JP2005530161A - アナログ信号及び混合信号の回路又はシステムを試験するためのデジ試験システムおよび試験方法 - Google Patents

アナログ信号及び混合信号の回路又はシステムを試験するためのデジ試験システムおよび試験方法 Download PDF

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JP2005530161A
JP2005530161A JP2004513786A JP2004513786A JP2005530161A JP 2005530161 A JP2005530161 A JP 2005530161A JP 2004513786 A JP2004513786 A JP 2004513786A JP 2004513786 A JP2004513786 A JP 2004513786A JP 2005530161 A JP2005530161 A JP 2005530161A
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circuit
output
digital
fault
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JP2005530161A5 (enExample
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デイビッド ジェイムス ハミルトン
ブライアン フィリップ スティンプソン
マーモウド アリ モーザ ベクハイト
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University of Strathclyde
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University of Strathclyde
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
JP2004513786A 2002-06-17 2003-06-17 アナログ信号及び混合信号の回路又はシステムを試験するためのデジ試験システムおよび試験方法 Pending JP2005530161A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0213882.4A GB0213882D0 (en) 2002-06-17 2002-06-17 A digital system & method for testing analogue & mixed-signal circuits or systems
PCT/GB2003/002599 WO2003107019A2 (en) 2002-06-17 2003-06-17 A digital system and method for testing analogue and mixed-signal circuits or systems

Publications (2)

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JP2005530161A true JP2005530161A (ja) 2005-10-06
JP2005530161A5 JP2005530161A5 (enExample) 2006-08-03

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JP2004513786A Pending JP2005530161A (ja) 2002-06-17 2003-06-17 アナログ信号及び混合信号の回路又はシステムを試験するためのデジ試験システムおよび試験方法

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US (1) US7174491B2 (enExample)
EP (1) EP1514125B1 (enExample)
JP (1) JP2005530161A (enExample)
AT (1) ATE521898T1 (enExample)
AU (1) AU2003250369A1 (enExample)
GB (1) GB0213882D0 (enExample)
WO (1) WO2003107019A2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018173771A (ja) * 2017-03-31 2018-11-08 富士通株式会社 入力データ生成装置、方法及びプログラム

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EP1382975B1 (en) * 2002-07-19 2008-01-02 Qimonda AG Method of generating a test pattern for the simulation and/or test of the layout of an integrated circuit
US7823128B2 (en) * 2004-04-19 2010-10-26 Verigy (Singapore) Pte. Ltd. Apparatus, system and/or method for combining multiple tests to a single test in a multiple independent port test environment
US20050278160A1 (en) * 2004-06-14 2005-12-15 Donnelly James M Reduction of settling time in dynamic simulations
US7747405B2 (en) 2006-03-24 2010-06-29 Ics Triplex Technology Ltd. Line frequency synchronization
EP1837670B1 (en) * 2006-03-24 2018-01-03 Rockwell Automation Limited Fault detection method and apparatus
US7729098B2 (en) 2006-03-24 2010-06-01 Ics Triplex Technology Limited Overload protection method
US7613974B2 (en) 2006-03-24 2009-11-03 Ics Triplex Technology Limited Fault detection method and apparatus
US7504975B2 (en) 2006-03-24 2009-03-17 Ics Triplex Technology Limited Method and apparatus for output current control
US8166362B2 (en) 2006-03-24 2012-04-24 Rockwell Automation Limited Fault detection method and apparatus for analog to digital converter circuits
US7476891B2 (en) 2006-03-24 2009-01-13 Ics Triplex Technology, Ltd. Fault detection method and apparatus
US7688560B2 (en) 2006-03-24 2010-03-30 Ics Triplex Technology Limited Overload protection method
US9459316B2 (en) 2011-09-06 2016-10-04 Taiwan Semiconductor Manufacturing Company, Ltd. Method and apparatus for testing a semiconductor device
CN103064009B (zh) * 2012-12-28 2015-03-11 辽宁大学 基于小波分析和有限高斯混合模型em方法的模拟电路故障诊断方法
FI126901B (en) * 2014-09-12 2017-07-31 Enics Ag Method and system for testing an electronic unit
CN105223495A (zh) * 2015-10-20 2016-01-06 国家电网公司 一种基于专家系统的模数混合电路故障诊断的测试方法
US11199177B2 (en) 2016-12-22 2021-12-14 Vestas Wind Systems A/S Detecting electrical failures in a wind turbine generator control system
CN112444737B (zh) * 2020-09-21 2021-10-22 电子科技大学 模拟电路故障参数范围确定方法
CN112684282B (zh) * 2020-11-12 2022-07-19 国网河北省电力有限公司电力科学研究院 配电网单相接地故障识别方法、装置及终端设备
CN113051862B (zh) * 2021-04-19 2022-07-26 电子科技大学 基于遗传算法的数模混合电路测试向量集优选方法
US20230094919A1 (en) * 2021-09-23 2023-03-30 Hsinho Wu Techniques for monitoring and control of high speed serial communication link
CN115099146B (zh) * 2022-06-27 2025-08-29 上海集成电路装备材料产业创新中心有限公司 电路生成方法、装置、电子设备及存储介质
CN115085194B (zh) * 2022-07-20 2022-12-23 南方电网科学研究院有限责任公司 一种电力系统稳控策略生成方法、系统、装置及存储介质
US20240219453A1 (en) * 2023-01-03 2024-07-04 Nxp B.V. Test system for detecting faults in multiple devices of the same type
CN117970039B (zh) * 2024-04-01 2024-06-04 山东大学 一种配电线路故障时刻检测方法
CN118731656B (zh) * 2024-09-02 2024-12-10 陕西星环聚能科技有限公司 隔离放大器测试方法和测试系统

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US5646521A (en) * 1995-08-01 1997-07-08 Schlumberger Technologies, Inc. Analog channel for mixed-signal-VLSI tester
US5745409A (en) * 1995-09-28 1998-04-28 Invox Technology Non-volatile memory with analog and digital interface and storage
US5793778A (en) * 1997-04-11 1998-08-11 National Semiconductor Corporation Method and apparatus for testing analog and digital circuitry within a larger circuit
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US6467058B1 (en) * 1999-01-20 2002-10-15 Nec Usa, Inc. Segmented compaction with pruning and critical fault elimination
US20020188904A1 (en) * 2001-06-11 2002-12-12 International Business Machines Corporation Efficiency of fault simulation by logic backtracking
US6898746B2 (en) * 2001-06-19 2005-05-24 Intel Corporation Method of and apparatus for testing a serial differential/mixed signal device

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Publication number Priority date Publication date Assignee Title
JP2018173771A (ja) * 2017-03-31 2018-11-08 富士通株式会社 入力データ生成装置、方法及びプログラム

Also Published As

Publication number Publication date
US7174491B2 (en) 2007-02-06
WO2003107019A2 (en) 2003-12-24
WO2003107019A3 (en) 2004-07-01
AU2003250369A8 (en) 2003-12-31
ATE521898T1 (de) 2011-09-15
EP1514125A2 (en) 2005-03-16
AU2003250369A1 (en) 2003-12-31
GB0213882D0 (en) 2002-07-31
EP1514125B1 (en) 2011-08-24
US20060242498A1 (en) 2006-10-26

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