JP2007192705A - Measuring probe - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a measuring probe capable of reducing parasitic inductance during probe connection. <P>SOLUTION: The measuring probe includes a first measurement arm made of conductive material whose one end has a first hook section for locking a first measured terminal and made of elastic material and a first hinge section disposed in a midway, and the other end has a first connecting means connected to a measuring probe body. The measuring probe also comprises a second measurement arm made of conductive material whose one end has a second hook section for locking a second measured terminal and made of elastic material and a second hinge section whose midway is turnably connected to the first hinge section, and the other end has a second connecting means connected to the measuring probe body. The measuring probe also comprises a force applying means that is disposed in the hinge section and applying a force to the first and second measurement arms so that the first and second measured terminals are gripped by the first and second hook sections elastically cooperatively. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a measurement probe that can reduce parasitic inductance when a probe is connected.

  Prior art documents related to the measurement probe include the following.

JP-A-6-5321

4A and 4B are explanatory views of a configuration of a conventional example that is generally used conventionally. FIG. 4A is a front view, and FIG. 4B is a side view.
The IC clip 10 includes an insulating mold part 11, a plurality of pins 12 arranged side by side in correspondence with a plurality of IC terminals (not shown), and a spring 13.

  When the IC clip is used, the lower end of each pin 12 comes into contact with the corresponding terminal (lead terminal) of the IC by sandwiching the IC between the tip portions of the IC clip 10. The portion exposed from the mold portion 11 is contacted and probed by a probe (not shown), so that the electrical waveform of the IC can be observed.

  In this type of IC clip 10, a specific pin (generally a ground pin) is used as a reference in order to measure the potential of each pin 12 and the like. The child is connected to the pin to be measured. In this case, since the distances between the specific pin and each measurement pin are all different, the probe 20 as shown in FIG. 5 is used.

  The probe 20 includes a probe main body 21, a ground wire 22, an alligator clip 23 attached to the tip of the ground wire 22, and a contact 24 at the tip of the probe.

  When the ground line 22 of the probe 20 is set to a certain length and the contactor 24 comes into contact with the pin to be measured, even if the specific pin to be a reference such as the ground is separated, the ground line 22 This makes measurement easier.

Such an apparatus has the following problems.
When a long ground wire 22 is used for the probe, when measuring a signal having a frequency component of a certain level or more, the inductance component of the ground wire has an effect, and there is a drawback that correct measurement cannot be performed.

  In order to solve this drawback, if a probe in which a short bare wire 25 for ground is fixed and attached near the contact 24 instead of the ground wire 22 as shown in FIG. Since all the distances are different from each other, there are disadvantages that measurement is not easy and erroneous contact is likely to occur.

  An object of the present invention is to solve the above-described problems, and to provide a measurement probe that can be easily clipped on with a low inductance as a measurement target.

In order to achieve such a problem, in the present invention, in the measurement probe of claim 1,
A first hook portion made of an electrically conductive material, with a first measurement target terminal locked on one end and made of an elastic material, a first hinge portion provided in the middle, and a measurement probe main body connected to the other end. A first measuring arm having one connecting means, a second hook portion made of an electrically conductive material, a second hook portion made of an elastic material with a second measurement target terminal locked to one end, and the first hinge portion halfway. And a second measuring arm having a second hinge part connected to the second probe part and a second connection means connected to the measurement probe main body at the other end, and the first and first hinges provided on the hinge part. Force applying means for applying a force to the first and second measuring arms so that the second measuring object terminal is elastically sandwiched between the first hook portion and the second hook portion. It was characterized by comprising.

In the measurement probe according to claim 2 of the present invention, in the measurement probe according to claim 1,
The connection means uses a socket.

In the measurement probe according to claim 3 of the present invention, in the measurement probe according to claim 1 or 2,
The first and second measurement arms are covered with an insulating coating except for the hook portion.

In the measurement probe according to claim 4 of the present invention, in the measurement probe according to any one of claims 1 to 3,
At least one of the first and second measurement arms is made of a conductive spring material.

In the measurement probe according to claim 5 of the present invention, in the measurement probe according to any one of claims 1 to 4,
A lever provided on at least one of the other end sides of the first and second measurement arms is provided to open between the first and second hook portions.

In the measurement probe according to claim 6 of the present invention, in the measurement probe according to any one of claims 1 to 5,
The force applying means uses a spring.

According to claim 1 of the present invention, there are the following effects.
Since the structure is simple and can be made small, the connecting portion from the hook portion to the measuring probe main body can be shortened, and a measuring probe that can reduce the parasitic inductance when the probe is connected can be obtained.

According to claim 2 of the present invention, there are the following effects.
Since a socket is used as the connection means, a measurement probe that can be easily attached and detached is obtained.

According to claim 3 of the present invention, there are the following effects.
Since the first and second measurement arms are covered with an insulating coating except for the hook portion, a measurement probe that can prevent a short circuit with a circuit or the like during measurement is obtained.

According to claim 4 of the present invention, there are the following effects.
Since at least one of the first and second measurement arms is made of a conductive spring material, the first and second measurement arms can also serve as a force application unit, reduce the number of parts, and obtain an inexpensive measurement probe.

According to claim 5 of the present invention, there are the following effects.
Since a lever is provided on at least one of the other ends of the first and second measurement arms and opens between the first and second hook portions, the first and second hook portions can be opened. A measurement probe that can be easily obtained is obtained.

According to claim 6 of the present invention, there are the following effects.
Since a spring is used as the force applying means, the spring is commercially available and easily available, so an inexpensive measurement probe can be obtained.

Hereinafter, the present invention will be described in detail with reference to the drawings.
FIG. 1 is a diagram illustrating the configuration of the main part of one embodiment of the present invention, and FIG. 2 is a diagram illustrating the operation of FIG.

In FIG. 1, 31 is a measurement probe body, 32 is a first measurement arm, 33 is a second measurement arm, and 34 is a force applying means.
The first measurement arm 32 includes a first hook part 321, a first hinge part 322, and first connection means 323.

The first hook portion 321 is provided at one end of the first measurement arm 32 and is made of an elastic material by locking the first measurement target terminal at one end.
The first hinge portion 322 is provided in the middle of the first measurement arm 32.
The first connection means 323 is provided at the other end of the first measurement arm 32 and is connected to the measurement probe main body 31.

The second measurement arm 33 includes a second hook portion 331, a second hinge portion 332, and second connection means 333.
The second hook portion 331 is provided at one end of the second measurement arm 33, and is made of an elastic material by locking the second measurement target terminal at one end.

The second hinge part 332 is provided in the middle of the second measurement arm 33 and is connected to the first hinge part 322 so as to freely rotate.
The second connection means 333 is provided at the other end of the second measurement arm 33 and is connected to the measurement probe main body 31.

  The force application means 34 is provided in the hinge portions 322 and 332 so that the first and second measurement target terminals are elastically sandwiched between the first hook portion 321 and the second hook portion 331. In addition, a force is applied to the first and second measurement arms 32 and 33.

In this case, the first connecting means 323 uses a socket, and the second connecting means 333 uses a ring-shaped contact ring. The first and second measurement arms 32 and 33 are covered with first and second insulating coatings 324 and 334 except for the hook portions 321 and 331.
Further, at least one of the first and second measurement arms 32 and 33 is made of a conductive spring material. In this case, a phosphor bronze leaf spring is used for the second measuring arm 33.

The lever is provided on at least one of the other end sides of the first and second measurement arms 32 and 33 and opens between the first and second hook portions 321 and 331. In this case, the second A lever 335 is provided on the other end side of the measurement arm 33.
The force application means 34 is a coiled spring.

  In the above configuration, as shown in FIG. 2, when the measurement probe is connected to the measurement target terminal, the lever 335 is pushed in and the space between the first and second hook portions 321 and 331 is widened so that the signal to be measured When the lever 335 is released in accordance with the terminal A and the ground terminal G, the signal terminal A and the ground terminal G to be measured are grasped and fixed by the restoring force of the leaf spring of the second measurement arm 33.

As a result,
Since the structure is simple and can be reduced, the connection from the hook portions 321 and 331 to the measurement probe main body 31 can be shortened, and a measurement probe that can reduce the parasitic inductance when the probe is connected is obtained.
Further, by making the first and second hook portions 321 and 331 thin or thin, a measurement probe that can easily cope with probing of fine pitch package parts can be obtained.

  Since a socket is used as the connection means 323, a measurement probe that can be easily attached and detached is obtained.

  Since the first and second measurement arms 32 and 33 are covered with the insulating coatings 324 and 334 except for the hook portions 321 and 331, a measurement probe that can prevent a short circuit with a circuit or the like during measurement is obtained.

  Since at least one of the first and second measurement arms 32 and 33 is made of a conductive spring material, the first and second measurement arms 32 and 33 can also serve as the force application means 34, reduce the number of parts, and obtain an inexpensive measurement probe. It is done.

  Since a lever 335 that opens between at least one of the first and second measurement arms 32 and 33 and opens between the first and second hook portions 321 and 331 is provided. Thus, a measurement probe that can easily open the gap between the hook portions 321 and 331 is obtained.

  Since the spring is used as the force applying means 34, the spring is commercially available and can be easily obtained, so that an inexpensive measurement probe can be obtained.

FIG. 3 is an explanatory view of the main part configuration of another embodiment of the present invention.
In FIG. 3, 41 is a measurement probe body, 42 is a first measurement arm, 43 is a second measurement arm, and 44 is a force applying means.
The first measurement arm 42 includes a first hook part 421, a first hinge part 422, and first connection means 423.

The first hook portion 421 is provided at one end of the first measurement arm 42 and is made of an elastic material by locking the first measurement target terminal at one end.
The first hinge portion 422 is provided in the middle of the first measurement arm 42.
The first connection means 423 is provided at the other end of the first measurement arm 42 and is connected to the measurement probe main body 41.

The second measurement arm 43 includes a second hook part 431, a second hinge part 432, and second connection means 433.
The second hook portion 431 is provided at one end of the second measurement arm 42 and is made of an elastic material by locking the second measurement target terminal at one end.

The second hinge portion 432 is provided in the middle of the second measurement arm 43, and is connected to the first hinge portion so as to freely rotate.
The second connection means 433 is provided at the other end of the second measurement arm 43 and is connected to the measurement probe main body 41.

  The force applying means 44 is provided on the hinge portions 422 and 432 so that the first and second measurement target terminals are elastically sandwiched between the first hook portion 421 and the second hook portion 431. In addition, a force is applied to the first and second measurement arms 42 and 43.

In this case, sockets are used as the connecting means 423 and 433. The first and second measurement arms 42 and 43 are covered with insulating coatings 424 and 434 except for the hook portions 421 and 431.
Further, at least one of the first and second measurement arms 42 and 43 is made of a conductive spring material. In this case, the second measuring arm 43 is a phosphor bronze leaf spring.

The levers 425 and 435 are provided on the other end sides of the first and second measurement arms 42 and 43, respectively, and open between the first and second hook portions 421 and 431.
The force applying means 44 is a coiled spring.

As a result,
Since the structure is simple and can be reduced, the connection from the hook portions 421 and 431 to the measurement probe main body 41 can be shortened, and a measurement probe that can reduce the parasitic inductance when the probe is connected can be obtained.
Further, by making the first and second hook portions 421 and 431 thin or thin, a measurement probe that can easily cope with probing of fine pitch package parts can be obtained.

  Since the sockets are used for the connection means 423 and 433, a measurement probe that can be easily electrically attached and detached is obtained.

  Since the first and second measurement arms 42 and 43 are covered with insulating coatings 424 and 434 except for the hook portions 421 and 431, a measurement probe that can prevent a short circuit with a circuit or the like during measurement is obtained.

  Since at least one of the first and second measurement arms 42 and 43 is made of a conductive spring material, the first and second measurement arms 42 and 43 can also serve as the force applying means 44, reduce the number of parts, and obtain an inexpensive measurement probe. It is done.

  Since the first and second levers 425 and 435 that are provided on the other end side of the first and second measurement arms 42 and 43 and open between the first and second hook portions 421 and 431 are provided. A measurement probe that can easily open the space between the first and second hook portions 421 and 431 is obtained.

  Since a spring is used as the force applying means 44, the spring is commercially available and can be easily obtained, so that an inexpensive measurement probe can be obtained.

  By changing the shape of the connection means 423, 433, it can be connected to various measurement probe bodies. For example, by using a configuration of both inputs, it can be used for a measurement probe body of balanced differential input.

The above description merely shows a specific preferred embodiment for the purpose of explanation and illustration of the present invention.
Therefore, the present invention is not limited to the above-described embodiments, and includes many changes and modifications without departing from the essence thereof.

It is principal part structure explanatory drawing of one Example of this invention. It is operation | movement explanatory drawing of FIG. It is principal part structure explanatory drawing of the other Example of this invention. It is structure explanatory drawing of the prior art example of the IC clip generally used conventionally. It is structure explanatory drawing of the prior art example of the measurement probe generally used conventionally. It is structure explanatory drawing of the prior art example of the other measurement probe generally used conventionally.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 IC clip 11 Mold part 12 Pin 13 Spring 20 Probe 21 Pin 22 Ground wire 23 Alligator clip 24 Contact 25 Ground bare wire 31 Measurement probe main body 32 1st measurement arm 321 1st hook part 322 1st hinge Part 323 First connection means 324 First insulation coating 33 Second measurement arm 331 Second hook part 332 Second hinge part 333 Second connection means 334 Second insulation coating 335 Lever 34 Force application means 41 Measurement probe main body 42 First measurement arm 421 First hook portion 422 First hinge portion 423 First connection means 424 First insulation coating 425 First lever 43 Second measurement arm 431 Second hook portion 432 2nd hinge part 433 2nd connection means 434 2nd insulation coating 435 2 levers 44 force applying means A signal terminal G ground terminal

Claims (6)

A first hook portion made of an electrically conductive material, with a first measurement target terminal locked on one end and made of an elastic material, a first hinge portion provided in the middle, and a measurement probe main body connected to the other end. A first measuring arm having one connecting means;
A second hook portion made of an electrically conductive material, having a second measurement target terminal locked at one end and made of an elastic material, and a second hinge portion that is connected to the first hinge portion in a freely rotating manner. A second measurement arm having second connection means connected to the measurement probe main body at the other end;
The first and second measurements are provided so that the first and second measurement target terminals provided on the hinge portion are elastically sandwiched between the first hook portion and the second hook portion. And a force applying means for applying a force to the arm. The measurement probe according to claim 1, wherein a socket is used as the connection means. The measurement probe according to claim 1, wherein the first and second measurement arms are covered with an insulating coating except for the hook portion. The measurement probe according to any one of claims 1 to 3, wherein at least one of the first and second measurement arms is made of a conductive spring material. 5. The lever according to claim 1, further comprising a lever that is provided on at least one of the other end sides of the first and second measurement arms and opens between the first and second hook portions. The measurement probe according to 1. The measurement probe according to claim 1, wherein a spring is used as the force application unit.

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