JP2006029871A - Voltage application mechanism and apparatus for measuring characteristics of electronic component - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To inhibit the abnormal measurement or the deterioration and breakdown on the surface of electronic component from generating even in the case of breakdown voltage test of an electronic component. <P>SOLUTION: The characteristics measurement test apparatus for measuring the characteristics of the electronic components by applying the voltage between the external electrodes 14a, 14b, is constituted of: the transfer table 3 which is provided with a holding holes 1 for holding the electronic components 10, a pair of auxiliary electrodes 2a, 2b arranged with a mode of surrounding the hole 1 for holding the electronic component 10 at both the ends of the electronic components held in the hole 1, and a pair of external electrodes 14a, 14b so arranged as to sneak from the end surface to the sides of the electronic component while covering the region corresponding to the tip parts 16a, 16b sneaking to the side surface; a driving means for driving the transfer table 3; and a pair of contact electrodes 5a, 5b for applying voltage on a pair of external electrodes from both the main surfaces 3a, 3b of the transfer table 3 by bringing into contact with the external electrodes arranged on both the ends of the electronic component. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a voltage application mechanism and an electronic component characteristic measuring apparatus, and more particularly, to an electronic component having a pair of external electrodes disposed at both ends in a manner that wraps around from the end surface to the side surface. A voltage application mechanism for applying a voltage between the pair of external electrodes and a voltage between the pair of external electrodes disposed at both ends of the electronic component held in the holding holes of the transport table. The present invention relates to an electronic component characteristic measuring apparatus that measures the characteristic of an electronic component by applying the voltage.

  Chip-type electronic components such as chip capacitors and chip resistors are widely used from the standpoints of compactness, high density, high reliability, and suitability for automatic mounting equipment. In the case of such a chip-type electronic component, usually, a quality inspection is performed to measure the electrical characteristics and remove defective products before shipment.

  By the way, as a characteristic measuring apparatus used in the quality inspection of a conventional electronic component, for example, an inspection apparatus as shown in FIG. 9 is known (see Patent Document 1).

  This inspection apparatus comprises (a) a metal plate 11 in which a plurality of mounting holes 12 are arranged at regular intervals, and a holding hole 13 for elastically holding the electronic component A is formed on the inner wall of the mounting hole 12. A holding jig 10 to which an elastic body (elastic rubber) 14 is attached, (b) a pin-type contact electrode 21 that contacts an external electrode (terminal portion) a of the electronic component A, and a rear end portion of the contact electrode 21 And a probe 20 having an insulative guide shaft 22 connected thereto.

  And the probe 20 is arrange | positioned so that it may oppose not only the upper side (one side) of the holding jig 10 holding the electronic component A but the lower side (opposite side), and the contact electrode 21 of each probe 20 is attached. By contacting the external electrode (terminal part) a of the electronic component A, the characteristics of the plurality of electronic components A can be measured simultaneously.

  By the way, the tip part of the external electrode that is arranged at both end portions of the electronic component so as to extend from the end surface to the side surface of the electronic component extends to the side surface of the electronic component. It is a so-called triple junction that contacts the person, and the electric field concentrates and the electric field strength is stronger than the other parts.

  And, when the electrode such as the contact electrode or other conductor covers the tip (triple junction) of the external electrode, the concentration of the electric field is suppressed and the discharge start voltage is increased. However, in the above-described inspection apparatus, only the pin-shaped contact electrode 21 contacts the external electrode a of the electronic component A, and an elastic rubber is provided around the tip (triple junction) of the external electrode a. Since only 14 is positioned, the effect of suppressing the concentration of the electric field cannot be expected, and the discharge starts at a low voltage (discharge voltage), which causes a problem that the electronic component is damaged. .

  In the atmosphere or negative gas, there is a problem that creeping discharge is likely to occur due to electric field concentration at the tip (triple junction) of the external electrode on the high potential side of the pair of external electrodes. is there.

In general, a method of providing a pleat on the surface of the electronic component to increase the dielectric breakdown strength by increasing the substantial creepage distance is considered, but in order to increase the creepage distance, It is necessary to change the surface shape (from a flat surface shape to a pleated surface shape), resulting in an increase in manufacturing cost.
JP-A-8-122386

  The present invention solves the above-mentioned problems, and prevents the occurrence of creeping discharge on the surface of an electronic component when a high voltage is applied to perform a pressure resistance test of the electronic component, resulting in an abnormal measurement value. It is an object of the present invention to provide a voltage application mechanism and an electronic component characteristic measuring apparatus capable of preventing the occurrence of occurrence of deterioration and the alteration or destruction of the surface of the electronic component.

In order to solve the above problem, the voltage application mechanism of the present invention (Claim 1) is:
In order to apply a voltage between the pair of external electrodes in a state in which the electronic component having the pair of external electrodes disposed at both ends in a manner that wraps around from the end surface to the side surface is held in the holding hole of the transport table. A voltage application mechanism,
A pair of auxiliary electrodes disposed in such a manner as to surround the holding hole of the transfer table so as to cover a region corresponding to the tip of the pair of external electrodes that wraps around from the end surface to the side surface of the electronic component; ,
And a pair of contact electrodes that contact each of the pair of external electrodes and apply a voltage between the pair of external electrodes.

  The voltage application mechanism according to claim 2 is the voltage application mechanism according to claim 1, wherein the auxiliary electrode and the contact electrode on the same side of the pair of auxiliary electrodes and the pair of contact electrodes are electrically connected to each other. It is characterized in that it is electrically conductive and has the same potential.

In addition, the characteristic measuring device for an electronic component of the present invention (Claim 3) is:
By applying a voltage between the pair of external electrodes in a state in which an electronic component having a pair of external electrodes disposed at both ends in a manner that wraps around from the end surface to the side surface is held in the holding hole of the transport table. In the electronic component characteristic measuring device for measuring the characteristic of the electronic component,
The holding hole for holding the electronic component, and the region of the electronic component held in the holding hole so as to cover a region corresponding to the tip portion of the pair of external electrodes that wraps around from the end surface to the side surface A pair of auxiliary electrodes arranged in such a manner as to surround the holding hole, and a transport table for transporting electronic components held in the holding hole;
Drive means for driving the transfer table;
A pair of contact electrodes for applying a voltage between the pair of external electrodes in contact with the external electrodes disposed on both ends of the electronic component from both main surface sides of the transport table; It is said.

  The electronic component characteristic measuring apparatus according to claim 4 is the electronic component characteristic measuring apparatus according to claim 3, wherein the auxiliary electrode on the same side of the pair of auxiliary electrodes and the pair of contact electrodes is in contact with the contact. The electrodes are configured to be electrically connected to each other to have the same potential.

  The voltage application mechanism of the present invention (Claim 1) is a voltage application mechanism for applying a voltage between a pair of external electrodes disposed at both ends of the electronic component while being held in the holding hole of the transfer table. A pair of auxiliary electrodes arranged in such a manner as to surround the holding hole of the transport table so as to cover a region corresponding to the tip of the pair of external electrodes that wraps around from the end surface to the side surface of the electronic component And a pair of contact electrodes that contact each of the pair of external electrodes and apply a voltage between the pair of external electrodes, so that the auxiliary electrode is a portion where the external electrode wraps around the side surface of the electronic component Since a voltage is applied between a pair of electrodes in a state of covering the front end portion (that is, a so-called triple junction where the external electrode, the chip body, and the air contact), a triple junction where the electric field tends to concentrate The electric field concentration to Shon, it is possible to increase the discharge starting voltage is suppressed by the electrostatic shielding effect of the auxiliary electrode. As a result, it is possible to prevent creeping discharge on the surface of the electronic component, and to prevent the measurement value from being abnormal, and the surface of the electronic component from being altered or broken.

Note that the pair of auxiliary electrodes may have the same shape and structure as each other, or may have different shapes and structures.
The pair of contact electrodes may also have the same shape and structure as each other, or may have different shapes and structures.

Further, when the auxiliary electrode is exposed, the creeping distance to the external electrode and the auxiliary electrode of the opposing electronic component is shortened, and a discharge is easily generated between the auxiliary electrodes or between the auxiliary electrode and the external electrode of the electronic component. Therefore, it is desirable that the auxiliary electrode is configured to cover the triple junction (tip portion of the external electrode) where the electric field tends to concentrate through the insulating material.
Further, the voltage applied to the auxiliary electrode may be the same as or different from the voltage of the contact electrode. However, the voltage applied to the auxiliary electrode is preferably equal to or higher than the voltage of the contact electrode and up to 120% of the voltage of the contact electrode.

  Further, in the voltage application mechanism according to claim 1, the auxiliary electrode and the contact electrode on the same side of the pair of auxiliary electrodes and the pair of contact electrodes are electrically connected to each other. When the same potential is established by conducting, the concentration of the electric field on the triple junction where the electric field tends to concentrate is suppressed by the electrostatic shielding effect by the auxiliary electrode without requiring a complicated configuration, and the electronic component It is possible to prevent creeping discharge on the surface and prevent abnormalities in the measured values, or alteration or destruction of the surface of the electronic component. It becomes possible.

  An electronic component characteristic measuring apparatus according to the present invention (Claim 3) is an electronic component characteristic measuring apparatus that measures the characteristic of an electronic component by applying a voltage between a pair of external electrodes of the electronic component. a) Arranged in such a manner as to surround the holding hole so as to cover the holding hole for holding the electronic component and the region corresponding to the tip of the pair of external electrodes of the electronic component held in the holding hole A transport table that transports an electronic component held in the holding hole, a drive unit that drives the transport table, and (c) both main surface sides of the transport table. The auxiliary electrode covers the tip of the external electrode (so-called triple junction) because it has a pair of contact electrodes that contact the external electrodes disposed at both ends and apply a voltage between the pair of external electrodes. Apply voltage in such a state Doo is enabled, the electric field concentration to the electric field concentration easily triple junction, to suppress the electrostatic shielding effect of the auxiliary electrode, it is possible to increase the discharge starting voltage. Therefore, it is possible to prevent creeping discharge on the surface of the electronic component, to prevent the measurement value from becoming abnormal, to prevent the surface of the electronic component from being altered or destroyed, and to accurately measure the characteristics of the electronic component. Is possible.

Also in the electronic component characteristic measuring apparatus of the present invention, it is desirable that the auxiliary electrode is configured to cover a triple junction (a tip portion of the external electrode) where an electric field tends to concentrate through an insulating material. As described with respect to the invention of the voltage application mechanism of claim 1, when the auxiliary electrode is exposed, the creeping distance to the external electrode and the auxiliary electrode of the opposing electronic component is shortened, and the auxiliary electrodes are arranged between the auxiliary electrodes or between the auxiliary electrodes. This is because discharge tends to occur between the electrode and the external electrode of the electronic component.
Further, the voltage applied to the auxiliary electrode may be the same as or different from the voltage of the contact electrode. However, the voltage applied to the auxiliary electrode is preferably equal to or higher than the voltage of the contact electrode and up to 120% of the voltage of the contact electrode.

  Moreover, in the electronic component characteristic measuring apparatus according to claim 3, the electronic component characteristic measuring apparatus according to claim 4 is in contact with the auxiliary electrode on the same side of the pair of auxiliary electrodes and the pair of contact electrodes. When the electrodes are electrically connected to each other and have the same potential, the electric field is concentrated on the triple junction where the electric field tends to concentrate without the need for a complicated configuration. It is possible to suppress creeping discharge on the surface of the electronic component, and to prevent an abnormality in the measured value and the occurrence of alteration and destruction on the surface of the electronic component. Can be made more effective.

Hereinafter, the features of the present invention will be described in more detail with reference to examples of the present invention.
In the following first embodiment, a description will be given by taking as an example an apparatus (electronic component characteristic measuring apparatus) used when a withstand voltage test is performed on an electronic component (multilayer ceramic capacitor) 10 having a structure as shown in FIG.

  FIG. 1 is a cross-sectional view showing an electronic component characteristic measuring apparatus according to an embodiment of the present invention, in which (a) shows a state before one contact electrode is brought into contact, and (b) shows one contact electrode. FIG. 2 is a diagram showing a transport table constituting the electronic component characteristic measuring apparatus shown in FIG. 1. FIG. 3 is a cross-sectional view showing the configuration of an electronic component (a chip type multilayer ceramic capacitor in this embodiment) used for characteristic measurement.

  In the electronic component (multilayer ceramic capacitor) 10 to be inspected in the first embodiment, a plurality of internal electrodes 13a and 13b are arranged inside a ceramic multilayer element 11 with a ceramic layer 12 therebetween. In addition, a pair of external electrodes are alternately drawn at one end side to end faces 15a and 15b on different sides of the ceramic multilayer element 11, and are connected to the internal electrodes 13a and 13b at both ends of the ceramic multilayer element 11. 14a and 14b are provided.

  In this multilayer ceramic capacitor 10, the external electrodes 14 a and 14 b are arranged in such a manner as to wrap around from the end faces 15 a and 15 b of the ceramic multilayer element 11 to the side face 25, and the end faces 15 a and 15 b of the ceramic multilayer element 11. The tip portions 16a and 16b of the external electrodes 14a and 14b that wrap around from the side to the side surface 25 are so-called triple junctions in contact with the external electrodes 14a and 14b, the ceramic multilayer element 11, and air, and the electric field is concentrated. The electric field intensity is stronger than the other parts.

The apparatus of the first embodiment (electronic component characteristic measuring apparatus) used for conducting a withstand voltage test of such a multilayer ceramic capacitor 10 is shown in FIGS. 1 (a), 1 (b) and 2, as shown in FIG. The holding hole 1 for holding the component (multilayer ceramic capacitor) 10 and the pair of external electrodes 14a and 14b disposed at both ends of the electronic component 10 held in the holding hole 1 are rotated to the side surfaces. A pair of auxiliary electrodes 2a and 2b disposed in a manner surrounding the holding hole 1 so as to cover the regions corresponding to the tip portions 16a and 16b of the recessed portions, and both main surfaces 3a and 3b are substantially A conveyance table 3 that conveys the electronic components held in the holding hole by the rotation so as to be rotatable in a vertical posture, a driving unit (not shown) that drives the conveyance table 3, and a conveyance Both main surfaces 3 of the table 3 A pair of contact electrodes 5a and 5b for applying a voltage between the pair of external electrodes 14a and 14b in contact with the external electrodes 14a and 14b at both ends of the electronic component 10 from the a and 3b sides are provided.
The auxiliary electrode 2a and the contact electrode 5a, and the auxiliary electrode 2b and the contact electrode 5b are configured to be electrically connected to each other and have the same potential.

Hereinafter, the electronic component characteristic measuring apparatus according to the first embodiment will be described more specifically.
In the electronic component characteristic measuring apparatus according to the first embodiment configured as described above, the auxiliary electrodes 2a and 2b wrap around from the end faces 15a and 15b of the electronic component (specifically, the ceramic multilayer element 11) to the side surface 25. It is made of an insulating material so as to surround the holding hole 1 so as to cover a region corresponding to the tip portions 16a and 16b of the external electrodes 14a and 14b (hereinafter also simply referred to as “external electrode tip portions”). It is embedded in the transfer table 3. In the first embodiment, the auxiliary electrodes 2a and 2b are annular, and the external electrode tip portions 16a and 16b and the auxiliary electrodes 2a and 2b, which are triple junctions, are made of an insulating material (for example, insulating ceramics) constituting the transfer table 3. Or an insulating resin).

  Further, due to the positional relationship between the external electrode tip portions 16a and 16b and the auxiliary electrodes 2a and 2b embedded in the transfer table 3, the concentration of the electric field on the external electrode tip portions (triple junctions) 16a and 16b is suppressed, and the electric field strength is reduced. The values of the distances X and Y in FIG. 1B are set so that becomes the smallest.

  Here, X is the distance in the direction parallel to the arrow X from the external electrode tip (triple junction) 16a, 16b to the end of the auxiliary electrodes 2a, 2b, and Y is the external electrode tip (triple junction) 16a. , 16b to the auxiliary electrodes 2a, 2b in the direction parallel to the arrow Y.

  The one auxiliary electrode 2a and the other auxiliary electrode 2b are arranged at a predetermined interval so as to ensure a distance that does not cause dielectric breakdown of the transfer table 3.

  FIG. 4 shows the relationship between the above-described values of the distance X and the distance Y and the electric field strength of the external electrode tip portions (triple junctions) 16a and 16b.

  As shown in FIG. 4, when the value of X is in the range of 0.2 mm to 0.8 mm, it is possible to maintain the electric field strength in a stable state, and the value of Y is from 0.8 mm to 0.4 mm. In the range, it can be seen that the electric field strength decreases as the value of Y decreases.

  For example, when polycarbonate is used as the constituent material of the transfer table 3, the dielectric breakdown strength of polycarbonate is about 30 kV / mm. Therefore, when the applied voltage is 5 kV, the distance between the auxiliary electrodes 2a and 2b is 0.17 mm. It is necessary to be above.

  In the electronic component characteristic measuring apparatus according to the first embodiment, of the pair of contact electrodes 5a and 5b, one contact electrode 5a is configured as a movable electrode, and is a surface facing the external electrode 14a of the electronic component 10. The concave portion 16 is formed in the concave portion 16, and by moving the movable electrode (contact electrode) 5a to the external electrode 14a side, the bottom surface of the concave portion 16 abuts the external electrode 14a, and the convex portions 17 on both ends of the concave portion 16 are provided. However, the auxiliary electrode 2a embedded in the transfer table 3 is in contact with a portion exposed on the one main surface 3a of the transfer table 3, and the auxiliary electrode 2a and the contact electrode (movable electrode) 5a are electrically connected to each other. It is comprised so that it may become.

Further, the other contact electrode 5b of the pair of contact electrodes 5a and 5b is configured as a fixed electrode, which is in contact with the external electrode 14b of the electronic component 10 and of the auxiliary electrode 2b embedded in the transport table 3. The auxiliary electrode 2b and the contact electrode (fixed electrode) 5b are brought into contact with each other and exposed to the portion exposed on the other main surface 3b of the transport table 3, and are configured to have the same voltage.
Thereby, it becomes possible to simultaneously apply a potential from the movable electrode 5a and the fixed electrode 5b to the external electrodes 14a and 14b and the auxiliary electrodes 2a and 2b of the electronic component 10.

By using the electronic component characteristic measuring apparatus configured as described above, the concentration of the electric field on the external electrode tip portions (triple junctions) 16a and 16b is increased by the auxiliary electrodes 2a and 2b embedded in the transfer table 3. Since it is suppressed by the shielding effect and the electric field strength is reduced, the discharge start voltage can be increased.
Therefore, it is possible to improve the dielectric strength without providing pleats on the surface of the electronic component 10 and to perform a withstand voltage test at a higher voltage.

  Further, creeping discharge on the surface of the electronic component 10 can be prevented, so that it is possible to prevent the measurement value from being abnormal and the surface of the electronic component 10 from being altered or broken. become.

  FIG. 5 is a cross-sectional view showing the main configuration of an electronic component characteristic measuring apparatus according to another embodiment (Example 2) of the present invention. In FIG. 5, the parts denoted by the same reference numerals as those in FIGS. 1A and 1B and FIG.

  In the second embodiment, of the contact electrodes 5a and 5b, one of the contact electrodes 5a is urged toward one external electrode 14a of the electronic component (multilayer ceramic capacitor) 10 by the spring 21. The movable terminal 22 is provided. That is, one contact electrode 5a includes an external electrode contact movable terminal 22 that contacts the external electrode 14a of the electronic component (multilayer ceramic capacitor) 10, and a portion (convex portion) 17 that contacts the auxiliary electrode 2a. It is configured.

  As described above, when the contact electrode 5a is configured such that the portion that applies a voltage to the external electrode 14a of the electronic component 10 and the portion that applies a voltage to the auxiliary electrode 2a can be driven independently. The contact property of the contact electrode 5a with respect to the external electrode 14a and the auxiliary electrode 2a of the electronic component 10 is improved, and a voltage can be reliably applied to the electronic component.

FIG. 6 is a side view showing an essential part of an electronic component characteristic measuring apparatus according to still another embodiment (third embodiment) of the present invention, and FIG. 7 is a cross-sectional view taken along line AA of FIG.
6 and 7, the same reference numerals as those in FIGS. 1A, 1 </ b> B, and 2 indicate the same or corresponding parts.

In the electronic component characteristic measuring apparatus according to the third embodiment, the contact electrode 5a includes a spring terminal 31 using elasticity and a spring terminal 32.
The spring terminal 31 is configured to be elastically biased toward the one external electrode 14a of the electronic component (multilayer ceramic capacitor) 10 by the elastic contact portion 31a at the tip. Due to elasticity, an abutting convex portion (not shown) at the tip is urged toward the auxiliary electrode 2 a embedded in the transfer table 3.

  In the electronic component characteristic measuring apparatus according to the third embodiment, since an actuator for driving the movable electrode (contact electrode) 5a is not required, the cost can be reduced.

  In the configuration of the third embodiment, when the spring terminal 31 and the spring terminal 32 are connected, for example, at a base end side portion (not shown), the voltage applied to the external electrode 14a of the electronic component 10 is The voltage applied to the auxiliary electrode 2a can be set to the same voltage, and the spring terminal 31 and the spring terminal 32 are connected to a power source having a different voltage without conducting the spring terminal 31, Different voltages can be applied independently to each of the spring terminals 32, and a predetermined voltage can be applied independently to the external electrode 14a and the auxiliary electrode 2a of the electronic component 10.

  FIG. 8 is a view showing a modification of the movable electrode. In the third embodiment, the spring terminal having the contact convex portion formed at the tip is used. However, as shown in FIG. 8, the spring terminal 34 with the roller portion in which the roller portion 33a is disposed on the spring plate 33. It is also possible to use.

  In the first to third embodiments, the electronic component characteristic measuring apparatus used for the withstand voltage test of the multilayer ceramic capacitor has been described as an example. However, the present invention is not limited to the multilayer ceramic capacitor and measures various characteristics of various electronic components. It can be widely applied to cases.

  In the first to third embodiments, the conveyance table is described as an example of a configuration in which the main surface is vertical. However, in the present invention, the conveyance table has a posture other than vertical (for example, a horizontal posture). The present invention can also be applied to the configuration arranged in the above.

  In the first to third embodiments, the case where the other contact electrode is a fixed electrode has been described as an example. However, the other contact electrode can also be a movable electrode.

  The invention of the present application is not limited to the above embodiment in other points, and various applications and modifications can be made within the scope of the gist of the invention.

As described above, according to the present invention, it is possible to increase the discharge start voltage by suppressing the concentration of the electric field on the outer electrode tip (triple junction) where the electric field tends to concentrate by the electrostatic shielding effect by the auxiliary electrode. Thus, creeping discharge on the surface of the electronic component can be prevented, and it is possible to prevent the measurement value from becoming abnormal and the surface of the electronic component from being altered or broken.
Therefore, the present invention can be widely applied to technical fields where it is necessary to measure characteristics by applying a voltage to an electronic component having external electrodes.

It is sectional drawing which shows the characteristic measuring apparatus of the electronic component concerning one Example of this invention, (a) is a figure which shows the state before contacting one contact electrode, (b) is making one contact electrode contact. FIG. It is a figure which shows the conveyance table which comprises the characteristic measuring apparatus of the electronic component of FIG. It is sectional drawing which shows the structure of the electronic component (a chip type multilayer ceramic capacitor in this Example) used for a characteristic measurement. The relationship between the values of the distance X and the distance Y and the electric field strength at the external electrode tip (triple junction) is shown. It is sectional drawing which shows the principal part structure of the characteristic measuring apparatus of the electronic component concerning other Example (Example 2) of this invention. It is a side view which shows the principal part of the characteristic measuring apparatus of the electronic component concerning other Example (Example 3) of this invention. It is the sectional view on the AA line of FIG. It is a figure which shows the modification of a movable electrode. It is a figure which shows the characteristic measuring apparatus used in the quality inspection of the conventional electronic component.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Holding hole 2a, 2b Auxiliary electrode 3 Transfer table 3a, 3b Main surface of transfer table 5a, 5b Contact electrode 6 Insulating material 10 Electronic component (multilayer ceramic capacitor)
DESCRIPTION OF SYMBOLS 11 Ceramic laminated element 12 Ceramic layer 13a, 13b Internal electrode 14a, 14b External electrode 15a, 15b End surface of ceramic laminated element 16 Recessed part 16a, 16b Tip of external electrode (triple junction)
17 convex portion 21 spring 22 movable terminal for contact with external electrode 25 side surface 31 and 32 of ceramic laminated element 31a spring terminal 31a convex portion for contact 33 spring plate 33a roller portion 34 spring terminal with roller portion

Claims (4)

In order to apply a voltage between the pair of external electrodes in a state in which the electronic component having the pair of external electrodes disposed at both ends in a manner that wraps around from the end surface to the side surface is held in the holding hole of the transport table. A voltage application mechanism,
A pair of auxiliary electrodes disposed in such a manner as to surround the holding hole of the transfer table so as to cover a region corresponding to the tip of the pair of external electrodes that wraps around from the end surface to the side surface of the electronic component; ,
A voltage application mechanism comprising: a pair of contact electrodes that contact each of the pair of external electrodes and apply a voltage between the pair of external electrodes.   The auxiliary electrode and the contact electrode on the same side of the pair of auxiliary electrodes and the pair of contact electrodes are configured to be electrically connected to each other to have the same potential. Item 2. The voltage application mechanism according to Item 1. By applying a voltage between the pair of external electrodes in a state in which an electronic component having a pair of external electrodes arranged at both ends in a manner that wraps around from the end surface to the side surface is held in the holding hole of the transport table. In the electronic component characteristic measuring device for measuring the characteristic of the electronic component,
The holding hole for holding the electronic component and the electronic component held in the holding hole so as to cover a region corresponding to the tip portion of the pair of external electrodes that wraps around from the end surface to the side surface. A pair of auxiliary electrodes arranged in such a manner as to surround the holding hole, and a transport table for transporting the electronic component held in the holding hole;
Drive means for driving the transfer table;
A pair of contact electrodes for applying a voltage between the pair of external electrodes in contact with the external electrodes disposed on both ends of the electronic component from both main surface sides of the transfer table. An electronic component characteristic measuring device.   The auxiliary electrode and the contact electrode on the same side of the pair of auxiliary electrodes and the pair of contact electrodes are configured to be electrically connected to each other to have the same potential. Item 3. The electronic component characteristic measuring apparatus according to Item 3.

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