JP2005512099A - 補間法による永続データのスケーリング - Google Patents

補間法による永続データのスケーリング Download PDF

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Publication number
JP2005512099A
JP2005512099A JP2003551772A JP2003551772A JP2005512099A JP 2005512099 A JP2005512099 A JP 2005512099A JP 2003551772 A JP2003551772 A JP 2003551772A JP 2003551772 A JP2003551772 A JP 2003551772A JP 2005512099 A JP2005512099 A JP 2005512099A
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JP
Japan
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data
display
persistent data
size
permanent
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JP2003551772A
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Japanese (ja)
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JP2005512099A5 (enExample
Inventor
リッテル，ジル
トーマス ミラー，マーティン
カンピシュ，ティエリ
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レクロイ コーポレイション
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Publication of JP2005512099A publication Critical patent/JP2005512099A/ja
Publication of JP2005512099A5 publication Critical patent/JP2005512099A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor
    • G01R13/0227—Controlling the intensity or colour of the display

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Controls And Circuits For Display Device (AREA)
JP2003551772A 2001-12-11 2002-12-04 補間法による永続データのスケーリング Pending JP2005512099A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/013,603 US6965383B2 (en) 2001-12-11 2001-12-11 Scaling persistence data with interpolation
PCT/US2002/038830 WO2003050796A1 (en) 2001-12-11 2002-12-04 Scaling persistence data with interpolation

Publications (2)

Publication Number Publication Date
JP2005512099A true JP2005512099A (ja) 2005-04-28
JP2005512099A5 JP2005512099A5 (enExample) 2006-01-26

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ID=21760786

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003551772A Pending JP2005512099A (ja) 2001-12-11 2002-12-04 補間法による永続データのスケーリング

Country Status (6)

Country Link
US (1) US6965383B2 (enExample)
EP (1) EP1454311A4 (enExample)
JP (1) JP2005512099A (enExample)
CN (1) CN100392721C (enExample)
AU (1) AU2002353055A1 (enExample)
WO (1) WO2003050796A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102097223B1 (ko) * 2018-12-27 2020-04-03 한국산업기술대학교산학협력단 고주파 계측기를 위한 계측 신호 처리 방법 및 장치

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US20030006990A1 (en) * 2001-05-31 2003-01-09 Salant Lawrence Steven Surface mapping and 3-D parametric analysis
US7248263B2 (en) * 2004-05-10 2007-07-24 International Business Machines Corporation User interface for representing multiple data sets on a common graph
US7663624B2 (en) * 2004-06-30 2010-02-16 Lecroy Corporation Report generating method and apparatus
JP2006084453A (ja) * 2004-08-18 2006-03-30 Horiba Ltd 分析装置
US8502821B2 (en) * 2008-02-04 2013-08-06 C Speed, Llc System for three-dimensional rendering of electrical test and measurement signals
DE102008017289B4 (de) * 2008-03-03 2021-10-14 Rohde & Schwarz GmbH & Co. Kommanditgesellschaft Anpassbares Messgerät und Verfahren zur Anpassung
US8525837B2 (en) * 2008-04-29 2013-09-03 Teledyne Lecroy, Inc. Method and apparatus for data preview
US9496993B1 (en) 2012-01-13 2016-11-15 Teledyne Lecroy, Inc. Noise analysis to reveal jitter and crosstalk's effect on signal integrity
US10577895B2 (en) 2012-11-20 2020-03-03 Drilling Info, Inc. Energy deposit discovery system and method
CN103869119B (zh) * 2012-12-13 2019-03-05 北京普源精电科技有限公司 一种具有改进界面显示功能的测试测量仪器
US10853893B2 (en) 2013-04-17 2020-12-01 Drilling Info, Inc. System and method for automatically correlating geologic tops
US10459098B2 (en) 2013-04-17 2019-10-29 Drilling Info, Inc. System and method for automatically correlating geologic tops
CN106687398B (zh) 2014-07-02 2019-03-08 多宾有限公司 带有用于高速生产焊接的刮板输送机的系统和方法
US9911210B1 (en) 2014-12-03 2018-03-06 Drilling Info, Inc. Raster log digitization system and method
CN104459259B (zh) * 2014-12-16 2017-05-31 南京国睿安泰信科技股份有限公司 一种用于示波器的改进型波形内插系统
US10908316B2 (en) * 2015-10-15 2021-02-02 Drilling Info, Inc. Raster log digitization system and method

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US3873918A (en) * 1971-11-04 1975-03-25 Coulter Electronics Particle analyzing apparatus including a system for visually displaying a particle size distribution curve on a 100 percent scale irrespective of the quantity of particles sampled by the apparatus
US4263593A (en) * 1979-08-20 1981-04-21 Tektronix, Inc. Display interpolator employing a transversal filter for a digital oscilloscope
US4821030A (en) * 1986-12-19 1989-04-11 Tektronix, Inc. Touchscreen feedback system
WO1992017875A1 (fr) * 1991-04-08 1992-10-15 Hitachi, Ltd. Procede et appareil pour traitement d'images ou de donnees, et procede et appareil de controle les mettant en ×uvre
JPH0715704A (ja) * 1993-06-25 1995-01-17 Sony Corp 受像機
US5517105A (en) * 1994-10-25 1996-05-14 Tektronix, Inc. Dual linked zoom boxes for instrument display
US6151010A (en) * 1996-05-24 2000-11-21 Lecroy, S.A. Digital oscilloscope display and method therefor
US6229536B1 (en) * 1998-03-05 2001-05-08 Agilent Technologies, Inc. System and method for displaying simultaneously a main waveform display and a magnified waveform display in a signal measurement system
JP3492521B2 (ja) * 1998-05-06 2004-02-03 安藤電気株式会社 電気光学サンプリングオシロスコープ
US6229456B1 (en) * 1998-08-10 2001-05-08 Tektronix, Inc. Method and apparatus for facilitating user interaction with a measurement instrument using a display-based control knob
GB2344037B (en) * 1998-11-20 2003-01-22 Ibm A method and apparatus for adjusting the display scale of an image
US6571185B1 (en) * 1999-04-20 2003-05-27 Tektronix, Inc. Continually responsive and anticipating automatic setup function for a digital oscilloscope
US6224549B1 (en) * 1999-04-20 2001-05-01 Nicolet Biomedical, Inc. Medical signal monitoring and display
US6515665B1 (en) * 1999-06-21 2003-02-04 Tektronix, Inc. Data filtering/suppression of data acquisitions/samples for multi-channel electronic display and analysis
US7446783B2 (en) * 2001-04-12 2008-11-04 Hewlett-Packard Development Company, L.P. System and method for manipulating an image on a screen

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102097223B1 (ko) * 2018-12-27 2020-04-03 한국산업기술대학교산학협력단 고주파 계측기를 위한 계측 신호 처리 방법 및 장치

Also Published As

Publication number Publication date
EP1454311A4 (en) 2005-04-06
US6965383B2 (en) 2005-11-15
AU2002353055A1 (en) 2003-06-23
WO2003050796A1 (en) 2003-06-19
US20030107581A1 (en) 2003-06-12
CN1618092A (zh) 2005-05-18
EP1454311A1 (en) 2004-09-08
CN100392721C (zh) 2008-06-04

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