JP2007064735A - Probe pin transfer system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To prevent trouble such as clogging by a probe pin when the probe pin is automatically inserted by a probe pin insertion mechanism, reduce time required for handling the trouble, and improve an equipment utilization rate. <P>SOLUTION: The probe pin transfer system comprises a parts feeder 1 for positioning and discharging a supplied first probe pin 10 through vibration, a supply rail 2 to which the first probe pin 10 positioned by the parts feeder 1 is supplied, and a pin transfer rail 3 for transferring the first probe pin 10 transferred from the supply rail 2 to the probe pin insertion mechanism 18. A probe pin separating mechanism A is provided between the supply rail 2 and the pin transfer rail 3, which transfers a proper first probe pin 10 to the probe pin insertion mechanism 18 by discriminating the shape of the first probe pin 10 and separates and collects a second probe pin 20. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  In the present invention, in an in-circuit tester (ICT), a probe pin used in an ICT connection jig is transported from a parts feeder to a probe pin insertion mechanism, and a probe pin having a different shape is damaged. The present invention relates to a probe pin transport device provided with a probe pin sorting mechanism that can automatically sort a defective probe pin.

  As a device for inspecting the disconnection or short circuit of the pattern of the board to be inspected, which is a printed circuit board, the pin head equipped with probe pins is moved relative to the board to be inspected and brought into contact with the inspection pad of the board to be inspected In-circuit testers to perform are known.

  There is an ICT connection jig for performing an electrical connection between the board to be inspected and the in-circuit tester when performing a functional test on another type of board to be inspected by the in-circuit tester. A probe pin transport device that supplies the probe pins used in the ICT connection jig to the parts feeder, sends the probe pins aligned by vibration to the transport rail, and supplies the probe pins to the probe pin insertion mechanism is generally used. Has been put to practical use.

  The first probe pin 10 and the second probe pin 20 having different shapes are used as probe pins conveyed by the probe pin conveying device. As shown in FIG. 2, the first probe pin 10 has a stroke portion 10-1 that moves up and down when testing a printed circuit board with an ICT connection jig. The holding portion 10-2 is formed to support the pin rail so that it does not fall down when placed on the pin movement path of the supply rail or the pin conveyance rail.

  Moreover, the 2nd probe pin 20 has the stroke part 20-1 and the holding | maintenance part 20-2 similarly to the 1st probe pin 10, and also the top end part of the stroke part 20-1 as shown in FIG. The pin head portion 20-3 is formed on the surface.

  As shown in FIGS. 16 and 17, the conventional probe pin transport device includes a parts feeder 31 that discharges the probe pins (first probe pins 10 or second probe pins 20) aligned by vibration, and the parts feeder 31. The supply rail 32 to which the probe pins (the first probe pin 10 or the second probe pin 20) aligned in the above are supplied, and the probe pin (the first probe pin 10 or the second probe pin 20 transferred from the supply rail 32). ) Is conveyed to a probe pin insertion mechanism (not shown).

  The probe pins (the first probe pins 10 or the second probe pins 20) supplied to the parts feeder 31 are aligned by vibration and sent to the supply rail 32. Furthermore, it is sent to the pin transport rail 33 by vibration and transported to a probe pin insertion mechanism (not shown).

  The probe pin transport device having this series of mechanisms requires a set for each type of probe pin shape, and is used exclusively for each shape. That is, a probe pin transport device that transports the first probe pins 10 and a probe pin transport device that transports the second probe pins 20 are required.

  Moreover, the pin insertion / extraction device for the printed circuit board in the in-circuit tester includes a pin extraction portion and a pin insertion portion, and the pin insertion portion includes a probe pin conveyance device. In other words, the pin insertion part separates the selected probe pin into one pin, an XY table that positions the pin bed at the pin insertion position, a parts feeder that supplies probe pins, a pin selection supply part that selects types, Pin separating part, a pin insertion head for inserting a probe pin, a pin suction part for sucking a probe pin from below the pin bed when the probe pin is inserted, and a pin for discharging the pin bed in which the probe pin has been inserted and removed It consists of a bed discharge section.

  In the pin selection and supply method using the pin selection and supply unit and the pin separation unit, first, the probe pin discharged from the parts feeder is transported to the pin detection mechanism, and the upper end portion of the probe pin aligned and stationary by the pin detection mechanism is detected by the sensor. And the type of the probe pin is determined, and information related to the probe pin is stored in a control unit (not shown).

Next, the pin selection supply unit moves to any fixed position of the pin separation unit according to the stored information. Next, the probe pin is discharged and transferred to the pin separation unit. By repeating the above operation, the probe pin is supplied to a fixed position (see Patent Document 1).
JP-A-8-327697

  When inspecting a pattern break or short circuit on a printed circuit board by the above insert tester, the probe pin recovered from the printed circuit board after the probe focus inspection supplied by the probe pin transport device is of the same type as the deceleration, Depending on the result, during the inspection of the printed circuit board, if the specified inspection result does not come out with the type of probe pin used by the inspector's own judgment, replace part of the probe pin with another type of probe pin and try again. In some cases, the probe pin may be damaged during the inspection. In such a case, the first probe pin 10 and the second probe pin 20 are mixed in the parts feeder 31, or defective probe pins 30 that are damaged or the like are mixed.

  16 and 17, when the first probe pin 10 and the second probe pin 20 are mixedly entered in the parts feeder 31, the first probe pin 10 Since there is no mechanism for separating the second probe pins 20 from each other, the two types of probe pins 10 and 20 are mixedly supplied to the pin transport rail 33 and sent to the probe pin insertion mechanism as they are. Will cause trouble.

  In addition, when the defective probe pin 30 in a state where the stroke portion 20-1 of the second probe pin 20 is damaged enters the parts feeder 31, there is no mechanism for separating the defective probe pin 30, so that The probe pins 30 are mixedly supplied to the pin transport rail 3 and are sent to the probe pin insertion mechanism as they are, causing trouble in the probe pin insertion mechanism.

  Therefore, in order to recover from trouble such as probe pin clogging in the probe pin insertion mechanism, the probe is stopped and the mixed probe pin (first probe pin 10 or second probe pin 20) or defective probe pin 30 is taken out. In some cases, work such as disassembling the probe pin insertion mechanism part and taking out the probe pin (the first probe pin 10 or the second probe pin 20) or the defective probe pin 30 occurs, and the trouble recovery work takes an enormous amount of time. It was.

  For example, the probe pin insertion mechanism includes a columnar suction head having a plurality of probe pin suction groove portions formed on the peripheral surface portion, and the probe pins transported from the pin transport rail are suctioned to the probe pin suction groove portion by negative pressure. When the probe pin is inserted into the pin head, the probe pin is easily clogged at a portion of the probe pin suction groove portion that sucks the conveyed probe pin with a negative pressure.

  If the second probe pin 20 enters the probe pin adsorption groove during the operation of handling the first probe pin 10, the probe pin adsorption groove is clogged with the second probe pin 20, and if this is continued for a long time, the probe The pin accumulates, and in the worst case, the pin is caught in the probe pin suction groove. In this state, even tweezers can not be removed, various screw members are removed, the suction head is taken out, and the probe pin inserted mechanism is removed, causing problems with the probe pin insertion mechanism .

  Further, in the probe pin transport device provided in the pin insertion / extraction device disclosed in Patent Document 1, the probe pin is inserted when the jig is used, removed when not used, and repeatedly reused. I am using it. There are several types of probe pins. Depending on the shape of the location where the probe pins of the board to be inspected are in contact, the probe pins can be replaced with pins of different shapes depending on the state of contact with the board to be inspected. To remove the probe pins from the jig, the probe pins with different shapes were mixed and supplied to one parts feeder. In addition, the probe pin stroke portion was damaged due to the frequency of use of the probe pin, and the damaged probe pin was supplied with a non-defective product in one parts feeder.

  Therefore, if a probe pin with a different shape or a defective probe pin is transported as it is, and troubles such as sensor detection errors occur in the pin detection mechanism, it takes time to deal with it, causing a reduction in equipment operation rate. It was.

  The present invention has been made to solve the above-described conventional problems, and the object of the present invention is to solve problems such as clogging of probe pins when the probe pins are automatically inserted by the probe pin insertion mechanism. An object is to provide a probe pin transport device that can prevent occurrence, reduce the response time, and further improve the equipment operation rate.

  In order to achieve the above-described object, a probe pin transport device according to the present invention includes a parts feeder for aligning and discharging probe pins by vibration, a supply rail to which probe pins aligned by the parts feeder are supplied, A probe pin transport device having a pin transport rail for transporting probe pins transferred from the supply rail to a probe pin insertion mechanism, wherein the shape of the probe pin is identified between the supply rail and the pin transport rail. Probe pin sorting mechanism that transports the proper probe pins to the proper probe pin transport system that reaches the pin transport rail, and sorts out the incorrect probe pins and defective probe pins and removes them from the proper probe pin transport system. It is characterized by providing.

  With this configuration, even if probe pins with inappropriate shape differences are mixed and entered into the parts feeder or defective probe pins are mixed, proper probe pins can be transported through the probe pin sorting mechanism to Only the probe pins can be supplied to the pin transport rail, and probe pins having different shapes and defective probe pins can be collected in, for example, a pin collection means (pin collection box or the like).

  As a result, only proper probe pins are transported and supplied to the probe pin insertion mechanism, so troubles such as clogging of probe pins that occur when probe pins with different shapes or defective probe pins are supplied are generated. It can prevent, reduce the response time, and further improve the equipment operation rate.

  Further, the probe pin transport device according to the present invention is the above-described probe pin transport device according to the present invention, wherein the probe pin has a stroke portion and a holding portion having a larger diameter than the stroke portion at an intermediate portion of the stroke portion. In addition to the formed first probe pin, the holding portion, and the stroke portion, the second probe pin has a pin head portion having a diameter larger than that of the stroke portion at the top end portion of the stroke portion. A first separation rail that forms a proper probe pin transport system for transporting only the first probe pin to the pin transport rail while transporting the pin and the second probe pin in the pin transport direction A while being held by the respective holding portions; The second probe pin transported by the first separation rail is removed from the proper probe pin transport system while being held by the pin head portion. Characterized by comprising a second fractionation rail to discharge recovered down recovery means.

  With this configuration, the first probe pin sent from the parts feeder to the supply rail is sent to the first separation rail as it is, and sent to the pin movement path of the pin conveyance rail without being excluded from the proper probe pin conveyance system. Then, it is conveyed to the probe pin insertion mechanism as it is and the insertion operation is performed.

  In addition, the second probe pin sent from the parts feeder to the supply rail is sent to the first separation rail as it is and conveyed to the second separation rail, but is removed from the appropriate probe pin conveyance system and collected by the pin collection means. Is done. As a result, even if the second probe pin accidentally enters the parts feeder, it is not transported to the proper probe pin transport system.

  The probe pin transport device according to the present invention is the above-described probe pin transport device according to the present invention, wherein the first separation rail is provided with a first separation rail side pin moving path through which only the stroke portion passes. The second sorting rail is connected to the second sorting rail side pin moving path through which only the stroke portion passes, and the terminal of the second sorting rail side pin moving path, and is deviated with respect to the pin conveying direction a. A pin drop port located above the probe pin collecting means is formed, the pin loading side of the first sorting rail is located below the pin loading side of the supply rail, and the pin loading side of the second sorting rail Is located above the pin carry-out side of the first separation rail and at the position where the pin head portion is placed, and the first separation rail and the second separation rail operate in conjunction with the vibration of the pin conveyance rail. .

  With this configuration, the first probe pin sent from the parts feeder to the supply rail is directly sent to the first separation rail and conveyed to the second separation rail, but the first probe pin has no pin head portion. The first probe pin cannot be placed on the second sorting rail side pin moving path, but is sent to the pin moving path of the pin transport rail, and is transported to the probe pin inserting mechanism as it is to perform the inserting operation.

  In addition, the second probe pin sent from the parts feeder to the supply rail is sent as it is to the first separation rail and conveyed to the second separation rail. However, since the second probe pin has a pin head portion, The two probe pins are transported in a state where the pin head portion is held by the second sorting rail, and when the two probe pins reach the pin dropping port, they are dropped and collected by the pin collecting means. As a result, even if the second probe pin accidentally enters the parts feeder, it is not transported to the proper probe pin transport system and is not transported to the probe pin insertion mechanism.

  Further, the probe pin transport device according to the present invention is the above-described probe pin transport device according to the present invention, wherein the probe pin has a stroke portion and a holding portion having a larger diameter than the stroke portion at an intermediate portion of the stroke portion. In addition to the formed first probe pin, the holding portion and the stroke portion, the second probe pin is formed with a pin head portion having a diameter larger than that of the stroke portion at the top end portion of the stroke portion. Proper probe pin transport system for transporting the second probe pin to the pin transport rail by transporting it in the pin transport direction a while holding it, and forming the proper probe pin transport system for the defective probe pin without the first probe pin and the pin head portion. It has the probe pin classification rail excluded from.

  With this configuration, the second probe pin sent from the parts feeder to the supply rail is sent to the probe pin sorting rail, and is transported to the appropriate probe pin transport system, and is transported to the probe pin insertion mechanism as it is to perform the insertion operation. .

  Also, when the first probe pin is sent from the parts feeder to the supply rail, the probe pin sorting rail cannot be transported to the proper probe pin transport system because the pin head portion does not exist in the first probe pin. It is not conveyed and falls from the pin carry-out side of the supply rail and is collected by the pin collecting means.

  Similarly, since the defective probe pin does not exist because the pin head portion is broken, the probe pin sorting rail cannot be transported and is not transported to the proper probe pin transport system and falls from the pin unloading side of the supply rail. Is collected by the pin collecting means.

  As a result, even if the first probe pin or the defective probe pin accidentally enters the parts feeder, it is not transported to the proper probe pin transport system and is not transported to the probe pin insertion mechanism.

  Further, the probe pin transport device according to the present invention is the above-described probe pin transport device according to the present invention, wherein the probe pin sorting rail has a probe pin sorting rail side pin moving path through which only the stroke portion passes, and the probe pin An appropriate probe pin transport system for forming a pin drop opening connected to the terminal end of the sorting rail side pin moving path, and the probe pin sorting rail side pin moving path and the pin drop opening for transferring the second probe pin to the pin transport rail. The pin carry-in side of the probe pin sorting rail is located above the pin carry-out side of the supply rail and the pin head part is placed, and the probe pin sorting rail operates in conjunction with the vibration of the pin carrying rail. It is characterized by doing.

  With this configuration, the second probe pin sent from the parts feeder to the supply rail is sent to the probe pin sorting rail, and since the second probe pin has a pin head portion, the second probe pin probes the pin head portion. It is transported along the probe pin sorting rail-side pin movement path while being held by the pin sorting rail, and when the second probe pin reaches the pin drop opening, it falls to the pin carrying rail and the appropriate probe pin carrying system Then, it is conveyed to the probe pin insertion mechanism as it is, and an insertion operation is performed.

  Also, when the first probe pin is sent from the parts feeder to the supply rail, the probe pin sorting rail cannot be transported to the proper probe pin transport system because the pin head portion does not exist in the first probe pin. It is not conveyed and falls from the pin carry-out side of the supply rail and is collected by the pin collecting means.

  Similarly, since the defective probe pin does not exist because the pin head portion is broken, the probe pin sorting rail cannot be transported and is not transported to the proper probe pin transport system and falls from the pin unloading side of the supply rail. Is collected by the pin collecting means.

  According to the probe pin conveying device according to the present invention, even if probe pins of different shapes are mixed and enter the parts feeder or defective probe pins are mixed, the probe pins are conveyed through the probe pin sorting mechanism. By doing so, it becomes possible to supply only appropriate probe pins to the pin transport rail. Also, probe pins having different shapes and defective probe pins can be collected, for example, in a pin collection means (pin collection box, etc.). Can do.

  As a result, only proper probe pins are transported and supplied to the probe pin insertion mechanism, so troubles such as clogging of probe pins that occur when probe pins with different shapes or defective probe pins are supplied are generated. It is possible to prevent, reduce the response time, and further improve the equipment operation rate.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  FIG. 1 to FIG. 8 show a configuration of a probe pin conveying apparatus according to the present invention, which has a probe pin sorting mechanism for sorting and selecting the first probe pins 10. 2 shows the first probe pin 10, and FIG. 3 shows the first probe pin 20.

  As described above, the first probe pin 10 has the stroke portion 10-1 and the holding portion 10-2 provided at the intermediate portion of the stroke portion 10-1. Similar to the one probe pin 10, in addition to the stroke portion 20-1 and the holding portion 20-2, a pin head portion 20-3 is provided.

  As shown in FIG. 1, the probe pin transport device is supplied with a parts feeder 1 that aligns and discharges the supplied first probe pins 10 by vibration, and the first probe pins 10 that are aligned with the parts feeder 1. Supply rail 2 and a pin transport rail 3 for transporting the first probe pin 10 transferred from the supply rail 2 to the probe pin insertion mechanism 18, and between the supply rail 2 and the pin transport rail 3. Identifies the shape of the first probe pin 10, conveys the first probe pin 10 to an appropriate probe pin conveyance system that reaches the pin conveyance rail 3, and separates the second probe pin 20 to provide an appropriate probe pin conveyance system. There is provided a probe pin sorting mechanism A that is removed and collected.

  As shown in FIG. 4, the supply rail 2 has a pair of rail members 2-1 and 2-2 arranged in parallel in a horizontal state, and a stroke of the first probe pin 10 between the rail members 2-1 and 2-2. The pin moving path 2-3 having a width dimension s1 that is slightly larger than the diameter of the portion 10-1 is formed, and the pin transport rail 3 has a pair of rail members 3-1, 3-2 in a horizontal state. The pin moving path 3-3 having a width dimension s2 slightly larger than the diameter of the stroke portion 10-1 of the first probe pin 10 is formed between the rail members 3-1, 3-2 in parallel with each other. is there.

  The probe pin sorting mechanism A includes a first sorting rail 4, a second sorting rail 5, and a collection box 7 that is a pin collection means. As shown in FIGS. 4 and 5, the first separation rail 4 includes a pair of rail members 4-1 and 4-2, and these rail members 4-1 and 4-2 have both ends thereof. Are held by the pillars 8a and 8b erected on the rail members 3-1 and 3-2 of the pin transport rail 3 and arranged in parallel in a horizontal state. Between the rail members 4-1 and 4-2, the first sorting rail side pin moving path having a width dimension s 3 that is slightly larger than the diameter of the stroke portions 10-1 and 20-1 of the first and second probe pins 10 and 20. 4-3 is formed. Then, the pin carry-in side of the first sorting rail 4 is located below the pin carry-out side of the supply rail 2.

  As described above, since the first separation rail 4 is fixed to the upper portion of the pin transport rail 3 via the support columns 8a and 8b, the first probe pin 10 is operated by operating in conjunction with the vibration of the pin transport rail 3. The second probe pin 20 can be transported.

  As shown in FIGS. 4 and 5, the second separation rail 5 includes a rail member 5-1, and the rail member 5-1 has one side forward from the substantially central portion with respect to the pin conveying direction a. It is bent to the right, and a pin drop opening 6 made of a circular hole having a diameter larger than that of the pin head portion 20-3 of the second probe pin 20 is formed in the bent portion 5-2. . The rail member 5-1 has a slit-shaped dividing groove having a width dimension s 4 that allows the stroke portion 20-1 of the second probe pin 20 to pass in the center in the width direction thereof. A pin moving path 5-3 is formed, and the second sorting rail side pin moving path 5-3 is bent to one side (right side) with respect to the pin conveying direction a from the substantially central portion. The pin carry-in side opens to the base end of the rail member 5-1, and the pin carry-out side opens to the pin drop opening 6.

  And the rail member 5-1 is hold | maintained via the support | pillar 9a at the rail members 4-1 and 4-2 of the 1st separation rail 4 at the base end part side, and pin conveyance is carried out at the front end side. The rails 3-1 and 3-2 of the rail 3 are held horizontally via the support columns 9 b and are made horizontal. As described above, the second sorting rail 5 is fixed to the first sorting rail 4 and the pin transport rail 3 via the support columns 9a and 9b, and thus operates in conjunction with the vibration of the pin transport rail 3. The second probe pin 20 can be conveyed.

  And the pin carrying-in side of the 2nd classification rail 5 is located above the pin carrying-out side of the 1st classification rail 4, and the 1st classification rail side pin moving path 4-3 and the 2nd classification rail side pin moving path The portion excluding the bent portion 5-3 is located on the pin moving path 3-3 of the pin transport rail 3, and the pin dropping port 6 is located outside the pin moving path 3-3 of the pin transport rail 3 ( And located above the collection box 7.

  And the 1st classification rail 4 follows the 1st classification rail side pin moving path 4-3, hold | maintaining the 1st probe pin 10 and the 2nd probe pin 20 with each holding | maintenance part 10-2, 20-2. And an appropriate probe pin transport system for transporting the first probe pins 10 to the pin transport rail 3 is formed, and the second separation rail 5 is transported by the first separation rail 4. The two probe pins 20 have a function of being removed from the appropriate probe pin transport system and being discharged into the collection box 7 while being held by the pin head portion 20-3.

  Next, the sorting and conveying operation in the probe pin conveying apparatus will be described with reference to FIGS.

  6 and 7 show a transport state when an appropriate probe pin 10 is supplied to the parts feeder 1. The first probe pins 10 sent from the parts feeder 1 to the supply rail 2 are sent to the first sorting rail 4 as they are. And although it is conveyed to the 2nd classification rail 5, since the 1st probe pin 10 does not have the pin head part 20-3, the 1st probe pin 10 penetrates into the 2nd classification rail side pin moving path 5-3. However, it cannot be placed on the second sorting rail 4 but is sent to the pin moving path 3-3 of the pin transport rail 3 and is transported to the probe pin insertion mechanism 18 as it is to perform the insertion operation. That is, the first probe pin 10 is transported through the appropriate probe pin transport system.

  FIG. 8 and FIG. 9 show the conveyance state when the second probe pin 20 is supplied to the parts feeder 1. The second probe pin 20 sent from the parts feeder 1 to the supply rail 2 is sent to the first sorting rail 4 as it is. Then, the second probe pin 20 has the pin head portion 20-3, and therefore the second probe pin 20 moves the pin head portion 20-3 to the second separation rail 5. It is conveyed along the second sorting rail side pin moving path 5-3 while being held.

  Since the second sorting rail 5 is bent in one direction with respect to the pin transport direction a from the middle, the second probe pin 20 is transported in a direction away from the pin transport rail 3 and goes to the pin drop opening. When it reaches 6, it falls and is collected in the pin collection box 7. As a result, even if the second probe pin 20 enters the parts feeder 1 by mistake, it is not transported to the pin transport rail 3 and is not transported to the probe pin insertion mechanism 18.

  As described above, according to the embodiment of the present invention, only the appropriate first probe pin 10 is transported and supplied to the probe pin insertion mechanism 18, so that the second probe pin 20 is supplied. Can prevent troubles such as clogging of probe pins, reduce the response time, and improve the equipment operation rate.

  Next, FIG. 1 and FIG. 10 to FIG. 15 show a configuration having a probe pin sorting mechanism A-1 for sorting and selecting the second probe pins 20, which is a probe pin transport apparatus according to the present invention.

  As shown in FIG. 1, the probe pin transport device is supplied with a parts feeder 11 for discharging the supplied second probe pins 20 by aligning them by vibration and the second probe pins 20 aligned by the parts feeder 11. A supply rail 12 and a pin conveyance rail 13 for conveying the second probe pin 20 transferred from the supply rail 12 to the probe pin insertion mechanism 18, and between the supply rail 12 and the pin conveyance rail 13. Forms a proper probe pin transport system that transports the second probe pin 20 to the pin transport rail 3 by transporting the second probe pin 20 to the pin transport rail 3 while holding the pin head portion 20-3, and the first probe pin 10 and the pin head portion. There is provided a probe pin sorting mechanism A-1 for removing a defective probe pin 30 without 20-3 from an appropriate probe pin transport system. .

  The supply rail 12 has a pair of rail members 12-1 and 12-2 arranged in parallel in a horizontal state, and the stroke portions 10 of the first and second probe pins 10 and 20 between the rail members 12-1 and 12-2. -1 and 20-1 are formed by forming a pin moving path 12-3 having a width dimension s5 that is slightly larger than the diameters, and the pin transport rail 13 includes a pair of rail members 13-1 and 13-2. A pin moving path 13-3 having a width dimension s6 that is slightly larger than the diameter of the stroke portion 20-2 of the second probe pin 20 is formed between the rail members 13-1 and 13-2 in parallel in a horizontal state. It is.

  The probe pin sorting mechanism A-1 has a probe pin sorting rail 14 and a pin collection box 17. And as shown in FIG.10 and FIG.11, the probe pin classification rail 14 is equipped with the rail member 14-1, and this rail member 14-1 is the both ends (a pin carrying-in side and a pin carrying-out side), The pins 16 are held by the pillars 16 erected on the rail members 13-1 and 13-2 of the pin transport rail 13 and are arranged in parallel in a horizontal state. From the probe pin sorting rail side pin moving path 14-2 having a width dimension s7 that is slightly larger than the diameter of the stroke part 20-1, and from a rectangular hole connected to the terminal end of the probe pin sorting rail side pin moving path 14-2 The pin drop port 15 is formed. The pin carry-in side of the probe pin sorting rail 14 is located above the pin carry-out side of the supply rail 12 and at a height at which the pin head portion 20-3 is placed.

  As described above, since the probe pin sorting rail 14 is fixed to the upper portion of the pin transport rail 13 via the support column 16, the second probe pin 20 is moved by operating in conjunction with the vibration of the pin transport rail 13. It can be transported.

  The probe pin sorting rail 14 forms a proper probe pin transport system that transports the second probe pin 20 to the pin transport rail 3 by transporting the second probe pin 20 to the pin transport rail 3 while holding the pin head portion 20-3. 1 probe pin 10 and defective probe pin 30 without pin head portion 20-3 are excluded from the proper probe pin transport system.

  Next, the separating and conveying operation in the probe pin conveying apparatus will be described with reference to FIGS.

  FIGS. 12 and 13 show the conveyance state when the appropriate second probe pin 20 is supplied to the parts feeder 11. The second probe pin 20 sent from the parts feeder 11 to the supply rail 12 is sent to the probe pin sorting rail 14. Since the second probe pin 20 has the pin head portion 20-3, the second probe pin 20 has the pin head portion 20-3 held by the probe pin separation rail 14 and the probe pin separation rail side pin. It is conveyed along the movement path 14-2.

  The probe pin sorting rail 14 is provided with a pin drop opening 15 having a diameter larger than that of the pin head portion 20-3 of the second probe pin 20. When the second probe pin 20 reaches the pin drop opening 15, the pin transport rail The pin transport rail 13 is transported to the probe pin insertion mechanism 18 and inserted into the pin pin rail 20 while holding the pin head portion 20-3 of the second probe pin 20. Is done.

  FIGS. 14 and 15 show the conveyance state when the first probe pin 10 and the defective probe pin 30 which is the second probe pin 20 having the pin head portion 20-3 damaged are supplied to the parts feeder 11. FIG.

  The first probe pin 10 or the defective probe pin 30 sent from the parts feeder 11 to the supply rail 12 is transported to the pin carry-in side of the probe pin sorting rail 14, but the first probe pin 10 is a pin head portion 20-3. Therefore, the probe pin sorting rail 14 cannot be transported and falls from the pin carry-out side of the supply rail 12 and is collected in the pin collection box 17.

  Similarly, the defective probe pin 30 does not exist because the pin head portion 20-3 is broken, so that the probe pin sorting rail 14 cannot be transported and falls from the pin carry-out side of the supply rail 12, and the pin recovery box. 17 recovered.

  As a result, even if the first probe pin 10 or the defective probe pin 30 enters the parts feeder 11 by mistake, it is not transported to the proper probe pin transport system and is not transported to the probe pin insertion mechanism 18.

  As described above, according to the embodiment of the present invention, only the appropriate second probe pin 20 is transported and supplied to the probe pin insertion mechanism 18, so that the first probe pin 10 and the defective probe pin 30 are supplied. The occurrence of troubles such as clogging of probe pins, which are caused by supply, can be prevented, the response time can be reduced, and the equipment operation rate can be improved.

  According to the probe pin transport device according to the present invention, since only a proper probe pin is transported and supplied to the probe pin insertion mechanism, it is generated by supplying a probe pin having a different shape or a defective probe pin. It has the effect of preventing troubles such as clogging of probe pins, reducing the response time, and further improving the equipment operation rate. Probe pins used in ICT connection jigs are This is useful for a probe pin transport device that transports from a parts feeder to a probe pin insertion mechanism.

It is a block diagram which shows the structure of the probe pin conveying apparatus which concerns on this invention. It is composition explanatory drawing of the 1st probe pin. It is a structure explanatory view of the 2nd probe pin. 1 is a plan view of a configuration having a probe pin sorting mechanism for sorting and selecting first probe pins, which is a probe pin transport device according to the present invention. FIG. It is the same side view. It is a top view which shows the conveyance operation | movement of a 1st probe pin in the probe pin conveyance apparatus. It is the same side view. It is a top view which shows the conveyance operation of the 2nd probe pin in the probe pin conveyance apparatus. It is the same side view. FIG. 5 is a plan view of a configuration having a probe pin sorting mechanism for sorting and selecting second probe pins, which is a probe pin transport device according to the present invention. It is the same side view. It is a top view which shows the conveyance operation of the 2nd probe pin in the probe pin conveyance apparatus. It is the same side view. FIG. 6 is a plan view showing a transport operation of a defective probe pin that is a first probe pin or a second probe pin in which a pin head portion is damaged in the probe pin transport device. It is the same side view. In the conventional probe pin conveying apparatus, it is a top view which shows the conveyance operation | movement of the defective probe pin which is a 2nd probe pin which damaged the 1st probe pin, the 2nd probe pin, and the pin head part. It is the same side view.

Explanation of symbols

A Probe pin sorting mechanism A-1 Probe pin sorting mechanism 1 Parts feeder 2 Supply rail 2-1 Rail member 2-2 Rail member 2-3 Pin moving path 3 Pin transport rail 3-1 Rail member 3-2 Rail member 3- 3 Pin Moving Path 4 First Sorting Rail 4-1 Rail Member 4-2 Rail Member 4-3 First Sorting Rail Side Pin Moving Path 5 Second Sorting Rail 5-1 Rail Member 5-2 Bending Part 5-3 Second Separation rail side pin travel path 6 Pin drop port 7 Pin collection box (pin collection means)
8a, 8b Post 9a, 9b Post 10 First probe pin 10-1 Stroke part 10-2 Holding part 11 Parts feeder 12 Supply rail 12-1 Rail member 12-2 Rail member 12-3 Pin moving path 13 Pin transport rail 13 -1 Rail member 13-2 Rail member 14 Probe pin sorting rail 14-1 Rail member 14-2 Probe pin sorting rail side pin moving path 15 Pin drop port 16 Post 17 Pin collection box (pin collection means)
18 Probe pin insertion mechanism 20 Second probe pin 20-1 Stroke part 20-2 Holding part 20-3 Pin head part 30 Defective probe pin

Claims (5)

A parts feeder for aligning and discharging probe pins by vibration, a supply rail to which the probe pins aligned by the parts feeder are supplied, and transporting the probe pins transferred from the supply rail to a probe pin insertion mechanism A probe pin transport device having a pin transport rail,
The probe pin is identified between the supply rail and the pin transport rail, and the proper probe pin is transported to the proper probe pin transport system leading to the pin transport rail, and the probe pin is not proper. And a probe pin sorting mechanism for sorting and removing the defective probe pins from the appropriate probe pin carrying system and collecting them. The probe pin includes a stroke portion, a first probe pin formed with a holding portion having a diameter larger than the stroke portion at an intermediate portion of the stroke portion, the holding portion, and the stroke portion. A second probe pin having a pin head portion having a diameter larger than that of the stroke portion at a top end portion; and the probe pin sorting mechanism holds the first probe pin and the second probe pin by the holding portions. The first separation rail that forms the appropriate probe pin conveyance system for conveying only the first probe pin to the pin conveyance rail while conveying the first probe pin to the pin conveyance rail, and the second conveyed by the first separation rail. The probe pin is removed from the appropriate probe pin transport system while being held by the pin head portion, and the probe pin collecting means discharges and collects the second. Probe pin conveying device according to claim 1, characterized in that with a separate rail. The first separation rail has a first separation rail side pin moving path through which only the stroke portion passes, and the second separation rail has a second separation rail side pin through which only the stroke portion passes. A pin drop opening is formed which is connected to the end of the moving path and the second sorting rail side pin moving path and is displaced with respect to the pin conveying direction a and located above the probe pin collecting means, A pin carry-in side of the first separation rail is located below the pin carry-out side of the supply rail, and a pin carry-in side of the second separation rail is above the pin carry-out side of the first separation rail. 3. The probe pin transport apparatus according to claim 2, wherein the pin head portion is located, and the first sorting rail and the second sorting rail operate in conjunction with vibration of the pin transport rail. The probe pin includes a stroke portion, a first probe pin formed with a holding portion having a diameter larger than the stroke portion at an intermediate portion of the stroke portion, the holding portion, and the stroke portion. A second probe pin in which a pin head portion having a diameter larger than that of the stroke portion is formed at a top end portion, and the probe pin sorting mechanism conveys the second probe pin in a pin conveying direction while holding the pin head portion; Forming a proper probe pin transport system for transferring to the pin transport rail, and having a probe pin sorting rail for excluding defective probe pins without the first probe pin and the pin head portion from the proper probe pin transport system; The probe pin conveying apparatus according to claim 1, characterized in that: The probe pin sorting rail is formed with a probe pin sorting rail side pin moving path through which only the stroke portion passes, and a pin drop opening connected to the end of the probe pin sorting rail side pin moving path. The pin separation rail side pin moving path and the pin drop port form an appropriate probe pin conveyance system for transferring the second probe pin to the pin conveyance rail, and the pin carry-in side of the probe pin separation rail is 5. The probe according to claim 4, wherein the probe head is located in a position where the pin head portion is placed above the supply side of the supply rail, and the probe pin sorting rail operates in conjunction with vibration of the pin transport rail. Pin transport device.

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