JP2006133790A - Multibeam light source apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To realize a multibeam light source apparatus which has excellent secular stability and to easily adjust the distance between beam spots with a simple structure. <P>SOLUTION: The multibeam light source apparatus is provided with a light source part having a plurality of semiconductor lasers 101 and 102, a plurality of collimate lenses 104 and 105 which are furnished as pairs with the semiconductor lasers and turn respective light beams into parallel luminous fluxes, and a supporting member 103 which arranges the plurality of semiconductor lasers and the collimator lenses in a main scanning direction and supports as a unit. The relation D/d>1 exists between the distance D of the semiconductor lasers and the distance d of the collimate lenses, and the light source part is supported by being positioned in the turning direction around the emission axis a. Accordingly, the relative positions of even a combination of conventional semiconductor lasers are kept when the environment changes, a stable optical axis accuracy is kept, and a subscanning direction pitch is adjustable. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to an optical scanning device used in a writing system of a recording apparatus such as a digital copying machine, a laser printer, or a laser facsimile. In particular, the recording speed is remarkably improved by simultaneously scanning a photosensitive member with a plurality of light beams. The present invention relates to a multi-beam light source device used as a light source of a multi-beam optical scanning device.

  As a means for improving the recording speed in an optical scanning apparatus used in a writing system of a recording apparatus such as a digital copying machine, a laser printer, or a laser facsimile, there is a method for increasing the rotational speed of a rotary polygon mirror (polygon mirror) as a deflecting means. is there. However, in this method, the durability of the motor, noise, vibration, modulation speed of the semiconductor laser, and the like become problems, and the recording speed is limited. In view of this, a multi-beam optical scanning apparatus has been proposed in which a plurality of laser beams are scanned at a time and a plurality of lines are simultaneously recorded to improve the recording speed. As an example, a method of combining light beams from a plurality of semiconductor laser light sources using a beam splitter, or a plurality of light emitting sources as an array as disclosed in Japanese Patent Laid-Open No. 56-42248. There is a method using a semiconductor laser array arranged in the above.

Although the above-mentioned semiconductor laser array has a plurality of light sources and a common sensor for detecting the output, the light sources are close to each other even though the light output cannot be fed back in real time like a normal semiconductor laser. Therefore, the light output is likely to fluctuate due to the crosstalk, and the light amount control with high accuracy cannot be performed. In addition, it has the disadvantage of being expensive due to its particularity. These become disadvantageous as the number of light sources increases.
On the other hand, the method of using a plurality of general-purpose semiconductor lasers and synthesizing the light beams from the plurality of semiconductor lasers does not have the above-mentioned problems, but requires improved environmental stability and handling.

JP-A-56-42248

  As a multi-beam optical scanning device, a method is known in which light beams from two semiconductor lasers are combined, and the two beams are simultaneously scanned by a deflecting means such as a rotary polygon mirror to record adjacent lines. And higher density are required, and 3-beam and 4-beam are becoming necessary. To solve this problem, a semiconductor laser array has been proposed that uses a semiconductor laser array as a light source. However, as described above, the semiconductor laser array has restrictions in terms of control and can be handled in the same way as a general-purpose semiconductor laser. However, it is not suitable for high-accuracy output control, and even though there are multiple light sources, the collimating lens is common. The handling is troublesome, for example, the beam is shifted or the beams emitted from the collimating lens diverge in the directions away from each other.

  On the other hand, in the case of a multi-beam light source device that uses two or more general-purpose semiconductor lasers to synthesize a beam using a beam splitter or prism, it is necessary to synthesize one beam at a time by overlapping the beam splitter or prism in multiple stages. However, there are drawbacks in that it is difficult to align each beam and maintain the beam spot interval. In addition, as the structure becomes complicated, the accumulation of errors increases, so each component is required to have high accuracy, and a means for detecting and correcting the beam position is necessary to correct the beam position shift over time. It is disadvantageous in terms of cost.

  The present invention has been made in view of the above circumstances, and in the present invention, even when two or more general-purpose semiconductor lasers are used for beam synthesis by a beam splitter, it is not necessary to provide a beam splitter or the like in multiple stages. An object of the present invention is to realize a multi-beam light source device having a simple structure and excellent stability over time, and to easily adjust the interval between beam spots (setting the scanning line interval in the sub-scanning direction).

  In recent years, recording devices have become multifunctional, and a function for selecting the recording density according to the application has been incorporated. In order to change the recording density in the multi-beam writing system as described above, a polygon motor or In addition to the modulation speed of the semiconductor laser, it is necessary to vary the scanning line interval in the sub-scanning direction.

Accordingly, an object of the present invention is to provide a multi-beam light source device which can easily and surely switch the scanning line interval in the sub-scanning direction in response to this.
Furthermore, an object of the present invention is to provide a multi-beam light source device that can increase the number of beams with a minimum light output without loss of light quantity.

  In order to achieve the above object, a multi-beam light source device according to claim 1 is provided with a plurality of semiconductor lasers, a plurality of collimating lenses provided in pairs with the semiconductor lasers to make each light beam a parallel light beam, A light source unit including a semiconductor laser and a plurality of collimating lenses arranged in the main scanning direction and a support member for integrally supporting them, and D / d> 1 between the semiconductor laser interval D and the collimating lens interval d. And the light source unit is supported so as to be positioned in the rotation direction with the emission axis as the rotation axis.

  According to a second aspect of the present invention, there is provided a multi-beam light source device in which a semiconductor laser, a collimating lens that converts a light beam from the semiconductor laser into a parallel light beam, and the semiconductor laser and the collimating lens are arranged on an emission axis. A plurality of semiconductor lasers, a plurality of collimating lenses which are provided in pairs with the semiconductor lasers to make each light beam a parallel light beam, and the plurality of semiconductor lasers. A second light source unit having a plurality of collimating lenses arranged symmetrically with respect to the emission axis and a support member that integrally supports them, and the light beams of the first and second light source units are emitted close to each other. It comprises a beam synthesis means.

  4. The multi-beam light source device according to claim 3, wherein a plurality of semiconductor lasers, a plurality of collimating lenses provided in pairs with the semiconductor lasers to convert each light beam into parallel light beams, the plurality of semiconductor lasers and a plurality of collimating lenses are provided. And a second light source unit configured in the same manner as the first light source unit, and a first light source unit having a support member for integrally supporting them in the main scanning direction with respect to the emission axis, It comprises beam combining means for emitting the light beams of the first and second light source units close to each other.

  The multi-beam light source device according to claim 4 is the multi-beam light source device according to claim 3, wherein either one of the first and second light source portions is 2N (even number) (N = 1). , 2,...), And a ratio of the semiconductor laser interval D to the collimator lens interval d with respect to a spot interval sandwiching at least the emission axis of a plurality of beam spots from the light source unit. By making D / d different, the beam spot interval L from the other light source unit having N semiconductor lasers is set to N + 1 times.

  6. A multi-beam light source device according to claim 5, wherein 2N + 1 (odd number) (N = 1, 2,...) Semiconductor lasers and collimators provided in pairs with the semiconductor lasers to make each light beam a parallel light beam. A lens, and a support member that integrally arranges the 2N + 1 semiconductor lasers and the collimating lens in the main scanning direction and symmetrically arranged with the optical axis of the semiconductor laser located at the center as the emission axis. A first light source unit having 2N or 2N + 2 (even number) semiconductor lasers, a collimating lens that is provided in pairs with the semiconductor laser and makes each light beam a parallel light beam, and the 2N or 2N + 2 semiconductor lasers, A second light source unit having a collimating lens arranged symmetrically with respect to the emission axis in the main scanning direction, and a support member that integrally supports the collimating lens; and from the first and second light source units And it is characterized in that comprising a beam combining means for injection in close proximity to the beam.

The multi-beam light source device according to claim 6 is the multi-beam light source device according to any one of claims 2 to 5, wherein the beam synthesizing unit includes a second light source unit arranged on an emission axis of the first light source unit. It is characterized in that the injection axis is made to coincide with the injection axis.
The multi-beam light source device according to claim 7 is the multi-beam light source device according to any one of claims 2 to 6, wherein the first and second light source units and the beam combining means are substantially integrated. And is detachably attached to the optical housing, and is rotatably supported with the emission axis of the first light source unit as a rotation axis.
Furthermore, the multi-beam light source device according to claim 8 is the multi-beam light source device according to any one of claims 2 to 7, wherein the beam combining means is one of the first and second light source units. Polarized light that is emitted by combining a half-wave plate that collectively converts the phases of the polarization directions of a plurality of beams, a plurality of beams that have passed through the half-wave plate, and a beam from the other light source unit. It comprises a beam splitter.

  2. The multi-beam light source device according to claim 1, wherein a plurality of semiconductor lasers, a plurality of collimating lenses provided in pairs with the semiconductor lasers to make each light beam a parallel light beam, and the plurality of semiconductor lasers and the collimating lens are subjected to main scanning. A light source unit having a support member that is arranged in a direction and integrally supports them, the semiconductor laser interval D and the collimator lens interval d have a relationship of D / d> 1, and the light source unit is emitted. By supporting the shaft so that it can be positioned in the direction of rotation about the rotation axis, the relative position is maintained against environmental changes even with a combination of general-purpose semiconductor lasers, and stable optical axis accuracy can be maintained. In addition, a multi-beam light source device that can adjust the pitch in the sub-scanning direction can be realized.

  3. The multi-beam light source device according to claim 2, wherein a general-purpose semiconductor laser, a collimating lens for converting a light beam from the semiconductor laser into a parallel beam, the semiconductor laser and the collimating lens are arranged on an emission axis, and these are integrated. A plurality of semiconductor lasers, a plurality of collimating lenses provided in pairs with the semiconductor lasers, each of which collimates each light beam, and the plurality of semiconductor lasers. A beam composition in which a collimating lens is arranged symmetrically with respect to an emission axis and a support member that integrally supports the collimating lens and a light beam emitted from the first and second light source units are brought close to each other and emitted. The multi-beam light source device with a further increased number of beams can be provided in a small size and at a low cost. It is possible to cope with the reduction.

  In the multi-beam light source device according to claim 3, a plurality of semiconductor lasers, a plurality of collimating lenses provided in pairs with the semiconductor lasers to make each light beam a parallel beam, the plurality of semiconductor lasers, and a plurality of collimating lenses are provided. A first light source unit having a support member that is arranged symmetrically with respect to the emission axis in the main scanning direction and integrally supports them, a second light source unit configured similarly to the first light source unit, and the first light source unit By comprising the beam combining means that emits the light beams of the first and second light source units close to each other, a multi-beam light source device with a further increased number of beams can be provided in a small size and at a low cost. It is possible to cope with high-speed and high-density recording devices.

  The multi-beam light source device according to claim 4 is the multi-beam light source device according to claim 3, wherein either one of the first and second light source units is 2N (even number) (N = 1). , 2,...), And a ratio of the semiconductor laser interval D to the collimator lens interval d with respect to a spot interval sandwiching at least the emission axis of a plurality of beam spots from the light source unit. By making D / d different, the beam spot interval L from the other light source unit having N semiconductor lasers is set to N + 1 times the beam spot interval L, so that the beam spots of the first and second light source units do not overlap. It is possible to easily and reliably change the pitch in the sub-scanning direction by a simple operation of aligning and rotating the light source unit.

  6. The multi-beam light source device according to claim 5, wherein 2N + 1 (odd number) (N = 1, 2,...) Semiconductor lasers and a collimating lens provided in pairs with the semiconductor lasers to make each light beam a parallel light beam. And a support member that integrally arranges the 2N + 1 semiconductor lasers and the collimating lens in the main scanning direction and symmetrically arranges the optical axis of the semiconductor laser located at the center thereof as the emission axis. 1 light source section, 2N or 2N + 2 (even number) semiconductor lasers, a collimating lens provided in pairs with the semiconductor lasers to make each light beam a parallel light flux, and the 2N or 2N + 2 semiconductor lasers and collimating lenses are mainly used. A second light source unit having a support member which is disposed symmetrically with respect to the emission axis in the scanning direction and integrally supports them; and the optical beam from the first and second light source units. It is possible to provide a multi-beam light source device with an increased number of beams in a compact and low-cost manner, and to cope with high-speed and high-density recording devices. can do. In addition, since the beam spots of the first and second light source units are alternately arranged without overlapping, it is possible to easily and reliably change the pitch in the sub-scanning direction by a simple operation of rotating the light source unit. Furthermore, since a beam spot interval that is ½ of the element interval (interval between the semiconductor laser and the collimating lens) between the first and second light source units can be obtained, the number of beams can be further increased with a predetermined element size. Thus, the multi-beam light source device can be further miniaturized.

6. The multi-beam light source device according to claim 6, wherein the beam combining means includes a second light source unit arranged on an emission axis of the first light source unit. By making the emission axes coincide with each other, the beam spot interval (pitch) P in the sub-scanning direction can be adjusted by adjusting only the inclination θ of the first and second light source sections. Work is simplified and assembly efficiency is improved.
Further, in the multi-beam light source device according to claim 7, in the multi-beam light source device according to any one of claims 2 to 6, the first and second light source units and the beam combining means are substantially integrated. And a simple drive means for rotating the holder by being rotatably supported by using the emission axis of the first light source unit as a rotation axis. By just doing this, it becomes possible to correct when the pitch in the sub-scanning direction fluctuates over time and to switch the recording density.
Furthermore, in the multi-beam light source device according to claim 8, in the multi-beam light source device according to any one of claims 2 to 7, the beam combining means is one of the first and second light source units. Polarized light that is emitted by combining a half-wave plate that collectively converts the phases of the polarization directions of a plurality of beams, a plurality of beams that have passed through the half-wave plate, and a beam from the other light source unit. By comprising the beam splitter, there is almost no light loss, the number of beams can be increased with a minimum light emission output, and a multi-beam light source device having a plurality of beams can be easily realized.

  Hereinafter, embodiments of the present invention will be described in detail based on the illustrated examples.

  FIG. 1 is an explanatory diagram of a configuration of a multi-beam light source device showing an embodiment of the present invention, and shows a four-beam light source unit using a total of four general-purpose semiconductor lasers. In FIG. 1, the semiconductor lasers 101 and 102 are fitted in fitting holes (not shown) formed in parallel at intervals of 6 mm in the main scanning direction (Y direction in the figure) on the back side of the support member 103 made of aluminum die cast. Each is press-fitted and supported. The collimating lenses 104 and 105 provided in pairs with the semiconductor lasers 101 and 102 are aligned in the X direction so that the divergent light beams of the semiconductor lasers 101 and 102 become parallel light beams, and predetermined beam emission is performed. The Y and Z directions are aligned so that the direction is the same, and the adhesive is placed in the gap between the U-shaped support portions 103-1 and 103-2 of the support member 103 formed in pairs with the fitting holes of the semiconductor lasers 101 and 102. Is fixed and constitutes the first light source part LD1. The second light source part LD2 is also composed of semiconductor lasers 106 and 107, collimating lenses 108 and 109, and a support member 103 ', and has the same configuration as the first light source part LD1. In the above embodiment, the semiconductor lasers 101 and 102 and the collimating lenses 104 and 105 are directly supported by the supporting member 103, and the semiconductor lasers 106 and 107 and the collimating lenses 108 and 109 are directly supported by the supporting member 103 ′. However, a member that holds the semiconductor laser or a member that holds the collimating lens may be interposed and supported by the support member. In this case, the holding member and the support member are made of the same material or equivalent thermal characteristics. It is desirable that the material has.

  FIG. 2A shows the first light source portion LD1, the second light source portion LD2, and the beam combining prism 111 in the X and Y directions of the first light source portion of the multi-beam light source unit in which the beam combining prism 111 is incorporated in the holder 110. The state of a parallel section is shown. The semiconductor lasers 101 and 102 and the collimating lenses 104 and 105 are arranged symmetrically with respect to the emission axis a of the first light source unit, and the interval d of the collimating lenses 104 and 105 is set with respect to the interval D of the semiconductor lasers 101 and 102. It is set to be small (D / d> 1) (that is, the optical axes of the collimating lenses 104 and 105 are arranged eccentric to the exit axis a side in the Y direction, and the U-shaped support portion 103-1 of the support member 103 is arranged. , 103-2 with an adhesive 113). As a result, the laser beams from the semiconductor lasers 101 and 102 are emitted by the collimating lenses 104 and 105 at an angle α in the intersecting direction.

  The first light source part LD1 is in close contact with a reference surface provided on the back surface of the holder 110 so that the emission axis a is aligned with the center a ′ of the cylindrical part 110-1 serving as the rotation reference of the holder 110, and from the front side of the holder 110. It is fixed by the threaded screw 114. The second light source part LD2 is also configured in the same manner as the first light source part LD1, and its exit beam is made up of all beams by combining the exit axis with the exit axis a of the first light source part LD1 by the beam combining prism 111. Are injected in the state of being adjacent. The beam combining prism 111 is fitted and fixed from the back side of the holder 110 before the first and second light source parts are attached.

Here, as shown in FIG. 2B, the first light source portion LD1 is installed with an inclination of θ from the main scanning direction (Y direction) to the sub-scanning direction (Z direction) with the emission axis a as the rotation center. However, the beam spot interval in the sub-scanning direction on the surface to be scanned such as the photosensitive member can be adjusted by adjusting the tilt amount θ. Similarly, the beam spot interval in the sub-scanning direction can be adjusted for the second light source unit LD2.
Since the first light source unit LD1 and the second light source unit LD2 have the same beam spot interval L, the main scanning direction (Y direction) to the sub scanning direction (Z) with the emission axis a (= a ′) as the rotation center. By setting the tilt amount θ in the direction) different from θ1 for the first light source unit and θ2 for the second light source unit, as shown in FIG. The two beam spots LD1-L, LD1-R on the surface of the photoreceptor of the portion LD1 and the two beam spots LD2-L, LD2-R of the second light source portion LD2 are equal in the sub-scanning direction (Z direction). It can be adjusted so that the pitch P of the interval (recording density pitch) is obtained.

  Also, by changing the above-mentioned d / D between the first light source part LD1 and the second light source part LD2 to make the emission angles α of the respective beams different, the pitch P at equal intervals in the sub-scanning direction on the photoreceptor surface. Is obtained. In this case, since the relationship L = f (α) with the beam spot interval L on the photosensitive member surface with respect to the emission angle α is not uniform (linear) by the imaging optical system, the first light source unit LD1 and the second light source LD1 and the second However, the ratio of the two beam spots of the second light source part LD2 to 3 · L with respect to the two beam spot distances L on the photoreceptor surface of the first light source part LD1 is not defined. The first light source unit LD1 has the same inclination amount θ from the main scanning direction to the sub-scanning direction with the emission axis a (= a ′) of the first light source unit LD1 and the second light source unit LD2 as the rotation center. The beam spots of the second light source part LD2 are arranged on a straight line as shown in FIG. 6, so that the pitch P (recording density pitch) is equally spaced in the sub-scanning direction.

  Thus, if the beam spots LD1-R and LD1-L of the first light source part LD1 and the beam spots LD2-R and LD2-L of the second light source part LD2 are arranged on the same straight line, By rotating the injection axis a in accordance with the central axis a ′ of the cylindrical portion 110-1 of the holder 110, the pitch P can be varied in proportion thereto. In the case where the beam spots are arranged as shown in FIG. 6, the cylindrical portion 110-1 of the holder 110 shown in FIG. 1 is rotatably held by a holding member (not shown), and the lever 110 provided on the side wall portion of the holder 110. The pitch P can be easily adjusted by providing a mechanism for rotating the holder 110 by moving -2 upward or downward.

  The beam combining prism 111 shown in FIG. 1 includes a polarization beam splitter surface 111-1 therein, and a half-wave plate (λ / 2 plate) 112 is provided on the incident surface of the beam from the second light source unit LD2. A reflection surface 111-2 that is provided and reflects the beam from the second light source unit LD2 is provided. The beam from the first light source unit LD1 is transmitted through the polarization beam splitter surface 111-1 as it is, and the beam from the second light source unit LD2 is a half-wave plate. The polarization direction is rotated 90 degrees by 112, reflected upward by the inclined surface 111-2, and further reflected by the polarization beam splitter surface 111-1 and emitted. As a result, it is possible to easily synthesize the beams from the first and second light source units while reducing the light amount loss.

  Next, FIG. 3 is a configuration explanatory view of a multi-beam light source device showing another embodiment of the present invention, and shows a three-beam light source unit using a total of three general-purpose semiconductor lasers. In the three-beam light source unit shown in FIG. 3, the semiconductor laser 201 of the first light source unit LD1 is disposed at the center of the support member 203, and is supported with the collimating lens 202 in alignment with the optical axis. The second light source unit LD2 includes two semiconductor lasers 204 and 205, a pair of the semiconductor lasers, two collimating lenses 207 and 208 that convert the respective light beams into parallel luminous fluxes, and a support member 206 that supports them. Thus, the configuration is the same as that of the first and second light source portions of FIG. 1 described above, and the state of the cross section parallel to the X and Y directions is the same as that of FIG. The first light source unit LD1, the second light source unit LD2, and the beam combining prism 211 are incorporated in the holder 210, and two beams from the second light source unit LD2 are combined with the first light source unit LD1 by the beam combining prism 211. Injection is performed with the injection axis a aligned. Note that the optical axis of the semiconductor laser 201 and the collimating lens 202 of the first light source LD1 and the emission axis a coincide with each other, and the emission axis a is the center a ′ of the cylindrical portion 210-1 that serves as the rotation reference of the holder 210. It is adapted to.

  Accordingly, as shown in FIG. 7, the two light spots LD2 are adjusted by adjusting the tilt amount θ in the sub-scanning direction (Z direction) of the second light source section LD2 around the beam spot of the first light source section LD1. By arranging -R and LD2-L on a straight line, pitches P (recording density pitch) at equal intervals in the sub-scanning direction can be obtained. According to this arrangement, the injection axis a is aligned with the center a ′ of the cylindrical portion 210-1 of the holder 210, and the holder 210 is rotated about the injection axis a = a ′ to adjust the tilt amount θ. Thus, the pitch P can be varied in proportion thereto. A mechanism for rotating the holder 210 by holding the cylindrical portion 210-1 of the holder 210 rotatably with a holding member (not shown) and moving the lever 210-2 provided on the side wall of the holder 210 upward or downward is provided. Therefore, the pitch P can be easily adjusted.

  Next, FIG. 4 is a diagram showing an outline of a multi-beam optical scanning device using a four-beam light source unit having the same configuration as in FIG. Each beam emitted from the light source unit 400 crosses in the vicinity of the reflection position of the polygon mirror 403 as a deflecting unit via the cylinder lens 402 and is then deflected and scanned by the polygon mirror 403. Each beam passes through the two-piece fθ lens 404, is reflected by the folding mirror 405 toward the photosensitive drum 407, is imaged on the photosensitive drum 407 by the toroidal lens 406, and has a predetermined pitch P in the sub-scanning direction. Four adjacent lines are drawn simultaneously for each beam. Further, a mirror 408 for synchronization detection is provided outside the image area of the folding mirror 405, and a beam reflected by the mirror 408 is detected by the synchronization detection sensor 409, and scanning of each beam in the main scanning direction S is started. The position is detected.

  Here, the beam spots LD1-R and LD1-L by the first light source part LD1 and the beam spots LD2-R and LD2-L by the second light source part LD2 are arranged in the arrangement as shown in FIG. The embodiment set (separated in the direction) will be described. Since the beams are incident on the synchronization detection sensor 409 in time series, the detection timing of each beam is separated to take the writing timing individually. If the beam spots are not separated in the main scanning direction, the beam passing through the synchronization detection sensor 409 is first detected and delayed by a predetermined amount to obtain the timing of the other beams.

Further, a linear sensor 411 is arranged at the scanning end position in the vicinity of the photosensitive drum 407 in the sub-scanning direction. For example, only two beams of the second light source unit LD2 are turned on and the beam interval is measured. Even if the scanning line interval changes due to environmental changes or parts replacement, it is corrected so that the predetermined value is always maintained. In the case of the arrangement of FIG. 6, this measured value is ideally three times the recording pitch P (3 · P), and the pitch calculation unit 412 calculates the amount of deviation of the measured value from 3 · P. The calculation result is sent to the motor control unit 413, the motor control unit 413 drives the stepping motor 414 by an angle (converted value) corresponding to the deviation, and the lever 410-1 provided integrally with the holder 410 is moved. If the holder 410 of the light source unit 400 is rotated in the γ direction with the emission axis as the rotation center by being pushed up or pulled down, the shift in the recording pitch P in the sub-scanning direction can be corrected.
Further, when a recording density variable signal is received from an operation unit (not shown) and the recording pitch P to be set is switched, the motor control unit 413 drives the stepping motor 414 in the same manner, and the recording pitch in the sub-scanning direction. P is varied.

  In the embodiment described above, the beam spots are arranged symmetrically with respect to the emission axis a by aligning the emission axes a of the first and second light source parts LD1 and LD2, and the emission axis a is set to the rotation center a ′ of the holder. The pitch P in the sub-scanning direction is varied by rotating in accordance with the rotation angle, but not limited to this, and as shown in FIG. 8, the emission axes a1 and a2 of the first and second light source portions LD1 and LD2 Are arranged symmetrically with respect to the rotation center a ′ of the holder, and the tilt amounts θ1 and θ2 in the sub-scanning direction of the first and second light source parts LD1 and LD2 are adjusted, respectively, so that each beam spot LD1-R , LD1-L, LD2-R, and LD2-L can also vary the pitch P by rotation about the rotation center a ′ of the holder by combining the beams so that they are arranged in series.

  Incidentally, in the embodiment of FIG. 1, an example in which two semiconductor lasers are used for each of the first light source unit LD1 and the second light source unit LD2 is shown, and in the embodiment of FIG. 2, the first light source unit LD1 includes Although an example in which one semiconductor laser is used and two semiconductor lasers are used for the second light source unit LD2 is shown, a configuration in which more semiconductor lasers are used for the first and second light source units is used. be able to.

  FIG. 9 is a diagram showing an example of a configuration in which many semiconductor lasers are used in the first and second light source units, and an example of an 8-beam light source unit using a total of eight general-purpose semiconductor lasers. The light source section LD1 main scans four semiconductor lasers 501, 502, 503, and 504, and collimating lenses 505, 506, 507, and 508, which are provided in pairs with the semiconductor lasers and convert the light beams into parallel light beams. The second light source unit LD2 is similarly arranged with four semiconductor lasers 511, 512, 513, and 514, and arranged in the direction (Y direction in the figure) and integrally supported by the support member 509. The collimating lenses 515, 516, 517, and 518, which are provided in pairs with the semiconductor laser and convert each light beam into parallel light beams, are arranged in the main scanning direction and are integrally supported by the support member 509. The first and the second light source unit and the beam combining prism 520, are assembled integrally with the configuration of the holder (not shown) as shown in FIG.

  The beam combining prism 520 includes a polarization beam splitter surface 520-1 in the same manner as in FIG. 1, and a half-wave plate (λ / 2 plate) 521 on the incident surface of the beam from the second light source unit LD 2. And a reflection surface 520-2 for reflecting the beam from the second light source part LD2. The four beams from the first light source unit LD1 pass through the polarization beam splitter surface 520-1 as they are, and the four beams from the second light source unit LD2 have a ½ wavelength. The polarization direction is rotated 90 degrees by the plate 521, reflected upward by the inclined surface 520-2, and further reflected by the polarization beam splitter surface 520-1 and emitted. Thereby, it is possible to easily synthesize a plurality of beams from the two light source units with less light loss.

  Here, FIG. 10 shows an example of the arrangement of beam spots on the surface of the photosensitive member when four semiconductor lasers are used for the first and second light source sections. In this example, among the four beam spots LD1-R, LD1-RR, LD1-L, and LD1-LL from the first light source unit LD1 in FIG. 9, the beam spot LD1-R that sandwiches the emission axis a ′. As for the interval LD1-L, the semiconductor laser interval (interval between adjacent semiconductor lasers 502 and 503 with respect to the emission axis a ′) D and the collimator lens interval (interval between adjacent collimator lenses 506 and 507 with respect to the emission axis a ′). ) By making the ratio D / d different from d, it becomes five times the interval L between the four beam spots LD2-R, LD2-RR, LD2-L, LD2-LL from the second light source part LD2. And the beam spot row of the second light source part LD2 is arranged between them. In addition, the distance between the beam spots LD1-R and LD1-RR from the first light source unit LD1 and the distance between the LD1-L and LD1-LL are L. By setting in this way, the beam spots of the first and second light source units can be aligned on a straight line at equal intervals L without overlapping, so that the light source unit can be aligned with the emission axis a ′ (rotation of a holder not shown). The scanning line interval (recording density pitch) P in the sub-scanning direction can be reliably changed by a simple operation of rotating around the center.

  Note that there are many other arrangement methods if the beam spot intervals of the first and second light source units are changed at a plurality of locations. However, since the operation becomes complicated and may cause confusion and cause an operation error, the interval is used here. I showed how to change as little as possible.

  Next, FIG. 11 is a diagram showing another example of a configuration in which many semiconductor lasers are used for the first and second light source units, and an example of a 7-beam light source unit using a total of seven general-purpose semiconductor lasers. is there. The first light source unit LD1 includes three semiconductor lasers 601, 602, and 603 and collimating lenses 604, 605, and 606 that are provided in pairs with the semiconductor lasers and convert the light beams into parallel light beams in the main scanning direction (see FIG. The first semiconductor laser 602 and the collimating lens 605 are arranged on the emission axis a ′, and the others are arranged in the Y direction in the middle and integrally supported by the support member 607. They are arranged symmetrically with respect to the injection axis a ′. The second light source unit LD2 mainly includes four semiconductor lasers 608, 609, 610, and 611 and collimating lenses 612, 613, 614, and 615 that are provided in pairs with the semiconductor lasers and convert the light beams into parallel light beams. It is configured to be integrally supported by a support member 616 arranged in the scanning direction and symmetrically with respect to the emission axis a ′. Further, the first and second light source units and the beam combining prism 617 are integrally assembled to a holder (not shown) having a configuration as shown in FIG.

  As in FIG. 1, the beam combining prism 617 includes a polarization beam splitter surface 617-1 therein, and a half-wave plate (λ / 2 plate) is formed on the incident surface of the beam from the second light source unit LD2. 618 is provided, and a reflection surface 617-2 for reflecting the beam from the second light source unit LD2 is provided. The three beams from the first light source part LD1 pass through the polarization beam splitter surface 617-1 as they are, and the four beams from the second light source part LD2 have a half wavelength. The polarization direction is rotated 90 degrees by the plate 618, reflected upward by the inclined surface 617-2, and further reflected by the polarization beam splitter surface 617-1 and emitted. Thereby, it is possible to easily synthesize a plurality of beams from the two light source units with less light loss.

  Here, FIG. 12 shows an example of the arrangement of beam spots on the photosensitive member surface when three semiconductor lasers are used for the first light source unit LD1 and four semiconductor lasers are used for the second light source unit LD2. Yes. In this example, the interval between the three beam spots LD1-R, LD1-C, LD1-L from the first light source unit LD1 in FIG. 11 is L, and the four beam spots LD2- from the second light source unit LD2 are set. The intervals of R, LD2-RR, LD2-L, and LD2-LL are also L, and the beam spots from the first and second light source units are alternately arranged at equal intervals.

  As shown in FIG. 12, when the number of semiconductor lasers of the first and second light source units is an odd number (2N + 1 (N = 1, 2,...)) And an even number (2N + 2), as shown in FIG. The beam spots from the first and second light source units can be alternately aligned at equal intervals, and the pitch P in the sub-scanning direction can be varied in proportion to the rotation angle simply by rotating around the emission axis a ′. be able to. In addition, when there is only one light source unit, the beam spot interval L corresponds to the interval of the semiconductor laser, and therefore the size of the semiconductor laser or the collimating lens itself must be reduced to reduce the interval in order to bring the beam spot close. 11 and 12, since the beam spots of the first and second light source units are alternately arranged, the beam spot interval of each light source unit is L (pitch in the sub-scanning direction). 2P), the effective beam spot interval after beam synthesis is L / 2 (pitch P in the sub-scanning direction), and the number of beams can be increased by a predetermined element size. That is, the multi-beam light source device is downsized. Is possible.

  In the embodiment shown in FIG. 3, the number of semiconductor lasers in the first and second light source units is odd (2N + 1 (N = 1, 2,...)) And even (2N + 2). In the combination, an example of N = 0 is shown, but when N = 0, there is only one pair of the semiconductor laser and the collimating lens of one light source, so the angles θ of the first and second light source units are matched. There is no need, and if each light source part is simply assembled in the holder, the beam spot on the surface of the photoconductor is aligned on a straight line, so that the assembly is excellent and the amount of eccentricity between the semiconductor laser and the collimating lens is minimized. A conventional optical system for recording with one beam can be used as it is (substituting only the light source unit).

  In the embodiment of the present invention described above, as the beam combining means, the phases of the polarization directions of a plurality of beams from the second light source unit among the first and second light source units are collectively converted. A beam combining prism (111, 211, 520) having a half-wave plate, and a polarization beam splitter surface that emits a plurality of beams that have passed through the half-wave plate and a beam from the first light source unit. , 617).

  In order to increase the number of beams in the conventional beam combining method, for example, as shown in FIG. 13, an optical element in which a plurality of beam splitter surfaces (BS surfaces) are arranged in parallel is used and the beam splitter surface is passed a plurality of times. Can be considered. Usually, the amount of light transmitted and reflected on the beam splitter surface is halved, so the beam of the first semiconductor laser LD-1 is phase-polarized using a half-wave plate (λ / 2 plate). Is rotated 90 degrees and the polarization beam splitter surface (polarization BS surface), which is the final synthesis surface, is transmitted, the amount of light emitted from the polarization beam splitter surface, which is the final synthesis surface, is the first semiconductor laser LD-1. The second semiconductor laser LD-2 passes one BS surface more than the amount of emitted light 1, so that the amount of emitted light is ½. In the third semiconductor laser LD3 and the fourth semiconductor laser LD-4, Since two light passes through the BS surface, the amount of emitted light becomes ¼, and the amount of light loss increases as the number of beams increases, which is limited by the output of the semiconductor laser.

  On the other hand, in the beam combining means of the present invention, since the plurality of beams from the first and second light source sections only pass through the polarization beam splitter surface once, there is almost no loss in light amount, and a minimum light emission output. The number of beams can be increased with a multi-beam light source device having a plurality of beams using a general-purpose semiconductor laser, such as the light source unit of 3, 4, 7, or 8 beams shown in the embodiment. It can be easily realized.

BRIEF DESCRIPTION OF THE DRAWINGS It is a figure which shows one Example of this invention, Comprising: It is a perspective view which shows schematic structure of the multibeam light source device of 4 beams. It is explanatory drawing of the principal part structure of the multi-beam light source device shown in FIG. 1, (a) is a figure which shows the cross section parallel to the X and Y direction of the 1st light source part of a multi-beam light source device, (b) is. It is the figure which looked at the semiconductor laser of the 1st light source part from the X direction back side. It is a figure which shows another Example of this invention, Comprising: It is a perspective view which shows schematic structure of the multi-beam light source device of 3 beams. FIG. 2 is a configuration explanatory diagram of an optical scanning device using the multi-beam light source device shown in FIG. 1. It is a figure which shows the example of an arrangement | sequence of the beam spot on the photoreceptor surface at the time of using the multi-beam light source device of 4 beams shown in FIG. FIG. 6 is a diagram showing another example of arrangement of beam spots on the photosensitive member surface when the 4-beam multi-beam light source device shown in FIG. 1 is used. It is a figure which shows the example of an arrangement | sequence of the beam spot on the photoreceptor surface at the time of using the multi-beam light source device of 3 beams shown in FIG. FIG. 6 is a diagram showing still another example of arrangement of beam spots on the photoreceptor surface when the 4-beam multi-beam light source device shown in FIG. 1 is used. It is a figure which shows another Example of this invention, Comprising: It is a principal part perspective view which shows schematic structure of the multi-beam light source device of 8 beams. It is a figure which shows the example of an array of the beam spot on the photoreceptor surface at the time of using the multi-beam light source device of 8 beams shown in FIG. It is a figure which shows another Example of this invention, Comprising: It is a principal part perspective view which shows schematic structure of the multi-beam light source device of 7 beams. It is a figure which shows the example of an array of the beam spot on the photoreceptor surface at the time of using the multi-beam light source device of 7 beams shown in FIG. It is a figure which shows an example of the conventional beam synthetic | combination means.

Explanation of symbols

101, 102, 106, 107, 201, 204, 205, 501 to 504, 511 to 514, 601 to 603, 608 to 611: Semiconductor lasers 104, 105, 108, 109, 202, 207, 208, 505 to 508, 515-518, 604-606, 612-615: Collimating lens 103, 103 ', 203, 206, 509, 519, 607, 616: Support member 110, 210, 410: Holder (optical housing)
111, 211, 520, 617: Beam combining prism (beam combining means)
111-1, 211-1, 520-1, 617-1: Polarized beam splitter surfaces 112, 212, 521, 618: 1/2 wavelength plate 400: Multi-beam light source unit 402: Cylinder lens 403: Polygon mirror 404: fθ Lens 405: Folding mirror 406: Toroidal lens 407: Photosensitive drum 408: Mirror for synchronization detection 409: Synchronization detection sensor 411: Linear sensor LD1: First light source unit LD2: Second light source unit

Claims (8)

  A plurality of semiconductor lasers, a plurality of collimating lenses that are provided in pairs with the semiconductor lasers to make each light beam a parallel light beam, and the plurality of semiconductor lasers and a plurality of collimating lenses are arranged in the main scanning direction. A light source unit having a support member that supports the light source unit; the semiconductor laser interval D and the collimating lens interval d have a relationship of D / d> 1, and the light source unit is rotated about an emission axis as a rotation axis. A multi-beam light source device characterized by being supported so as to be positionable in a direction. A semiconductor laser; a collimating lens that converts a light beam from the semiconductor laser into a parallel light beam; and a support member that integrally arranges the semiconductor laser and the collimating lens on an emission axis. A light source unit;
A plurality of semiconductor lasers, a plurality of collimating lenses which are provided in pairs with the semiconductor lasers and make each light beam a parallel light beam, and the plurality of semiconductor lasers and a plurality of collimating lenses are arranged symmetrically with respect to the emission axis. A second light source unit having a support member that supports the unit integrally;
A multi-beam light source apparatus comprising: beam combining means for emitting the light beams of the first and second light source units close to each other. A plurality of semiconductor lasers, a plurality of collimating lenses which are provided in pairs with the semiconductor lasers and make each light beam a parallel light beam, and the plurality of semiconductor lasers and the plurality of collimating lenses are symmetrical with respect to the emission axis in the main scanning direction. A first light source unit having a support member that is arranged and integrally supports them;
A second light source configured similarly to the first light source;
A multi-beam light source apparatus comprising: beam combining means for emitting the light beams of the first and second light source units close to each other.   4. The multi-beam light source device according to claim 3, wherein either one of the first and second light source units includes 2N (even) (N = 1, 2,...) Semiconductor lasers. By configuring the collimating lens and changing the ratio D / d between the semiconductor laser interval D and the collimating lens interval d for the spot interval sandwiching at least the emission axis of the plurality of beam spots from the light source unit, N pieces can be obtained. A multi-beam light source device characterized in that the beam spot interval L from the other light source unit having the semiconductor laser is N + 1 times. 2N + 1 (odd number) (N = 1, 2,...) Semiconductor lasers, a collimating lens provided in pairs with the semiconductor lasers to parallelize the respective light beams, and the 2N + 1 semiconductor lasers and collimators. A first light source unit having a support member that arranges the lenses in the main scanning direction and symmetrically arranges the optical axis of the semiconductor laser located in the center thereof as the emission axis and supports them integrally.
2N or 2N + 2 (even number) semiconductor lasers, a collimating lens provided in pairs with the semiconductor laser to make each light beam a parallel beam, and the 2N or 2N + 2 semiconductor lasers and the collimating lens are emitted in the main scanning direction. A second light source unit having a support member that is arranged symmetrically with respect to the axis and integrally supports them;
A multi-beam light source device comprising beam combining means for emitting the light beams from the first and second light source units close to each other.   6. The multi-beam light source device according to claim 2, wherein the beam combining means emits light with the emission axis of the second light source unit aligned with the emission axis of the first light source unit. A multi-beam light source device.   7. The multi-beam light source device according to claim 2, wherein the first and second light source units and the beam combining unit are substantially integrated into a module and detachable from the optical housing. A multi-beam light source device, wherein the multi-beam light source device is rotatably supported with the emission axis of the first light source unit as a rotation axis. The multi-beam light source device according to any one of claims 2 to 7, wherein the beam synthesizing unit collects the phases of the polarization directions of a plurality of beams for one of the first and second light source units. A multi-beam comprising: a half-wave plate to be converted, and a polarization beam splitter that emits a plurality of beams that have passed through the half-wave plate and a beam from the other light source unit. Light source device.

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