JP2006335787A - Pressure-sensitive adhesive sheet and method for producing electronic part - Google Patents

Pressure-sensitive adhesive sheet and method for producing electronic part Download PDF

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JP2006335787A
JP2006335787A JP2005158580A JP2005158580A JP2006335787A JP 2006335787 A JP2006335787 A JP 2006335787A JP 2005158580 A JP2005158580 A JP 2005158580A JP 2005158580 A JP2005158580 A JP 2005158580A JP 2006335787 A JP2006335787 A JP 2006335787A
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pressure
sensitive adhesive
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adhesive sheet
thickness
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JP4563257B2 (en
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Masanobu Kutsumi
正信 九津見
Koichi Taguchi
広一 田口
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Denka Co Ltd
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Denki Kagaku Kogyo KK
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Abstract

<P>PROBLEM TO BE SOLVED: To solve problems that the follow-up to bumps cannot be made and dimples (recessed parts of the back surface ground parts) corresponding to the bumps or cracks are formed to cause deterioration of thickness accuracy of a pressure-sensitive adhesive sheet or blocking during molding of a substrate of the pressure-sensitive adhesive sheet even if the follow-up can be made when an electronic member such as a semiconductor wafer having the bumps such as a circuit surface having unevennesses of ≥25 μm or solder balls is ground, etc. <P>SOLUTION: The pressure-sensitive adhesive sheet is obtained by laminating a reinforcing layer, a flexible layer, an intermediate layer and a pressure-sensitive adhesive layer in the order mentioned. The reinforcing layer has 40-90 Shore D hardness and 5-1,000 μm thickness and the flexible layer has 20-80 Shore A hardness and 50-1,000 μm thickness. The intermediate layer has 40-90 Shore D hardness and 5-100 μm thickness. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、粘着シート及び電子部品製造方法に係り、特に25μm以上の回路面やハンダボール等のバンプを有する半導体ウエハや電子部品の製造に供される粘着シート及び電子部品製造方法に関する。   The present invention relates to an adhesive sheet and an electronic component manufacturing method, and more particularly, to an adhesive sheet and an electronic component manufacturing method used for manufacturing a semiconductor wafer having a circuit surface of 25 μm or more and bumps such as solder balls and electronic components.

半導体チップの製造に用いられるウエハにはシリコンウエハ、ガリウム−砒素等があり、中でもシリコンウエハが多用されている。シリコンウエハは高純度の単結晶シリコンを厚さ500〜1000μm程度に薄くスライスすることにより製造されているが、近年50μm程度の回路付きウエハやウエハレベルCSP等に代表されるパッケージ化された100〜500μmのバンプ(ハンダボール等の凹凸)を有するウエハの需要が増えてきている。   There are silicon wafers, gallium arsenide, and the like as wafers used for manufacturing semiconductor chips, and among these, silicon wafers are frequently used. Silicon wafers are manufactured by slicing high-purity single crystal silicon thinly to a thickness of about 500 to 1000 μm. Recently, a packaged 100 to 100 typified by a wafer with a circuit of about 50 μm or a wafer level CSP is used. There is an increasing demand for wafers having bumps of 500 μm (unevenness such as solder balls).

特許文献1のように、シートの硬度と厚みを特定した粘着シートでは、25μmを超える凹凸を有する半導体ウエハに用いると、凹凸への追従性や応力緩和に耐えきれず、バンプに対応するディンプル(裏面研削部の凹み)が生じたり、割れが生じたりした。   As in Patent Document 1, the pressure-sensitive adhesive sheet in which the hardness and thickness of the sheet are specified, when used for a semiconductor wafer having irregularities exceeding 25 μm, can not withstand followability to irregularities and stress relaxation, and dimples corresponding to bumps ( A dent in the back grinding part) or a crack occurred.

特許文献2のJIS−A硬度10〜55の軟質基材にショアD硬度30〜50の基材を積層する手段では、25μm以上の凹凸を吸収できても、基材が軟質であるため粘着シートの厚み精度が悪く、基材成形時にブロッキングが生じていた。
特公平6−18190号公報 特開2000−8010号公報
In the means for laminating a substrate having a Shore D hardness of 30 to 50 on a soft substrate having a JIS-A hardness of 10 to 55 in Patent Document 2, even if the irregularities of 25 μm or more can be absorbed, the adhesive sheet is soft because the substrate is soft The thickness accuracy was poor, and blocking occurred during the molding of the substrate.
Japanese Patent Publication No. 6-18190 JP 2000-8010 A

本発明の課題は、25μm以上の回路面やハンダボール等のバンプを有する半導体ウエハ等の電子部材を研削すると、バンプに追従できず、バンプに対応するディンプル(裏面研削部の凹み)が生じたり、割れが生じたりし、追従できても粘着シートの厚み精度低下、粘着シートの基材成形時のブロッキングである。   An object of the present invention is that when an electronic member such as a semiconductor wafer having bumps such as a circuit surface of 25 μm or more and a solder ball is ground, dimples corresponding to the bumps (dents on the back surface grinding portion) are generated. Even if cracks occur and follow-up, the thickness accuracy of the pressure-sensitive adhesive sheet is lowered, and blocking is performed when the base material of the pressure-sensitive adhesive sheet is formed.

本願請求項1記載の発明は、補強層、軟質層、中間層、粘着剤層の順に積層される粘着シートであって、補強層がショアD硬度40〜90且つ厚み5〜1000μmであり、軟質層がショアA硬度20〜80且つ厚み50〜1000μmであり、中間層がショアD硬度40〜90且つ厚み5〜100μmである粘着シートである。   The invention of claim 1 of the present application is a pressure-sensitive adhesive sheet that is laminated in the order of a reinforcing layer, a soft layer, an intermediate layer, and a pressure-sensitive adhesive layer, wherein the reinforcing layer has a Shore D hardness of 40 to 90 and a thickness of 5 to 1000 μm. The pressure-sensitive adhesive sheet has a layer having a Shore A hardness of 20 to 80 and a thickness of 50 to 1000 μm, and an intermediate layer having a Shore D hardness of 40 to 90 and a thickness of 5 to 100 μm.

本願請求項2記載の発明は、粘着剤層の厚みが3〜100μmである請求項1記載の粘着シートである。   Invention of Claim 2 of this application is the adhesive sheet of Claim 1 whose thickness of an adhesive layer is 3-100 micrometers.

本願請求項3記載の発明は、電子部品用である請求項1又は2記載の粘着シートである。   The invention according to claim 3 of the present application is the pressure-sensitive adhesive sheet according to claim 1 or 2 for electronic parts.

本願請求項4記載の発明は、表面に25〜500μmの突起がある電子部品の背面を研削して電子部品を製造する電子部品製造方法であって、電子部品の突起形成面と請求項1又は2記載の粘着シートの粘着層を貼り合わせ、電子部品の背面を研削する電子部品製造方法である。   Invention of Claim 4 of this application is an electronic component manufacturing method which manufactures an electronic component by grinding the back surface of the electronic component which has a protrusion of 25-500 micrometers on the surface, Comprising: The protrusion formation surface of an electronic component and Claim 1 or 2. An electronic component manufacturing method in which the adhesive layer of the adhesive sheet according to 2 is bonded and the back surface of the electronic component is ground.

本願請求項5記載の発明は、表面に25〜500μmの突起がある電子部品を複数個有する板状体を個々にダイシングする電子部品製造方法であって、電子部品の突起形成面と請求項1又は2記載の粘着シートの粘着層を貼り合わせ、電子部品を個々にダイシングする電子部品製造方法である。   The invention according to claim 5 of the present application is an electronic component manufacturing method for individually dicing a plate-like body having a plurality of electronic components each having a projection of 25 to 500 μm on the surface, wherein the projection forming surface of the electronic component and claim 1 are provided. Or it is the electronic component manufacturing method which bonds together the adhesive layer of the adhesive sheet of 2, and dices an electronic component individually.

本発明は、上記構成により、粘着シートの厚み精度が維持され、粘着シートの基材成形時のブロッキングも生じないし、25μm以上の回路面やハンダボール等のバンプを有する半導体ウエハ等の電子部材を研削しても、バンプに追従し、バンプに対応するディンプル(裏面研削部の凹み)や割れも生じない。   The present invention maintains the thickness accuracy of the pressure-sensitive adhesive sheet by the above-described configuration, does not cause blocking during molding of the base material of the pressure-sensitive adhesive sheet, and has an electronic member such as a semiconductor wafer having a circuit surface of 25 μm or more and a bump such as a solder ball. Even after grinding, the bumps follow the bumps, and dimples corresponding to the bumps (recessed portion dents) and cracks do not occur.

本発明において、補強層、軟質層、中間層、粘着剤層の順に積層される粘着シートであって、補強層がショアD硬度40〜90且つ厚み5〜1000μmであり、軟質層がショアA硬度20〜80且つ厚み50〜1000μmであり、中間層がショアD硬度40〜90且つ厚み5〜100μmである粘着シートとしたのは、単に硬度の低い基材と高い基材を積層したシートでは、本発明の課題を解決することはできず、もう一方の軟質基材側に比較的薄い基材(本願の中間層)を積層することによりバンプ追従が可能となり、25μm以上のバンプを有するウエハの裏面研削・ダイシングに用いても良好な結果を得ることを見出し、本発明に至った。   In the present invention, a pressure-sensitive adhesive sheet is laminated in the order of a reinforcing layer, a soft layer, an intermediate layer, and a pressure-sensitive adhesive layer, the reinforcing layer has a Shore D hardness of 40 to 90 and a thickness of 5 to 1000 μm, and the soft layer has a Shore A hardness. The pressure-sensitive adhesive sheet having a thickness of 20 to 80 and a thickness of 50 to 1000 μm and an intermediate layer having a Shore D hardness of 40 to 90 and a thickness of 5 to 100 μm is simply a sheet obtained by laminating a low hardness substrate and a high substrate. The problem of the present invention cannot be solved. By stacking a relatively thin substrate (intermediate layer of the present application) on the other soft substrate side, it becomes possible to follow the bump, and the wafer having a bump of 25 μm or more is obtained. The inventors have found that good results can be obtained even when used for back surface grinding and dicing, and have reached the present invention.

補強層のショアD硬度を40〜90にしたのは、あまりに硬すぎるとロール状での巻き取りが困難になり、あまりに柔らかすぎると研削時に歪みが発生しウエハが破損したりブロッキングによる影響で歩留まりが低下するからである。ショアD硬度とはASTM D−2240によるD型ショア硬度計を使用した値である。   The reason why the Shore D hardness of the reinforcing layer is 40 to 90 is that if it is too hard, winding in a roll shape becomes difficult, and if it is too soft, distortion occurs during grinding and the wafer is damaged or the yield is affected by blocking. This is because of a decrease. The Shore D hardness is a value using a D-type Shore hardness meter according to ASTM D-2240.

補強層の厚みを5〜1000μmにしたのは、あまりに薄いと補強層を積層した効果を発揮し得ず、あまりに厚いと研削時にかかる応力によりフィルムが歪みウエハにクラックが生じるためである。   The reason why the thickness of the reinforcing layer is 5 to 1000 μm is that if the layer is too thin, the effect of laminating the reinforcing layer cannot be exhibited. If the layer is too thick, the film is distorted by stress applied during grinding and cracks occur in the wafer.

補強層及び後述する中間層を形成する素材としては、ショアD硬度を上記範囲内とするものであれば従来公知の合成樹脂を適宜選択でき、具体的にはポリエチレンやポリプロピレンに代表されるポリオレフィン、ポリ塩化ビニル、ポリブテン、ポリブタジエン、エチレン−酢酸ビニル共重合体、エチレン−エチルアクリレート共重合体、ポリエチレンテレフタレート、ポリエチレンナフタレート、ポリスチレン、ポリカーボネート、ポリイミドがある。   As a material for forming the reinforcing layer and the intermediate layer described later, a conventionally known synthetic resin can be appropriately selected as long as the Shore D hardness is within the above range, specifically, a polyolefin represented by polyethylene or polypropylene, Examples include polyvinyl chloride, polybutene, polybutadiene, ethylene-vinyl acetate copolymer, ethylene-ethyl acrylate copolymer, polyethylene terephthalate, polyethylene naphthalate, polystyrene, polycarbonate, and polyimide.

軟質層のショアA硬度を20〜80にしたのは、あまりに低いと研削時の圧力により基材が歪みウエハ表面状態が悪化し破損を引き起こし、あまりに高いとバンプの応力を吸収・緩和できずディンプルや破損を引き起こすからであり、より好ましくは15〜50が良い。ショアA硬度とはASTM D−2240に規定されるA型ショア硬度計を使用した値である。   The reason why the shore A hardness of the soft layer is 20-80 is that if it is too low, the base material will be distorted by the pressure during grinding, causing the wafer surface to deteriorate and causing damage. If it is too high, the bump stress cannot be absorbed or alleviated. It is because it causes damage, and 15 to 50 is more preferable. The Shore A hardness is a value using an A-type Shore hardness meter defined in ASTM D-2240.

軟質層の厚みを10〜1000μmにしたのは、あまりに薄いとバンプの凹凸を吸収することができず、あまりに厚いと研削時にかかる応力により粘着シート全体が歪んでウエハにクラックを生じさせるためであり、好ましくは100〜500μmが良い。   The reason why the thickness of the soft layer is set to 10 to 1000 μm is that if it is too thin, bump irregularities cannot be absorbed, and if it is too thick, the entire pressure-sensitive adhesive sheet is distorted by the stress applied during grinding and causes cracks in the wafer. The thickness is preferably 100 to 500 μm.

軟質層として採用される素材は、ショアA硬度が上記値であれば従来公知の合成樹脂を適宜選択でき、具体的にはポリエチレンやポリプロピレンに代表されるポリオレフィン類、ポリ塩化ビニル、ポリブテン、ポリブタジエン、エチレン−酢酸ビニル共重合体、エチレン−エチルアクリレート共重合体がある。   As the material employed as the soft layer, a conventionally known synthetic resin can be appropriately selected as long as the Shore A hardness is the above value. Specifically, polyolefins represented by polyethylene and polypropylene, polyvinyl chloride, polybutene, polybutadiene, There are ethylene-vinyl acetate copolymer and ethylene-ethyl acrylate copolymer.

中間層の厚みを5〜100μmにしたのは、あまりに薄いとフィルムにピンホールが発生し製造困難になり、あまりに厚いと粘着シート全体のバンプ追従性を失い、ウエハにクラックを生じさせるためである。   The reason why the thickness of the intermediate layer is 5 to 100 μm is that if it is too thin, pinholes are generated in the film, which makes it difficult to manufacture, and if it is too thick, bump followability of the entire adhesive sheet is lost and cracks occur in the wafer. .

補強層、軟質層、中間層で形成されるシートは、後述する粘着剤層が紫外線硬化型粘着剤の場合には、シート自体を通過させて紫外線を粘着剤層に届かせる必要があるため、紫外線透過性のものでなければならない。シート自体は、後述する粘着剤層が加熱硬化型粘着剤や加熱発泡型粘着剤の場合には、加熱時に使用される温度より高い温度の融点を有していなければならない。   When the adhesive layer described later is an ultraviolet curable adhesive, the sheet formed of the reinforcing layer, the soft layer, and the intermediate layer needs to allow the ultraviolet rays to reach the adhesive layer through the sheet itself. Must be UV transmissive. In the case where the pressure-sensitive adhesive layer described later is a thermosetting pressure-sensitive adhesive or a heat-foaming pressure-sensitive adhesive, the sheet itself must have a melting point that is higher than the temperature used during heating.

粘着剤層は、一般感圧型粘着剤、紫外線硬化型粘着剤、加熱硬化型粘着剤等を用いることができる。一般感圧型粘着剤としてはアクリル系、ゴム系、シリコン系など従来公知の粘着剤が用いられる。紫外線硬化型粘着剤は、一般感圧型粘着剤に硬化性化合物及び紫外線硬化開始剤を配合したものであり、紫外線の照射によりその粘着力を調整することができるものである。加熱硬化型粘着剤は、一般感圧型粘着剤に硬化性化合物及び加熱硬化開始剤を配合したものであり、加熱することによりその粘着力を調整することができるものである。   For the pressure-sensitive adhesive layer, a general pressure-sensitive pressure-sensitive adhesive, an ultraviolet curable pressure-sensitive adhesive, a heat-curable pressure-sensitive adhesive, or the like can be used. Conventional pressure-sensitive adhesives include conventionally known pressure-sensitive adhesives such as acrylic, rubber, and silicon. The ultraviolet curable pressure-sensitive adhesive is obtained by blending a curable compound and an ultraviolet curing initiator with a general pressure-sensitive pressure-sensitive adhesive, and the adhesive strength thereof can be adjusted by irradiation with ultraviolet rays. The heat-curable pressure-sensitive adhesive is a general pressure-sensitive pressure-sensitive adhesive blended with a curable compound and a heat-curing initiator, and the adhesive strength can be adjusted by heating.

粘着剤層の厚みは、塗工性や作業性を考えると、3〜100μmの範囲が好ましい。   The thickness of the pressure-sensitive adhesive layer is preferably in the range of 3 to 100 μm in view of coating property and workability.

本発明にかかる粘着シートは、必要に応じて、上記ウエハ粘着剤層の粘着面にポリエチレンラミネート紙、剥離処理プラスチックフィルム等の剥離紙又は剥離シートを密着させて保存することができる。   The pressure-sensitive adhesive sheet according to the present invention can be stored by bringing a release paper or a release sheet such as polyethylene laminated paper or a release-treated plastic film into close contact with the pressure-sensitive adhesive surface of the wafer pressure-sensitive adhesive layer as necessary.

本発明に係るシートの製造方法は、従来公知のTダイ共押出法、インフレーション共押出法、カレンダー押出法等により形成するほか、単層のフィルムに粘着剤を塗工しラミネートさせる方法等さまざまな方法を用いることができる。   The sheet manufacturing method according to the present invention may be formed by a conventionally known T-die coextrusion method, inflation coextrusion method, calender extrusion method, or the like, and various methods such as a method of applying an adhesive to a single layer film and laminating it. The method can be used.

本発明に係るシートの製造は、従来公知のTダイ共押出法、インフレーション共押出法、カレンダー押出法等により形成するほか、単層のフィルムに粘着剤を塗工しラミネートさせる方法等さまざまな方法を用いることができる。   The sheet according to the present invention can be produced by various methods such as a conventionally known T-die coextrusion method, inflation coextrusion method, calender extrusion method, etc., as well as a method of applying an adhesive to a single layer film and laminating it. Can be used.

上述する粘着シートの粘着剤層面を、表面に25〜500μmの突起がある電子部品の突起形成面と貼り合わせ、電子部品の背面(突起のない側の面)を研削機械によって研削し、薄い電子部品を製造することができる。   The pressure-sensitive adhesive layer surface of the above-mentioned pressure-sensitive adhesive sheet is bonded to the protrusion-forming surface of an electronic component having a protrusion of 25 to 500 μm on the surface, and the back surface (surface without the protrusion) of the electronic component is ground by a grinding machine. Parts can be manufactured.

上述する粘着シートの粘着剤層面を、表面に25〜500μmの突起がある電子部品の突起形成面と貼り合わせ、電子部品を個々にチップ化し、ダイシングし、チップ状であって、突起のある電子部品を製造することができる。   The above-mentioned pressure-sensitive adhesive sheet surface of the pressure-sensitive adhesive sheet is bonded to the protrusion-forming surface of an electronic component having a protrusion of 25 to 500 μm on the surface, and the electronic component is individually chipped, diced, chip-shaped, with a protrusion Parts can be manufactured.

本発明にかかる実施例を、表1を参照しつつ、比較例と対比しながら、詳細に説明する。 Examples according to the present invention will be described in detail with reference to Table 1 and in comparison with comparative examples.

Figure 2006335787
Figure 2006335787

実施例・比較例における評価は、次のように行った。   Evaluation in Examples and Comparative Examples was performed as follows.

表1の「フィルム成形性の評価」は、各実施例・各比較例の粘着シート上に目視にてピンホールなどの微細な穴がある場合又は粘着シートが硬すぎて巻き取りが困難な場合を「不可」、それ以外を「良」とした。   “Evaluation of film formability” in Table 1 indicates that there are fine holes such as pinholes on the adhesive sheet of each example and each comparative example, or the adhesive sheet is too hard to be wound. Was “impossible” and the others were “good”.

表1の「研削性の評価」は、各実施例・各比較例の粘着シート上に、直径5インチ、厚さ650μm、回路面のバンプ(ハンダボール)150μmの半導体ウエハをマウンター(株式会社タカトリ製マウンターATM−1100)にて貼り付け、半導体ウエハ裏面研削用シートをカッティングしてから研削機(株式会社ディスコ製バックグラインダーDFG−841)を用いてウエハの裏面を厚さが150μmになるまで研削し、研削後の半導体ウエハ表面のディンプル、クラックの発生状態を目視にて評価し、10枚中1枚でもクラック及びディンプルが発生したものには「不可」、それ以外を「良」とした。   “Evaluation of grindability” in Table 1 shows that a semiconductor wafer having a diameter of 5 inches, a thickness of 650 μm, and a bump (solder ball) of a circuit surface of 150 μm is mounted on a pressure-sensitive adhesive sheet of each example and each comparative example. After mounting the semiconductor wafer backside grinding sheet using a mounter ATM-1100), the backside of the wafer is ground to 150 μm using a grinding machine (Dogco's back grinder DFG-841). Then, the state of occurrence of dimples and cracks on the surface of the semiconductor wafer after grinding was visually evaluated, and “not acceptable” was given to those in which cracks and dimples were generated even in one of the 10 wafers, and “good” was designated otherwise.

実施例1にかかる粘着シートについて、説明する。実施例1にかかる粘着シートは、補強層、軟質層、中間層、粘着剤層の順で形成された粘着シートであり、補強層及び中間層は、エチレン−エチルアクリレート共重合体(三井・デュポンポリケミカル社製A−701、ショアD硬度50、厚さ25μm)で形成し、軟質層はエチレン−酢酸ビニル共重合体(三井・デュポンポリケミカル社製EV150、ショアA硬度68、厚さ200μm)で形成したものである。   The pressure-sensitive adhesive sheet according to Example 1 will be described. The pressure-sensitive adhesive sheet according to Example 1 is a pressure-sensitive adhesive sheet formed in the order of a reinforcing layer, a soft layer, an intermediate layer, and a pressure-sensitive adhesive layer. The reinforcing layer and the intermediate layer are made of an ethylene-ethyl acrylate copolymer (Mitsui DuPont). A-701 made by Polychemical Co., Shore D hardness 50, thickness 25 μm), and the soft layer is an ethylene-vinyl acetate copolymer (EV150, Mitsui-Dupont Polychemical Co., Shore A hardness 68, thickness 200 μm) It was formed by.

この三層のシートは、上記各合成樹脂をTダイ共押出法により成形したものである。   This three-layer sheet is formed by molding each of the above synthetic resins by a T-die coextrusion method.

この三層のシートへの粘着剤層積層方法は、次の方法によって行った。日本合成化学工業社製N−3330(100質量部)、日本ポリウレタン工業社製コロネートL−45(5質量部)を攪拌機にて1時間攪拌して均質化させた粘着剤を、コンマコーターによって、離型フィルムとしてのポリエチレンテレフタレートフィルム(厚さ38μm)の離型処理面に塗布し、塗布された粘着剤層を上述の三層のシートの中間層側に押圧して転写させて積層した。   The method for laminating the pressure-sensitive adhesive layer on the three-layer sheet was performed by the following method. By using a comma coater, N-3330 (100 parts by mass) manufactured by Nippon Synthetic Chemical Industry Co., Ltd. and Coronate L-45 (5 parts by mass) manufactured by Nippon Polyurethane Industry Co., Ltd. were stirred and homogenized with a stirrer for 1 hour. A polyethylene terephthalate film (thickness: 38 μm) as a release film was applied to the release treatment surface, and the applied adhesive layer was pressed and transferred to the intermediate layer side of the above three-layer sheet for lamination.

実施例2及び3の粘着シートにあっては、実施例1の粘着剤の厚みを表1に記載した値としたものであり、この厚み以外は、実施例1と同様にして構成し、製造したものである。   In the pressure-sensitive adhesive sheets of Examples 2 and 3, the thickness of the pressure-sensitive adhesive of Example 1 was set to the value described in Table 1. Except for this thickness, it was constructed in the same manner as in Example 1 and manufactured. It is a thing.

比較例1〜12の粘着シートにあっては、各層の硬度、厚みを表1に記載した値とした以外は、実施例1と同様にして、製造したものである。   The pressure-sensitive adhesive sheets of Comparative Examples 1 to 12 were produced in the same manner as in Example 1 except that the hardness and thickness of each layer were the values described in Table 1.

表1に示したように、実施例1は、研削性の評価ではディンプルやクラックの発生は認められず、フィルム成形性も良好で、使用可能な程度のものであった。実施例2及び3は、研削性の評価においてウエハの表面状態が若干悪いが使用可能な程度のものであった。   As shown in Table 1, in Example 1, the occurrence of dimples and cracks was not observed in the evaluation of grindability, the film formability was good, and the usable grade was satisfactory. In Examples 2 and 3, the surface condition of the wafer was slightly bad in the evaluation of grindability, but it was usable.

軟質層のショアA硬度の低い比較例1、ショアA硬度の高い比較例2では、研削時にクラックの発生が認められ研削性が悪かった。軟質層が薄い比較例3ではフィルム成形時にピンホールが発生しフィルム成形性が悪いと共にバンプ追従性も得られなかったためクラックが発生し研削性も悪かった。軟質層が厚い比較例4ではクラックが発生し研削性が悪かった。中間層のショアD硬度の低い比較例5ではクラックが発生し研削性が悪く、中間層のショアD硬度の高い比較例6ではフィルム成形性が悪く、研削時にクラックも発生し研削性も悪かった。中間層が薄い比較例7ではフィルム成形性が悪く、研削時にクラックが発生し研削性も悪く、中間層が厚い比較例8では研削時にクラックが発生し研削性が悪かった。補強層のショアD硬度の低い比較例9では、研削時にクラックが発生し研削性が悪く、補強層のショアD硬度の高い比較例10では研削性は良いがフィルム成形性が悪かった。補強層が薄い比較例11ではフィルム成形性が悪く研削時にクラックが発生し研削性も悪く、補強層が厚い比較例12では研削時にクラックが発生し研削性が悪かった。   In Comparative Example 1 in which the soft layer had a low Shore A hardness and Comparative Example 2 in which the Shore A hardness was high, cracks were observed during grinding and the grindability was poor. In Comparative Example 3 in which the soft layer was thin, pinholes were generated during film formation, and the film formability was poor and the bump following ability was not obtained, so cracks occurred and the grindability was also poor. In Comparative Example 4 where the soft layer was thick, cracks occurred and the grindability was poor. In Comparative Example 5 where the Shore D hardness of the intermediate layer was low, cracks occurred and the grindability was poor, and in Comparative Example 6 where the Shore D hardness of the intermediate layer was high, film formability was poor, cracks were generated during grinding and the grindability was also poor. . In Comparative Example 7 in which the intermediate layer was thin, the film formability was poor, cracks were generated during grinding and the grindability was poor, and in Comparative Example 8 in which the intermediate layer was thick, cracks were generated during grinding and the grindability was poor. In Comparative Example 9 where the Shore D hardness of the reinforcing layer was low, cracks occurred during grinding and the grindability was poor, and in Comparative Example 10 where the Shore D hardness of the reinforcing layer was high, the grindability was good but the film formability was poor. In Comparative Example 11 in which the reinforcing layer was thin, the film formability was poor and cracks were generated during grinding and the grindability was also poor. In Comparative Example 12 in which the reinforcing layer was thick, cracks were generated during grinding and the grindability was poor.

本発明は、粘着シート及び電子部品製造方法に係り、特に25μm以上の回路面やハンダボール等のバンプを有する半導体ウエハや電子部品の製造に供される粘着シート及び電子部品製造方法に関する。
The present invention relates to an adhesive sheet and an electronic component manufacturing method, and more particularly, to an adhesive sheet and an electronic component manufacturing method used for manufacturing a semiconductor wafer having a circuit surface of 25 μm or more and bumps such as solder balls and electronic components.

Claims (5)

補強層、軟質層、中間層、粘着剤層の順に積層される粘着シートであって、補強層がショアD硬度40〜90且つ厚み5〜1000μmであり、軟質層がショアA硬度20〜80且つ厚み50〜1000μmであり、中間層がショアD硬度40〜90且つ厚み5〜100μmである粘着シート。   A pressure-sensitive adhesive sheet laminated in the order of a reinforcing layer, a soft layer, an intermediate layer, and a pressure-sensitive adhesive layer, wherein the reinforcing layer has a Shore D hardness of 40 to 90 and a thickness of 5 to 1000 μm, and the soft layer has a Shore A hardness of 20 to 80 and A pressure-sensitive adhesive sheet having a thickness of 50 to 1000 μm and an intermediate layer having a Shore D hardness of 40 to 90 and a thickness of 5 to 100 μm. 粘着剤層の厚みが3〜100μmである請求項1記載の粘着シート。   The pressure-sensitive adhesive sheet according to claim 1, wherein the pressure-sensitive adhesive layer has a thickness of 3 to 100 µm. 電子部品用である請求項1又は2記載の粘着シート。   The pressure-sensitive adhesive sheet according to claim 1 or 2, which is used for electronic parts. 表面に25〜500μmの突起がある電子部品の背面を研削して電子部品を製造する電子部品製造方法であって、電子部品の突起形成面と請求項1又は2記載の粘着シートの粘着層を貼り合わせ、電子部品の背面を研削する電子部品製造方法。   An electronic component manufacturing method for manufacturing an electronic component by grinding a back surface of an electronic component having a projection of 25 to 500 μm on the surface, wherein the protrusion forming surface of the electronic component and the adhesive layer of the adhesive sheet according to claim 1 or 2 are provided. An electronic component manufacturing method for bonding and grinding the back surface of an electronic component. 表面に25〜500μmの突起がある電子部品を複数個有する板状体を個々にダイシングする電子部品製造方法であって、電子部品の突起形成面と請求項1又は2記載の粘着シートの粘着層を貼り合わせ、電子部品を個々にダイシングする電子部品製造方法。   3. An electronic component manufacturing method for individually dicing a plate-like body having a plurality of electronic components having a projection of 25 to 500 [mu] m on the surface, wherein the projection forming surface of the electronic component and the adhesive layer of the adhesive sheet according to claim 1 or 2 An electronic component manufacturing method in which the electronic components are individually diced together.
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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009206435A (en) * 2008-02-29 2009-09-10 Nitto Denko Corp Adhesive sheet for grinding back surface of semiconductor wafer and method for grinding back surface of semiconductor wafer using the same
KR20180038568A (en) * 2015-08-31 2018-04-16 칼 하인즈 프리바쎄르 Wafer processing methods and protective seating for use in this method
WO2018097036A1 (en) * 2016-11-25 2018-05-31 三井化学東セロ株式会社 Adhesive laminated film and method for producing electronic device
WO2020175363A1 (en) * 2019-02-26 2020-09-03 株式会社ディスコ Adhesive sheet for backgrinding and production method for semiconductor wafer
JP2020188215A (en) * 2019-05-17 2020-11-19 東レフィルム加工株式会社 Base material film for dicing sheet

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002226803A (en) * 2001-02-06 2002-08-14 Achilles Corp Base film for dicing
JP2004363139A (en) * 2003-06-02 2004-12-24 Denki Kagaku Kogyo Kk Adhesive sheet for grinding rear surface of semiconductor wafer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002226803A (en) * 2001-02-06 2002-08-14 Achilles Corp Base film for dicing
JP2004363139A (en) * 2003-06-02 2004-12-24 Denki Kagaku Kogyo Kk Adhesive sheet for grinding rear surface of semiconductor wafer

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JP2009206435A (en) * 2008-02-29 2009-09-10 Nitto Denko Corp Adhesive sheet for grinding back surface of semiconductor wafer and method for grinding back surface of semiconductor wafer using the same
TWI724020B (en) * 2015-08-31 2021-04-11 日商迪思科股份有限公司 Method of processing wafer and protective sheeting for use in this method
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CN108140609B (en) * 2015-08-31 2022-10-11 株式会社迪思科 Method for processing wafer and protective sheet used in the method
CN108140609A (en) * 2015-08-31 2018-06-08 卡尔·海因茨·普利瓦西尔 Handle the method for wafer and with protection sheet material in the method
JP2018526826A (en) * 2015-08-31 2018-09-13 プリーヴァッサー, カール ハインツPRIEWASSER, Karl Heinz Method for processing wafers and protective sheet for use in the method
US11437275B2 (en) 2015-08-31 2022-09-06 Disco Corporation Method of processing wafer and protective sheeting for use in this method
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US11453208B2 (en) 2016-11-25 2022-09-27 Mitsui Chemical Tohcello, Inc. Adhesive laminate film and method for manufacturing electronic device
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WO2020175363A1 (en) * 2019-02-26 2020-09-03 株式会社ディスコ Adhesive sheet for backgrinding and production method for semiconductor wafer
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