TiAlN as a hard mask material remains. Is to provide.

  In order to achieve the above-described object, the method for manufacturing a ferroelectric element according to the present invention includes the following steps. First, a multilayer film for forming a capacitor is formed on a base by sequentially laminating a first conductive layer, a ferroelectric layer made of a metal oxide dielectric, and a second conductive layer. Next, a hard mask including a TiAlN mask layer is formed on the capacitor forming laminated film. Next, the first conductive layer, the ferroelectric layer, and the second conductive layer are processed into a lower electrode, a ferroelectric thin film, and an upper electrode, respectively, by etching using a hard mask. A body capacitor is formed. Next, heat treatment is performed in a nitrogen atmosphere to recover the crystal structure of the TiAlN mask layer remaining on the ferroelectric capacitor. Next, heat treatment is performed in an oxygen atmosphere to recover the crystal structure of the ferroelectric thin film.

  According to the method for manufacturing a ferroelectric element of the present invention, the crystal structure of the TiAlN mask layer is recovered by performing the heat treatment in a nitrogen atmosphere. Heat treatment in an oxygen atmosphere for restoring the structure can be performed.

  Further, since TiAlN is a conductive material, an interlayer insulating film can be formed and a contact hole can be etched with the TiAlN mask layer remaining. As a result, damage introduced into the capacitor during contact hole etching is reduced, and the TiAlN mask layer can also be used as an etching buffer layer, so that a margin is increased.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. However, the positions, sizes, and arrangement relationships of the constituent elements are merely schematically shown to the extent that the present invention can be understood. In the following, a preferred configuration example of the present invention will be described. However, the composition (material) and numerical conditions of each component are merely preferred examples. Therefore, the present invention is not limited to the following embodiment.

  With reference to FIGS. 2 to 6, a manufacturing method of a ferroelectric ferroelectric element will be described by taking a stack type ferroelectric memory as an example. FIG. 2 is a diagram for explaining a method of manufacturing a ferroelectric element, and particularly shows a manufacturing flow of a ferroelectric capacitor. 3 to 6 are diagrams for explaining a method of manufacturing a ferroelectric element, and showing a manufacturing process of a ferroelectric memory. 3 to 6 each show a cut surface of a cross section.

  In step (hereinafter, the step is represented by S) 5, a base 20 is prepared. The base 20 includes a first interlayer insulating film 40 on one main surface side of the silicon substrate 32 on which the MOS transistor 30 is formed.

  The MOS transistor 30 is formed in a region defined by the element isolation film 39. The MOS transistor 30 sandwiches the gate oxide film 36 and the gate electrode 38 when the gate oxide film 36 and the gate electrode 38 formed on the silicon substrate 32 and one main surface side of the silicon substrate are viewed in a plan view. At the position, a diffusion layer 34 functioning as a drain region and a source region is provided. Note that the step of forming the element isolation film 39 and the MOS transistor 30 on the silicon substrate 32 may be performed by any conventionally known and suitable method, and thus description thereof is omitted here.

  The first interlayer insulating film 40 is formed of a silicon oxide film by, for example, a CVD (Chemical Vapor Deposition) method. The first interlayer insulating film 40 includes a lower electrode contact plug 42 and a first bit line contact plug 44a. The contact plug 42 for the lower electrode is a contact plug for electrically connecting the diffusion layer 34 of the MOS transistor 30 and the lower electrode of the ferroelectric capacitor. The first bit line contact plug 44a is a contact plug used for electrically connecting the diffusion layer 34 and the bit line. The contact plug can be formed by any suitable conventionally known method. For example, after opening a contact hole exposing the diffusion layer 34 by photolithography and dry etching, tungsten (W) or polysilicon is deposited in the contact hole by a CVD method. Thereafter, planarization is performed by CMP (Chemical Mechanical Polishing) or etch back to obtain a base 20 (FIG. 3A).

  In S <b> 10, the capacitor forming multilayer film 50 is formed on the base 20 by sequentially laminating the first conductive layer 52, the ferroelectric layer 54 made of a metal oxide dielectric, and the second conductive layer 56.

The first conductive layer 52 is formed by sequentially laminating, for example, a titanium aluminum nitride (TiAlN) layer 71, an Ir layer 73, an IrO ₂ layer 75, and a Pt layer 77 by sputtering. The first conductive layer 52 is processed in a later step and becomes the lower electrode of the ferroelectric capacitor. Although the configuration of the lower electrode is not limited to this example, the lower electrode contact plug 42 can be prevented from being oxidized by forming the lower electrode in a laminated structure of a TiAlN layer, an Ir layer, an IrO ₂ layer, and a Pt layer. This can reduce damage to the lower part of the capacitor.

  Next, an organic solvent containing a ferroelectric component element is applied onto the substrate, and then the crystallization heat treatment is performed to evaporate the organic solvent and obtain a desired crystal structure. Form. As the ferroelectric, for example, SBT, PZT, or BLT is used. Here, SBT will be described as an example of a ferroelectric. The ferroelectric material is not limited to these, and any suitable metal oxide ferroelectric material can be used. Also, the film forming process of the ferroelectric material is not limited to the above-described method, and any suitable known method can be used. The crystallization heat treatment of the ferroelectric may be performed under any suitable conditions depending on the type, composition ratio, film forming method, film thickness, etc. of the ferroelectric material. RTA (rapid thermal annealing) for about 30 seconds to 5 minutes may be performed in an oxygen atmosphere at a temperature (that is, ambient temperature).

  Next, the second conductive layer 56 is formed by depositing, for example, Pt on the ferroelectric layer 54 by sputtering. Note that an Ir-based material may be used for the second conductive layer 56 (FIG. 3B).

  After the capacitor forming multilayer film is formed, a hard mask including a TiAlN mask layer is formed on the capacitor forming multilayer film 50 in S20. The configuration of the hard mask can be selected according to the desired capacitor shape and etching conditions.

For example, in consideration of components remaining in the atmosphere after etching, it is preferable to use a silicon oxide film as a material for the hard mask. Etching when the silicon oxide film is used as a hard mask is performed at a relatively low temperature of about 80 ° C. from room temperature. On the other hand, noble metal materials such as Pt and Ir used as the electrodes of the ferroelectric capacitor are extremely low in reactivity and are difficult to etch at low temperatures. Therefore, the precious metal material is preferably etched in a high temperature atmosphere. However, there is no silicon oxide film in a high temperature atmosphere. For this reason, it is preferable that TiAlN, a silicon oxide film (SiO ₂ ), and titanium nitride (TiN) are sequentially stacked as a hard mask.

In the step of forming a hard mask, first, a TiAlN layer 83, a SiO ₂ layer 85, and a TiN layer 87 are sequentially stacked to form a hard mask forming stacked film 81. The hard mask forming laminated film 81 may be formed by any suitable known method such as sputtering or CVD (FIG. 4A). Thereafter, the hard mask forming multilayer film 81 is processed by photolithography and dry etching to form a hard mask 80 in which a TiAlN mask layer 82, a silicon oxide film (SiO ₂ ) mask layer 84, and a TiN mask layer 86 are sequentially stacked. . The hard mask 80 is provided at a position on the capacitor forming laminated film 50 so as to cover a region where the ferroelectric capacitor 51 is formed (FIG. 4B).

  In S30, etching using the hard mask 80 is performed. By this etching, the first conductive layer 52, the ferroelectric layer 54, and the second conductive layer 56 are processed into the lower electrode 53, the ferroelectric thin film 55, and the upper electrode 57, respectively. Capacitor 51 is formed.

In the step of forming the ferroelectric capacitor 51, first, the upper electrode 57 is formed by processing the second conductive layer 56 by dry etching in a high temperature atmosphere. Here, the etching is preferably performed by using, for example, a mixed gas of Cl ₂ , Ar, and O _{2 as} the reaction gas and setting the ambient temperature to 450 ° C.

Next, the ferroelectric thin film 55 is formed by processing the ferroelectric layer 54 by dry etching in a low temperature atmosphere. Here, for example, etching is performed using a mixed gas of Cl ₂ , Ar, and O _{2 at} a temperature of 80 ° C. as a reactive gas.

Next, the first conductive layer 52 is processed by dry etching in a high temperature atmosphere to form the lower electrode 53. The etching conditions for forming the lower electrode 53 are the same as the etching conditions for forming the upper electrode 57. By these series of dry etching, the TiN mask layer 86, the SiO ₂ mask layer 84 and the TiAlN mask layer 82 of the hard mask 80 are consumed, but a part of the TiAlN mask layer 82 remains on the ferroelectric capacitor 51 ( FIG. 5).

  Here, an example in which the hard mask 80 has a three-layer structure and is etched at a high temperature, a low temperature, and a high temperature has been described, but the present invention is not limited to this example.

  For example, the hard mask may have a two-layer structure of a TiAlN mask layer and a silicon oxide mask layer. In this case, in the etching process, first, the second conductive layer and the ferroelectric layer are processed into an upper electrode and a ferroelectric thin film, respectively, by low temperature etching. Thereafter, the first conductive layer is processed into a lower electrode by high temperature etching.

  Further, the hard mask may be formed of one layer of TiAlN mask layer. In this case, in the etching step, the second conductive layer, the ferroelectric layer, and the first conductive layer are processed into an upper electrode, a ferroelectric thin film, and a lower electrode, respectively, by high temperature etching.

  Note that the TiAlN mask layer 82 remains on the ferroelectric capacitor 51 after these etching processes. Although TiAlN has oxidation resistance, the TiAlN mask layer 82 may be in an unstable state due to damage caused by etching. Examples of damage caused by etching include introduction of Cl, O, Ar, etc. in the etching atmosphere into the crystal as impurities, crystal defects due to the introduction of impurities, change in composition ratio due to desorption of N, formation of surface irregularities, etc. There is. Note that impurities to be introduced are not limited to Cl, O, and Ar, and C or the like may be introduced by an etching gas. When the TiAlN mask layer 82 is in an unstable state as described above, the TiAlN mask layer 82 is peeled off or aggregated by a heat treatment in an oxygen atmosphere for recovering the crystal structure of the ferroelectric in a later step. . If the second interlayer insulating film 41 covering the ferroelectric capacitor 51 is formed in this state, a problem such as a step formed on the upper surface of the second interlayer insulating film 41 occurs.

  Therefore, in S40, heat treatment is performed in a nitrogen atmosphere to recover the crystal structure of the TiAlN mask layer 82 remaining on the ferroelectric capacitor 51. By this heat treatment, impurities introduced into the TiAlN mask layer 82 are desorbed, and the TiAlN mask layer 82 is recovered from a change in composition ratio and crystal defects due to desorption of N.

  After the TiAlN mask layer 82 is recovered from damage caused by etching, heat treatment in an oxygen atmosphere is performed in S50 to recover the crystal structure of the ferroelectric thin film 55. This is because the ferroelectric thin film is damaged by the etching process like the TiAlN mask layer, such as deterioration of the crystal structure, change in composition ratio such as oxygen vacancies, and diffusion of etching gas into the film.

  The heat treatment conditions in the oxygen atmosphere may be the same as those for the crystallization heat treatment of the ferroelectric layer 54 of S10. For example, in the oxygen atmosphere at a temperature in the range of 650 ° C. to 800 ° C. It is performed with RTA of about one minute.

  On the other hand, the heat treatment in the nitrogen atmosphere is preferably performed at a high temperature, for example, at a temperature equal to or higher than the atmospheric temperature in the high temperature etching, from the viewpoint of recovery of the TiAlN mask layer 82. However, when high-temperature heat treatment is performed in a nitrogen atmosphere, the ferroelectric thin film 55, which is a metal oxide dielectric, is reduced and oxygen deficiency occurs. Therefore, the heat treatment in the nitrogen atmosphere is preferably performed at a lower temperature than the heat treatment in the oxygen atmosphere performed thereafter. Preferably, RTA is performed in a nitrogen atmosphere at a temperature within the range of 450 to 600 ° C. (that is, the ambient temperature) for about 30 seconds to 5 minutes. Note that this heat treatment is not limited to RTA, and may be performed by introducing a nitrogen atmosphere having a temperature within a range of 450 to 600 ° C. (that is, an atmospheric temperature) into the chamber.

  Note that the ferroelectric thin film may be reduced as long as oxygen deficiency is recovered by heat treatment in an oxygen atmosphere. Therefore, the heat treatment in the nitrogen atmosphere can be performed at a higher temperature than the heat treatment in the oxygen atmosphere.

  As described above, according to the method for manufacturing a ferroelectric element of the present invention, the crystal structure of the TiAlN mask layer is recovered by the heat treatment in the nitrogen atmosphere, so that the TiAlN remains in the state where the TiAlN remains. Heat treatment in an oxygen atmosphere for recovering the crystal structure can be performed.

  After the formation of the ferroelectric capacitor 51, a second interlayer insulating film 41 is formed on the base 20 and the ferroelectric capacitor 51, and further, a plate line contact plug 46 and a second bit line contact. A plug 44b is formed. The plate line contact plug 46 is a contact plug that electrically connects the upper electrode 57 of the ferroelectric capacitor 51 and the plate line (PL) provided on the second interlayer insulating film 41. The second bit line contact plug 44b is combined with the first bit line contact plug 44a to form a bit line contact plug. The bit line contact plug is a contact plug that electrically connects the diffusion layer 34 of the MOS transistor 30 and the bit line (BL) provided on the second interlayer insulating film 41.

  The contact plugs 44b and 46 can be formed in the same manner as the contact plug 42 for the lower electrode and the contact plug 44a for the first bit line. Here, the contact plugs 44a and 44b for the bit line may be collectively formed after the second interlayer insulating film 41 is formed. In the case where the formation of the bit line contact plugs 44a and 44b is not performed at once, it is preferable to appropriately take measures such as oxidation prevention of the first bit line contact plug 44a.

  Here, the TiAlN mask layer 82 remaining on the upper electrode 57 of the ferroelectric capacitor 51 is a conductive material. Therefore, in the etching for opening the contact hole 48 on the upper electrode 57, the upper electrode 57 does not need to be exposed, and the TiAlN mask layer 82 may be exposed. Since the TiAlN mask layer 82 remains at the bottom of the contact hole 48, damage introduced into the ferroelectric thin film 55 by etching of the contact hole 48 can be reduced. In this case, the thickness of the TiAlN mask layer 82 is formed to be larger than the thickness required as a hard mask, and the TiAlN mask layer 82 is actively left on the ferroelectric capacitor 51. The TiAlN mask layer 82 can be used as an etching buffer layer that opens a contact hole, and the margin is expanded relative to the depth of the contact hole in the etching process by the thickness of the TiAlN mask layer 82. (See FIG. 6).

  Although the hard mask 80 including the TiAlN mask layer 82 has been described here, the material is not necessarily limited to TiAlN. Any metal nitride that can be used as a hard mask and has oxidation resistance and conductivity can be used.

  Although the stack type ferroelectric memory has been described as an example of the ferroelectric element, the present invention is not limited to the stack type ferroelectric memory. It can be applied to an element having a ferroelectric capacitor.

It is the schematic which shows the basic cell of a ferroelectric memory. It is a figure which shows the manufacturing flow of a ferroelectric capacitor. FIG. 6 is a diagram (part 1) illustrating a manufacturing process of the ferroelectric memory; FIG. 6 is a diagram (part 2) illustrating a manufacturing process of the ferroelectric memory; FIG. 6 is a diagram (No. 3) for explaining a manufacturing process of the ferroelectric memory; FIG. 6 is a diagram (No. 4) for explaining a manufacturing process of the ferroelectric memory.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Memory cell 20 Base 30 MOS transistor 32 Silicon substrate 34 Diffusion layer 36 Gate oxide film 38 Gate electrode 39 Element isolation film 40, 41 Interlayer insulating film 42, 44a, 44b, 46 Contact plug 50 Multilayer film for capacitor formation 51 Ferroelectric material Capacitor 52 First conductive layer 53 Lower electrode 54 Ferroelectric layer 55 Ferroelectric thin film 56 Second conductive layer 57 Upper electrode 60 Bit line (BL)
62 Plate wire (PL)
71 Titanium aluminum nitride (TiAlN) layer 73 Ir layer 75 IrO ₂ layer 77 Pt layer 80 hard mask 81 laminated film for forming hard mask 82 TiAlN mask layer 83 TiAlN layer 84 SiO ₂ mask layer 85 SiO ₂ layer 86 TiN mask layer 87 TiN layer

Claims (7)

Forming a multilayer film for capacitor formation in which a first conductive layer, a ferroelectric layer made of a metal oxide dielectric, and a second conductive layer are sequentially stacked on the ground;
Forming a hard mask including a TiAlN mask layer on the capacitor-forming laminated film;
By etching using the hard mask, the first conductive layer, the ferroelectric layer, and the second conductive layer are processed into a lower electrode, a ferroelectric thin film, and an upper electrode, respectively. Forming a ferroelectric capacitor;
Performing a heat treatment in a nitrogen atmosphere to recover the crystal structure of the TiAlN mask layer remaining on the ferroelectric capacitor;
And a step of recovering the crystal structure of the ferroelectric thin film by performing a heat treatment in an oxygen atmosphere. 2. The method of manufacturing a ferroelectric element according to claim 1, wherein the temperature of the nitrogen atmosphere is set lower than the temperature of the oxygen atmosphere. The heat treatment in the nitrogen atmosphere is performed at an atmospheric temperature within a range of 450 to 600 ° C, and the heat treatment in the oxygen atmosphere is performed at an atmospheric temperature within a range of 650 to 800 ° C. Of manufacturing a ferroelectric element. In the step of forming the hard mask, the hard mask is formed by sequentially stacking a TiAlN mask layer, a silicon oxide film mask layer, and a TiN mask layer, and in the step of forming the ferroelectric capacitor, the second conductive layer is formed. A layer is processed into the upper electrode by high temperature etching, the ferroelectric layer is processed into the ferroelectric thin film by low temperature etching, and the first conductive layer is processed into the lower electrode by high temperature etching. The manufacturing method of the ferroelectric element as described in any one of Claims 1-3. In the step of forming the hard mask, the hard mask is formed by sequentially stacking a TiAlN mask layer and a silicon oxide film mask layer, and in the step of forming the ferroelectric capacitor, the second conductive layer and the strong mask are formed. The dielectric layer is processed into the upper electrode and the ferroelectric thin film by low temperature etching, respectively, and the first conductive layer is processed into the lower electrode by high temperature etching. A method for manufacturing a ferroelectric element according to claim 1. In the step of forming the hard mask, the hard mask is formed of a TiAlN mask layer, and in the step of forming the ferroelectric capacitor, the second conductive layer, the ferroelectric layer, and the first conductive layer are formed. The method for manufacturing a ferroelectric element according to claim 1, wherein the upper electrode, the ferroelectric thin film, and the lower electrode are processed by high-temperature etching, respectively. After the step of recovering the crystal structure of the ferroelectric thin film, a step of forming an interlayer insulating film on the base and the ferroelectric capacitor;
Opening a contact hole using the TiAlN mask layer as a buffer layer;
The method for manufacturing a ferroelectric element according to claim 1, wherein a step of forming a conductive plug in the contact hole is performed.

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