JP2007298659A - Neutral density filter - Google Patents
Neutral density filter Download PDFInfo
- Publication number
- JP2007298659A JP2007298659A JP2006125444A JP2006125444A JP2007298659A JP 2007298659 A JP2007298659 A JP 2007298659A JP 2006125444 A JP2006125444 A JP 2006125444A JP 2006125444 A JP2006125444 A JP 2006125444A JP 2007298659 A JP2007298659 A JP 2007298659A
- Authority
- JP
- Japan
- Prior art keywords
- film layer
- layer
- film
- metal film
- neutral density
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
本発明は、膜の荒れの進行を防止した耐久性を有する中性濃度フィルタに関する。 The present invention relates to a neutral density filter having durability that prevents progression of film roughness.
中性濃度フィルタ(以下NDフィルタという)は、入射光を減光するために用いられる光学フィルタであり、例えば分光透過特性が偏るHf(ハフニウム)膜及びAl(アルミニウム)膜を合成石英の透明基板上にスパッタリングにより積層して形成される(特許文献1参照)。
図5(a)は、従来のNDフィルタの成膜構造の一例を示すもので、合成石英基板1上にHf層2及びAl層3を被着し、最外層に所望の光学特性を得ると共に酸化や傷付を防ぐためにHfO2(酸化ハフニウム)層4を被着した構造である。この場合、各層の膜厚形成はイオンビームスパッタリングにより行われ、一例として光学濃度OD値1.48の例を示すと図5(b)に示すように17.58nmのHf層2、12.84nmのAl層3、14.35nmのHfO2層4という具合に成膜されて平坦な分光透過特性を得ている。
A neutral density filter (hereinafter referred to as an ND filter) is an optical filter used to attenuate incident light. For example, an Hf (hafnium) film and an Al (aluminum) film whose spectral transmission characteristics are biased are made of a synthetic quartz transparent substrate. It is formed by laminating by sputtering (see Patent Document 1).
FIG. 5 (a) shows an example of a conventional ND filter film formation structure, in which a Hf layer 2 and an Al layer 3 are deposited on a synthetic quartz substrate 1 to obtain desired optical characteristics in the outermost layer. In this structure, an HfO2 (hafnium oxide) layer 4 is deposited to prevent oxidation and scratching. In this case, the film thickness of each layer is formed by ion beam sputtering. As an example, when an optical density OD value of 1.48 is shown, a 17.58 nm Hf layer 2, 12.84 nm as shown in FIG. The Al layer 3 and the 14.35 nm HfO 2 layer 4 are formed to obtain flat spectral transmission characteristics.
NDフィルタとしては、この成膜後、予め使用環境下以上の熱負荷を加える熱処理が行われる。この熱処理は、金属膜が熱エネルギに晒される使用環境下での耐久性を向上させるために必要であり、経年変化により光学特性が変化しあるいは劣化を最小限とするため、事前に使用環境下以上の熱エネルギを与えて特性を固める処理となっている。
そして、NDフィルタとしては、この熱処理後の品質が所望の耐久性を有し、しかも例えば平坦な分光透過特性となるように製造に当たり各金属膜の材質や各膜厚が選択・調整されることになる。
As the ND filter, the material of each metal film and each film thickness are selected and adjusted so that the quality after the heat treatment has a desired durability and, for example, flat spectral transmission characteristics. become.
上述のように従来NDフィルタの製造にあたっては、Hf層2及びAl層3等からなる異なる金属膜を熱処理するという工程を取ることになる。ところが、この熱処理によって図6に示す写真(合成石英基板/Hf/Al/HfO2からなる積層構造の写真)のようにHf層とAl層との境界面において膜の荒れが進行し顕著になることが判明した。この荒れは、金属膜間の熱拡散によって極小径のピンホールの形成という現象に発展し、主にNDフィルタの外観の劣化をもたらしひいてはピンホール同士がその後の熱エネルギによる経年変化にて連結することによりクラックとなり、結果的に耐久性が得られないという問題を有する。 As described above, in manufacturing a conventional ND filter, a process of heat-treating different metal films including the Hf layer 2 and the Al layer 3 is taken. However, with this heat treatment, as shown in the photograph (synthetic quartz substrate / Hf / Al / HfO 2 laminated structure) shown in FIG. 6, the roughness of the film advances and becomes noticeable at the interface between the Hf layer and the Al layer. There was found. This roughness develops into the phenomenon of the formation of extremely small pinholes due to thermal diffusion between the metal films, which mainly causes the appearance of the ND filter to deteriorate, and the pinholes are connected by aging due to subsequent thermal energy. It becomes a crack by this, and has a problem that durability cannot be obtained as a result.
本発明は、上述の問題に鑑み、異なる金属間の境界面での膜の荒れの進行を防止してクラックが発生しないようにしたNDフィルタの提供を目的とする。 In view of the above-described problems, an object of the present invention is to provide an ND filter which prevents the occurrence of cracks by preventing the progress of film roughness at the interface between different metals.
上述の目的を達成する本発明は、基板に少なくとも2種類以上の金属膜を積層して形成されるNDフィルタにおいて、第1の金属膜層とこの第1の金属膜層に隣接する第2の金属膜層との境界に酸化膜層を形成したことを特徴とする。 The present invention that achieves the above-described object provides a first metal film layer and a second metal film adjacent to the first metal film layer in an ND filter formed by laminating at least two kinds of metal films on a substrate. An oxide film layer is formed at the boundary with the metal film layer.
本発明によれば、金属膜層間に酸化膜層を介在させることにより、金属膜層間の拡散による膜の荒れの進行を防止することができ、外観の劣化のみならずクラックの発生を防止してNDフィルタとして耐久性を得ることができる。 According to the present invention, by interposing the oxide film layer between the metal film layers, it is possible to prevent the roughening of the film due to diffusion between the metal film layers, and to prevent the occurrence of cracks as well as the deterioration of the appearance. Durability can be obtained as an ND filter.
以下、図1〜図4を参照して本発明の実施形態を説明する。なお、以下の図において図5と同一部分には同一符号を付す。
〔第1実施形態〕
図1は、合成石英基板1上には第1の金属膜層として短波長になるほど光透過率が低下するHf層2が被着され、このHf層2上に酸化膜層であるHfO2層5が被着され、更にこのHfO2層5上には第2の金属膜層として短波長になるほど光透過率が上昇するAl層3が被着され、そして最外層に所望の光学特性を得ると共に酸化や傷付を防ぐために保護膜であるHfO2層4が被着されている構造である。各層の膜厚形成はイオンビームスパッタリングにより行われ、光学濃度OD値1.48の具体例を示すと、図1(b)に示すように48.55nmのHf層2、14.65nmのHfO2層5、4.70nmのAl層3、最外層に14.65nmのHfO2層4という具合に成膜され、Hf層2とAl層3とHfO2層4、5を積層することで、全体として平坦な分光透過特性を得るようにしている。
Hereinafter, an embodiment of the present invention will be described with reference to FIGS. In the following drawings, the same parts as those in FIG.
[First embodiment]
In FIG. 1, an Hf layer 2 whose light transmittance decreases as the wavelength of the first metal film layer is deposited on a synthetic quartz substrate 1, and an HfO 2 layer 5, which is an oxide film layer, is deposited on the Hf layer 2. Furthermore, an Al layer 3 whose light transmittance increases as the wavelength of the second metal film layer is deposited on the HfO 2 layer 5 as the second metal film layer, and desired optical characteristics are obtained and oxidized on the outermost layer. In order to prevent damage and scratches, an HfO 2 layer 4 as a protective film is deposited. The film thickness of each layer is formed by ion beam sputtering, and a specific example of an optical density OD value of 1.48 is shown as follows. As shown in FIG. 1B, a 48.55 nm Hf layer 2 and a 14.65 nm HfO 2 layer. 5 and 4.70 nm Al layer 3 and outermost layer 14.65 nm HfO 2 layer 4 are formed, and Hf layer 2, Al layer 3 and HfO 2 layers 4 and 5 are laminated to form a flat surface as a whole. Spectral transmission characteristics are obtained.
ここで、酸化膜層HfO2層5は、Hf層2とAl層3との間にあって、これら両者間の境界で発生する熱処理時の拡散を防止し、金属膜2及び3間の膜の荒れの進行を防止するために設けられる。このHfO2層5の膜厚がきわめて薄い場合には膜の荒れの進行防止効果は少ないことが判明しているので、ある程度の厚さが必要であるが、上述の例ではHfO2層5の厚さとして、14.65nmの膜厚は十分な厚さである。酸化膜層の膜厚としてはNDフィルタ全体として所望の光学濃度での平坦な分光透過特性を得る膜厚であることを前提として、膜の荒れの進行防止効果が十分な膜厚が必要となる。また、酸化膜層としては、拡散を防止し膜の荒れの進行を防止することから種々の金属酸化物が適用可能であり、例えばAl2O3(酸化アルミニウム)膜を被着させるようにしても良い。なお、このAl2O3膜は、最外層の保護膜ともなり得る。 Here, the oxide film layer HfO 2 layer 5 is located between the Hf layer 2 and the Al layer 3 and prevents diffusion during the heat treatment that occurs at the boundary between the two, and the film roughness between the metal films 2 and 3 is prevented. Provided to prevent progression. When the film thickness of the HfO 2 layer 5 is extremely thin, it has been found that the effect of preventing the roughening of the film is small, so that a certain amount of thickness is necessary. As a result, the film thickness of 14.65 nm is sufficient. The film thickness of the oxide film layer is required to be sufficient to prevent the roughening of the film from progressing on the premise that the entire ND filter has a film thickness that can obtain flat spectral transmission characteristics at a desired optical density. . Further, as the oxide film layer, various metal oxides can be applied because it prevents diffusion and prevents the film from progressing. For example, an Al2O3 (aluminum oxide) film may be deposited. The Al2O3 film can also be an outermost protective film.
こうして、酸化膜層を金属膜間に介在することによって平坦な分光透過特性を得ると共に熱処理後でも膜の荒れのない図2に示すような写真(合成石英基板/Hf/HfO2/Al/HfO2からなる積層構造の写真)のNDフィルタを得ることができる。
NDフィルタにおいてAl膜は、図1の例では該当しないが、その厚さが一定以上厚くなった場合には、クラックが生じ易いという性質がある。このため、図3は、このAl膜の性質に着目して所望の分光透過特性を得ようとしてAl層を厚くしようとするとき、1層の厚さを薄くした多層のAl層を形成した例を示す。図3(a)はHf層2の上層及び下層にAl層31、32を分割して積層した例を示し、このHf層2とAl層31及び32との間にHfO2層やAl2O3層51、52を形成した例を示す。また、図3(b)は6層のHf層21、22、23とAl層31、32、33との間にHfO2層やAl2O3層51、52、53、54、55を形成した例を示す。なお、図3にて4は例えばAl2O3からなる保護膜である。
In this way, a flat spectral transmission characteristic is obtained by interposing the oxide film layer between the metal films, and a photograph (from a synthetic quartz substrate / Hf / HfO2 / Al / HfO2) as shown in FIG. An ND filter having a multilayer structure) can be obtained.
In the ND filter, the Al film does not correspond to the example of FIG. 1, but has a property that cracks are likely to occur when the thickness of the Al film exceeds a certain level. For this reason, FIG. 3 shows an example in which a multi-layered Al layer having a reduced thickness is formed when an attempt is made to increase the thickness of the Al layer in order to obtain a desired spectral transmission characteristic by paying attention to the properties of the Al film. Indicates. FIG. 3A shows an example in which the Al layers 31 and 32 are divided and stacked on the upper layer and the lower layer of the Hf layer 2, and an HfO 2 layer and an Al 2 O 3 layer 51 are interposed between the Hf layer 2 and the Al layers 31 and 32. The example which formed 52 is shown. FIG. 3B shows an example in which an HfO 2 layer or an Al 2 O 3 layer 51, 52, 53, 54, 55 is formed between the six Hf layers 21, 22, 23 and the Al layers 31, 32, 33. . In FIG. 3, reference numeral 4 denotes a protective film made of, for example, Al 2 O 3.
〔第2実施形態〕
平坦な分光透過特性を得る他の例のNDフィルタとして、図4に示すようにAl膜3にCr(クロム)膜6を積層した構造のものがある。このNDフィルタは、透過率が一定で、ある波長域(400〜700nm)にてきわめて平坦な分光透過特性を得るものである。そして、図4(a)に示すような構造においても、Al膜3とCr膜6との間にたとえばAl2O3層5のような酸化膜層を形成することにより、膜の荒れの進行を防止することができる。
[Second Embodiment]
As another example of an ND filter that obtains flat spectral transmission characteristics, there is a structure in which a Cr (chromium) film 6 is laminated on an Al film 3 as shown in FIG. This ND filter has a constant transmittance and obtains a very flat spectral transmission characteristic in a certain wavelength region (400 to 700 nm). Also in the structure as shown in FIG. 4A, an oxide film layer such as an Al 2 O 3 layer 5 is formed between the Al film 3 and the Cr film 6 to prevent the film from progressing. be able to.
また、前述のようにAl膜にクラックが生じ易いことから、図4(b)ではAl膜3に似た特性を有するAg(銀)膜7をAl膜3とCr膜6との間に介在させているが、この場合もAl膜3とAg膜7との間、Ag膜7とCr膜6との間にそれぞれ例えばAl2O3膜51、52のような酸化膜層を被着形成することにより、膜の荒れの進行を防止することができる。 Further, as described above, since cracks are easily generated in the Al film, an Ag (silver) film 7 having characteristics similar to the Al film 3 is interposed between the Al film 3 and the Cr film 6 in FIG. In this case as well, an oxide film layer such as Al2O3 films 51 and 52 is deposited between the Al film 3 and the Ag film 7 and between the Ag film 7 and the Cr film 6, respectively. Further, the progress of film roughness can be prevented.
Claims (5)
第1の金属膜層とこの第1の金属膜層に隣接する第2の金属膜層との境界に酸化膜層を形成したことを特徴とする中性濃度フィルタ。 In a neutral density filter formed by laminating at least two kinds of metal films on a substrate,
A neutral density filter comprising an oxide film layer formed at a boundary between a first metal film layer and a second metal film layer adjacent to the first metal film layer.
第1の金属膜層はアルミニウムからなり、第2の金属膜層はハフニウムからなることを特徴とする中性濃度フィルタ。 The neutral density filter according to claim 1,
The neutral density filter, wherein the first metal film layer is made of aluminum and the second metal film layer is made of hafnium.
酸化膜層はハフニウム酸化膜層あるいはアルミニウム酸化膜層であることを特徴とする中性濃度フィルタ。 The neutral density filter according to claim 2,
The neutral density filter, wherein the oxide film layer is a hafnium oxide film layer or an aluminum oxide film layer.
第1の金属膜層はアルミニウムからなり、第2の金属膜層はクロムまたは銀からなることを特徴とする中性濃度フィルタ。 The neutral density filter according to claim 1,
The neutral density filter, wherein the first metal film layer is made of aluminum, and the second metal film layer is made of chromium or silver.
第1の金属膜層はクロムからなり、第2の金属膜層は銀からなることを特徴とする中性濃度フィルタ。 The neutral density filter according to claim 1,
The neutral density filter, wherein the first metal film layer is made of chromium and the second metal film layer is made of silver.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006125444A JP2007298659A (en) | 2006-04-28 | 2006-04-28 | Neutral density filter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006125444A JP2007298659A (en) | 2006-04-28 | 2006-04-28 | Neutral density filter |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2007298659A true JP2007298659A (en) | 2007-11-15 |
Family
ID=38768216
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006125444A Pending JP2007298659A (en) | 2006-04-28 | 2006-04-28 | Neutral density filter |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2007298659A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014167651A (en) * | 2014-05-12 | 2014-09-11 | Canon Electronics Inc | Nd filter, aperture device, and image capturing device |
JP2019139165A (en) * | 2018-02-14 | 2019-08-22 | キヤノン電子株式会社 | ND filter, light source angle measuring device and artificial satellite |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04116829A (en) * | 1990-09-06 | 1992-04-17 | Toshiba Corp | Semiconductor device and manufacture thereof |
JP2005300963A (en) * | 2004-04-13 | 2005-10-27 | Japan Aviation Electronics Industry Ltd | Neutral density filter |
JP2007240790A (en) * | 2006-03-08 | 2007-09-20 | Sumitomo Metal Mining Co Ltd | Absorption type multilayered nd filter and manufacturing method therefor |
-
2006
- 2006-04-28 JP JP2006125444A patent/JP2007298659A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04116829A (en) * | 1990-09-06 | 1992-04-17 | Toshiba Corp | Semiconductor device and manufacture thereof |
JP2005300963A (en) * | 2004-04-13 | 2005-10-27 | Japan Aviation Electronics Industry Ltd | Neutral density filter |
JP2007240790A (en) * | 2006-03-08 | 2007-09-20 | Sumitomo Metal Mining Co Ltd | Absorption type multilayered nd filter and manufacturing method therefor |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014167651A (en) * | 2014-05-12 | 2014-09-11 | Canon Electronics Inc | Nd filter, aperture device, and image capturing device |
JP2019139165A (en) * | 2018-02-14 | 2019-08-22 | キヤノン電子株式会社 | ND filter, light source angle measuring device and artificial satellite |
JP7093194B2 (en) | 2018-02-14 | 2022-06-29 | キヤノン電子株式会社 | Light source angle measuring device and artificial satellite |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR20160034315A (en) | Substrate with multilayered reflective film, reflective mask blank for euv lithography, reflective mask for euv lithography, process for producing same, and process for producing semiconductor device | |
JP2019124970A (en) | Polarizing plate, optical device, and method of manufacturing polarizing plate | |
JP2004354735A (en) | Light ray cut filter | |
JP2007193060A (en) | Mirror for solid laser | |
JP2010032867A (en) | Infrared ray cutoff filter | |
JP2010128259A (en) | Absorption type multilayer film nd filter and method of manufacturing the same | |
JP2018040888A (en) | Inorganic polarizer and manufacturing method thereof | |
JP2007298659A (en) | Neutral density filter | |
JP2005156201A (en) | X-ray total reflection mirror and x-ray exposure system | |
JP2011077552A (en) | Reflective mask blank, reflective mask, and multilayer film reflecting mirror | |
JP2004334012A (en) | Antireflection film and optical filter | |
JP2007063574A5 (en) | ||
JP2011107735A (en) | Halftone type phase shift mask blank and manufacturing method of halftone type phase shift mask | |
JP4351678B2 (en) | Silver mirror and manufacturing method thereof | |
JP2014227309A (en) | Cover glass and method of producing cover glass | |
JP4005582B2 (en) | Neutral density filter | |
JP4802770B2 (en) | Absorption-type multilayer ND filter and method for manufacturing the same | |
JP2003004919A (en) | High reflective mirror | |
JP2007206136A (en) | Nd filter, manufacturing method therefor and light quantity control diaphragm | |
JP2007233345A5 (en) | ||
TW201723647A (en) | Mask blank | |
JP5125268B2 (en) | Method for manufacturing absorption multilayer ND filter | |
JP2004184703A (en) | Reflection mirror | |
JP2005221867A (en) | Reflection type optical device | |
JP2011107496A (en) | Absorption type multilayer film nd filter and method of manufacturing the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Effective date: 20090401 Free format text: JAPANESE INTERMEDIATE CODE: A621 |
|
A977 | Report on retrieval |
Effective date: 20110413 Free format text: JAPANESE INTERMEDIATE CODE: A971007 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20110510 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20110913 |