JP2006518534A - 走査型電子顕微鏡のためのサンプルエンクロージャと、その使用法 - Google Patents

走査型電子顕微鏡のためのサンプルエンクロージャと、その使用法 Download PDF

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JP2006518534A
JP2006518534A JP2005515862A JP2005515862A JP2006518534A JP 2006518534 A JP2006518534 A JP 2006518534A JP 2005515862 A JP2005515862 A JP 2005515862A JP 2005515862 A JP2005515862 A JP 2005515862A JP 2006518534 A JP2006518534 A JP 2006518534A
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sample
enclosure
sem
membrane
sample container
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JP2005515862A
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JP2006518534A5 (enExample
Inventor
スプリンザク,デイヴッド
ネチュシタン,アモズ
ズィク,オリー
ギリーディ,オファー
カルニ,イフタ
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クアントミックス・リミテッド
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Priority claimed from PCT/IL2003/000454 external-priority patent/WO2003104846A2/en
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Priority claimed from PCT/IL2003/001054 external-priority patent/WO2004075209A1/en
Publication of JP2006518534A publication Critical patent/JP2006518534A/ja
Publication of JP2006518534A5 publication Critical patent/JP2006518534A5/ja
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JP2005515862A 2003-02-20 2003-12-10 走査型電子顕微鏡のためのサンプルエンクロージャと、その使用法 Pending JP2006518534A (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US44880803P 2003-02-20 2003-02-20
PCT/IL2003/000454 WO2003104846A2 (en) 2002-06-05 2003-06-01 A sample enclosure for a scanning electron microscope and methods of use thereof
PCT/IL2003/000457 WO2003104848A2 (en) 2002-06-05 2003-06-01 Methods for sem inspection of fluid containing samples
PCT/IL2003/001054 WO2004075209A1 (en) 2003-02-20 2003-12-10 A sample enclosure for a scanning electron microscope and methods of use thereof

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JP2006518534A true JP2006518534A (ja) 2006-08-10
JP2006518534A5 JP2006518534A5 (enExample) 2006-09-21

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008016249A (ja) * 2006-07-04 2008-01-24 Jeol Ltd 試料保持体、試料検査方法及び試料検査装置並びに試料検査システム
JP2008210765A (ja) * 2007-01-31 2008-09-11 Jeol Ltd 試料保持体、試料検査装置及び試料検査方法、並びに試料保持体の製造方法
JP2018137231A (ja) * 2018-03-23 2018-08-30 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材
JPWO2021256412A1 (enExample) * 2020-06-16 2021-12-23
US12265041B2 (en) 2019-10-10 2025-04-01 Hitachi High-Tech Corporation Thin film damage detection function and charged particle beam device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008016249A (ja) * 2006-07-04 2008-01-24 Jeol Ltd 試料保持体、試料検査方法及び試料検査装置並びに試料検査システム
JP2008210765A (ja) * 2007-01-31 2008-09-11 Jeol Ltd 試料保持体、試料検査装置及び試料検査方法、並びに試料保持体の製造方法
JP2018137231A (ja) * 2018-03-23 2018-08-30 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材
US12265041B2 (en) 2019-10-10 2025-04-01 Hitachi High-Tech Corporation Thin film damage detection function and charged particle beam device
JPWO2021256412A1 (enExample) * 2020-06-16 2021-12-23
JP7142404B2 (ja) 2020-06-16 2022-09-27 学校法人中部大学 走査型電子顕微鏡を用いた観察方法、及びそのための試料ホルダ

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