JP2006140654A5 - - Google Patents

Claims (6)

Peripheral image signal generating means for inputting an image signal photoelectrically converted by the image sensor and generating a defect detection target image signal and its peripheral image signal;
Defect detection means for detecting whether or not a defect detection target pixel signal in the defect detection target image signal is a defective pixel signal based on image signal information from the peripheral image signal generation means;
A false detection pattern detection means for detecting whether or not the defect detection target pixel signal and the peripheral pixel signal have a pixel signal pattern satisfying a predetermined condition based on image signal information from the peripheral image signal generation means;
And signal correction means for the correction pixel signal by replacing the pixel signals forming the image signal to a normal level of the image element signals,
When the defect detection target pixel signal is detected to be a defective pixel signal, and the defect detection target pixel signal and its peripheral pixel signal are detected to have a pixel signal pattern that satisfies the predetermined condition, the defect detection is performed. A defect detection and correction circuit comprising: control means for performing control to output a target pixel signal without replacing it with the correction pixel signal. Counting means for counting the number of detection times of the pixel signal pattern that satisfies the predetermined condition by the erroneous detection pattern detection means;
Comparing means for comparing the count value of the counting means with a preset threshold value,
2. The defect detection and correction circuit according to claim 1, wherein the control means outputs the input image signal thereafter when the count value exceeds the threshold value.   The predetermined condition is that when the defect detection target pixel signal and its peripheral pixel signal range are rectangular, the pixel signals on the two diagonal lines have relatively close levels, and the pixel signals on one diagonal line When the level is farther than the level of the pixel signal on the other diagonal line, or the pixel signals on the two vertical and horizontal lines are relatively close to each other, and the level of the pixel signal on one line is the other 2. The defect detection / correction circuit according to claim 1, wherein the defect detection / correction circuit is separated from a level of a pixel signal on the line.   3. The defect detection / correction circuit according to claim 2, wherein when the count value exceeds the threshold value, operation of a circuit related to defect detection / correction of the pixel signal is stopped. A defect detection and correction method that detects whether or not there is a defective pixel signal in an image signal that is photoelectrically converted by an image sensor and replaces it with a corrected pixel signal if there is a defective pixel signal. ,
When the defect detection target pixel signal and its surrounding pixel signals have a pixel signal pattern that satisfies a predetermined condition, even if the defect detection target pixel signal is detected as a defective pixel signal, this is detected as the correction pixel signal. A defect detection and correction method, characterized in that the defect is output without being replaced.   6. The defect detection according to claim 5, wherein the number of appearances of the pixel signal pattern satisfying the predetermined condition is counted, and when the counted value exceeds a predetermined threshold value, the input image signal is output thereafter. Correction method.