JP2007136623A - Axisymmetric aspheric surface polishing method - Google Patents

Axisymmetric aspheric surface polishing method Download PDF

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JP2007136623A
JP2007136623A JP2005335319A JP2005335319A JP2007136623A JP 2007136623 A JP2007136623 A JP 2007136623A JP 2005335319 A JP2005335319 A JP 2005335319A JP 2005335319 A JP2005335319 A JP 2005335319A JP 2007136623 A JP2007136623 A JP 2007136623A
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polishing
axisymmetric
aspheric surface
polisher
aspherical surface
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昌信 ▲龍▼山
Masanobu Tatsuyama
Tatsuya Kobayashi
達也 小林
Tomoyuki Koda
倫行 国府田
Masafumi Ito
政文 伊東
Takahiro Tamaki
貴広 玉木
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Olympus Corp
Olympus Imaging Corp
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Olympus Imaging Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an axisymmetric aspheric surface polishing method, simply correcting a polishing target value in a short time to polish an axisymmetric aspheric surface even when the polishing removing amount of an axisymmetric aspheric surface extending from the central axis of rotation to the peripheral edge part has a tendency of excess or shortage, thereby making the axisymmetric aspheric surface into a favorable optical surface. <P>SOLUTION: In this axisymmetric aspheric surface polishing method, the axisymmetric aspheric surface 1 after grinding is rotated round the center axis C of rotation of the axisymmetric aspheric surface 1, a rotating spherical polisher 6 is pressed from the normal direction of the axisymmetric aspheric surface 1, and scanned in the direction of a meridian to polish the whole of the axisymmetric aspheric surface 1. The method includes a correcting and polishing process of changing the ratio of the rotational frequency of the axisymmetric aspheric surface 1 to the rotational frequency of the polisher 6 after polishing the whole of the axisymmetric aspheric surface 1 to perform polishing. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、レンズやミラー等の光学的な非球面を有する光学素子、或いは、光学素子を成形するための成形用型等の被加工物(ワーク)において、良好な光学面を加工するための軸対称非球面研磨方法に関する。   The present invention provides an optical element having an optical aspheric surface such as a lens or a mirror, or a workpiece (work) such as a molding die for molding the optical element, for processing a good optical surface. The present invention relates to an axisymmetric aspheric polishing method.

光学的な軸対称非球面を加工する研磨方法としては、軸対称非球面を有するワークの非球面軸を回転中心軸回りに回転させ、さらに回転するポリッシャーをワークの軸対称非球面の法線方向から押圧しつつ、子午線上に沿って走査して、両者の相対運動により軸対称非球面の全体を研磨するものが知られている(例えば、特許文献1参照。)。   As a polishing method for processing an optically axisymmetric aspherical surface, the aspherical axis of a workpiece having an axially symmetric aspherical surface is rotated around the rotation center axis, and the rotating polisher is moved in the normal direction of the axisymmetric aspherical surface of the workpiece. While being pressed, the scanning is performed along the meridian, and the whole of the axisymmetric aspheric surface is polished by the relative movement of the two (for example, see Patent Document 1).

このような方法では、実際加工やサンプル研磨加工から作成した、NCやCNCの研磨加工データとなる研磨加工目標値に基づいて、研削後の軸対称非球面をポリッシャーが法線方向から押圧するように姿勢制御及び速さ制御されている。即ち、軸対称非球面とポリッシャーとの当接部において、ポリッシャーによる研磨除去量が軸対称非球面上の任意の位置において均等となるように、ワーク及びポリッシャーのそれぞれの回転数や、ポリッシャーの送り速さが決められている。   In such a method, the polisher presses the axisymmetric aspherical surface after grinding from the normal direction based on the polishing target value, which is the NC or CNC polishing data created from actual processing or sample polishing. Attitude control and speed control. That is, at the contact portion between the axisymmetric aspherical surface and the polisher, the number of rotations of the workpiece and the polisher and the polisher feed so that the polishing removal amount by the polisher is equal at any position on the axisymmetric aspherical surface. The speed is decided.

こうして、軸対称非球面を回転中心軸線回りに回転させるとともに、ポリッシャーを軸対称非球面に押圧した状態で軸対称非球面の子午線に沿って移動させて全体を研磨する。このような全体研磨を、一回から必要に応じて複数回繰り返して行い、良好な光学的非球面を加工している。   In this way, the axisymmetric aspheric surface is rotated about the rotation center axis, and the polisher is moved along the meridian of the axisymmetric aspheric surface while the polisher is pressed against the axisymmetric aspheric surface to polish the whole. Such a whole polishing is repeated from one time to a plurality of times as necessary to process a good optical aspherical surface.

ここで、軸対称非球面の研磨実施前の形状に対して、均等除去深さを目的にした全体研磨を実施した後、回転中心軸線近傍の研磨除去深さ(以下、研磨除去量と称する。)が、周縁部に比べて多い又は少ない不具合が発生する頻度が高い。この際、実際加工やサンプル研磨加工の結果を破棄して、形状誤差から、研磨除去深さが軸対称非球面のどの部位でも均等になるように、演算装置を用いてポリッシャーの送り速さ(以下、滞留時間と称する。)を算出し、研磨加工データとなる研磨加工目標値を補正している。
特開2000−254848号公報 特開2003−68688号公報
Here, after the entire polishing for the purpose of uniform removal depth is performed on the shape of the axisymmetric aspherical surface before polishing, the polishing removal depth in the vicinity of the rotation center axis (hereinafter referred to as a polishing removal amount). ) Is more frequent than the peripheral portion. At this time, the result of the actual processing or sample polishing processing is discarded, and the polisher feed speed (by using the arithmetic unit is set so that the polishing removal depth is uniform in any part of the axisymmetric aspherical surface from the shape error. Hereinafter, the dwell time is calculated), and the polishing target value serving as the polishing data is corrected.
JP 2000-254848 A JP 2003-68688 A

しかしながら、上記従来の軸対称非球面研磨方法によれば、研磨加工目標値の補正を演算装置を用いてポリッシャーの滞留時間に対して行うので、研磨前の研磨加工目標値との比較演算も必要となり、補正前よりも補正後の研磨加工目標値の作成のほうが、手間が大きく、時間がかかる。
本発明は上記事情に鑑みて成されたものであり、回転中心軸線から周縁部にかけての軸対称非球面の研磨除去量が過剰傾向又は不足傾向を示していても、研磨加工目標値を簡便、かつ、短時間に補正して研磨することができ、軸対称非球面を良好な光学面とすることができる軸対称非球面研磨方法を提供することを目的とする。
However, according to the above-mentioned conventional axisymmetric aspherical polishing method, the polishing target value is corrected for the dwell time of the polisher using an arithmetic unit, so that a comparison calculation with the polishing target value before polishing is also necessary. Therefore, it takes more time and time to create the corrected polishing target value than before correction.
The present invention has been made in view of the above circumstances, and even if the removal amount of the axisymmetric aspherical surface from the rotation center axis to the peripheral portion shows an excessive tendency or an insufficient tendency, the polishing target value is simply set. An object of the present invention is to provide an axisymmetric aspherical polishing method that can correct and polish in a short time and can make an axisymmetric aspherical surface a good optical surface.

本発明は、上記課題を解決するため、以下の手段を採用する。
本発明に係る軸対称非球面研磨方法は、研削後の軸対称非球面を該軸対称非球面の回転中心軸線回りに回転させ、回転する球状のポリッシャーを前記軸対称非球面の法線方向から押圧し、かつ、子午線方向に走査して前記軸対称非球面を全体研磨する軸対称非球面研磨方法において、前記軸対称非球面の全体研磨の後、前記軸対称非球面の回転数及び前記ポリッシャーの回転数の比率を変更して研磨を行う修正研磨工程を備えていることを特徴とする。
The present invention employs the following means in order to solve the above problems.
In the axially symmetric aspherical polishing method according to the present invention, the axisymmetric aspherical surface after grinding is rotated about the rotation center axis of the axisymmetric aspherical surface, and the rotating spherical polisher is moved from the normal direction of the axisymmetric aspherical surface. In the axially symmetric aspherical polishing method of pressing and scanning in the meridian direction to polish the entire axisymmetric aspherical surface, after the overall polishing of the axisymmetric aspherical surface, the rotational speed of the axisymmetric aspherical surface and the polisher And a modified polishing step for polishing by changing the ratio of the number of rotations.

この発明は、回転中心軸線から周縁部にかけての軸対称非球面の研磨除去量が過剰傾向又は不足傾向を示していても、軸対称非球面の回転数及びポリッシャーの回転数の比率を変更することによって、ポリッシャーの軸対称非球面に対する滞留時間や角度を変更しなくても、回転中心軸線からの距離に応じた研磨除去量を変更することができ、研磨加工目標値を補正することができる。   This invention changes the ratio of the rotational speed of the axisymmetric aspherical surface and the rotational speed of the polisher even if the removal amount of the axially symmetric aspherical surface from the rotational center axis line to the peripheral portion tends to be excessive or insufficient. Thus, the polishing removal amount according to the distance from the rotation center axis can be changed without changing the dwell time and angle of the polisher with respect to the axisymmetric aspheric surface, and the polishing target value can be corrected.

また、本発明に係る軸対称非球面の研磨方法は、前記軸対称非球面の研磨方法であって、研磨前の前記軸対称非球面の研磨加工目標値に対して、研磨除去量が、前記軸対称非球面の前記回転中心軸線から周縁部にかけて直線状に過剰又は不足傾向である場合、前記修正研磨工程が、前記軸対称非球面の回転数及び前記ポリッシャーの回転数から前記研磨除去量を算出するための直線状の関数から、前記研磨除去量の過剰傾向又は不足傾向を解消させる方向の直線状の傾きを有する近似式を算出する工程と、前記近似式から前記軸対称非球面の回転数及び前記ポリッシャーの回転数を逆算して補正後の研磨加工目標値を作成する工程とを備えていることを特徴とする。   Further, an axially symmetric aspherical surface polishing method according to the present invention is the axially symmetric aspherical surface polishing method, wherein a polishing removal amount with respect to a polishing target value of the axially symmetric aspherical surface before polishing is In the case where there is a tendency to excessively or insufficiently linearly extend from the rotation center axis of the axisymmetric aspheric surface to the peripheral portion, the modified polishing step calculates the polishing removal amount from the rotation speed of the axisymmetric aspheric surface and the rotation speed of the polisher. A step of calculating an approximate expression having a linear inclination in a direction that eliminates the tendency of excess or deficiency of the polishing removal amount from a linear function for calculation, and rotation of the axisymmetric aspherical surface from the approximate expression And calculating the corrected polishing target value by back-calculating the number and the number of rotations of the polisher.

この発明は、研磨前における軸対称非球面の形状測定結果と研磨後における形状測定結果とを対比した際、回転中心軸線から周縁部にかけて研磨除去量が直線状に過剰傾向又は不足傾向していた場合には、この傾向を逆転させるような近似式を算出することにより、補正すべき軸対称非球面の回転数及びポリッシャーの回転数を算出することができる。   In the present invention, when the shape measurement result of the axisymmetric aspherical surface before polishing and the shape measurement result after polishing were compared, the polishing removal amount tended to be excessive or insufficient linearly from the rotation center axis to the peripheral edge. In this case, by calculating an approximate expression that reverses this tendency, the rotational speed of the axisymmetric aspherical surface to be corrected and the rotational speed of the polisher can be calculated.

また、本発明に係る軸対称非球面の研磨方法は、前記軸対称非球面の研磨方法であって、補正前の研磨加工目標値における前記軸対称非球面の回転数及び前記ポリッシャーの回転数をそれぞれNwo及びNpoとし、補正後の研磨加工目標値における前記軸対称非球面の回転数及び前記ポリッシャーの回転数をそれぞれNwi、Npiとしたとき、前記関数が、Npi/NwiがNpo/Nwoよりも小さいときには、前記軸対称非球面の前記回転中心軸線近傍から前記周縁部に向かって研磨除去量を漸次増加させ、Npi/NwiがNpo/Nwoよりも大きいときには、前記軸対称非球面の前記回転中心軸線近傍から前記周縁部に向かって研磨除去量を漸次減少させる傾向を有することを特徴とする。   An axially symmetric aspherical surface polishing method according to the present invention is the axially symmetric aspherical surface polishing method, wherein the rotational speed of the axially symmetric aspheric surface and the rotational speed of the polisher at the polishing target value before correction are determined. When the rotation speed of the axisymmetric aspherical surface and the rotation speed of the polisher are Nwi and Npi, respectively, at the corrected polishing target value, respectively, Nwo and Npo, the function is such that Npi / Nwi is higher than Npo / Nwo. When it is small, the polishing removal amount is gradually increased from the vicinity of the rotation center axis of the axisymmetric aspheric surface toward the peripheral portion, and when Npi / Nwi is larger than Npo / Nwo, the rotation center of the axisymmetric aspheric surface is increased. The polishing removal amount tends to gradually decrease from the vicinity of the axis toward the peripheral portion.

この発明は、軸対称非球面の回転数及びポリッシャーの回転数を変更することによって、回転中心軸線近傍から前記周縁部に向かう研磨除去量を増減させることができ、研磨加工目標値を容易に補正することができる。   In this invention, by changing the rotational speed of the axisymmetric aspheric surface and the rotational speed of the polisher, the polishing removal amount from the vicinity of the rotation center axis to the peripheral portion can be increased or decreased, and the polishing target value is easily corrected. can do.

また、本発明に係る軸対称非球面の研磨方法は、前記軸対称非球面の研磨方法であって、前記関数が、プレストンの式を利用していることを特徴とする。
この発明は、研磨に関するシミュレーションによく用いられるプレストンの式に基づく関数を使用するので、NCやCNCデータの作成の際に違和感なく適用することができる。
An axially symmetric aspherical surface polishing method according to the present invention is the axially symmetric aspherical surface polishing method, wherein the function uses a Preston equation.
Since the present invention uses a function based on Preston's formula often used in simulations related to polishing, it can be applied without any sense of incongruity when creating NC or CNC data.

本発明によれば、回転中心軸線から周縁部にかけての軸対称非球面の研磨除去量が過剰傾向又は不足傾向を示していても、研磨加工目標値を簡便、かつ、短時間に補正して均等研磨除去量にて研磨することができ、軸対称非球面を良好な光学面とすることができる。   According to the present invention, even if the removal amount of the axisymmetric aspherical surface from the rotation center axis to the peripheral portion shows an excessive tendency or an insufficient tendency, the polishing target value is corrected easily and evenly in a short time. Polishing can be performed with the polishing removal amount, and an axially symmetric aspherical surface can be a good optical surface.

本発明に係る一実施形態について、図1から図4を参照して説明する。
本実施形態に係る軸対称非球面研磨方法では、図1に示すように、凸状の軸対称非球面1が形成された非球面ワーク2を、ワーク回転軸3によって回転可能なワークヤトイ5に固定した状態で行う。軸対称非球面1の回転中心軸線C上のワーク回転軸3が、不図示の駆動部に接続されて回転されることによって、軸対称非球面1が、研磨加工動作データ(NC制御)に基づき、図中に示すXYθ方向に対して速さ自在に姿勢制御される。ポリッシャー6は先端が球状に形成され、不図示の駆動部とポリッシャー回転軸7を介して固定され、図1に示すように、軸対称非球面1に押圧された状態で駆動部によって回転可能とされている。
An embodiment according to the present invention will be described with reference to FIGS.
In the axially symmetric aspherical polishing method according to this embodiment, as shown in FIG. 1, an aspherical workpiece 2 on which a convex axially symmetric aspherical surface 1 is formed is fixed to a workpiece yatoy 5 that can be rotated by a workpiece rotating shaft 3. Perform in the state. The workpiece rotation axis 3 on the rotation center axis C of the axisymmetric aspherical surface 1 is connected to a drive unit (not shown) and rotated, so that the axisymmetric aspherical surface 1 is based on polishing operation data (NC control). The attitude is controlled freely with respect to the XYθ direction shown in the figure. The polisher 6 has a spherical tip, is fixed via a drive unit (not shown) and a polisher rotating shaft 7, and can be rotated by the drive unit while being pressed against the axisymmetric aspherical surface 1, as shown in FIG. Has been.

研磨加工工程は、図2に示すように、研削後に軸対称非球面1の全体を研磨する均一研磨工程(S01)と、鏡面(光学的粗さ)を得た後の軸対称非球面1の形状測定工程(S02)と、軸対称非球面1の全体研磨の後、軸対称非球面1の回転数及びポリッシャーの回転数の比率を変更して研磨を行う修正研磨工程(S03)とを備えている。   As shown in FIG. 2, the polishing process includes a uniform polishing step (S01) for polishing the entire axisymmetric aspherical surface 1 after grinding, and an axisymmetric aspherical surface 1 after obtaining a mirror surface (optical roughness). A shape measuring step (S02) and a modified polishing step (S03) for performing polishing by changing the ratio of the rotational speed of the axisymmetric aspherical surface 1 and the rotational speed of the polisher after the entire polishing of the axially symmetric aspherical surface 1 is performed. ing.

均一研磨工程(S01)では、予め設定した研磨加工目標値に基づいて研削後の非球面ワーク2を設定された回転数でワーク回転軸3の回りに回転させ、設定された回転数で回転する球状のポリッシャー6を軸対称非球面1の法線方向から押圧し、かつ、子午線方向に走査して、XYθの姿勢制御により相対的な研磨除去運動を与えて軸対称非球面1を均等な研磨除去量となるように全体研磨する。   In the uniform polishing step (S01), the aspherical workpiece 2 after grinding is rotated around the workpiece rotation axis 3 at a set rotation speed based on a preset polishing target value, and is rotated at the set rotation speed. The spherical polisher 6 is pressed from the normal direction of the axisymmetric aspherical surface 1 and scanned in the meridian direction, and the relative polishing removal motion is given by the attitude control of XYθ to uniformly polish the axisymmetric aspherical surface 1. The entire surface is polished so that the removal amount is obtained.

軸対称非球面1の形状測定工程(S02)では、均一研磨後の軸対称非球面1の形状を測定し、均一研磨工程(S01)で使用した研磨加工目標値と対比して研磨除去量を把握する。
この結果、研磨前の軸対称非球面1の研磨加工目標値に対して、研磨除去量が、軸対称非球面1の回転中心軸線Cから周縁部にかけて過剰傾向又は不足傾向であるかどうか、そのときの傾向が直線状であるか否かを判断する。
In the shape measuring step (S02) of the axially symmetric aspherical surface 1, the shape of the axially symmetric aspherical surface 1 after uniform polishing is measured, and the polishing removal amount is compared with the polishing target value used in the uniform polishing step (S01). To grasp.
As a result, whether the removal amount of polishing tends to be excessive or insufficient from the rotation center axis C to the peripheral edge of the axisymmetric aspherical surface 1 with respect to the polishing target value of the axisymmetric aspherical surface 1 before polishing, It is determined whether or not the tendency of time is linear.

修正研磨工程(S03)では、さらに、軸対称非球面1の回転数及びポリッシャー6の回転数から軸対称非球面1の研磨除去量を算出する直線状の関数から、上述した研磨除去量の傾向を第一近似式で表す工程(S03−1)と、第一近似式に対し、前記関数から研磨除去量の過剰傾向又は不足傾向を解消させる方向となる直線状の傾きを有する第二近似式(近似式)を算出する工程(S03−2)と、第二近似式から軸対称非球面1の回転数及びポリッシャー6の回転数を逆算して補正後の研磨加工目標値を作成する工程(S03−3)と、補正後の研磨加工目標値に基づき実際に研磨する工程(S03−4)とを行う。   In the modified polishing step (S03), the above-described tendency of the polishing removal amount from a linear function for calculating the polishing removal amount of the axisymmetric aspherical surface 1 from the rotational speed of the axisymmetric aspherical surface 1 and the rotation speed of the polisher 6. Step (S03-1) representing the first approximate expression, and the second approximate expression having a linear inclination that is a direction to eliminate the excess tendency or the insufficient tendency of the polishing removal amount from the function with respect to the first approximate expression. A step of calculating (approximate equation) (S03-2), and a step of back-calculating the rotational speed of the axisymmetric aspherical surface 1 and the rotational speed of the polisher 6 from the second approximate expression to create a corrected polishing target value ( S03-3) and a step of actual polishing (S03-4) based on the corrected polishing target value are performed.

ここで、上記関数は、補正前の研磨加工目標値における軸対称非球面1の回転数及びポリッシャー6の回転数をそれぞれNwo及びNpoとし、補正後の研磨加工目標値における軸対称非球面1の回転数及びポリッシャー6の回転数をそれぞれNwi、Npiとする。このとき、上述した関数としては、Npi/NwiがNpo/Nwoよりも小さいときには、軸対称非球面1の回転中心軸線C近傍から周縁部に向かって研磨除去量を漸次増加させ、Npi/NwiがNpo/Nwoよりも大きいときには、軸対称非球面1の回転中心軸線C近傍から周縁部に向かって研磨除去量を漸次減少させる傾向を有する、以下に示す式(1)に基づく。   Here, the above-mentioned function is defined such that the rotational speed of the axisymmetric aspherical surface 1 and the rotational speed of the polisher 6 at the polishing target value before correction are Nwo and Npo, respectively, and the axially symmetric aspherical surface 1 at the corrected polishing target value is obtained. The number of rotations and the number of rotations of the polisher 6 are Nwi and Npi, respectively. At this time, as a function described above, when Npi / Nwi is smaller than Npo / Nwo, the polishing removal amount is gradually increased from the vicinity of the rotation center axis C of the axisymmetric aspherical surface 1 toward the peripheral portion, and Npi / Nwi is When it is larger than Npo / Nwo, it is based on the following formula (1), which has a tendency to gradually reduce the polishing removal amount from the vicinity of the rotation center axis C of the axisymmetric aspherical surface 1 toward the peripheral edge.

Figure 2007136623
Figure 2007136623

ここで、Dpは、研磨除去量、rは回転軸中心軸線Cからポリッシャー6が軸対称非球面1に接触している位置までの距離、Δδはポリッシャー6の研磨波及範囲、即ち、実験や過去の加工結果から算出される研磨痕の径を示す。   Here, Dp is the amount of polishing removal, r is the distance from the central axis C of the rotation axis to the position where the polisher 6 is in contact with the axisymmetric aspherical surface 1, Δδ is the polishing spread range of the polisher 6, ie, experiments and past The diameter of the polishing mark calculated from the processing result is shown.

また、hは、式(2)のように展開されるプレストンの式による研磨除去体積を示す。   Further, h represents the polishing removal volume according to the Preston equation developed as in Equation (2).

Figure 2007136623
Figure 2007136623

ここで、kは実験や過去の加工結果から求められる係数、pは研磨押圧力、vは軸対称非球面1に対するポリッシャ−6の加工点における相対速度、Δtはポリッシャー6の滞留時間(∝1/送り速度)を示す。なお、相対速度(v)は式(3)で表される。   Here, k is a coefficient obtained from experiments and past processing results, p is a polishing pressing force, v is a relative speed at the processing point of the polisher 6 with respect to the axisymmetric aspherical surface 1, and Δt is a dwell time of the polisher 6 (∝1 / Feed speed). The relative speed (v) is expressed by the formula (3).

Figure 2007136623
Figure 2007136623

ここで、Rpはポリシャー6の外径、Rwは回転軸中心軸線Cからポリッシャー6が軸対称非球面1に接触している位置までの距離、Npはポリッシャー6の回転数、Nwは非球面ワーク2の回転数を示す。   Here, Rp is the outer diameter of the polisher 6, Rw is the distance from the rotation axis central axis C to the position where the polisher 6 is in contact with the axisymmetric aspherical surface 1, Np is the rotational speed of the polisher 6, and Nw is the aspherical workpiece 2 indicates the number of rotations.

次に、上述した研磨加工工程に基づく軸対称非球面研磨方法の作用・効果について説明する。
まず、例えば、研削によって、図3に示すような軸対称非球面1を得たとして、所定の研磨加工目標値に基づき均一研磨工程(S01)を実施する。
Next, the operation and effect of the axisymmetric aspherical polishing method based on the above-described polishing process will be described.
First, for example, assuming that an axisymmetric aspherical surface 1 as shown in FIG. 3 is obtained by grinding, a uniform polishing step (S01) is performed based on a predetermined polishing target value.

続いて、形状測定工程(S02)に移行して、例えば、図4に示すような軸対称非球面1の表面の形状測定結果を得たとする。
この形状測定結果を研磨加工を施す前の形状測定結果と相対比較し、回転中心軸線C近傍から周縁部にかけて、軸対称非球面1の研磨除去量が過剰傾向か不足傾向かを比較する。
Then, it transfers to a shape measurement process (S02) and suppose that the shape measurement result of the surface of the axisymmetric aspherical surface 1 as shown in FIG. 4 was obtained, for example.
This shape measurement result is compared with the shape measurement result before the polishing process to compare whether the polishing removal amount of the axisymmetric aspherical surface 1 tends to be excessive or insufficient from the vicinity of the rotation center axis C to the periphery.

ここでは、研磨実施前の形状精度に対し、周縁部側の研磨除去量が、回転中心軸線Cの近傍よりも直線状の勾配を有して不足傾向を示している。そこで、軸対称非球面1の全体の研磨除去量の均等化を図るために、研磨時の非球面ワーク2の回転数:Nwoとポリッシャー6の回転数:Npoとの比を調整して、軸対称非球面1の回転中心軸線Cの近傍から周縁部に向って、研磨除去量の傾向が研磨前の状態よりも増加傾向となるようにする。   Here, with respect to the shape accuracy before polishing, the polishing removal amount on the peripheral edge side has a linear gradient more than the vicinity of the rotation center axis C, indicating a tendency of deficiency. Therefore, in order to equalize the entire polishing removal amount of the axisymmetric aspherical surface 1, the ratio of the rotational speed of the aspherical workpiece 2 during polishing: Nwo and the rotational speed of the polisher 6: Npo is adjusted to From the vicinity of the rotation center axis C of the symmetric aspherical surface 1 toward the periphery, the tendency of the polishing removal amount tends to increase more than the state before polishing.

修正研磨工程(S03)に移行して、形状測定結果を直線状の第一近似式で表す工程(S03―1)では、まず、図4に示す研磨傾向を図示しない直線状の第一近似式として近似する。
次に、第二近似式を算出する工程(S03−2)では、第一近似式の傾きを反転させた直線状の第二近似式Aをコンピュータにより算出して、図5に示すように、グラフ表示する。
Moving to the modified polishing step (S03), in the step (S03-1) in which the shape measurement result is expressed by a linear first approximate expression, first, a linear first approximate expression not showing the polishing tendency shown in FIG. Approximate as
Next, in the step of calculating the second approximate expression (S03-2), a linear second approximate expression A obtained by inverting the slope of the first approximate expression is calculated by a computer, and as shown in FIG. Display a graph.

そして、補正後の研磨加工目標値を作成する工程(S03−3)では、補正後の非球面ワーク2の回転数:Nwiと補正後のポリッシャー6の回転数:Npiとを変数としたとき、Npi/Nwi<Npo/Nwoを実現するためのNpi及びNwiを第二近似式Aから求める。
即ち、NwiをNwoよりも大きくするか、NpiをNpoよりも小さくするか、或いは、その両方とするかという観点から、グラフに表れた第二近似式Aと式(1)とが一致するまで、Nwi及びNpiを式(1)に繰り返し当てはめる。その結果、式(1)と第二近似式Aとが一致したときの非球面ワーク2の回転数:Nwi、ポリッシャー回転数:Npiをそれぞれ得る。
Then, in the step of creating the corrected polishing target value (S03-3), when the rotational speed of the aspherical workpiece 2 after correction: Nwi and the rotational speed of the polisher 6 after correction: Npi are variables, Npi and Nwi for realizing Npi / Nwi <Npo / Nwo are obtained from the second approximate expression A.
That is, from the viewpoint of whether Nwi is larger than Nwo, Npi is smaller than Npo, or both, until the second approximate expression A shown in the graph and Expression (1) match , Nwi and Npi are repeatedly applied to equation (1). As a result, the rotational speed Nwi and polisher rotational speed Npi of the aspherical workpiece 2 when the formula (1) and the second approximate expression A coincide with each other are obtained.

続いて、実際に研磨する工程(S03−4)に移行して、上述のようにして求めたNwi及びNpiを補正後の研磨加工目標値としてこれに基づき研磨加工を行う。
その結果、補正前の研磨加工目標値では、研磨除去量の傾向が軸対称非球面1の周縁部で回転中心軸線Cの近傍よりも不足傾向であったのに対して、補正後の研磨加工目標値では増加傾向となり、軸対称非球面1の面全体で均等な研磨除去量を保つように作用する。
Subsequently, the process proceeds to an actual polishing step (S03-4), and polishing is performed based on Nwi and Npi obtained as described above as corrected polishing target values.
As a result, in the polishing target value before correction, the polishing removal amount tends to be deficient in the peripheral portion of the axisymmetric aspherical surface 1 than in the vicinity of the rotation center axis C. The target value tends to increase, and acts to maintain an even polishing removal amount over the entire surface of the axisymmetric aspherical surface 1.

こうして、再び軸対称非球面1の面全体を均等な除去研磨量で研磨加工を続行し、形状精度を維持して良好な光学機能面(鏡面)を有する面性状(肌の粗さ)に加工し、軸対称非球面1の研磨加工(光学面全体の研磨)を終了する。   In this way, the entire surface of the axisymmetric aspherical surface 1 is again polished with a uniform removal polishing amount and processed into a surface property (skin roughness) having a good optical function surface (mirror surface) while maintaining the shape accuracy. Then, the polishing of the axisymmetric aspherical surface 1 (polishing of the entire optical surface) is completed.

この軸対称非球面研磨方法によれば、非球面ワーク2の回転数及びポリッシャー6の回転数の比率を変更することによって、ポリッシャー6の軸対称非球面1に対する滞留時間や角度を変更しなくても、回転中心軸線Cからの距離に応じた研磨除去量を変更することができ、研磨加工目標値を補正することができる。従って、研磨加工目標値を簡便、かつ、短時間に補正して研磨することができ、軸対称非球面1を良好な光学面とすることができる。   According to this axisymmetric aspherical polishing method, the residence time and angle of the polisher 6 with respect to the axisymmetric aspherical surface 1 can be changed by changing the ratio of the rotational speed of the aspherical workpiece 2 and the rotational speed of the polisher 6. In addition, the polishing removal amount can be changed according to the distance from the rotation center axis C, and the polishing target value can be corrected. Therefore, the polishing target value can be simply corrected in a short time and polished, and the axisymmetric aspherical surface 1 can be made a good optical surface.

この際、研磨前における軸対称非球面1の形状測定結果と研磨後における形状測定結果とを対比した際、回転中心軸線Cから周縁部にかけて研磨除去量が直線状に変化していた場合には、変化の状態を直線状の第一近似式に置き換えることによって、研磨除去量の変化を逆転させるような第二近似式Aを算出することができる。そして、第二近似式Aから補正すべき非球面ワーク2の回転数及びポリッシャー6の回転数を容易に算出することができる。   At this time, when the shape measurement result of the axisymmetric aspherical surface 1 before polishing is compared with the shape measurement result after polishing, the polishing removal amount changes linearly from the rotation center axis C to the peripheral edge. By replacing the change state with the linear first approximate expression, the second approximate expression A that reverses the change in the polishing removal amount can be calculated. Then, the rotational speed of the aspherical workpiece 2 and the rotational speed of the polisher 6 to be corrected can be easily calculated from the second approximate expression A.

特に、研磨除去量の調整の際に、研磨に関するシミュレーションによく用いられるプレストンの式に基づく関数を使用するので、NCやCNCデータの作成の際に違和感なく適用することができる。
また、非球面ワーク2の回転数のみを用いて調整するほうが、軸対称非球面1の中心部に発生するヘソ(凹凸)への影響も小さくすることができる。
In particular, since a function based on Preston's equation often used in polishing-related simulations is used when adjusting the polishing removal amount, it can be applied without any discomfort when creating NC or CNC data.
Further, the adjustment using only the rotational speed of the aspherical work 2 can also reduce the influence on the kinks (unevenness) generated at the center of the axisymmetric aspherical surface 1.

なお、本発明の技術範囲は上記実施の形態に限定されるものではなく、本発明の趣旨を逸脱しない範囲において種々の変更を加えることが可能である。   The technical scope of the present invention is not limited to the above embodiment, and various modifications can be made without departing from the spirit of the present invention.

上記実施形態に基づき、非球面ワーク2の回転数(Nwo)を200回/分、ポリッシャー6の直径(D)を5mmとして回転数(Npo)を150回/分とし、ポリッシャー6の軸対称非球面1に対する研磨押圧力(P)を1Nとして、実際に研磨加工を実施した。   Based on the above embodiment, the rotational speed (Nwo) of the aspherical workpiece 2 is 200 times / minute, the diameter (D) of the polisher 6 is 5 mm, the rotational speed (Npo) is 150 times / minute, Polishing was actually performed with the polishing pressing force (P) on the spherical surface 1 being 1N.

まず、所定の研磨加工目標値に基づき均一研磨工程(S01)を実施した。そして、形状測定工程(S02)に移行して、図4に示すような測定結果を得た。この結果、周縁部の研磨除去量のほうが回転中心軸線C近傍よりも不足傾向であることがわかったので、周縁部の研磨除去量を増加させる必要があるとして、修正研磨工程(S03)を実施した。この際、図示しない第一近似式から、図5に示すような第二近似式Aを算出し、これを使用することによって、軸対称非球面1の研磨除去量の偏りを拡大させないことができると判断する。この第二近似式Aに該当する式(1)から、補正後の研磨加工目標値として、ワーク回転軸3の回転数(Nwi)を240回/分、ポリッシャー6の回転数(Npi)を120回/分という条件を得た。
こうして、この補正後の研磨加工目標値を用いて実際に研磨したところ、図6に示すような形状測定結果を得た。
First, a uniform polishing step (S01) was performed based on a predetermined polishing target value. And it moved to the shape measurement process (S02), and obtained the measurement result as shown in FIG. As a result, it has been found that the polishing removal amount at the peripheral portion tends to be insufficient compared to the vicinity of the rotation center axis C. Therefore, it is necessary to increase the polishing removal amount at the peripheral portion, and the correction polishing step (S03) is performed. did. At this time, by calculating the second approximate expression A as shown in FIG. 5 from the first approximate expression (not shown) and using this, it is possible to prevent the deviation of the polishing removal amount of the axisymmetric aspherical surface 1 from being increased. Judge. From the formula (1) corresponding to the second approximate formula A, as the corrected grinding target value, the rotational speed (Nwi) of the workpiece rotating shaft 3 is 240 times / minute, and the rotational speed (Npi) of the polisher 6 is 120. The condition of times / minute was obtained.
Thus, when it grind | polished actually using the grinding | polishing processing target value after this correction | amendment, the shape measurement result as shown in FIG. 6 was obtained.

図7に示すような形状測定結果を有する研削後の軸対称非球面1に対し、実施例1と同様に、非球面ワーク2の回転数(Nwo)を200回/分、ポリッシャー6の直径(D)を5mmとして回転数(Npo)を150回/分とし、ポリッシャー6の軸対称非球面1に対する研磨押圧力(P)を1Nとして、実際に研磨加工を実施した。   For the axisymmetric aspherical surface 1 having a shape measurement result as shown in FIG. 7, the rotational speed (Nwo) of the aspherical workpiece 2 is 200 times / minute and the diameter of the polisher 6 ( Polishing was actually performed with D) being 5 mm, the rotation speed (Npo) being 150 times / minute, and the polishing pressing force (P) of the polisher 6 against the axisymmetric aspherical surface 1 being 1 N.

まず、所定の研磨加工目標値に基づき均一研磨工程(S01)を実施して、形状測定工程(S02)に移行して、図8に示すような測定結果を得た。
本実施例2でも、周縁部の研磨除去量のほうが回転中心軸線C近傍よりも不足傾向を示していたので、修正研磨工程(S03)を実施し、図示しない第一近似式から図9に示すような第二近似式Bを算出する。この第二近似式Bから、軸対称非球面1の研磨除去量を変更することができると判断した後、補正後の研磨加工目標値として、ワーク回転軸3の回転数(Nwi)を280回/分、ポリッシャー6の回転数(Npi)を150回/分という条件を得た。
こうして、この補正後の研磨加工目標値を用いて実際に研磨したところ、図10に示すような形状測定結果を得た。
First, a uniform polishing step (S01) was performed based on a predetermined polishing processing target value, and the process moved to a shape measurement step (S02) to obtain a measurement result as shown in FIG.
Also in the present Example 2, since the polishing removal amount at the peripheral edge portion showed a tendency of being deficient as compared with the vicinity of the rotation center axis C, the correction polishing step (S03) was performed, and the first approximate expression (not shown) is shown in FIG. Such a second approximate expression B is calculated. From this second approximate expression B, after determining that the polishing removal amount of the axisymmetric aspherical surface 1 can be changed, the number of rotations (Nwi) of the workpiece rotation shaft 3 is 280 times as the corrected polishing target value. / Min, and the number of revolutions (Npi) of the polisher 6 was 150 times / min.
Thus, when it grind | polished actually using this grinding | polishing target value after correction | amendment, the shape measurement result as shown in FIG. 10 was obtained.

図11に示すような形状測定結果を有する研削後の軸対称非球面1に対し、実施例1と同様に、非球面ワーク2の回転数(Nwo)を200回/分、ポリッシャー6の直径(D)を5mmとして回転数(Npo)を150回/分とし、ポリッシャー6の軸対称非球面1に対する研磨押圧力(P)を1Nとして、実際に研磨加工を実施した。   For the axisymmetric aspherical surface 1 having a shape measurement result as shown in FIG. 11, the rotational speed (Nwo) of the aspherical workpiece 2 is 200 times / minute and the diameter of the polisher 6 ( Polishing was actually performed with D) being 5 mm, the rotation speed (Npo) being 150 times / minute, and the polishing pressing force (P) of the polisher 6 against the axisymmetric aspherical surface 1 being 1 N.

まず、所定の研磨加工目標値に基づき均一研磨工程(S01)を実施して、形状測定工程(S02)に移行したところ、上記実施例と異なり、図12に示すように、回転中心軸線C近傍よりも周縁部のほうが研磨除去量が過剰傾向を示す測定結果を得た。
この場合には、補正後の非球面ワーク2の回転数:Nwi、変更後のポリッシャー6の回転数:Npiとした場合、Npi/Nwi>Npo/Nwoとすることよって、軸対称非球面1の回転中心軸線Cの近傍から周縁部に向って、研磨除去量の傾向が研磨前の状態よりも減少傾向とするように調整方針を決める。
First, a uniform polishing step (S01) is performed based on a predetermined polishing target value, and then the shape measurement step (S02) is performed. Unlike the above embodiment, as shown in FIG. The measurement result which shows that the polishing removal amount tends to be excessive at the peripheral portion was obtained.
In this case, when the rotational speed of the aspherical work 2 after correction is Nwi and the rotational speed of the polished polisher 6 is Npi, Npi / Nwi> Npo / Nwo, so that the axisymmetric aspherical surface 1 The adjustment policy is determined so that the tendency of the polishing removal amount decreases from the vicinity of the rotation center axis C toward the peripheral edge as compared with the state before polishing.

そして、修正研磨工程(S03)に移行する。ここでは、研磨後の光学面全体で形状誤差最小な研磨除去量とするために、回転中心軸線Cの近傍よりも周縁部のほうの研磨除去量を積極的に不足させることとした。即ち、第一近似式で表す工程(S03―1)では、形状測定結果をそのまま当てはめるのではなく、周縁部のほうが、実際の結果よりもより研磨除去量が過剰となる傾向を示す図示しない第一近似式を算出した。この第一近似式に基づき、第二近似式を算出する工程(S03−2)では、中心軸線Cの近傍よりも周縁部のほうが研磨除去量が過剰に不足する傾向を示す図示しない第二近似式を算出した。   Then, the process proceeds to the modified polishing step (S03). Here, in order to obtain a polishing removal amount with a minimum shape error on the entire optical surface after polishing, the polishing removal amount in the peripheral portion is more actively reduced than in the vicinity of the rotation center axis C. That is, in the step (S03-1) represented by the first approximate expression, the shape measurement result is not applied as it is, but the peripheral portion tends to have a larger amount of polishing removal than the actual result. An approximate expression was calculated. Based on this first approximate expression, in the step of calculating the second approximate expression (S03-2), the second approximation (not shown) showing a tendency that the polishing removal amount tends to be excessively insufficient in the peripheral portion than in the vicinity of the central axis C. The formula was calculated.

この第二近似式から、補正後の研磨加工目標値として、ワーク回転軸3の回転数(Nwi)を120回/分、ポリッシャー6の回転数(Npi)を180回/分という条件を得た。
こうして、この補正後の研磨加工目標値を用いて実際に研磨したところ、図13に示すように、軸対称非球面全体で形状誤差最小な研磨結果となる形状測定結果を得た。
From this second approximate expression, the corrected target values for polishing were obtained such that the rotational speed (Nwi) of the workpiece rotating shaft 3 was 120 times / minute and the rotational speed (Npi) of the polisher 6 was 180 times / minute. .
Thus, when actual polishing was performed using the corrected polishing target value, as shown in FIG. 13, a shape measurement result was obtained that resulted in a polishing result with a minimum shape error over the entire axisymmetric aspheric surface.

本発明の一実施形態に係る軸対称非球面研磨方法における軸対称非球面の研磨状態を示す説明図である。It is explanatory drawing which shows the grinding | polishing state of the axially symmetric aspherical surface in the axially symmetric aspherical surface polishing method which concerns on one Embodiment of this invention. 本発明の一実施形態に係る軸対称非球面研磨方法を示すフロー図である。It is a flow figure showing an axisymmetric aspherical surface polishing method concerning one embodiment of the present invention. 実施例1における研削後の軸対称非球面の形状測定結果を示すグラフである。4 is a graph showing a shape measurement result of an axisymmetric aspheric surface after grinding in Example 1. 実施例1における均一研磨後の軸対称非球面の形状測定結果を示すグラフである。6 is a graph showing the shape measurement result of an axially symmetric aspherical surface after uniform polishing in Example 1. 実施例1における第二近似式を示すグラフである。6 is a graph showing a second approximation formula in Example 1. 実施例1における修正研磨後の軸対称非球面の形状測定結果を示すグラフである。6 is a graph showing a shape measurement result of an axisymmetric aspheric surface after correction polishing in Example 1. 実施例2における研削後の軸対称非球面の形状測定結果を示すグラフである。It is a graph which shows the shape measurement result of the axisymmetric aspherical surface after grinding in Example 2. 実施例2における均一研磨後の軸対称非球面の形状測定結果を示すグラフである。6 is a graph showing a shape measurement result of an axially symmetric aspherical surface after uniform polishing in Example 2. 実施例2における第二近似式を示すグラフである。10 is a graph showing a second approximation formula in Example 2. 実施例2における修正研磨後の軸対称非球面の形状測定結果を示すグラフである。It is a graph which shows the shape measurement result of the axisymmetric aspherical surface after the correction grinding | polishing in Example 2. FIG. 実施例3における研削後の軸対称非球面の形状測定結果を示すグラフである。10 is a graph showing a shape measurement result of an axisymmetric aspherical surface after grinding in Example 3. 実施例3における均一研磨後の軸対称非球面の形状測定結果を示すグラフである。10 is a graph showing the shape measurement result of an axially symmetric aspherical surface after uniform polishing in Example 3. 実施例3における修正研磨後の軸対称非球面の形状測定結果を示すグラフである。10 is a graph showing a shape measurement result of an axisymmetric aspheric surface after correction polishing in Example 3.

符号の説明Explanation of symbols

1 軸対称非球面
6 ポリッシャー
C 回転中心軸線
1 Axisymmetric aspherical surface 6 Polisher C Rotation center axis

Claims (4)

研削後の軸対称非球面を該軸対称非球面の回転中心軸線回りに回転させ、回転する球状のポリッシャーを前記軸対称非球面の法線方向から押圧し、かつ、子午線方向に走査して前記軸対称非球面を全体研磨する軸対称非球面研磨方法において、
前記軸対称非球面の全体研磨の後、前記軸対称非球面の回転数及び前記ポリッシャーの回転数の比率を変更して研磨を行う修正研磨工程を備えていることを特徴とする軸対称非球面研磨方法。
The axisymmetric aspheric surface after grinding is rotated around the axis of rotation of the axisymmetric aspheric surface, the rotating spherical polisher is pressed from the normal direction of the axisymmetric aspheric surface, and scanned in the meridian direction. In the axially symmetric aspherical polishing method for polishing the entire axially symmetric aspherical surface,
An axially symmetric aspherical surface comprising a modified polishing step of performing polishing by changing the ratio of the rotational speed of the axially symmetric aspherical surface and the rotational speed of the polisher after the entire polishing of the axially symmetric aspherical surface Polishing method.
研磨前の前記軸対称非球面の研磨加工目標値に対して、研磨除去量が、前記軸対称非球面の前記回転中心軸線から周縁部にかけて直線状に過剰又は不足傾向である場合、前記修正研磨工程が、
前記軸対称非球面の回転数及び前記ポリッシャーの回転数から前記研磨除去量を算出するための直線状の関数から、前記研磨除去量の過剰傾向又は不足傾向を解消させる方向の直線状の傾きを有する近似式を算出する工程と、
前記近似式から前記軸対称非球面の回転数及び前記ポリッシャーの回転数を逆算して補正後の研磨加工目標値を作成する工程とを備えていることを特徴とする請求項1に記載の軸対称非球面研磨方法。
When the polishing removal amount tends to be excessive or insufficient linearly from the rotation center axis to the peripheral edge of the axisymmetric aspheric surface with respect to the target processing value of the axisymmetric aspheric surface before polishing, the corrected polishing The process is
From a linear function for calculating the polishing removal amount from the rotational speed of the axisymmetric aspheric surface and the rotational speed of the polisher, a linear inclination in a direction to eliminate the excessive tendency or the insufficient tendency of the polishing removal amount is obtained. Calculating an approximate expression having:
The shaft according to claim 1, further comprising a step of reversely calculating the rotational speed of the axisymmetric aspherical surface and the rotational speed of the polisher from the approximate expression to create a corrected polishing target value. Symmetric aspheric polishing method.
補正前の研磨加工目標値における前記軸対称非球面の回転数及び前記ポリッシャーの回転数をそれぞれNwo及びNpoとし、補正後の研磨加工目標値における前記軸対称非球面の回転数及び前記ポリッシャーの回転数をそれぞれNwi、Npiとしたとき、
前記関数が、
Npi/NwiがNpo/Nwoよりも小さいときには、前記軸対称非球面の前記回転中心軸線近傍から前記周縁部に向かって研磨除去量を漸次増加させ、
Npi/NwiがNpo/Nwoよりも大きいときには、前記軸対称非球面の前記回転中心軸線近傍から前記周縁部に向かって研磨除去量を漸次減少させる傾向を有することを特徴とする請求項2記載の軸対称非球面研磨方法。
The rotation speed of the axisymmetric aspherical surface and the rotation speed of the polisher at the polishing target value before correction are set to Nwo and Npo, respectively, and the rotation speed of the axisymmetric aspherical surface and the rotation of the polisher at the corrected polishing target value are set. When the numbers are Nwi and Npi respectively,
The function is
When Npi / Nwi is smaller than Npo / Nwo, the polishing removal amount is gradually increased from the vicinity of the rotation center axis of the axisymmetric aspheric surface toward the peripheral portion,
3. When Npi / Nwi is larger than Npo / Nwo, there is a tendency that the polishing removal amount gradually decreases from the vicinity of the rotation center axis of the axisymmetric aspheric surface toward the peripheral portion. Axisymmetric aspheric polishing method.
前記関数が、プレストンの式を利用していることを特徴とする請求項2に記載の軸対称非球面研磨方法。

3. The axisymmetric aspherical polishing method according to claim 2, wherein the function uses a Preston equation.

JP2005335319A 2005-11-21 2005-11-21 Axisymmetric aspheric surface polishing method Withdrawn JP2007136623A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107470990A (en) * 2017-09-07 2017-12-15 云南北方驰宏光电有限公司 The processing method of sulphur based material aspherical lens
JP2020183010A (en) * 2019-05-08 2020-11-12 オリンパス株式会社 Polishing method and manufacturing method for optical element

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107470990A (en) * 2017-09-07 2017-12-15 云南北方驰宏光电有限公司 The processing method of sulphur based material aspherical lens
JP2020183010A (en) * 2019-05-08 2020-11-12 オリンパス株式会社 Polishing method and manufacturing method for optical element

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