JP2007107937A5 - - Google Patents
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- Publication number
- JP2007107937A5 JP2007107937A5 JP2005297019A JP2005297019A JP2007107937A5 JP 2007107937 A5 JP2007107937 A5 JP 2007107937A5 JP 2005297019 A JP2005297019 A JP 2005297019A JP 2005297019 A JP2005297019 A JP 2005297019A JP 2007107937 A5 JP2007107937 A5 JP 2007107937A5
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- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005297019A JP4849861B2 (en) | 2005-10-11 | 2005-10-11 | Probe card |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005297019A JP4849861B2 (en) | 2005-10-11 | 2005-10-11 | Probe card |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011132475A Division JP2011221031A (en) | 2011-06-14 | 2011-06-14 | Probe |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007107937A JP2007107937A (en) | 2007-04-26 |
JP2007107937A5 true JP2007107937A5 (en) | 2008-11-20 |
JP4849861B2 JP4849861B2 (en) | 2012-01-11 |
Family
ID=38033919
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005297019A Active JP4849861B2 (en) | 2005-10-11 | 2005-10-11 | Probe card |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4849861B2 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101368139B1 (en) * | 2007-07-16 | 2014-03-12 | 어드밴티스트 아메리카, 인크. | A device and method for repairing a microelectromechanical system |
KR101355484B1 (en) * | 2007-07-24 | 2014-01-28 | 주식회사 코리아 인스트루먼트 | Method for repairing bump in probe card, and probe card repaired thereby |
JP5016420B2 (en) * | 2007-09-06 | 2012-09-05 | 日本電子材料株式会社 | Probe replacement method and probe card |
JP5273841B2 (en) * | 2007-09-12 | 2013-08-28 | 日本電子材料株式会社 | Probe mounting method |
JP5625209B2 (en) * | 2007-09-12 | 2014-11-19 | 日本電子材料株式会社 | Replacement probe |
JP5186508B2 (en) | 2007-12-13 | 2013-04-17 | 株式会社日本マイクロニクス | Electrical connection device and contact for use in the electrical connection device |
JP5276836B2 (en) * | 2007-12-14 | 2013-08-28 | 日本電子材料株式会社 | Probe card |
JP5863168B2 (en) | 2011-11-10 | 2016-02-16 | 株式会社日本マイクロニクス | Probe card and manufacturing method thereof |
JP7386138B2 (en) * | 2020-07-06 | 2023-11-24 | 日本特殊陶業株式会社 | wiring board |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0351769A (en) * | 1989-07-19 | 1991-03-06 | Kiga Puroobu Kk | Probe card |
JPH08262061A (en) * | 1995-03-22 | 1996-10-11 | Nobuaki Suzuki | Probe for circuit inspection, and circuit-inspecting instrument |
JPH1038925A (en) * | 1996-07-17 | 1998-02-13 | Nippon Maikuronikusu:Kk | Integrated circuit testing probe and head with it |
JP2002005960A (en) * | 2000-06-21 | 2002-01-09 | Ando Electric Co Ltd | Probe card and its manufacturing method |
-
2005
- 2005-10-11 JP JP2005297019A patent/JP4849861B2/en active Active
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