JP2006521006A - 直交加速飛行時間型質量分析のための新規な電子イオン化源 - Google Patents

直交加速飛行時間型質量分析のための新規な電子イオン化源 Download PDF

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Publication number
JP2006521006A
JP2006521006A JP2006509064A JP2006509064A JP2006521006A JP 2006521006 A JP2006521006 A JP 2006521006A JP 2006509064 A JP2006509064 A JP 2006509064A JP 2006509064 A JP2006509064 A JP 2006509064A JP 2006521006 A JP2006521006 A JP 2006521006A
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Prior art keywords
ion
magnetic field
ions
electron
source
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Japanese (ja)
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JP2006521006A5 (enExample
Inventor
リー，ミルトン
ユエ，ビンファン
リー，エドガー・ディー
ロックウッド，アラン・エル
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Brigham Young University
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Brigham Young University
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Publication of JP2006521006A publication Critical patent/JP2006521006A/ja
Publication of JP2006521006A5 publication Critical patent/JP2006521006A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2006509064A 2003-03-03 2004-03-03 直交加速飛行時間型質量分析のための新規な電子イオン化源 Pending JP2006521006A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US45190803P 2003-03-03 2003-03-03
PCT/US2004/006536 WO2004079765A2 (en) 2003-03-03 2004-03-03 Novel electro ionization source for orthogonal acceleration time-of-flight mass spectrometry

Publications (2)

Publication Number Publication Date
JP2006521006A true JP2006521006A (ja) 2006-09-14
JP2006521006A5 JP2006521006A5 (enExample) 2007-04-19

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ID=32962659

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006509064A Pending JP2006521006A (ja) 2003-03-03 2004-03-03 直交加速飛行時間型質量分析のための新規な電子イオン化源

Country Status (4)

Country Link
US (1) US7060987B2 (enExample)
EP (1) EP1602119A4 (enExample)
JP (1) JP2006521006A (enExample)
WO (1) WO2004079765A2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008090600A1 (ja) * 2007-01-23 2008-07-31 Shimadzu Corporation 質量分析装置
JP2025000593A (ja) * 2023-06-19 2025-01-07 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 軸方向イオン源

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004025262A1 (de) * 2004-05-19 2005-12-22 Bruker Daltonik Gmbh Massenspektrometer mit Ionenfragmentierung durch Elektroneneinfang
US6998622B1 (en) * 2004-11-17 2006-02-14 Agilent Technologies, Inc. On-axis electron impact ion source
JP4806214B2 (ja) * 2005-01-28 2011-11-02 株式会社日立ハイテクノロジーズ 電子捕獲解離反応装置
US7482582B2 (en) * 2005-05-27 2009-01-27 Ionwerks, Inc. Multi-beam ion mobility time-of-flight mass spectrometry with multi-channel data recording
GB0511083D0 (en) * 2005-05-31 2005-07-06 Thermo Finnigan Llc Multiple ion injection in mass spectrometry
CA2624926C (en) * 2005-10-11 2017-05-09 Leco Corporation Multi-reflecting time-of-flight mass spectrometer with orthogonal acceleration
US7459677B2 (en) * 2006-02-15 2008-12-02 Varian, Inc. Mass spectrometer for trace gas leak detection with suppression of undesired ions
US8207495B2 (en) * 2006-10-11 2012-06-26 Shimadzu Corporation Quadrupole mass spectrometer
GB0700735D0 (en) * 2007-01-15 2007-02-21 Micromass Ltd Mass spectrometer
US20100123073A1 (en) * 2007-01-31 2010-05-20 University Of Manitoba Electron capture dissociation in a mass spectrometer
US8003935B2 (en) * 2007-10-10 2011-08-23 Mks Instruments, Inc. Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole mass spectrometer
US8003936B2 (en) * 2007-10-10 2011-08-23 Mks Instruments, Inc. Chemical ionization reaction or proton transfer reaction mass spectrometry with a time-of-flight mass spectrometer
US8334505B2 (en) 2007-10-10 2012-12-18 Mks Instruments, Inc. Chemical ionization reaction or proton transfer reaction mass spectrometry
GB2454241B (en) * 2007-11-02 2009-12-23 Microsaic Systems Ltd A mounting arrangement
JP5425798B2 (ja) * 2007-11-06 2014-02-26 ジ アリゾナ ボード オブ リージェンツ オン ビハーフ オブ ザ ユニバーシティ オブ アリゾナ ガス中の蒸気としての化合物を分析するための高感度イオン検出装置及び方法
GB2454508B (en) * 2007-11-09 2010-04-28 Microsaic Systems Ltd Electrode structures
JP5523457B2 (ja) * 2008-07-28 2014-06-18 レコ コーポレイション 無線周波数電場内でメッシュを使用してイオン操作を行う方法及び装置
GB0907619D0 (en) * 2009-05-01 2009-06-10 Shimadzu Res Lab Europe Ltd Ion analysis apparatus and method of use
US8525106B2 (en) * 2011-05-09 2013-09-03 Bruker Daltonics, Inc. Method and apparatus for transmitting ions in a mass spectrometer maintained in a sub-atmospheric pressure regime
JP5813536B2 (ja) 2012-03-02 2015-11-17 株式会社東芝 イオン源
US10840073B2 (en) * 2012-05-18 2020-11-17 Thermo Fisher Scientific (Bremen) Gmbh Methods and apparatus for obtaining enhanced mass spectrometric data
CA2912998A1 (en) 2013-05-30 2014-12-04 Dh Technologies Development Pte. Ltd. Inline ion reaction device cell and method of operation
US9117617B2 (en) 2013-06-24 2015-08-25 Agilent Technologies, Inc. Axial magnetic ion source and related ionization methods
GB2524614B (en) * 2013-12-24 2016-06-15 Waters Technologies Corp Ion optical element
EP3086882B1 (en) 2013-12-24 2021-05-26 Waters Technologies Corporation Atmospheric interface for electrically grounded electrospray
US10256087B2 (en) * 2014-08-05 2019-04-09 Dh Technologies Development Pte. Ltd. Band pass extraction from an ion trapping device and TOF mass spectrometer sensitivity enhancement
US10176977B2 (en) 2014-12-12 2019-01-08 Agilent Technologies, Inc. Ion source for soft electron ionization and related systems and methods
US10490396B1 (en) 2017-03-28 2019-11-26 Thermo Finnigan Llc Ion source with mixed magnets
EP3607576B8 (en) * 2017-04-03 2023-10-04 PerkinElmer U.S. LLC Ion transfer from electron ionization sources
RU179352U1 (ru) * 2017-10-24 2018-05-11 Федеральное государственное бюджетное учреждение "Институт теоретической и экспериментальной физики имени А.И. Алиханова Национального исследовательского центра "Курчатовский институт" Двухступенчатый источник многозарядных ионов с электронным циклотронным резонансом
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808949D0 (en) * 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them
US11145502B2 (en) 2019-12-19 2021-10-12 Thermo Finnigan Llc Emission current measurement for superior instrument-to-instrument repeatability
KR102132977B1 (ko) 2020-02-25 2020-07-14 영인에이스 주식회사 질량분석기

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61263039A (ja) * 1985-05-16 1986-11-21 Ryuichi Shimizu 質量分析計
JP2000516762A (ja) * 1996-08-09 2000-12-12 アナリチカ オブ ブランフォード，インコーポレーテッド イオン蓄積式飛行時間型質量分析計

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2737852C2 (de) * 1977-08-23 1982-04-22 Bruker - Franzen Analytik GmbH, 2800 Bremen Ionenquellen zur chemischen Ionisierung
DE4200235C1 (enExample) * 1992-01-08 1993-05-06 Hoffmeister, Helmut, Dr., 4400 Muenster, De
US5412207A (en) * 1993-10-07 1995-05-02 Marquette Electronics, Inc. Method and apparatus for analyzing a gas sample
US7019285B2 (en) * 1995-08-10 2006-03-28 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
US5942752A (en) * 1996-05-17 1999-08-24 Hewlett-Packard Company Higher pressure ion source for two dimensional radio-frequency quadrupole electric field for mass spectrometer
US6958472B2 (en) * 2001-03-22 2005-10-25 Syddansk Universitet Mass spectrometry methods using electron capture by ions

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61263039A (ja) * 1985-05-16 1986-11-21 Ryuichi Shimizu 質量分析計
JP2000516762A (ja) * 1996-08-09 2000-12-12 アナリチカ オブ ブランフォード，インコーポレーテッド イオン蓄積式飛行時間型質量分析計

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008090600A1 (ja) * 2007-01-23 2008-07-31 Shimadzu Corporation 質量分析装置
JP4947061B2 (ja) * 2007-01-23 2012-06-06 株式会社島津製作所 質量分析装置
US8299427B2 (en) 2007-01-23 2012-10-30 Shimadzu Corporation Mass spectrometer
JP2025000593A (ja) * 2023-06-19 2025-01-07 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 軸方向イオン源
JP7751694B2 (ja) 2023-06-19 2025-10-08 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 軸方向イオン源

Also Published As

Publication number Publication date
WO2004079765A3 (en) 2005-06-09
US20040238755A1 (en) 2004-12-02
WO2004079765A2 (en) 2004-09-16
EP1602119A2 (en) 2005-12-07
EP1602119A4 (en) 2010-05-12
US7060987B2 (en) 2006-06-13

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