JP2005292273A5 - - Google Patents
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- JP2005292273A5 JP2005292273A5 JP2004104157A JP2004104157A JP2005292273A5 JP 2005292273 A5 JP2005292273 A5 JP 2005292273A5 JP 2004104157 A JP2004104157 A JP 2004104157A JP 2004104157 A JP2004104157 A JP 2004104157A JP 2005292273 A5 JP2005292273 A5 JP 2005292273A5
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- scanning
- optical system
- scanning optical
- optical systems
- laser microscope
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- 230000003287 optical effect Effects 0.000 claims 57
- 238000000034 method Methods 0.000 claims 6
Claims (9)
前記複数の走査光学系のうち第１の走査光学系の走査と、前記複数の走査光学系のうち第２の走査光学系の走査とが重なる領域で、該第２の走査光学系のレーザ光の照射を停止する制御を行うレーザ光照射制御手段と
を備えることを特徴とする走査型レーザ顕微鏡。 A plurality of scanning optical systems;
The laser beam of the second scanning optical system in a region where the scanning of the first scanning optical system of the plurality of scanning optical systems and the scanning of the second scanning optical system of the plurality of scanning optical systems overlap. And a laser beam irradiation control means for controlling to stop irradiation of the scanning laser microscope.
前記標本の特定の部位に特異現象を発現させるための第２の走査光学系と、
前記第１の走査光学系の走査と前記第２の走査光学系の走査とが重なる領域で、第１の走査光学系または第２の走査光学系のレーザ光の照射を停止する制御を行うレーザ光照射制御手段と
を備えることを特徴とする走査型レーザ顕微鏡。 A first scanning optical system for obtaining a scanned image of the specimen;
A second scanning optical system for expressing a specific phenomenon in a specific part of the specimen;
Laser that controls to stop the irradiation of the laser light of the first scanning optical system or the second scanning optical system in a region where the scanning of the first scanning optical system and the scanning of the second scanning optical system overlap. A scanning laser microscope comprising: a light irradiation control unit.
前記複数の走査光学系のうち第１の走査光学系の走査と、前記複数の走査光学系のうち第２の走査光学系の走査とが重なる領域で、該第２の走査光学系のレーザ光の照射を停止する制御を行う
ことを特徴とする走査型レーザ顕微鏡制御方法。 A scanning laser microscope control method for controlling a scanning laser microscope provided with a plurality of scanning optical systems,
The laser beam of the second scanning optical system in a region where the scanning of the first scanning optical system of the plurality of scanning optical systems and the scanning of the second scanning optical system of the plurality of scanning optical systems overlap. A method for controlling a scanning laser microscope, characterized in that control for stopping irradiation of the laser beam is performed.
前記複数の走査光学系に走査を行わせる処理と、
前記複数の走査光学系を制御して、当該複数の走査光学系のうち第１の走査光学系の走査と、前記複数の走査光学系のうち第２の走査光学系の走査が重なる領域で、該第２の走査光学系のレーザ光の照射を停止する処理
を、コンピュータに実行させるための走査型レーザ顕微鏡制御プログラム。 A scanning laser microscope control program for causing a computer to execute control of a scanning laser microscope having a plurality of scanning optical systems,
Processing for causing the plurality of scanning optical systems to perform scanning;
By controlling the plurality of scanning optical systems, in a region where the scanning of the first scanning optical system of the plurality of scanning optical systems and the scanning of the second scanning optical system of the plurality of scanning optical systems overlap, The scanning laser microscope control program for making a computer perform the process which stops irradiation of the laser beam of this 2nd scanning optical system.
前記複数の走査光学系のそれぞれの走査領域が重なり合う場合に、前記複数の走査光学系のうち第１の走査光学系の走査の帰線区間で、前記複数の走査光学系のうち第２の走査光学系の走査と該第１の走査光学系の走査とを交差させる制御を行う交差制御手段と、
を備えることを特徴とする走査型レーザ顕微鏡。 A plurality of scanning optical systems;
When the scanning areas of the plurality of scanning optical systems overlap, the second scanning of the plurality of scanning optical systems is performed in the blanking interval of the scanning of the first scanning optical system among the plurality of scanning optical systems. Cross control means for performing control for crossing the scanning of the optical system and the scanning of the first scanning optical system;
A scanning laser microscope comprising:
前記標本の特定の部位に特異現象を発現させるための第２の走査光学系と、
前記第1および第2の走査光学系のそれぞれの走査領域が重なり合う場合に、前記第２の走査光学系の走査の帰線区間で、該第２の走査光学系の走査と前記第１の走査光学系の走査とを交差させる制御を行う交差制御手段と、
を備えることを特徴とする走査型レーザ顕微鏡。 A first scanning optical system for obtaining a scanned image of the specimen;
A second scanning optical system for expressing a specific phenomenon in a specific part of the specimen;
When the respective scanning areas of the first and second scanning optical systems overlap, the scanning of the second scanning optical system and the first scanning are performed in the blanking interval of the scanning of the second scanning optical system. Cross control means for performing control to cross the scanning of the optical system;
A scanning laser microscope comprising:
前記複数の走査光学系のそれぞれの走査領域が重なり合う場合に、前記複数の走査光学系のうち第１の走査光学系の走査の帰線区間で、前記複数の走査光学系のうち第２の走査光学系の走査と該第１の走査光学系の走査とを交差させることを特徴とする走査型レーザ顕微鏡制御方法。 A scanning laser microscope control method for controlling a scanning laser microscope provided with a plurality of scanning optical systems,
When the scanning areas of the plurality of scanning optical systems overlap, the second scanning of the plurality of scanning optical systems is performed in the blanking interval of the scanning of the first scanning optical system among the plurality of scanning optical systems. A scanning laser microscope control method characterized by intersecting scanning of an optical system and scanning of the first scanning optical system.
前記複数の走査光学系に走査を行わせる処理と、
前記複数の走査光学系のそれぞれの走査領域が重なり合う場合に、前記複数の走査光学系を制御して、当該複数の走査光学系のうち第１の走査光学系の走査の帰線区間で、前記複数の走査光学系のうち第２の走査光学系の走査と該第１の走査光学系の走査とを交差させる処理
を、コンピュータに実行させるための走査型レーザ顕微鏡制御プログラム。 A scanning laser microscope control program for causing a computer to execute control of a scanning laser microscope having a plurality of scanning optical systems,
Processing for causing the plurality of scanning optical systems to perform scanning;
When the scanning areas of the plurality of scanning optical systems overlap each other, the plurality of scanning optical systems are controlled, and in the blanking section of the scanning of the first scanning optical system among the plurality of scanning optical systems, A scanning laser microscope control program for causing a computer to execute a process of crossing a scan of a second scan optical system and a scan of the first scan optical system among a plurality of scan optical systems.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004104157A JP4694137B2 (en) | 2004-03-31 | 2004-03-31 | Scanning laser microscope, control method, and control program |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004104157A JP4694137B2 (en) | 2004-03-31 | 2004-03-31 | Scanning laser microscope, control method, and control program |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005292273A JP2005292273A (en) | 2005-10-20 |
| JP2005292273A5 true JP2005292273A5 (en) | 2007-05-10 |
| JP4694137B2 JP4694137B2 (en) | 2011-06-08 |
Family
ID=35325300
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004104157A Expired - Fee Related JP4694137B2 (en) | 2004-03-31 | 2004-03-31 | Scanning laser microscope, control method, and control program |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4694137B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ATE455312T1 (en) * | 2007-02-05 | 2010-01-15 | Olympus Corp | LASER SCANNING MICROSCOPE |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4468507B2 (en) * | 1999-03-24 | 2010-05-26 | オリンパス株式会社 | Scanning laser microscope |
| JP4136440B2 (en) * | 2002-04-26 | 2008-08-20 | オリンパス株式会社 | Microscope equipment |
-
2004
- 2004-03-31 JP JP2004104157A patent/JP4694137B2/en not_active Expired - Fee Related
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