JP2007258691A5 - - Google Patents
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- JP2007258691A5 JP2007258691A5 JP2007038802A JP2007038802A JP2007258691A5 JP 2007258691 A5 JP2007258691 A5 JP 2007258691A5 JP 2007038802 A JP2007038802 A JP 2007038802A JP 2007038802 A JP2007038802 A JP 2007038802A JP 2007258691 A5 JP2007258691 A5 JP 2007258691A5
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- Prior art keywords
- laser
- optical element
- diffractive optical
- laser beam
- irradiated
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- 230000003287 optical effect Effects 0.000 claims 14
- 238000000034 method Methods 0.000 claims 7
- 239000011229 interlayer Substances 0.000 claims 6
- 239000004065 semiconductor Substances 0.000 claims 4
- 230000001678 irradiating effect Effects 0.000 claims 3
- 239000010410 layer Substances 0.000 claims 3
- 238000004587 chromatography analysis Methods 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 230000005405 multipole Effects 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Claims (13)
前記レーザ発振器から射出されたレーザビームは、前記回折光学素子により、複数のレーザビームに分割され、前記複数のマイクロミラーの中央部又は中央部と隅の間に集光するように入射し、前記複数のマイクロミラーにより、前記搬送ステージに上に載置された被照射体に照射するように偏向されることを特徴とするレーザ照射装置。 And Les chromatography The oscillator, a diffraction optical element, a laser irradiation apparatus having a micromirror multiple, and conveyance stage, and
The laser beam emitted from the laser oscillator is split into a plurality of laser beams by the diffractive optical element, and is incident so as to be condensed between the central part or the central part and the corners of the plurality of micromirrors. A laser irradiation apparatus which is deflected by a plurality of micromirrors so as to irradiate an irradiated object placed on the transfer stage.
前記回折光学素子は透過型回折光学素子又は反射型回折光学素子であることを特徴とするレーザ照射装置。 In claim 1,
The diffractive optical element is a transmissive diffractive optical element or a reflective diffractive optical element.
前記回折光学素子は2値位相格子、多極位相格子、又は連続位相格子のいずれかであることを特徴とするレーザ照射装置。The diffractive optical element is any one of a binary phase grating, a multipole phase grating, and a continuous phase grating.
前記複数に分割されたレーザビームは、互いに等しいエネルギーを有することを特徴とするレーザ照射装置。 In any one of Claim 1 thru | or 3 ,
The laser irradiation apparatus according to claim 1, wherein the plurality of divided laser beams have equal energy.
前記回折光学素子と、前記搬送ステージとの間に配置された投影レンズを有することを特徴とするレーザ照射装置。 Any one to Oite of claims 1 to 4,
A laser irradiation apparatus comprising a projection lens disposed between the diffractive optical element and the transfer stage.
前記集光されたレーザビームのスポットサイズは、前記マイクロミラーの表面積よりも小さいことを特徴とするレーザ照射装置。 Any one to Oite of claims 1 to 5,
Spot size of the focused beam laser beam, a laser irradiation apparatus, wherein the O surface area of the micro mirror remote small.
前記複数に分割されたレーザビームを複数のマイクロミラーにおいて、それぞれの中央部又は中央部と隅の間に集光するように入射させ、偏向して被照射体に照射することを特徴とするレーザ照射方法。 The laser beam emitted from the laser oscillator is incident on the diffractive optical element and divided into a plurality of parts,
Laser in a plurality of micro-mirrors to split the laser beam into the plurality, is incident to the condenser between a respective central portion or central portion corner deflection to and irradiating the irradiated body Irradiation method.
前記集光されたレーザビームは、前記マイクロミラーの表面積よりも小さいことを特徴とするレーザ照射方法。 Oite to claim 7,
The condensing laser beams, laser irradiation method, characterized in that less than the surface area of the micro mirror.
前記複数に分割されたレーザビームのうちの1つのレーザビームを第1のマイクロミラーにおいて、中央部又は中央部と隅の間に集光するように入射させて偏向し、前記レーザビームを被照射体上に照射し、
前記複数に分割されたレーザビームのうちの他の1つのレーザビームを第2のマイクロミラーにおいて、中央部又は中央部と隅の間に集光するように入射さて偏向し、前記レーザビームを被照射体上に照射することを特徴とするレーザ照射方法。 The laser beam emitted from the laser oscillator is incident on the diffractive optical element and divided into a plurality of parts,
One laser beam of the plurality of divided laser beams is incident on the first micromirror so as to be condensed between the central portion or the central portion and the corner and deflected, and the laser beam is irradiated. Irradiate on the body,
In another one of the second micro-mirror laser beam of the split laser beams to said plurality of deflected incident to focused between the central portion or central portion corners, the laser beam laser irradiation method, which comprises irradiating the object to be irradiated.
前記回折光学素子は透過型回折光学素子又は反射型回折光学素子であることを特徴とするレーザ照射方法。 In claim 7 or claim 9 ,
The laser irradiation method, wherein the diffractive optical element is a transmissive diffractive optical element or a reflective diffractive optical element.
前記複数に分割されたレーザビームは互いに等しいエネルギーを有することを特徴とするレーザ照射方法。 Any one to Oite of claims 7 to 11,
The laser irradiation method, wherein the plurality of divided laser beams have equal energy.
前記複数に分割されたレーザビームは、前記回折光学素子と、被照射体が載置された搬送ステージとの間に配置された投影レンズを通過した後、前記被照射体上に照射されることを特徴とするレーザ照射方法。 Any one to Oite of claims 7 to 11,
Said plurality of divided laser beam, and the diffraction optical element passes through the arrangement projection lens between the transport stage irradiated object is placed, said to be irradiated onto the object to be irradiated A laser irradiation method characterized by the above.
前記複数の島状半導体層上に第1の層間絶縁膜を形成し、
前記第1の層間絶縁膜を介して前記複数の島状半導体層上に、それぞれゲート電極を形成し、
前記ゲート電極上に第2の層間絶縁膜を形成し、
前記第2の層間絶縁膜上にレジストを設け、
回折光学素子を通過して複数に分割され、さらに複数のマイクロミラーの中央又は中央部と隅の間に集光するように入射させて偏向されたそれぞれのレーザビームを前記レジストに照射し、
前記レーザビームが照射された前記レジストを現像し、
前記レジストをマスクとして、前記第1の層間絶縁膜及び前記第2の層間絶縁膜をエッチングすることによって、選択的にコンタクトホールを形成することを特徴とする半導体装置の作製方法。
Forming an island-shaped semiconductor layer of the multiple on the substrate,
Forming a first interlayer insulating film on the plurality of island-shaped semiconductor layers;
Forming a gate electrode on each of the plurality of island-like semiconductor layers via the first interlayer insulating film;
Forming a second interlayer insulating film on the gate electrode;
Providing a resist on the second interlayer insulating film;
Irradiating the resist with each laser beam that has been divided into a plurality of parts through the diffractive optical element and incident and deflected so as to be condensed between the center or the center and corners of the plurality of micromirrors,
Developing the resist irradiated with the laser beam;
A method for manufacturing a semiconductor device, wherein contact holes are selectively formed by etching the first interlayer insulating film and the second interlayer insulating film using the resist as a mask.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007038802A JP2007258691A (en) | 2006-02-21 | 2007-02-20 | Device for laser irradiation, method of laser irradiation, and method of fabricating semiconductor device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006044201 | 2006-02-21 | ||
JP2007038802A JP2007258691A (en) | 2006-02-21 | 2007-02-20 | Device for laser irradiation, method of laser irradiation, and method of fabricating semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007258691A JP2007258691A (en) | 2007-10-04 |
JP2007258691A5 true JP2007258691A5 (en) | 2010-04-02 |
Family
ID=38632575
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007038802A Withdrawn JP2007258691A (en) | 2006-02-21 | 2007-02-20 | Device for laser irradiation, method of laser irradiation, and method of fabricating semiconductor device |
Country Status (1)
Country | Link |
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JP (1) | JP2007258691A (en) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009178843A (en) | 2006-08-22 | 2009-08-13 | Rynne Group Llc | Identification card, and identification card transaction system using the identification card |
US7768627B2 (en) * | 2007-06-14 | 2010-08-03 | Asml Netherlands B.V. | Illumination of a patterning device based on interference for use in a maskless lithography system |
JP5267029B2 (en) | 2007-10-12 | 2013-08-21 | 株式会社ニコン | Illumination optical apparatus, exposure apparatus, and device manufacturing method |
EP2179330A1 (en) * | 2007-10-16 | 2010-04-28 | Nikon Corporation | Illumination optical system, exposure apparatus, and device manufacturing method |
US8379187B2 (en) | 2007-10-24 | 2013-02-19 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
US9116346B2 (en) | 2007-11-06 | 2015-08-25 | Nikon Corporation | Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method |
US8047442B2 (en) | 2007-12-03 | 2011-11-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
WO2009078223A1 (en) * | 2007-12-17 | 2009-06-25 | Nikon Corporation | Spatial light modulating unit, illumination optical system, aligner, and device manufacturing method |
WO2009104272A1 (en) * | 2008-02-22 | 2009-08-27 | リン グループ エルエルシー | Total transaction system using identification card |
US8823921B2 (en) * | 2011-08-19 | 2014-09-02 | Ultratech, Inc. | Programmable illuminator for a photolithography system |
US20180068047A1 (en) * | 2016-09-08 | 2018-03-08 | Mapper Lithography Ip B.V. | Method and system for fabricating unique chips using a charged particle multi-beamlet lithography system |
US10522472B2 (en) * | 2016-09-08 | 2019-12-31 | Asml Netherlands B.V. | Secure chips with serial numbers |
US10418324B2 (en) * | 2016-10-27 | 2019-09-17 | Asml Netherlands B.V. | Fabricating unique chips using a charged particle multi-beamlet lithography system |
JP2020098866A (en) * | 2018-12-18 | 2020-06-25 | 株式会社ブイ・テクノロジー | Laser annealing device |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002228818A (en) * | 2001-02-05 | 2002-08-14 | Taiyo Yuden Co Ltd | Diffraction optical device for laser beam machining and device and method for laser beam machining |
JP4338434B2 (en) * | 2002-06-07 | 2009-10-07 | 富士フイルム株式会社 | Transmission type two-dimensional light modulation element and exposure apparatus using the same |
JP2004062156A (en) * | 2002-06-07 | 2004-02-26 | Fuji Photo Film Co Ltd | Exposure head and exposure apparatus |
JP4279053B2 (en) * | 2002-06-07 | 2009-06-17 | 富士フイルム株式会社 | Exposure head and exposure apparatus |
JP4323335B2 (en) * | 2004-01-21 | 2009-09-02 | 富士フイルム株式会社 | Image exposure method and apparatus |
JP4162606B2 (en) * | 2004-01-26 | 2008-10-08 | 富士フイルム株式会社 | Light modulation element, light modulation element array, and image forming apparatus |
JP4497382B2 (en) * | 2004-03-02 | 2010-07-07 | 住友重機械工業株式会社 | Laser irradiation device |
JP2005275325A (en) * | 2004-03-26 | 2005-10-06 | Fuji Photo Film Co Ltd | Image exposing device |
JP2006108465A (en) * | 2004-10-07 | 2006-04-20 | Nikon Corp | Optical characteristic measurement equipment and exposure device |
JP5178022B2 (en) * | 2006-02-03 | 2013-04-10 | 株式会社半導体エネルギー研究所 | Method for manufacturing memory element |
-
2007
- 2007-02-20 JP JP2007038802A patent/JP2007258691A/en not_active Withdrawn
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