JP2006078479A - 自動ポート延長校正を含むネットワークアナライザ及び動作方法 - Google Patents

自動ポート延長校正を含むネットワークアナライザ及び動作方法 Download PDF

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Publication number
JP2006078479A
JP2006078479A JP2005237480A JP2005237480A JP2006078479A JP 2006078479 A JP2006078479 A JP 2006078479A JP 2005237480 A JP2005237480 A JP 2005237480A JP 2005237480 A JP2005237480 A JP 2005237480A JP 2006078479 A JP2006078479 A JP 2006078479A
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Japan
Prior art keywords
network analyzer
measurement data
test fixture
delay
value
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Pending
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JP2005237480A
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Japanese (ja)
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JP2006078479A5 (enExample
Inventor
Joel Dunsmore
ジョエル・ダンスモア
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication of JP2006078479A publication Critical patent/JP2006078479A/ja
Publication of JP2006078479A5 publication Critical patent/JP2006078479A5/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2005237480A 2004-09-13 2005-08-18 自動ポート延長校正を含むネットワークアナライザ及び動作方法 Pending JP2006078479A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/939,670 US7088087B2 (en) 2004-09-13 2004-09-13 Network analyzer including automatic port extension calibration and method of operation

Publications (2)

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JP2006078479A true JP2006078479A (ja) 2006-03-23
JP2006078479A5 JP2006078479A5 (enExample) 2008-09-18

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JP2005237480A Pending JP2006078479A (ja) 2004-09-13 2005-08-18 自動ポート延長校正を含むネットワークアナライザ及び動作方法

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US (1) US7088087B2 (enExample)
JP (1) JP2006078479A (enExample)
DE (1) DE102005027925A1 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104111432A (zh) * 2013-04-16 2014-10-22 安捷伦科技有限公司 扩展操作范围上的测试工具的校准
JP2015520368A (ja) * 2012-05-18 2015-07-16 エムティーエス システムズ コーポレイション 位相特性を合致させるように遅延を使用する変換器加速度補償
JP2017106921A (ja) * 2015-12-09 2017-06-15 テクトロニクス・インコーポレイテッドTektronix,Inc. 信号測定方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007018096A1 (de) * 2007-04-17 2008-10-23 Rohde & Schwarz Gmbh & Co. Kg Verfahren zur Ermittlung von Zeitunterschieden zwischen durch zumindest zwei gekoppelte Messgeräte gemessenen Signalen sowie Messsystem und entsprechende Umschaltvorrichtung
US7777497B2 (en) * 2008-01-17 2010-08-17 Com Dev International Ltd. Method and system for tracking scattering parameter test system calibration
DE102010035191A1 (de) * 2010-08-24 2012-03-01 Rohde & Schwarz Gmbh & Co. Kg Kalibriereinrichtung für einen Netzwerkanalysator
TWI504192B (zh) * 2013-01-22 2015-10-11 Compal Broadband Networks Inc 用於校驗系統之補償方法及電腦系統
CN105182076B (zh) * 2015-09-18 2018-02-23 电子科技大学 基于矢量网络分析仪的二端口网络相移实时测试方法
CN118962557A (zh) * 2024-08-23 2024-11-15 成都玖锦科技有限公司 一种基于多区间段的源端口功率数据校准方法及系统

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US5399976A (en) * 1993-02-05 1995-03-21 Hewlett-Packard Company Group delay estimate system using least square fit to phase response ramp
US5467021A (en) * 1993-05-24 1995-11-14 Atn Microwave, Inc. Calibration method and apparatus
US6300775B1 (en) * 1999-02-02 2001-10-09 Com Dev Limited Scattering parameter calibration system and method
US6920407B2 (en) * 2000-09-18 2005-07-19 Agilent Technologies, Inc. Method and apparatus for calibrating a multiport test system for measurement of a DUT
US6836743B1 (en) * 2002-10-15 2004-12-28 Agilent Technologies, Inc. Compensating for unequal load and source match in vector network analyzer calibration
US6928373B2 (en) * 2003-01-30 2005-08-09 Anritsu Company Flexible vector network analyzer measurements and calibrations
US6882160B2 (en) * 2003-06-12 2005-04-19 Anritsu Company Methods and computer program products for full N-port vector network analyzer calibrations

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JPN7010004159, ベクトル・ネットワーク・アナライザを使用したSパラメータ・ネットワークのディエンベディングおよびエン, 20040119, JP, アジレント・テクノロジー株式会社 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015520368A (ja) * 2012-05-18 2015-07-16 エムティーエス システムズ コーポレイション 位相特性を合致させるように遅延を使用する変換器加速度補償
CN104111432A (zh) * 2013-04-16 2014-10-22 安捷伦科技有限公司 扩展操作范围上的测试工具的校准
US10042029B2 (en) 2013-04-16 2018-08-07 Keysight Technologies, Inc. Calibration of test instrument over extended operating range
JP2017106921A (ja) * 2015-12-09 2017-06-15 テクトロニクス・インコーポレイテッドTektronix,Inc. 信号測定方法

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Publication number Publication date
US20060055394A1 (en) 2006-03-16
US7088087B2 (en) 2006-08-08
DE102005027925A1 (de) 2006-03-30

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