JP2006245287A - Inspection method of possibility of degradation failure occurrence in on-vehicle laser diode - Google Patents

Inspection method of possibility of degradation failure occurrence in on-vehicle laser diode Download PDF

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JP2006245287A
JP2006245287A JP2005058951A JP2005058951A JP2006245287A JP 2006245287 A JP2006245287 A JP 2006245287A JP 2005058951 A JP2005058951 A JP 2005058951A JP 2005058951 A JP2005058951 A JP 2005058951A JP 2006245287 A JP2006245287 A JP 2006245287A
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inspection
laser diode
temperature
current value
procedure
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Masaaki Hirose
正明 廣瀬
Hajime Oka
初 岡
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Denso Corp
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Denso Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspection method for removing a product with high probability that a degradation failure will occur in a stage before shipping. <P>SOLUTION: Time calculated from a life characteristic of a laser diode, a temperature confirmed from the life characteristic of the laser diode, and an inspection temperature which is set in a product operation guarantee temperature, are substituted for a formula of a mean failure interval. Inspection time is calculated corresponding to the inspection temperature which is set in the production operation guarantee temperature. An acceleration condition is set, and laser light emission from the laser diode is continued for inspection time after an acceleration condition is set, in a state where the laser diode is maintained in the inspection temperature after the acceleration condition is set. It is inspected whether a difference between a current value before inspection of current required for laser light mission just after the laser diode starts laser light emission, and a current value after inspection of current required for laser light emission just before laser light emission is terminated, is within a prescribed range where a regulated production operation can be guaranteed from the characteristic of the laser diode. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、例えば車載用DVDプレーヤに使用されている車載用レーザダイオードの劣化故障が発生する可能性を検査する方法に関する。   The present invention relates to a method for inspecting the possibility of a deterioration failure of an in-vehicle laser diode used in, for example, an in-vehicle DVD player.

レーザダイオードを製造する方法の一例として、例えば下記の特許文献1に示すものがある。
特開2003−229633号公報
As an example of a method for manufacturing a laser diode, for example, there is one shown in Patent Document 1 below.
JP 2003-229633 A

この種のレーザダイオードにおいては、常温の環境下でレーザダイオードがレーザを発光するのに必要な電流の電流値を測定し、その測定された電流値がレーザダイオードの特性から規定されている製品動作を保証し得る規定範囲内であるか否かを判定することにより、初期故障が発生しているか否かを検査していた。   In this type of laser diode, the current value of the current required for the laser diode to emit laser light in a room temperature environment is measured, and the measured current value is defined by the characteristics of the laser diode. Whether or not an initial failure has occurred has been examined by determining whether or not it is within a prescribed range that can guarantee the above.

ところで、例えば車載用DVDプレーヤに使用されている車載用レーザダイオードを想定すると、車載用であるが故に室内用のものと比較すると、振動が与えられたり高温下に長時間にわたって放置されたりするなど使用環境が厳しいという背景から、劣化故障についても検査する必要がある。しかしながら、従来では、劣化故障が発生する可能性を検査する有効な方法がなく、したがって、製品出荷前の段階では劣化故障が発生する可能性を判定することができず、十分な品質を確保することが困難なものであった。   By the way, assuming an in-vehicle laser diode used in an in-vehicle DVD player, for example, it is in-vehicle, so compared to an in-vehicle one, vibration is applied or it is left at a high temperature for a long time. Because of the harsh environment, it is necessary to inspect for degradation failures. However, in the past, there is no effective method for inspecting the possibility of occurrence of deterioration failure, and therefore it is not possible to determine the possibility of occurrence of deterioration failure at the stage before product shipment, thus ensuring sufficient quality. It was difficult.

本発明は、上記した事情に鑑みてなされたものであり、その目的は、劣化故障が発生する可能性が高い製品を製品出荷前の段階で排除することができ、十分な品質を確保することができる車載用レーザダイオードの劣化故障発生の可能性の検査方法を提供することにある。   The present invention has been made in view of the above-described circumstances, and the object thereof is to ensure that sufficient quality can be eliminated at the stage prior to product shipment of products that are likely to cause degradation failures. It is an object of the present invention to provide a method for inspecting the possibility of occurrence of a deterioration failure in a vehicle-mounted laser diode.

請求項1に記載した発明によれば、車載用レーザダイオードの寿命特性から算出された時間、車載用レーザダイオードの寿命特性から確認された温度及び製品動作保証温度に設定された検査温度を平均故障間隔の数式に代入し、製品動作保証温度に設定された検査温度に対応する検査時間を算出する第1の手順と、車載用レーザダイオードを前記検査温度に維持した状態で車載用レーザダイオードからのレーザ発光を前記検査時間にわたって継続させる第2の手順と、車載用レーザダイオードがレーザ発光を開始した直後でのレーザ発光に必要な電流の電流値を検査前電流値として測定する第3の手順と、車載用レーザダイオードがレーザ発光を終了する直前でのレーザ発光に必要な電流の電流値を検査後電流値として測定する第4の手順と、前記検査前電流値と前記検査後電流値との差を電流値変化量として算出する第5の手順と、前記電流値変化量が車載用レーザダイオードの特性から規定されている製品動作を保証し得る規定範囲内であるか否かを判定する第6の手順とを実行し、劣化故障が発生する可能性を検査する。   According to the first aspect of the present invention, the time calculated from the life characteristics of the in-vehicle laser diode, the temperature confirmed from the life characteristics of the in-vehicle laser diode, and the inspection temperature set to the product operation guarantee temperature are averaged. A first procedure for calculating an inspection time corresponding to the inspection temperature set as the product operation guarantee temperature by substituting into the formula of the interval, and from the in-vehicle laser diode while maintaining the in-vehicle laser diode at the inspection temperature. A second procedure for continuing laser emission over the inspection time, and a third procedure for measuring a current value of a current necessary for laser emission immediately after the vehicle-mounted laser diode starts laser emission as a pre-inspection current value; A fourth procedure for measuring a current value of a current necessary for laser light emission immediately before the on-vehicle laser diode finishes laser light emission as a post-inspection current value; A fifth procedure for calculating a difference between the pre-inspection current value and the post-inspection current value as a current value change amount, and guaranteeing a product operation in which the current value change amount is defined by the characteristics of the in-vehicle laser diode. And a sixth procedure for determining whether or not it is within the specified range to be obtained, and inspecting the possibility of the occurrence of a deterioration failure.

これにより、製品出荷前の段階で、車載用レーザダイオードがレーザ発光を開始した直後でのレーザ発光に必要な電流の検査前電流値とレーザ発光を終了する直前でのレーザ発光に必要な電流の検査後電流値との差が製品動作を保証し得る規定範囲内であるか否かを判定して劣化故障が発生する可能性を判定することができるので、劣化故障が発生する可能性が高い製品を製品出荷前の段階で排除することができ、十分な品質を確保することができる。   As a result, the current value before the inspection of the current required for laser emission immediately after the on-vehicle laser diode starts laser emission and the current required for laser emission immediately before the end of laser emission at the stage before product shipment. Since it is possible to determine whether or not the difference from the current value after the inspection is within a specified range that can guarantee the product operation, it is possible to determine the deterioration failure, so there is a high possibility that the deterioration failure will occur. Products can be eliminated at the stage before product shipment, and sufficient quality can be ensured.

請求項2に記載した発明によれば、検査時間を短縮することを目的として、前記第1の手順で製品動作保証温度に設定された検査温度を加速条件設定前の検査温度とすると共に前記第1の手順で算出された検査時間を加速条件設定前の検査時間とし、加速条件設定前の検査時間よりも短い時間を加速条件設定後の検査時間として設定すると共に検査時間と検査温度との関係から加速条件設定後の検査時間に対応する温度を加速条件設定後の検査温度として算出し、設定された加速条件設定後の検査時間と算出された加速条件設定後の検査温度とを用いて前記第2の手順から前記第6の手順までを実行する。   According to the second aspect of the invention, for the purpose of shortening the inspection time, the inspection temperature set as the product operation guarantee temperature in the first procedure is set as the inspection temperature before the acceleration condition setting and the first The inspection time calculated in step 1 is set as the inspection time before setting the acceleration conditions, and the time shorter than the inspection time before setting the acceleration conditions is set as the inspection time after setting the acceleration conditions, and the relationship between the inspection time and the inspection temperature. The temperature corresponding to the inspection time after setting the acceleration condition is calculated as the inspection temperature after setting the acceleration condition, and the inspection time after setting the acceleration condition and the inspection temperature after setting the acceleration condition are calculated as described above. The second procedure to the sixth procedure are executed.

これにより、加速条件設定前の検査時間よりも短い加速条件設定後の検査時間にしたがって検査することにより、単に加速条件設定前の検査時間にしたがって検査する場合よりも、検査時間(レーザ発光を継続させる時間)を短縮することができ、製品出荷するまでに要する全体の検査期間を短縮することができる。   As a result, by inspecting according to the inspection time after setting the acceleration condition, which is shorter than the inspection time before setting the acceleration condition, the inspection time (laser emission continues more than when inspecting according to the inspection time before setting the acceleration condition) The total inspection period required to ship the product can be shortened.

以下、本発明の一実施形態について、図面を参照して説明する。まず、図2は、車両に搭載可能な車載用DVDプレーヤの電気的な構成を機能ブロック図として示している。車載用DVDプレーヤ1は、信号処理IC2、ドライバIC3、フロントエンドプロセッサ(FEP)4、スピンドルモータ5、ターンテーブル6、光ピックアップ7及びステッピングモータ8を備えて構成されている。信号処理IC2は、通常のコンピュータとして機能するもので、CPU、RAM、ROM及びI/Oを接続するバスラインが設けられて構成されている。また、信号処理IC2は、データ転送方式の規格の一つである「ATAPI」の規格に準拠してホスト(ナビECU)9との間でデータ転送を行う。   Hereinafter, an embodiment of the present invention will be described with reference to the drawings. FIG. 2 is a functional block diagram showing the electrical configuration of an in-vehicle DVD player that can be mounted on a vehicle. The in-vehicle DVD player 1 includes a signal processing IC 2, a driver IC 3, a front end processor (FEP) 4, a spindle motor 5, a turntable 6, an optical pickup 7, and a stepping motor 8. The signal processing IC 2 functions as a normal computer, and is configured by providing a bus line for connecting a CPU, RAM, ROM, and I / O. Further, the signal processing IC 2 performs data transfer with the host (navigator ECU) 9 in accordance with the “ATAPI” standard which is one of the data transfer system standards.

ドライバIC2は、信号処理IC2から制御指令が入力されると、その入力された制御指令に基づいてスピンドルモータ5、光ピックアップ7及びステッピングモータ8の動作を制御する。スピンドルモータ5は、ドライバIC2から制御指令が入力されると、ディスク10がターンテーブル6に搭載されている状態であれば、その入力された制御指令に基づいてディスク10とターンテーブル6とを一体として所定の回転速度にしたがって回転させる。ステッピングモータ8は、ドライバIC2から制御指令が入力されると、その入力された制御指令に基づいてディスク10に対する光ピックアップ7の位置(レーザの照射位置)を変動させる。光ピックアップ7は、その内部にレーザダイオード(LD)11(本発明でいう車載用レーザダイオード)を有しており、ドライバIC2から制御指令が入力されると、レーザダイオード11からレーザを発光させる。   When a control command is input from the signal processing IC 2, the driver IC 2 controls operations of the spindle motor 5, the optical pickup 7, and the stepping motor 8 based on the input control command. When a control command is input from the driver IC 2, the spindle motor 5 integrates the disk 10 and the turntable 6 based on the input control command if the disk 10 is mounted on the turntable 6. And rotating according to a predetermined rotation speed. When a control command is input from the driver IC 2, the stepping motor 8 changes the position (laser irradiation position) of the optical pickup 7 with respect to the disk 10 based on the input control command. The optical pickup 7 has a laser diode (LD) 11 (vehicle-mounted laser diode in the present invention) inside, and emits a laser from the laser diode 11 when a control command is input from the driver IC 2.

この場合、レーザダイオード11から発光されたレーザは、反射板12により照射角度が変更された後に対物レンズ13から放出されてディスク10に照射される。そして、このようにしてレーザダイオード11から発光されたレーザがディスク10に照射されると、ディスク10に記録されているデータが光信号として読出され、その光信号は、レーザダイオード11で受光された後にフロントエンドプロセッサ4でアナログ信号に変換され、信号処理IC2でアナログ信号からデジタル信号に変換されてホスト9へ転送される。   In this case, the laser emitted from the laser diode 11 is emitted from the objective lens 13 after the irradiation angle is changed by the reflecting plate 12 and irradiated onto the disk 10. When the laser emitted from the laser diode 11 is irradiated onto the disk 10 in this way, the data recorded on the disk 10 is read as an optical signal, and the optical signal is received by the laser diode 11. Later, the signal is converted into an analog signal by the front end processor 4, converted from an analog signal to a digital signal by the signal processing IC 2, and transferred to the host 9.

ここで、レーザダイオード11の劣化故障が発生する可能性を検査する方法について、図1を参照して説明する。
最初に、製品動作保証温度を加速条件設定前の検査温度(T2)として設定し(ステップS1)、レーザダイオード11の寿命特性から算出された時間(t1)、レーザダイオード11の寿命特性から確認された温度(T1)及び加速条件設定前の検査温度(T2)を下記の平均故障間隔(MTTF)の数式に代入し、製品動作保証温度の検査温度に対応する検査時間を加速条件設定前の検査時間(t2)として算出する(ステップS2)。ここで、製品動作保証温度とは、製品の正常な動作を保証する最高温度であり、例えば「85℃」などである。
Here, a method for inspecting the possibility of the deterioration failure of the laser diode 11 will be described with reference to FIG.
First, the product operation guarantee temperature is set as the inspection temperature (T2) before the acceleration condition is set (step S1), and the time (t1) calculated from the life characteristics of the laser diode 11 is confirmed from the life characteristics of the laser diode 11. The inspection temperature (T1) and the inspection temperature (T2) before setting the acceleration condition are substituted into the following average failure interval (MTTF) formula, and the inspection time corresponding to the inspection temperature of the product operation guarantee temperature is inspected before the acceleration condition is set. Calculated as time (t2) (step S2). Here, the product operation guarantee temperature is a maximum temperature that guarantees normal operation of the product, and is, for example, “85 ° C.”.

t2/t1=exp[(1/T2−1/T1)*(Ea/K)]
Ea=2.54
K=8.62*10-5
次いで、レーザダイオード11の寿命特性に対して検査時間を何倍にするかを決定する(加速倍数を決定する)。つまり、このようにして算出された加速条件設定前の検査時間(t2)よりも短い時間を加速条件設定後の検査時間(t2´)として設定し(ステップS3)、検査時間と検査温度との関係から加速条件設定後の検査時間(t2´)に対応する加速条件設定後の検査温度(T2´)を算出する(ステップS4)。この場合、加速条件設定後の検査時間(t2´)とは、実際にレーザダイオード11からレーザを発光させる時間である。
t2 / t1 = exp [(1 / T2-1 / T1) * (Ea / K)]
Ea = 2.54
K = 8.62 * 10 −5
Next, it is determined how many times the inspection time is to be increased with respect to the lifetime characteristics of the laser diode 11 (an acceleration multiple is determined). That is, a time shorter than the inspection time (t2) before the acceleration condition setting calculated in this way is set as the inspection time (t2 ′) after the acceleration condition setting (step S3), and the inspection time and the inspection temperature are set. From the relationship, the inspection temperature (T2 ′) after setting the acceleration condition corresponding to the inspection time (t2 ′) after setting the acceleration condition is calculated (step S4). In this case, the inspection time (t2 ′) after setting the acceleration condition is the time for actually emitting the laser from the laser diode 11.

次いで、例えば車載用DVDプレーヤ1を加速条件設定後の検査温度(T2´)下に放置することにより、レーザダイオード11を加速条件設定後の検査温度(T2´)に維持し(ステップS5)、レーザダイオード11からのレーザ発光を開始する(エージングを開始する)(ステップS6)。このとき、レーザダイオード11がレーザ発光を開始した直後でのレーザ発光に必要な電流の電流値を検査前電流値(I1)として測定する(ステップS7)。   Next, for example, by leaving the in-vehicle DVD player 1 under the inspection temperature (T2 ′) after setting the acceleration condition, the laser diode 11 is maintained at the inspection temperature (T2 ′) after setting the acceleration condition (step S5). Laser light emission from the laser diode 11 is started (aging is started) (step S6). At this time, the current value of the current necessary for laser light emission immediately after the laser diode 11 starts laser light emission is measured as the pre-inspection current value (I1) (step S7).

次いで、レーザダイオード11からのレーザ発光を開始してから加速条件設定後の検査時間(t2´)が経過した後に(ステップS8にて「YES」)、レーザダイオード11がレーザ発光を終了する直前でのレーザ発光に必要な電流の電流値を検査後電流値(I2)として測定し(ステップS9)、レーザダイオード11からのレーザ発光を終了する(エージングを終了する)(ステップS10)。   Next, after the inspection time (t2 ′) after the acceleration conditions are set after the laser emission from the laser diode 11 is started (“YES” in step S8), immediately before the laser diode 11 finishes the laser emission. The current value of the current necessary for laser emission is measured as a post-inspection current value (I2) (step S9), and the laser emission from the laser diode 11 is terminated (aging is terminated) (step S10).

次いで、検査前電流値(I1)と検査後電流値(I2)との差を電流値変化量(ΔI)として算出し(ステップS11)、算出された電流値変化量(ΔI)がレーザダイオード11の特性から規定されている製品動作を保証し得る規定範囲内であるか否かを判定する(ステップS12)。そして、電流値変化量(ΔI)がレーザダイオード11の特性から規定されている製品動作を保証し得る規定範囲内であれば(ステップS12にて「YES」)、劣化故障が発生する可能性が低いと判定し(ステップS13)、これに対して、電流値変化量(ΔI)がレーザダイオード11の特性から規定されている製品動作を保証し得る規定範囲内でなければ(規定範囲外であれば)(ステップS12にて「NO」)、劣化故障が発生する可能性が高いと判定する(ステップS14)。   Next, the difference between the pre-inspection current value (I1) and the post-inspection current value (I2) is calculated as a current value change amount (ΔI) (step S11), and the calculated current value change amount (ΔI) is the laser diode 11 It is determined whether or not the product operation is within a specified range that can guarantee the product operation defined from the characteristics (step S12). If the amount of change in current value (ΔI) is within a specified range that can guarantee the product operation specified from the characteristics of the laser diode 11 (“YES” in step S12), there is a possibility that a degradation failure will occur. On the other hand, the current value change amount (ΔI) is not within the specified range that can guarantee the product operation specified from the characteristics of the laser diode 11 (if it is out of the specified range). ("NO" in step S12), it is determined that there is a high possibility that a degradation failure will occur (step S14).

以上に説明した一連の検査により、劣化故障が発生する可能性が低い製品と劣化故障が発生する可能性が高い製品とを分別することができ、製品を出荷するに際して劣化故障が発生する可能性が高い製品を排除することが可能となり、劣化故障が発生する可能性が低い製品のみを出荷することが可能となる。   Through the series of inspections described above, products that are unlikely to cause degradation failures can be separated from those that are likely to cause degradation failures, and degradation failures may occur when products are shipped. Therefore, it is possible to eliminate products with a high value, and it is possible to ship only products that are less likely to cause deterioration failures.

以上に説明したように本実施形態によれば、レーザダイオード11の寿命特性から算出された時間(t1)、レーザダイオード11の寿命特性から確認された温度(T1)及び製品動作保証温度に設定された検査温度(T2)を平均故障間隔の数式に代入し、製品動作保証温度に設定された検査温度(T2)に対応する検査時間(t2)を算出し、加速条件を設定し、レーザダイオード11を加速条件設定後の検査温度(T2´)に維持した状態でレーザダイオード11からのレーザ発光を加速条件設定後の検査時間(t2´)にわたって継続させ、レーザダイオード11がレーザ発光を開始した直後でのレーザ発光に必要な電流の検査前電流値(I1)とレーザ発光を終了する直前でのレーザ発光に必要な電流の検査後電流値(I2)との差である電流値変化量(ΔI)がレーザダイオード11の特性から規定されている製品動作を保証し得る規定範囲内であるか否かを判定し、劣化故障が発生する可能性を検査するようにした。   As described above, according to the present embodiment, the time (t1) calculated from the lifetime characteristics of the laser diode 11, the temperature (T1) confirmed from the lifetime characteristics of the laser diode 11, and the product operation guaranteed temperature are set. The inspection temperature (T2) is substituted into the average failure interval equation, the inspection time (t2) corresponding to the inspection temperature (T2) set as the product operation guarantee temperature is calculated, the acceleration condition is set, and the laser diode 11 Is maintained at the inspection temperature (T2 ′) after setting the acceleration condition, and laser light emission from the laser diode 11 is continued for the inspection time (t2 ′) after setting the acceleration condition, and immediately after the laser diode 11 starts laser light emission. The difference between the current value (I1) before inspection of the current necessary for laser emission at the current and the current value (I2) after inspection of the current necessary for laser emission immediately before the end of laser emission It is determined whether or not the current value change amount (ΔI) is within the specified range that can guarantee the product operation specified from the characteristics of the laser diode 11, and the possibility of the occurrence of the deterioration failure is inspected. did.

これにより、製品出荷前の段階で、レーザダイオード11がレーザ発光を開始した直後でのレーザ発光に必要な電流の検査前電流値(I1)とレーザ発光を終了する直前でのレーザ発光に必要な電流の検査後電流値(I2)との差が製品動作を保証し得る規定範囲内であるか否かを判定して劣化故障が発生する可能性を判定することができるので、劣化故障が発生する可能性が高い製品を製品出荷前の段階で排除することができ、十分な品質を確保することができる。   Thereby, in the stage before product shipment, the current value (I1) before inspection of the current necessary for laser light emission immediately after the laser diode 11 starts laser light emission and the laser light emission just before the laser light emission is finished. Deterioration failure occurs because it is possible to determine whether or not the difference from the current value (I2) after the current inspection is within a specified range in which product operation can be guaranteed, and the possibility of deterioration failure occurs. Products that are likely to be removed can be eliminated at the stage before product shipment, and sufficient quality can be ensured.

また、この場合は、検査時間を短縮することを目的として、加速条件を設定し、加速条件設定後の検査時間(t2´)にしたがって検査するようにしたので、単に加速条件設定前の検査時間(t2)にしたがって検査する場合よりも、検査時間(レーザ発光を継続させる時間)を短縮することができ、製品出荷するまでに要する全体の検査期間を短縮することができる。   In this case, the acceleration condition is set for the purpose of shortening the inspection time, and the inspection is performed according to the inspection time (t2 ') after the acceleration condition is set. Compared with the case of inspecting according to (t2), the inspection time (time for continuing laser emission) can be shortened, and the entire inspection period required until product shipment can be shortened.

本発明は、上記した実施形態にのみ限定されるものではなく、以下のように変形または拡張することができる。
検査期間に十分な余裕があれば、加速条件を設定することなく、加速条件設定前の検査時間(t2)にしたがって検査するようにしても良い。
The present invention is not limited to the above-described embodiment, and can be modified or expanded as follows.
If there is a sufficient margin in the inspection period, the inspection may be performed according to the inspection time (t2) before setting the acceleration condition without setting the acceleration condition.

本発明の一実施形態を示すものであって、検査の手順を示す図The figure which shows one Embodiment of this invention and shows the procedure of a test | inspection 車載用DVDプレーヤの電気的な構成を示す機能ブロック図Functional block diagram showing the electrical configuration of the in-vehicle DVD player

符号の説明Explanation of symbols

図面中、11はレーザダイオード(車載用レーザダイオード)である。

In the drawings, reference numeral 11 denotes a laser diode (vehicle-mounted laser diode).

Claims (2)

車載用レーザダイオードの寿命特性から算出された時間、車載用レーザダイオードの寿命特性から確認された温度及び製品動作保証温度に設定された検査温度を平均故障間隔の数式に代入し、製品動作保証温度に設定された検査温度に対応する検査時間を算出する第1の手順と、
車載用レーザダイオードを前記検査温度に維持した状態で車載用レーザダイオードからのレーザ発光を前記検査時間にわたって継続させる第2の手順と、
車載用レーザダイオードがレーザ発光を開始した直後でのレーザ発光に必要な電流の電流値を検査前電流値として測定する第3の手順と、
車載用レーザダイオードがレーザ発光を終了する直前でのレーザ発光に必要な電流の電流値を検査後電流値として測定する第4の手順と、
前記検査前電流値と前記検査後電流値との差を電流値変化量として算出する第5の手順と、
前記電流値変化量が車載用レーザダイオードの特性から規定されている製品動作を保証し得る規定範囲内であるか否かを判定する第6の手順とを実行し、
劣化故障が発生する可能性を検査することを特徴とする車載用レーザダイオードにおける劣化故障発生の可能性の検査方法。
Substitute the time calculated from the life characteristics of the in-vehicle laser diode, the temperature confirmed from the life characteristics of the in-vehicle laser diode, and the inspection temperature set as the product operation guarantee temperature into the formula for the average failure interval, and the product operation guarantee temperature A first procedure for calculating an inspection time corresponding to the inspection temperature set in
A second procedure for continuing laser emission from the in-vehicle laser diode over the inspection time while maintaining the in-vehicle laser diode at the inspection temperature;
A third procedure for measuring a current value of a current necessary for laser light emission immediately after the vehicle-mounted laser diode starts laser light emission as a pre-inspection current value;
A fourth procedure for measuring a current value of a current necessary for laser emission just before the in-vehicle laser diode finishes laser emission as a post-inspection current value;
A fifth procedure for calculating a difference between the pre-inspection current value and the post-inspection current value as a current value change amount;
Performing a sixth procedure for determining whether the amount of change in the current value is within a specified range that can guarantee the product operation specified from the characteristics of the in-vehicle laser diode;
A method for inspecting the possibility of occurrence of deterioration failure in an in-vehicle laser diode, characterized by inspecting the possibility of occurrence of deterioration failure.
検査時間を短縮することを目的として、前記第1の手順で製品動作保証温度に設定された検査温度を加速条件設定前の検査温度とすると共に前記第1の手順で算出された検査時間を加速条件設定前の検査時間とし、加速条件設定前の検査時間よりも短い時間を加速条件設定後の検査時間として設定すると共に検査時間と検査温度との関係から加速条件設定後の検査時間に対応する温度を加速条件設定後の検査温度として算出し、その設定された加速条件設定後の検査時間と当該算出された加速条件設定後の検査温度とを用いて前記第2の手順から前記第6の手順までを実行することを特徴とする請求項1に記載した車載用レーザダイオードにおける劣化故障発生の可能性の検査方法。

For the purpose of shortening the inspection time, the inspection temperature set as the product operation guarantee temperature in the first procedure is set as the inspection temperature before setting the acceleration condition, and the inspection time calculated in the first procedure is accelerated. Set the inspection time before setting the conditions, and set the time shorter than the inspection time before setting the acceleration conditions as the inspection time after setting the acceleration conditions, and correspond to the inspection time after setting the acceleration conditions from the relationship between the inspection time and the inspection temperature. The temperature is calculated as the inspection temperature after setting the acceleration condition, and the sixth procedure to the sixth step are performed using the set inspection time after setting the acceleration condition and the calculated inspection temperature after setting the acceleration condition. 2. The inspection method for the possibility of deterioration failure in an in-vehicle laser diode according to claim 1, wherein the procedure is executed.

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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02125484A (en) * 1988-11-04 1990-05-14 Matsushita Electric Ind Co Ltd Sorting method for propriety of semiconductor laser

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02125484A (en) * 1988-11-04 1990-05-14 Matsushita Electric Ind Co Ltd Sorting method for propriety of semiconductor laser

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