JP2005276762A - Inorganic barrier layer for pdp and process for manufacturing the same - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an inorganic barrier layer for PDP with a large size, which is free from cracking in various patterns of a barrier or a dielectric substance after calcination, has little variation in line width or film thickness, and also has a barrier with a low dielectric constant, high brightness, high height and high aspect ratio. <P>SOLUTION: An inorganic barrier layer for PDP has a barrier having an aspect ratio of 1 to 10 and a height of 100 μm to 800 μm, and contains antimony oxide. The barrier has a void size in the cross section of 0.1 μm to 30 μm and an area void ratio of 5% to 75%. The process for manufacturing the inorganic barrier layer for PDP comprises the step of forming a barrier pattern in a paste layer containing at least two types of inorganic powders different in softening point and particle size, either of which is antimony oxide, by the sand-blasting method, and then calcining the barrier. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to an inorganic partition wall layer for PDP and a method for producing the same. More specifically, the present invention relates to an inorganic barrier rib layer for PDP including a barrier rib such as a plasma display panel (PDP) and a plasma address liquid crystal (PALC) display panel and a dielectric inorganic film.

In recent years, in the field of display and circuit materials, there is a strong demand for a technique for patterning inorganic materials with high accuracy. In particular, in the field of displays, miniaturization and high definition are progressing, and accordingly, it is desired to improve the technology of pattern processing technology.
On the other hand, attempts have been made to lower the dielectric constant by selecting materials in order to control electrical characteristics such as dielectric constant. However, further reduction is desired, and development of a method for realizing it has been desired.
In recent years, the panel has been increased in size and performance, and it has been necessary to form a film with a large area uniformly and thickly. However, cracks such as cracks may occur during firing, and improvements are desired. It was.
Furthermore, in order to improve performance such as luminous efficiency, it was desired that the height of the partition walls be high and high definition. However, while maintaining high definition, the partition walls are uniform and high without failure such as cracks. It was desired to form.

  Conventionally, when pattern processing of an inorganic material is performed, a method in which a paste made of inorganic particles and an organic binder is screen-printed and then baked is often used. However, screen printing has a problem that a highly accurate pattern cannot be formed. In addition, when forming a pattern with a high aspect ratio, it is necessary to perform multilayer printing, and there is a problem that the number of processes increases.

In order to eliminate such drawbacks, Patent Literature 1 and Patent Literature 2 disclose a partition forming method using a sandblast method.
This method has features such as the ability to form a high aspect ratio pattern and high accuracy. However, in the sandblasting process, the sandblasting properties of the dielectric forming layer and the barrier rib forming layer are made different, and only the barrier rib forming layer in the opening portion of the resist pattern is removed during the sandblasting process, and the dielectric forming layer which is the lower layer is left. However, it was difficult to make a difference in sandblasting properties.
Further, when the dielectric layer is patterned using a photosensitive dry film and a sand blast method, there is a problem that the adhesion between the partition wall forming layer and the photosensitive resist is weak and peels off during development or sand blasting.
Further, when the dielectric constant of the dielectric layer is lowered, there is a problem that the softening point is increased due to the glass composition.

Furthermore, in the firing process, there is a problem that the shrinkage is likely to occur due to local unevenness of shrinkage or large shrinkage, and that the partition walls are easily deformed during firing after sandblasting. Moreover, the dielectric constant of the partition walls made by firing was high, and there were problems such as heat generation and power consumption.
Therefore, when the partition wall is formed by the sand blast method, the adhesive property to the photosensitive sand blast resist is good without impairing the sand blasting property, and it is used for the partition wall forming layer having a low dielectric constant with less sagging, deformation and cracking during firing. The material was desired.
Patent Document 3 discloses a rib paste in which inorganic particles having two kinds of average particle sizes are mixed for problems such as defects during coating of an inorganic composition, chipping of a pattern during sandblasting, and cracks during firing. A method of forming a pattern by screen printing using the above is described.
However, a fine pattern with high resolution after firing cannot be formed, and since the printing method is used, it is not fully satisfactory in terms of uniformity, and the aspect ratio and the high partition wall are not satisfactory. It was not possible to make the image high and high definition. Further, when the screen is enlarged, it is difficult to obtain a partition wall having a uniform height.
Patent Document 4 describes a dielectric paste using glass having two peaks in the particle size distribution, but does not describe formation of barrier ribs.

Patent Documents 5 to 13 and others describe a partition forming method using a mold. However, even if these methods are used, it is difficult to form a thick film without cracks and having a uniform height.
Patent Document 14 describes a method of manufacturing a PDP that uses a porous partition in order to improve the escape of air in the pixel surface when the phosphor paste is pushed into the inner surface of the pixel. However, there is no description of what kind of material should be used in order to make the partition walls workable and have a low dielectric constant, and the degree of porosity such as the size and porosity of the porosity forming the porosity.
Further, Patent Document 15 discloses that the purity of the inert gas in the discharge space is reduced by forming a layer that is more porous than the partition wall on the surface of the partition wall so that the impurity gas is less likely to be mixed into the discharge space during panel light emission. Is maintained and the light emission luminance is improved. However, there is no disclosure about the guidelines for reducing the dielectric constant, and there is no description about the degree of porosity such as the void size and void ratio of the layer on the partition wall surface.
Further, Patent Document 16 discloses a forming material in which antimony oxide and an oxidation promoter are contained in the partition in order to increase the translucency of the partition and increase the brightness as a plasma display.

The present applicant has proposed that a partition wall for a PDP having a large size, a high height, and a high aspect ratio can be manufactured by controlling the size and abundance of the voids present in the partition wall (Japanese Patent Application No. 2003-146327, etc.) ).
However, generally, when a void is formed in the partition wall, there is a problem that cracks are likely to occur.

JP-A-10-144206 Japanese Patent Laid-Open No. 10-172424 JP-A-11-1343 JP 2002-15664 A JP 2003-123637 A JP 2000-185938 A JP 2001-167698 A JP 2002-75175 A JP 2002-93313 A JP 2002-134005 A JP 2000-173456 A JP 2001-58352 A Japanese Patent Laid-Open No. 2001-1436128 Japanese Patent Laid-Open No. 5-47303 JP 2002-324491 A JP 2003-327448 A

The present invention is a large-size barrier rib having a high-aspect-ratio barrier rib with high brightness and high height without cracks in the barrier ribs and various patterns of the dielectric after firing, almost no change in line width and film thickness. An object of the present invention is to provide an inorganic partition wall layer for PDP and a method for producing the same.
Another object of the present invention is to provide a power-saving inorganic partition wall layer for PDP that has a low dielectric constant and suppresses heat generation, and a method for manufacturing the same.

The present invention is as described below, whereby the above-described problems can be solved.
1) An inorganic partition wall layer for PDP having a partition wall having an aspect ratio of 1 to 10 and a height of 100 to 800 μm, wherein the inorganic partition wall layer for PDP contains antimony oxide, and the partition wall has a void size in cross section An inorganic partition wall layer for PDP, which is 0.1 to 30 μm and has an area porosity of 5 to 75%.
2) The inorganic partition wall layer for PDP as described in 1) above, which contains an oxidation accelerator.
3) The inorganic partition wall layer for PDP as described in 1) or 2) above, wherein the oxidation accelerator comprises an oxide of at least one atom selected from Ta, Nb, Mn, Ce, La and Ni. .
4) The inorganic partition wall layer for PDP according to any one of 1) to 3) above, wherein the dielectric constant is 3.5 to 12.
5) A partition wall pattern was formed by a sandblasting method on a paste layer containing at least two types of inorganic powders having different softening points and particle sizes, and any one of the inorganic powders was antimony oxide. Then, the inorganic partition wall layer for PDP according to any one of the above 1) to 4) is formed by firing, and the method for producing an inorganic partition wall layer for PDP is characterized in that it is fired.

The present invention has a partition having a low dielectric constant, a high height, a high aspect ratio, and a high brightness by using a paste containing two or more kinds of inorganic powders having different average particle diameters and softening points and antimony oxide. A large-sized inorganic partition wall for PDP can be obtained.
In addition, the present invention can provide a precision electronic device such as a large-screen PDP having a high-accuracy and power-saving partition wall with little change in line width and film thickness after firing.

The inorganic partition wall layer for PDP of the present invention (hereinafter also referred to as “inorganic partition wall layer”) has a partition wall having a porous and specific profile. In the former, the area porosity and the void size are defined within a specific range. In the latter, the aspect ratio and height are specified.
By adopting the above-described structure, the inorganic partition wall layer has an effect of improving the shrinkage resistance of the partition wall and reducing the dielectric constant. Reduction of the dielectric constant has an effect of suppressing heat generation of the PDP or the like and reducing power consumption.
In addition, since the shrinkage during firing is very small, the thickness of the film can be kept uniform and cracks are unlikely to occur, so that a thick film with a large area can be easily produced.
In addition, since the present invention can smooth the surface properties of the paste layer provided on the substrate from a transfer film or coated with an inorganic powder-containing paste as a raw material for the inorganic partition wall layer, an excellent pattern with an accurate profile Can be formed on a desired substrate.

In the present invention, the void size and void area are determined from the cross section of the hole in the cross section of the partition wall.
The void size means the longest diameter (distance between two points) of the cross section, and is 0.1 to 30 μm in the present invention, preferably 0.3 to 28 μm, and more preferably 1 to 25 μm.
The void area means the sum of the cross-sectional areas of the holes, and the area of each cross-section can be obtained by copying the hole part of the cross-sectional photograph taken by SEM on tracing paper, measuring it, and measuring the mass. it can.
The cross-sectional shape of the hole is not particularly limited and may be indefinite or circular. In the present invention, the ratio of the void area to the cross-sectional area of the partition wall is defined as the area void ratio. Here, the area porosity is obtained by taking an SEM photograph of a cross section of a partition wall and obtaining an average of measured values from three cross sections each having a size of 100 μm × 100 μm. In the present invention, the area porosity of the partition walls is 5 to 75%, more preferably 10 to 70%.
In the present invention, when antimony oxide is contained as an inorganic powder in the inorganic partition wall layer, cracking of the inorganic partition wall layer is prevented, so that a large-sized inorganic partition layer having a partition wall having a high height and a high aspect ratio is obtained. And the dielectric constant is reduced.

The height of the partition is the distance h from the bottom of the recess between the partitions to the apex of the projection when the partition is a projection. The aspect ratio is a value represented by h / w where w is the width of the partition wall (the direction perpendicular to the longitudinal direction of the partition wall) at the bottom of the recess.
In the present invention, the partition wall has an aspect ratio of 1 to 10, preferably 2 to 8, and a height of 100 to 800 μm, preferably 100 to 700 μm. The shape of the cut surface of the partition wall in the direction perpendicular to the longitudinal direction of the partition wall is preferably a rectangle, or a trapezoid that changes so that the width becomes narrow in the height direction, and the variation is 95% with respect to w at the top. The following is preferable.
When the partition wall has the above structure, even if the size of the inorganic partition wall layer is large, for example, 1 m ² or more, the variation in shrinkage is suppressed to less than 3%, and the inorganic partition wall layer can be manufactured with high yield. . As a result, a large-sized PDP or the like having high definition and no color unevenness can be manufactured.
Here, the inorganic partition layer means a layer structure including at least the partition. Specifically, the inorganic partition wall layer may be a partition wall alone or may have a structure including a partition wall and a dielectric layer provided adjacent to the partition wall.
Further, the width of the recesses between the partition walls is preferably 50 to 1000 μm, and more preferably 60 to 800 μm.
In addition, the inorganic partition wall layer of the present invention can have a low dielectric constant because of its porosity, but the dielectric constant can be further reduced by using antimony oxide. The dielectric constant of the inorganic partition wall layer is preferably 3.5 to 12, and more preferably 3.5 to 11. As a result, the power consumption of a device such as a PDP can be reduced and the life can be extended.
Examples of means for controlling the dielectric constant include selecting the composition of the inorganic partition wall layer and increasing the area porosity as much as possible while ensuring the strength.

In the present invention, examples of the means for controlling the porosity of the inorganic partition wall layer within the above range include the following means.
As the inorganic powder-containing paste, an inorganic powder having at least two types each having a different particle size (average particle size) and softening point and having a high softening point and a type having a large average particle size is preferably used. Can be mentioned. Here, the inorganic powders having different average particle diameters and softening points are listed in the order of the lower order alphabetical order of the inorganic powders a, b, c, d,.
(1) Use a mixture of inorganic powder a and inorganic powder b as the inorganic powder.
(2) As the inorganic powder, a mixture composed of inorganic powder A having an average particle diameter of 0.2 to 2.5 μm and inorganic powder B having an average particle diameter larger than that and an average particle diameter of 2 to 10 μm is used.
In the means (1), the softening point of the inorganic powder b is preferably 50 ° C. or higher, more preferably 100 ° C. or higher than the softening point of the inorganic powder a. The higher softening point is preferably from 600 to 1500 ° C, more preferably from 700 to 1400 ° C. In addition, the inorganic powder a and the inorganic powder b have different elemental compositions and / or crystal structures, but the specific size of the average particle diameter of both is within the range of (2) above when corresponding to the same type of characters. Although it is not necessary, it is preferable.
In the means (2), it is important to specify the average particle diameter of the inorganic powder A and the inorganic powder B as described above. That is, the average particle diameter of the inorganic powder A is 0.2 to 2.5 μm, preferably 0.3 to 2.0 μm, and the average particle diameter of the inorganic powder B is 2 to 10 μm, preferably 2. It is necessary to make the average particle diameter of the inorganic powder B larger than the average particle diameter of the inorganic powder A. In addition, the inorganic powder A and the inorganic powder B may have the same elemental composition and / or crystal structure, and the relationship between the softening points of both needs to be in the range of (1) above when corresponding to the same type of characters. There is no, but it is preferred.
The inorganic powder used in the present invention preferably has at least two maximum peaks in its particle size distribution curve. Examples of the inorganic powder include inorganic powder a or b and a mixture thereof, inorganic powder A or B and a mixture thereof. This particle size distribution curve is plotted by particle size distribution on the horizontal axis and frequency (volume) on the vertical axis by the laser diffraction scattering method. In the present invention, the average particle diameter means a particle diameter (D50) at which the cumulative volume becomes 50% when the sum of the cumulative volumes of the frequency is 100% (however, in the particle size distribution curve, a maximum peak is not necessarily obtained). It is not necessary to have it, but it is preferable to have a maximum peak in the vicinity of D50).
In order for the inorganic powder to have at least two maximum peaks, the blending ratio of the powder component that gives the maximum peaks may be adjusted so that the average particle diameter of each powder falls within the range of the present invention.
Therefore, in this case, various particle size distribution curves of the powder component giving the maximum peak can be selected. In the present invention, the particle diameter (D10) at which the cumulative volume is 10% when the total cumulative volume of the particle size distribution curve is 100% is 0.1 to 2.0 μm for the inorganic powder a or the inorganic powder A. In the case of the inorganic powder b or the inorganic powder B, 1.0 to 8.0 μm is preferable.
In the present invention, the particle diameter (D90) at which the cumulative volume is 90% when the total cumulative volume of the particle size distribution curve is 100% is 2.5 to 8.0 μm in the case of the inorganic powder a or the inorganic powder A. In the case of the inorganic powder b or the inorganic powder B, 5 to 15 μm is preferable.

When the inorganic powder is specified as described above, the inorganic powder a or the inorganic powder A is filled in the gap between the inorganic powder b or the inorganic powder B in the paste layer containing the inorganic powder, and the size and the softening point are different when fired. It is considered that the above voids are generated due to the contribution of.
In the present invention, at least one of the inorganic powders contains antimony oxide, but it is preferable that the inorganic powder a or the inorganic powder A contain antimony oxide and further an oxidation accelerator.

  Since antimony oxide has high oxidizing power, it can reduce the unburned residue of organic components such as resin contained in the paste layer containing inorganic powder by releasing oxygen during firing, reducing dielectric constant, cracking It can contribute to prevention. In addition, antimony oxide can suppress the coloring of the glass even if colored elements such as Pb, Bi, and Ce added to adjust the softening point and thermal expansion coefficient of the glass are present in the glass. The translucency of the partition wall is increased, and the luminance of the PDP can be improved.

  The oxidation promoter plays a role of further enhancing and sustaining the oxidizing power of the coexisting antimony oxide. That is, elements other than oxygen constituting antimony oxide and oxidation promoter have a plurality of oxidation numbers, and the proportion of antimony having a large oxidation number is increased in the glass when antimony oxide coexists with the oxidation promoter. , Oxidation power is increased. Also, oxygen is released to burn organic components during firing, and the antimony whose oxidation number is reduced is restored to antimony with a higher oxidation number by supplying oxygen from the oxidation accelerator, so it is high. Oxidizing power is maintained and organic components are prevented from being burned out.

The content of antimony oxide (Sb ₂ O ₃ ) is preferably 0.01 to 20% by mass and more preferably 0.1 to 15% by mass with respect to the inorganic powder. When the amount of antimony oxide is less than 0.01% by mass, it is difficult to obtain the above-described effect, and when it is more than 20% by mass, it is difficult to form the partition wall precisely.
The content of the oxidation accelerator is preferably 0.01 to 20% by mass with respect to the inorganic powder in terms of the total amount of oxides of at least one atom selected from Ta, Nb, Mn, Ce, La and Ni. More preferred is ˜15% by mass. When the amount is less than 0.01% by mass, the above-described effect is hardly obtained. In particular, since Mn, Ce, and Ni are colored elements having strong coloring power, the total amount of their oxides is preferably 1.0% by mass or less.

  The inorganic partition wall layer of the present invention can be used by adding antimony oxide or an oxidation accelerator as a component of glass powder described later or by adding it as a metal oxide powder, but it is oxidized as a component of glass powder. When antimony and an oxidation accelerator are contained, both components are present homogeneously in the glass, which is preferable because the oxidation accelerator easily acts effectively. The raw material for the antimony oxide and the oxidation accelerator is not limited at all with respect to the oxidation number, but an oxide having a high oxidation number is preferable because the oxidizing power tends to increase.

In addition, as an element that contributes to adjusting the area porosity while specifying the size and softening point of the inorganic powder, the composition of the inorganic powder-containing paste, for example, appropriately selecting a binder, a solvent, a plasticizer, For example, selecting firing conditions.
In addition, the inorganic powder-containing paste (hereinafter also simply referred to as paste) may contain inorganic components other than the specific powder component. As the inorganic component, for example, inorganic powders having different sizes and softening points can be used. For example, colloidal silica having an average particle diameter of 50 nm or less can be used.

The transfer film that can be used in the present invention preferably has a release layer between the paste layer and the flexible temporary support.
The releasable layer is provided so that the paste layer can be easily and accurately transferred onto a substrate such as glass.
Examples of the release layer include those provided with a release agent on a substrate. Examples of the release agent include silicone compounds (for example, high viscosity silicone compounds, low viscosity silicone compounds, modified silicone compounds), and fluorine-based layers. Examples thereof include compounds, vegetable oils and fats-based compounds (for example, those based on vegetable phospholipids (lecithin)), waxes and the like.
In the transfer film, both the release layer and the paste layer may be transferred onto the substrate, or the release layer may remain on the flexible temporary support and only the paste layer may be transferred. Therefore, the transfer layer obtained by transferring the paste layer onto the substrate using the transfer film may have a releasable layer.
Further, when a transfer film is used, the surface of the paste layer can be smoothed, and the center line average surface roughness (Ra) is preferably 0.5 μm or less, and more preferably 0.3 μm or less. preferable.

One of the methods for producing the inorganic barrier layer in the present invention is to provide a photosensitive composition on a paste layer that is applied directly to the substrate or transferred from the transfer film onto the substrate, and is exposed and developed. After the treatment, a partition wall pattern is formed on the paste layer by a sandblasting method, and then fired.
Moreover, an inorganic partition wall layer can also be manufactured by forming a partition pattern using a paste and a mold and then firing it.
As other partition wall formation methods, specifically, a paste is put in a mold, the partition pattern is transferred to a substrate and fired, a partition pattern is formed in the mold by placing the substrate and paste in the mold, And a method of forming a partition pattern on a paste layer formed by coating on a substrate or transferring from a transfer film using a mold.

Further, the pattern structure of the partition includes a stripe type, a waffle type, a honeycomb type, a honeycomb type, a diamond type, etc., but any pattern can be applied to the partition layer of the present invention and its manufacturing method. .
Hereafter, it explains in full detail for every component of this invention.

A. Paste A paste applied to a substrate or the like, or a paste applied to a flexible temporary support for producing a transfer film contains at least an inorganic powder, and further contains a resin and a solvent as components. In addition to the above components, the paste can contain various known additives such as plasticizers, preservatives, and surfactants.
However, the paste has a composition in which the blending ratio of the inorganic powder component is increased, and it is desirable that the organic component is as small as possible in order to effectively exhibit the advantages.

A-a. Inorganic powder The inorganic powder is not particularly limited, but an inorganic substance having a function of mainly giving mechanical strength to the fired inorganic partition wall layer, such as alumina, titanium oxide, zirconia, cordierite, etc. Examples thereof include inorganic substances having a function of mainly imparting transparency to the fired inorganic partition wall layer, such as metal oxide and metal, such as glass, preferably low melting point glass.

The low melting point glass powder means one having a softening point of 390 to 990 ° C., a linear thermal expansion coefficient of (45 to 100) × 10 ⁻⁷ K ⁻¹ , and (50 to 90) × 10 ^−. It is preferable for ⁷ K ^-1.

  As a composition of the low melting point glass powder, silicon oxide is preferably blended in the range of 3 to 80% by mass, more preferably 10 to 70% by mass. When the amount is less than 3% by mass, the denseness, strength and stability of the glass layer are lowered, the coefficient of thermal expansion deviates from a desired value, and mismatching with the glass substrate tends to occur. Moreover, by setting it as 70 mass% or less, there exists an advantage that a thermal softening point becomes low and baking to a glass substrate is attained.

The composition of the low-melting glass powder contains 5 to 60% by mass of at least one of bismuth oxide, lead oxide, zinc oxide, aluminum oxide, lithium oxide, sodium oxide, and potassium oxide, and also contains antimony oxide and an oxidation accelerator. Or a total of 8 to 60% by mass of boron oxide, bismuth oxide or lead oxide, and 0 to 15% by mass of at least one of lithium oxide, sodium oxide and potassium oxide, and antimony oxide and Glass using glass particles containing an oxidation accelerator is preferred because of its low melting point.
Preferable examples of the composition of the low melting point glass powder in which antimony oxide and an oxidation accelerator are used include (1) a mixture of lead oxide, boron oxide, silicon oxide (PbO—B ₂ O ₃ —SiO ₂ ), (2 ) A mixture of zinc oxide, boron oxide, silicon oxide (ZnO—B ₂ O ₃ —SiO ₂ ), (3) lead oxide, boron oxide, silicon oxide, aluminum oxide (PbO—B ₂ O ₃ —SiO ₂₎ mixture of -al ₂ O ₃ system), can be exemplified such as a mixture of (4) lead oxide, zinc oxide, boron oxide, silicon oxide _{(PbO-ZnO-B 2 O} 3 -SiO 2 system).
In particular, the mixture from which the lead component is removed in the above (1) to (4), so-called non-lead glass, is not only preferable for environmental conservation, but also effective for lowering the dielectric constant of the inorganic partition wall layer. When applied to a layer, it is excellent in power saving, and kneadability with a metal oxide powder such as alumina is improved, so that the uniformity of the inorganic partition wall layer can be improved. Moreover, since the lead-free glass containing antimony oxide and further an oxidation accelerator can effectively suppress the coloration derived from the composition element, it can contribute to the improvement of luminance.
Further, as the lead-free glass, in addition to the above components, BaO, MgO, Na ₂ O, K ₂ O, Li ₂ O, Al ₂ O ₃ , TiO ₂ , ZrO ₂ , Nb ₂ O ₅ , Bi ₂ O _3, etc. One or more selected from the above can be included, and further desired elements can be blended.
As the lead-free glass, glass containing at least one of ZnO, B ₂ O ₃ , SiO ₂ , BaO and Bi ₂ O ₃ is preferable. As this composition, Sb ₂ O ₃ / oxidation accelerator / ZnO / B ₂ O ₃ / SiO ₂ / BaO / Bi ₂ O ₃ /others=0.01-5/0.01-15/20-by molar ratio 70 / 0-80 / 0-45 / 0-50 / 0-15 / 0-15 are preferable, 0.05-5 / 0.05-5 / 25-65 / 0-75 / 0-40 / 0 More preferably, 45/0 to 13/0 to 13.

  The inorganic partition wall layer of the present invention is preferably composed of 30 to 85% by weight of glass powder and 15 to 35% by weight of metal oxide powder, 40 to 80% by weight of glass powder, and 20 to 60% by weight of metal oxide powder. More preferably, it consists of By setting the blending ratio of the two to the above, firing is sufficient, translucency is ensured, and a partition wall having a dense and strong profile can be formed.

  The pattern can be colored by adding various metal oxides other than the specific inorganic powder component to the paste. For example, a black pattern can be formed by including 1-10 mass% of a black metal oxide in the paste. Blackening is possible by including at least one, preferably three or more of Cr, Fe, Co, Mn, and Cu as black or other colored oxides used for this purpose. . In particular, a black pattern can be formed by adding 0.5 mass% or more of each of Fe and Mn oxides.

  Furthermore, by using a paste to which an inorganic pigment that develops red, blue, green, or the like in addition to black is used, it is possible to form an inorganic partition layer having a colored pattern such as a partition of each color or a color filter.

Ab. The resin contained in the resin paste is not particularly limited, but a cellulose compound or an acrylic compound can be used.

(Cellulose compound)
The cellulose compound used for the paste includes cellulose and its derivatives. The cellulose compound is a cellulose resin such as ethyl cellulose, methyl cellulose, ethyl propyl cellulose, nitrocellulose, cellulose acetate, cellulose propionate, cellulose acetate butyrate, and cellulose butyrate.
The substitution rate of the substituent of the cellulose derivative is 0 to 90%, preferably 10 to 80%, of the cellulose hydroxyl group. For example, ethyl cellulose having a substitution rate of 10 to 70% is suitable. These binders may use a single type of polymer, or may be used by mixing with other cellulose derivatives or non-cellulosic polymers described above as long as the polymers are miscible with each other. The mixing ratio is arbitrary as long as it can be mixed and the function as a binder is maintained.
As the mass average molecular weight (Mw), those having a molecular weight of 10,000 to 400,000 can be used in combination of a single low molecular weight, a single polymer, and two or more types having an average molecular weight.

  In addition to the above, the cellulose derivative used as a binder may be added with a cellulose derivative substituted with a water-soluble group as a secondary component. This resin is substituted with a lower alkyl group or a lower acyl group in addition to the water-soluble group. It may be included as a group. The water-soluble group of a substituent is a hydroxyalkyl group (C1-C3) and a carboxymethyl group.

  The substitution rate of the hydroxyalkyl group of these hydroxyalkyl celluloses is 1.3 to 7.0 equivalents, preferably 1.5 to 5.0 equivalents, per glucose unit. When the substitution rate exceeds 3.0 per glucose unit, it means that further substitution is performed on the hydroxyalkyl-substituted hydroxyalkyl group. If the substitution rate is 1.3 equivalents or less, the solubility and miscibility are insufficient, and if it exceeds 7.0 equivalents, it is difficult to increase the degree of substitution and the production cost increases. Particularly preferred water-soluble group-substituted cellulose derivatives are hydroxypropylcellulose, hydroxymethylcellulose, hydroxyethylcellulose, carboxymethylcellulose, carboxyethylcellulose, hydroxypropylmethylcellulose, hydroxymethylphthalate cellulose, hydroxypropylmethylcellulose phthalate, hydroxypropylmethylcellulose acetate phthalate, cellulose sulfate. It is.

  Methyl cellulose is synthesized from alkali cellulose and methyl chloride or dimethyl sulfate by a conventional method. Furthermore, by reacting with ethylene oxide by a conventional method, hydroxyethyl methylcellulose can be obtained. Ethyl cellulose is obtained by reacting alkali cellulose with ethyl chloride under pressure. Other alkyl celluloses can be synthesized by the same method. Hydroxyethyl cellulose is synthesized from cellulose and ethylene oxide by a conventional method. Carboxymethyl cellulose can be obtained by reacting cellulose and monochloroacetic acid in the presence of caustic alkali by a conventional method. Cellulose sulfate can be obtained by reacting cellulose and dimethylformamide by a conventional method. Other cellulose derivatives can be synthesized by the same known method. It is also commercially available.

(Acrylic compound)
As the acrylic compound, a homopolymer of a (meth) acrylate compound represented by the following general formula (1) (a general term for an acrylate compound when R ¹ is a hydrogen atom and a methacrylate compound when R ¹ is a methyl group) ( 1a), two or more copolymers (1b) of (meth) acrylate compounds represented by the following general formula (1), and (meth) acrylate compounds represented by the following general formula (1) and other copolymers A copolymer (1c) with a polymerizable monomer is included.
H ₂ C═C (R ¹ ) COOR ² (1)
[Wherein R ¹ represents a hydrogen atom or a methyl group, and R ² represents a monovalent organic machine. Examples of the organic group include an alkyl group, a cycloalkyl group, a hydroxyalkyl group, an alkoxy group, an aryloxy group, a polyalkylene glycol half ester residue, and a polyalkylene glycol monoether ester residue. ]

Specific examples of the (meth) acrylate compound represented by the general formula (1) used for producing the homopolymer (1a) and the copolymer (1b) include methyl (meth) acrylate and ethyl (meth). Acrylate, propyl (meth) acrylate, isopropyl (meth) acrylate, butyl (meth) acrylate, isobutyl (meth) acrylate, t-butyl (meth) acrylate, pentyl (meth) acrylate, amyl (meth) acrylate, isoamyl (meth) Acrylate, hexyl (meth) acrylate, heptyl (meth) acrylate, octyl (meth) acrylate, isooctyl (meth) acrylate, ethylhexyl (meth) acrylate, nonyl (meth) acrylate, decyl (meth) acrylate, isodecyl (meth) Alkyl (meth) acrylates such as acrylate, undecyl (meth) acrylate, dodecyl (meth) acrylate, lauryl (meth) acrylate, stearyl (meth) acrylate, isostearyl (meth) acrylate; hydroxyethyl (meth) acrylate, 2-hydroxy Hydroxyalkyl (meth) acrylates such as propyl (meth) acrylate, 4-hydroxybutyl (meth) acrylate, 3-hydroxypropyl (meth) acrylate, 2-hydroxybutyl (meth) acrylate, 3-hydroxybutyl (meth) acrylate; Phenoxyalkyl (meth) acrylates such as phenoxyethyl (meth) acrylate and 2-hydroxy-3-phenoxypropyl (meth) acrylate; 2-methoxyethyl ( ) Alkoxyalkyl (meth) acrylates such as 2-acrylate, 2-ethoxyethyl (meth) acrylate, 2-propoxyethyl (meth) acrylate, 2-butoxyethyl (meth) acrylate, 2-methoxybutyl (meth) acrylate; polyethylene glycol Mono (meth) acrylate, ethoxydiethylene glycol (meth) acrylate, methoxypolyethylene glycol (meth) acrylate, phenoxypolyethylene glycol (meth) acrylate, nonylphenoxypolyethylene glycol (meth) acrylate, polypropylene glycol mono (meth) acrylate, methoxypolypropylene glycol ( (Meth) acrylate, ethoxypolypropylene glycol (meth) acrylate, nonylphenoxypoly Polyalkylene glycol (meth) acrylates such as propylene glycol (meth) acrylate; cyclohexyl (meth) acrylate, 4-butylcyclohexyl (meth) acrylate, dicyclopentanyl (meth) acrylate, dicyclopentenyl (meth) acrylate, dicyclo Cycloalkyl (meth) acrylates such as pentadienyl (meth) acrylate, bornyl (meth) acrylate, isobornyl (meth) acrylate, tricyclodecanyl (meth) acrylate; benzyl (meth) acrylate, tetrahydrofurfuryl (meth) acrylate And so on. Among these, in the above general formula (1), the group represented by R ² is preferably a group containing an alkyl group or an oxyalkylene group, and as a particularly preferred (meth) acrylate compound, methyl (meth) acrylate , Butyl (meth) acrylate, ethylhexyl (meth) acrylate, lauryl (meth) acrylate, isodecyl (meth) acrylate and 2-ethoxyethyl (meth) acrylate.
The other copolymerizable monomer used for copolymerization with the (meth) acrylate compound used to produce the copolymer (1c) may be a compound copolymerizable with the (meth) acrylate compound. For example, unsaturated carboxylic acids such as (meth) acrylic acid, vinyl benzoic acid, maleic acid, vinyl phthalic acid; vinyl benzyl methyl ether, vinyl glycidyl ether, styrene, α-methyl styrene, butadiene, isoprene, etc. Mention may be made of vinyl group-containing radically polymerizable compounds. In the copolymer (1c), the copolymer component derived from the (meth) acrylate compound represented by the general formula (1) is usually 40% by mass or more, preferably 50% by mass or more.
The molecular weight of the acrylic compound which is a homopolymer (1a), a copolymer (1b) or (1c) is preferably 1,000 to 300,000, more preferably as a weight average molecular weight in terms of polystyrene by GPC. Is 2,000 to 200,000.

  The content ratio of the resin in the paste is preferably 1 to 20 parts by mass, more preferably 15 to 18 parts by mass with respect to 100 parts by mass of the low melting glass powder component. When the ratio of the resin is too small, the low melting point glass powder component cannot be reliably bound and held, whereas when this ratio is excessive, the firing process takes a long time, The formed sintered body (inorganic partition wall layer) may not have sufficient strength and film thickness.

Ac. Solvent and plasticizer As the solvent constituting the paste used in the present invention, the affinity with the inorganic powder and the solubility of the resin are good, and the paste can be imparted with an appropriate viscosity and easily dried. Preferably, it can be removed by evaporation. Particularly preferred solvents include ketones, alcohols and esters having a normal boiling point (boiling point at 1 atm) of 60 to 300 ° C.
Specific examples of such a solvent include ketones such as diethyl ketone, methyl butyl ketone, dipropyl ketone, heptanone, octanone, cyclohexanone and N-methylpyrrolidone; methanol, ethanol, propanol, isopropanol, butanols, n-pentanol, Alcohols such as 4-methyl-2-pentanol, cyclohexanol, 7-bromo-heptanol, octanol, diacetone alcohol, glycerin, benzyl alcohol, turpentine oil, terpineol; ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol Monobutyl ether, propylene glycol monomethyl ether, propylene glycol monoethyl ether, diethylene glycol monoethyl ether Ether ethers such as diethylene glycol monobutyl ether; saturated aliphatic monocarboxylic acid alkyl esters such as acetic acid-n-butyl and amyl acetate; lactate esters such as ethyl lactate and lactate-n-butyl; methyl cellosolve acetate; Examples include ether cell esters such as ethyl cellosolve acetate, propylene glycol monomethyl ether acetate, ethyl-3-ethoxypropionate, diethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, etc. Among these, terpineol, N -Methyl pyrrolidone, methyl butyl ketone, cyclohexanone, diacetone alcohol, ethylene glycol monobutyl ether, propylene glycol Methyl ether, ethyl lactate, ethyl 3-ethoxypropionate are preferred. These solvents can be used alone or in combination of two or more.
In addition, a plasticizer can be added to increase the flexibility of the inorganic partition wall layer or to provide self-adhesion. As the plasticizer, butyl benzyl phthalate, dioctyl phthalate, dicapryl phthalate, dibutyl phthalate and the like can be used alone or in combination.
As a content rate of the solvent in the paste (before layer formation) used for this invention, it is preferable that it is 5-50 mass parts with respect to 100 mass parts of inorganic powder from a viewpoint of maintaining the viscosity of a paste in a suitable range. More preferably, it is 8.0-40 mass parts. Moreover, it is preferable that the ratio of a plasticizer is 0-20 mass parts with respect to 100 mass parts of inorganic powder.

Ad. Preparation of paste In addition to the above essential components, various additives such as dispersants, leveling agents, tackifiers, surface tension modifiers, stabilizers and antifoaming agents are included as optional components in the paste used in the present invention. It may be contained. An example of a preferred paste (before layer formation) is a paste containing 1 to 20 parts by mass of resin, 10 to 50 parts by mass of solvent, and 2 to 10 parts by mass of plasticizer with respect to 100 parts by mass of inorganic powder. Can do. The paste used in the present invention can be prepared by kneading the above components using a kneading / dispersing machine such as a roll kneader, a mixer, a homomixer, or a sand mill. The paste used in the present invention prepared as described above is a paste having fluidity suitable for forming a layer.

B. Production of Transfer Film A flexible temporary support used for a transfer film is one that carries a paste by coating. The applied paste layer is stored over time, transferred to a substrate such as a glass substrate during use, and the flexible temporary support is peeled off.

  As such a flexible temporary support, the material, form, etc. thereof are not particularly limited as long as the above functions are exhibited. As a material for the flexible temporary support, a resin film is usually used. For example, a polyester film (for example, polyethylene terephthalate, polyethylene naphthalate), a polyolefin film (for example, polyethylene, polypropylene, etc.), a polyamide film (for example, , Nylon, aramid, etc.), polyimide-based, polysulfone-based, cellulose-based, etc. The type, physical properties (for example, Young's modulus, thermal expansion coefficient, surface roughness, etc.), thickness, etc. are appropriately selected according to the purpose of use. Is done.

  In addition to the resin component, the flexible temporary support can contain other materials such as inorganic powder, release agent and the like. Further, the surface of the flexible temporary support on which the paste is provided may be physically and / or chemically treated. For example, top coat treatment (providing the release layer, eg, resin coat such as wax coat, silicone coat, etc.), metal deposition treatment, sputtering treatment, plating treatment, dust removal treatment, alkali treatment, heat treatment, corona discharge Treatment, plasma treatment and the like.

The viscosity of the paste used for application on the flexible temporary support is preferably 0.1 to 300 Pa · sec. Examples of the coating machine include a roll coater, a blade coater, a curtain coater, a wire coater, and the like, so that a paste layer can be applied onto a flexible temporary support, and the paste layer is wound into a roll. Can be stored and supplied at. Examples of the thickness of the flexible temporary support include 10 to 100 μm. The paste layer constituting the transfer film can be formed by applying the paste used in the present invention on a flexible temporary support, drying the coating film, and removing a part or all of the solvent. As a method of applying the paste used in the present invention on a flexible temporary support, a coating film having a large film thickness (for example, 20 μm or more) excellent in film thickness uniformity can be efficiently formed. It is preferable.
The surface of the flexible temporary support to which the paste used in the present invention is applied preferably has a release layer. Thereby, in the transfer process of the paste layer onto the substrate, the peeling operation of the flexible temporary support can be easily performed. Moreover, a protective film layer may be provided on the surface of the paste layer in the transfer film. Examples of such a protective film layer include a polyethylene terephthalate film, a polyethylene film, and a polyvinyl alcohol film.

  As described above, the paste used in the present invention may be used when producing a transfer film, or the paste is directly applied to the surface of a glass substrate or the like by a screen printing method or the like, and the coating film is dried. Can also be used in a method for forming a paste layer having a partition wall pattern, or a paste layer can be formed by a known coating apparatus, and a pattern can be formed by a sandblast method. Here, the viscosity of the paste used in the step of applying to the substrate by screen printing or the like is preferably 0.1 to 300 Pa · sec.

C. Method for Producing Inorganic Partition Layer The method for producing an inorganic partition layer of the present invention comprises forming a paste layer on a substrate such as a glass plate from a transfer film, laminating a photosensitive dry film on the surface of the paste layer, and A method of forming a pattern on the substrate by sand blasting using a resist pattern formed by sequentially performing pattern exposure and development on a porous dry film and then baking it is preferable.
The photosensitive dry film laminated on the surface of the paste layer is obtained by providing a photosensitive resin composition layer (also referred to as a resist layer) on a temporary support such as a PET film. Although it may be a material or a negative resist material, the negative type is preferred. In the positive type, a positive type resist composed of a mixture of an alkali-soluble phenol resin and naphthoquinone diazide is particularly preferable. Among these, a cresol novolac resin and an o-naphthoquinonediazide sulfonic acid derivative are preferable. The negative type includes a cyclized rubber-bisazide resist in which a cyclized rubber such as a chain polymer having an alicyclo ring and a bisazide compound such as an aromatic bisazide compound are combined, and a novolac resin in which 1-azidopyrene is combined with a metacresol novolac resin. -Azide resist, acrylic resist liquid in which an acrylic monomer and a photopolymerization initiator are combined, and the like. These are available as commercial products.

The substrate on which the paste layer is formed means a single substrate such as glass or the like, or a substrate provided with at least one of a dielectric layer, an electrode, a circuit, etc. on the substrate, and the substrate surface on which the paste layer is provided is a substrate. The front or back side of
In the method for producing an inorganic barrier layer of the present invention, a dielectric layer paste layer is provided on the surface of a substrate having electrodes, a barrier layer paste layer is provided thereon, and then the resist material is applied on the barrier paste layer. It is preferable to provide in.
The dielectric layer paste layer can prevent erosion of the dielectric layer due to sandblasting, protect the electrode, and be uniform by using a higher molecular weight binder than the partition wall paste layer as a binder. A partition wall having a specific aspect ratio at a high height can be easily obtained.
Here, the dielectric layer paste layer to be used is preferably integrated with the partition wall paste after firing, and each physical property may be the same or different. It is preferable from the viewpoint of performance.
The dielectric layer after firing usually has a thickness of about 5 to 50 μm.
If desired, the barrier rib paste layer can be provided directly on the substrate surface where the thin film electrode such as gold is exposed without providing a dielectric layer.
For the inorganic barrier rib layer, a PDP back plate can be produced by forming a phosphor layer in the concave portion of the barrier rib pattern.

After laminating a photosensitive dry film on the paste layer, pattern exposure is performed on the photosensitive dry film using an exposure apparatus. A hot roller can be used for the formation of the paste layer and the lamination. In the transfer of the paste layer, the paste layer of the transfer film and the substrate are brought into close contact with each other and passed through a heat roller, and then the temporary support is peeled off. In the lamination of the photosensitive dry film, the photosensitive dry film is brought into close contact with the paste layer, passed through a heat roller in the same manner as described above, and then the temporary support of the photosensitive dry film is peeled off. The temporary support of the photosensitive dry film can be peeled before or after the exposure step.
The exposure process is generally performed by a mask exposure method using a photomask, as in normal photolithography. As the mask to be used, either a negative type or a positive type is selected depending on the type of the photosensitive organic component of the resist layer. Alternatively, a method of directly drawing with a red or blue visible laser beam, an Ar ion laser, a UV ion laser, or the like without using a photomask may be used.

  As the exposure apparatus, a stepper exposure machine, a proximity exposure machine or the like can be used. Moreover, when performing exposure of a large area, a large area can be exposed with the exposure machine of a small exposure area by exposing while conveying board | substrates, such as a glass substrate.

Examples of the active light source used in this case include visible light, near ultraviolet light, ultraviolet light, electron beam, X-ray, and laser light. Among these, ultraviolet light is preferable. Mercury lamps, ultra-high pressure mercury lamps, halogen lamps, germicidal lamps, etc. can be used. Among these, an ultrahigh pressure mercury lamp is suitable. Although exposure conditions vary depending on the coating thickness, exposure is performed for 0.1 to 30 minutes using an ultrahigh pressure mercury lamp with an output of 1 to 100 mW / cm ² .

  After the exposure, development is performed using the difference in solubility between the photosensitive portion and the non-photosensitive portion of the resist layer with respect to the developer. In this case, the development can be performed by an immersion method, a spray method, or a brush method. The developer to be used can be developed with water, but an organic solvent in which an organic component in the resist layer can be dissolved can also be used. When a compound having an acidic group such as a carboxyl group is present in the resist layer, it may be preferable to develop with an alkaline aqueous solution rather than water. A metal alkali aqueous solution such as sodium hydroxide, sodium carbonate, calcium hydroxide aqueous solution or the like can be used as the alkali aqueous solution. However, it is preferable to use an organic alkali aqueous solution because an alkaline component can be easily removed during firing. Further, depending on the resin, development with water is also possible.

  As the organic alkali, a general amine compound can be used. Specific examples include tetramethylammonium hydroxide, trimethylbenzylammonium hydroxide, monoethanolamine, and diethanolamine. The density | concentration of aqueous alkali solution is 0.01-10 mass% normally, More preferably, it is 0.1-5 mass%. If the alkali concentration is too low, the soluble portion is not removed, and if the alkali concentration is too high, the pattern portion may be peeled off and the non-soluble portion may be corroded. The development temperature during development is preferably 20 to 40 ° C. in terms of process control.

Next, the process proceeds to a step of removing the paste layer according to the pattern formed on the resist layer. This step is preferably a sand blast method. Sand blasting is a processing method in which abrasive fine particles mixed with compressed gas are sprayed at high speed to physically etch the paste layer.
For etching the paste layer, high-pressure spray development described in JP-A No. 2000-16412 can also be used.
After the etching of the paste layer, a step of removing the resist pattern on the paste layer may be provided, or the process may be directly transferred to the baking step. In the step of removing the resist pattern, the resist pattern can be removed by dipping in a stripping solution or spray coating.

  Next, firing is performed in a firing furnace. The firing atmosphere and temperature vary depending on the type of paste layer and substrate, but firing is performed in air, nitrogen, hydrogen, or the like. As the firing furnace, a batch-type firing furnace or a belt-type continuous firing furnace can be used. The firing temperature is 400 to 600 ° C. The firing time is 10 to 60 minutes. A lower firing temperature is preferable in terms of energy economy, but a temperature of 400 ° C. is necessary to remove organic components and promote glass sintering. Moreover, it is not necessary to raise it to 600 degreeC or more. Moreover, you may introduce | transduce a 50-300 degreeC heating process in the above-mentioned each process of exposure, image development, and baking for the purpose of drying and a preliminary reaction.

As a method for producing the inorganic barrier layer of the present invention, in addition to a method using a photosensitive dry film, a paste layer formed by using a transfer film or coating is patterned by an embossing method without using a photosensitive dry film. The method of manufacturing using the method of forming on a board | substrate can be used. Examples of the embossing method include a method in which a pattern is directly formed on the paste layer by applying the mold to the paste layer. Examples of the mold used include a mold (rotary mold, flat mold, etc.) in which the portion corresponding to the convex pattern is concave and the portion corresponding to the concave pattern is a convex shape. This is a method in which the paste layer is plastically deformed according to the mold by pressing it up to form a pattern.
As another embossing method, a female die having a hole corresponding to the convex portion of the pattern is applied to the paste layer to capture only the convex portion, and then the paste layer taken into the female die is placed on the hole on the substrate. Examples thereof include a method of forming a pattern by extruding at a corresponding male mold, hydraulic pressure or atmospheric pressure.
It is preferable that a release agent such as that used in the release layer is applied to the surface of these molds and / or the paste layer surface. In the present invention, for example, methods described in JP-A-10-326562 and JP-A-2002-93313 can be employed. In this case, the composition of the paste layer (particularly, the type and amount of the solvent, plasticizer, etc.) is selected so that the above-mentioned mold forming is possible, and the plasticity is appropriately adjusted.

  Hereinafter, the present invention will be specifically described with reference to examples. However, the present invention is not limited to this. “Part” means “part by mass”.

Sample No. 1-42 (Example), Sample No. 43-48 (comparative example)
1) Preparation of coating paste Preparation of coating paste A1 Inorganic powder A1 having an average particle diameter of 1.2 μm (glass added with oxidation accelerator and antimony oxide listed in Table 2 to glass A listed in Table 1) 70 parts And an inorganic powder component comprising 30 parts of an inorganic powder (alumina, softening point: 1200 ° C.) having an average particle diameter of 7 μm is dispersed in a solution of 2 parts of resin (ethyl cellulose) in a mixed solvent of terpineol and diethylene glycol monobutyl ether acetate. Thereafter, dibutyl phthalate was added as a plasticizer and kneaded to obtain a coating paste A1.
Preparation of coating pastes A2 to A7 In coating paste A1, coating paste A2 was used in the same manner except that inorganic powder A1 was changed from antimony oxide and oxidation accelerator A2 to A7 as shown in Table 2. -A7 was obtained.

Preparation of coating pastes B1 to F1 In the coating paste A1, in place of the inorganic powder A1, inorganic powders B1 to F1 (glass in which the oxidation promoter and antimony oxide described in Tables 3 to 7 are added to the glass B described in Table 1) The coating pastes B1 to F1 were prepared in the same manner as the coating paste A1 except that (1) was used.
Preparation of coating pastes B2-B7, C2-C7, D2-D7, E2-E7, F2-F7 In coating pastes B1-F1, inorganic powders B1-F1 were mixed with antimony oxide and Except using B2-B7, C2-C7, D2-D7, E2-E7, and F2-F7 with different oxidation accelerators, the coating pastes B2-B7, C2-C7, D2-D7, E2 were used in the same manner. To E7 and F2 to F7 were obtained.

Preparation of coating pastes A to F (for comparison) In coating paste A1, inorganic powder A (without addition of glass, oxidation accelerator and antimony oxide described in Table 1) was used instead of inorganic powder A1. Coating pastes A to F were prepared in the same manner as coating paste A1.

Preparation of coating paste A1-1 to A1-6 (for comparison) In coating paste A1, the average particle diameter of inorganic powder A1 and alumina was changed as shown in Table 12, and was the same as coating paste A1. Coating pastes A1-1 to A1-6 were prepared.

Preparation of coating paste A1-7 (for comparison) Coating paste A1 was the same as coating paste A1 except that the amount of inorganic powder A1 and alumina was changed from 70:30 to 20:80 in coating paste A1. -7 was prepared.

2) Formation of paste layer The coating pastes A1 to A7, B1 to B7, C1 to C7, D1 to D7, E1 to E7, F1 to F7, comparative pastes A to F and A1-1 to A1-7 are made of glass. The sample was coated on a substrate (1 m × 1 m) with a coater with a film thickness of 200 μm. 1-42 (Example), Sample No. Samples 43 to 55 (comparative examples) were produced.
3) Lamination of photosensitive dry film Next, a negative type dry film resist (Nippon Synthetic Chemical Industry Co., Ltd., NCP225, 25 μm) having a protective film was laminated on the paste layer with a 100 ° C. hot roll.
4) Pattern formation A line-and-space pattern mask with a line width of 220 μm and a space of 80 μm is aligned and placed on the resist layer and irradiated with ultraviolet rays (364 nm, intensity 20 mW / cm ² , irradiation amount 120 mJ / cm ² ). After the exposure, the protective film on the photoresist layer was peeled off, and spray development was performed using a 1% by mass aqueous solution of sodium carbonate having a liquid temperature of 30 ° C. A resist pattern corresponding to the line pattern mask was obtained.

Next, using this resist pattern as a mask, a sand blasting apparatus was used to sand blast the paste layer in the resist pattern opening.
Thereafter, the substrate having the patterned paste layer is placed in a firing furnace, and the temperature in the furnace is increased from room temperature to 570 ° C. at a temperature increase rate of 5 ° C./min, and the temperature is increased to 30 ° C. in a temperature atmosphere of 570 ° C. By baking for a minute, a partition baking pattern was formed on the surface of the glass substrate.
The aspect ratio, partition height, area porosity, shrinkage resistance, cracking, dielectric constant and resolution of the formed partition wall pattern were evaluated, and the results are shown in Tables 8-12.
Shrinkage resistance (%): (100 × film thickness after firing / film thickness before firing).
Cracking: Observed in detail visually. If it was not observed, it was deemed to be none.
Dielectric constant: Measured with a dielectric constant measuring device (1 MHz) manufactured by Yokogawa Electric Corporation.
Resolution: The exposure amount was changed to change the line width, and the limit resolution of the pattern after baking was examined. This resolving power is the width (w) of the partition after firing.

When the formed barrier rib firing pattern was visually observed, sample No. As for No. 1-48, the peeling from a board | substrate etc. was not recognized, but also as a result of observing the cross section of a partition with an electron microscope, the innumerable space | gap of 0.5-15 micrometers was confirmed and it was recognized that it is porous.
From the above table, the examples of the present invention contained antimony oxide as compared with the comparative example, so that cracks were eliminated during firing, and the dielectric constant could be lowered by using an oxidation accelerator in combination. . Further, it was found that the examples of the present invention have little change in the line width after firing, and high resolution can be obtained.
On the other hand, sample No. Nos. 49 to 54 show that even when the partition walls are formed using A1 glass containing antimony oxide, cracking occurs when the area porosity is small.
Sample No. No. 55 was able to obtain an area porosity of 80%, but this also had cracks after firing, was weak in strength, and was easy to break.

Claims (5)

  An inorganic partition wall layer for PDP having partition walls having an aspect ratio of 1 to 10 and a height of 100 to 800 μm, wherein the inorganic partition wall layer for PDP contains antimony oxide, and the partition wall has a void size of 0. An inorganic partition wall layer for PDP, which is 1 to 30 μm and has an area porosity of 5 to 75%.   The inorganic partition wall layer for PDP according to claim 1, comprising an oxidation accelerator.   The inorganic partition wall layer for PDP according to claim 1 or 2, wherein the oxidation accelerator is made of an oxide of at least one atom selected from Ta, Nb, Mn, Ce, La and Ni.   The inorganic partition wall layer for PDP according to any one of claims 1 to 3, wherein the dielectric constant is 3.5 to 12.   After forming a partition wall pattern by a sandblasting method on a paste layer containing an inorganic powder having at least two kinds of inorganic powders having different softening points and particle sizes, and any one of the inorganic powders is antimony oxide, A method for producing an inorganic partition wall layer for PDP, wherein the inorganic partition wall layer for PDP according to any one of claims 1 to 4 is formed by firing.