JP2007024516A - Drop impact testing device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a drop impact testing device, capable of carrying out precisely a natural drop impact test dropped under identical conditions, from a fixed height each time, and accurately dropped at the same spot. <P>SOLUTION: This device for inspecting the drop impact characteristics of a work, that is an object of inspection, is provided with a holding tool 17 for holding the work, a flexible wire rod 21 for suspending the holding tool, a means 16 for holding the holding tool 17 supported by the wire rod at a fixed height, and a means 18 for dropping the holding tool 17 from the fixed height and for sending out the wire rod, in response to the drop. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a drop impact testing apparatus for testing characteristics of a drop impact by fixing a product such as an electronic component to a holding jig and dropping the product from a certain height.

  Currently, many industrial products such as electronic parts that are produced and used are extremely precise. After shipping, the impact, that is, the process of assembling the parts into a finished product or after the product reaches the user. An impact test is performed from the viewpoint of how the performance is affected when an impact from the outside is received in a use environment or the like.

  For example, a device has been proposed in which a predetermined plate is suspended at a certain height to be swingable, an electronic device as a product is placed on the plate, and a hammer is applied to the plate (Patent Document 1). reference).

  However, this device inspects by applying impact from the outside with a hammer, but for this inspection method, the effect of drop impact from a certain height is rather inspected, and repeatedly under the same conditions. Therefore, it is possible to make objective product standards by inspecting or comparing the effects.

Conventionally, such a drop test is often performed by a human hand, and it is difficult to precisely match individual drop conditions.
On the other hand, an apparatus for performing a drop test mechanically has also been proposed (see Patent Document 2).

4-75938 JP-A-10-332538

However, the apparatus described in Patent Document 2 is intended to test various characteristics such as vertical and horizontal tensile tests, bending characteristics, and distortion characteristics with respect to the workpiece. An arbitrary weight is fixed, a vertical acceleration is applied, and the impact is to be tested.
Therefore, it is not known to conduct a test relating to an impact when it naturally falls from a certain height, and it is not known to conduct a drop impact test using a natural drop.
By the way, when performing a drop impact test from a certain height with human hands, it is difficult to align the conditions such as dropping from the same height precisely every time and dropping to the same location if repeated drop tests are performed. High drop impact test cannot be performed.

  The present invention was made to solve the above-described problems, and is a drop impact test that can accurately perform a natural drop impact test such as dropping from a certain height every time under the same conditions and dropping exactly on the same location. An object is to provide an apparatus.

  According to the first aspect of the present invention, there is provided a device for inspecting a drop impact characteristic of a work to be inspected, a holding jig for holding the work, and a flexible jig for suspending the holding jig. A drop impact comprising a wire, means for holding the holding jig supported by the wire at a constant height, and means for dropping the holding jig from the constant height and feeding the wire in response to the drop. This is achieved with a test device.

According to the configuration of the first invention, a workpiece such as an electronic component to be inspected is fixed to the holding jig. Since this holding jig is suspended by a flexible wire and has means for holding it at a constant height, the holding jig is precisely dropped and naturally dropped.
In particular, since the holding jig is suspended by a flexible wire, it is not dropped without a track, but it is dropped while being held by the wire being fed out by the wire feeding means, so that it does not fall into various locations. It is possible to examine the impact of a natural drop on a plurality of workpieces under the same conditions.
Thus, it is possible to provide a drop impact test apparatus capable of accurately performing a natural drop impact test such as dropping from a certain height every time under the same conditions and dropping precisely to the same location.

According to a second aspect of the present invention, in the configuration of the first aspect of the present invention, there is provided pull-back means for pulling back the wire rod and repeatedly returning the holding jig to the same height.
According to the configuration of the second aspect of the invention, by providing the pulling means for repeatedly returning the holding jig to the same height, it is possible to repeatedly reproduce the natural drop impact test from the same height as many times as necessary. it can.

According to a third aspect of the present invention, in the configuration of the first or second aspect of the invention, there is provided a rebound preventing unit that applies tension to the wire in a predetermined time after the holding jig is dropped.
According to the configuration of the third invention, when a tension is applied to the wire rod in a predetermined time after the holding jig is dropped, the wire rod is dropped after the holding jig falls and receives a drop impact on the dropping surface. To be shortened. As a result, the holding jig is pulled back upward, so that the holding jig does not reach the dropping surface. Therefore, it is prevented that the holding jig once again (rebounds) or repeatedly collides with the dropping surface. That is, rebound can be avoided to prevent different conditions for each test, and the accuracy in test reproducibility can be improved.

According to a fourth aspect of the invention, in the configuration of the second or third aspect of the invention, the pull-back means has a folded portion in which the extending direction of the wire is reciprocating and opposite to each other, and the folded portion serves as a linear guide. It is characterized by the configuration of moving along.
According to the configuration of the fourth invention, by providing the linear guide that folds the extending direction of the wire and moves the folded portion, the intersecting portion moves along the linear guide, so that the intersecting portion is moved. The wire hanging from the holding jig can be fed out or pulled back by a distance twice as long as the moving distance. Thereby, compared with the feeding distance of a wire, an apparatus can be formed compactly.

A fifth invention is a configuration in which in the configuration of any one of the first to fourth inventions, a plurality of types of holding jigs are fixed to the wire to hold the workpiece to be inspected in different postures. And the fall start height changing means for changing the drop height according to the type of the holding jig is provided.
According to the configuration of the fifth invention, a drop test under the same conditions can be performed in a state where the posture of the workpiece is changed.

A sixth invention is characterized in that, in the configuration of any one of the first to fifth inventions, there is provided a rocking regulation guide portion for preventing the long extending wire from rocking in the horizontal direction.
According to the configuration of the sixth invention, when the paths of the wires cross each other and the wires approach each other, the long wires are drawn out at a high speed or entangled with each other when pulled back. There is a risk of being caught by other parts and structures. Therefore, by providing the swing regulation guide portion, it is possible to prevent the above disadvantages even if the wire is drawn around in a narrow range.

Preferred embodiments of the present invention will be described below with reference to the accompanying drawings.
FIG. 1 is a schematic configuration diagram showing an embodiment of a drop impact test apparatus of the present invention.
This drop impact test apparatus (hereinafter referred to as “test apparatus”) 10 naturally drops a work such as a crystal device such as a crystal resonator from a certain height and influences the impact in that case. It is a device for checking.

That is, the test apparatus 10 is arranged on a base (or floor surface) 11, a target 12 that is a dropping surface that receives a collision of a dropped holding jig, and a support column that stands substantially vertically from the base 11. Part 13 is provided.
The column 13 serves as a basic frame of the test apparatus 10, and is preferably a column that extends in the vertical direction (Z direction) and is made of a material that is sturdy and accurate. The target 12 is made of a strong material that is not easily damaged because the holding jig falls and collides, and the upper surface is horizontally formed of stone, concrete, metal, or the like.

The support column 13 has a height dimension that is at least a predetermined height at which a drop test is performed, and extends linearly in the Z direction on different surfaces as shown in FIGS. 1 and 2. A first linear guide 23 and a second linear guide 24 are provided.
The first moving slider 15 is guided by the first linear guide 23 so as to be movable in the Z direction (F direction in FIG. 1). The second linear guide 24 guides the second moving slider 18 so as to be movable in the Z direction (B direction in FIG. 1).

Here, the “moving slider” is a member that is movably attached to a frame or an arm such as a support column and is slid relative to the wire. A “fixed slider” to be described later is a member that is fixed so as not to move to the frame or the arm and slides the wire, unlike the moving slider.
As will be described later, the first moving slider 15 is a means for holding the drop level (height) of a holding jig (to be described later) that holds a workpiece, and can be moved by a driving means such as a built-in motor. Thus, a part of the means for changing / adjusting the drop level of the holding jig 17 is formed.
As will be described later, the second moving slider 18 constitutes a part of a means for feeding and pulling a wire rod.

In the vicinity of the upper end of the support column 13, a fixed arm 14 extending along a horizontal direction (X direction in FIG. 1) is disposed. At least the tip of the fixed arm 14 extends to a position overlapping the target 12.
On the other hand, the first moving slider 15 movable in the F direction is provided with a moving arm 16 extending in the horizontal direction. The distal end of the moving arm 16 is also located on the target 12, and a through hole 16a is formed at the distal end. A wire rod fixing portion 31 is provided at the upper end of the first moving slider 15.
The wire 21 is preferably a flexible and tough wire that can be bent and bent and has a slight surface friction. For this reason, for example, a wire rope, a rope made of a synthetic resin, a tough natural fiber rope, and the like are suitable. The wire 21 is fixed by tying its base end to a hook (not shown) provided at the upper end of the first slider 15. The other end of the wire 21 is first drawn downward in FIG. 1, goes around the outer periphery of the second moving slider 18, for example, the cylinder, and passes through the folded portion 22 in which the extending direction of the wire 21 is opposite, Head up.

  Further, the wire 21 is positioned above the second moving slider 18, is drawn around the fixed slider 19 provided on the fixed arm 14, and wraps around the outer periphery of the cylinder (see FIG. 5). The fixed slider 20 is drawn so as to hang around the outer periphery of the cylinder. The further distal end portion of the wire 21 is inserted through the through hole 16a of the moving arm 16, and the holding jig 17 is fixed to the distal end portion. As will be described later, the holding jig fixes and holds a workpiece to be inspected.

  In this way, with respect to the moving slider and the fixed slider for the wire 21 to be routed and guided, the fixed slider 19 shown in FIG. 5 will be described as a representative example. A guide groove through which the wire 21 passes is formed by a swinging regulation guide portion configured to sandwich the cylinder 19c from both sides by the wall portions 19a and 19b. Since the swing regulation guide portion has the walls 19a and 19b, the swing of the wire 21 in the width direction can be prevented, and even when the wires 21 come close to each other, they are entangled or shaken. Can be prevented. In addition, it is possible to replace and fix a new wire by simply breaking a knot such as a hook (not shown) provided at the upper end portion of the first slider 15, and by simply passing the tip side through several moving sliders and fixed sliders. 21 can be easily replaced and replaced.

The second moving slider 18 can be moved in the direction of arrow B by driving means such as a built-in motor, and has a moving distance L2 that is a distance between the moving upper limit switch 27 and the moving lower limit switch 26. Moved in range. These limit switches can be of various types, such as those having a mechanical configuration and those having a photo interrupter type using a light emitting / receiving element.
On the other hand, the holding jig 17 that holds the workpiece is fixed to the tip of the wire 21 and is naturally dropped by a distance L1 from the contact surface 16b at the tip of the moving arm 16 to the upper surface of the target 12. That is, the second moving slider 18 descends and moves by the distance L2, and the holding jig 17 is brought into contact with the contact surface 16b of the fixed arm 16. In this state, the wire 21 is prevented from moving, the second moving slider 18 is raised by a distance L2, and the holding jig 17 is naturally dropped by the amount of slack of the wire 21 at that time. In this way, the holding jig 17 is dropped just by the distance L1 so that the holding jig 17 collides with the surface of the target 12.

In order to realize such a movement, a wire pressing cylinder 32 is disposed on the fixed arm 14 so as to face the fixed slider 19. That is, the wire clamp cylinder 32 includes a presser upper limit switch 34 and a presser lower limit switch 35, and the presser arm 32a that moves between these limit switches holds the wire 21 on the outer peripheral surface of the cylinder 19c as shown in FIG. It comes to put on.
That is, when the holding jig 17 is in contact with the contact surface 16b of the moving arm 16, the wire 21 is pressed against the outer peripheral surface of the cylinder 19c, and when the second moving slider 18 is raised to the position D, the wire 21 can sag. Next, when the wire pressing cylinder 32 raises the pressing arm 32a, the holding jig 17 naturally falls according to gravity.

In addition, a rebound prevention cylinder 33 is disposed on the fixed arm 14 between the fixed slider 19 and the fixed slider 20. The holding arm 33a of the rebound prevention cylinder 33 has a contact surface with a wide area at the tip, and the contact surface is pressed down against the wire 21. Thereby, as can be understood from FIG. 1, the dropped holding jig 17 is pulled up.
That is, since the holding jig 17 falls and collides with the target 12 at a predetermined time from the time when the wire holding cylinder 32 removes the holding of the wire 21 as described above, when the first collision is completed, If the holding jig 17 is pulled back by the above-described action of the rebound prevention cylinder 33, it is possible to prevent the holding jig 17 from colliding with the target 12 again or repeatedly.
The test apparatus 10 in FIG. 1 includes a power supply unit 25 and a drop counter 49 for measuring the number of drops, as well as a predetermined sequence circuit or a computer control unit.

3 and 4 show two types of holding jigs used in the test apparatus 10.
The holding jig 17-1 in FIG. 3 is, for example, a pentagonal plate, and is used so that the tip of the wire 21 is tied to the fixing ring 17a at the end with the apex thereof facing down. In this holding jig 17-1, for example, a crystal device 44 mounted on a square or rectangular substrate 43 is screwed at the four corners of the substrate 43 with the side surface of the substrate 43 facing down. , Is supposed to hold fixed. Note that the substrate 43 may be fixed by changing its orientation as indicated by an arrow in FIG.

  The holding jig 17-2 in FIG. 4 is, for example, a rectangular or square plate having a bottom surface with a sharp tip, and the tip of the wire 21 is connected to the fixing ring 17b in the center with the tip down. Used as described above. In the holding jig 17-2, the crystal device 44 mounted on the substrate 43 similar to the above is fixed and held by screwing the four corners of the substrate 43 in a horizontal state. .

As described above, the holding jig 17-1 in FIG. 3 and the holding jig 17-2 in FIG. 4 can give a drop impact from different directions to the crystal device mounted on the substrate 43. is there.
Correspondingly, in the test apparatus 10, the distance L1 is changed by moving the first moving slider 15 in FIG. 1 in the direction of arrow F, and as shown in FIGS. The tool 17-1 and the holding jig 17-2 in FIG. 4 can be adjusted so as to have the same drop distance.

FIG. 7 is a block diagram showing an outline of an electrical configuration for controlling the test apparatus 10.
The control unit 41 uses, for example, a computer composed of a CPU (central processing unit) and necessary storage means (memory), an input / output device such as a keyboard and a display, or a processing circuit incorporating a predetermined sequence. Composed.
The control unit 41 is connected to the wire presser cylinder 32, the presser upper limit (limit) switch 34, the presser lower limit (limit) switch 35, the first moving slider 15 and the like described with reference to FIG. Level holding means and level holding / adjusting means as adjusting means for changing and adjusting the level are configured.

  Further, the control unit 41 is connected to the second moving slider 18, the moving lower limit switch 26, and the moving upper limit switch 27, and these constitute the (wire) feeding and withdrawal means of the test apparatus 10. Furthermore, a rebound prevention cylinder 33 and a necessary timer 47 are connected to the control unit 41, and these constitute a rebound prevention means 48 of the test apparatus 10.

  Further, the power source unit 25, various switches 42 on the operation panel, a counter 49 for measuring the number of drop inspections, and a memory 46 as necessary storage means are connected to the control unit 41. The memory 46 includes a part of a storage device that constitutes the control unit 41, and stores software corresponding to the inspection step and provides a necessary work area for the control unit 41.

The test apparatus 10 of the present embodiment is configured as described above. Next, an example of the operation will be described with reference to the flowchart of FIG.
First, the crystal device 44 and the substrate 43 which are the workpieces described in FIG. 3 are fixed to the holding jig 17-1. Further, the holding jig 17-1 is tied and fixed to the tip of the wire 21 (ST1).
An operator (not shown) turns on the start switch of the test apparatus 10 to start inspection. As a result, in FIG. 1, when the second moving slider 18 descends and moves to the position E (ST2), the movement lower limit switch 26 is turned on (ST3). In this state, the wire 21 is pulled back and is in a position in contact with the contact surface of the moving arm 16 as shown by the dotted line in FIG.

Receiving the ON signal of the movement lower limit switch 26, the control unit 41 drives the wire presser cylinder 32, and the presser arm 32a is lowered (ST4), whereby the presser lower limit switch 35 is turned on (ST5). . In this state, the wire 21 is pinched by the function of the wire holding cylinder 32 and cannot move in the feeding direction.
In response to the ON signal of the presser lower limit switch 35, the control unit 41 drives and raises the second moving slider 18 (ST6), and when the second moving slider 18 reaches the position D, the moving upper limit switch 27 Is turned on (ST7). In this state, the wire 21 has a sufficient slack, that is, a slack of the wire 21 up to a distance at which the holding jig 17-1 can naturally fall until it collides with the target 12.

In response to the ON signal of the movement upper limit switch 27, the control unit 41 drives the wire presser cylinder 32, the presser arm 32a rises (ST8), and the presser upper limit switch 34 turns on (ST9).
The wire 21 to which the holding jig 17-1 is fixed simultaneously with the above-described ST8 is released by the weight of the holding jig 17-1 because the holding by the wire holding cylinder 32 is released (ST10) and collides with the target 12. (ST11). Thereby, an impact is given to the quartz crystal device 44 which is a work fixed to the holding jig 17-1 from the side surface.

  On the other hand, when the control unit 41 receives an ON signal of the presser upper limit switch 34 in ST9, the control unit 41 starts timing by the timer 47 (ST12), and the timer 47 finishes counting the preset time. When this is notified to the control unit 41, the control unit 41 immediately issues a command to the rebound prevention cylinder 33, the presser arm 33a descends (ST13), and the wire rod 21 is pulled back instantaneously. It is prevented that the holding jig 17-1 that collided with bounces back and further falls again and collides with the target 12 again or again. Thereafter, the control unit 41 issues a command to the rebound prevention cylinder 33, and the presser arm 33a is raised (ST14).

Next, the set number of times is checked to check whether or not the above drop impact test is repeated (ST15), the effective number of inspections is added to the counter 49 (ST16), and if there is a repeat setting, the counter 49 is set. The process returns to ST2 to repeat until the number of times is reached, and if there is no repeat setting in advance, the process ends.
As described above, according to the test apparatus 10 of the present embodiment, a workpiece such as an electronic component as an inspection target is fixed to the holding jig 17, and the holding jig 17 is suspended by the flexible wire 21. Since the means 15 for holding this at a constant height is provided, the holding jig 17 determines the height precisely and is naturally dropped.

In particular, since the holding jig 17 is suspended by the flexible wire 21 and is not dropped without a track, it is dropped while being held by the drawn-out wire 21 by the wire feeding means 38 (18). It always collides with the same part of the target 12 without falling to a particular part. For this reason, it is possible to examine the impact of a natural drop on a plurality of workpieces under the same conditions.
Thus, it is possible to provide a drop impact test apparatus capable of accurately performing a natural drop impact test such as dropping from a certain height every time under the same conditions and dropping precisely to the same location.

The present invention is not limited to the above-described embodiment.
The electronic component to be inspected according to the present invention is not limited to a crystal device, but can inspect any electrical or electronic component in which the drop impact characteristic is a problem.
A part of the conditions and configurations of the above-described embodiment may be omitted as appropriate, or may be combined with other configurations not mentioned.

The schematic block diagram which shows the whole structure of the drop impact test apparatus which concerns on embodiment of this invention. The figure of the linear guide of the drop impact test apparatus of FIG. The figure of the holding jig of the drop impact test apparatus of FIG. The figure of the holding jig of the drop impact test apparatus of FIG. The figure of the fixed slider of the drop impact test apparatus of FIG. The figure of the fixed slider of the drop impact test apparatus of FIG. The block diagram which shows an example of the electrical constitution of the drop impact test apparatus of FIG. The flowchart which shows an example of operation | movement of the drop impact test apparatus of FIG.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 10 ... Drop impact test apparatus, 11 ... Base, 12 ... Target, 13 ... Support | pillar part, 15 ... 1st moving slider, 16 ... Moving arm, 17 ... Holding jig, 18 ... second moving slider, 19 ... fixed slider, 20 ... fixed slider, 21 ... wire rod, 37 ... level holding / adjusting means, 38 ... feeding and Pull-back means, 48 ... rebound prevention means

Claims (6)

An apparatus for inspecting the drop impact characteristics of a workpiece to be inspected,
A holding jig for holding the workpiece;
A flexible wire for suspending the holding jig;
Means for holding the holding jig supported by the wire at a certain height;
A drop impact test apparatus comprising: means for dropping the holding jig from the fixed height and feeding the wire in response to the drop.   The drop impact test apparatus according to claim 1, further comprising pull-back means for pulling back the wire and repeatedly returning the holding jig to the same height.   The drop impact test apparatus according to claim 1, further comprising a rebound preventing unit that applies tension to the wire in a predetermined time after the holding jig is dropped.   4. The pull-back means has a folded portion in which the extending direction of the wire reciprocates and is opposite to each other, and the folded portion is configured to move along a linear guide. Crab drop impact test device.   A drop start height in which a plurality of types of holding jigs are fixed to the wire to hold the workpiece to be inspected in different postures, and the drop height is changed according to the type of holding jig. 5. A drop impact test apparatus according to claim 1, further comprising a changing means.   6. The drop impact test apparatus according to claim 1, further comprising a swing regulation guide portion for preventing the wire rod extending long from swinging in the horizontal direction.

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