JP2007234001A5 - - Google Patents

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Publication number
JP2007234001A5
JP2007234001A5 JP2007020267A JP2007020267A JP2007234001A5 JP 2007234001 A5 JP2007234001 A5 JP 2007234001A5 JP 2007020267 A JP2007020267 A JP 2007020267A JP 2007020267 A JP2007020267 A JP 2007020267A JP 2007234001 A5 JP2007234001 A5 JP 2007234001A5
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JP
Japan
Prior art keywords
circuit
random number
arithmetic
program
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2007020267A
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English (en)
Japanese (ja)
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JP2007234001A (ja
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Publication date
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Priority to JP2007020267A priority Critical patent/JP2007234001A/ja
Priority claimed from JP2007020267A external-priority patent/JP2007234001A/ja
Publication of JP2007234001A publication Critical patent/JP2007234001A/ja
Publication of JP2007234001A5 publication Critical patent/JP2007234001A5/ja
Withdrawn legal-status Critical Current

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JP2007020267A 2006-01-31 2007-01-31 半導体装置 Withdrawn JP2007234001A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007020267A JP2007234001A (ja) 2006-01-31 2007-01-31 半導体装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006023675 2006-01-31
JP2007020267A JP2007234001A (ja) 2006-01-31 2007-01-31 半導体装置

Publications (2)

Publication Number Publication Date
JP2007234001A JP2007234001A (ja) 2007-09-13
JP2007234001A5 true JP2007234001A5 (https=) 2010-02-12

Family

ID=38554486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007020267A Withdrawn JP2007234001A (ja) 2006-01-31 2007-01-31 半導体装置

Country Status (1)

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JP (1) JP2007234001A (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5288283B2 (ja) 2008-02-06 2013-09-11 日本電気株式会社 サイドチャネル攻撃耐性評価装置とサイドチャネル攻撃耐性評価方法、及びサイドチャネル攻撃耐性評価用プログラム
FR2928475B1 (fr) * 2008-03-05 2010-05-07 Commissariat Energie Atomique Dispositif de communication sans contact.
WO2010032611A1 (en) 2008-09-19 2010-03-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JPWO2011148558A1 (ja) 2010-05-28 2013-07-25 日本電気株式会社 署名生成装置、署名方法、及び署名生成プログラム
JP5499365B2 (ja) * 2010-09-29 2014-05-21 国立大学法人神戸大学 メモリセルアレイを用いたｉｄチップおよびその生成方法
WO2012136763A2 (en) * 2011-04-05 2012-10-11 Intrinsic Id B.V. Random number generating system based on memory start-up noise
JP5813380B2 (ja) * 2011-06-03 2015-11-17 株式会社東芝 半導体記憶装置
CN105431861A (zh) * 2013-05-31 2016-03-23 科欧罗基克斯有限公司 用于安全系统的电荷分配控制
JP6373690B2 (ja) 2014-09-05 2018-08-15 ルネサスエレクトロニクス株式会社 半導体装置
DE112020005424T5 (de) 2020-01-07 2022-09-01 Mitsubishi Electric Corporation Informationsverarbeitungseinrichtung, informationsverarbeitungsverfahren und informationsverarbeitungsprogramm

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05258127A (ja) * 1992-03-12 1993-10-08 Mitsubishi Electric Corp 情報カード
JPH1069222A (ja) * 1996-08-27 1998-03-10 Dainippon Printing Co Ltd Ｉｃカード
EP0871897A1 (en) * 1996-11-05 1998-10-21 Koninklijke Philips Electronics N.V. Contactless data transmission and receiving device with a synchronous demodulator
JP2002190798A (ja) * 2000-12-20 2002-07-05 Nec Corp 暗号化装置および復号化装置
JP5121119B2 (ja) * 2003-12-26 2013-01-16 株式会社半導体エネルギー研究所 チップ搭載物
JP4072503B2 (ja) * 2004-02-04 2008-04-09 シャープ株式会社 補助演算用コプロセッサ内蔵型ｉｃカード及びその制御方法
JP4294514B2 (ja) * 2004-03-05 2009-07-15 シャープ株式会社 半導体装置および電子装置
JP2005269187A (ja) * 2004-03-18 2005-09-29 Nec Infrontia Corp 暗号処理通信システム
US8131134B2 (en) * 2004-04-14 2012-03-06 Microsoft Corporation Digital media universal elementary stream

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