JP2007258691A5 - - Google Patents

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Publication number
JP2007258691A5
JP2007258691A5 JP2007038802A JP2007038802A JP2007258691A5 JP 2007258691 A5 JP2007258691 A5 JP 2007258691A5 JP 2007038802 A JP2007038802 A JP 2007038802A JP 2007038802 A JP2007038802 A JP 2007038802A JP 2007258691 A5 JP2007258691 A5 JP 2007258691A5
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Prior art keywords
laser
optical element
diffractive optical
laser beam
irradiated
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JP2007038802A
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Japanese (ja)
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JP2007258691A (en
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Priority to JP2007038802A priority Critical patent/JP2007258691A/en
Priority claimed from JP2007038802A external-priority patent/JP2007258691A/en
Publication of JP2007258691A publication Critical patent/JP2007258691A/en
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Claims (13)

ーザ発振器と、折光学素子と、数のマイクロミラーと、送ステージと、を有するレーザ照射装置であり、
前記レーザ発振器から射出されたレーザビームは、前記回折光学素子により、複数のレーザビームに分割され、前記複数のマイクロミラーの中央部又は中央部と隅の間に集光するように入射し、前記複数のマイクロミラーにより、前記搬送ステージに上に載置された被照射体に照射するように偏向されることを特徴とするレーザ照射装置。
And Les chromatography The oscillator, a diffraction optical element, a laser irradiation apparatus having a micromirror multiple, and conveyance stage, and
The laser beam emitted from the laser oscillator is split into a plurality of laser beams by the diffractive optical element, and is incident so as to be condensed between the central part or the central part and the corners of the plurality of micromirrors. A laser irradiation apparatus which is deflected by a plurality of micromirrors so as to irradiate an irradiated object placed on the transfer stage.
請求項1において、
前記回折光学素子は透過型回折光学素子又は反射型回折光学素子であることを特徴とするレーザ照射装置。
In claim 1,
The diffractive optical element is a transmissive diffractive optical element or a reflective diffractive optical element.
請求項1において、In claim 1,
前記回折光学素子は2値位相格子、多極位相格子、又は連続位相格子のいずれかであることを特徴とするレーザ照射装置。The diffractive optical element is any one of a binary phase grating, a multipole phase grating, and a continuous phase grating.
請求項1乃至請求項3のいずれか一において、
前記複数に分割されたレーザビームは、互いに等しいエネルギーを有することを特徴とするレーザ照射装置。
In any one of Claim 1 thru | or 3 ,
The laser irradiation apparatus according to claim 1, wherein the plurality of divided laser beams have equal energy.
請求項1乃至請求項のいずれか一において、
前記回折光学素子と、前記搬送ステージとの間に配置された投影レンズを有することを特徴とするレーザ照射装置。
Any one to Oite of claims 1 to 4,
A laser irradiation apparatus comprising a projection lens disposed between the diffractive optical element and the transfer stage.
請求項1乃至請求項のいずれか一において、
前記集光されたレーザビームのスポットサイズは、前記マイクロミラーの表面積よりも小さいことを特徴とするレーザ照射装置。
Any one to Oite of claims 1 to 5,
Spot size of the focused beam laser beam, a laser irradiation apparatus, wherein the O surface area of the micro mirror remote small.
レーザ発振器から射出したレーザビームを回折光学素子に入射して複数に分割し、
前記複数に分割されたレーザビームを複数のマイクロミラーにおいて、それぞれの中央部又は中央部と隅の間に集光するように入射させ、偏向して被照射体に照射することを特徴とするレーザ照射方法。
The laser beam emitted from the laser oscillator is incident on the diffractive optical element and divided into a plurality of parts,
Laser in a plurality of micro-mirrors to split the laser beam into the plurality, is incident to the condenser between a respective central portion or central portion corner deflection to and irradiating the irradiated body Irradiation method.
請求項7において、
前記集光されたレーザビームは、前記マイクロミラーの表面積よりも小さいことを特徴とするレーザ照射方法。
Oite to claim 7,
The condensing laser beams, laser irradiation method, characterized in that less than the surface area of the micro mirror.
レーザ発振器から射出したレーザビームを回折光学素子に入射して複数に分割し、
前記複数に分割されたレーザビームのうちの1つのレーザビームを第1のマイクロミラーにおいて、中央部又は中央部と隅の間に集光するように入射させて偏向し、前記レーザビームを被照射体上に照射し、
前記複数に分割されたレーザビームのうちの他の1つのレーザビームを第2のマイクロミラーにおいて、中央部又は中央部と隅の間に集光するように入射さ偏向し、前記レーザビームを被照射上に照射することを特徴とするレーザ照射方法。
The laser beam emitted from the laser oscillator is incident on the diffractive optical element and divided into a plurality of parts,
One laser beam of the plurality of divided laser beams is incident on the first micromirror so as to be condensed between the central portion or the central portion and the corner and deflected, and the laser beam is irradiated. Irradiate on the body,
In another one of the second micro-mirror laser beam of the split laser beams to said plurality of deflected incident to focused between the central portion or central portion corners, the laser beam laser irradiation method, which comprises irradiating the object to be irradiated.
請求項又は請求項において、
前記回折光学素子は透過型回折光学素子又は反射型回折光学素子であることを特徴とするレーザ照射方法。
In claim 7 or claim 9 ,
The laser irradiation method, wherein the diffractive optical element is a transmissive diffractive optical element or a reflective diffractive optical element.
請求項乃至請求項11のいずれか一において、
前記複数に分割されたレーザビームは互いに等しいエネルギーを有することを特徴とするレーザ照射方法。
Any one to Oite of claims 7 to 11,
The laser irradiation method, wherein the plurality of divided laser beams have equal energy.
請求項乃至請求項11のいずれか一において、
前記複数に分割されたレーザビームは、前記回折光学素子と、被照射体が載置された搬送ステージとの間に配置された投影レンズを通過した後、前記被照射上に照射されることを特徴とするレーザ照射方法。
Any one to Oite of claims 7 to 11,
Said plurality of divided laser beam, and the diffraction optical element passes through the arrangement projection lens between the transport stage irradiated object is placed, said to be irradiated onto the object to be irradiated A laser irradiation method characterized by the above.
基板上に複数の島状半導体層を形成し、
前記複数の島状半導体層上に第1の層間絶縁膜を形成し、
前記第1の層間絶縁膜を介して前記複数の島状半導体層上に、それぞれゲート電極を形成し、
前記ゲート電極上に第2の層間絶縁膜を形成し、
前記第2の層間絶縁膜上にレジストを設け、
回折光学素子を通過して複数に分割され、さらに複数のマイクロミラーの中央又は中央部と隅の間に集光するように入射させて偏向されたそれぞれのレーザビームを前記レジストに照射し、
前記レーザビームが照射された前記レジストを現像し、
前記レジストをマスクとして、前記第1の層間絶縁膜及び前記第2の層間絶縁膜をエッチングすることによって、選択的にコンタクトホールを形成することを特徴とする半導体装置の作製方法。

Forming an island-shaped semiconductor layer of the multiple on the substrate,
Forming a first interlayer insulating film on the plurality of island-shaped semiconductor layers;
Forming a gate electrode on each of the plurality of island-like semiconductor layers via the first interlayer insulating film;
Forming a second interlayer insulating film on the gate electrode;
Providing a resist on the second interlayer insulating film;
Irradiating the resist with each laser beam that has been divided into a plurality of parts through the diffractive optical element and incident and deflected so as to be condensed between the center or the center and corners of the plurality of micromirrors,
Developing the resist irradiated with the laser beam;
A method for manufacturing a semiconductor device, wherein contact holes are selectively formed by etching the first interlayer insulating film and the second interlayer insulating film using the resist as a mask.

JP2007038802A 2006-02-21 2007-02-20 Device for laser irradiation, method of laser irradiation, and method of fabricating semiconductor device Withdrawn JP2007258691A (en)

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JP2006044201 2006-02-21
JP2007038802A JP2007258691A (en) 2006-02-21 2007-02-20 Device for laser irradiation, method of laser irradiation, and method of fabricating semiconductor device

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Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009178843A (en) 2006-08-22 2009-08-13 Rynne Group Llc Identification card, and identification card transaction system using the identification card
US7768627B2 (en) * 2007-06-14 2010-08-03 Asml Netherlands B.V. Illumination of a patterning device based on interference for use in a maskless lithography system
JP5267029B2 (en) 2007-10-12 2013-08-21 株式会社ニコン Illumination optical apparatus, exposure apparatus, and device manufacturing method
EP2179330A1 (en) * 2007-10-16 2010-04-28 Nikon Corporation Illumination optical system, exposure apparatus, and device manufacturing method
US8379187B2 (en) 2007-10-24 2013-02-19 Nikon Corporation Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
US9116346B2 (en) 2007-11-06 2015-08-25 Nikon Corporation Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method
US8047442B2 (en) 2007-12-03 2011-11-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
WO2009078223A1 (en) * 2007-12-17 2009-06-25 Nikon Corporation Spatial light modulating unit, illumination optical system, aligner, and device manufacturing method
WO2009104272A1 (en) * 2008-02-22 2009-08-27 リン グループ エルエルシー Total transaction system using identification card
US8823921B2 (en) * 2011-08-19 2014-09-02 Ultratech, Inc. Programmable illuminator for a photolithography system
US20180068047A1 (en) * 2016-09-08 2018-03-08 Mapper Lithography Ip B.V. Method and system for fabricating unique chips using a charged particle multi-beamlet lithography system
US10522472B2 (en) * 2016-09-08 2019-12-31 Asml Netherlands B.V. Secure chips with serial numbers
US10418324B2 (en) * 2016-10-27 2019-09-17 Asml Netherlands B.V. Fabricating unique chips using a charged particle multi-beamlet lithography system
JP2020098866A (en) * 2018-12-18 2020-06-25 株式会社ブイ・テクノロジー Laser annealing device

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002228818A (en) * 2001-02-05 2002-08-14 Taiyo Yuden Co Ltd Diffraction optical device for laser beam machining and device and method for laser beam machining
JP4338434B2 (en) * 2002-06-07 2009-10-07 富士フイルム株式会社 Transmission type two-dimensional light modulation element and exposure apparatus using the same
JP2004062156A (en) * 2002-06-07 2004-02-26 Fuji Photo Film Co Ltd Exposure head and exposure apparatus
JP4279053B2 (en) * 2002-06-07 2009-06-17 富士フイルム株式会社 Exposure head and exposure apparatus
JP4323335B2 (en) * 2004-01-21 2009-09-02 富士フイルム株式会社 Image exposure method and apparatus
JP4162606B2 (en) * 2004-01-26 2008-10-08 富士フイルム株式会社 Light modulation element, light modulation element array, and image forming apparatus
JP4497382B2 (en) * 2004-03-02 2010-07-07 住友重機械工業株式会社 Laser irradiation device
JP2005275325A (en) * 2004-03-26 2005-10-06 Fuji Photo Film Co Ltd Image exposing device
JP2006108465A (en) * 2004-10-07 2006-04-20 Nikon Corp Optical characteristic measurement equipment and exposure device
JP5178022B2 (en) * 2006-02-03 2013-04-10 株式会社半導体エネルギー研究所 Method for manufacturing memory element

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