JP2006167824A - Polishing device and polishing method - Google Patents

Polishing device and polishing method Download PDF

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JP2006167824A
JP2006167824A JP2004360438A JP2004360438A JP2006167824A JP 2006167824 A JP2006167824 A JP 2006167824A JP 2004360438 A JP2004360438 A JP 2004360438A JP 2004360438 A JP2004360438 A JP 2004360438A JP 2006167824 A JP2006167824 A JP 2006167824A
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electrode
polished
polishing
contact
lead wire
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Hiroshi Furuya
浩 古屋
Shinichiro Ishizuka
真一郎 石塚
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a polishing device, achieving short processing time and small processing space, and dispensing with a solution hard to handle. <P>SOLUTION: This polishing device 1 includes: an electrolytic grinding vessel 2 storing an electrolyte 6; a first electrode 3; and a second electrode 4, wherein voltage is applied between the first electrode 3 and the second electrode 4, an electric current is applied between a part 101 to be polished of a material to be polished 100 where the first electrode 3 comes into contact and the second electrode 4 through the electrolyte 6, thereby polishing the part 101 to be polished. In this polishing device 1, the part 11 of the first electrode 3, which comes into contact with the part 101 to be polished is disposed in the electrolyte at least during the application of voltage. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は研磨装置および研磨方法に関し、特に、電解研磨装置および電解研磨方法に関する。   The present invention relates to a polishing apparatus and a polishing method, and more particularly, to an electrolytic polishing apparatus and an electrolytic polishing method.

金属の表面を研磨する方法の一つとして、化学研磨方法が知られている。化学研磨方法は、被研磨部分を過酸化水素等の化学研磨液に浸漬し、当該被研磨部分の表面を溶解させて研磨する(特許文献1)。
特開平1−272785号公報
A chemical polishing method is known as one method for polishing a metal surface. In the chemical polishing method, the portion to be polished is immersed in a chemical polishing solution such as hydrogen peroxide, and the surface of the portion to be polished is dissolved (Patent Document 1).
JP-A-1-272785

しかしながら、化学研磨方法は、被研磨物の表面を化学的に溶解させるため研磨処理に時間がかかり、加えて、研磨処理後に化学研磨液を完全に洗い流さねばならず洗浄処理にも時間がかかる。
また、化学研磨液として過酸化水素等の医薬用外劇物が用いられることが多く、取り扱いに危険が伴い、また廃液の処理も面倒である。
However, in the chemical polishing method, since the surface of the object to be polished is chemically dissolved, it takes time for the polishing process. In addition, the chemical polishing liquid must be completely washed away after the polishing process, and the cleaning process also takes time.
In addition, non-pharmaceutical deleterious substances such as hydrogen peroxide are often used as the chemical polishing liquid, which is dangerous to handle and the treatment of the waste liquid is troublesome.

本発明は、上記した課題に鑑み、研磨処理時間が短く、また取り扱いに危険が伴い廃液の処理が面倒な医薬用外劇物を使用する必要のない研磨装置および研磨方法を提供することを目的とする。   An object of the present invention is to provide a polishing apparatus and a polishing method in which the polishing time is short, the handling is dangerous, and there is no need to use an external medicinal product for waste liquid, which is troublesome to process. And

上記課題を解決するため、請求項1記載の本発明に係る研磨装置は、電解液を貯蔵する電解研磨槽と、第1の電極と、第2の電極とを備え、前記第1の電極と前記第2の電極との間に電圧を印加し、前記第1の電極に接触させた被研磨物の被研磨部分と、前記第2の電極との間に前記電解液を介して電流を流し、前記被研磨部分を研磨する研磨装置であって、前記第1の電極は、前記被研磨部分と接触する接触部分が、少なくとも前記電圧印加時、前記電解液中に配置されている構成を有する。   In order to solve the above problems, a polishing apparatus according to the present invention described in claim 1 includes an electrolytic polishing tank that stores an electrolytic solution, a first electrode, and a second electrode, and the first electrode, A voltage is applied between the second electrode and a current is allowed to flow between the portion to be polished and the second electrode in contact with the first electrode via the electrolytic solution. A polishing apparatus for polishing the portion to be polished, wherein the first electrode has a configuration in which a contact portion that is in contact with the portion to be polished is disposed in the electrolytic solution at least when the voltage is applied. .

請求項2記載の本発明に係る研磨装置は、請求項1記載の研磨装置において、前記第1の電極は、前記接触部分が前記電解研磨槽の貯蔵部内に収まるように前記電解研磨槽に取り付けられている構成を有する。
請求項3記載の本発明に係る研磨装置は、請求項1または2記載の研磨装置において、前記第1の電極は、前記接触部分を前記被研磨部分側へ弾発付勢する弾性部を備えている構成を有する。
A polishing apparatus according to a second aspect of the present invention is the polishing apparatus according to the first aspect, wherein the first electrode is attached to the electrolytic polishing tank so that the contact portion is accommodated in a storage part of the electrolytic polishing tank. It has the structure which is made.
A polishing apparatus according to a third aspect of the present invention is the polishing apparatus according to the first or second aspect, wherein the first electrode includes an elastic portion that elastically biases the contact portion toward the polished portion. It has the composition which is.

請求項4記載の本発明に係る研磨装置は、請求項3記載の研磨装置において、前記弾性部は、板ばね構造を有する構成を有する。
請求項5記載の本発明に係る研磨装置は、請求項2記載の研磨装置において、前記被研磨物を把持する把持手段と、前記把持部材を上下に移動させ、前記把持部材が把持した前記被研磨物の被研磨部分を前記第1の電極に接触させる移動手段と、前記把持部材を前記第1の電極側へ弾発付勢する弾性部材とを備えた被研磨物移動手段を備える構成を有する。
A polishing apparatus according to a fourth aspect of the present invention is the polishing apparatus according to the third aspect, wherein the elastic portion has a structure having a leaf spring structure.
A polishing apparatus according to a fifth aspect of the present invention is the polishing apparatus according to the second aspect, wherein the gripping means for gripping the workpiece and the gripping member are moved up and down so that the gripping member grips the gripping target. A configuration including a moving object moving means including a moving means for bringing a portion to be polished of the polishing object into contact with the first electrode, and an elastic member for elastically biasing the gripping member toward the first electrode. Have.

請求項6記載の本発明に係る研磨装置は、請求項1から5のいずれか1項に記載の研磨装置において、前記第1の電極は、少なくとも前記電解液に浸漬する部分がタングステンで形成されている構成を有する。
請求項7記載の本発明に係る研磨方法は、第1の電極、第2の電極および被研磨物の被研磨部分を、前記第1の電極と前記被研磨部分とが接触し、かつ、前記第1の電極の少なくとも一部、前記第2の電極の少なくとも一部および前記被研磨部分が電解液に浸漬した状態に配置する配置ステップと、前記第1の電極と前記第2の電極との間に電圧を印加し、前記第2の電極と前記被研磨部分との間に前記電解液を介して電流を流し、前記被研磨部分を研磨する研磨ステップとを含むことを特徴とする。
A polishing apparatus according to a sixth aspect of the present invention is the polishing apparatus according to any one of the first to fifth aspects, wherein at least a portion immersed in the electrolytic solution is formed of tungsten in the first electrode. It has the composition which is.
The polishing method according to the seventh aspect of the present invention is the polishing method of the first electrode, the second electrode, and the object to be polished, wherein the first electrode and the object to be polished are in contact with each other, and An arrangement step of disposing at least a part of the first electrode, at least a part of the second electrode, and the portion to be polished in an electrolytic solution; and the first electrode and the second electrode A polishing step of polishing the portion to be polished by applying a voltage between the second electrode and the portion to be polished to pass a current through the electrolytic solution.

請求項8記載の本発明に係る研磨方法は、請求項7記載の研磨方法において、前記配置ステップにおいて、前記第1の電極の少なくとも一部を予め前記電解液に浸漬しておき、前記第1の電極の浸漬部分に前記被研磨部分を接触させることを特徴とする。
請求項9記載の本発明に係る研磨方法は、請求項7または8記載の研磨方法において、前記第1の電極の前記被研磨部分との接触部分を、前記被研磨部分側へ弾発付勢させることを特徴とする。
The polishing method according to an eighth aspect of the present invention is the polishing method according to the seventh aspect, wherein in the placing step, at least a part of the first electrode is immersed in the electrolytic solution in advance. The portion to be polished is brought into contact with the immersed portion of the electrode.
A polishing method according to a ninth aspect of the present invention is the polishing method according to the seventh or eighth aspect, wherein the contact portion of the first electrode with the portion to be polished is elastically biased toward the portion to be polished. It is characterized by making it.

請求項10記載の本発明に係る研磨方法は、請求項7から9のいずれか1項に記載の研磨方法において、前記被研磨物は、冷陰極蛍光ランプであり、前記被研磨部分はリード線であることを特徴とする。   A polishing method according to a tenth aspect of the present invention is the polishing method according to any one of the seventh to ninth aspects, wherein the object to be polished is a cold cathode fluorescent lamp, and the portion to be polished is a lead wire. It is characterized by being.

請求項1記載の発明によれば、電気エネルギーが寄与する陽極的溶解によって被研磨部分を研磨するため、化学的溶解により研磨する化学研磨方法と比べて研磨処理時間が格段に短い。また、取り扱いに危険が伴うと共に廃液の処理が面倒な医薬用外劇物等を使用する必要もない。
請求項2記載の発明によれば、第1の電極の接触部分が電解研磨槽の貯蔵部内に収められているため、被研磨部分を電解液中に移動させるだけで、前記被研磨部分と前記接触部分とを接触させることができ、第1の電極を移動させるための手段が不要である。
According to the first aspect of the present invention, since the portion to be polished is polished by anodic dissolution contributed by electric energy, the polishing time is remarkably shorter than that of the chemical polishing method of polishing by chemical dissolution. Further, it is not necessary to use a deleterious substance for medical use that is dangerous in handling and has a troublesome treatment of the waste liquid.
According to invention of Claim 2, since the contact part of the 1st electrode is stored in the storage part of an electropolishing tank, only to move the to-be-polished part in electrolyte solution, the to-be-polished part and the above-mentioned The contact portion can be brought into contact, and means for moving the first electrode is unnecessary.

請求項3記載の発明によれば、被研磨部分を第1の電極に接触させたときの衝撃を弾性部で低減させることができ、被研磨物や被研磨部分が衝撃に弱い物性であっても、前記被研磨物や前記被研磨部分が破損しにくい。さらに、接触部分は、弾性部によって被研磨部分側に弾発付勢されているため、前記第1の電極と前記被研磨部分との接触状態を安定維持することができる。   According to the third aspect of the present invention, the impact when the part to be polished is brought into contact with the first electrode can be reduced by the elastic part, and the object to be polished and the part to be polished have physical properties that are weak against the shock. However, the object to be polished and the part to be polished are not easily damaged. Furthermore, since the contact portion is elastically biased toward the portion to be polished by the elastic portion, the contact state between the first electrode and the portion to be polished can be stably maintained.

請求項4記載の発明によれば、第1の電極を簡単な構造にすることができるため、低コスト化が図れ、メンテナンスも簡単である。
請求項5記載の発明によれば、被研磨部分を第1の電極に接触させたときの衝撃を弾性部材で低減させることができ、被研磨物や被研磨部分が衝撃に弱い物性であっても、前記被研磨物や前記被研磨部分が破損しにくい。さらに、接触部分は、弾性部材によって被研磨部分側に弾発付勢されているため、前記第1の電極と前記被研磨部分との接触状態を安定維持することができる。
According to the invention described in claim 4, since the first electrode can have a simple structure, the cost can be reduced and the maintenance is also simple.
According to the invention of claim 5, the impact when the part to be polished is brought into contact with the first electrode can be reduced by the elastic member, and the object to be polished and the part to be polished have physical properties that are weak against the impact. However, the object to be polished and the part to be polished are not easily damaged. Furthermore, since the contact portion is elastically biased toward the portion to be polished by the elastic member, the contact state between the first electrode and the portion to be polished can be stably maintained.

請求項6記載の発明によれば、第1の電極が研磨されにくく、部品交換回数の低減による低コスト化とメンテナンスの簡略化を図ることができる。
請求項7記載の発明によれば、電気エネルギーが寄与する陽極的溶解によって研磨するため、化学的溶解により研磨する化学研磨方法と比べて処理時間が格段に短い。また、取り扱いに危険が伴うと共に廃液の処理が面倒な医薬用外劇物を使用する必要もない。
According to the sixth aspect of the present invention, the first electrode is hardly polished, and the cost can be reduced and the maintenance can be simplified by reducing the number of parts replacement.
According to the seventh aspect of the invention, since the polishing is performed by anodic dissolution contributed by electric energy, the processing time is remarkably shorter than the chemical polishing method in which polishing is performed by chemical dissolution. Further, it is not necessary to use a non-medicinal deleterious substance that is dangerous to handle and has a troublesome treatment of the waste liquid.

請求項8記載の発明によれば、被研磨部分を移動させるだけで、前記被研磨部分と前記接触部分とを簡単に接触させることができる。
請求項9記載の発明によれば、被研磨部分を第1の電極に接触させたときの衝撃を弾性部材で低減させることができ、被研磨物や被研磨部分が破損しにくい。さらに、第1の電極と被研磨部分との接触状態を安定維持することができる。
According to the eighth aspect of the present invention, the polished portion and the contact portion can be easily brought into contact only by moving the polished portion.
According to the ninth aspect of the invention, the impact when the part to be polished is brought into contact with the first electrode can be reduced by the elastic member, and the object to be polished and the part to be polished are not easily damaged. Furthermore, the contact state between the first electrode and the portion to be polished can be stably maintained.

請求項10記載の発明によれば、冷陰極蛍光ランプのリード線の研磨に特有の問題を解決することができる。これについての詳細は後述する。   According to the invention of the tenth aspect, problems peculiar to the polishing of the lead wire of the cold cathode fluorescent lamp can be solved. Details of this will be described later.

以下、本発明の実施の形態に係る研磨装置および研磨方法について、図面を参照しながら説明する。
第1〜第4の実施形態に係る研磨装置および研磨方法は、被研磨物を陽極側にして陰極との間に電解液を介して電流を流し、前記被研磨物の表面を陽極酸化させ研磨効果を得る、いわゆる電解研磨装置および電解研磨方法である。
Hereinafter, a polishing apparatus and a polishing method according to embodiments of the present invention will be described with reference to the drawings.
In the polishing apparatus and the polishing method according to the first to fourth embodiments, the object to be polished is on the anode side, an electric current is passed between the cathode and the cathode, and the surface of the object to be polished is anodized and polished. This is a so-called electropolishing apparatus and electropolishing method that achieve an effect.

<第1実施形態>
(電解研磨装置の説明)
図1は、第1の実施の形態に係る電解研磨装置を示す概略図である。電解研磨装置1は、電解研磨槽2、第1の電極3、および、第2の電極4を備える。
電解研磨槽2は、上面に開口を有する箱形形状であって、材質は、塩化ビニルである。電解研磨槽2は、内部が貯蔵部5となっており、この貯蔵部5には、電解液6として、40重量%のリン酸を含有するのリン酸水溶液が貯蔵される。
<First Embodiment>
(Description of electropolishing equipment)
FIG. 1 is a schematic view showing an electropolishing apparatus according to the first embodiment. The electropolishing apparatus 1 includes an electropolishing tank 2, a first electrode 3, and a second electrode 4.
The electrolytic polishing tank 2 has a box shape having an opening on the upper surface, and the material thereof is vinyl chloride. The electrolytic polishing tank 2 has a storage part 5 inside, and the storage part 5 stores an aqueous phosphoric acid solution containing 40% by weight of phosphoric acid as the electrolytic solution 6.

なお、リン酸水溶液の濃度は40重量%に限定されないが、研磨処理の時間を短くするためには、リン酸水溶液の濃度が30〜50重量%であることが好ましい。また、電解液6は、リン酸水溶液に限定されず、電解研磨で使用される公知の電解液を適宜選択して使用することができる。例えば、硫酸水溶液や硝酸水溶液等が挙げられる。但し、リン酸水溶液は、医薬用外劇物適用外であるリン酸を使用しているため、安全に取り扱うことができ、廃液の処理も簡単である。また、リン酸水溶液は、汚れると着色するため、交換時期の見極めが容易である。   The concentration of the phosphoric acid aqueous solution is not limited to 40% by weight, but the concentration of the phosphoric acid aqueous solution is preferably 30 to 50% by weight in order to shorten the polishing time. Moreover, the electrolyte solution 6 is not limited to phosphoric acid aqueous solution, The well-known electrolyte solution used by electropolishing can be selected suitably, and can be used. For example, sulfuric acid aqueous solution, nitric acid aqueous solution, etc. are mentioned. However, since the phosphoric acid aqueous solution uses phosphoric acid that is not applicable to non-medicinal deleterious substances, it can be handled safely and the treatment of the waste liquid is simple. Further, since the phosphoric acid aqueous solution is colored when it becomes dirty, it is easy to determine the replacement time.

また、電解研磨槽2の材質は、塩化ビニルに限定されず、電解液6の種類に応じて、前記電解液6に侵食されにくいものを適宜選択可能である。なお、電解液6をリン酸水溶液とした場合、リン酸水溶液は侵食性に乏しいため電解研磨槽2が侵食されにくい。
第1の電極3は、電解研磨槽2に取り付けられている。当該第1の電極3は、前記電解研磨槽2の側板に固定された支持部材7と、前記支持部材7に支持された電極本体8とを備える。
The material of the electrolytic polishing tank 2 is not limited to vinyl chloride, and a material that is not easily eroded by the electrolytic solution 6 can be appropriately selected according to the type of the electrolytic solution 6. Note that when the electrolytic solution 6 is a phosphoric acid aqueous solution, the electrolytic polishing tank 2 is not easily eroded because the phosphoric acid aqueous solution has poor erodibility.
The first electrode 3 is attached to the electrolytic polishing tank 2. The first electrode 3 includes a support member 7 fixed to a side plate of the electrolytic polishing tank 2 and an electrode body 8 supported by the support member 7.

電極本体8は、タングステン製の板材を略L字形に折曲成形したものであって、支持部材7の一端部にネジ9で固定される垂直部10と、冷陰極蛍光ランプ100のリード線101を接触させる接触部分としての水平部11とを備えている。電極本体8は、水平部11が電解研磨槽2の貯蔵部5内に収納されるように、支持部材7によって所定の高さ位置に支持されている。   The electrode body 8 is formed by bending a tungsten plate material into a substantially L shape, and includes a vertical portion 10 fixed to one end portion of the support member 7 with a screw 9 and a lead wire 101 of the cold cathode fluorescent lamp 100. And a horizontal portion 11 as a contact portion for contacting the. The electrode body 8 is supported at a predetermined height position by the support member 7 so that the horizontal part 11 is accommodated in the storage part 5 of the electrolytic polishing tank 2.

電極本体8は、タングステンで形成されているため、電圧印加時の電解液6に浸漬させても電解研磨されにくい。なお、電極本体8の材質は、タングステンに限定されず、電解研磨されにくい性質を有する材質であればよい。
電極本体8は、前述した通り略L字形に折り曲げられた板材であるため、それ自体が板ばね構造を有する弾性部となっている。したがって、水平部11に荷重がかかると、前記水平部11は垂直部10との連結部分を中心に回動する。例えば、水平部11の上面に上方からリード線101を押し当てて接触させた場合、前記水平部11には下向きの荷重が加わり、前記水平部11は下方(図1における矢印12で示す方向)に回動する。
Since the electrode body 8 is made of tungsten, it is difficult to be electropolished even if it is immersed in the electrolytic solution 6 when a voltage is applied. The material of the electrode body 8 is not limited to tungsten, and may be any material having a property that is difficult to be electropolished.
Since the electrode body 8 is a plate material bent into a substantially L shape as described above, the electrode body 8 itself is an elastic portion having a leaf spring structure. Therefore, when a load is applied to the horizontal portion 11, the horizontal portion 11 rotates around the connection portion with the vertical portion 10. For example, when the lead wire 101 is pressed against the upper surface of the horizontal portion 11 from above and brought into contact, a downward load is applied to the horizontal portion 11, and the horizontal portion 11 is downward (in the direction indicated by the arrow 12 in FIG. 1). To turn.

このように、水平部11に荷重が加わると前記水平部11が回動するため、前記水平部11にリード線101を接触させた際に、前記リード線101に加わる荷重を低減させることができる。そのため、水平部11にリード線101を強く押し当ててしまうようなことがあっても、前記リード線101が折れ曲がったり、冷陰極蛍光ランプ100が折れて破損したりしにくい。   As described above, when a load is applied to the horizontal portion 11, the horizontal portion 11 rotates. Therefore, when the lead wire 101 is brought into contact with the horizontal portion 11, the load applied to the lead wire 101 can be reduced. . Therefore, even if the lead wire 101 is strongly pressed against the horizontal portion 11, the lead wire 101 is not easily bent, and the cold cathode fluorescent lamp 100 is not easily broken and damaged.

なお、電極本体8の板ばね構造のばね圧は、冷陰極蛍光ランプ100のサイズ、リード線101の径および突出部分の長さ、後述するチャックヘッド110の下方へ移動する速度などに応じて、適宜調節することが好ましい。なお、ばね圧が強すぎると、前記冷陰極蛍光ランプ100や前記リード線101が折れ曲がり、ばね圧が弱すぎると、水平部11が所定の位置に戻らなくなる。   The spring pressure of the leaf spring structure of the electrode body 8 depends on the size of the cold cathode fluorescent lamp 100, the diameter of the lead wire 101 and the length of the protruding portion, the speed of moving below the chuck head 110 described later, etc. It is preferable to adjust appropriately. When the spring pressure is too strong, the cold cathode fluorescent lamp 100 and the lead wire 101 are bent, and when the spring pressure is too weak, the horizontal portion 11 does not return to a predetermined position.

また、電極本体8が板ばね構造を有しているため、リード線101を水平部11に接触させると、前記水平部11が前記リード線101側へ弾発付勢されるため、前記水平部11と前記リード線101との接触状態を安定維持することができる。したがって、リード線101に電流を安定して流すことができ、研磨処理を確実に行うことができる。
第2の電極4は、略L字形に折り曲げられた鉛製の棒材であって、一方の端部が電解研磨槽2の貯蔵部6内に収まるようにして前記電解研磨槽2の側板に固定されている。
In addition, since the electrode body 8 has a leaf spring structure, when the lead wire 101 is brought into contact with the horizontal portion 11, the horizontal portion 11 is elastically biased toward the lead wire 101, so that the horizontal portion 11 and the lead wire 101 can be stably maintained. Therefore, a current can be stably supplied to the lead wire 101, and the polishing process can be reliably performed.
The second electrode 4 is a lead bar bent in a substantially L shape, and one end of the second electrode 4 is placed on the side plate of the electrolytic polishing tank 2 such that the end of the second electrode 4 is accommodated in the storage section 6 of the electrolytic polishing tank 2. It is fixed.

第1の電極3は、電気配線13を介して、図示しない電源の陽極側に接続されており、また、第2の電極4は、電気配線14を介して、前記電源の陰極側に接続されている。支持部材7および電極本体8がそれぞれ導電性を有しているため、第1の電極3は、前記電源と電気的に導通している。また、第2の電極4も、導電性を有しているため、前記電源と電気的に導通している。   The first electrode 3 is connected to the anode side of a power source (not shown) via an electric wiring 13, and the second electrode 4 is connected to the cathode side of the power source via an electric wiring 14. ing. Since the support member 7 and the electrode body 8 are conductive, the first electrode 3 is electrically connected to the power source. Moreover, since the 2nd electrode 4 also has electroconductivity, it is electrically connected with the said power supply.

(被研磨物の説明)
本実施の形態に係る電解研磨装置1は、被研磨物が冷陰極蛍光ランプ100であり、被研磨部分が前記冷陰極蛍光ランプ100のリード線101である場合に特に有用である。
図2は、冷陰極蛍光ランプを示す縦断面図である。なお、図2では、各構成部材間の縮尺は統一されていない。図2に示すように、冷陰極蛍光ランプ100は、両端部に電極102が気密封止され、内面に蛍光体膜103が形成され、内部に水銀および希ガスが封入されたガラスバルブ104を備える。
(Description of the object to be polished)
The electropolishing apparatus 1 according to the present embodiment is particularly useful when the object to be polished is the cold cathode fluorescent lamp 100 and the portion to be polished is the lead wire 101 of the cold cathode fluorescent lamp 100.
FIG. 2 is a longitudinal sectional view showing a cold cathode fluorescent lamp. In FIG. 2, the scales between the constituent members are not unified. As shown in FIG. 2, the cold cathode fluorescent lamp 100 includes a glass bulb 104 in which electrodes 102 are hermetically sealed at both ends, a phosphor film 103 is formed on an inner surface, and mercury and a rare gas are sealed inside. .

ガラスバルブ104は、全長が280〜1000mm、外径が1.8〜4.0mm、内径が1.4〜3.0mmである。
各電極102は、有底筒状の電極本体105と、前記電極本体105の底部にレーザー溶接等によって接続されたリード線101とを備える。電極102は、電極本体105と、リード線101の前記電極本体105側の端部とが、ガラスバルブ104の内部に収まり、前記リード線101の前記電極本体105とは反対側の端部が、前記ガラスバルブ104から外側へ突出するように配置されている。
The glass bulb 104 has a total length of 280 to 1000 mm, an outer diameter of 1.8 to 4.0 mm, and an inner diameter of 1.4 to 3.0 mm.
Each electrode 102 includes a bottomed cylindrical electrode body 105 and a lead wire 101 connected to the bottom of the electrode body 105 by laser welding or the like. In the electrode 102, the electrode body 105 and the end portion of the lead wire 101 on the electrode body 105 side are accommodated in the glass bulb 104, and the end portion of the lead wire 101 on the side opposite to the electrode body 105 is The glass bulb 104 is disposed so as to protrude outward.

リード線101は、例えば、ニオブ・ニッケル製であって、線径は0.8〜0.9mmである。また、リード線101におけるガラスバルブ104から外側へ突出した部分(以下、単に「突出部分」)の長さは、2〜11mmである。なお、リード線101の代わりに、例えば、鉄・ニッケル合金線の心材を銅層で被覆したもの(ジュメット線)等が使用されていてもよい。   The lead wire 101 is made of, for example, niobium nickel and has a wire diameter of 0.8 to 0.9 mm. In addition, the length of the portion of the lead wire 101 that protrudes outward from the glass bulb 104 (hereinafter simply “protruding portion”) is 2 to 11 mm. Instead of the lead wire 101, for example, an iron / nickel alloy wire core material covered with a copper layer (jumet wire) may be used.

図3は、冷陰極蛍光ランプの製造における電極封止工程を説明する図である。図3に示すように、電極封止工程では、リード線101にガラスビーズ107を外嵌させておいた電極102を、ガラスバルブ104の前駆体であるガラス管106の端部に差し込み、その端部をガスバーナー108で加熱軟化させることによって電極102を封止する。
前記ガスバーナー108の加熱温度は約1300℃であり、この加熱によって、リード線101の突出部分に膜厚0.2〜1.0μmの酸化被膜が形成される。特に、ガスバーナー108の炎に近い突出部分の根元付近(図3において符号109で示す範囲)には、酸化被膜が形成され易い。なお、酸化被膜の膜厚は、オージェ電子分光分析法により測定した。
FIG. 3 is a diagram for explaining an electrode sealing process in manufacturing a cold cathode fluorescent lamp. As shown in FIG. 3, in the electrode sealing step, the electrode 102 in which the glass beads 107 are externally fitted to the lead wire 101 is inserted into the end of the glass tube 106 that is a precursor of the glass bulb 104, and the end The electrode 102 is sealed by heating and softening the part with a gas burner 108.
The heating temperature of the gas burner 108 is about 1300 ° C. By this heating, an oxide film having a film thickness of 0.2 to 1.0 μm is formed on the protruding portion of the lead wire 101. In particular, an oxide film is easily formed in the vicinity of the base of the protruding portion close to the flame of the gas burner 108 (range indicated by reference numeral 109 in FIG. 3). The film thickness of the oxide film was measured by Auger electron spectroscopy.

一般に、冷陰極蛍光ランプ100は、リード線101の突出部分の酸化を防止するために、前記突出部分の表面が半田でコーティングされ出荷される。コーティングに半田が用いられるのは、冷陰極蛍光ランプ100をバックライトユニットなどの灯具(不図示)へ取り付ける際に、コーティングされた半田を利用して半田付けをすることができ、別途半田を用意する手間が省けるからである。   In general, the cold cathode fluorescent lamp 100 is shipped with the surface of the protruding portion coated with solder in order to prevent oxidation of the protruding portion of the lead wire 101. The solder is used for the coating. When the cold cathode fluorescent lamp 100 is attached to a lamp (not shown) such as a backlight unit, the coated solder can be used for soldering, and a separate solder is prepared. This is because it saves time and effort.

ところが、リード線101の表面に酸化被膜が形成されていると、前記リード線101の表面の半田の濡れ性が悪くなり、半田のコーティング処理が上手くいかない。これにより、冷陰極蛍光ランプ100の製造歩留まりが低下する。したがって、リード線101を研磨して酸化被膜を除去しなければならない。そして、特に研磨したい部分は、リード線101の根本部分109である。   However, if an oxide film is formed on the surface of the lead wire 101, the wettability of the solder on the surface of the lead wire 101 is deteriorated, and the solder coating process is not successful. Thereby, the manufacturing yield of the cold cathode fluorescent lamp 100 is lowered. Therefore, the lead wire 101 must be polished to remove the oxide film. A portion that is particularly desired to be polished is a root portion 109 of the lead wire 101.

電解研磨装置1は、第1の電極3の水平部11が電解液6中に配置されているため、電圧印加時にリード線101の突出部分の全体を電解液6に浸漬させることが可能である。したがって、酸化被膜が形成され易いリード線101の根元付近109を電解液6に浸漬させることが可能であり、前記根元付近109を研磨することができる。
一般に、電解研磨方法では、第1の電極3と接触している部分が研磨され難い。しかし、第1の実施形態に係る電解研磨装置1の場合、第1の電極3の水平部11と接触しているのは、酸化被膜が形成され難いリード線101の下端部であり、酸化被膜が形成され易い根元付近109は第1の電極3と接触していない状態で電解液6中に浸漬している。したがって、根元付近109を効率良く研磨することができる。
In the electropolishing apparatus 1, the horizontal portion 11 of the first electrode 3 is disposed in the electrolytic solution 6, so that the entire protruding portion of the lead wire 101 can be immersed in the electrolytic solution 6 when a voltage is applied. . Therefore, it is possible to immerse the base portion 109 of the lead wire 101 where an oxide film is easily formed in the electrolytic solution 6, and the base portion 109 can be polished.
In general, in the electrolytic polishing method, a portion in contact with the first electrode 3 is difficult to be polished. However, in the case of the electropolishing apparatus 1 according to the first embodiment, it is the lower end portion of the lead wire 101 where the oxide film is difficult to be formed that is in contact with the horizontal portion 11 of the first electrode 3. The vicinity 109 of the root where it is easy to form is immersed in the electrolytic solution 6 without being in contact with the first electrode 3. Therefore, the root vicinity 109 can be efficiently polished.

(電解研磨方法の説明)
以下に、電解研磨装置1を用いて行う電解研磨方法について説明する。
まず、電解研磨槽2の貯蔵部5内に、少なくとも第1の電極3の水平部11と第2電極の一端部とが浸漬する程度に、電解液6を注入する。
次に、冷陰極蛍光ランプ100を移動させて、前記冷陰極蛍光ランプ100のリード線101を第3の電極3の水平部11の上面に押し当て、前記リード線101と前記水平部11とを接触させる。
(Description of electropolishing method)
Below, the electrolytic polishing method performed using the electrolytic polishing apparatus 1 is demonstrated.
First, the electrolytic solution 6 is injected into the storage unit 5 of the electrolytic polishing tank 2 to such an extent that at least the horizontal part 11 of the first electrode 3 and one end of the second electrode are immersed.
Next, the cold cathode fluorescent lamp 100 is moved, the lead wire 101 of the cold cathode fluorescent lamp 100 is pressed against the upper surface of the horizontal portion 11 of the third electrode 3, and the lead wire 101 and the horizontal portion 11 are brought together. Make contact.

冷陰極蛍光ランプ100は、冷陰極蛍光ランプ100を把持する把持部材111と、前記把持部材111を上下に移動させる移動手段112とを備えたチャックヘッド110によって移動させる。
具体的には、チャックヘッド110によって、冷陰極蛍光ランプ100を電解研磨槽2の真上に移動させ、さらに、前記冷陰極蛍光ランプ100を下方へ降ろす。これにより、冷陰極蛍光ランプ100のリード線101が電解液収納部5内の電解液6に浸漬し、前記リード線101の下端部が、前記電解液6中の水平部11の上面に接触する。
The cold cathode fluorescent lamp 100 is moved by a chuck head 110 including a holding member 111 that holds the cold cathode fluorescent lamp 100 and a moving unit 112 that moves the holding member 111 up and down.
Specifically, the cold cathode fluorescent lamp 100 is moved directly above the electrolytic polishing tank 2 by the chuck head 110, and the cold cathode fluorescent lamp 100 is further lowered. As a result, the lead wire 101 of the cold cathode fluorescent lamp 100 is immersed in the electrolytic solution 6 in the electrolytic solution storage portion 5, and the lower end portion of the lead wire 101 comes into contact with the upper surface of the horizontal portion 11 in the electrolytic solution 6. .

次に、第1の電極3と第2の電極4との間に電圧を印加し、第1の電極3に接触させたリード線101と第2の電極4との間に電解液6を介して0.8〜5.0Aの電流を3秒以上流す。これにより、リード線101の酸化被膜が、電気化学的反応によって電解液6に溶解し、リード線101の表面が研磨される。なお、電圧印加時、リード線101は陽極として機能し、第2の電極4は陰極として機能する。   Next, a voltage is applied between the first electrode 3 and the second electrode 4, and the electrolytic solution 6 is interposed between the lead wire 101 brought into contact with the first electrode 3 and the second electrode 4. Then, a current of 0.8 to 5.0 A is supplied for 3 seconds or more. Thereby, the oxide film of the lead wire 101 is dissolved in the electrolytic solution 6 by an electrochemical reaction, and the surface of the lead wire 101 is polished. Note that when voltage is applied, the lead wire 101 functions as an anode, and the second electrode 4 functions as a cathode.

<第2実施形態>
第2の実施形態に係る電解研磨装置は、第1の電極が板ばね構造を有さない代わりに、接触部分を被研磨部分側へ弾発付勢する弾性部を備えている点において第1の実施形態とは相違する。他の構成は、基本的に第1の実施形態に係る電解研磨装置1と同様である。したがって、共通の構成部分には第1の実施形態と同じ符号を付し、その説明は省略するか簡略するにとどめ、相違点を中心に説明する。
Second Embodiment
The electropolishing apparatus according to the second embodiment is the first in that the first electrode has an elastic part that elastically biases the contact part toward the part to be polished instead of having a leaf spring structure. This is different from the embodiment. Other configurations are basically the same as those of the electropolishing apparatus 1 according to the first embodiment. Therefore, common constituent parts are denoted by the same reference numerals as those in the first embodiment, and the description thereof will be omitted or simplified, and differences will be mainly described.

(電解研磨装置の説明)
図4は、第2の実施の形態に係る電解研磨装置を示す概略図である。電解研磨装置200は、電解研磨槽2、第1の電極201、第2の電極4、および、弾性部材202を備える。
第1の電極201は、タングステンで形成されており、冷陰極蛍光ランプ100のリード線101を接触させる第1の水平部203と、取付部材204によって電解研磨槽2の側板に摺動自在に取り付けられた垂直部205と、電気配線13が接続された第2の水平部206とを有する。
(Description of electropolishing equipment)
FIG. 4 is a schematic view showing an electropolishing apparatus according to the second embodiment. The electropolishing apparatus 200 includes an electropolishing tank 2, a first electrode 201, a second electrode 4, and an elastic member 202.
The first electrode 201 is made of tungsten, and is slidably attached to the side plate of the electrolytic polishing tank 2 by the first horizontal portion 203 that contacts the lead wire 101 of the cold cathode fluorescent lamp 100 and the attachment member 204. And a second horizontal portion 206 to which the electrical wiring 13 is connected.

第1の電極201は、電解研磨槽2の貯蔵部5内における第1の水平部203の下側に配置された弾性部材202によって、前記水平部203が所定の高さ位置となるよう支持されている。
弾性部材202は、内部にエアーが充填されたゴム製の袋体であって、第1の水平部203に荷重が加わると、前記第1の水平部203に圧迫されて扁平する。すなわち、弾性部材202は、第1の電極201の第1の水平部203をリード線101側へ弾発付勢している。例えば、第1の水平部203の上面に上方からリード線101を接触させた場合、前記第1の水平部203に下向きの荷重が加わって、弾性部材202が横長に扁平し、前記第1の水平部203は下方(図4における矢印207で示す方向)に移動する。
The first electrode 201 is supported by the elastic member 202 disposed below the first horizontal portion 203 in the storage portion 5 of the electropolishing tank 2 so that the horizontal portion 203 is at a predetermined height position. ing.
The elastic member 202 is a rubber bag body filled with air. When a load is applied to the first horizontal portion 203, the elastic member 202 is compressed by the first horizontal portion 203 and flattened. In other words, the elastic member 202 elastically biases the first horizontal portion 203 of the first electrode 201 toward the lead wire 101 side. For example, when the lead wire 101 is brought into contact with the upper surface of the first horizontal portion 203 from above, a downward load is applied to the first horizontal portion 203, the elastic member 202 is flattened horizontally, and the first horizontal portion 203 is The horizontal portion 203 moves downward (in the direction indicated by the arrow 207 in FIG. 4).

このように、第1の水平部203に上方から荷重が加わると、前記第1の水平部203が下方へ移動するため、リード線101に加わる荷重を低減させることができる。しかも、弾性部材202の弾発力によって、第1の水平部203はリード線101側へ弾発付勢されるため、前記第1の水平部203とリード線101との接触状態を安定維持することができる。   Thus, when a load is applied to the first horizontal portion 203 from above, the first horizontal portion 203 moves downward, so that the load applied to the lead wire 101 can be reduced. In addition, since the first horizontal portion 203 is elastically biased toward the lead wire 101 by the elastic force of the elastic member 202, the contact state between the first horizontal portion 203 and the lead wire 101 is stably maintained. be able to.

第1の電極201は、電気配線13を介して、図示しない電源の陽極側に接続されている。第1の水平部203、垂直部205および第2の水平部205がそれぞれ導電性を有しているため、第1の電極201は、電源と電気的に導通している。
(電解研磨方法の説明)
以下に、電解研磨装置200を用いて行う電解研磨方法について説明する。
The first electrode 201 is connected to the anode side of a power source (not shown) through the electric wiring 13. Since the first horizontal portion 203, the vertical portion 205, and the second horizontal portion 205 have conductivity, the first electrode 201 is electrically connected to the power source.
(Description of electropolishing method)
Hereinafter, an electrolytic polishing method performed using the electrolytic polishing apparatus 200 will be described.

まず、電解研磨槽2の貯蔵部5内に、少なくとも第1の電極201の第1の水平部203と第2電極の一端部とが浸漬する程度に、電解液6を注入する。
次に、冷陰極蛍光ランプ100を、把持部材111および移動手段112を備えたチャックヘッド110によって移動させ、リード線101の根元付近109を電解液6に浸漬させると共に、前記リード線101の下端部を第3の電極3の第1の水平部203の上面に接触させる。
First, the electrolytic solution 6 is injected into the storage unit 5 of the electrolytic polishing tank 2 so that at least the first horizontal portion 203 of the first electrode 201 and one end of the second electrode are immersed.
Next, the cold cathode fluorescent lamp 100 is moved by the chuck head 110 having the gripping member 111 and the moving means 112 so that the base portion 109 of the lead wire 101 is immersed in the electrolytic solution 6 and the lower end portion of the lead wire 101 is moved. Is brought into contact with the upper surface of the first horizontal portion 203 of the third electrode 3.

さらに、第1の電極201と第2の電極4との間に電圧を印加して、前記第1の電極201に接触させたリード線101と前記第2の電極4との間に電解液6を介して電流を流す。これにより、リード線101の表面の酸化被膜が、電気化学的反応によって電解液6に溶解し、リード線101の表面が研磨される。
<第3実施形態>
第3の実施形態に係る電解研磨装置は、被研磨物移動手段を備えている点において第1の実施形態とは相違するが、他の構成は、基本的に第1の実施形態に係る電解研磨装置1と同様の構成をしている。したがって、共通の構成部分には第1の実施形態と同じ符号を付してその説明は省略するか簡略するにとどめ、相違点を中心に説明する。
Further, a voltage is applied between the first electrode 201 and the second electrode 4, and the electrolytic solution 6 is placed between the lead wire 101 brought into contact with the first electrode 201 and the second electrode 4. Current is passed through. As a result, the oxide film on the surface of the lead wire 101 is dissolved in the electrolytic solution 6 by an electrochemical reaction, and the surface of the lead wire 101 is polished.
<Third Embodiment>
The electropolishing apparatus according to the third embodiment is different from the first embodiment in that it includes a workpiece moving means, but the other configurations are basically electrolysis according to the first embodiment. The configuration is the same as that of the polishing apparatus 1. Therefore, common components are denoted by the same reference numerals as those in the first embodiment, and the description thereof will be omitted or simplified, and differences will be mainly described.

(電解研磨装置の説明)
図5は、第3の実施の形態に係る研磨装置を示す概略図である。電解研磨装置300は、電解研磨槽2、第1の電極301、第2の電極4、および、被研磨物移動手段の1例としてのチャックヘッド310を備える。
第1の電極301は、タングステンで形成されており、その一端部側が電解研磨槽2の側板に設けられた開口部302を貫通し、前記電解研磨槽2の貯蔵部5内に収まっている。なお、第1の電極301と開口部302内面との間にはシール部材303が充填され、電解研磨槽2の電解液6が漏れないようになっている。
(Description of electropolishing equipment)
FIG. 5 is a schematic view showing a polishing apparatus according to the third embodiment. The electropolishing apparatus 300 includes an electropolishing tank 2, a first electrode 301, a second electrode 4, and a chuck head 310 as an example of an object moving means.
The first electrode 301 is made of tungsten, and one end side of the first electrode 301 passes through the opening 302 provided in the side plate of the electrolytic polishing tank 2 and is accommodated in the storage unit 5 of the electrolytic polishing tank 2. A seal member 303 is filled between the first electrode 301 and the inner surface of the opening 302 so that the electrolytic solution 6 in the electrolytic polishing tank 2 does not leak.

第1の電極301は、電解液収納部5側の端部が、冷陰極蛍光ランプ100のリード線101を接触させるための接触部分となっている。
図6は、冷陰極蛍光ランプを把持したチャックヘッドを図5における矢印A側から見た図である。図5および図6に示すように、チャックヘッド310は、冷陰極蛍光ランプ100を把持する一対の把持部材311と、前記把持部材を上下に移動させるための一対の移動手段312とを備える。
As for the 1st electrode 301, the edge part by the side of the electrolyte storage part 5 is a contact part for making the lead wire 101 of the cold cathode fluorescent lamp 100 contact.
6 is a view of the chuck head holding the cold cathode fluorescent lamp as viewed from the arrow A side in FIG. As shown in FIGS. 5 and 6, the chuck head 310 includes a pair of gripping members 311 for gripping the cold cathode fluorescent lamp 100 and a pair of moving means 312 for moving the gripping members up and down.

把持部材311は、前記把持部材311を貫通する軸体313に沿って上下に摺動自在に支持されており、前記把持部材311と軸体313とは移動手段312の下端部付近に取り付けられた筐体314内に収納されている。また、把持部材311の上方には、軸体313に外嵌させるようにして弾性部材の1例としてのばね315が取り付けられており、前記把持部材311は、前記ばね315によって第1の電極301側へ弾発付勢されている。   The gripping member 311 is supported so as to be slidable up and down along a shaft body 313 that penetrates the gripping member 311, and the gripping member 311 and the shaft body 313 are attached in the vicinity of the lower end of the moving means 312. Housed in the housing 314. Further, a spring 315 as an example of an elastic member is attached above the gripping member 311 so as to be fitted on the shaft body 313, and the gripping member 311 is attached to the first electrode 301 by the spring 315. The bullet is energized to the side.

把持部材311が冷陰極蛍光ランプ100を把持する強さは、前記冷陰極蛍光ランプ100のリード線101を第1の電極301に接触させた際、前記冷陰極蛍光ランプ100がズレ動かない程度に強いことが好ましい。なお、把持部材311が冷陰極蛍光ランプ100を強く挟み過ぎて、前記冷陰極蛍光ランプ100が破損することがないように、前記把持部材311の前記冷陰極蛍光ランプ100と直接接触する部分には、緩衝材316が取り付けられている。   The strength with which the gripping member 311 grips the cold cathode fluorescent lamp 100 is such that the cold cathode fluorescent lamp 100 does not move when the lead wire 101 of the cold cathode fluorescent lamp 100 is brought into contact with the first electrode 301. Strong is preferred. In order to prevent the cold cathode fluorescent lamp 100 from being damaged due to the gripping member 311 being too tightly sandwiched by the cold cathode fluorescent lamp 100, the gripping member 311 is not directly in contact with the cold cathode fluorescent lamp 100. A buffer material 316 is attached.

冷陰極蛍光ランプ100は、チャックヘッド310によって、電解研磨槽2の真上に移動させられ、その後下方へ降ろされる。これにより、冷陰極蛍光ランプ100の下側のリード線101が電解液収納部5内の電解液6に浸漬し、前記リード線101の下端部が、前記電解液6中の水平部11の上面に接触する。
リード線101を第1の電極301に接触させた際、把持部材311に下方から荷重が加わると、前記把持部材311が上方へ移動するため、リード線101に加わる荷重を低減させることができる。しかも、ばね314の弾発力によって、把持部材311が第1の電極3側へ弾発付勢されるため、第1の電極301とリード線101との接触状態は安定維持される。
The cold cathode fluorescent lamp 100 is moved directly above the electropolishing tank 2 by the chuck head 310 and then lowered downward. Thereby, the lower lead wire 101 of the cold cathode fluorescent lamp 100 is immersed in the electrolytic solution 6 in the electrolytic solution storage portion 5, and the lower end portion of the lead wire 101 is the upper surface of the horizontal portion 11 in the electrolytic solution 6. To touch.
When a load is applied to the gripping member 311 from below when the lead wire 101 is brought into contact with the first electrode 301, the gripping member 311 moves upward, so that the load applied to the lead wire 101 can be reduced. Moreover, since the holding member 311 is elastically biased toward the first electrode 3 by the elastic force of the spring 314, the contact state between the first electrode 301 and the lead wire 101 is stably maintained.

(電解研磨方法の説明)
以下に、電解研磨装置300を用いて行う電解研磨方法について説明する。
まず、電解研磨槽2の貯蔵部5内に、少なくとも第1の電極301の貯蔵部5側の端部と、第2電極の一端部とが浸漬する程度に電解液6を注入する。
次に、冷陰極蛍光ランプ100を、チャックヘッド310によって移動させ、リード線101の根元付近109を電解液6に浸漬させると共に、前記リード線101の下端部を第3の電極301の上面に接触させる。
(Description of electropolishing method)
Hereinafter, an electrolytic polishing method performed using the electrolytic polishing apparatus 300 will be described.
First, the electrolytic solution 6 is injected into the storage unit 5 of the electrolytic polishing tank 2 to such an extent that at least the end of the first electrode 301 on the storage unit 5 side and the one end of the second electrode are immersed.
Next, the cold cathode fluorescent lamp 100 is moved by the chuck head 310 so that the base portion 109 of the lead wire 101 is immersed in the electrolytic solution 6 and the lower end portion of the lead wire 101 is brought into contact with the upper surface of the third electrode 301. Let

さらに、第1の電極301と第2の電極4との間に電圧を印加して、前記第1の電極301に接触させたリード線101と前記第2の電極4との間に電解液6を介して電流を流す。これにより、リード線101の表面の酸化被膜が、電気化学的反応によって電解液6に溶解し、リード線101の表面が研磨される。
<第4実施形態>
第4の実施形態に係る電解研磨装置は、被研磨物移動手段を備える点において第1の実施形態とは相違するが、他の構成は、基本的に第1の実施形態に係る電解研磨装置1と同様の構成をしている。したがって、共通の構成部分には第1の実施形態と同じ符号を付してその説明は省略するか簡略するにとどめ、相違点を中心に説明する。
Further, a voltage is applied between the first electrode 301 and the second electrode 4, and the electrolytic solution 6 is interposed between the lead wire 101 brought into contact with the first electrode 301 and the second electrode 4. Current is passed through. As a result, the oxide film on the surface of the lead wire 101 is dissolved in the electrolytic solution 6 by an electrochemical reaction, and the surface of the lead wire 101 is polished.
<Fourth embodiment>
The electropolishing apparatus according to the fourth embodiment is different from the first embodiment in that it includes a workpiece moving means, but the other configuration is basically the electropolishing apparatus according to the first embodiment. 1 has the same configuration. Therefore, common components are denoted by the same reference numerals as those in the first embodiment, and the description thereof will be omitted or simplified, and differences will be mainly described.

(電解研磨装置の説明)
図7は、第4の実施の形態に係る研磨装置を示す概略図である。電解研磨装置400は、電解研磨槽2、第1の電極401、第2の電極4、および、被研磨物移動手段の1例としての電解用ヘッド410を備える。
第1の電極401の構成は、第3の実施形態に係る第1の電極301と同様である。すなわち、第1の電極401は、タングステンで形成されており、開口部402を貫通して電解研磨槽2の貯蔵部5内に収まった一端部側が、冷陰極蛍光ランプ100のリード線101を接触させるための接触部分となっている。また、第1の電極401と開口部402内面との間にはシール部材403が充填されている。
(Description of electropolishing equipment)
FIG. 7 is a schematic view showing a polishing apparatus according to the fourth embodiment. The electropolishing apparatus 400 includes an electropolishing tank 2, a first electrode 401, a second electrode 4, and an electrolysis head 410 as an example of an object moving means.
The configuration of the first electrode 401 is the same as that of the first electrode 301 according to the third embodiment. That is, the first electrode 401 is made of tungsten, and one end side of the first electrode 401 that passes through the opening 402 and is stored in the storage unit 5 of the electrolytic polishing tank 2 contacts the lead wire 101 of the cold cathode fluorescent lamp 100. It is a contact part to make it. A seal member 403 is filled between the first electrode 401 and the inner surface of the opening 402.

第4の実施の形態に係る電解研磨装置400の場合、冷陰極蛍光ランプ100は、第1の実施形態で用いられるチャックヘッド110と同様のチャックヘッド110によって電解研磨槽2の真上に移動させられる。さらに、電解研磨槽2の真上に移動させられた冷陰極蛍光ランプ100は、チャックヘッド110から電解用ヘッド410へと受け渡され、前記電解用ヘッド410によって下方へ降ろされる。   In the case of the electropolishing apparatus 400 according to the fourth embodiment, the cold cathode fluorescent lamp 100 is moved directly above the electropolishing tank 2 by the chuck head 110 similar to the chuck head 110 used in the first embodiment. It is done. Further, the cold cathode fluorescent lamp 100 moved right above the electropolishing tank 2 is transferred from the chuck head 110 to the electrolysis head 410 and lowered by the electrolysis head 410.

電解用ヘッド410は、冷陰極蛍光ランプ100を把持する把持部材411と、前記把持部材411を上下に移動させるための一対の移動手段412とを備える。
把持部材411は、前記把持部材411を貫通する軸体413に沿って上下に摺動自在に支持されており、前記把持部材411と軸体413とは移動手段412に取り付けられた筐体414内に収納されている。また、把持部材411の上方には、軸体413に外嵌させるようにして弾性部材としてのばね415が取り付けられており、前記把持部材411は、前記ばね415によって移動手段412に対して下方に弾発付勢されている。
The electrolysis head 410 includes a gripping member 411 that grips the cold cathode fluorescent lamp 100 and a pair of moving means 412 for moving the gripping member 411 up and down.
The grip member 411 is supported so as to be slidable up and down along a shaft body 413 penetrating the grip member 411, and the grip member 411 and the shaft body 413 are in a housing 414 attached to a moving means 412. It is stored in. Further, a spring 415 as an elastic member is attached above the gripping member 411 so as to be fitted on the shaft body 413, and the gripping member 411 is moved downward with respect to the moving means 412 by the spring 415. The bullet is energized.

移動手段412は、前記移動手段412を貫通する軸体416に沿って上下に摺動自在に支持されている。
冷陰極蛍光ランプ100が電解用ヘッド410によって下方へ降ろされると、冷陰極蛍光ランプ100の下側のリード線101が電解液収納部5内の電解液6に浸漬し、前記リード線101の下端部が、前記電解液6中の水平部11の上面に接触する。
The moving means 412 is supported so as to be slidable up and down along a shaft body 416 penetrating the moving means 412.
When the cold cathode fluorescent lamp 100 is lowered by the electrolysis head 410, the lower lead wire 101 of the cold cathode fluorescent lamp 100 is immersed in the electrolyte solution 6 in the electrolyte solution storage unit 5, and the lower end of the lead wire 101. The part contacts the upper surface of the horizontal part 11 in the electrolytic solution 6.

リード線101を第1の電極401に接触させた際、把持部材411に下方から荷重が加わると、前記把持部材411が上方へ移動するため、リード線101に加わる荷重を低減させることができる。しかも、ばね414の弾発力によって、把持部材411は第1の電極401側へ弾発付勢されるため、第1の電極401とリード線101との接触状態は安定維持される。   When the lead wire 101 is brought into contact with the first electrode 401, if a load is applied to the grip member 411 from below, the grip member 411 moves upward, so that the load applied to the lead wire 101 can be reduced. In addition, the gripping member 411 is elastically biased toward the first electrode 401 by the elastic force of the spring 414, so that the contact state between the first electrode 401 and the lead wire 101 is stably maintained.

(電解研磨方法の説明)
以下に、電解研磨装置400を用いて行う電解研磨方法について説明する。
まず、電解研磨槽2の貯蔵部5内に、少なくとも第1の電極401の貯蔵部5側の端部と、第2電極の一端部とが浸漬する程度に電解液6を注入する。
次に、冷陰極蛍光ランプ100を、把持部材111および移動手段112を備えたチャックヘッド110によって電解研磨槽2の真上に移動させ、さらに、電解用ヘッド410によって下方に降ろして、リード線101の根元付近109を電解液6に浸漬させると共に、前記リード線101の下端部を第3の電極401の上面に接触させる。
(Description of electropolishing method)
Hereinafter, an electropolishing method performed using the electropolishing apparatus 400 will be described.
First, the electrolytic solution 6 is injected into the storage unit 5 of the electrolytic polishing tank 2 so that at least the end of the first electrode 401 on the storage unit 5 side and the one end of the second electrode are immersed.
Next, the cold cathode fluorescent lamp 100 is moved directly above the electropolishing tank 2 by the chuck head 110 having the gripping member 111 and the moving means 112, and further lowered by the electrolysis head 410, so that the lead wire 101 is moved down. The bottom portion 109 of the lead wire 101 is immersed in the electrolytic solution 6 and the lower end portion of the lead wire 101 is brought into contact with the upper surface of the third electrode 401.

さらに、第1の電極401と第2の電極4との間に電圧を印加して、前記第1の電極401に接触させたリード線101と前記第2の電極4との間に電解液6を介して電流を流す。これにより、リード線101の表面の酸化被膜が、電気化学的反応によって電解液6に溶解し、リード線101の表面が研磨される。   Further, a voltage is applied between the first electrode 401 and the second electrode 4, and the electrolytic solution 6 is interposed between the lead wire 101 brought into contact with the first electrode 401 and the second electrode 4. Current is passed through. As a result, the oxide film on the surface of the lead wire 101 is dissolved in the electrolytic solution 6 by an electrochemical reaction, and the surface of the lead wire 101 is polished.

本発明に係る研磨装置および研磨方法は、導電性を有する物品の表面を研磨する場合に利用できる。   The polishing apparatus and the polishing method according to the present invention can be used when polishing the surface of an article having conductivity.

第1の実施形態に係る電解研磨装置を示す概略図である。It is the schematic which shows the electropolishing apparatus which concerns on 1st Embodiment. 冷陰極蛍光ランプを示す縦断面図である。It is a longitudinal cross-sectional view which shows a cold cathode fluorescent lamp. 冷陰極蛍光ランプの製造における電極封止工程を説明する図である。It is a figure explaining the electrode sealing process in manufacture of a cold cathode fluorescent lamp. 第2の実施形態に係る電解研磨装置を示す概略図である。It is the schematic which shows the electropolishing apparatus which concerns on 2nd Embodiment. 第3の実施形態に係る電解研磨装置を示す概略図である。It is the schematic which shows the electropolishing apparatus which concerns on 3rd Embodiment. 冷陰極蛍光ランプを把持したチャックヘッドを図5における矢印A側から見た図である。It is the figure which looked at the chuck head which hold | gripped the cold cathode fluorescent lamp from the arrow A side in FIG. 第4の実施形態に係る電解研磨装置を示す概略図である。It is the schematic which shows the electropolishing apparatus which concerns on 4th Embodiment.

符号の説明Explanation of symbols

1,200,300,400 研磨装置
2 電解研磨槽
3,201,301,401 第1の電極
4 第2の電極
5 貯蔵部
6 電解液
8 弾性部
11 接触部分
100 被研磨物
101 被研磨部分
310,410 被研磨物移動手段
311,411 把持手段
312,412 移動手段
315,415 弾性部材
DESCRIPTION OF SYMBOLS 1,200,300,400 Polishing apparatus 2 Electrolytic polishing tank 3,201,301,401 1st electrode 4 2nd electrode 5 Storage part 6 Electrolytic solution 8 Elastic part 11 Contact part 100 To-be-polished object 101 To-be-polished part 310 , 410 Workpiece moving means 311, 411 Holding means 312, 412 Moving means 315, 415 Elastic member

Claims (10)

電解液を貯蔵する電解研磨槽と、第1の電極と、第2の電極とを備え、
前記第1の電極と前記第2の電極との間に電圧を印加し、前記第1の電極に接触させた被研磨物の被研磨部分と、前記第2の電極との間に前記電解液を介して電流を流し、前記被研磨部分を研磨する研磨装置であって、
前記第1の電極は、前記被研磨部分と接触する接触部分が、少なくとも前記電圧印加時、前記電解液中に配置されていることを特徴とする研磨装置。
An electrolytic polishing tank for storing an electrolytic solution, a first electrode, and a second electrode;
A voltage is applied between the first electrode and the second electrode, and the electrolyte solution is between the second electrode and the portion to be polished of the object to be polished that is in contact with the first electrode. A polishing apparatus for polishing the portion to be polished by passing an electric current through
The polishing apparatus according to claim 1, wherein a contact portion of the first electrode that contacts the portion to be polished is disposed in the electrolytic solution at least when the voltage is applied.
前記第1の電極は、前記接触部分が前記電解研磨槽の貯蔵部内に収まるように前記電解研磨槽に取り付けられていることを特徴とする請求項1記載の研磨装置。   The polishing apparatus according to claim 1, wherein the first electrode is attached to the electrolytic polishing tank so that the contact portion is accommodated in a storage portion of the electrolytic polishing tank. 前記第1の電極は、前記接触部分を前記被研磨部分側へ弾発付勢する弾性部を備えていることを特徴とする請求項1または2に記載の研磨装置。   The polishing apparatus according to claim 1, wherein the first electrode includes an elastic portion that elastically urges the contact portion toward the polished portion. 前記弾性部は、板ばね構造を有することを特徴とする請求項3に記載の研磨装置。   The polishing apparatus according to claim 3, wherein the elastic portion has a leaf spring structure. 前記被研磨物を把持する把持手段と、
前記把持部材を上下に移動させ、前記把持部材が把持した前記被研磨物の被研磨部分を前記第1の電極に接触させる移動手段と、
前記把持部材を前記第1の電極側へ弾発付勢する弾性部材と
を備えた被研磨物移動手段を備えることを特徴とする請求項2に記載の研磨装置。
Gripping means for gripping the object to be polished;
Moving means for moving the gripping member up and down to bring the polished portion of the object to be polished gripped by the gripping member into contact with the first electrode;
The polishing apparatus according to claim 2, further comprising an object moving means including an elastic member that elastically biases the gripping member toward the first electrode.
前記第1の電極は、少なくとも前記電解液に浸漬する部分がタングステンで形成されていることを特徴とする請求項1から5のいずれか1項に記載の研磨装置。   The polishing apparatus according to claim 1, wherein at least a portion of the first electrode immersed in the electrolytic solution is formed of tungsten. 第1の電極、第2の電極および被研磨物の被研磨部分を、前記第1の電極と前記被研磨部分とが接触し、かつ、前記第1の電極の少なくとも一部、前記第2の電極の少なくとも一部および前記被研磨部分が電解液に浸漬した状態に配置する配置ステップと、
前記第1の電極と前記第2の電極との間に電圧を印加し、前記第2の電極と前記被研磨部分との間に前記電解液を介して電流を流し、前記被研磨部分を研磨する研磨ステップと
を含むことを特徴とする研磨方法。
The first electrode, the second electrode, and the portion to be polished of the object to be polished are in contact with the first electrode and the portion to be polished, and at least a part of the first electrode, the second electrode Arrangement step for disposing at least a part of the electrode and the portion to be polished in an electrolyte solution; and
A voltage is applied between the first electrode and the second electrode, a current is passed between the second electrode and the portion to be polished via the electrolytic solution, and the portion to be polished is polished. And a polishing step.
前記配置ステップにおいて、前記第1の電極の少なくとも一部を予め前記電解液に浸漬しておき、前記第1の電極の浸漬部分に前記被研磨部分を接触させることを特徴とする請求項7に記載の研磨方法。   In the arrangement step, at least a part of the first electrode is previously immersed in the electrolytic solution, and the portion to be polished is brought into contact with the immersion portion of the first electrode. The polishing method described. 前記第1の電極の前記被研磨部分との接触部分を、前記被研磨部分側へ弾発付勢させることを特徴とする請求項7または8に記載の研磨方法。   The polishing method according to claim 7 or 8, wherein a portion of the first electrode that contacts the portion to be polished is elastically biased toward the portion to be polished. 前記被研磨物は、冷陰極蛍光ランプであり、前記被研磨部分はリード線であることを特徴とする請求項7から9のいずれか1項に記載の研磨方法。   The polishing method according to claim 7, wherein the object to be polished is a cold cathode fluorescent lamp, and the portion to be polished is a lead wire.
JP2004360438A 2004-12-13 2004-12-13 Polishing device and polishing method Pending JP2006167824A (en)

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KR102247637B1 (en) * 2020-07-10 2021-05-03 주식회사 레노메디컬 Electrolytic-polished core wire and core wire electrolytic polishing device

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JPS632623A (en) * 1986-06-20 1988-01-07 Toowa Giken Kk Jig for electrolytic polishing
JPH06210521A (en) * 1993-01-14 1994-08-02 Hitachi Zosen Corp Method of beveling work to hard-to-cut material
JPH07299659A (en) * 1994-04-28 1995-11-14 Mitsumi Electric Co Ltd Co amorphous magnetic wire polishing method and device therefor
JPH08250028A (en) * 1995-03-08 1996-09-27 Nec Home Electron Ltd Method for fixing glass bead to electrode lead
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JPS55115237A (en) * 1979-02-26 1980-09-05 West Electric Co Ltd Manufacturing method and device of flash discharge tube
JPS632623A (en) * 1986-06-20 1988-01-07 Toowa Giken Kk Jig for electrolytic polishing
JPH06210521A (en) * 1993-01-14 1994-08-02 Hitachi Zosen Corp Method of beveling work to hard-to-cut material
JPH07299659A (en) * 1994-04-28 1995-11-14 Mitsumi Electric Co Ltd Co amorphous magnetic wire polishing method and device therefor
JPH08250028A (en) * 1995-03-08 1996-09-27 Nec Home Electron Ltd Method for fixing glass bead to electrode lead
JP2002254248A (en) * 2001-02-28 2002-09-10 Sony Corp Electrochemical machining device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102247637B1 (en) * 2020-07-10 2021-05-03 주식회사 레노메디컬 Electrolytic-polished core wire and core wire electrolytic polishing device

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