JP2005300250A5 - - Google Patents
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- JP2005300250A5 JP2005300250A5 JP2004113974A JP2004113974A JP2005300250A5 JP 2005300250 A5 JP2005300250 A5 JP 2005300250A5 JP 2004113974 A JP2004113974 A JP 2004113974A JP 2004113974 A JP2004113974 A JP 2004113974A JP 2005300250 A5 JP2005300250 A5 JP 2005300250A5
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- JP
- Japan
- Prior art keywords
- light
- path length
- optical
- optical path
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Claims (7)
前記透過波面の測定位置を移動させる移動機構と、
前記測定位置に応じて前記計測光の光路長又は前記参照光の光路長の少なくとも一方を変更する光路長変更機構とを有することを特徴とする光干渉測定装置 The light from the light source is divided into reference light and measurement light, by interfering the measurement light transmitted through the optical system to have a lenses and with said reference light, the transmitted wavefront of the target optical system An optical interference measuring device for measuring,
A moving mechanism for moving the measurement position before SL transmitted wavefront,
Optical interference measuring apparatus characterized by having an optical path length changing mechanism for changing one optical path length of the least well of the optical path length of the measuring light or the reference light in accordance with the prior Kihaka place
前記被検光学系内での前記透過波面測定位置を移動させるステップと、
前記透過波面測定位置に応じて前記計測光の光路長又は前記参照光の光路長の少なくとも一方を変更するステップとを有することを特徴とする光干渉測定方法。 The light from the light source is divided into reference light and measurement light, by interfering the measurement light transmitted through the optical system to have a lenses and with said reference light, the transmitted wavefront of the target optical system An optical interference measuring device for measuring,
Moving the transmitted wavefront measurement position in the test optical system;
Optical interference measuring method characterized by a step of changing one said measuring light optical path length or the reference light and small optical path length also in response to the transmitted wavefront measuring position.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004113974A JP2005300250A (en) | 2004-04-08 | 2004-04-08 | Optical interference measuring apparatus, optical interference measuring method, optical element, and exposure apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004113974A JP2005300250A (en) | 2004-04-08 | 2004-04-08 | Optical interference measuring apparatus, optical interference measuring method, optical element, and exposure apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005300250A JP2005300250A (en) | 2005-10-27 |
JP2005300250A5 true JP2005300250A5 (en) | 2007-06-07 |
Family
ID=35331962
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004113974A Pending JP2005300250A (en) | 2004-04-08 | 2004-04-08 | Optical interference measuring apparatus, optical interference measuring method, optical element, and exposure apparatus |
Country Status (1)
Country | Link |
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JP (1) | JP2005300250A (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009216454A (en) | 2008-03-07 | 2009-09-24 | Canon Inc | Wavefront aberration measuring apparatus, wavefront aberration measuring method, exposure apparatus, and device manufacturing method |
JP5489658B2 (en) * | 2009-11-05 | 2014-05-14 | キヤノン株式会社 | Measuring device |
JP6378149B2 (en) | 2015-09-16 | 2018-08-22 | 東芝メモリ株式会社 | Defect detection apparatus, defect detection method and program |
JP6441252B2 (en) | 2016-03-16 | 2018-12-19 | 東芝メモリ株式会社 | Thermal laser stimulation apparatus, thermal laser stimulation method, and recording medium |
CN114414073B (en) * | 2022-03-15 | 2023-06-02 | 中国工程物理研究院激光聚变研究中心 | Method for measuring spectrum phase in ultra-short pulse laser system |
-
2004
- 2004-04-08 JP JP2004113974A patent/JP2005300250A/en active Pending
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