JP2006234384A - Strain gauge device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a strain gauge device improved in the measurement accuracy of strain quantity. <P>SOLUTION: In the strain gauge device provided with an insulation member 100 and a resistor 200 contacting with the insulation member 100, the resistor 200 has electric connection with a return pattern 111 going back and forth by turning at the both ends and the resistor control pattern 112 provided with holes C1 to C11 having no resistance and surrounded by resistors electrically connected with the return pattern 11. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a strain gauge device for measuring a strain amount generated in a strain generating member or the like.

  In general, a strain gauge device is used when measuring a strain amount of a strain generating member or the like generated by an external force.

  Here, a method of measuring a strain amount using a strain gauge device will be described with reference to FIG. As shown in FIG. 2A, for example, two strain gauge devices 22a, 22b and 22c, 22d are arranged on the illustrated upper surface 21a and the illustrated lower surface 21b of the strain generating member 21, respectively. And the bridge circuit 23 as shown in FIG.2 (b) is comprised using the strain gauge apparatuses 22a-22d arrange | positioned on the strain generating member 21. FIG. Here, the resistance values of the resistors provided in the strain gauge devices 22a to 22d are R1 to R4. An input circuit such as a power supply circuit 24 is connected between the points a and c, and an output circuit 25 is connected between the points b and d.

  In the bridge circuit 23 of FIG. 2B, when R1 = R2 and R3 = R4, and the external force is not applied to the strain generating member 21, the bridge circuit 23 is balanced, and the output between the ends e and f of the output circuit 25 is It is set to be zero.

  With the above configuration, when an external force is applied to the strain generating member 21 in FIG. 2A and the strain generating member 21 is distorted, the strain gauge devices 22a to 22d are deformed, and the magnitudes of the resistance values R1 to R4 change. To do. At this time, the balance of the bridge circuit 23 in FIG. 2B is lost, and a voltage is generated at both ends e and f of the output circuit 25. This voltage corresponds to the amount of strain generated in the strain generating member 21, and the strain amount of the strain generating member 21 is measured based on this magnitude.

  Here, a conventional strain gauge device will be described with reference to FIG. FIG. 3 shows only the patterned resistor portion.

  A common electrode pattern 30 is formed, for example, in the illustrated horizontal direction at the center in the illustrated vertical direction. The common electrode pattern 30 is provided with wide first and second wide patterns 30a and 30b at both left and right ends, and a narrow narrow pattern between the first wide pattern 30a and the second wide pattern 30b. 30c is provided. A first resistor 31 is formed above the common electrode pattern 30 and a second resistor 32 is formed below the common electrode pattern 30.

  The first resistor 31 is electrically connected to the first wide pattern 30a, folded back and forth on both upper and lower sides in the figure, and reciprocated a plurality of times in the obliquely upward direction in the figure, and the reciprocating pattern area 31a and the The external connection pattern region 31b is connected to an external circuit, for example, an input circuit such as a power supply.

  The second resistor 32 is electrically connected to the first wide pattern 30a, folded back on both upper and lower sides in the figure, and reciprocated a plurality of times in the diagonally downward direction in the figure, and the reciprocating pattern area 32a The external connection pattern region 32b is electrically connected and connected to an external circuit such as an input circuit such as a power source.

  The third resistor and the fourth resistor are also formed by the same method as the first resistor 31 and the second resistor 32.

  And the 1st resistor-the 4th resistor are joined to the up-and-down both sides of a strain generating member, as shown in Drawing 2 (a). Further, the first resistor to the fourth resistor are formed in a bridge circuit as shown in FIG. 2B, and an input circuit and an output circuit are further connected.

  A conventional strain gauge device is formed by attaching a resistor on an insulating member and patterning the resistor by etching or the like. At this time, as shown in FIG. 2B, when the bridge circuit 23 is constituted by four resistors R1 to R4, R1 = R2 and R3 = R4 are set so that the bridge circuit 23 is balanced. However, R1 = R2 and R3 = R4 may not be satisfied due to accuracy problems in the manufacturing process.

  In such a case, in the conventional strain gauge device, the shape is changed by, for example, removing a part of the resistor using an etching solution. However, the work is complicated, and it is difficult to adjust the resistance value.

  An object of the present invention is to provide a strain gauge device that solves the above-described drawbacks and that allows easy adjustment of the resistance value.

  The present invention relates to a strain gauge device comprising an insulating member and a resistor bonded and patterned to the insulating member, and a region of the resistor that is surrounded by the resistor and having no resistor. A resistance adjustment pattern is provided.

  According to the present invention, an adjustment pattern having a region without a resistor surrounded by a resistor is provided on a part of the patterned resistor. Therefore, for example, by cutting a resistor positioned between the edge of the adjustment pattern and the region without the resistor, the resistance value can be easily adjusted, and a strain gauge device with improved measurement accuracy is realized.

  An embodiment of the present invention will be described with reference to FIG. FIG. 1 shows the patterned resistor divided into two by a line segment B-B and divided into (a) and (b) in FIG.

  A resistor 200 is joined on the insulating member 100. The resistor 200 includes a common electrode pattern 10 formed in the horizontal direction at the center in the vertical direction in the figure, a first resistor 11 positioned above the common electrode pattern 10 in the figure, and a second resistor located below the common electrode pattern 10 in the figure. It consists of a resistor 12 and the like.

  The common electrode pattern 10 is provided with wide first to third wide patterns 101 to 103 at the left end, the center, and the right end. The width between the first wide pattern 101 and the second wide pattern 102 and the width between the second wide pattern 102 and the third wide pattern 103 are narrower than those of the first to third wide patterns 101 to 103. First and second narrow patterns 104 and 105 are provided. A first resistor 11 is formed above the common electrode pattern 10 and a second resistor 12 is formed below the common electrode pattern 10.

  The first resistor 11 is electrically connected to, for example, a reciprocating pattern 111 electrically connected to the first wide pattern 101, a resistance adjusting pattern 112 electrically connected to the reciprocating pattern 111, and the resistance adjusting pattern 112. And an external connection pattern 113 that is electrically connected to an external circuit such as an input circuit such as a power supply.

  The reciprocating pattern 111 is folded back, for example, in the vicinity along the first narrow pattern 104 as a lower side and approximately the same height as the upper end in the figure of the first wide pattern 101 as an upper side. It is formed into a shape.

  The resistance adjustment pattern 112 is provided with, for example, first to ninth adjustment regions a1 to a9. In the first adjustment region a1, for example, a part of the resistor is removed at the time of etching for patterning the resistor, and the resistor pattern portion forming the first adjustment region a1 is surrounded by the resistor. A region without a resistor, for example, an elliptical hole C1 through which the insulating member 100 is exposed is formed. In the second adjustment region a2, an elliptical hole C2 larger than the hole C1 and an elliptical hole C3 smaller than the hole C2 and larger than the hole C1 are formed. The holes C2 and C3 are arranged in a direction perpendicular to the length direction of the resistance adjustment pattern 112, that is, in the vertical direction in the drawing. The third adjustment region a3 is formed in the same pattern as the second adjustment region a2, and two holes C4 and C5 are provided.

  In the fourth adjustment region a4, one rectangular hole C6 larger than the holes C1 to C5 is formed. The fifth adjustment region a5 to the seventh adjustment region a7 are all formed in the same pattern as the fourth adjustment region a4, and one rectangular hole C7 to C9 is provided.

  In the eighth adjustment region a8, one hole C10 having a shape in which a plurality of, for example, three protruding holes are provided is formed in a substantially square hole portion. In this case, a thin resistor that is bent along the outside of the hole C10, for example, along three protruding holes, is formed. The ninth adjustment region a9 is formed in the same pattern as the eighth adjustment region a8.

  Further, for example, semicircular cutouts L1 to L9 are formed on the upper edge of the resistance adjustment pattern 112 for each of the adjustment regions a1 to a9. The notches L1 to L9 are provided on the same line as the holes C1 to C11 provided in each adjustment region, for example, in a direction perpendicular to the length direction of the resistance adjustment pattern 112, that is, in the vertical direction in the drawing.

  Further, at the lower edge of the resistance adjustment pattern 112 in the figure, elongated cuts M1 to M10 are provided at the start and boundary portions and the end of the adjustment regions a1 to a9, respectively. The cuts M1 to M10 extend, for example, to substantially the same positions as the upper ends of the holes of the adjustment regions a1 to a9. In this case, the width of the resistance adjustment pattern 112 is narrowed at the notches M1 to M10, and the resistance value of the resistor is increased.

  When the resistance value is adjusted with the above-described configuration, for example, the portions provided with reference numerals N1 to N11, for example, the resistors located around the holes C1 to C11 are cut. At this time, the shape of the resistor in the cut adjustment region changes. That is, the resistance value of the adjustment region where the resistor is cut changes, and the resistance value is adjusted. Moreover, since the width | variety is narrow by the semicircle-shaped notch L1-L9, a cutting operation becomes easy.

  In each of the adjustment regions a1 to a9, a plurality of types of holes having different hole sizes and shapes are formed. Accordingly, the amount of change in the resistance value differs depending on the location to be cut, and the location to be cut is appropriately selected depending on the magnitude of the resistance value to be adjusted. Further, for example, one place or a plurality of places are selected and cut in accordance with the size of adjusting the resistance value.

  Since the resistance adjustment pattern of the second resistor R2 is substantially line symmetric with the resistance adjustment pattern 111 of the first resistor R1 with respect to the common electrode pattern 10, overlapping description is omitted.

  In addition, when the first resistor 11 and the second resistor 12 are provided as described above and the resistance R1 of the first resistor 11 and the resistance R2 of the second resistor 12 are equal, the two resistors 11, Only one of the twelve resistors R1 and R2 may be adjusted, or both resistors R1 and R2 may be adjusted.

  In the above embodiment, the resistor is provided with the reciprocating pattern, but a pattern having a shape other than this can also be used.

  According to the above configuration, the resistance value provided in the strain gauge device can be easily adjusted, and a strain gauge device with improved measurement accuracy can be realized.

It is a top view explaining embodiment of this invention. It is a figure explaining the measuring method of distortion, (a) is a schematic perspective view of a strain gauge, (b) is a circuit diagram. It is a top view explaining a prior art example.

Explanation of symbols

DESCRIPTION OF SYMBOLS 100 ... Insulating member 200 ... Resistor 10 ... Common electrode pattern 11 ... 1st resistor 111 ... Reciprocating pattern 112 of 1st resistor ... Resistance adjustment pattern 113 of 1st resistor ... External connection pattern 113 of 1st resistor
12 ... 2nd resistor a1-a9 ... 1st-9th adjustment area C1-C11 ... hole

Claims (2)

  In a strain gauge device comprising an insulating member and a resistor bonded and patterned to the insulating member, a resistance adjustment pattern having a region having no resistor surrounded by a resistor at a part of the resistor A strain gauge device characterized by comprising:   The strain gauge device according to claim 1, wherein the region having no resistor has a plurality of types different in at least one of size and shape.

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