JP2006019653A - Solid-state image pick up device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a solid-state image pick up device which can supply an necessary voltage to both of a wiring layer and shading film, in a backlight type solid-state image pick up device. <P>SOLUTION: The solid-state image pick up device includes a semiconductor substrate 30 having a pixel portion where a plurality of pixels are arranged, a wiring layer 40 which is formed on a surface opposite to the light-incident surface of the semiconductor substrate 30 and where wiring 41, 42, 43 containing the driving signal line of the pixel portion are laminated, and a shading film 62 which is formed on the light-incident surface of the semiconductor substrate 30 and shades a dark pixel to decide a black signal among pixels. An opening which passes through the semiconductor substrate 30 from the light-incident surface to expose the pad 45 of the wiring layer 40, and the solid-state image pick up device is constituted to supply a voltage from the outside to the pad 45 of the wiring layer 40 and the shading film 63. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a solid-state imaging device, and more particularly to a back-illuminated solid-state imaging device that receives light from a side opposite to a side on which a wiring layer is formed.

  FIG. 11 is a schematic cross-sectional view of a conventional solid-state imaging device.

  Photodiodes 71 constituting pixels and elements constituting peripheral circuits are formed on the semiconductor substrate 70, and a wiring layer 80 is formed on the semiconductor substrate 70. FIG. 11 illustrates the case of a three-layer wiring, and the wiring layer 80 includes a first layer wiring 81, a second layer wiring 82, and a third layer wiring 83 embedded in an interlayer insulating film 84. .

  Any of the wirings 81 to 83 shields the photodiode 71a of the dark pixel for determining the optical black signal. In FIG. 11, the photodiode 71 a of the dark pixel is shielded from light by the uppermost third layer wiring 83.

  The wirings 81 to 83 are connected by contact holes. Since the wirings 81 to 83 can be connected during the semiconductor process, the pad 85 that connects the solid-state imaging device and the outside thereof is generally formed by the uppermost third layer wiring 83.

In the solid-state imaging device, light is received from the side on which the wiring layer 80 is formed. For this reason, there is a problem that the wiring layer 80 reduces the aperture ratio for light reception and restricts the degree of freedom of the layout of the wiring layer. In order to solve such a problem, a back-illuminated fixed imaging device is known in which a wiring layer is formed on the front surface side of a semiconductor layer and light can be incident from the back surface side of the semiconductor layer so that an image can be captured. As back-illuminated solid-state imaging devices, a CCD type (for example, see Patent Document 1) and a MOS type (for example, see Patent Document 2) have been proposed.
JP 2002-151673 A JP 2003-31785 A

  By the way, also in the backside illumination type solid-state imaging device, a light-shielding film is formed on the backside of the semiconductor substrate to open pixels and shield dark pixels for determining a black signal. It is preferable to fix the light shielding film at a constant potential in order to prevent parasitic capacitance from being changed by charging the light shielding film and the capacitance from affecting the accumulation, reading, noise, etc. of photoelectrons.

  In Patent Document 1, a pad opening that exposes the wiring layer is formed in the support substrate provided on the upper layer of the wiring layer. When this method is employed, the light shielding film existing on the back side of the substrate is fixed at a constant potential. Can not be fixed to. Moreover, it is difficult to connect the wiring layer and the light shielding film during the manufacturing process.

  The present invention has been made in view of the above circumstances, and an object thereof is to provide a solid-state imaging device capable of supplying necessary voltages to both a wiring layer and a light-shielding film in a back-illuminated solid-state imaging device. There is to do.

  In order to achieve the above object, a solid-state imaging device of the present invention is formed on a surface of a semiconductor substrate having a pixel portion in which a plurality of pixels are arranged, and on a surface opposite to a light incident surface of the semiconductor substrate, A wiring layer in which wiring including a driving signal line is laminated, and a light shielding film that is formed on the light incident surface of the semiconductor substrate and shields a dark pixel for determining a black signal among the pixels, An opening is formed through the semiconductor substrate from the light incident surface side to expose the pad of the wiring layer, and is configured to be able to supply voltage from the outside to the pad of the wiring layer and the light shielding film. Yes.

  In the solid-state imaging device of the present invention, an opening is formed through the semiconductor substrate from the light incident surface side to expose the pad of the wiring layer. Therefore, a voltage can be supplied from the outside to the pad and the light shielding film of the wiring layer exposed on the light incident surface side.

  According to the present invention, in the backside illumination type solid-state imaging device, a necessary voltage can be supplied to both the wiring layer and the light shielding film.

  Embodiments of a solid-state imaging device of the present invention will be described below with reference to the drawings. In the present embodiment, a CMOS image sensor will be described as an example of a back-illuminated solid-state imaging device.

(First embodiment)
FIG. 1 is a schematic configuration diagram of a solid-state imaging apparatus according to the present embodiment.

  The solid-state imaging device includes a pixel unit 11, a vertical selection circuit 12, an S / H (sample / hold) / CDS (Correlated Double Sampling) circuit 13, a horizontal selection circuit 14, and a timing generator (TG). ) 15, an AGC (Automatic Gain Control) circuit 16, an A / D conversion circuit 17, and a digital amplifier 18, which are mounted on the same semiconductor substrate.

  The pixel unit 11 has a configuration in which a large number of unit pixels, which will be described later, are arranged in a matrix, and address lines and the like are arranged in rows and vertical signal lines are arranged in columns.

  The vertical selection circuit 12 sequentially selects the pixels in units of rows, and reads the signal of each pixel to the S / H • CDS circuit 13 for each pixel column through the vertical signal line. The S / H • CDS circuit 13 performs signal processing such as CDS on the pixel signal read from each pixel column.

  The horizontal selection circuit 14 sequentially extracts the pixel signals held in the S / H • CDS circuit 13 and outputs them to the AGC circuit 16. The AGC circuit 16 amplifies the signal input from the horizontal selection circuit 14 with an appropriate gain and outputs the amplified signal to the A / D conversion circuit 17.

  The A / D conversion circuit 17 converts the analog signal input from the AGC circuit 16 into a digital signal and outputs the digital signal to the digital amplifier 18. The digital amplifier 18 appropriately amplifies the digital signal input from the A / D conversion circuit 17 and outputs it from a pad (terminal) described later.

  The operations of the vertical selection circuit 12, the S / H / CDS circuit 13, the horizontal selection circuit 14, the AGC circuit 16, the A / D conversion circuit 17, and the digital amplifier 18 are based on various timing signals generated by the timing generator 15. Done.

  FIG. 2 is a diagram illustrating an example of a circuit configuration of a unit pixel of the pixel unit 11.

  The unit pixel includes, for example, a photodiode 21 as a photoelectric conversion element. For this single photodiode 21, four transistors, a transfer transistor 22, an amplification transistor 23, an address transistor 24, and a reset transistor 25, are active elements. It has the composition which has as.

  The photodiode 21 photoelectrically converts incident light into charges (here, electrons) in an amount corresponding to the amount of light. The transfer transistor 22 is connected between the photodiode 21 and the floating diffusion FD, and when a drive signal is given to the gate through the drive wiring 26, the electrons photoelectrically converted by the photodiode 21 are transferred to the floating diffusion FD. .

  The gate of the amplification transistor 23 is connected to the floating diffusion FD. The amplification transistor 23 is connected to the vertical signal line 27 via the address transistor 24, and constitutes a constant current source I and a source follower outside the pixel portion. When an address signal is applied to the gate of the address transistor 24 through the drive wiring 28 and the address transistor 24 is turned on, the amplifying transistor 23 amplifies the potential of the floating diffusion FD and applies a voltage corresponding to the potential to the vertical signal line 27. Output to. The vertical signal line 27 transmits the voltage output from each pixel to the S / H • CDS circuit 13.

  The reset transistor 25 is connected between the power supply Vdd and the floating diffusion FD, and resets the potential of the floating diffusion FD to the potential of the power supply Vdd when a reset signal is given to the gate through the drive wiring 29. These operations are simultaneously performed for each pixel of one row because the gates of the transfer transistor 22, the address transistor 24, and the reset transistor 25 are wired in units of rows.

  FIG. 3 is a schematic cross-sectional view of the solid-state imaging device.

  In the semiconductor substrate 30, photodiodes 31 that form unit pixels in the pixel unit 11 are arranged and formed. The photodiode 31 corresponds to the photodiode 21 shown in the circuit diagram of FIG. The semiconductor substrate 30 is composed of, for example, a p-type silicon epitaxial substrate, and the photodiode 31 is composed of an n-type region formed on the substrate. The thickness of the semiconductor substrate 30 depends on the specifications of the solid-state imaging device, but is 4 to 6 μm for visible light and 6 to 10 μm for near infrared.

  Although not shown, the transistor described with reference to FIG. 2 is formed on one surface of the semiconductor substrate 30. Note that in regions other than the pixel portion, elements such as transistors constituting the circuits 12 to 18 are formed on one surface of the semiconductor substrate 30.

  A wiring layer 40 is formed on one surface of the semiconductor substrate 30. FIG. 3 illustrates a three-layer wiring, and the wiring layer 40 includes a first layer wiring 41, a second layer wiring 42, and a third layer wiring 43 embedded in an interlayer insulating film 44. The wires 41 to 43 correspond to the drive wires 26, 28, 29 and the vertical signal line 27 in FIG.

  A support substrate 50 for reinforcing the strength of the semiconductor substrate 30 is formed on the wiring layer 40. The support substrate 50 is made of, for example, the same silicon as the semiconductor substrate 30 in order to prevent warpage due to a difference in thermal expansion coefficient from the semiconductor substrate 30.

  On the other surface of the semiconductor substrate 30, that is, on the light incident surface, a light shielding film 62 embedded in the insulating film 61 is formed. The light shielding film 62 is made of, for example, aluminum or copper. The light shielding film 62 shields the photodiode 31a of the dark pixel for determining the black signal. Further, the light shielding film 62 is provided with an opening at a position corresponding to the photodiode 31 of a pixel other than the dark pixel, and is configured to shield light between the pixels.

  In addition, as will be described later, a color filter and an on-chip lens are formed on the insulating film 61 in the pixel portion 11 as necessary.

  In this embodiment, the insulating film 61 has an opening C1 that exposes a part of the light shielding film 62. The light shielding film 62 exposed in the opening C1 is connected to the pad 63 for connection to the outside. Become. As will be described later, when the light shielding film 62 formed in the pixel portion 11 is integrally connected, the potential of the light shielding film 62 can be fixed if only one opening C1 exists.

  In addition, a plurality of openings C <b> 2 that penetrate the insulating film 61 and the semiconductor substrate 30 and expose a part of the first layer wiring 41 are formed in the peripheral portion of the pixel portion 11. The portion of the first layer wiring 41 exposed in the opening C2 becomes a pad 45 for connection to the outside. The plurality of pads 45 supply the ground potential, the power supply Vdd, and the necessary drive voltage to the respective parts 11 to 18 through the first layer wiring 41, respectively. The diameter of the opening C2 exposing the pad 45 is about 100 μm, and the depth of the opening C2 is about 5 to 10 μm. Therefore, the aspect ratio of the opening C2 is sufficiently small.

  FIG. 4 is a sectional view of a unit pixel of the pixel unit 11. In FIG. 4, the structure on the light incident surface side of the semiconductor substrate 30 is mainly described, so that the top and bottom of FIG. 3 are inverted.

  In addition to the photodiode 31, a floating diffusion FD made of, for example, an n-type region is formed on the semiconductor substrate 30. Further, the gate electrode 46 of the transfer transistor 22 is embedded in the interlayer insulating film 44.

  A silicon oxide film 64 is formed on the light incident surface of the semiconductor substrate 30, and a light shielding film 62 is formed on the silicon oxide film 64. In the light shielding film 62, an opening 62a is formed at a position corresponding to the photodiode 31 constituting the unit pixel.

  A silicon nitride film 65 is formed so as to cover the light shielding film 62. The silicon oxide film 64 and the silicon nitride film 65 correspond to the insulating film 61 shown in FIG. On the silicon nitride film 65, a color filter 66 and an on-chip lens 67 are formed.

  FIG. 5 is a schematic plan view of the light shielding film 62. Of the pixels P1 and P2 arranged in a matrix, an opening 62a is formed at a position corresponding to the pixel P1, but the darkness for determining the black signal is shown in FIG. No opening is formed at a position corresponding to the pixel P2. For example, the dark pixel P2 is selected from pixels corresponding to the peripheral portion among pixels arranged in a matrix. In the present embodiment, all pixels in the peripheral portion are dark pixels.

  Next, a method for manufacturing the solid-state imaging device will be described.

  First, as shown in FIG. 6A, a photodiode 31 and other semiconductor regions are formed on a semiconductor substrate 30 having a thickness of about 600 to 800 μm, and further, a gate electrode of a transistor (not shown) is formed. Thereafter, the first layer wiring 41, the second layer wiring 42, and the third layer wiring 43 embedded in the interlayer insulating film 44 are formed on the semiconductor substrate 30 by repeating the insulating layer deposition step and the wiring formation step. A wiring layer 40 is formed. Note that the portion of the first layer wiring 41 serving as a pad in the peripheral portion is formed wide.

  Next, as shown in FIG. 6B, a support substrate 50 made of, for example, silicon is formed on the wiring layer 40. The support substrate 50 may be formed by pouring silicon on the wiring layer 40 or a silicon substrate may be attached.

  Next, as shown in FIG. 7A, the semiconductor substrate 30 is removed from the back surface side to form a thin film. In this step, the semiconductor substrate 30 having a thickness of 600 to 800 μm is shaved by about several hundred μm using a grinder, and then the remaining several tens of μm are removed by wet etching.

  Next, as shown in FIG. 7B, the semiconductor substrate 30 is inverted and a film is deposited on the back surface of the semiconductor substrate 30, that is, on the light incident surface side. That is, after an insulating film is deposited on the light incident surface of the semiconductor substrate 30 and the light shielding film 62 is formed, the insulating film is deposited again. Thereby, the light shielding film 62 embedded in the insulating film 61 is formed. Thereafter, a color filter and an on-chip lens (not shown) are formed on the insulating film 61 in the pixel portion 11.

  As a subsequent process, an opening C1 exposing the pad portion of the light shielding film 62 is formed in the insulating film 61 using a resist mask or the like, and the pad portion of the first layer wiring 41 penetrates the insulating film 61 and the semiconductor substrate 30. An opening C2 that exposes is formed. In addition, since the etching depth for forming the opening C1 and the opening C2 is different, the etching process is preferably performed separately. Thus, the solid-state imaging device shown in FIG. 3 is manufactured.

  Thereafter, the semiconductor substrate 30 on which the pixel portion 11 and the like are formed is mounted on the package 100. FIG. 8 is a schematic view showing an example of mounting the semiconductor substrate 30.

  The semiconductor substrate 30 is mounted on the package 100 from the wiring layer 40 side (support substrate 50 side). Then, the pads 45 and 63 formed on the semiconductor substrate 30 and the terminal 101 of the package 100 are connected by the wire 102. Note that the pad 63 connected to the wiring fixed to a constant potential in the pad 45 and the pad 63 may be connected inside the package 100.

  Although not shown, the semiconductor substrate 30 is hermetically sealed by being covered with glass or the like so that dust or the like does not enter the package 100.

  By thus connecting the pads 63 and the terminals 101 of the package 100, the light shielding film 62 can be fixed at a constant potential from the outside of the semiconductor substrate 30. Further, a necessary drive voltage can be supplied to the pad 45.

  As described above, in the solid-state imaging device according to the present embodiment, the opening that penetrates the semiconductor substrate 30 from the light incident surface side of the semiconductor substrate 30 and exposes the pad 45 of the wiring layer 40 is formed. Similarly, an opening exposing the pad 63 of the light shielding film 62 is formed in the insulating film 61 formed on the light incident surface of the semiconductor substrate 30.

  Since the openings exposing the pads 45 and 63 are formed on the same surface side of the semiconductor substrate 30, the pads 45 and 63 of the semiconductor substrate 30 and the terminals 101 of the package 100 can be connected without changing the package 100. The wire 102 can be easily connected. Therefore, the light shielding film 62 can be fixed at a constant potential such as the ground potential or the power supply Vdd, and the wiring layer 40 can be supplied with a necessary drive voltage in addition to the power supply Vdd.

  Further, by forming an opening C1 exposing the pad 63 of the light shielding film 62 and an opening C2 exposing the pad 45 of the first layer wiring 41 of the wiring layer 40 from the light incident surface side of the semiconductor substrate 30, the semiconductor substrate is formed. The connection by the wire 102 can be performed in a state where the back surface of the light incident surface 30 is fixed to the package 100.

(Second Embodiment)
FIG. 9 is a schematic view showing another example of mounting the semiconductor substrate 30. As shown in FIG.

  The semiconductor substrate 30 is mounted with the light incident surface facing the mounting substrate 110. In order to make light incident on the semiconductor substrate 30, an opening 110 a is formed in the mounting substrate 110 at a position corresponding to the pixel portion 11 of the semiconductor substrate 30.

  Pads 45 and 63 formed on the semiconductor substrate 30 and wiring (not shown) formed on the mounting substrate 110 are connected by bumps 111. Note that the pad 63 connected to the wiring fixed to a constant potential in the pad 45 and the pad 63 may be connected inside the mounting substrate 110.

  Although not shown, the space on the light incident surface of the semiconductor substrate 30 is hermetically sealed by being covered with glass or the like so that dust or the like does not enter the light incident surface of the semiconductor substrate 30.

  By connecting the pads 45 and 63 and the wiring of the mounting substrate 110 in this way, the light shielding film 62 can be fixed at a constant potential via the wiring of the mounting substrate 110. Further, a necessary drive voltage can be supplied to the pad 45. Therefore, the solid-state imaging device according to the present embodiment can achieve the same effects as those of the first embodiment.

The present invention is not limited to the description of the above embodiment.
For example, as shown in FIG. 10, among pads 45 connected to the wiring layer 40 of the semiconductor substrate 30, pads connected to wiring fixed to a constant potential such as the power supply Vdd and the ground potential, and pads 63 of the light shielding film 62. May be connected by a wire 102 from the outside.

Further, the CMOS image sensor has been described as an example of the solid-state imaging device, but the present invention can also be applied to a CCD type solid-state imaging device. In addition, although an example of a circuit configuration formed on the semiconductor substrate 30 has been described with reference to FIG. 1, configurations other than the pixel portion 11 can be changed as appropriate.
In addition, various modifications can be made without departing from the scope of the present invention.

It is a schematic block diagram of the solid-state imaging device concerning this embodiment. It is a figure which shows an example of the circuit structure of the unit pixel of a pixel part. It is a schematic sectional drawing of a solid-state imaging device. It is sectional drawing of the unit pixel of a pixel part. It is a schematic plan view of a light shielding film. It is process sectional drawing in the manufacturing method of a solid-state imaging device. It is process sectional drawing in the manufacturing method of a solid-state imaging device. It is a figure for demonstrating the example of mounting of a solid-state imaging device. It is a figure for demonstrating the example of mounting of the solid-state imaging device concerning 2nd Embodiment. It is a figure for demonstrating the other mounting example of a solid-state imaging device. It is a schematic sectional drawing of the conventional solid-state imaging device.

Explanation of symbols

DESCRIPTION OF SYMBOLS 11 ... Pixel part, 12 ... Vertical selection circuit, 13 ... S / H / CDS circuit, 14 ... Horizontal selection circuit, 15 ... Timing generator, 16 ... AGC circuit, 17 ... A / D conversion circuit, 18 ... Digital amplifier, 21 DESCRIPTION OF SYMBOLS ... Photodiode, 22 ... Transfer transistor, 23 ... Amplification transistor, 24 ... Address transistor, 25 ... Reset transistor, 26, 28, 29 ... Drive wiring, 27 ... Vertical signal line, 30 ... Semiconductor substrate, 31 ... Photodiode, 40 ... wiring layer, 41 ... first layer wiring, 42 ... second layer wiring, 43 ... third layer wiring, 44 ... interlayer insulating film, 45 ... pad, 46 ... gate electrode, 50 ... support substrate, 61 ... insulating film, 62 ... Light shielding film, 62a ... Opening, 63 ... Pad, 64 ... Silicon oxide film, 65 ... Silicon nitride film, 66 ... Color filter, 67 ... On-chip lens DESCRIPTION OF SYMBOLS 70 ... Semiconductor substrate, 71 ... Photodiode, 80 ... Wiring layer, 81 ... First layer wiring, 82 ... Second layer wiring, 83 ... Third layer wiring, 84 ... Interlayer insulating film, 85 ... Pad, 100 ... Package, DESCRIPTION OF SYMBOLS 101 ... Terminal, 102 ... Wire, 110 ... Mounting board, 111 ... Bump, FD ... Floating diffusion, P1 ... Pixel, P2 ... Dark pixel

Claims (7)

A semiconductor substrate having a pixel portion in which a plurality of pixels are arranged;
A wiring layer formed on a surface opposite to the light incident surface of the semiconductor substrate, and a wiring layer including a wiring including a driving signal line of the pixel portion;
A light-shielding film that is formed on the light incident surface of the semiconductor substrate and shields a dark pixel for determining a black signal among the pixels;
An opening is formed through the semiconductor substrate from the light incident surface side to expose the pad of the wiring layer, and configured to be able to supply a voltage from the outside to the pad of the wiring layer and the light shielding film. Solid-state imaging device. The semiconductor substrate is mounted on the package from the wiring layer side,
The solid-state imaging device according to claim 1, wherein the wiring layer pad and the light shielding film are respectively connected to terminals of the package via wires. The solid-state imaging device according to claim 1, wherein the pad of the wiring layer and the light shielding film are respectively connected to a mounting substrate via a bump. The solid-state imaging device according to claim 1, wherein the light shielding film is fixed at a constant potential. The solid-state imaging device according to claim 1, wherein a pad connected to a wiring fixed to a constant potential in the wiring layer and the light shielding film are externally connected and held at the same potential. The solid-state imaging device according to claim 1, wherein the light-shielding film is configured to open pixels other than dark pixels and shield light between the pixels. The solid-state imaging device according to claim 1, further comprising a support substrate formed on the wiring layer.

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