JP2005308509A5 - - Google Patents

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Publication number
JP2005308509A5
JP2005308509A5 JP2004124966A JP2004124966A JP2005308509A5 JP 2005308509 A5 JP2005308509 A5 JP 2005308509A5 JP 2004124966 A JP2004124966 A JP 2004124966A JP 2004124966 A JP2004124966 A JP 2004124966A JP 2005308509 A5 JP2005308509 A5 JP 2005308509A5
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JP
Japan
Prior art keywords
signal
phase
distributed
cross
generating
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JP2004124966A
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English (en)
Japanese (ja)
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JP2005308509A (ja
JP4761724B2 (ja
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Priority to JP2004124966A priority Critical patent/JP4761724B2/ja
Priority claimed from JP2004124966A external-priority patent/JP4761724B2/ja
Publication of JP2005308509A publication Critical patent/JP2005308509A/ja
Publication of JP2005308509A5 publication Critical patent/JP2005308509A5/ja
Application granted granted Critical
Publication of JP4761724B2 publication Critical patent/JP4761724B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2004124966A 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置 Expired - Lifetime JP4761724B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004124966A JP4761724B2 (ja) 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004124966A JP4761724B2 (ja) 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置

Publications (3)

Publication Number Publication Date
JP2005308509A JP2005308509A (ja) 2005-11-04
JP2005308509A5 true JP2005308509A5 (ru) 2007-05-31
JP4761724B2 JP4761724B2 (ja) 2011-08-31

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ID=35437460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004124966A Expired - Lifetime JP4761724B2 (ja) 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置

Country Status (1)

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JP (1) JP4761724B2 (ru)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5619902B2 (ja) * 2009-09-23 2014-11-05 オーイーウェイブス，インコーポレーテッド 光遅延に基づく無線周波数、マイクロ波又はミリ波信号における位相雑音の測定
US8711992B2 (en) * 2012-05-31 2014-04-29 Agilent Technologies, Inc. Phase noise extraction apparatus and technique
GB2529200B (en) * 2014-08-13 2019-05-01 Fen Ep Ltd Improvement to Analysing Physiological Electrograms
CN110716092B (zh) * 2019-10-22 2021-09-07 上海交通大学 基于激光鉴频和互相关处理的相位噪声测量装置和测量方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5956170A (ja) * 1982-09-24 1984-03-31 Advantest Corp 伝達関数測定器
JP3099979B2 (ja) * 1991-05-27 2000-10-16 日本電信電話株式会社 付加位相雑音測定方法および装置
US5412325A (en) * 1993-12-23 1995-05-02 Hughes Aircraft Company Phase noise measurement system and method
JP3381109B2 (ja) * 1994-12-28 2003-02-24 ソニー株式会社 伝達関数測定装置
US5608331A (en) * 1995-06-06 1997-03-04 Hughes Electronics Noise measurement test system
JP3921035B2 (ja) * 2000-06-14 2007-05-30 アンリツ株式会社 位相雑音伝達特性解析装置
JP2003232842A (ja) * 2002-02-12 2003-08-22 Mitsubishi Electric Corp 方位探知装置

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