JP2006078386A - Powder sample molding method for x-ray fluorescence analysis - Google Patents

Powder sample molding method for x-ray fluorescence analysis Download PDF

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JP2006078386A
JP2006078386A JP2004263820A JP2004263820A JP2006078386A JP 2006078386 A JP2006078386 A JP 2006078386A JP 2004263820 A JP2004263820 A JP 2004263820A JP 2004263820 A JP2004263820 A JP 2004263820A JP 2006078386 A JP2006078386 A JP 2006078386A
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sample
polymer film
powder sample
molded
ray fluorescence
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JP3968098B2 (en
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Masaji Kuraoka
正次 倉岡
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Rigaku Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a pretreatment method which enables measurement of light elements on a trace amount of powder samples of approximately a few tens of milligrams by X-ray fluorescence analyses, and easily recovering the samples after the analyses. <P>SOLUTION: For X-ray fluorescence analyses, a small amount of powder samples 1A is pressed and molded with a single sheet of polymeric film 2, in the direction of the thickness of the high molecular film 2 and is adhered to the high molecular film 2. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、微量の粉体試料を蛍光X線分析に供するために加圧成形する方法に関する。   The present invention relates to a method for pressure-molding a minute amount of a powder sample to be subjected to fluorescent X-ray analysis.

数十mg程度の微量の粉体試料を蛍光X線分析に供するために、その粉体試料だけを加圧成形しても、持ち上げるだけでに崩れてしまい、取り扱うことができない。これに対処すべく、従来、2つの前処理方法がある。第1の方法は、ホウ酸またはセルロースのペレットに設けたくぼみに粉体試料を入れて全体を加圧成形して一体化させる方法であり、第2の方法は、2枚の高分子フィルムの間に粉体試料を挟み込んで保持する方法である。   Since a small amount of a powder sample of about several tens mg is subjected to fluorescent X-ray analysis, even if only the powder sample is pressure-molded, it is broken only by lifting and cannot be handled. In order to cope with this, there are conventionally two preprocessing methods. The first method is a method in which a powder sample is placed in a recess provided in a pellet of boric acid or cellulose and the whole is pressure-molded and integrated, and the second method is a method of combining two polymer films. In this method, a powder sample is sandwiched between and held.

しかし、従来の第1の方法では、試料がフィルムなどで覆われないので、軽元素からの蛍光X線を減衰させずに検出して測定できるものの、粉体であった試料は加圧成形でペレットと一体化するので、分析後に試料を回収することが困難である。一方、従来の第2の方法では、分析後に高分子フィルムの間から粉体試料を取り出して容易に回収できるものの、軽元素からの蛍光X線が高分子フィルムで減衰されるので、軽元素の測定が困難である。つまり、数十mg程度の微量しか採取できない粉体試料について、蛍光X線分析で軽元素の測定をして、その後試料を回収して別の化学分析などに供したいという要求に応じられる前処理方法がない。   However, in the first conventional method, since the sample is not covered with a film or the like, the fluorescent X-ray from the light element can be detected and measured without being attenuated, but the sample that has been a powder is formed by pressure molding. Since it is integrated with the pellet, it is difficult to recover the sample after analysis. On the other hand, in the second conventional method, the powder sample can be taken out from between the polymer films after the analysis and can be easily recovered. However, since the fluorescent X-rays from the light elements are attenuated by the polymer film, Measurement is difficult. In other words, for powder samples that can be collected only in a few tens of mg, pre-processing that meets demands for measuring light elements by fluorescent X-ray analysis and then collecting the samples for further chemical analysis There is no way.

本発明は前記従来の問題に鑑みてなされたもので、数十mg程度の微量の粉体試料について蛍光X線分析で軽元素の測定ができ、かつ分析後に試料を容易に回収できる前処理方法を提供することを目的とする。   The present invention has been made in view of the above-described conventional problems, and a pretreatment method capable of measuring a light element by fluorescent X-ray analysis on a small amount of powder sample of about several tens of mg and easily recovering the sample after the analysis. The purpose is to provide.

前記目的を達成すべく、本発明は、微量の粉体試料を蛍光X線分析に供するために1枚の高分子フィルムとともにその高分子フィルムの厚み方向に加圧成形して前記高分子フィルムに付着させる粉体試料成形方法である。   In order to achieve the above-mentioned object, the present invention is to form a small amount of powder sample by pressure molding in the thickness direction of the polymer film together with one polymer film in order to use for fluorescent X-ray analysis. This is a powder sample forming method to be adhered.

本発明によれば、粉体試料を板状に加圧成形して片面を高分子フィルムに付着させるので、自重で高分子フィルムからはがれ落ちないように試料の方を上にして保持すれば容易に取り扱うことができ、持ち上げるだけでに崩れるようなことはない。そして、高分子フィルムに付着していない側は試料が露出しているので、軽元素からの蛍光X線を減衰させることなく測定が可能である。さらに、分析後は、試料を高分子フィルムから剥離するだけで容易に回収できる。   According to the present invention, since the powder sample is pressure-molded into a plate shape and one surface is attached to the polymer film, it is easy to hold the sample facing up so that it does not come off from the polymer film due to its own weight. It can be handled easily, and it won't collapse just by lifting. And since the sample is exposed on the side not attached to the polymer film, measurement is possible without attenuating fluorescent X-rays from light elements. Furthermore, after the analysis, the sample can be easily recovered simply by peeling it from the polymer film.

本発明においては、前記高分子フィルムが、ポリエステル、ポリプロピレンまたはポリイミドからなり、厚さが10μm以下であることが好ましい。   In this invention, it is preferable that the said polymer film consists of polyester, a polypropylene, or a polyimide, and thickness is 10 micrometers or less.

以下、本発明の一実施形態の粉体試料成形方法について、図にしたがって説明する。この方法では、まず、図1に示すように、下側加圧治具4aの上に1枚の高分子フィルム2を載せ、その上に、微量、例えば40mgの粉体試料1Aを載せる。高分子フィルム2には、X線の透過性の高い、例えば厚さ5μmのポリエステル、ポリプロピレンまたはポリイミドからなるフィルムを用いることができる。高分子フィルム2は、例えば円形で、加圧成形後に円板状になる試料1B(図2)の直径を想定して、それよりもやや大きい直径のものを用いる。なお、すべての図において、図示と理解の容易のために、フィルム2,5cや成形後の試料1Bの厚さなどは誇大に表しており、寸法関係は正確ではない。   Hereinafter, a powder sample forming method according to an embodiment of the present invention will be described with reference to the drawings. In this method, first, as shown in FIG. 1, a single polymer film 2 is placed on the lower pressurizing jig 4a, and a trace amount, for example, 40 mg of a powder sample 1A is placed thereon. As the polymer film 2, a film made of polyester, polypropylene or polyimide having a high X-ray permeability, for example, a thickness of 5 μm can be used. The polymer film 2 is, for example, circular and has a diameter slightly larger than that of a sample 1B (FIG. 2) that assumes a disk shape after pressure molding. In all the drawings, the thicknesses of the films 2 and 5c and the molded sample 1B are exaggerated for easy illustration and understanding, and the dimensional relationship is not accurate.

次に、図2に示すように、上側加圧治具4bを降ろして、粉体試料1A(図1)を高分子フィルム2とともにその高分子フィルム2の厚み方向(図2では上下方向)に例えば150kNで加圧成形して円板状に固化させるとともに、高分子フィルム2に付着させる。このとき、成形後の試料1Bの直径は例えば13mmになる。   Next, as shown in FIG. 2, the upper pressurizing jig 4b is lowered, and the powder sample 1A (FIG. 1) is put together with the polymer film 2 in the thickness direction of the polymer film 2 (vertical direction in FIG. 2). For example, it is pressure-molded at 150 kN to be solidified into a disk shape and attached to the polymer film 2. At this time, the diameter of the molded sample 1B is, for example, 13 mm.

次に、上側加圧治具4bを上げて、図3に示すように、成形後の試料1Bが自重で高分子フィルム2からはがれ落ちないように試料1Bの方を上にした状態で保持し、下側加圧治具4aから取り出す。成形後の試料1Bの片面は高分子フィルム2に付着しているので、全体を成形試料3として、試料1Bの方を上にして保持すれば、容易に取り扱うことができ、持ち上げるだけで試料1Bが崩れるようなことはない。   Next, the upper pressurizing jig 4b is raised and held with the sample 1B facing upward so that the molded sample 1B does not peel off from the polymer film 2 due to its own weight, as shown in FIG. Then, it is taken out from the lower pressurizing jig 4a. Since one side of the molded sample 1B is attached to the polymer film 2, if the entire sample 1B is held as the molded sample 3 with the sample 1B facing up, the sample 1B can be easily handled and simply lifted up. Will not collapse.

なお、図1において、下側加圧治具4aの上に粉体試料1Aを載せ、それを覆うように高分子フィルム2を被せておき、図2に示したように、上側加圧治具4bを降ろして、粉体試料1A(図1)を高分子フィルム2とともにその高分子フィルム2の厚み方向(図2では上下方向)に加圧成形して高分子フィルム2に付着させてもよい。この場合は、成形後の試料1Bが高分子フィルム2の下になるので、試料1Bと高分子フィルム2を挟持した状態で加圧治具全体4a,4bを上下逆転させてから、前述したように成形試料3を加圧治具4a,4bから取り出す。   In FIG. 1, the powder sample 1A is placed on the lower pressure jig 4a, and the polymer film 2 is placed over the powder sample 1A. As shown in FIG. 4b may be lowered, and the powder sample 1A (FIG. 1) may be pressed together with the polymer film 2 in the thickness direction of the polymer film 2 (vertical direction in FIG. 2) to adhere to the polymer film 2. . In this case, since the molded sample 1B is under the polymer film 2, the entire pressurizing jigs 4a and 4b are turned upside down with the sample 1B and the polymer film 2 sandwiched therebetween, as described above. Then, the molded sample 3 is taken out from the pressure jigs 4a and 4b.

このように前処理した成形試料3を蛍光X線分析に供する際には、図4に示すような試料ホルダ5に載置するのが好ましい。この試料ホルダ5は、中空カップである本体5aと、輪状の係止部材5bと、X線を透過させる支持フィルム5cとで構成される。より具体的には、本体5aの開口部を覆うように、本体5aの外径よりもやや直径の大きい円形の支持フィルム5cを載せ、上方から係止部材5bを本体5aの外側に嵌合させることにより、係止部材5bと本体5aとの間に支持フィルム5cの周辺部を挟持させている。支持フィルム5cには、ポリエステル、ポリプロピレン、ポリイミドなどからなるフィルムを用いることができる。   When the molded sample 3 thus pretreated is subjected to fluorescent X-ray analysis, it is preferably placed on the sample holder 5 as shown in FIG. The sample holder 5 includes a main body 5a that is a hollow cup, a ring-shaped locking member 5b, and a support film 5c that transmits X-rays. More specifically, a circular support film 5c having a diameter slightly larger than the outer diameter of the main body 5a is placed so as to cover the opening of the main body 5a, and the locking member 5b is fitted to the outside of the main body 5a from above. Thus, the periphery of the support film 5c is sandwiched between the locking member 5b and the main body 5a. A film made of polyester, polypropylene, polyimide, or the like can be used for the support film 5c.

そして、この試料ホルダ5の支持フィルム5cの上に、成形試料3を載置して、成形後の試料1Bの上面に1次X線6を照射して、発生する蛍光X線7の強度を測定する。成形後の試料1Bの上面は、フィルムなどに覆われずに試料1Bが露出しているので、軽元素からの蛍光X線7を減衰させることなく測定が可能である。また、成形後の試料1Bの下方には、X線を透過させる高分子フィルム2と支持フィルム5cしかなく、その下は空洞であるので、蛍光X線分析の際のバックグラウンドも十分に低減される。さらに、蛍光X線分析の後は、成形後の試料1Bを高分子フィルム2から剥離するだけで容易に回収でき、別の化学分析などに供することができる。   Then, the molded sample 3 is placed on the support film 5c of the sample holder 5, the primary X-ray 6 is irradiated on the upper surface of the molded sample 1B, and the intensity of the generated fluorescent X-ray 7 is increased. taking measurement. Since the upper surface of the molded sample 1B is not covered with a film or the like and the sample 1B is exposed, measurement can be performed without attenuating the fluorescent X-rays 7 from the light elements. In addition, below the molded sample 1B, there are only the polymer film 2 and the support film 5c that transmit X-rays, and the space below is a cavity, so that the background during fluorescent X-ray analysis is also sufficiently reduced. The Further, after the fluorescent X-ray analysis, the molded sample 1B can be easily recovered simply by peeling from the polymer film 2 and can be used for another chemical analysis.

本発明の一実施形態の粉体試料成形方法における、加圧前の粉体試料および高分子フィルムを示す図である。It is a figure which shows the powder sample and polymer film before pressurization in the powder sample shaping | molding method of one Embodiment of this invention. 同方法における、加圧中の試料および高分子フィルムを示す図である。It is a figure which shows the sample and polymer film in pressurization in the same method. 同方法における、加圧成形後の試料および高分子フィルムからなる成形試料を示す図である。It is a figure which shows the shaping | molding sample which consists of the sample after pressure molding and a polymer film in the same method. 同方法で得られた成形試料を蛍光X線分析に供している状態を示す図である。It is a figure which shows the state which has provided the shaping | molding sample obtained by the same method to a fluorescent X ray analysis.

符号の説明Explanation of symbols

1A 粉体試料
1B 加圧成形後の試料
2 高分子フィルム
1A Powder sample 1B Sample 2 after pressure molding 2 Polymer film

Claims (2)

微量の粉体試料を蛍光X線分析に供するために1枚の高分子フィルムとともにその高分子フィルムの厚み方向に加圧成形して前記高分子フィルムに付着させる粉体試料成形方法。   A powder sample molding method in which a minute amount of a powder sample is pressure-molded in the thickness direction of the polymer film together with a single polymer film so as to be subjected to fluorescent X-ray analysis. 請求項1において、
前記高分子フィルムが、ポリエステル、ポリプロピレンまたはポリイミドからなり、厚さが10μm以下である粉体試料成形方法。
In claim 1,
The powder sample shaping | molding method whose said polymer film consists of polyester, a polypropylene, or a polyimide, and whose thickness is 10 micrometers or less.
JP2004263820A 2004-09-10 2004-09-10 Powder sample molding and recovery method for fluorescent X-ray analysis Expired - Fee Related JP3968098B2 (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
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JP2013246137A (en) * 2012-05-29 2013-12-09 Rigaku Corp Sample processing method for fluorescent x-ray analysis and fluorescent x-ray analysis method using the same
CN111289548A (en) * 2020-03-16 2020-06-16 武汉科技大学 Sample powder arrangement method during sample wafer pressing for XRFS analysis
CN111527391A (en) * 2018-09-11 2020-08-11 株式会社Lg化学 Method for preparing test piece for MALDI mass spectrometry using water-insoluble substance and method for quantitatively analyzing water-insoluble substance using MALDI mass spectrometry
JP2021071308A (en) * 2019-10-29 2021-05-06 株式会社堀場テクノサービス Powder sample cell, x-ray fluorescence analyzer, and x-ray fluorescence analysis method

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013246137A (en) * 2012-05-29 2013-12-09 Rigaku Corp Sample processing method for fluorescent x-ray analysis and fluorescent x-ray analysis method using the same
CN111527391A (en) * 2018-09-11 2020-08-11 株式会社Lg化学 Method for preparing test piece for MALDI mass spectrometry using water-insoluble substance and method for quantitatively analyzing water-insoluble substance using MALDI mass spectrometry
JP2021508369A (en) * 2018-09-11 2021-03-04 エルジー・ケム・リミテッド A method for producing a water-insoluble substance sample for MALDI mass spectrometry and a method for quantitative analysis of a water-insoluble substance using MALDI mass spectrometry.
JP7031956B2 (en) 2018-09-11 2022-03-08 エルジー・ケム・リミテッド A method for producing a water-insoluble substance sample for MALDI mass spectrometry and a method for quantitative analysis of a water-insoluble substance using MALDI mass spectrometry.
US11282684B2 (en) 2018-09-11 2022-03-22 Lg Chem, Ltd. Method for producing test pieces of water-insoluble material for MALDI mass spectrometry and method for quantitative analysis of water-insoluble material using MALDI mass spectrometry
JP2021071308A (en) * 2019-10-29 2021-05-06 株式会社堀場テクノサービス Powder sample cell, x-ray fluorescence analyzer, and x-ray fluorescence analysis method
JP7208882B2 (en) 2019-10-29 2023-01-19 株式会社堀場テクノサービス Powder sample cell, fluorescent X-ray analyzer and fluorescent X-ray analysis method
CN111289548A (en) * 2020-03-16 2020-06-16 武汉科技大学 Sample powder arrangement method during sample wafer pressing for XRFS analysis
CN111289548B (en) * 2020-03-16 2022-07-19 武汉科技大学 Sample powder arrangement method during sample wafer pressing for XRFS analysis

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